Techniques to Reduce Femtocell Manufacturing Test MHz 2350 MHz 2350 MHz 2310 MHz 2310 MHz 2610 MHz 2610MHz 1900 MHz ... • 3 year Std Keysight Warranty ... • GUI and API

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  • Techniques to Reduce FemtocellManufacturing Test Time

  • PageAgenda Femtocell test challenges

    Improving Test Time and Throughput

    What is Test time ?

    Test faster with Measurement Sequencer techniques (SAMM)

    Increase test throughput with Pipeline and Ping Pong

    Introduction to the Keysight E6650A EXF Femtocell test solution

    Wireless Symposium 2

  • PageAgenda Femtocell test challenges

    Improving Test Time and Throughput

    What is Test time ?

    Test faster with Measurement Sequencer techniques (SAMM)

    Increase test throughput with Pipeline and Ping Pong

    Introduction to the Keysight E6650A EXF Femtocell test solution

    Wireless Symposium 3

  • Page

    0

    5,000,000

    10,000,000

    15,000,000

    20,000,000

    25,000,000

    2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018

    CellularInfrastructureEquipment Units

    3G/4GSmallCell

    3G/4GFemtocell

    LTEMacro

    2G/3GBSC

    3GRRHMacro

    2G/3GBTSMacro

    Setting the Scene, The Femtocell Market

    Femtocell and Small Cell units expected to grow at 46% CAGR from 2014-2018 to account for 90% of all mobile infrastructure equipment units sold in 2018.

    Wireless Market Forecasts

    Source: Infonetics Research, Dec 2014, Feb 2015, Mar 2015

    Long-term drivers Demand for indoor coverage RAN offload for operators to

    improve network capacity Need for consistent mobile

    broadband Home-zone applications/tariffs >$100 per unit cost for residential

    Phase 1

    Phase 2

    Phase 3

    Phase 4

    We are here

  • Page

    Femtocell Manufacturing Test Requirement and Challenges

    Calibration Tx Frequency, Power, IQ Rx -- Uplink & Monitor Gain

    Verification tests Tx Power, OBW, ACP,

    EVM, SEM, Freq error Rx -- RSSI, BER

    Wireless Symposium 5

    Test Items & Requirements Test Challenges

    Multiple Cellular Radio formats

    3GPP Specified tests have strict requirements for conformance

    Incremental WLAN Test

  • PageAgenda Femtocell test challenges

    Improving Test Time and Throughput

    What is Test time ?

    Test faster with Measurement Sequencer techniques (SAMM)

    Increase test throughput with Pipeline and Ping Pong

    Introduction to the Keysight E6650A EXF Femtocell test solution

    Wireless Symposium 6

  • Page

    How to Reduce Femtocell Manufacturing Test Time?

    Wireless Symposium 7

    Calibration time

    Mode switch and Boot time

    Txmeasurement

    time

    Rx measurement

    time

    One device, One test Set : Measurement and Sequencer Techniques

    Multiple Devices, One test Set : Smart Scheduling Techniques

    Cal Mode Tx Rx Cal Mode Tx Rx

    Reduce measurement timereduce Cal time Mode Switch time

    Sequencer (analyzer and Source)

    Smarter Scheduling method

    Cal Mode Tx Rx

  • Page

    Traditional Signal Analyzer Measurement Concept

    Reports back a single measurement result every time Need to switch between two measurements

    Wireless Symposium

    Burst 1 Burst 2 Burst nMeas 1 X1Meas 2 X2 Meas n Xn

    Acquisition 1 Acquisition 2 Acquisition n

    8

    Single acquisition single measurement (SASM)

  • Page

    Parallel Measurement Concept

    Approach 1 : Combined measurements under one measurement mode

    Acquisition length is one burst Reports multiple measurement results Measurement BW is limited by hardware

    Wireless Symposium 9

    Two approaches to improve the measurement speed

    Burst 1 Burst 2 Burst nMeas 1 X1 X2 XnMeas 2 X1 X2 Xn X1 X2 XnMeas n X1 X2 Xn

    Acquisition 1 Acquisition 2 Acquisition n

  • Page

    Sequencer Measurement Concept

    2nd Approach : Single acquisition multiple measurements(SAMM)

    Acquisition length is n*bursts Report multiple measurement results No limitation on measurement BW Supports frequency fast switch and multi-burst results

    Wireless Symposium

    Burst 1 Burst 2 Burst n

    Burst n+1

    Burst n+2 Burst n+m

    Meas 1 X1 X1 X1 X1 X2 X2 X2 X2Meas 2 X1 X1 X1 X1 X2 X2 X2 X2

    X1 X1 X1 X1 X2 X2 X2 X2Meas N X1 X1 X1 X1 X2 X2 X2 X2

    Acquisition 1 Acquisition 2

    10

    Further approach to improve the measurement speed

    Same time, Many More

    measurements!

  • Page

    There are two independent sequencers in the EXF Wireless Test Set for Femtocell E6650A:

    Source List Sequencer Sequence Analyzer List Sequencer

    Each sequencer can work individually or in Synch with the other.

    Both sequencers can synchronize with each other by the use of internal triggers

    Both Sequencers can be controlled by a single sequence

    Test Faster with the Sequencer Technique

    Page 11

    11Wireless Symposium

    Sequencer Basics

  • Page

    Sequence Analyzer Key Parameters Acquisition Parameters

    Supports up to 512 pre-configurable hardware states.

    Wireless Symposium 12

    Analysis Parameters Up 1000 steps per sequence

    Defines part of the capture memory to use as a measurement step

    Each State has: Radio Format Frequency Gain Acquisition

    duration Transition Time

    Trigger Type Trigger Delay Output Trigger Max Acquisition

    length 2GB =256MSa

    Each step has: Analysis Offset (from Acquisition start) - Expected Power at DUT Analysis Interval - Measurement Selection Analysis Number

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    Pre-Trigger

    Basic Terminology for Sequence Analyzer

    Sequence

    Acquisition Acquisition

    Trig Event TransitionTime

    AnalysisIntervals

    Acquisition Duration Data is returned to App after FPGA analysis here

    Wireless Symposium 13

  • Page

    Red Bar = Acquisition vs. Blue Bar = Analysis Step

    Wireless Symposium 14

    RFBIMM

    Contiguous samplesStored in capture memory

    Step 1 Step 2 Step 3 Step 1 Step 2 Step 3 Step 4 Step 5

    Freq Changed.Samples gated out(Not stored)

    Acq 1 time

    TransitionInterval

    Trig delay

    Trig event locationStored

    Conceptual StepBeginning = Trig event +Trig Delay

    Multiple Extractions of the same data allowed (and with different lengths)

    E-Atten changeRequired, hence new Acquisition

    Step 1 Step 2

    SequenceAcquisition1 Acquisition2 Acquisition3

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    Source List Sequencer Signal is generated in ARB waveform mode

    Setup a waveform sequence with the same or different waveforms to cover one or multiple formats

    Each waveform signal can be configured with a different frequency and amplitude by using a new step in the sequence

    Wireless Symposium 15

    Key Parameters

    Waveform Sequence

    Segment

    Repetition

    Trigger

    Trigger Source

    Trigger delay

    Trigger type

    Polarity

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    How do you Co-ordinate the Sequencers ?

    Wireless Symposium 16

    DUT

    List Sequence from DUT1. Channel 1 Tx, 0dBm, E-TM 1.12. Channel 1 Tx, -10dBm, E-TM 1.1 3. Channel 1 Tx, 0dBm, E-TM 3.1 4. Channel 2 Rx

    List Sequence measurements by EXF1. Channel 1 Power2. Channel 2 Power, EVM, Spectral mask3. Channel 3 Power4. Channel 2 RX Test, -100dBm, FRC A1-1

    TestController

    Ethernet Hub

    List Sequence EXF E6650A

    BERResult

    Measurement Results

    Start Sequencer

  • Page

    Typical Sequencer Test Plan

    Wireless Symposium

    17

    Power, EVM

    Power

    -20 dBm

    +24 dBm

    120 ms

    120 ms

    120 ms

    Power, SEM, ACLR, EVM,Time error, Freq error, OBW, PCDE

    -60 dBm

    2310 MHz 2310 MHz 2350 MHz 2350 MHz 2390 MHz 2390 MHz 2610 MHz 2610 MHz

    2310 MHz

    Power, EVM

    Power

    -20 dBm

    +24 dBm

    120 ms

    120 ms

    120 ms

    Power, SEM, ACLR, EVM,Time error, Freq error, OBW, PCDE

    -60 dBm

    Power, EVM

    Power

    -20 dBm

    +24 dBm

    120 ms

    120 ms

    120 ms

    Power, SEM, ACLR, EVM,Time error, Freq error, OBW, PCDE

    -60 dBm

    Power, EVM

    Power

    -20 dBm

    +24 dBm

    120 ms

    120 ms

    120 ms

    Power, SEM, ACLR, EVM,Time error, Freq error, OBW, PCDE

    -60 dBm

    2310 MHz2310 MHz 2610MHz2610MHz2610 MHz2350 MHz2350 MHz2350 MHz 1900 MHz1900 MHz1900 MHz

    Source output Uplink signal as a sequence to DUT

    Tx

    Rx

    Triggers / Synch

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    Fastest Measurement Speed

    18

    Sequence analyzer LTE 20 MHz LTE-FDD E-TM3.1 example

    EXF Sequencer

    EXF sequencer: Typical Testplan

    34x faster than MXA one-button application

    Wireless Symposium

    MXA one-ButtonTest Equipment Setup

  • Page

    Increase Test Throughput with Pipeline

    19

    Pipeline Test Scenario

    Serial Test: 2 DUTsSerial Test: 2 DUTs

    Tx-DUT1 Rx- DUT1Boot-DUT1DUT 1DUT 2

    Tx-DUT2 Rx- DUT2Boot-DUT2

    Pipeline: Test DUT1 Tx, DUT2 Rx in parallel; then swapPipeline: Test DUT1 Tx, DUT2 Rx in parallel; then swap

    Boot-DUT1DUT 1DUT 2 Boot-DUT2

    Time saved

    DUT 1

    DUT 2

    Wireless Symposium

    Tx-DUT1 Rx- DUT1Tx-DUT2Rx- DUT2

  • Page

    TRX1TRX1

    Increase Test Throughput with Ping Pong

    20

    Ping Pong Test ScenarioOn a 16 port Test Set, you can connect 8 two-antenna (1 Tx/Rx, 1 Rx diversity) DUTsOn a 16 port Test Set, you can connect 8 two-antenna (1 Tx/Rx, 1 Rx diversity) DUTs

    DUT 2

    1

    Boot up

    Cellular Cal

    Cellular Tx

    Cellular Rx

    Cellular Rx Diversity

    Tx

    Tx

    Rx

    Rx

    RxTx

    RxD

    RxD

    RxD

    Boot

    Boot

    Boot

    B