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Symbol Recognition Contest 2009 current status Philippe Dosch 1 , Ernest Valveny 2 and Mathieu Delalandre 2 1 LORIA, QGAR team, Nancy, France 2 CVC, DAG Group, Barcelona, Spain GREC 2009 Workshop La Rochelle, France Thursday 23th of July 2009

Symbol Recognition Contest 2009 current status Philippe Dosch 1, Ernest Valveny 2 and Mathieu Delalandre 2 1 LORIA, QGAR team, Nancy, France 2 CVC, DAG

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Symbol Recognition Contest 2009current status

Philippe Dosch1, Ernest Valveny2 and Mathieu Delalandre2

1LORIA, QGAR team, Nancy, France2CVC, DAG Group, Barcelona, Spain

GREC 2009 WorkshopLa Rochelle, France

Thursday 23th of July 2009

Introduction

• Context

Many recognition methods exist, sometimes very ad-hoc and domain dependent

Which are the most generic/robust ones? Able to recognize a large variety of data, from different application domains Robust to common noise and distortion found in documents Easy to implement and/or tune

Objective: Measure their performance and robustness under different criteria and kinds of noise

Introduction

Past recognition contests:

ICPR’00, GREC’2003, GREC’2005 and GREC’2007

Contest evolution

ICPR’00, GREC’2003, GREC’2005 segmented technical symbols

GREC2007 segmented logos

GREC2009 whole drawings (i.e. symbol localization)

Agenda

by 31th of July training datasets will be available

http://dag.cvc.uab.es/isrc2009/

by OctoberThe contest will be run online http://epeires.loria.fr/

Interested people are invited to participate

Introduction

• Concerned data

Plan

Recognition datasets (segmented technical symbols and logos)

Localization datasets (drawings, queries)

Conclusions

Recognition Datasets

• 10-25 images/class• All classes included

Basic dataset

Scalability …

Subsets of the basic dataset with increasing number of classes (25, 50, 100, 150)

Geometrictransformations

Application of rotation and scaling to the images of the basic dataset

Image degradations

Application of increasing levels of degradation to the images of the basic dataset (for each kindof degradation)

Recognition Datasetsnoise A noise B noise E

Recognition Datasets

Domain Nº of symbol models

Nº of images / symbol models

Symbols Noise

Technical 150 10 1500 Rotation

Technical 150 10 1500 Scaling

Technical 150 10 1500 Rotation and Scaling

Technical 150 25 3750 Noise A (1-5)

Technical 150 25 3750 Noise B (1-5)

Technical 150 25 3750 Noise E (1-6)

15 750

Logos 105 10 1050 Rotation

Logos 105 10 1050 Scaling

Logos 105 10 1050 Rotation and Scaling

Logos 105 25 2625 Noise A (1-5)

Logos 105 25 2625 Noise B (1-5)

Logos 105 25 2625 Noise E (1-6)

14 775

Training sets

Localization Datasets

c2

c1

M1

M2

M3

M4

C1

C2

C3

C4

L1

θ1

p1

L2θ2

p2

p

1,0L 2,0

L

bounding box and control point

alignment

symbol model loaded symbol

Symbol Models

BuildingEngine

(2) run

(3) display

(1) edit

Background Image

Localization Datasets

Localization Datasets

Groundtruth

Generation of queries

1. Random selection of a document2. Radom selection of a symbol

3. Random crop

Background Dataset 1

Random selectionof a test image

with groundtruth

Background Dataset 2

Background Dataset n

---

Image degradation

Contest Dataset 1

Contest Dataset 2

Contest Dataset n

---

Localization Datasets

Level 1 Level 2 Level 3

Localization Datasets

Type Domain Nº of symbol models

Images Symbols Noise

Drawings Architectural 16 20 633 ideal

Drawings Architectural 16 20 597 level 1

Drawings Architectural 16 20 561 level 2

Drawings Architectural 16 20 593 level 3

80 2384

Drawings Electrical 20 20 246 ideal

Drawings Electrical 20 20 274 level 1

Drawings Electrical 20 20 237 level 2

Drawings Electrical 20 20 322 level 3

80 1079

Queries Both 36 900 900 NA

900 900

Conclusions

New feature of the contest, localization datasets

Remaining work, performance characterization for localization

simple method (e.g. bounding box overlapping)

Agenda

by 31th of July training datasets will be available

http://dag.cvc.uab.es/isrc2009/

by OctoberThe contest will be run online http://epeires.loria.fr/

Interested people are invited to participate,

please contact us: [email protected]

[email protected]

[email protected]