The Analytical Instrument Association

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  • (5) Lsztity, .; Wang, X.; Viczian, M.; Is rael, Y.; Barnes, R. M. J. Anal. At. Spec trom. 1989,4,737-42.

    (6) Stanek III, E. J.; Calabrese, E . J . Barnes, R. M. Keegan, E.; Lsztity, A. Wang, X.; Gilbert, C E . ; Pastides, H. Kostecki, P. J. Trace Elem. Exp. Med. 1988, 1, 179-90.

    (7) Binder, S.; Sokal, D.; Maughan, D. Arch. Environ. Health 1986, 41, 341-45.

    (8) Clausing, P.; Brunekreff, B.; van Wij-nen, J. H. Int. Arch. Occup. Environ. Med. 1987,59,73.

    (9) Davis, S.; Waller, P.; Buschom, R.; Bal-lou, J.; White, P. Arch. Environ. Health, in press.

    (10) Lsztity, .; Viczian, M.; Wang, X.; Barnes, R. M. J. Anal. At. Spectrom. 1989,4,761-66.

    (11) Iyengar, G. V. Elemental Analysis of Biological Systems; CRC Press: Boca Raton, FL, 1989; Vol. 1.

    (12) Snyder, W. S.; Cook, M. J.; Nasset, E. S.; Karhausen, L. R.; Howells, G. P.; Tipton, I. H. Report of the Task Group on Reference Man; Pergamon Press: Oxford, 1975; pp. 365-418.

    (13) Adriano, D. C. Trace Elements in the Terrestrial Environment; Springer-Ver-lag: New York, 1986.

    (14) Iyengar, G. V.; Woittiez, J. Clin. Chem. 1988, 34, 474-81.

    (15) Tsalev, D. C ; Zaprianov, . . Atomic Absorption in Occupational and Environmental Health Practice; CRC Press: Boca Raton, FL, 1983; Vol. 1, Chapter 2.

    (16) Hee, S.S.Q.; Boyle, J. R. Anal. Chem. 1988,60,1033-42.

    (17) Reeves, R. D.; Brooks, R. R. Trace Element Analysis of Geological Materials; Wiley: New York, 1978.

    (18) Iyengar, G. V. Clin. Nut. 1987, 6, 105. (19) Igarahi, Y.; Kawamura, H.; Shiraishi,

    K.; Takaku, Y. J. Anal. At. Spectrom. 1989,4,571-76.

    (20) Tlg, G. Fresenius Z. Anal. Chem. 1988,331, 226-35.

    (21) Paschal, D. C. Spectrochim. Acta 1989,445,1229-36.

    (22) Houk, R. S.; Thompson, J . J . Mass Spectrom. Rev. 1988, 7, 425-61.

    (23) Date, A. R.; Gray, A. L. Applications of Inductively Coupled Plasma Mass Spectrometry; Blackie: Glasgow, 1989.

    (24) Calabrese, E. J.; Stanek, E. J.; Gilbert, C. E.; Barnes, R. M. Regul. Toxicol. Phar-macol. 1990,12, 88-95.

    (25) Calabrese, E. J.; Stanek III, E. J.; Gil-bert, C. E.; Layton, D.; Barnes, R. M., submitted for publication in Regul. Toxi-col. Pharmacol.

    (26) Viczian, M.; Lsztity, .; Barnes, R. M. J. Anal. At. Spectrom. 1990, 5, 293-300.

    (27) Delves, H. T.; Campbell, M. J. J. Anal. At. Spectrom. 1988,3, 343-48.

    (28) Campbell, M. J.; Delves, H. T. J. Anal. At. Spectrom. 1989,4, 235-36.

    (29) Yaffee, Y.; Flessel, C ; Wesolowski, J.; Del Rosario, .; Guirguis, G.; Matias, V.; DeGarmo, T.; Coleman, G.; Gramlich, J.; Kelly, W. Arch. Environ. Health 1983,38, 237.

    (30) Hammond, P. B.; Clark, C. S.; Gart-side, P. S.; Berger, .; Walker, .; Michael, L. W. Int. Arch. Occup. Environ. Health 1980,46,191.

    (31) Boeckx, R. L. Anal. Chem. 1986, 58, 274 A-288 A.

    (32) Chaney, R. L.; Mielke, H. W.; Sterrett, S. B. In Lead in Soil: Issues and Guidelines; Davies, B. E.; Wixson, B. G., Eds.; Science Reviews Ltd.: Northwood, U.K., 1988; pp. 105-41.

    Ramon M. Barnes is a professor of chemistry at the University of Massachusetts, Amherst. He received his B.S. degree from Oregon State University in 1962, his M.A. degree from Columbia University in 1963, and his Ph.D. in 1966 from the University of Illinois. His research interests include fundamental and applied aspects of electrical plasmas (e.g., ICPs, dc plasma jets, microwave plasmas, and low-pressure rf plasmas).





    Members include Beckman Instruments, Dionex, Ftsons, Hewlett-Packard, Hitachi, Perkin-Elmer, Varian Associates, Waters and many others who soon will be as well known.

    If you're in the analytical instruments

    business, can help your company

    grow with:

    bookings reports that track markets

    in the U.S. and other countries

    opportunities to meet other industry


    "hands on" programs focused on

    management, manufacturing and


    workshops for small companies

    salary surveys

    financial ratios reports

    development of communication

    standards for data exchange

    Annual dues cover all programs, except

    meeting registration fees.

    (the Analytical Instilment Associa

    tion) is the successor to SAMA's Instrument

    Section. Our sixty-plus members include-

    both the market leaders and small,

    growing companies. For more informa

    tion on how your company can grow

    and prosper with in today's highly

    competitive world market, contact:

    Mike Duff, , 225 Reinekers Lane,

    Suite 625, Alexandria, VA 22514,

    (703) 836-1360; FAX (703) 836-6644.

    ANALYTICAL CHEMISTRY, VOL. 62, NO. 19, OCTOBER 1, 1990 1033 A

    The Analytical Instrument Association