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UCLA UCLA Nanoscale Measurement Nanoscale Measurement System System Non-confidential summary of UCLA technology available for licensing, Case reference: LA2004-660 March 18, 2005 March 18, 2005 Ken Polasko Ken Polasko Business Development Officer Business Development Officer Office of Intellectual Property Administration Office of Intellectual Property Administration KPolasko @ ResAdmin .UCLA. edu www.research. ucla . edu / oipa (310) 794-8087 (310) 794-8087

UCLA Nanoscale Measurement System March 18, 2005 Nanoscale Measurement System Non-confidential summary of UCLA technology available for licensing, Case

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UCLAUCLA

Nanoscale Measurement System Nanoscale Measurement System Non-confidential summary of UCLA technology available for

licensing, Case reference: LA2004-660

March 18, 2005March 18, 2005Ken PolaskoKen Polasko

Business Development OfficerBusiness Development Officer

Office of Intellectual Property AdministrationOffice of Intellectual Property Administration

[email protected]

www.research.ucla.edu/oipa

(310) 794-8087(310) 794-8087

Nanoscale Measurement System

Markets Force and displacement characterization tools for the nanotechnology market.

Background Construction of hybrid bio-nanosystems relies on measuring and optimizing forces and displacements at the molecular level. The measurement of the forces and displacements involved when attaching biological material to inorganic material or micro electro mechanical systems (MEMS) is becoming an increasing import design capability.

Problem Conventional force transducers (e.g. load sensors) have been the choice for the measurement of forces however these sensors do not have the required sensitivity. Conventional force microscopy relies on cantilever torsional modes for measuring forces along the surface plane, implying in poor visualization and sensitivity. Optical tweezers have been the choice for the measurement of forces produced by single molecules however this techniques has limited force range (pN).

Solution Prototype has been fabricated that can detect forces of ~ 0.2 nN and a corresponding displacement of ~ 40 nm. The prototype incorporates a novel illumination system that permits excellent visualization of biological material. The system design permits flexible handling of liquids. This system fills the gap between existing tools for measuring forces associated with biological elements and purely atomic measurement systems.

Nanoscale Measurement System

Technological StatusTechnological Status

Research Development Commercialization

Discovery TechnicalFeasibility

Integration Prototype Production

Nanoscale Measurement System

Nanoscale Measurement System

Inventors and CollaboratorsInventors and Collaborators Professor Carlo Montemagno, Department of

Bioengineering & Biomedical Engineering Professor Jacob Schmidt, Department of

Bioengineering & Biomedical Engineering Professor Toshikazu Hamasaki, Department of

Bioengineering & Biomedical Engineering Dr. Sergio Freire, Department of Bioengineering &

Biomedical Engineering

Intellectual PropertyIntellectual Property Provisional patent filed

Nanoscale Measurement System