VOL 34 NO 3, JULY 1994

PRESIDENT'S MESSAGE

FERENCE OF .TANDARDS LASORATORI·ES

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N F Q L

Are you really committed to quality in your job? The response should be YES for all of us since our only product is a number with integrity and a pedigree. If that same question was asked of the various NCSL committees, a quick review of their activities and goals would affirm this conunitment also. Each committee places a high priority on producing a product or service which is designed to improve some aspect of the quality of measurements or the operation of our member companies metrology laboratories. A sampling of these on-going activities include:

... Addressing the quality of life through the establishment of sound, safe and healthy metrology facilities .

.. Improved. quality and usefulness of equipment documentation.

... Development of "best practices" documentation on software controls .

... Development of methods for improving the quality of measurements through extensive Measurement Assurance Program (MAP) activities.

... Improving the quality of measurements through the development of Recommended Intrinsic/Derived Standard Practices (RISP) .

... Improving the quality of software through the development of a recommended

practice (RP) on software validation. ...Ralph E. Bel1emwl1ll Improving the quality of metrology personnel through a wide range of training

NCSL Presidellt and educational initiatives. ... Conduct and report the results of benchmarking surveys.

.. Improved measurement quality through the development of national standards and a measurement uncertainty RP.

... On-goi g activities to improve the quality of each annual conference. ¥ Improve the quality of region, section and area meetings for all members.

Docs that sound like a lot of work in progress? It surely is. Opportunities abound for qualit)! improvements in personal skills, laboratory capabilities, and knowledge, supported by impro\'ements in training and self assessment activities and member to member interactions and involvement. Are you involved?

And speaking of quality, our special thanks and best wishes go to Dr. Joe Simmons, the NIST Representative to NCSL, who announced his retirement effective April 29, 1994. Joe has set standards of excellence and made contributions, not only to NCSL but to the field of metrology worldwide, that will be hard to follow. He will be sorely missed. In the seven years as the NIST Representative to the NCSL, Joe has brought abollt a true partnership between the two organizations and is a credit to the National Institute of Standards and Technology. In recognition of his outstanding accomplishments to the metrology profession, he was presented with the 1992 Wildhack Award by his peers within NCSL.

Joe, our deepest thanks for a job well done from all of us at the National Conference of Standards Laboratol'ies.

(Continued Oil page 11)

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L

NCSL President Ralph Bertermann is either practicing his lines

before the crowd al1ived, or callie in early to check the facilities.

Tony Andelson, Bill Doyle, Ralph Be/fermann and Jim IHgram

keep the discussions lively.

Hotels and hotel meetillg rooms must be all alike. Gilly the players and the agenda al"C different.

Georgia Hanis readies her handouts for her presentation 0/1

Weights and Measures matte/so

L Past President Jilll Ingram led the searclllilg discussions on

Strategy 2000, where we wallt the NCSL to go in the next 10

years.

-7­

A good ILl/noW for the Sp/ing meeting i/1 Salt Lake City. And it

is gratifying to see /IlO/"C and more new faces 011 tire Board.

Scenes from the Board Meeting

Press Photographer Wilbur Anson, shot by ace photographer

Frank Bandy.

But Ihen, who shot this picture of Bill Doyle and Frank BaJ1dy when Frank is usually behind the camera?

Ken Almstrong, NIST-relired, and NCSL Secreta/iat-retired, visils Ihe Board meeting. Ken is now living in Utah.

Look at that view from the NCSL President's sLlite on the top of

Ihe hOle!. That's about the only perk NCSL presidents get for all that hard work and organizational hear1DLI/71.

Marcy and GQ/Y Davidson along with Ralph BeJ1ennalll1 Deidre Lavallee and Georgia Ilal7is walch the pelfomwnce of

decompress after the daylong meeling before heading OLlt 10 Ihe peacock in the COll/tyard, before the Board dinner.

dinner.

- 8 ­

Scenes from the Board Meeting

Ralph & Joyce Bel1emlaml, alld just a slice ofJim Ingram.

interesting places and eat in gounnet resfaurants. And WOlk

your heart aLit, too,

Join the Committee and Regional staffs of NCSL, travel to

Jim Ingram, Deidre Lavellee and Treasurer Keven RuM Kevin's fll1wlcial reporls are as good os I've seen in 22 yew'S of

Charlie & Rose Motzko discuss 1994 Conference arrangements obselving NCSL. with Roland Vavken,

Fra/lk BWldy, Tom Huttemonn, Dave Nebel, Randy Seefeldt alld Joltn WehnJleyer, Looks like Dave Nebel drew (he short

so'ow, ond is now 1995 NCSL Program Chail7llal1.

- 9­

I ASIA·PACIFIC METROLOGY PROGRAMME

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Tony Rocha sends along a copy of the January 1994 issue of their regional newsletter. News inside includes information from Australia, China, Hong Kong. India, Japan, Korea, New Zealand and Taiwan. 'If your work involves international and Pacific Rim programs, you might want to request getting your name on their circulation.

Tony's name and address is in the Roster at the back.

**~*****

CALIBRATION LABORATORY MANAGERS GUIDEBOOK PRINTED IN INDIA

CALIBRATION LABORATORY

MANAGER'S GUIDEBOOK

Guidebook, to be used in the expanding activities in their country. As you can see from the regular regional reports from India, they are popularizing NCSL USA activities among the non-aligned nations in the neighboring countries of the India Region.

We congratulate those hard-working organizers, and wish them well. The man who keeps us up-to-date on progress is below. He also publishes a regular STQC Newsletter which reports on USA NCSL news.

Mr. LA Namrani, Additional Director STQC Directorate, Rm 3075

Dept. of Electronics Electronics Niketan 6, C G 0 Complex New Delhi, 110003 India

CANADIAN REPORT

Les R. Peer, NCSL Canadian Region Coordinator

We have a vacancy for area coordinator for Eastern Ontario as Tim Mell's company Allied Signal Hawksbury division was bought out by Pylon. I am seeking a replacement coordinator. Thanks to the active participation of our coordinators we are doing very well in Canada.

Our two yearly meetings are confirmed with the following arrangements:

1) Canadian Region Spring meeting at Sir Sandford Fleming College in Peterborough Ontario.

On April 27, 1994 we held a very successful spring meeting at Sir Sandford Fleming College in Peterborough Ontario. Attending were a total of 38 persons, made up of 23 members, 11 students and 4 faculty. Among the attendees were three of our area coordinators:

Wayne Sampson, Litton Systems, Halifax Nova Scotia Adrien Michaud, Marconi, Montreal, Quebec George Parker, Litton Systems, Toronto, Ontario

We heard from:

.. Noel Briones and the students on the success of their programs and toured 'the facility. All 11 students have been placed for their summer work term. The NCSL scholarships are greatly appreciated.

.. Wayne Sampson of the Metrology Requirements;)~ffiI~.:sfiq;~~

NaLlenal Con'~(en¢lt 01 S~.nd3(ds Labcfollodes Committee read the report which we had sent the NRC and Paul MacIntyre of the NRC gave their verbal response,

Mr. LA. Namrani, of the Standardization, Testing and a written response has been promised for later.

Quality Control Branch in India published a new bilingual - 10·

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John Ragsdale of TVA & Jack Burdick of Southem California

Edison are new co-chairs of the Utilities Committee. Theyrepo/ted of the Board Meeting.

HEALTHCARE METROLOGY CO MITTEERuss Roberson

Committee meeting Monday August 1, 4:00 p.m. in the DeltaRoom at the Hyatt Regency O'Hare.

Committee will host a calibration laboratory tour FridayAugust 5.

PETROLEUM INDUSTRY METROLOGY COMMITTEE

Committee Meeting Tuesday August 2, 4:30 p.m. in the OzarkRoom at the Hyatt Regency O'Hare.

Mailed 184 Letters inviting Petroleum Industry MetrologyCommittee Members to a committee meeting to be held inconjunction with the conference.

QUALllY PROGRAMSDave Abell, V.P.

I submitted a paper entitled "Proposal for Simplified M&TEAccreditation" to the Head Executive of NAMAS, with copiesto NVLAP, NIST, Standards Council of Canada, and EAL(WECC). Although not an NCSL document, I sent it underthe letterhead of my Hewlett-Packard job & I have drawnheavily from, and acknowledged the ideas of the TOMCommittee. My purpose is to help accelerate the excellentpractical suggestions that have been put forward by the TOMCommittee.

Sent a copy of the "Proposal. .. "paper to Hugh Felger, theChairman of 133 Equipment Documentation Committee anddiscussed my suggestions for an approaCh to genericcalibration procedures. Mr. Felger has been asked by Mr.Fitzpatrick to focus the objective of this committee on thetopic of generic or standardized calibration procedures.

- 25-

Committee News

LAB EVALUATIONLeroy Britain with John Wehrmeyer assisting.

This committee met during the January Measurement ScienceConference and is working on a practical applicationhandbook for the ANSI/NCSL Z-540-1 Standard. Severalwriting assignments were illake at that time and thecommittee has been very active in completing their tasks.Leroy will attend the Board illeeting in Salt Lake to present areport.

CALSY$TEM$J. Wade Keith

Final Analysis of survey returns has been completed. Wadewill attend the Board meeting in Salt Lake to present hisreport.

TQM COMMIITBEGary Davidson

The Executive Standards Council of ANSI approved theaccreditation of the NCSL TOM Committee at its Feb. 28,1994 meeting. A notice of the accreditation will appear in theMay 1994 issue of Standards Action. ANSI/NCSL Z-540-1should be listed in the April issue of Standards Action and thepublic will have 60 days for comments and objections. Garywill attend the Board meeting and present his report.

CALIBRATION INTERVALHoward Castrup

RP-1 work continues. The following changes that wereidentified as being in progress in the January report are nowcompleted:

* Removal of non-viable algorithmic methods* Revision of one algorithmic method

Items that are still in progress include:

* Expansion and clarification of statistical method S2.. Addition of two new statistical methods* Expansion of conceptual and technical background sections* Expansion and clarification of language in general.

The completed changes and those still in progress werereceived by the committee at the January meeting. Duringthis meeting, it was recommended that each methoddocumented in the RP be accompanied by a clearly wordeddisclaimer indicating strengths and weaknesses.

It was also suggested that each method, algorithmic orstatistical, be given its own section with suitable introductoryremarks.

Finally, it was determined that the current section on requireddata elements be converted to a Chapter titled "Calibration

NASA UPDATE

It appears that NASA is in process of adopting MIL-STD­4S662A in lieu of their current calibration requirements.Raymond Kotowski indicated that will cause an automaticmigration to ANSI/NCSL Z540-1-1994.

COMMITfEE RECEIVES ANSI ACCREDITATIONANSI/NCSL Z540-1-1 994 SUBMITfED FOR ANSI FORPUBLIC COMMENT

On February 28, 1994 the NCSL TQM Committee onCalibration Systems Requirements/ANSI Z540 wasaccredited by ANSI. The final draft of the standard andsupporting documentation was sent to ANSI on March 7,1994 by the NCSL Secretariat. ANSI/NCSL Z540-1 will belisted in ANSI Standards Action, April 1, 1994 issue. There isa 60 day period for public comments. The earliest publicationdate would now be August 1994. This is predicted on notreceiving any objections during the public comment period(not likely).

!REVISION OF ISO GUIDE 25 GENERALREQUIREMENTS FOR THE COMPETENCE OFCALIBRATION AND TESTING LABORATORIES

On February 18, 1994, Norm Belecki and I met with JohnDonaldson, Chief, Standards and Information, OffIce ofStandards Services, NIST, regarding involvement with ISOstandards. John put me in touch with Lynne Neumann, U.S.member to the drafting committee, TAG for CASCO. Lynneis with U.S. Testing Company and has prior calibration labexperience.

On March 11, 1994, I completed the comments to ISO Guide25 and they were submitted to Lynne Neumann, U.S. memberto the drafting committee, TAG for CASCO. My package ofcomments were reviewed by Bill Quigley, Ken Lund, and JoeSimmons prior to submittal. I met with Lynne Neumann onMarch 28 to discuss the results of the drafting committeereview of our comments. I am pleased that the draftingcommittee accepted many of our recommendations, and thatall comments were apparently taken seriously. LynneNeumann did an excellent job representing us at the meeting.Lynne stated that our input was of the highest quality that thedrafting committee had received. For those items that wererejected that the committee feels strongly about, we arepreparing further justification. The rejected items are not a"dead issue" with Lynne Neumann if our position can befurther justifIed or clarifIed. This response will be sent toLynne Neumann by April 15, 1994.

THE BOAT IS LEAVING

With all the arrows pointing towards ISO standards,government agencies, international trade and otherwise, theNCSL membership does not have adequate representationthrough direct involvement in international standards. Theboat is being built but we're only going to be passengers - toride in comfort we need to be the builders - or if we carewhere the boat is going we need to help steer. Our input to

- 27 -

Committee News

ISO Guide 2S is through a testing laboratory representative.There is no consensus process from the U.S. for input to ISO10012.1 or .2. There is no consensus input from the U.S.calibration community to the ISO 9000 series documents.And fmally, there is no easy solution to getting U.S.involvement from the calibration community. It's expensiveto participate. Direct benefit to a corporation is hard toquantify (particularly before the boat gets to the dock), andforeign travel is run all tile way up tile corporate flag pole ­challenged at every step.

Let me give you just one example that would add significantcost to calibration without value added: Paragraph 12.1 ofISO Guide 25 states "The laboratory shall maintain a recordsystem .... It shall retain on record all original observations,calculations, and derived data and ..." In general, for generalpurpose test equipment, we do not comply to this in U.S.calibration laboratories. Our chances of having this languageremoved is slim because the testing community thinks it'srequired. This language was removed from ANSI/NCSL 540­1-1994. Removal of language such as this at the U.S. levelputs international acceptance of our system at risk.

The challenge that I pose to the NCSL Board of Directors isto fmd a way for us to increase our influence in thedevelopment and revision of international standards thateffect the calibration laboratory community.

The Z540 Handbook Committee met after the NCSL BoardMeeting in Sa/t Lake.

N

MiES: The Missing link

ISA/94.\ ~ \., • [' • :tI .:--~I-;:

REl';tSTUl.QIJ"'" ·il

N

INTEC, A PUBLICATION OF THE INSTRUMENTSOCIETY OF AMERICA

STANDARD REFERENCE MATERIALSJanuary 1994 Price List Available

NlSIU~DtJ"."""L"'"'rOfa:n.lJ.lt ........r~.____

~'--~-.a,,".-l t"'......,.

This new price list for SRM materials is off the press.Contact NIST for your copy

,.. .... ,.. ....... ,..

As Newsletter Editor, I get some of the regular publicationsof the lSA, including calendars of their training courses onmeasurement and instrumentation. If you are interested,contact: INTECH, ISA, PO Box 12277, Research TrianglePark, NC 27709, (919) 549-8411.

RP-12 DETERMINING AND REPORTINGMEASUREMENT UNCERTAINTIES

... ,.. ... ". .,.. ......

MEASUREMENT SUGGESTIONS NEEDED

I:"m,,,,,,, eod "P,:lI ~r~t~sLlreIllent Uncertainties

State of IsraelMinistry of DefenceRafael-Armament Development AuthorityHaifa, IsraelMay 17,1884

EDITOR:

Re\'Ulllmenllcfl Pr:'ll:tl((RP·I~

f'..~t.nl"! I.''''

Dave Abell and his committee just finished publishing thisnew guideline for a complex and not-so-well-understoodsubject. All NCSL Member Delegates should have receivedtheir copy. Others can purchase them by contacting theNCSL Business Office.

- 29-

I receive the NCSL Newsletter regularly and enjoy it verymuch. Under the present format there is no section forLetters To The Editor or any other section which requestsreader participation in the compiling of the Newsletter. nusmay be an editorial or secretariat decision. I am of theopinion that the Newsletter could serve as a sounding boardfor new ideas from the members or even as a means to havethe membership present problems in metrology for discussionor comment. Not everyone is able to present such topics atan NCSL conference. I have a problem in mind which I havenot been able to solve and would be interested in llearingfrom other NCSL members.

Our Ca1J.bration Section is responsible for all calibrationscarried out in our facility. Among the items which faU intothis category are different types of eoating thickness

NCSL Newsnotes

measuring instruments. As long as we are dealing with fairlythick coatings or platings, we can mechanically measureplastic or metal foils and calibrate the various instrumentswith full traceability. The problems arise when we try todetermine the accuracy of relatively thin metallic coatings onother metals -- for example, Cadmium on Steel.

Naftali Stern, Research Engineer for New Methods ofMeasurement and Calibration

Editor's Note: There has been some Board guidance in pastyears to not include a "Letters to the Editor" section in the

Newslerter. I have usually handled applvpriate letters by merely

including them here in the Newsnotes section.

I have discussed this with several manufacturers and was toldthat they are aware of the problem but have not been able toget NIST involved with it. The NIST Standard ReferenceMaterial Catalog lists various standards which are alsoavailable, but there are very few which are of interest to us. Ihave also written to NIST and have been told that they havenothing available at this time, but if we were willing to fmancethe development of sueh a standard they would be willing toconsider developing one.

I have written to many different standard laboratories inmany different countries in order to fmd a traceable standardwhich I might purchase. The best known manufacturersenclose a certificate with their standards, indicating that theirstandards are traceable to institutions such as NIST throughthe balances which they use in detennining the thickness

through the weight-area method. This method involves theweighing of a metal substrate before and after applying thecoating. The difference in the weight indicates the thicknessof the plating based on average weight of the platingsubstance divided by the area of the substrate. This doesstretch the credibility of the trace8bility chain.

We are audited by many different agencies and companiesand must show tags on the measuring instruments showingtheir status and traceability. I am sure many other companieshave this problem, yet I have not seen any mention of thetopic at any NCSL or MSC meeting or in any pUblications. Itis possible that the accuracy required by the end users isconsiderably less than the stated accuracy on the instrument,therefore reducing the need for highly accuratemeasurements. But this sort of begs the question. Measuringinstruments and their associated standards must be calibrated.How does one do this without adequate standards? I wouldlike to hear from other calibration labs who have solved thisproblem or at least to fmd out whether we are alone in ourquest for traceability for coating thickness standards such asthose listed in the table below:

Isabelle Mourot, Secretary to Bill Simmons (NCSL PastPresident) at the NASA Stennis Space Center, Mississippiretires after 16 years of service. Isabelle worked for Bill thepast 7 years supporting him as the NCSL Vice President ofMarketing, Executive Vice President, President, PastPresident and currently with the Administrative Guidelines.(Now we see who really did all that good work from Bill'sOffice). The NCSL will miss you Isabelle and we allappreciate the outstanding job and the hard work you've donesupporting NCSL over the years. We wish you well, in yourretirement.

********

Bill Simmons, (left), Past President of NCSL presenting hissecretary, Isabelle Moul"Of (cenrel) with gifts of appreciation

during her retirement party. Debra WilSall (right) Bill's flew

secre/ruy looks on.

A FRIEND OF NeSt R IRES

Certainly, NCSL members seeking help with specific

measwements or plvcesses qualifies for circulation. If there

were enough such requests or "Handy Hints': we could start an

Applications section.

lOu

15r

15u

Coating and Substrate

Cadmium on Copper

Cadmium on Steel

Sn on Steel

Gold on Copper 5u........................

Silver on Copper lOu

- 30-

NCSL Newsnotes

Suggested Topics

Traceability, MeasurementAssessment, Accuracy andTolerancingResearch and Development, NavyPrimary Standards Lab, NavyLiaison, NIST SupportCalibration Procedures,Standards, Facilities/Environment,Etnerging TechnologiesMiniature & Micro Miniature,Mamtenance Testers (GENRAD,etc), Maximizing Fleet MeasurementCapabilityMeasure, CALS data, Micro CSM,MEASURE AIS,SERMIS/AUTOSERDComputer Aided Test SoftwareEvaluation, Diagnostics Assessment,Built - In Test, Design forTestabilityNavy Interface Gages, InterfaceAnalysis, Measurement Science &Acquisition CycleMeasurement Assurance Programand Correlation, Interval Analysis,SPC, Test System Certification,TQL.

'" Fleet Maintenance

'" Measurement DataSystems

'" NIST andthe Navy

'" AcquisitionSupporl Systems

'" Metrology Products

'" Metrology Needs& Uses

* Test Technology

CALL FOR PAPERS

TEST & CALIBRATION SYMPOSIUMImproving Navy Acquisition, Logistics & Maintenance

30 November - 2 December 1994Sheraton National Hotel900 South Orme StreetArlington, Virginja

'" Test ProcessControl

You are invited to participate in the first ever Test andCalibration Symposium hosted by Naval Warfare AssessmentDivision, Measurement Science Directorate. MeasurementScience Directorate serves as the Navy's technical authority

for test, measurement and calibration. This symposium willprovide a forum for exchange of ideas, plus a program toprovide information on Test and Caltbration and how itaffects our collective needs to improve Navy acquiSition,logistics and maintenance.

Include author's name and background, address, phonenumber, and paper title. Complete drafts of accepted paperswill be due 12 August 1994.

Papers/Information:John Shumate (T.C.S. Papers)Measurement Science Directorate (MS 11)Naval Warfare Assessment DivisionP.O. Box 5000

Many of our companies and organizations are involved tosome extent in Technology Transfer. Governmentorganizations are tasked to hand off technology to industry,and industry, in turn, is searching for good ideas to tum intocommercially-valuable products and services.

TECHNOLOGY TRANSF R MAGAZINE

Contact: Technology Transfer8500 Leesburg Pike #7500

Vienna, VA 22182-3932(703) 848-2800

This magazine tries to help with that communication.

WILL THE 1995 CONF£RENCE CHAIRMAN LEASESTAND U ?

Sharfyn Pliest, Frank Bandy'S Administrative Assistant gets

ready to ship off the wOIxing documents for pfanning the 1995col1ference to Dave Nebef of Textronix. Frank stepped up to thepfate at a late hour to take over tire 1994 conference.

-31-

Nancy Thomas, Hewlett-Packard Co., Associated Editor, (415) 857-5197, FAX (415) 857-4598

RE ORTSFROMT GIONS

April 11, 1994

Lockheed SandersNashua, NH

April 12, 1994

Hamilton Standard

Windsor Locks, CT

Steve Griffin

Region 1 Coordinator

Region I hosted approximately 50 NCSL members and guestat our New Hampshire meeting and 42 at the Connecticut

gathering.

Norman Morais, Director of Quality at Lockheed Sanders

welcomed the New Hampshire group. He made a shortpresentation describing Lockheed's mission, products andmarkets.

The first speaker was Jim Himing of Fluke Corporation. Jimdescribed Fluke's ISO 9001 rcgistration process. Jim

presented several thoughtful do's and don'ts for those

considering registration.

Doug Finn of National Instruments made a presentation

about their latest software products, and demonstrated how

they could be used in calibration applications.

Next, Phil Noll and Roger Parker of Hamilton Standard's

Space and Sea International group described a pressure

calibration system they designed called PICAlS. PICALS ishighly automated, very versatile, and easy to use. It consists of

both hardware and powerful software elements. Phil and

Roger utilized the National Instruments Software

demonstrated earlier by Doug Finn.

Milt Towne of Lockheed arraigned for a complimentary lunchin the Lockheed Cafeteria. After a lunch a group photo was

taken.

Sumner Weisman. of General Eastern began the afternoon

with an excellent presentation on the fundamentals of

humidity measurement. Those in attendance were pleased to

learn more about humidity and various humidity measurement

methods.

Many thanks to Milt Towne of Lockheed Sanders for allowingus to use their fine facilities, and for a delicious lunch.

On Tuesday April 11, 1994 the meeting moved to HamiltonStandard, Windsor Locks CT. The group was welcomed by

Don Reth..lce, a Senior Principal Engineer. Don made a

presentation that covered their products and capabilities.

1l1e meeting agenda and speakers were the same as that as

the day before.

Ajit Gokhale of National Instnlment made the software

presentation.

We had the good fortune of having Hamilton Standardengineer Don Rethke (aka Dr. Fluch) made a very humorous

speech about the history of human waste management duringspace travel. This well received talk described the serious

effort taken by NASA to keep out astronauts in good healthduring extended space flight.

Lunch was in Hamilton Standards cafeteria.

Many thanks to Phil Noll for hosting this successful meeting.The meeting room and hospitality were exceUent.

The day finished with a demonstration of both an American

and a Russian space suit. Hamilton Standard is the only

company in the U.S. that designs and builds space suits. Their

engineers explained the differences in features and conceptsbetween the two suits to a fascinated audience. It was the

perfect end to a great meeting.

The day closed after a short business meeting and raffling

several NCSL gifts.

Quality guest speakers are hard to find. This was an

outstanding group. Thank you all!

Plans are being made for a meeting this faU. Please caU me

with any suggestions you may have at (617) 762-9921

ATTENDEES· Nashua, New Hampshire

The final speaker was Bob Myers of Fluke Corporation.

Bob's presentation described the history and evolution of

multifunction cahbrators, and the problems associated with

using them to calibrate today's low priced in,<;truments whichcontain many functions.

The meeting ended after a short business meeting and a rame

drawing for a number of NCSL gifts and a Fluke Philosophy

of Calibration book.

- 47-

Fred Anderson

R. Bacon

Robert Belanger

Ed Blake

Dan BlanchetteRobert BrownNorman Carboneau

Larry Cllrpenter

Lockheed Sanders

Continental Resources

Lockheed SandersTech Serv

Lockheed SandersLockheed SandersMjACommLicl<11eed Sanders

Regional Reports

Du ane Christy RoberL Copetta Michael Decubellis Dave Finch Doug Finn Brett Flegenheimer Dick Gaudet Richard Gore Steve Griffin Mike Giallongo Gary Guilmette Brian Gurney Jim Himing Kathleen Lewis V.I. Lutkus Mario Mecliros John McGuire Paul Migliaccio Dick Miller Bob Myers Norman Nerais LYJU1 Newell Phil Noll Fred Otto Roger Parker Leo Pelletier Charles Piper Jon Paulovecki Andrew Pierce Harvey Relihan Alfred Roy Lou Sabetti Larry Schlecfnqust Richard Schieferstein Walter Smith Robert Stuart John Surret David Tatlebaum Jim Thompson Milt Towne Ken Walsh Sumner Weisman Dick Zemba

Federal Products C.S. Draper Labs Gore Labs Cal Tech National Instrument Lockheed Sanders Polymer Tech Corp. Gore Labs Fluke Flu de Ametek Aerospace Tech Serv Fluke MKS Northrup Quadtech NGS GTE Govt. Systems Lockheed Commercial Fluke Lockheed Sanders Q-C Services Hamilton Standard Quadtech, Inc. Hamilton Standard ESSCO Raytheon Company Federal Products ESSCO Locheed Sanders Raytheon Company Cal Tech Terradyne Q-C Services Lockheed Commercial Sockheed Sanders CalTek Baird Corp. C.S. Draper Labs Lockheed Sanders ESSCO General Eastern Fluke

Tim Anderson James Arbuckle Bill Bechter Donald Black Bob Boynton Paul Bujalski

Group picture, Windsor Locks, CT.

ATTENDEES· Windsor Locks, CT

Pratt & Whitney Northeast Engineering Pratt & Whitney IBM Sikorski AMI

Thomas Carroll Joe Cooper Gus Csuka Michael Dynia Thomas Eshner Richard Gadlowski Ajit Gokhale Clovis Goyetc Steve Griffin Peter Haase Joe Haloburdo Jim Hirning Thomas Koscal Earl Kotsonis Joe Kowlek Richard LaFrenierre Peter McConnell Ken Maker Bernardo Morris Timothy Murphy Bob Myers Tom Oberholtzer Frank Perillo' Van Nguyen Ken Parent Jim Parker Claudio Perigini Rich Pitkin Don Rethke Ken Siwicki Joe Swicklas Bob Toronto Sumner Weisman

IBM Meridan Cooper Fluke State ofCT Pratt & Whitney Hamilton Standard National Instruments Hamilton Standard Fluke

Micromotion Hamilton Standard Fluke IBM Pra tt & Whitney Pratt & Whitney Omega Engineering Pratt & Whitney Pratt & Whitney Auto Systems Lab New England Lab Fluke Meridan Cooper Norden Systems New England Power Pratt & Whitney Pratt & Whitney Fluke Hamilton Standard Hamilton Standard IBM Pratt & Whitney Pratt & Whitney General Eastern

- 48­

Regional Reports

Hamilton Stamlards group picwre.

?- EG/0I\I

2Apri119, 1994Rochester Holiday InnRochester, New YorkJoe MaciagUpper New York SectionCoordinator

Thermometer. After our mid-morning break Peter Ojerholmfrom the Norlon Company gave a presentation on diamondfilm vapor deposition and its applications throughout industryand in particular its application on Starrett measuringequipment. The diamond film is applied to critical wear areasof micrometers and calipers.

The meeting was brought to order by Joe Maciag at 9:00A.M. Introductions, review of agenda, and a preview of the1994 Workshop and Symposium in Chicago were completed.

A five year award pin was presented to Jim Dumaw ofTranscat. A spedal award plaque was presented to MichaelDodds of Caltronix for his efforts in the coordination of thesections recently completed gage block MAP.

The Fluke book "Calibration: Philosophy in Practice" wasshown to the individuals in attendance and it was highlyreconmlended as a reference book for any metrology lab.

Jeff Willey of Hart Scientific gave a presentation ontemperature calibration and the capabilities of the SLlper

- 49-

Afler lunch which was provided by the Eastman Kodak Co.,John P. McGuire of MKS instruments gave a presentation onlow pressure and vacuum instrumentation and calibrationmethods.

The meeti.ng closed out with a group discussion lead by JoeMaciag and John Wehmeyer on the proposed U.S. NationalCalibration Standard ANSI/NCSL 2540-1. We onlyprogressed part way through the specification and we willcontinue reviewing the specification at our next meeting.

The meeting adjourned at 3:15 P.M. Our next meeting willbe hosted by Dexter Electronic Materials located in Olean,N.Y. on Tuesday October 18, 1994.

Joe Maciag

Regional Reports

commercial calibration labs. Concluding his presentation,Mr. Wayman discussed potential changes in the ISOrequirements and their impact on industry.

A panel discussion of VXI instrument related issues broughttogether Mr. Carl Glasow (Tektronix), Mr. Ron Wolfe(National Instruments Inc.), Mr. Ron Shimell (Wavetek), Mr.Doug McCrary (Hewlett-Packard), and Mr. Bill Knox (Giga­Tronics) to discuss VXI instruments, support issues, and theVXI "Plug & Play" Alliance (a group of instrument andsoftware suppliers who have agreed on a policy to make

owning, using, and calibrating VXl instruments easier andless costly). It was clear from the comments made by panelmembers that lack of agreement from industry as a whole stillposes a problem for calibration labs.

An interest was expressed in holding a Region 6 NCSLsection meeting in the south Louisiana area (NewOrleans/Baton Rouge). Jim Patterson, the south sectioncoordinator (210) 522-2702, volunteered to assist in thiseffort. If you are interested in attending a meeting in thisarea please contact him.

Bill JohulsonWayne WaymanTim McGahaLonnie DuttonJay MorganGene ReedDonna ReinsolJim JohnsonCliff ChapmanDavid AustinLance NelsonDon McKenzieBill BrubbsMike GiorgioMack CoveyByrt ScammelMichael MessmerRon KuhlmanRon EubanksRon WolfeDave PatrickClyde Orrison

Tucker ElectronicsW.R. Wayman & Assoc.GEES&RGEES&RData Merketing Assoc.J. Wisdom & Assoc.Reliance CommfTecReliance CommfTecMETRUM ServicesE SystemsESystemsTektronixUniversity of North TexasDSC CommunicationsALCATELAirep Electronics Inc.

Texas Instruments Inc.Texas Instruments Inc.Halliburton Energy ServicesNational InstrumentsData Marketing Assoc.Texas Instruments Inc.

The next Central Section meeting will be lleld on Wednesday,November 9, 1994 at a local site to be announced.

The South Section of Region 6 will meet at the 3MCorporation in Austin TX (6801 River Place Blvd.) on July19, 1994. Call Jim Patterson of Southwest Research Instituteat (512) 522-2702 for details.

ATTENDEES

TIle meeting concluded by drawing for door prizes, whichconsisted of NCSL cups and briefcases, two copies of the newFluke book "Calibration: Philosophy in Practice", and twohandheld D1VlJvIs provided by Fluke and Textronixs. Ourmeeting 110st, Johnny Winters, was presented with a brightyellow NCSL ball cap. If Johnny wears this at work they canspot him easily.

Metrology e.xperls.

UXI Panel discussion.

ESystemsALCATEL1M Test Systems1M Test SystemsWavetek

Giga-TronicsSW Research InstituteJoh Fluke Mfg. Co.Houston Light & PowerCompaq ComputerTektronixAT&TAT&THewlett-PackardHewlett-PackardBoeing Co.Boeing Co.Cal Center Inc.

Tucker Electronics

Luke SmithJerry PriceEd MorrisonKen GarciaRon SchimellBill KnoxJim PattersonJohumy WintersKeith Scog"oinsChris GrachanenCarl GlasowRon GroomKathy MooneyMax MaxinDoug McCraryMike TerpilowskiJames HughesDwight MartinCraig Leong

--------.

- 51-

Regional Reports

Wayne Wayman, ISO issues.

Chris Grachal1el1, TUR calculator.

Feb 2, 1994Compaq Center Headquarters,Houston, TexasJim Patterson, South SectionCoordinator

The winter meeting of South Section, Region 6, NCSL washosted by COMPAQ Computer Corporation. Bob Cummins,COMPAQ Metrology Services coordinated meetingaccommodations at COMPAQ Center Headquarters inHouston. Fifty-two people were in attendance.

Jim Patterson, Section Coordinator, Southwest ResearchInstitute, San Antonio, Texas opened the meeting withintroductions and presented the meeting agenda and majortopics for discussion.

The welcome and introduction to COMPAQ was performedby Bill McDonald, Manager of COMPAQ's CorporareMetrology Services. Steve Gardner, Manager of CorporateServices, COMPAQ Computer Corporation, presented amedia presentation featuring computer teclmology of thefuture previewed at COMPAQ's "Innovate TechnologySununit" conference.

Ronnie Eubanks, NCSL Region 6 Coordinator, Halliburton

- 52-

Energy Services, Dallas, Texas presented past and presentNCSL events. Ronnie inquired if delegate members hadreceived their copy of NCSL introduction video and remindedthem of their annual dues. This lead into a discussionregarding "associate membership" for retired and smallbusiness featuring reduced rates. The "pubhcations onlymembership" for only $100.00 was promoted for those whovalue receiving NCSL publication's, but are not members ofNCSL and have dilIiculty traveling to the meetings. Ronniealso discussed the National Institute of Standards andTechnology (NIST) is accrediting laboratories to ISOGuide 25.

An overview of Region 6 "Round Robin" Programs that are inprocess were also presented by Ronnie Eubanks:RF Power MAP: contact Clyde Orrison, Texas Instruments,Dallas, TexasGuage Block MAP: contact: Clyde Orrison, TexasInstruments, Dallas, TexasPressure MAP: contact: Ronnie Eubanks, Halliburton EnergyServices, Dallas, Texas

Bill Sinunons, former NCSL President, Sverdrup Technology,NASA Stennis Space Center, presented an overview ofcurrent NCSL national news. Bill lead a discussion on the45662.A. as an international standard. Vendor audit issuesregarding acceptance of a new U.S. ANSIjNCSL standard byDOD MIL-STD-45662.A. government agencies andaccreditation fees associated with such a lab a=editationwere discussed. Bill reminded members that the new NCSLAcronym List pubhcation is available from NCSL for $10.00.

Chris Grachanen, Metrology Engineer, COMPAQ MetrologyServices, developed the Tolerance Calculator Windowssoftware apphcation for computer calculation ofinstrumentation specifications. Chris presented the attendeeswith a copy of COMPAQ's Tolerance Calculator Windowssoftware apphcation. Chris demonstrated the features of thesoftware which allows entry of measurement instrumentspecification and then computes total uncertainties based onnominal, range, and floor specification. Attendees werethrilled to receive such a valuable software application.COMPAQ Metrology Services has been granted permissionto release the application to NCSL, as a sharewareapplication.

Dr. Arnold Liu, Quantum Dynamics, gave a presentation onFlow Calibration Technology. Dr. Liu described a variety offlow measurement techniques. Flow measurement primaryspecifications for gas and liquid flow were discussed. Gasflow technologies applied by Quantum Dynamics weredescribed as well as details of utility flow measurementprojects participated in by Dr. Liu.

Mr. Bernard Morris, Automatic Systems Lab, presented anoverview of AC bridge technology applied in temperaturecalibration measurements. The presentation cover usingRTD's for wet and dry bulb measurements for humidity,precision RTD measurement and calendar van dusen scaling

"-_....

Regional Reports

issues, and elaborated on primary standard specifications forhumidity and temperature measurement.

The next NCSL South Texas Section meeting will be hostedby 3M Research Center, Austin, TX on Tuesday, July 19,1994.

An hour long tour of the COMPAQ manufacturing centerand COMPAQ Corporate Metrology calibration andstandards laboratories was conducted at close of the meeting.

Halliburton Energy ServicesCOMPAQ Computer Corp.COMPAQ Computer Corp.Elliot Moser & AssociatesTektronixTektronicFrank W. MurphyManufacturingTektronixCOMPAQ Computer Corp.COMPAQ Computer Corp.NASASIMCOSIMCOSIM:CODow ChemicalCOLCOM Inc.Mensor CorporationMotorola AJEGMensor CorporationSouthwest Research InstituteData MarketingFluke Corpmation

Johnnie Winters is ready for lunch!

Bill Simmons, a Region 6 pioneer.

Ronnie EubanksDave ShimwaySteve GainuDave UptonEd FordCharlie CongerNick Stehnach

Don McKenzieTroy ShuttleworthHarold FosterJose M. OlivarezWalter G. CookFrank SamarskiRon SmithJohn ThibodeauManual SilvaRobert ClaytonButch GuerreroSkip KingJim PattersonMike RiggsDoug Lynde

Dresser MeasurementDresser MeasurementsCOMPAQ Computer Corp.COMPAQ Computer Corp.ASLCOMPAQ Computer Corp.AIRIP ElectronicsPrecision MetrologyASLCOMPAQ Computer Corp.COMPAQ Computer Corp.COMPAQ Computer Corp.Fluke CorporationElliot Moser & AssociatesTALON Technical SalesJM Test SystemsJM Test SytemsQuantum DynamicsSverdrup TechnologyMETRUM ServicesFluke CorporationFluke CorporationCollimystemsRothe DevelopmentTechnical Mardeting GroupTexas InstrumentsUnion CarbideHouston Light and PowerHydril3M

Gary HarrisJohn ManeyAlbert Pefll1eyBill McDonaldBob CummingsMary Ann JusticeByrt ScammelMike LaRoseBernard MorrisMike WildePaulO. MearaRebecca NietoJohnnie L. WinterElliot MoserScott LeidolfKen GarciaCharles FeldnerA.E. LiuBill SinunonsIra CicotteDoug ErnyJim MeeksLou CollinsPeter J. Stemmermafll1Greg BalfoortClyde OrrisonJack HowardKeith Scog"oinsVirgil VaclavikCarl Jantz

Jim Patterson conducted a round table discussion whichcontinued on the topics from the morning session. ClydeOrrison, North Texas NCSL Section Coordinator, led adiscussion on promoting acceptance of ISO 9000 registrationas the quality guideline between customer and suppliers onfuture contracts. The :issue of concern centered aroundreducing the burden of supplier audits through acceptance of

the supplier's ISO 9000 registration.

ATTENDEES

A door prize drawing was held and Don McKenzie won aworld clock donated by COMPAQ, and Virgil Vaclavik won adesk clock also donated by COMPAQ. John Thibodeou'sname was drawn for the Fluke 77 Digital Multimeter donatedby Fluke Corporation, and Butch Guerrero received aTEKTRONIX Digital Multimeter donated by TEKTRONIX.Fluke Corporation donated 4 copies of their new book"Calibration, Philosophy in Practice" for the drawing and theywent to Bernard Morris, A.E. Liu, Bill Simmons, and ButchGurrero. Names were also drawn for NCSL and COMPAQcoffee cups.

- S3 -

Regional Reports

Dave Sanders looks happy!

After the tour of the facilities we reconvened in the'conference room. Tom Kegel presented his paper on SPCand measurement assurance of pressure standards used intheir flow calibration processes. Tom did a good jobe},:plaining how sample variance (within) and actual varianceof the process (between sample) are different and how theyare used to develop the control chart.

After lunch Mark Fritz, Denver, Instruments, presented adiscussion of history and trends in mass calibrations. Heexplained the ANSI classification of weights and how theycame into being. He also discussed the OIML weightclassifications and how they compared with the ANSI classesand the old NIST classes.

We adjourned for lunch at My Brothers Bar (excellent).

Commissioner McLavey explained the function of theDepartment of Agriculture placing special emphasis on thelaboratories. There are basically four labs including theWeights & Measures lab. These labs have the responsibilityto measure the contents of fertilizers, pesticides, and a newlydefmed mission of measuring the water quality of groundwater for contamination by pesticides and fertilizers. There isalso a laboratory which measures cattle blood serum for thepresence of the brucellosis antigens. This lab works inconjunction with the U.S. Department of Agriculture. Theyprocess about 500,000 samples of blood a year.

Once we completed the tours in the main building, BillYoung escorted us to the metrology lab. He e},:plained theirmission and showed us the balance and weight sets used tosupport the field inspectors that calibrate the very largecapacity (up to 120,000 lbs.) scales used to weigh trucks atborder entry stations and at grain elevators. There are sixlarge trucks, three semis and three smaller trucks with anattached cherry picker used to support this mission. Thesmaller trucks handle scales up to about 20,000 lbs. and thesemis carry enough weights to calibrate the scales up to104,OOOlbs. Bill explained an interesting calibration standardthat they had to develop to test grain moisture measuringsets. He prepares pint jars of grain that due to their moisturecontent develop a known capacitance value. These jars ofgrain are then shipped to the field and used to calibrate thefield grain moisture measuring sets. We then visited thelength and mass standards laboratory.

We then broke up into groups for a tour of the laboratories.

March 16, 1994Colorado Dept. of AgricultureLaboratoryDenver, ColoradoRoger Casto Boulder/DenverSection Coordinator

~EG10!\l

6

Jim Patterson has a few things to say.

The Spring meeting of the Region 6, West or RockyMountain section was held at the Colorado Department ofAgriculture Laboratories in Denver CO on March 16, 1994.The meeting was hosted by Bill Young of the ColoradoDepartment of Agriculture Laboratories.

Twenty four people attended the meeting.

In the absence oli Roger Casto, Section Coordinator, BillSorrells of Hewlett-Packard directed the meeting. Bill madethe apologies for Ronnie, Deirdre and Roger and thenintroduced the host Bill Young. Bill explained the logistics oftheir building and how we would handle lunch. He thenintroduced Deputy Agriculture Commissioner RobertMcLavey.

Bill Young gave an interesting talk about VASCAR, RADARand LASER used in traffic enforcement. He explained howVASCAR was not traceable in Colorado, but is used andnever challenged. He then explained the differences betweenthe bands of radar that are used and how they are calibrated.He has a radar tuning fork calibration procedure and lab thatis the basis of how police radars are supported in Colorado.

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Regional Reports

April 27, 1994Sir Sandford Fleming CollegePeterborough, OntarioLes R. PeerCanadian Region Coordinator

0-E. G1 o/VCANADA

Spring Meeting for Region 11, St. Louis Section.

Our expanded spring meeting continues to attract many ofour members and non members.

Vince Musielak from Hewlelf-Packard receiving door pn'ze from

Rick McCoy ofFluke.

Jim Ryan saying good-by to the St. Louis Section. Jim will bemissed, and hope he enjoys Florida.

Beta Raven Inc.Beta Raven Inc.Calser Corp.CMSCoin Acceptors Inc.Coin Acceptors Inc.DynatechDytec South Inc.Dytec South Inc.FlukeHewlett-PackardHewlett-PackardHewlett-PackardISL Corp.Keytek Inst. Corp.Lincoln Ind.McDonnell DouglasMonsantoMonsantoMonsantoMonsantoMonsantoMonsantoMonsantoPromacSherwood MedicalShire Ind.Telogylnc.Telogylnc.TedtronixTransmationWhite-RogersWhite-RogersWhite-RogersWhite-RogersWhite-RogersWhite-RogersWhite-RogersWhite-RogersMidcoast AviationZeuschel EquipGuest

The two books were used for door prized along with Telogyand NCSL coffee mugs. After the drawing, this excellentmeeting came to a close. Hope to see you in September.

ATIENDEES

Keven KlineDavid KuntzmalTom GagenRay SheaBob KrullBruce SavageGary FullerGene PetersonGeorge WilsonRick McCoyBill ErperldingVince Musielak.Ken WibbenmeyerPeter RecenMichail HopkinsPhilip Balbi IIIDennis FilesBryan BickerJoe BunningEric HeiningRobert McDanielsMelynn SchoweMaggie StammeyerGlenn ThompsonDan HerzbergDerris YerlikayaKarl SchmeerDennis EvansJolm LeeJolm PeeblesBob RosenbergScott BrunkJack GrarrickeRon HolohanDe[ena KoellingJohn KuppFen MiddlekauffDavid PerryDon ReedDon YorkRobert ZeuschelJim Ryan

Rick McCoy presenting a copy of Philosophy in Practice

Calibmdon to Section Coordinator Glellil Thompson.

- 56 -

Regional Reports

_.

'Jll

~b~~~j) ._~NT

Jamie Gies, Paul Shillinglaw, Paul Cutmore, Noel B/7ones.

David Dulmage shares accreditation ISO 900 registration

expeJiences.

Graham Cameron •• update 0/1 North Amen'can metrology

activities.

F[ I Itr\'~

;;~r.

Litton SystemsVW CanadaVWCanadaHydro QuebecHydro Quebeclnst. Space, Terest ScienceLitton SystemsTektronix Can Ltdlnterfax Systems Inc.Wavetek/Datron, USAEnvironment Can, NWRlM.TJ. Canada Ltd.Dept. Nt!. Defence, QETEINMS, Nt!. Research CouncilSir Sandford Fleming Col.Canadian MarconiAtmospheric Envir. ServiceGuildline InstrumentsFluke Elect. Can. Ltd.Certelecom LaboratoriesCDN Stds. AssociationStandards Council Can.Pylon Electronics

ATTENDEESWayne SampsonKaren DinniwellDale MaCleodJacques FlamandRobert ArmandJohn HarronGeorge ParkerRoy MaddoxKim EtheringtonAnthony YackovichLes PeerPeter MarchantDec1an McEvoyPaul MCintyreNoel BrionesAdrien MichaudPeter BowmanJames BennettPat StewartDavid DulmageJohn NorthGraham CameronJames Mullins

Plus 11 studentsPaul CutmoerCraig McCormackJames TophamHeather WelchPaul ShillinglawKeith RobinsonJohn EvansPaul LemkeRon BriegelJolm DavisJamie Gibs

Plus 4 facultyNoel BrionesKris SeshadriAdelio DemonteShirley Hartwick

Allthony Yackovich speaks at Canadian Spring Meeting.

- 58 -

Regional Reports

If there is a possibility, please publish this also in the NCSLNewsletter, even though it is late by 4 days from your duedate.

ALIGNEDIES

April 18, 1994Technology Applications, Inc.Fairborn, OhioAmos "Max" GreenSouthern Ohio SectionCoordinator

~EG'0!V

5

Mr. J.S. Raju, Director General (STQC) and adviser, DOEand Regional Coordinator of NCSL USA in India, presenteda paper on "NCSL USA activities in India (STQCDte./DOE)" at the 6th NAM (Non Aligned Movement)Countries Meeting in the sphere of Colombo, Sri Lankaduring 19-21 July, 1994, thus popularizing NCSL program ofUSA in neighboring countries of India Region. The copy ofthe paper (2 pages) was faxed to you, Mr. David Duff and Mr.Wilbur Anson on 21st January 1994.

LA. Namrarri, Addl. DirectorEMail: Namrani@xm.doe.ernet.inSTQC Directorate, Room No. 3075X.Mail: namrani2xrn.doe.ernet.inDepartment of ElectrorricsPhone: (0) 436-0886 & Electronics Niketan, 436-4757 Extn.30756, C G 0 Complex, (R) 687-7370 New, Delhi - 110 003FAX No: +91-11-436-3083

The Spring meeting for the Southern Ohio Section of Region5 was hosted by Max Green and his member companyTeclmology Applications, Inc., Fairborn, Ohio. There werefifteen members present representing eleven corporationsfrom three states.

Group photograph of preseI1t alld pmspec/ive NCSL membersin India laken at the 6th Annual meet of STQC Lab Directorsheld on March 4-5, 1994 at ETDC, Goa.

1. OPULARIZlttG NCSL IN NMOVEMENT(NAM)COUN

5. PARTICIPATIO In NCSL 1994-WORKSHOP ATCHICAGO

Mr. Raju thanks Mr. Ralph E. Bertermann, NCSL President,Mr. L. David Duff, International Director NCSL, Mr. John L.M~ck, NCSL Editor & Mr. Wilbur Anson, NCSL BusinessManager for their active support in providing necessaryinformation & back up material. Mr. Raju also appreciateshis colleague Mr. LA. Namrani for his initiative, secretarialassistance and prompt action on every aspect of the areacoordinator's work.

NCSL activities have picked up in India and a lot oforganizations have shown keen interest in the NCSLmembership and its benefits. It is a pleasure to infonn thaton vigorous membership drive by NCSL India AreaCoordinator, the NCSL membership has grown from 3 in theyear 1992 to seventeen now including CQAL, IDEMI, NIH,ERDA, NPL, BHEL & 11 STQC labs. Few morelaboratories have shown interest to become NCSL membersin the year 1995. Area Coordinator also persued andfollowed up with the NCSL members to renew theirmembership for the year 1994.

4. NCSL MEMBERSHIP DRIVE

It is a pleasure to inform that three technical papers fromIndian NCSL members have been accepted for presentationin the NCSL 1994 workshop & symposium at Chicago in July- August 1994. The accepted papers are "QualityCertification - Indian Scenario" by STQC Scientists viz., Dr.C. Muralikrishna Kumar & Mr. D.S. Rajasekhara. The othertwo authors are Mr. S.K. Kimothi of STQC and Dr. Y.R.Singh of NFL. All these speakers are from the organizations,who are NCSL members.

6. METROLO· Y TRAINING TO FOREIGN NATIONALSFOM COMMONWEALTH COUNTIES

NCSL Awards & Certificates will act as a motivating factorNCSL members to continue working for the betterment ofmetrology. This effort of Area Coordinator was appreciatedby all. The same information was also published in the STQCNewsletter of April 1994 issue.

The Commonwealth India Metrology Centre (CIMET), NPLDelhi has organized a state-of-the-art group training for threeweeks duration from May 23 - June 10, 1994 on metrology to30 participants from 22 commonwealth countries with thehelp of STQC HQ. & ERTL/EIDC (NCSL Members). Thetitle of the training is "TIle role of Metrology in Qualitymanagement and Quality improvement", covering calibrationphilosophy, standards & ISO 9000, where STQCscientists/engineers will be delivering technical talks inaddition to practical demonstrat~on at ERTL (N), Delhi andETDC, Jaipur. A similar training progranune was alsoorganized in the year 1992 by NPL & STQC (both NCSLmembers), which was very much] by all the participants.

- 60-

NC ,L BOARD 0 DIRECTORS1994

EPRESENTATlVE TO TI-JE BOARDDr. Roy VanKoughnettNatl. Res. Council of CanadaInst. for Natl. Meas. Stds.Ottawa, Ont. K1A OK6 Canada(613) 993-9326 FAX(613) 952-5113

50 TREASURER *Kevin M. RuhlTRW Space & Electronics GroupS/2767One Space ParkRedondo Beach, CA 90278(310) 812-1430 FAX(310) 812-8828

61 NIST REPRESENTATlVE TO THE BOARD

TBA

10 PRESIDENT '"Ralph E. BertermannAbbott LaboratoriesDept. 736-M41400 Sheridan Rd.N. Chicago, IL 60064(708) 938-9114 FAX(708) 937-4634

20 EXECUTlVE VICE PRESIDENT *William F. DoyleAT&T Capital Corp.P.O. Box 619260DFW Airport, TX 75261-9260(214) 456-4033 FAX(214) 456-4162

30 PAST PRESIDENT *James M. IngramGuildline Instruments, Inc.21 Gilroy St., Box 99Smiths Falls, Ont. K7A 4S9 Canada(613) 283-3000 FAX(613) 283-6082

L,.

190 VP - CONFERENCE MANAGEMENTAnthony AndersonGuildline Instruments, Inc.103 Commerce St., Suite 160Lake Mary, FL 32746(407) 333-3327 FAX(407) 333-3309

- 67-

40 SECRETARY *Jeff TaylorLockheed Aeronautical Systems Co.Dept. 59-13, Z-038686 S. Cobb Dr.Marietta, GA 30063(404) 494-2900 FAX(404) 494-3219 *Executive Committee Members

OPERATIONS VICE PRESLD S120 VP • OPERA1l0NS & MARKETlNG 160 VP - EDUCA1l0N & TRAINING

Gary ShUler Don DaltonDuke Power Co. Fluke CorporationMG03C1 MS: 275G13339 Hagers Ferry Rd. P.O Box 9090Huntersville, NC 28078 Everett, WA 98206-9090(704) 875-5767 FAX(704) 675-5509 (206) 356-6452 FAX(206) 356-5992

1,70 VP - QUALITY PROGRAMSDave AbellHewlett PackardMS: 36UT100 MayfieldMountain View, CA 94043(415) 691-5878 FAX(415) 691-5676

180 VP • LABORATORY RESOURCESRandall G. SeefeldtNavy Primary Standards LabCode 06501, Bldg. 469San Diego, CA 92135-7058(619) 545-8849 FAX(619) 545-7203

130 VP • LABORATORY SYSTEMS MANAGEMENT-. Brian Fitzpatrick

Hi-Tech, Inc.8223 Cloverleaf Dr., Ste. 126AMillersville. MD 21108(410) 987-4000 FAX(410) 987-4034

140 VP - MEASUREMENT SCIENCE & TECHNOLOGYDr. Thomas J. HuttemannEastman Kodak Co.Bldg. 23, FI. 4Corporate Metrology CenterRochester, NY 14652-4327(716) 477-8683 FAX(716) 477-0569

150 VP - INDUSTRIAL PROGRAMSWilliam F. QuigleyHughes Missile Systems CO.MIS 805/LL1P.O. Box 11337Tucson, AZ 85734-1337(602) 794-1042 FAX(602) 794-2328

DIVISION VICE PRESIDENTS200 VP - EASTERN DIVISION (Regions 1, 2, 3, 4, & 5) 400 VP • WESTERN DIVISION (Regions 7, 8, & 9)

Georgia Harris Mike SuraciNCWM, NIST Lockheed Missiles & Space Co.Office of Weights & Measures NSB BangorBuilding 101, Room A617 P.O. Box 6429Gaithersburg, MD 20899 Silverdale, WA 98315-6429(301) 975-4014 FAX(301) 926-0647 (206) 396-4024 FAX(206) 396-6878

300 VP - CENTRAL DIVISION (Regions 6 & 11) 1000 VP - INTERNA1l0NAL DIVISION (Regions 10 & 12)Deirdre J. Lavallee L. David DuffMKS Instruments, Inc. A-Metrology-Z5330 Sterling Dr. 2851 Senour Rd.Boulder, CO 80301 Indianapolis, IN 46239(303) 449-6841 FAX(303} 442-6880 (317) 862-0068 FAX(317} 862-0068

NCSL COMMITrEE CHAIRMA1994

OVERNMENT AFFAIRSMike SuraciLockheed Missiles & Space Co.NSB BangorP.O. Box 6429Silverdale, WA 98315-6429(206) 396-4024 FAX:(206} 396-6878

120 VP • OPERATIONS & MARKETINGGary Shuler

121 NCSL BUSINESS MANAGERWilbur J. AnsonNCSL1800 - 30th St., Suite 305BBoulder, CO 80301(303) 440-3339 FAX(303) 440-3384

133 EQUIPMENT DOCUMENTATIONHugh FelgerGeneral Fiber Optics, Inc.98 Commerce Rd.Cedar Grove, NJ 07009(201) 239-3400 FAX(201} 239-4258

140 VP - MEAS. SCIENCE & TECHNOLOGYDr. Thomas J. Huttemann

141 AUTOMATIC TEST & CALIBRATION SYSTEMSDavid NebelTektronix, Inc.3131 Newmark Dr., Suite 206Miamisburg, OH 45342(513) 438-1166 FAX(513} 438-1106

142 MEASUREMENT ASSURANCE PROGRAMSJames C. WheelerNavy Primary Standards LabCode 363C, Bldg. 469NADEP North IslandSan Diego, CA 92135-7058(619) 545-9698 FAX(619} 545-9861

143 NA110NAL MEASUREMENT REQUIREMENTSLaurie H. BakerRockwell InternationalDE Metrology, MS-HC023370 Miraloma Ave.Anaheim, CA 92803(714) 762-7864 FAX(714} 762-2674

144 INTRINSIC & DERIVED STANDARDSDr. Richard PettitSandia National LaboratoriesDept. 1742, MS: 0365P.O. Box 5800Albuquerque, NM 87185(505) 844-6242 FAX(505} 844-4372

145 NAn... MEAS. REQUIREMENTS OF CANADAWayne SampsonLitton Systems Canada, ltd.249 Aerotech Dr., Box 960Enfield, NS 80N 1NO Canada(902) 873-2000 x510 FAX(902) 873-2173

122 PUBLICITYAnthony AndersonGuildline Instruments, Inc.103 Commerce St., Suite 160Lake Mary, FL 32746(407) 333-3327 FAX(407} 333-3309

123 NEWSLETTERJohn MinckHewlett PackardVID Div. Bldg. 52UVA5301 Stevens Creek Blvd.Santa Clara, CA 95052(408) 553-3891 FAX(408) 553-3905

124 ADMINISTRATIVE GUIDEL1NES & BY-LAWSBill SimmonsSverdrup Technology, Inc.Room 8208, Bldg. 1105Stennis Space Center, MS 39529(601) 688-3192 FAX(601} 688-7694

125 HONORS & AWARDSFrieda A. EvaskisAT&T653 Mainstream Dr.Nashville, TN 37228(615) 242-1909 FAX(615} 242-1969

John Miche (Co-Chair)Marine Instruments1405 S. 58th St.Richmond, CA 94804(510) 232-9569

150 VP - INDUSTRIAL PROGRAMSWilliam F, QUigley

151 HEALTHCARE METROLOGYRuss Roberson (Co-Chair)Baxter HealthcareRte. 120 & Wilson Rd.Round Lake, IL 60073(708) 270-3668 FAX(708} 270·3699

153 UTl L1Tl ESJohn Ragsdale (Co-Chair)Tennessee Valley AuthorityMS: PSC 1B-C11 01 Market St.Chattanooga, TN 37402-2802(615) 697-4273 FAX(615) 697-4137

- 68-

BERSHIPF"---"'-_ Kent HuHman

AT&T Capital Services1830 W. Airfield Dr.P.O. Box 610408DFW Airport, TX 75261(214) 456-4007 FAX(214) 456-4059

130 VP • LABORATORY SYSTEMS MGMTBrian Fitzpatrick

LABORATORY HEALTH & SAFETYRoger L. HickeyMcDonnell-Douglas AerospaceMetrology Laboratory5301 Bolsa Ave., MS: T51Huntington Beach, CA 92647(714) 896-2580 FAX(714) 896-1313

132 LABORATORY FACIL1TlESFranklin S. BandyUnified Industries, Inc.7530 Fullerton Ct.Springfield, VA 22153(703) 569-0670 FAX(703) 569·5760

iNCSL COM I ITTEE CHA RMAN (Cont'd)

H4 TQM COMM. ON CAU' . SYS. REQUIREMENTS. . Gary Davidson

TRW Space & Electronics GroupS/2767One Space ParkRedondo Beach, CA 90278(310) 812-1388 FAX(310} 814·8797

175 INTl. MEASUREMENTS COORDINAllONGraham CameronStandards Council of Council1200-45 O'ConnorOttawa, ON K1 P 6N7 Canada(613) 238-3222 FAX (613) 995-4564

153 UTlLlllES (Cont'd)Jack Burdick (Co-Chair)Southern California Edison7300 Fenwick Ln.Westminster, CA 92638(714) 895-0422 FAX(714} 895-0665

154 PETROLEUM INDUSTRY METROLOGY

TBA

160 VP - EDUCATION & TRAI INDon Dalton

161 TRAINING RESOURCESBill SorrellsHewlett-Packard24 Inverness Place EastEnglewood, CO 80112(303) 649-5231 FAX (303) 649-5787

180 VP • LABORATORY RE OURCESRandall Seefeldt

181 GLOSSAFlY

TBA

1;62 TRAINING INFORMATlON DIRECTORYDave LorenzenMcDonnell Douglas AerospaceMetrology Lab, M/S T515301 Bolsa Ave.Huntington Beach, CA 92646(714) 696-4574 FAX(714) 896-1604

163 PERSONNEL TRA!NING REQUIREMENTS

TBA

162 COMPENDIUMDon DowellRaytheon Semiconductor Div.350 Ellis St.Mountain View, CA 94039-7016(415) 966-7792 FAX (415) 969-8556

183 EQUIPMENT MANAGEMENT FORUM. Charles A. Motzko

Telogy, Inc.150 Shoreline Dr.Redwood City, CA 94065(800) 835-6494 FAX(415) 592-2618

190 VP • CONFERENCE MANAGEMENTAnthony Anderson

191 SIll: SELECllONAnthony AndersonGuildline Instruments, Inc.103 Commerce St., Suite 160Lake Mary, FL 32746(407) 333-3327 FAX(407) 333-3309

194 CONFERENCE DIRECTOR 1994Dr. Thomas J. HuttemannEastman Kodak Co.Bldg. 23, FI. 4Corporate Metrology CenterRochester, NY 14652-4327(716) 477-8683 FAX(716} 477-0569

195 CONFERENCE DIRECTOR 1995Randall G. SeefeldtNavy Primary Standards LabCode 06501, Bldg. 469San Diego, CA 92135-7058(619) 545-8849 FAX(619} 545-7203

196 CONFERENCE DIRECTOR 1996James M. IngramGuildline Instruments, Inc.21 Gilroy St., Box 99Smiths Falls, Ont. K7A 4S9 Canada(613) 283-3000 FAX(613) 283-6082

164 EDUCAllON SYSTEM LIAISONThomas KimbrellTexas State Technical CollegeInstructional Div.P.O. Box 11197Amarillo, TX 79111(806) 335-2316 FAX(806) 335-3414

170 VP • QUALITY PROGRAMSDave Abell

171 LABORATORY EVALUA110N- Leroy Britain

Quality Technologies, Inc.6960 Madison Ave. WestGolden Valley, MN 55427(612) 593-7617 FAX(612} 593-7620

172 CAUBRATlON SYSTEMSJohn Wade Keith IIIMcDonnell Douglas AerospaceMS: T-515301 Bolsa Ave.Huntington Beach, CA 92647(714) 896-9599 FAX(714) 896-1313

173 CALIBRAllON INTERVALSHoward CastrupIntegrated Sciences Group14608 Casitas Canyon Rd.BakersHeld, CA 93386(805) 872-1683 FAX(805) 872-3669

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N SL R NAL C ' RDINA '0 S1994

REGION 1 (210)Steve GriffinFluke Corporation78 Margery LaneWestwood, MA 02090(617) 762-9921 FAX(617} 255-8841

REGION 4 Central FlorIda Section (242)Bob HansonFluke Corporation550 S. North Lake Blvd.Altamonte Springs, FL 32701-5227(407) 331-4881 FAX(407} 331-3366

REGION 2 Huntsville Section (243)Robert LovillTektronix, Inc.4970 Corporate Dr. Suite 100Huntsville, AL 35805(205) 830-9212 FAX(205) 837-2666

REGION 4

REGION 5 (250)David NebelTektronix, Inc.3131 Newmark Dr., Suite 206Miamisburg, OH 45342(513) 438-1166 FAX (513) 438-1106

(220)John A. WehrmeyerEastman Kodak Co.Corporate Metrology CenterBldg. 23, Floor 4Rochester, NY 14652-4327(716) 477-8891 FAX:(716) 477-0569

REGION 2 New York City Section (221)Gary HornITT Avionics100 Kingsland Rd.Clifton, NJ 07014(201) 284-2214

REGION 2 Upstate New York Section (222)Joseph MaciagMoog, Inc.Seneca & Jamison Rd.E. Aurora, NY 14052-0018(716) 687-4689

REGION 5 Northern Ohio Section (251)James A. CraneKeithley Instruments, Inc.28775 Aurora Rd.Cleveland, OH 44139-1891(216) 498-2904 FAX(216) 248-6168

-REGION 5 S. Ohio/Kentucky Section (252)

Amos "Max" GreenTechnology Applications, Inc.Suite 1003040 Presidential Dr.Fairborn, OH 45324-6272(513) 427-2663 FAX(513) 427-0913

REG'ION 5 Central Indiana Section (253)James C. GuyNAWC Aircraft Div.PTT Calibration Services6000 E. 21 st St.Indianapolis, IN 46219-2189(317) 353-3935 FAX(317) 351-4373

REGION 5 Northern Indiana Section (254)Jerry DrakeGTE NorthP.O. Box 270Fl. Wayne, IN 46801-0270(219) 428-6127 FAX(219} 424-1031

REGION 2 Philadelphia Section (223)Gary FosterAmerican Electronics Labs, IncBox 552Lansdale, PA 19446(215) 822-2929 x2403 FAX(215) 822-9165

REGION 2 Pittsburgh Section (224)Donald DrumButler County Community CollegeMetrology CenterCollege Rd, Oak HillsButler, PA 16001(412) 287-8711 FAX(412) 285-6047

REGION 3 (230)Tracy HarperBaltimore Gas & Electric Co.1000 Brandon Shores Rd.Baltimore, MD 21226-1746(410) 787-5387 FAX:(410) 787-6408

REGION 4 (240)Ernie SharpHewlett Packard Co.2000 S. Park PI.Atlanta, GA 30339(404) 980-7463 FAX(404) 988-3617

REGION 5 Michigan Section (255)Joe KoselKelsey-Hayes Co.Bldg. 438481 Huron River Dr.Romulus, MI 48174(313) 942-5179 FAX(313) 942-5156

REGION 4 Atlanta Section (241)

TBA

SL REGIONAL COOR NATORS (Co 'd)REGION 8 Phoenix-Tucson Section (424) (Acting)

Wayne BendaHughes Missile Systems Co.Bldg. 801, MS/N26P.O. Box 11337Tucson, AZ 85734(602) 794-4483 FAX(602) 794-5658

REGION 9 (430)Dave AgyFluke CorporationMS: 275GP.O. Box 9090Everett, WA 98206-9090(206) 356-5471 FAX(206) 356-5992

REGION 10 INTERNATIONAL REGION (1000)

REGION 10 Mexico Area (1011)Roberto BenitezMetricaP. Urios #3238 Rib. del RioGuadalupe, N.L. 67160 Mexico011-52-83-378376 FAX:011-52-83-378376

REGION 6 (310)Ronnie EubanksHalliburton Energy ServicesP.O. Box 819052Dallas, TX 75381-9052(214) 418-4034 FAX(214) 418-4380

REGION 6 Central Texas Section (311)Clyde OrrisonTexas Instruments, Inc.MS 264P.O. Box 655474Dallas, TX 75265(214) 995-5031 FAX(214) 995-4802

REGION 6 South Texas Section (312)Jim PattersonSouthwest Research Institute6220 Culebra Rd.P.O. Drawer 28510San Antonio, TX 78228-0510(210) 522-2702

,-

REGION 10 Japan Area (1015). . Katsumi Yokoi

Yokogawa-Hewlett-Packard9-1 Tankakuracho, HachiojiTokyo, 192 Japan011-81-426-42-1235 FAX:011-81-426-426692

'REGION 10 Great Britain Area (1012)Mike HutchinsHewlett Packard, Ltd.Customer Support CenterEskdale Road, WinnershWokingham, Berkshire RG11 50 England011-44·734-696·622 FAX:011-44-734-274377

REGION 10 Israel Area (1013)Grisha DeitchNational Physical LaboratoryGivat RamDanzinger "A" Bldg.Jerusalem, 91904 Israel011·972-2-584475 FAX:011-972-2-243130

REGION 10 TaIwan Area (1014)Nigal JouCenter for Meas. Stds. ITRI321, Sec. 2, Kuang Fu RoadHsinchu, Taiwan 30042 R.O.C.011-866-35-721321 FAX:011-886-35-716231

REGION 6 Boulder/Denver Section (313)Roger CastoThe Gates Rubber Co.MD: 45-1-1-AP.O. Box 5887Denver, CO 80217-5887(303) 744-4068 FAX(303) 744-5896

(410)Joe SiecinskiHewlett Packard321 E. Evelyn Ave.Mountain View, CA 94039-7051(415) 694-2345 FAX(415) 694-2376

REGION 8 (420)Wayne BendaHughes Missile Systems Co.Bldg. 801, MS/N26P.O. Box 11337Tucson, AZ 85734(602) 794-4483 FAX(602) 794-5658

REGION 8 LA,Nalley Section (421)Brian ConroyTeledyne Systems Co.MS: 3319601 NordhoH St.Northridge, CA 91324(818) 717-6872 FAX(818) 717-6881

LA/Orange Co. Section (422)David S. CollinsGTE West2979 Inland Empire Blvd.Ontario, CA 91764(909) 945-2317 FAX(909) 945-5664

REGION 8 San Diego Section (423)Carl LucasNavy Primary Standards LabCode 065, Bldg. 469San Diego, CA 92135-7058(619) 545-9705 FAX(619) 545-9861

10 India Area (1016)Joseph Satya RajuSTQC DirectorateDept. of Electronics6, C.G.O. ComplexNew Delhi, 110003 India011-91 (11 )-436-2831 FAX:011-91 (11 )-436-3083

REGION 10 Nordic Area (1017)Kurt JensenHewlett-Packard A/SKongevejen 253460 Birkeroed, Denmark011-45-4599-1275 FAX:011-45-4281-5810

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N - S REGt:Q L COORD ATORS (Cont'd)

REGION 10 France Area (1018)Jean Claude KrynickiHewlett-Packard, FranceZi de CourtaboeufLes Ulis, 91947 France011-69-826122 FAX:011-33-1-69-826061

REGION 10 Switzerland Area (1019)Denis PerrinLeCroy SA2 CH. Pri de la FontaineCH-1217 Meyrin 1Geneva, Switzerland011-41-22-719-2111 FAX:011-41-22-782-3915

REGION 12 Canada Region (1200)Les R. PeerEnvironment Canada, CCIWNational Water Research Institute867 Lakeshore Rd., Box 5050Burlington, Ont. L7R 4A6 Canada(905) 336-4893 FAX(905) 336-4989

12 Canada Region SecretariatMarilyn RossDept. National DefenceQuality Engineering Test Estab.QETE 11 80-14/N2Ottawa, Ont. K1A 0K2 Canada(819) 994-1189 FAX(819) 997-2523

REGION

REGION

REGION

REGION

REGION

11 (320)Herb O'NeilHutchinson Technical College2 Century Ave.Hutchinson, MN 55350-3183(612) 587-3636 FAX{612) 587-9019

11 Twin CitIes Section (321)Roger ZemaitisDytec InstrumentsSuite 3397600 Park Lawn Ave.Edina, MN 55435(612) 831-7169 FAX(612) 831-5114

11 Chicago Section (322)Tom WaltrichNSC Technologies601 E. Kensington Rd.Mt. Prospect, IL 60056(708) 506-2321

11 SI. Louis Section (323)Glenn ThompsonMonsantoMS: HH2B700 Chesterfield Village Pkwy.Chesterfield, MO 63017(314) 537-6794 FAX(314) 537-6098

11 Kansas City Section (324)Leon BarnesAllied-Signal Aerospace Co.P.O. Box 419159, MS: D/422 BR28Kansas City, MO 64141-6159(816) 997-5480 FAX (816) 997-3856

REGION

REG10N

REGION

REGION

REGION

12 Eastern Canada Area (1210)Wayne SampsonLitton Systems Canada, Ltd.249 Aerotech Dr., Box 960Enfield, NS BON 1NO Canada(902) 873-2000 x510 FAX(902) 873-2174

12 Quebec Area (1220)Adrien MichaudCanadian Marconi2442 Trenton Ave.Town of Mt. RoyalMontreal, Que. H3P 1Y9 Canada(514) 341-7630 x4074 FAX:(514) 340-3149

12 Eastern 0 ntario Area (1230)Tim MellAllied Signal Aerospace CanadaMetrology Services1010 Spence Ave.Hawksbury, Onto K6A 3H9 Canada(613) 632-4184 FAX(613) 632-3278

12 Western OntarIo Area (1240)George ParkerLitton Systems Canada, Ltd.MS; 413-1-E25 Cityview Dr.Etobicoke, Ont. M9W 5A7 Canada(416) 249-1231 X2565

12 Western Canada Area (1250)Satoshi NishieMiller Instruments, Ltd.#1-3871 N. Fraser WayBurnaby, BC V5J 5G6 Canada(604) 431-8882 FAX(604) 431-8714

901 PRECISION MEASUREMENTS ASSOC.

TBA

902 GIDEP METROLOGY COMMITTEEJim CarltonGIDEP Operations CenterP.O Box 8000Corona, CA 91718-8000(909) 273-4677 FAX(909) 736-5200

ElEGATES

903 MEASUREMENT SCIENCE CONFERENCEChet CraneTeledyne MicroelectronicsMS: 2912964 Panama St.Los Angeles, CA 90066(310) 574-2027 FAX(310) 574-2093

904 OIMLHenry SostmanHenry Ernst Sostman, P.E.613 Wagon Train Dr. SEAlbuquerque, NM 87123-4135(505) 275-2489 FAX(505) 294-6153

~----

-72-

LIAISON D LE TES (Cont'd)

John LockeAmerican Assn. tor Lab Accreditation656 Quince Orchard Rd. #304Gaithersburg, MD 20878-1409(301) 670-1377

915 IMEKOMike SuraciLockheed Missiles & Space Co.NSB BangorP.O Box 6429Silverdale, WA 98315-6429(206) 396-4024 FAX(206) 396-6878

906 ANSi~~- .._--

907 CPEM

Robert R. SmithLORAL Aeronutronic29947 Avenue de las BanderasP.O. Box 7004, Met LabRancho Santa Margarita, CA 92688-7004(714) 459-4535 FAX(714) 459-3885

Norman B. BeleckiNISTBldg. 220, Rm. B258Gaithersburg, MD 20899(301) 975-4223 FAX(30i) 926-3972

916 AlAAlan PainterBoeing Aerospace & ElectronicsM.S.2T-40P.O. Box 3999Seattle, WA 98124-2207(206) 544-5382 FAX(206) 544-5479

917 AMERICAN VACUUM SOCIETY

TBA

90B ASaC

TBA

918 PARENTERAL DRUG ASSOCIATlONDave DuffA-Metrology-Z2851 Senour Rd.Indianapolis, IN 46239(317) 862-0068 FAX(317) 862-0068

9~9 AMERICAN PHYSICAL SOCIETYDr. Klaus JaegerLockheed Missiles & Space Co.Bldg. 195A, 0/48-70P.O Box 3504Sunnyvale, CA 94088-3504(408) 756-0270 FAX(408) 742-4435

920 ASME THREADED FASTENERSRichard R. HymanNavy, Dept. ofCode 134, Bldg. 240Portsmouth Naval ShipyardPortsmouth, NH 03804-5000(207) 438-5438 FAX(207) 438-5450

921 INTI... LAB ACCREDITATlON CONF.Dr. Jack PerrowStandards Council of Canada45 O'Connor St., Suite 1200Ottawa, Ont., K1 P 6N7 Canada(613) 238-3222 FAX(613) 995-4564

911 IEEE I&MNorman BeleckiNISTElectricity Div.Bldg. 220, Rm. B146Gaithersburg, MD 20899(301) 975-4223 FAX(301) 926-3972

909 INSlRUMENT SOCIETY OF AMERICAMike Suracilockheed Missiles & Space Co.NSB BangorP.O. Box 6429Silverdale, WA 98315-6429(206) 396-4024 Fax(206) 396-6878

910 W.E.C.C.Graham CameronStandards Council of Canada1200-45 O'ConnorOttawa, Ontario Ki P 6N7 Canada(613) 238-3222 FAX(613) 995-4564

912 A2LAPeter S. UngerAmerican Association

for laboratory Accreditation656 Quince Orchard Rd. #704Gaithersburg, MD 20878(301) 670-1377 FAX(301) 869-1495

922 BRITlSH MEAS. & TESTING ASSOC.

TBA

913 CORMDr. Thomas J. HuttemannEastman Kodak Co.Corporate Metrology CenterBldg. 23, FI. 4Rochester, NY 14652-4327(716) 477-8683 FAX(716) 477-0569

923 AMER. MEAS. TOOL MFG. ASSOC.C. Welles JathoAMTMA1100 Woodward, Suite 120Bloomfield Hills, MI 48304-3970(313) 642-3312 FAX(313) 645-0749

IAI ON DEL GA ES (Cont'd)

924 ASSN. FOR ADV. OF MED. INSTRUM. (AAMI)Marc NachmanNachman Precision Systems, Inc.1257 Parkside PlaceVirginia Beach, VA 23454(804) 481-0013 FAX(804) 481-0013

926 ASQC/Measurement Quality DivisionJoe SimmonsNISTBldg. 411, Room A104Gaithersburg, MD 20899(301) 975-2005 FAX(301) 926-2884

92'9 NORTH AMERICAN CALIBRATION COOP. (NACC)Joe SimmonsNIST~dg. 411, Room A104Gaithersburg, MD 20899(301) 975-2005 FAX(301) 926-2884

930 INS1'ilTUTE OF ENVIRONMENTAL SCIENCES (IES)Robert L. MielkeAbbott LaboratoriesDept. 736, M41400 Sheridan Rd.N. Chicago, IL 60064(708) 938-9111 FAX(708) 937-4634

931 NAn. STANDARDS AUTH. OF IRELAND (NSAI)Stanley Salot, Jr.Natl. Standards Authority of IrelandSuite 23239159 Paseo Padre Pkwy.Fremont, CA 94538(510) 713-0292 FAX(510) 713-0294

925 NATL. CONF. OF WEIGHTS & MEASURESGeorgia HarrisNCWM, NISTOffice of Weights & MeasuresBuilding 101, Room A617Gaithersburg, MD 20899(301) 975-4014 FAX(301) 926-0647

926 ASIA/PACIFIC METROLOGY PROGRAMTony RochaHong Kong GovernmentStandards & Calibration Lab36/F Immigration Tower7 Gloucester Rd., Hong Kong011-852 829 4828 FAX:011-852 824 1302

927 AMMAC- Roberto Benitez

MetricaP. Urios #3238 Rib. del RioGuadalupe, N.L. 67160 Mexico011-52-83-37-8376 FAX:011-52-83-378376

H INTEREST D I ARTI ES

CONTRIBUTlNG EDITOR FOR MIL-C-45662Director, US Army TMDE ActivityAttn: Wesley F. McElveenAMXTM-MPRedstone Arsenal, AL 35898-3375(205) 876-5982 FAX(205) 876-3375

1994 NCSL WORKSHOP & SYMPOSIUMJury 31-August 4, 1994 • Chicago, Illinois

VP/Conference ManagementConference Director .Conference CoordinatorAssistant Cont. CoordinatorConference RegistrationExhibit Chairman .Program Chairman .

Session Developers:Theoretical .Technical .Management .

Guest Program Chairman .Publicity Chairman .Finance Chairman .Best Paper ChairmanConference Evaluator .....Speakers/Entertainment .Door Prizes .

Anthony AndersonTom HuttemannRoland VavkenBrian FitzpatrickWilbur AnsonDean BrungartFrank Bandy.

Klaus JaegerDave NebelJoseph Maciag

Mary FroegelAnthony AndersonKevin RuhlDon DaltonDon DaltonDave AbellMike Suraci

(407) 333-3327(71 6) 477-8683(602) 445-6255

(303) 440-3339(818) 991-7631(703) 569-0670

FAX (407) 333-3309FAX (716) 477-0569FAX (602) 445-6255

FAX (303) 440-3384FAX (818) 991-7631FAX (703) 569-5760

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AVERAGE NCSL MEMBER LABORATORY (ASSUMPTIONS BASED FROM THE 1993 NCSL SURVEY RESULTS)

.. Consists of 10 personnel: -7 (6.9) Technicians -2 (2.3) Support Personnel -1 (0.8) Manager

.. It's a U.S. Laboratory

.. 58% chance that it's a combined calibration and standards laboratory

.. 55% chance that it's a private lab (primary support is not commercial or government)

.. 54% chance that it supports less th.atl 5000 calibrations per year

.. 76 chance that the average c-ycle time is less than 10 days oj! 74% chance that rhe average in-wlerance percentage is greater than 90% .. 69% chance that the average in-tolerance percentage is greater than 90 oj! 53% chance it participates in MAP's .. 90% chance that it works with end users to define equipment needs .. 51% chance that it will participate in a voluntary laboratory accreditation program .. 53% chance that it provides equipment pick-up and delivery service for it's customers .. 79% chance that it performs on-site/in-situ calibration support

NCSL Calibration Systems Committee

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