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Update on Radiation Tests and Plans by SMU. SOS LOC1 Fiber VCSELs. Tests on the SOS technology. The proposal to evaluate the 0.25 micron SOS technology for radiation tolerant ASIC development has been approved by ATLAS. Summary of our previous test results: Test chip. Gammas test results. - PowerPoint PPT Presentation
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1
Update on Update on Radiation Tests Radiation Tests
and Plans by SMUand Plans by SMU1.1. SOSSOS2.2. LOC1LOC13.3. FiberFiber4.4. VCSELsVCSELs
J.Ye SMU 2 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the SOS Tests on the SOS technologytechnology
The proposal to evaluate the 0.25 micron The proposal to evaluate the 0.25 micron SOS technology for radiation tolerant SOS technology for radiation tolerant ASIC development has been approved by ASIC development has been approved by ATLAS.ATLAS.
Summary of our previous test results:Summary of our previous test results: Test chip.Test chip. Gammas test results.Gammas test results.
Plan for future tests:Plan for future tests: Future tests are contingent on available Future tests are contingent on available
funding.funding. Collaboration on data analysis and modeling Collaboration on data analysis and modeling
is needed.is needed.
J.Ye SMU 3 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the SOS Tests on the SOS technologytechnology
Summary of our previous test results:Summary of our previous test results: A dedicated test chip with transistors, sift A dedicated test chip with transistors, sift
registers, ring oscillators has been registers, ring oscillators has been designed and fabricated. We still have designed and fabricated. We still have about 80 such chips. All tests are about 80 such chips. All tests are performed on this test chip.performed on this test chip.
Transistor I-V curves are measured during Transistor I-V curves are measured during gamma (Co-60) irradiation as a function of gamma (Co-60) irradiation as a function of total dose at different dose rates. total dose at different dose rates.
With a grounded substrate, we observe With a grounded substrate, we observe small shifts in threshold voltages, but no small shifts in threshold voltages, but no noticeable leakage current increase. noticeable leakage current increase.
J.Ye SMU 4 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Test Chip
NMOS
PMOS
J.Ye SMU 5 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the SOS Tests on the SOS technologytechnology
Plan for future tests:Plan for future tests: An ADR proposal (SMU+VU) was sent to An ADR proposal (SMU+VU) was sent to
DOE for funds to support more tests. DOE for funds to support more tests. Should this proposal be funded, more tests Should this proposal be funded, more tests
and modeling work will be carried out. and modeling work will be carried out. Tests: gamma, proton and heavy ion.Tests: gamma, proton and heavy ion. Modeling: GEANT4+TCAD=MRED from VU.Modeling: GEANT4+TCAD=MRED from VU.
Modeling work may get help from The Modeling work may get help from The Radiation Effects and Reliability Group Radiation Effects and Reliability Group ((
http://http://eecs.vanderbilt.edu/research/rereecs.vanderbilt.edu/research/rer//)), Vanderbilt , Vanderbilt University, and from CERN.University, and from CERN.
J.Ye SMU 6 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on LOC1Tests on LOC1 Lab tests on LOC1 are finished and will Lab tests on LOC1 are finished and will
be reported in a different talk.be reported in a different talk. Irradiation test plan for LOC1:Irradiation test plan for LOC1:
Proton 230 MeV, Proton 230 MeV, Flux 5×10Flux 5×1055 to 5×10 to 5×101111 p/cm2/sec. 5 to 6 flux p/cm2/sec. 5 to 6 flux
steps to cover SEE, TID and NIEL tests.steps to cover SEE, TID and NIEL tests. June/July in Boston, MGH. June/July in Boston, MGH. Reason for the delay: no manpower to work Reason for the delay: no manpower to work
on preparation for this test beginning of on preparation for this test beginning of May. May.
J.Ye SMU 7 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the fiber Tests on the fiber
Previous test results:Previous test results: The fiber: Infinicor SX+ 50/250The fiber: Infinicor SX+ 50/250m/1.6mm m/1.6mm
MM 10G fiber from Corning. Germanium MM 10G fiber from Corning. Germanium doped.doped.
The tests: Gamma (Co-60) Proton (230 The tests: Gamma (Co-60) Proton (230 MeV, 1.9×10MeV, 1.9×101515 proton/cm proton/cm22). ).
The results: Very small light loss at low The results: Very small light loss at low flux (dose rate). Big loss at high flux but flux (dose rate). Big loss at high flux but anneals very quickly (within 1 hour) back.anneals very quickly (within 1 hour) back.
Results are very preliminary. More tests Results are very preliminary. More tests (coordinated by Oxford) are needed.(coordinated by Oxford) are needed.
J.Ye SMU 8 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the fiber Tests on the fiber
Previous test results:Previous test results:
J.Ye SMU 9 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the fiber Tests on the fiber
More tests are needed: More tests are needed: Coordinated by Oxford group.Coordinated by Oxford group. SMU: April 13-17, Gamma (Co-60) test SMU: April 13-17, Gamma (Co-60) test
at BNL. at BNL. Dose rate: 30 krad/hr.Dose rate: 30 krad/hr. Measurement stability studies carried Measurement stability studies carried
out at SMU.out at SMU.
J.Ye SMU 10 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the fiber Tests on the fiber
Measurement stability at SMU:Measurement stability at SMU:
J.Ye SMU 11 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on the fiber Tests on the fiber
Measurement stability at SMU:Measurement stability at SMU:
J.Ye SMU 12 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on VCSELsTests on VCSELs Two HFE6192-562 (10GHz, LC w/ 50 ohm Two HFE6192-562 (10GHz, LC w/ 50 ohm
flex) from Finisar tested .flex) from Finisar tested . Irradiated with 230 MeV proton, 1.9×10Irradiated with 230 MeV proton, 1.9×101515
proton/cmproton/cm22. . The VCSELs are biased during The VCSELs are biased during
irradiations.irradiations. Eye diagram and power are measured Eye diagram and power are measured
before and after irradiation -- see plots and before and after irradiation -- see plots and table next page. table next page.
More tests are needed, maybe with LOC1 More tests are needed, maybe with LOC1 proton tests. proton tests.
Tests coordinated by KK.Tests coordinated by KK.
J.Ye SMU 13 Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN
Tests on VCSELsTests on VCSELs
VCSELVCSEL
Before irradiationBefore irradiation After irradiationAfter irradiation
Rise/fall Rise/fall time (ps)time (ps)
O-power O-power
((W)W)Rise/fall Rise/fall time (ps)time (ps)
O-power O-power ((W)W)
L1L1 114/130114/130 431431 110/128110/128 133133
L2L2 120/132120/132 450450 122/132122/132 295295
L1, before irradiation L1, after irradiation