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National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 1 of 16
=========================================================================================
TestData Summary of 5.2GHz WLAN Direct Conversion RF Transceiver Board
=========================================================================================
Serial Number : 0001 Date : 3-FEB-03 Tester : Stefan Haenggi
No Receiver Test Measured Target Units
1 Inband Input IP3 -12 >-10 dBm
2 Baseband S/N at 5.24GHz (ADC goes Vpp) -82dBm -65dBm -30dBm
9.6 23.8 24.8
>+7 >+23 >+23
dB dB dB
3 Passband Peak Peak Ripple at 5.24GHz (300kHz – 8MHz)
0.8
<1
dBpp
4 Overall Rejection at Carrier of first Adjacent Channel (+/-20MHz) second Adjacent Channel (+/-40MHz)
31.4 50.8
>25 >45
dBc dBc
5 Baseband Image Rejection at 5.24GHz 1MHz 4MHz 8MHz
-28 -27 -26
>-23 >-23 >-23
dBc dBc dBc
6 Static DC Offset after Mixer 20 <100 mV
7
No Transmitter Test Measured Target Units
1 RF Output Power at 5.24GHz to meet Mask Maximal AGC Minimal AGC
+10 -20
>+16 -20
dBm dBm
2 Output IP3 +26 >+28 dBm
3 Passband Peak Peak Ripple (300kHz – 8MHz)
0.3
<0.5
dBpp
4 Baseband Image Rejection at 5.24GHz 1MHz 4MHz 8MHz
-25 -25 -25
<-30 <-30 <-30
dBc dBc dBc
5 Carrier Leakage at 5.24GHz -35 <-15 dBc
No RF Local Oscillator Test Measured Target Units
1 Tuning Range (5.18GHz- 5.32GHz) OK
2 Integrated RMS PhaseJitter (10kHz to 10MHz) 5.18GHz 5.24GHz 5.32GHz
2.2 2.3 2.2
< 3.0 < 3.0 < 3.0
deg deg deg
3
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 2 of 16
TestSetup
DUT Direct Conversion Radio
RX Test
RX_QAD
DA TX_I
DA TX_Q
Power Attenuator
Synth
RX_IAD
MATLAB
2 x 14bits / 40MS/s
DIGITAL PATTERN
GENERATOR
10MHz Ref in
2 x 14bits / 40MS/s
DIGITAL LOGIC
ANALYZER G
P
I
BState Mode
2 x 14bits / 40MS/s
DIGITAL SAMPLING
SCOPE G
P
I
B2 Channel
Diff.
Probe
Diff.
Probe
G
P
I
B
U
S
BMATLAB V13
LAPTOP
Instrument Control Toolbox
U
S
B
CW, QPSK
5GHz, -90 to -30dBm
RF GENERATOR A
CW, QPSK
5GHz, -90 to -30dBm
RF GENERATOR B
10MHz Ref out
PhaseNoise option
10kHz to 6GHz
SPECTRUM ANALYZER
High Peak Power Head
10kHz to 6GHz
RF POWER METER
TX Test
Vari-L GUI
Windows
PCP
a
r
a
Analog PowerSupply
Digital PowerSupply
10MHz Ref in Binary converter
1tone, 2tone, OFDM
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 3 of 16
1-1) Receiver, IQ Baseband Analog Frequency Response
1-2)
1. Adjacent
Channel 20MHz -31.4dB
2. Adjacent
Channel 40MHz -50.8dB
Signal after Baseband LNA
Signal before AD Converter
Passband Ripple 0.4dBp
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 4 of 16
1-3) Receiver, IQ Digital Baseband, Sampling Rate 40Ms/s, 4096 samples, Input Signal 5.244GHz, -82dBm, CW
1-4) 1-5)
Channel Filter shaping
Image
DC Offset
Input signal
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 5 of 16
1-6) Receiver, IQ Digital Baseband, Sampling Rate 40Ms/s, 4096 samples, Input Signal 5.244GHz, -65dBm, CW
1-7) 1-8)
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 6 of 16
7) Receiver, IQ Digital Baseband, Sampling Rate 40Ms/s, 4096 samples, Input Signal 5.244GHz, -30dBm, CW
1-9) 1-10)
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 7 of 16
AD Discrete Step Performance 1-11)
No missing codes, more or less equal binwidth
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 8 of 16
1-12) Receiver, IQ Digital Baseband, Sampling Rate 40Ms/s, 4096 samples, Input Signal 5.240 + offset GHz, -65dBm, CW
Frequency Offset = 1MHz Image Rejection = -28dBc
Frequency Offset = 4MHz Image Rejection = -27dBc
Frequency Offset = 8MHz Image Rejection = -26dBc
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 9 of 16
1-13) Receiver, IQ Digital Baseband, Sampling Rate 40Ms/s, 4096 samples, Input Signal 5.243GHz + 5.244, -30dBm, CW
2 tone input
IP3 product
Image
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 10 of 16
1-14) Transmitter, I signal Analog Baseband after DAC, WLAN BPSK 800bit packet, Frequency domain, before filtering
Comments : The baseband spectral shape should be able to pass the WLAN standard. The analog filter should have about 30dB rejection at 30MHz. With DAC who have internal interpolation (up-sampling) the filter specification could be relaxed significantly.
OFDM Waveform
DAC sampling rate : 40Ms/s
First unwanted
Image.
OFDM convoluted
with sampling
Impulse train (sin(x)/x)
Multiple
unwanted OFDM images
Wanted OFDM Waveform
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 11 of 16
Transmitter, RF signal with WLAN OFDM BPSK 800bit packet
TX RF signal before going into PowerAmplifier
TX RF signal after PowerAmplifer at the antenna connector
RF PowerRMS = +10dBm Spectral mask would pass
TX RF signal after PowerAmplifer at the antenna connector
RF PowerRMS = +16dBm Spectral mask would probably not pass
Spectrum Mask from 802.11a Physical Layer Standard
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 12 of 16
1-15) Transmitter, RF signal with 2tone test for Linearity
TX RF Power RMS : +15dBm at atenna port IP3 products : -22dBc Resulting output IP3 : +26dBm Carrier Leakage : -35dBc Image rejection : -25dBc
Wanted 2tone
Carrier Leakage
IP3 products
Image
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 13 of 16
Transmitter, IQ signal Analog Baseband after Filter, WLAN BPSK 800bit packet, sampled with Scope, 1000 samples
Comments :
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 14 of 16
1-16) LO/2 signal, Frequency Domain, 10MHz HP RF Generator reference, 2.62GHz
Span 50MHz Span 1MHz
Integrated RMS Phasenoise at 5.24GHz:
Frequency offset (Hz) 10k 20k 50k 100k 10M
Phasenoise (dBm/Hz) -72.2 -82.9- -93.7 -99.2 -104
RMS Phasejitter (10kHz-10MHz) = 2.2degree
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 15 of 16
Impulse response over a full RX-TX chain TBD
National Semiconductor Corporation Advanced Wireless Technology Group
RF Test Report 5-December-2002
Stefan Haenggi [email protected]
Page 16 of 16
Measured static values
No Static values Measured Target Units
1 Receiver ON current consumption +8V PowerSupply -8V PowerSupply 5V PowerSupply 3V PowerSupply
……………. ……………. ……………. …………….
mA mA mA mA
2 Transmitter ON current consumption +8V PowerSupply -8V PowerSupply 5V PowerSupply 3V PowerSupply
……………. ……………. ……………. …………….
mA mA mA mA
3 LO/2 RF Power after Splitter after TX booster after RX booster
……………. ……………. …………….
7