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ECE 5616Curtis
Using Stock Optics
• What shape to use• X & Y parameters
• Please use achromatics• Please use camera lens• Please use 4F imaging systems• Others things• Data link
ECE 5616Curtis
Stock OpticsSome comments
• Advantages– Time and cost– Can still choose custom coatings (typically)– If vendor is good can eventually transfer quality measurement to
vendor after process is established.• ALL optics have to be inspected before being used for quite some
time.• Disadvantages
– Limited performance choices in EFL, lens diameter, and function.– Most lenses are design for infinite conjugates and visible
wavelengths– Part can be obsolete even if you are buying it. Must confirm supply
if used in production and guarantee transition time if part is to be discontinued.
– Vendor can go out of business.– Vendor quality can vary dramatically with time as they change
suppliers. Even the most simple things can be messed up. The vendor’s ability for SQE can vary a lot.
ECE 5616Curtis
What shape lens should I use ?Aberrations using Thin Lenses
Shape Parameter X
ECE 5616Curtis
Aberrations using Thin Lenses
ECE 5616Curtis
Spherical Aberration for a thin lens
ECE 5616Curtis
Thin Lenses approximation
ECE 5616Curtis
Summary Chart from Smith
Note direction of flat side of plano convex lens – toward the focus. This is the correct way to use it.
ECE 5616Curtis
When ever possible use camera lensNikon AF Micro-Nikkor
105mm f/2.8
Wavelength range is ~450 to 680nmUse in 4F system for imaging, collimators, or imaging at distance
ECE 5616Curtis
Camera Lenses in 4F
• Put film side of lens (BFP) toward image/object and set focus in infinity• Alignment – back propagate Plane Wave to put focus on Image/Object and set distance between lenses with a PW though both lens and a shear plate.• Most camera lenses have FFP INSIDE lens if EFL is less than ~60mm• Magnification use different EFL for first and second lens.
ObjectImage
ECE 5616Curtis
Stock LensesUse 4F system for imaging
• Two achromatic doublets corrected for infinite conjugate– Narrow field flatter surface towards image/object– Wider fields reverse orientation works better
• Limited Field with really good performance• Ratio of Focal length is magnification• Why 4F systems ??? - symmetrical systems about the stop
(between the lens) then the system is free of coma, distortion, and lateral color.
• Also 4F is telecentric and is insensitive to image/object position.
ECE 5616Curtis
Stock LensField Lens
Use a field lens to flatten the field (Eliminates Petzval Field Curvature with little effect on other aberrations). Use a negative lens to flatten field resulting from positive elements.
ECE 5616Curtis
Stock LensesSplitting elements
Reduce SA by factor of 5 by using two lenses together
ECE 5616Curtis
Stock LensesPlacement of Stop
ECE 5616Curtis
Stock LensesHigher NA – alignment of lenses
ECE 5616Curtis
Stock LensesGeneral considerations
• Please use achromatic doublets. Much better SA – at F#2 can get diffraction limited focus from achromat but not PC lens.
• Accuracy of EFL is typically better for achromatic doublet lens than singlet.
• Remember to get correct AR coating.• Pick correct material for lens depending on wavelength (BK-7 or fused
Si are typical choices)• Look at scratch and dig (quality) and surface quality (λ/8 or better for
laser apps) needed for your application.• Can measure actual lens performance and thickness and re-optimize
mechanics…
For demanding laser and imaging systems where minimizing scattered light is criticalHigh20-10
Excellent for laser and imaging systems with focused beams that can tolerate little scattered lightModerate40-20
Used for low power laser and imaging applications where scattered light is not as critical as costLow60-40
ApplicationsCostScratch-Dig
ECE 5616Curtis
Stock LensesSpatial Filtering – use microscope objective
• When a positive lens of focal length F focuses a Gaussian beam, the image at the focal plane (the Optical Power Spectrum, or OPS) will be an inverted “map” of spatial wavelengths present in the beam. Shortwavelength noise (dn) will appear in an annulus of radius Fλ/dn centered on the optic axis. The long spatial wavelength of an ideal Gaussian profile will form an image directly on the optic axis.
A pinhole centered on the axis can block the unwanted noise annulus while passing most of the laser’s energy. The fraction of power passed by a pinhole of diameter D is:
This passes 99.3% of the total beam energy and blocks spatial wavelengths smaller than 2a, the diameter of the initial beam. Since dn is always much smaller than the beam diameter, the filtered beam is very close to the ideal profile.
A pinhole of diameter Dopt:
and the minimum noise wavelength transmitted by the pinhole is
ECE 5616Curtis
Stock OpticsBeam splitters or plates
• Place in collimated beam if possible. Even tilted plate in collimated beam will not introduce astigmatism.
• If not in collimated space place close to image/object plane (like field lens) to have minimal impact.
• Remember to align lenses with the BS or plate in the system to adjust spacing.
ECE 5616Curtis
ZEMAX
Click on Len to get
ECE 5616Curtis
ZEMAX
Click on the down arrow to select a vendor of you choice
ECE 5616Curtis
ZEMAX
Vendor Melles Griot
EFL between 80 to 100 mm
Diameter 15 to 25 mm
Lens can only be doublet
and have all the type of shapes selected
ECE 5616Curtis
ZEMAX
Click on Insert to place doublet lens
ECE 5616Curtis
ZEMAX
Need to enter EPD using Gen Button and use the marginal ray solve to find the paraxial focus
ECE 5616Curtis
Data Link Design
Amnon Yariv, Optical Electronics
As an example of the use of some of the basic concepts, lets consider the problem of designing an optical communication link using an optical fiber for transmission of binary digital data over a distance of 5km. The system requirements are
1) Data rate 5x108 bits/s2) Error probability after amplification at the receive must be less than 10-9.3) Parameters: Loss is 4dB/km, λ=1.04um, total capacitance of diode
(junction plus package) is 3x10-12f, noise figure of amplifier is 6dB, QE of detector is 50%.
System is shown below. How much power do we need?
ECE 5616Curtis
Detecting PulsesThreshold Detection
Noiseless data
Detected data with threshold
Data stream after detection
in< -is(1-k), 1 turns into 0in> isk, 0 turns into 1
ECE 5616Curtis
Detecting PulsesThreshold Detection
Let the noise current be random Gaussian, then σ is the RMS of the noise current, σ2 = in2 . Setting k=1/2 give probability of error Pe of
Using
Gives
Pe
ECE 5616Curtis
Detecting PulsesThreshold Detection
ECE 5616Curtis
Data TransmissionPower Needed
Dominant noise sources are amplifier and Johnson noise in resistor, so
Signal current is given by
Ps is the peak pulse power incident on detector
SNR after amp is We need this to be >11.89
So we need to know Te, Δν, and RL to find needed Ps and then cascade that power back to the diode to find required diode output power.
2/1)/4(/
Le
s
N
s
RkTheP
ii
ννη
Δ=
ECE 5616Curtis
Data TransmissionPower Needed
K2901 o
eT
TF +≡
)/(2 πτν =Δ
Te is obtained from the amplifiers noise figure.
Te= 290 + (4-1)290 = 1160. Lecture 21
Bandwidth of signal is given as 5x108 pulses per second (binary data).Thus, conservatively
Where τ is 2x10-9s from data rateΔν = 3.18 x108 Hz
Now the RL must not exceed the value below to support this rate
CRL υπΔ
=2
1
So using the given value of C, RL< 167 ohms
ECE 5616Curtis
Data TransmissionPower Needed
Plug in these values into equation below and solve for Ps
89.11)/4(
/2/1=
Δ Le
s
RkTheP
ννη
Ps ≅ 10-5 watts
Now loss to detector include 5km of fiber (20dB) and assume another 4dB coupling loss into the fiber for a total of 24dB (factor of 251).
Therefore the required laser power must exceed
Plaser > 10-5 x 251 = 2.51 mW
ECE 5616Curtis
Reading
W. Smith “Modern Optical Engineering”
Chapter 21
See “Optical Resources” on class website.