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X-ray Diffraction & Crystal Structure
Basic Concepts
T. P. RadhakrishnanSchool of Chemistry, University of Hyderabad
Email: [email protected]: http://chemistry.uohyd.ernet.in/~tpr/
http://chemistry.uohyd.ernet.in/~ch521/
Click on x-ray_powd.ppt
This powerpoint presentation is available at the following website
Outline
Crystalssymmetryclassification of latticesMiller planes
Waves phase, amplitudesuperposition of waves
Bragg law Powder diffraction Systematic absences, Structure factor Single crystals - Solution and Refinement Diffraction line width Applications of Powder diffraction
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
Molecular Structure
Optical spectroscopy – IR, UV-Vis
Magnetic resonance – NMR, ESR
Mass spectrometry
X-ray diffraction
High resolution microscopy
Molecular Structure Resolved by Atomic Force Microscopy
Gross, Mohn, Moll, Liljeroth, Meyer, Science 2009, 325, 1110
A. Molecular model of pentacene
A B
C D
5 Å 5 Å
20 Å5 Å
Pentacene on Cu(111)B. STM imageC, D. AFM images (tip modified with CO molecule)
Crystal and its structure
3-dimensions
Anthony, Raghavaiah, Radhakrishnan, Cryst. Growth Des. 2003, 3, 631
Plass, Kim, Matzger, J. Am. Chem. Soc. 2004, 126, 9042
STM image of 1,3-diheptadecylisophthalate on HOPG (with a model of two molecules)
2-dimensional square lattice
Point group symmetries :Identity (E)Reflection ()Rotation (Rn)Rotation-reflection (Sn)Inversion (i)
In periodic crystal lattice :(i) Additional symmetry - Translation
(ii) Rotations – limited values of n
Translation
Translation
Translation
Translation
Rotation
Rotation
Rotation
Restriction on n-fold rotation symmetryin a periodic lattice
cos (180-) = - cos = (n-1)/2
n 3 2 1 0 -1o 180 120 90 60 0Rotation 2 3 4 6 1
a
a a
na(n-1)a/2
Crystal Systems in 2-dimensions - 4
square
rectangular
oblique
hexagonal
Crystal Systems in 3-dimensions - 7
Cubic Tetragonal Orthorhombic
Trigonal HexagonalMonoclinic Triclinic
Bravais lattices in 2-dimensions - 5
square rectangular
oblique hexagonal
centred rectangular
Primitive cube (P)
Bravais Lattices in 3-dimensions(in cubic system)
Body centred cube (I)
Face centred cube (F)
Bravais Lattices in 3-dimensions - 14
Cubic - P, F (fcc), I (bcc)Tetragonal - P, IOrthorhombic - P, C, I, FMonoclinic - P, CTriclinic - PTrigonal - RHexagonal/Trigonal - P
Point groupoperations
Point groupoperations +translationsymmetries
7 Crystal systems
14 Bravais lattices
Lattice (o)
X X X X X X X X
X X X X X X X X
X
X
X X X X X X X X
X X X X X X X X
X
X
X X X X X X X X
X X X X X X X X
X
X
X X X X X X X X
X X X X X X X X
X
X
X X X X X X X X X
+ basis (x) = crystal structure
C4
C4
Spherical basis
Non-spherical basis
Lattice +Nonspherical Basis
Point groupoperations
Point groupoperations +translationsymmetries
7 Crystal systems 32 Crystallographic point groups
14 Bravais lattices 230 space groups
Lattice +Spherical Basis
(01)
(10)
Miller plane in 2-D
Distance between lines = a
a
a
x
y
(11)
Distance between lines = a/2= 0.7 a
Miller plane in 2-D
x
y
(23)
Distance between lines = a/(2)2+(3)2
= 0.27 a
Miller plane in 2-D
x
y (2, 3, 0)
In 3-D: intercepts = 1/2, 1/3,
Take inverses
x
y
z
(100)
Miller plane in 3-D
Distance between planes = a
a
Miller plane in 3-D
(010)
Distance between planes = a
x
y
z
Miller plane in 3-D
(110)
Distance between planes = a/2= 0.7 a
x
y
z
Miller plane in 3-D
(111)
Distance between planes = a/3= 0.58 a
x
y
z
ah2+k2+l2
dhkl =
Spacing between Miller planes
for cubic crystal system
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
0 0 /2
PhaseDisplacement
A sin{2(x/ - t)}
sin (0) = sin (n) = 0sin ([n+1/2] = +1 n even
-1 n odd
= wavelength = frequencyA = amplitude
Superposition of Waves
amplitude = A amplitude = 2A
Constructive interference
Superposition of Waves
amplitude = A amplitude = 1.4A
/4
Superposition of Waves
amplitude = A amplitude = 0
/2
Destructive interference
x
x+ /2
x+
1
2
3
Waves 1 and 2 interfere destructivelyWaves 1 and 3 interfere constructively
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
dhkl
hkl plane
2dhkl sin = n
Wavelength =
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
Single crystal Collection of several small crystals
Cones intersecting a film
Detector
Sample
X-ray tube
Powder diffraction setup
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100
1296
648
0
P o w d e r C e l l 2 . 2
Nacl
111
200
220
311
222
400
331
420
422
511
Powder x-ray diffractogram(sodium chloride)
2 (degree)
Counts
NaCl - powder x-ray datasource Cu-K ( = 1.540598 Å)
a = d(h2+k2+l2)½
Indexing
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
Primitive cube
b.c.c. (h+k+l = odd absent )
f.c.c. (h, k, l all even or all odd present )
(h00)
a/h
a
Equivalent to hth order scattering
2d.sin = n2(d/n).sin =
xa
(h00)
a/ha
123
3'1'
2'
2dh00sin =
dh00 = a/h
Path difference 2'1', =
Path difference 3'1', = xa/(a/h)
= hx
Phase difference 3'1' = (2/hx = 2hx
In 3-D, the phase difference 3'1' = 2hx+ky+lz)
The two waves 1 and 3 scattered from different
atomic layers have different phases, 1 and 2.
They will have different amplitudes A1and A2
if the atoms in the two planes are not the same.
Two waves having the same frequency, but different amplitudeand phase can be represented as :
E1 = A1sin1 and E2 = A2sin2
The scattered x-ray intensity is the sum of the contributions from the
different scattered waves
3
21
Waves can be represented as vectors in complex space
real
imaginary
A
The wave vector can be written as
A(cos + i.sin) = Aei
Structure Factor
Atomic scattering factor,
f =amplitude of wave scattered by an atom
amplitude of wave scattered by one electron
Wave scattered with phase, 2hx+ky+lz) from atoms having scattering factor, f contribute to theStructure Factor for the Miller plane, (hkl) :
Shkl = fn e2ihx +ky +lz ) n n n
n represent the atoms in the basis
Shkl = fn e2ihx +ky +lz ) n n n
Relates toAtom type
Atom position
Intensity of x-ray scattered from an(hkl) plane
Ihkl Shkl2
Systematic Absences
Shkl = fA + fB e2i(hx+ky+lz)
For body centred cubic lattice (bcc)x = 1/2, y = 1/2, z = 1/2
2i(hx+ky+lz) = i(h+k+l)
Shkl = fA + fB ei(h+k+l)
(h+k+l) is even ei(h+k+l) = +1
(h+k+l) is odd ei(h+k+l) = -1
If fA = fB = f
Shkl = 2f when h+k+l is even
= 0 when h+k+l is odd
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
Single Crystal X-ray Diffractometer with CCD detector
Water
Anode
X-rays
X-ray tube
Cathode
Filament
Tungsten wire at 1200 – 1800oCHeating current ~ 35 mAVoltage ~ 40 kV (Cu), 45 kV (Mo)
Goniometer
3-circle goniometer with fixed
CCD based detector
http://www.sensorsmag.com/articles/0198/cc0198/main.shtml
Charge Coupled Device
Shkl = fn e2ihx +ky +lz )
Fourier Synthesis
n n n
by Fourier transformation,
SK = f(r).eiK.r dr
(r) f(r) = SK.e-iK.r.dK
Structure Solution
•The Fourier map provides a structure solution
•Using the initial solution a structure factor is calculated for each (hkl) Shkl(calc)
•For each (hkl) there is also an experimental structure factor Shkl(exp)
•Least square method to carry out regression of Shkl(calc) against Shkl(exp). Quality of refinement represented by the r factor
•The final model used for the best Shkl(calc) is the structure solution
Structure Refinement
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
Effect of particle size on diffraction lines
B
Amax
½Amax
B (Bragg angle) B
Particle size small Particle size large
1 2
Scherrer formula for particle size estimation
t = 0.9
B cosB
t = average particle size = wavelength of x-rayB = width (in radians) at half-heightB = Bragg angle
0
1
2
3
m
d
t = md
A
D
M
A'
D'
M'
B
B
B
1 2
C C'
N N'
Path difference,
A'D' =
A'M' = m
B'L' = m(+x) = (m+1)for m: mx =
C'N' = (m-1)
B'E' = x
B
L
E
B'
L'
E'
A'D' 2d sinB =
A'M' 2(md)sinB = mi.e.2d sinB =
B'L' 2(md) sin1 = (m+1)
C'N' 2(md) sin2 = (m-1)
sin1
sinB=
mm+1
When m 1 = B
finite m: destructive interference is incomplete for 1 to 2
Crystals
Waves
Bragg Law
Powder diffraction
Systematic absences, Structure factor
Single crystals - Solution and Refinement
Diffraction line width
Applications of powder diffraction
1. Finger printing
a) Qualitative/quantitative analysis of mixturesExcedrin - composition of caffeine, aspirin, acitaminphen
Fly ash - for cement industry
b) Monitoring asbestos, silica in paints c) Degradation of drugs due to humidityd) ‘Builders’ in detergents
Sodium and potassium phosphates
e) Phase analysis of cement
2. Polymorph characterisation
a) Paints and pigmentsWhite pigment, TiO2 - rutile, anatase, brookite
Quinacridone paints
b) Pharmaceuticals Sulfathiazole (antibacterial) - four polymorphs
Ranitidine (antiulcer) - active/inactive polymorphsc) Food industry
Chocolate - 5 polymorphs stable at room temperature
3. Determination of degree of crystallinity and stress - linebroadening
a) ‘Excipients’ in pharmaceutical formulationscellulose - different derivatives have different extents of crystallinity
b) PhotographySilver halide in gelatin- stress due to drying of gelatin
c) Polymers - crystalline/amorphous phasesd) Preliminary characterisation of nanomaterials
Thank you
http://chemistry.uohyd.ernet.in/~ch521/
Click on x-ray_powd.ppt
This powerpoint presentation is available at the following website