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Detail of EBSD and Structure Control, very intensive lecture by Prof H. K.
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7/21/2019 Structure Control Engineering
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Application of Diffraction to Texture Analysis
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Application of Diffraction to Texture Analysis
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Application of Diffraction to Texture Analysis
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Application of Diffraction to Texture AnalysisPole figure measurements
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Application of Diffraction to Texture AnalysisPole figure measurements
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Application of Diffraction to Texture AnalysisPole figure measurements
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i is the imaginary constant, i.e. i = ( −1) 0.5
The intensity of the reflected radiation is proportional to F 2 and, hence,reflection only occurs if the reflected waves are all in phase, that is, if F ≠ 0.
Diffraction of radiation at the various atoms in a crystalline structure is governed bythe structure factor F ,
The differences between the various radiations used for texture analysis , that is,x-rays, neutrons, and electrons, are represented by the atomic scatteringamplitude f , but the geometrical considerations associated with structure factorF hold for all kinds of radiation.
Application of Diffraction to Texture AnalysisPole figure measurements
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It is seen that if ( h + k + l ) is odd, the exponentialterm in the equation becomes -1, so that F = 0.However, if ( h + k + l ) is even, then F = 2 f , whichmeans reflection.
(100), (200), (110), (220)
To derive the rules of extinction, the followingrelations with complex numbers are helpful;
BCC materials
Application of Diffraction to Texture AnalysisPole figure measurements
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FCC materials
(112), (200), (222), (111)
Application of Diffraction to Texture AnalysisPole figure measurements
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Ni3Al
(111), (211)
Application of Diffraction to Texture AnalysisPole figure measurements
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Application of Diffraction to Texture AnalysisStructure factors
Inverse pole figure map of pearlitic steelCementite (iron Carbide)
Orthorhombic structure
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Cementite (iron Carbide)
Orthorhombic structure
In literature it has been commonly reported that it is rather difficult to index cementite
lamellae due to their low structure factors of its lattice???? .
Application of Diffraction to Texture AnalysisPole figure measurements
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Application of Diffraction to Texture AnalysisPole figure measurements
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Application of Diffraction to Texture AnalysisPole figure measurements
For PFs measurement, asymmetric scanning should be used. In this scanning acertain set of hkl-planes is selected, and the sample has to be tilted and rotated inspace.
If the goniometer is set for {100} reflections, thenall directions in the sample that are parallel to
<100> directions will exhibit diffraction.
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Application of Diffraction to Texture AnalysisPole figure measurements