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X-Ray Microanalysis – Precision and Sensitivity
Recall…
wt.fraction I = ISiKα (unknown) / ISiKα (pure std.)
K-ratio I = [ISiKα (unknown) / ISiKα (std.)] x CF
CF relates concentration in std to pure element
K x 100 = uncorrected wt.%, and …
K (ZAF)(100) = corrected wt.%
Weight Percent?
X-ray intensities are related to mass concentration, not atom concentrationIncident electrons penetrate a constant mass of material which will differ as the composition differs
Electrons interact with orbital electrons of target atoms
lose kinetic energy
number of electrons proportional to atomic mass
Example:
Elements A and B
B is heavier than A
Pure A Mixture of A and B
Excited volume
If atomic concentration of A = nA
the mass concentration is:
CA = nAAA / [nAAA+(1-nA)AB]
Where: AA = atomic weight of A
AB = atomic weight of B
# of excited atoms in pure A = Nm / AA
Where: N is Avogadro’s number
m is mass penetrated by incident electrons
In the compound:
# of A atoms excited is
= nANm / [nAAA+(1-nA)AB]
The X-ray intensity ratio (proportional to the number of excited atoms) is then
= {nANm / [nAAA+(1-nA)AB]} / (Nm / AA)
Which is equal to the expression for CA, the mass concentration of A
Spatial Resolution
D = 0.077 (E01.5 – EC
1.5) / ρ
ρ = density
E0 = accelerating potential
EC = excitation potential
Example:
Si in fayalite at 15keV
ρ = 4.39
E0 = 15 keV
EC = 1.840 keV for SiKα
d = 0.98 μm
3σ = 2.9 μm diameter
volume containing 99% of X-ray productions
X-ray distribution from a point source…
X
Precision, Accuracy and Sensitivity (detection limits)
Precision: Reproducibility
Analytical scatter due to nature of X-ray measurement process
Accuracy: Is the result correct?
Sensitivity: How low a concentration can you expect to see?
Accuracy and Precision
Wt.% Fe
20 25 30 35
Correct value
Low precision, but relatively accurate
Wt.% Fe
20 25 30 35
Correct value
High precision, but low accuracy
Measured value
Standard deviationAve
Std error
Ave
Std error
Accuracy and Precision
Wt.% Fe
20 25 30 35
Correct value
Low precision, but relatively accurate
Wt.% Fe
20 25 30 35
Correct value
High precision, but low accuracy
Measured value
Standard deviationAve
Std error
Ave
Std error
Ave
Std error
Precise and accurate
Characterizing Error
What are the basic components of error?
1) Short-term random error (data set)
Counting statistics
Instrument noise
Surface imperfections
Deviations from ideal homogeneity
2) Short-term systematic error (session to session)
Background estimation
Calibration
Variation in coating
3) Long-term systematic error (overall systematic errors that a reproducible session-to-session)
Standards
Physical constants
Matrix correction and Interference algorithms
Dead time, current measurement, etc.
Frequency of X-ray counts
Counts
Short-Term Random Error - Basic assessment of counting statistics
X-ray production is random in time, and results in a fixed mean value – follows Poisson statistics
At high count rates, count distribution follows a normal (Gaussian) distribution
68.3% of area95.4% of area99.7% of area
3σ 2σ 1σ 1σ 2σ 3σ
The standard deviation is:
0
1
2
3
4
5
6
0 20000 40000 60000 80000 100000
Counts
1-s
igm
a e
rro
r %
Variation in percentage of total counts
= (σC / N)100
So to obtain a result to 1% precision,
Must collect at least 10,000 counts
Evaluation of count statistics for an analysis must take into account the variation in all acquired intensities
Peak (sample and standard)
Background (sample and standard)
And errors propagated
Relative std. deviation
Addition and subtraction
Multiplication and division
rrrBrBB
tttbbb
Positive and negative offsets for the background measurement, relative to the peak position
r+ et r-
Total number of measurements on the peak and on the background
jpmax, jbmax
index of measurements on the peak and on the backgroundjp, jb
Intensity (Peak-Bkgd in cps/nA) of the element in the samplee
Element concentration in the sampleCe
Intensity (Peak-Bkgd in cps/nA) of the element in the standards
Element concentration in the standardCs
Background countsB
Peak counts P
Total counting timetb
Counting time on the peaktp
Current from the Faraday cupi
For the calibration…
And standard deviation…
The measured standard deviation can be compared to the theoretical standard deviation …
Theo.Dev(%) = 100* Stheo/s
The larger of the two then represents the useful error on the standard calibration:
²s = max ((Smeas)², or (Stheo)²)
For the sample, the variance for the intensity can be estimated as…
where
The intensity on the sample is…
Or, in the case of a single measurement…
Pk – Bkg cps/nA
And the total count statistical error is then (3σ)…
An example
Calibration
Point Th Ma (cps/nA)1 154.62812 155.30823 154.88974 154.86565 156.46516 155.65097 156.88818 155.54019 154.8923
10 154.8614
Ave, omitting pt. 7 155.2334889SD 0.577232495SD% 0.371847917
X-Ray Th Ma
Pk-Bg Mean (cps/nA) 155.2335
Std.Dev (%) 0.372
Theo.Dev (%) 0.136
3 Sigma (Wt%) 0.563
Pk Mean (cps) 3119.686
Bg Mean (cps) 34.455
Raw cts Mean (cts) 61657
Beam (nA) 19.87
S meas 0.57746862
Sample Th data
Wt% curr pk cps pk t(sec) bkg cps pk-bk
6.4992 200.35 4098.57 800 285.0897 3813.483
λe (net intensity for sample) 19.0337268
π (peak int) 20.45665672β (bkg int) 1.422929914
σ2e (sample variance) 0.000136506
λs (net intensity for std) 155.2335σ2s (std variance) 0.333470007
σe 0.073511882
This is a very precise number
Sensitivity and Detection Limits
Ability to distinguish two concentrations that are nearly equal (C and C’)
95% confidence approximated by:
N = average counts
NB = average background counts
n = number of analysis points
Actual standard deviation ~ 2σC, so ΔC about 2X above equation
If N >> NB, then
Sensitivity in % is then…
To achieve 1% sensitivity
Must accumulate at least 54,290 counts
As concentration decreases,
must increase count time to maintain precision
Example gradient:
0 distance (microns) 25
Wt%
Ni
Take 1 micron steps: Gradient = 0.04 wt.% / step
Sensitivity at 95% confidence must be ≤ 0.04 wt.%
Must accumulate ≥ 85,000 counts / step
If take 2.5 micron steps
Gradient = 0.1 wt.% / step
Need ≥ 13,600 counts / step
So can cut count time by 6X