9
Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung Mercury Target Collaboration Meeting MIT Plasma Science and Fusion Center October 17 – 19, 2005

Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Embed Size (px)

Citation preview

Page 1: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

1DAQ for BNL 15 T Pulsed Magnet

DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET

Chen-yu Gung

Mercury Target Collaboration Meeting MIT Plasma Science and Fusion Center

October 17 – 19, 2005

Page 2: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

2DAQ for BNL 15 T Pulsed Magnet

Instrumentation and Signal Level

Instrumentation Name Number of Signals

Signal Level

Power Supply 2 (Vmagnet &

Vshunt resistor)

0 – 10 V

AMI LN level sensor 2 0 – 10 V

CERNOX 11 Varies with temperature

Discrete level sensor diode 10 Unknown

Others, such as TC’s, Hall probe, etc.

TBD TBD

Page 3: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

3DAQ for BNL 15 T Pulsed Magnet

SIGNALS AND DATA ACQUISITION FOR PULSED MAGNET TEST

MAC / LABVIEW

DA

Q C

AR

DN

B-M

IO-1

6XL-

18D

AQ

CA

RD

NB

-MIO

-16X

L-18

T01

T02..

T10

T11

D01

D02..

D09

D10.

L01

L02

V_ps

I_ps

VO

LTA

GE

DIV

IDE

RS

ISO

LAT

ION

AM

PLI

FIE

RSOTHERS

.

.

CH05CH06..

CH14

CH15

CH16

CH17

.

.CH24

CH25

CH26

.

.

CH32

CH01

CH02

CH03

CH04

Txx: CERNOX;Dxx: DIODE / DISCRETE LEVEL SENSOR;Lxx: LN LEVEL SENSOR (CONTINUOUS);

CRYOGEN LEVELCONTROLLER

PULSED MAGNETPOWER SUPPLY

CRYOGEN LEVELCONTROLLER

PULSED MAGNET

Page 4: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

4DAQ for BNL 15 T Pulsed Magnet

Data Acquisition System

Use 2 National Instrument NB-MIO-16XL-18 in one Macintosh computer.

DA is programmed in Labview.— Thing to do – modify existing program.

Precision at 16 bit for bipolar DA between ± 10 V: ~ 0.3 mV. Maximum (damaging) input voltage: ± 35 V. Max. sampling rate for single channel DA: 55 Ksamples/sec. Max. sampling rate for multi-channel DA: 20 Ksamples/sec.

Page 5: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

5DAQ for BNL 15 T Pulsed Magnet

CERNOX Temperature Sensor

Ref: Courts, S.S and Swinehart, P.R., ‘Stability of Cernox Resistance Temperature Sensors’, Adv. in Cryogenic Eng., Vol. 45, 2000.

~ 400 Ohm

~ 40 Ohm

Typical resistances of CERNOX are between 40 Ohm and 400 Ohm at respective temperatures of 120 K and 80K. The sensor voltage signals are between 0.4 V and 4 V if an excitation of 10 mA is used.

Page 6: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

6DAQ for BNL 15 T Pulsed Magnet

Excitation Source for CERNOX

• Each current source will be used to drive 4-5 CERNOX’s connected in series with an excitation current set at 10 mA. Connections of the current leads will be made outside the magnet vessel.

• Four lead measurement will be used. The voltage leads will be tapped to the current leads outside the magnet vessel.

• The voltage drop along the lead wires needs be corrected.

• The same type of current source will be used to drive the discrete LN level sensor diodes. Connection: TBD.

Lake Shore Model 120CS Current Source

Output Current 1 A to 100 mA

Accuracy 0.1% on fixed ranges

Stability Better than ± 0.01%

Compliance Voltage 11 Volts up to 50 mA

Page 7: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

7DAQ for BNL 15 T Pulsed Magnet

Data Acquisition During Cool-down and After Pulsing

During cool-down and before pulsing the magnet, including purging out LN, record

— LN level— Temperature— DAQ sampling interval: 2 minutes (tentative)

After pulsing the magnet, record— Temperature— DAQ sampling interval: 30 seconds (tentative)

Page 8: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

8DAQ for BNL 15 T Pulsed Magnet

Data Acquisition During a Pulse (Optional)

Will attempt to record the power supply voltage and current, and the temperature variation during a pulse.

But, it is dictated by the inductive voltage picked up by the DAQ system (noise and voltage limit).

Need ~ 13 channels.; zero LN level signals will not be recorded.

A typical pulse duration is ~ 15 seconds. The sampling interval can be set to 5 ms.

Page 9: Technology & Engineering Division 1 DAQ for BNL 15 T Pulsed Magnet DATA ACQUISITION FOR PRE-OPERATIONAL TESTING OF BNL-E951 15T PUSLED MAGNET Chen-yu Gung

Technology & Engineering Division

9DAQ for BNL 15 T Pulsed Magnet

Summary

Record temperature and LN level signals with existing equipment before and after pulsing the magnet is straightforward.

— TBD: Excitation and signal level of discrete level sensor diode. Recording temperature signal during a pulse (optional) is

dictated by the inductive voltages picked up by the DAQ.