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Flying Checker Data Creation Flying Checker Data Creation System System

U-ART/FLY LINE U-ART/FLY LINE

Flying Checker Data Creation Flying Checker Data Creation System System

U-ART/FLY LINE U-ART/FLY LINE

●Japan’s Best-Selling System ・ Japan’s No.1 continuity testing data creation system ・ Sold 120 sets and used by 60 companies

●Comprehensive Testing Data Creation System ・ Dedicated Fixture ・ Universal Fixture ・ Conductive Rubber Type Conversion Board ・ Flying Checker ・ Non-contact Type ・ Defect Analysis System

●Accurate Test Point Output ・ Accurate test point creation without omission ・ Full consideration to resist data ・ Various test point generation

Features of U-ART/FLY LINEFeatures of U-ART/FLY LINE

This new version of FLY LINE was created for the purpose of:

Operation Improvement

Reduction of Testing Data Creation Time

Accurate Data Creation

Specifically, desirable testing data creation time for a flying checker is 15 minutes to 1 hr, without any mistakes. Acquisition of FLY LINE operation is attained in about two days. And data can be processed with least processing. These were all aimed at upon creation of this new version.

New Functions of U-ART/FLY LINENew Functions of U-ART/FLY LINE(1) Individualized DB(2) Improved Operation(3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output

(1) Individualized Database

　　・ Folder administration for each object　　・ Simplified data backup 　　・ Blanket data administration by server

New Functions of U-ART/FLY LINENew Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output

Pcb1pcb2pcb3pcb4････

/home/data1 pcb1

pcb2,pcb3,pcb4 ･･････

/home/data2 sample1

sample2,sample3,sampl

e4

ＮｅｗＯｌｄ

(2) Improved Operation

　　・ Layer Number 　・・ ・・＞ Layer Name Layer name is now displayed as a name specified, not a number. Layer name can be decided checking graphics of each input file.

data1.gb 　 = 　 compdata2.gb 　 = 　 solddata3.gb 　 = 　 res-comp etc ・・

　　・ Simplified Specification of Layer AttributesIVH specification, Cut data synthesis specification

　　・ Revised Flow of ProcessingVast reduction of processing flow Simplified operation

New Functions of U-ART/FLY LINENew Functions of U-ART/FLY LINE(1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output

U-ART/FLY LINE Processing FlowU-ART/FLY LINE Processing Flow

Gerber Data NC Data

CAM Data Input(GT)

Graphic Editing(UEDITN)

AutomaticConversionProcessing

(FAP)

Net Info.Creation(UARTNN)

Test Point GenerationIntermediatePoint Deletion

(UDBC)

Data ConfirmationHIOKI Output

Gerber DataNC Data

CAM DataInput(GT)

GraphicEditing(UEDITN)

Pad ConversionNet CreationTest PointGenerationIntermediatePoint Deletion

Data ConfirmationHIOKI Output

(3) Full Compliance with Synthesized Data　　・ Net creation, test point generation, near-nets　　・ Up to 8 synthetic levels

New Functions of U-ART/FLY LINENew Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output

Data 1　　　　　　　　　　　 Data 2　　　　　　　　　 Data 3

＋ ＝＋

＋ ＝

Data 1　　　　　　　　　　　　　 Data 2

(4) Compliance with Special-Shaped Aperture 　　・ Tablet, Bullet, and Oval 　　・ Graphic display, net creation, test point generation, and near-nets -- compliance with all　　・ RS274X custom aperture

New Functions of U-ART/FLY LINENew Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output

Bullet　　　 Oval　　　　　　　 Tablet

（５） Checker Data Output　　・ Stamp unit position specification

Test Point Generation ①Test Point Generation ①

Accurate data generation for each tester type, without omissionAccurate data generation for each tester type, without omission

●Full consideration to resist data・ Using resist-free data,whether there is copper leaf or not is automatically determined to assign contact probes to upper and lower fixtures.・ Considering partial resist-free data, a contact probe is assigned to the center of copper leaf left. 　　　　　　　　　　　・ When there is not enough copper leaf left for a contact probe positioning, a resist defect checkmark is output and displayed on graphics. 　　　　　　　　　　　　　　　　　　●Compliance with single test・ There are four methods of probe assignment for a single net. Output on both sides/Output on Component side/Output on Soldered side/No probe output

●Compliance with via (surface) test・ Via (surface) test is the mode of whether to assign a probe to a point that looks like a single via hole when looked at on a plane but it is an intermediate point that connects to other pad when looked at three-dimensionally.

●Various output methods of net end in inner layer・ There are four methods of probe assignment where patterns end in inner layer. 1.Inner layers are divided into either Component or Soldered side groups and probe assignment is performed accordingly. 2.Probes are output compulsorily on either Component or Soldered side. 3.Probes are output on both Component and Soldered sides. 4. No test points are output at all.

●Full consideration to resist data

　　　　　　　　　　　　　　●Compliance with single test

●Compliance with via (surface) test

●Various output methods of net end in inner layer

Reference Reference Test Point Generation ①Test Point Generation ①

Test Point Generation ②Test Point Generation ②

●Loop patterns and paint （ wide-area patterns ） recognition・ Optimized contact probes are assigned to points related to loop lines and paint data, where recognition checkmarks for these data are output and displayed on graphics. 　　　　　　　　　　　　　　　　●Function of tracking back to previous net end points・ When a probe can not be output even at a net end point because of such a problem as resist defect, it tracks back to the previous net point(s) to search automatically where it can be output.

●Function of single point/zero point check ・ When there is only one test point output or no test point output for some reasons at patterns connected, checkmarks are displayed on graphics.

● Loop patterns and paint （ wide-area patterns ） recognition

　　　　　　　　　　　　　

● Function of tracking back to previous net end points

● Function of single point/zero point check

Reference Reference Test Point Generation ②Test Point Generation ②

Test Data OutputTest Data Output

● 　 HIOKI 1115 X-Y C Hi Tester test data output

・ Probe output in the center of effective surface of test point

・ When a blade-typed probe is used and through-holes with 1.45Φ and more are test points, they are avoided automatically and probe output is shifted to the “ring” part of the hole. Shifting direction can be specified.

・ In order to operate the flying checker at more agreeable speed, net information within the area specified for each net is output.

Diameter: 1.45 Φ and more