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MARKET DEMANDS
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS272
Users require increased
performance from electronic
components
The use of advanced and complex
devices has thus become a must
These new technologies are not
always mature or sufficiently
validated
Radiation environment is unique to
space therefore requiring specific
validation activities
SPACE IS UNIQUE -1
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS273
Outside of the Earth’s magnetosphere protection, integrated circuits are
affected by natural radiation sources that generate ionizing and non-
ionizing effects
Spacecraft electronics are exposed to a wide spectrum of charged
particles (electrons, protons and heavy ions) that deposit charge on
devices through ionization
SPACE IS UNIQUE - 2
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS274
The amount and nature of the radiation received depends on the
orbit, solar activity, mission lifetime and shielding
Radiation performance is not a requirement for mass-produced
components and, therefore, it is not considered during the
technology development phase
NEW TECHNOLOGIES - 1
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS275
Market is driving manufacturers towards more
advanced products, based on new CMOS
processes, that have a smaller size and footprint,
but much higher complexity
This has resulted on greater purity, thinner gate
oxides, that collect less electric charge, thus
reducing degradation due to radiation
However, there are still significant leakage
currents affecting operation of digital and analog
circuits
Mixed signal ASICs complexity make them
potentially sensitive to all known radiation effects
NEW TECHNOLOGIES - 2
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS276
New technologies are generating new challenges:
Operating speed
Gate density
Bandwidth
Complex packaging
Reduced power supply voltages
Reduced noise margins
Ground testing of complex devices using newer technologies is
mandatory to identify the radiation performance of these products
The increasing complexity of new devices creates additional
difficulties to characterize radiation performance using traditional
approaches
TID TESTING REQUIREMENTS - 1
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS277
Product complexity requires bigger and
better test platforms to ensure adequate
parametrical coverage
This coverage is often beyond the
capabilities of portable testers, requiring
the use of larger machines located in
test laboratories
Typically radiation sources (Co60) are
not in the proximity of testing
laboratories
ELDR sensitivity must be assessed for
CMOS devices, requiring long
exposition time and many intermediate
measurements
TID TESTING REQUIREMENTS - 2
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS278
ESCC 22900 calls for electrical
measurements to be done within
a two hours window between
irradiation interruptions
MIL-STD-883, TM1019 calls for
special logistics (use of dry ice),
making the testing experience
more difficult
Additionally, it is impractical to
spend complete days between
irradiation steps
ALTER TECHNOLOGY‘s APPROACH
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS279
RADLAB our new Cobalt-60 Radiation
facility features:
A fully flexible source
Unlimited availability
Extensive electrical parameter
measurement capabilities
Full in-house control
ALTER TECHNOLOGY
A recognized Centre of Excellence for
ESA for radiation testing
Approved service provider to OEM’s
and space agencies worldwide
FLEXIBILITY – Dose Rate Range - 1
The source at RADLAB provides a very wide dose rate range,
from less than 36rad(Si)/h to more than 36krad(Si)/h
36krad(Si)/h
36rad(Si)/h
Very High
Ultra Low
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2710
FLEXIBILITY – Dose Rate Range - 2
Simultaneous testing of componens with different dose rates, by applying a bi-
zonal attenuation configuration
Easy implementation of variable dose rate schemes (low rate for the first steps,
higher rate thereafter), optimizing exposure time vs results representativeness
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2711
FLEXIBILITY – Field Uniformity
All radiation tests are performed with a guaranteed uniformity above 90
percent, in a square area up to 1,4 x 1,4 meters
Field uniformity is measured for each specific irradiation unit
Depending of the sample size, a uniformity of 99% can be achieved
Example of a real 3D Uniformity Profile
measured in the RADLAB facility
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2712
RADLAB – Around The Clock Availability
A dedicated group of accredited licensed engineers and security
personnel are permanently available
Test when you canTest when you need instead of
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2713
The RADLAB facility provides full availability, 24 hours a day, 7
days a week
ALTER TECHNOLOGY offers full Electrical Test characterization capability
for:
FULL PARAMETRICAL ELECTRICAL TESTING
Mixed signal components (ADC/DAC
up to 24 bits)
Complex digital parts (FPGA’s,
Memories, Microcontrollers -32bits-)
PWM, PLL, Modulators/Demodulators,
DDS, Mixer/Receiver
High pin count components.
Expandable up to 1500 I/Os
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2714
RADLAB Capability – Monitoring & Recording
Two independent measurement systems to monitor and register the
accumulated dose of the DUT
Remote control of both the power consumption for each electronic
device and the environmental parameters of the irradiation room
DUTDevice Under Test
IRRADIATION
ROOM
Temperature,
Pressure
and Relative
Humidity
Radiation
Parameters
Biasing
Conditions
PRSParameter Register
System
CONTROL ROOM
REMOTE
CONNECTIONSDC
Secure Data Center
ATN SERVERS
RTE
Radiation
Test Engineer
ELECTRICAL
MEASUREMENTS
LABORATORY
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2715
ALTER TECHNOLOGY – TID Testing - 1
More than 1000 TID radiation test campaigns performed to-date
More than 5000 components tested, covering a wide range of
technologies and complexities/functions
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2716
ALTER TECHNOLOGY – TID Testing - 2
Custom radiation test plans are generated to fulfil your requirements,
including extensive verification of data-sheet or procurement specification
electrical parameters (DC, AC, functional test)
Radiation parameters
(dose rate, steps,
total dose, …)
Biasing conditions
Radiation
Test Plan
Annealing conditions
Electrical
parameters
to be measured
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2717
ALTER TECHNOLOGY – TID Testing - 3
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2718
Dedicated engineers develop all necessary software
In house design of sockets and boards
QUALITY SYSTEM
19
• UNE-EN 9100:2010 (QM for Aerospace & Defense)
• UNE-EN-ISO 9001:2008 (QM Requirements)
• UNE-EN-ISO/IEC 17025:2005 (General requirements for Calibration
& Testing)
• UNE-EN-ISO 14001 (Environmental Management)
• UNE-EN ISO/IEC 17065:2012 (Product Conformance Evaluation)
• ISO 17025 (RADLAB)
• DLA Suitability for RADLAB (On going)
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS27
SUMMARY – RADLAB
State of the Art
Radiation Laboratory
Full Availability Ultra High
Field Uniformity
Plane
Geometry
Simultaneous
Tests
Continuous Monitoring
& Recording
Wide Dose
Rate RangeLarge Irradiation
Field Size
High Dose Rate
Certainty & Precision
Logistic
Advantages RADLAB
ALTER TECHNOLOGY │TID TESTING ON COMPLEX INTEGRATED CIRCUITS │ MEWS2720