Single Event Transient (SET) in Linear Devices, Testing ......Trigger LevelTrigger Level NEPP Workshop, Houston TX January 5, 2002- presented by Stephen Buchner 10 Various transient

1NEPP Workshop, Houston TX January 5, 2002 - presented by Stephen Buchner

Single Event Transient (SET) in Linear Devices, Testing Guidelines

C. Poivey, S. Buchner,J. Howard, C. Seidleck,K. LaBel, H. Kim, J. Forney

NASA GSFC, Greenbelt MD 20771

Work sponsored by NASA ERC program and DTRA

2NEPP Workshop, Houston TX January 5, 2002- presented by Stephen Buchner

Outline

• Introduction• Lessons learned

– Irradiation conditions– Bias conditions– Test set-up– Data analysis and reporting

• Testing guidelines


Introduction

• SETs are momentary glitches in the output voltage of a circuit caused by ions passing through sensitive nodes in the circuit

• SETs can occur in both digital and analog circuits

R

Vdd

Vss

Vin(+)

Vin(-)


Introduction

•Need for test guidelines is to ensure

– that all SET testing of linear circuits be done by a test engineer who

is fully aware of all conditions that affect the results

– the results can become part of a radiation effects data base that

can be used by others who also want to use the part in space.


Introduction

•Numerous SET tests have been performed during the last two years by NASA-GSFC in order to define a low cost conservative test methodology.

•This talk presents both the lessons learned during these tests and the proposed testing guidelines.


1.00E-07

1.00E-06

1.00E-05

1.00E-04

1.00E-03

0 10 20 30 40 50 60

LET(MeVcm2/mg)

Cro

ss s

ectio

n (

cm2 /

com

par

ato

r)

0.05V

0.1V

0.2V

0.8V

0.9V

1V

2V

LM139 NSC

Bias conditions have a significant effect on device sensitivityInput Voltage


1.00E-09

1.00E-08

1.00E-07

1.00E-06

1.00E-05

1.00E-04

0 10 20 30 40 50LET(MeVcm2/mg)

Cro

ss s

ecti

on

(cm

2 /am

plif

ier)

Vcc=5V,Vin=0.015VVcc=5V,Vin=0.03VVcc=15V,Vin=0.05VVcc=15V,Vin=0.1VSeries5

0 event

LM124 NSC Non Inverting x11

Bias conditions have a significant effect on device sensitivityPower Supply Voltage

Tilted point


Angle (Degrees)0 10 20 30 40 50 60 70

Cro

ss-S

ecti

on

(cm

2 )

0

20x10-6

40x10-6

60x10-6

80x10-6

100x10-6

120x10-6

.05 Volts

.02 Volts

.10 Volts National LM111LET = 13.23 MeV cm2/mg

Differential Input Bias

There is not always a dependenceon tilt angle

Data provided by M. Savage, NAVSEA CRANE

RPP Method?


Bias conditions have a significant effectson transient waveform

LM139 Vcc=+/-5V TAMU LET=18.7 MeVcm2/mg

-5

-4

-3

-2

-1

0

1

2

3

4

5

1.2E-05 1.4E-05 1.6E-05 1.8E-05 2.0E-05 2.2E-05 2.4E-05 2.6E-05 2.8E-05

Time (s)

Ou

tpu

t V

olt

age

(V)

Rail to Rail transient:90% of transients for δδVin


Various transient waveforms can be collected

LM124 Non inverting gain x11 Vcc=+/-15V Vin=0.5V TAMU LET= 30 MeVcm2/mg

2

4

6

8

10

12

14

0.0E+00 1.0E-06 2.0E-06 3.0E-06 4.0E-06 5.0E-06 6.0E-06 7.0E-06 8.0E-06 9.0E-06 1.0E-05

Time (s)

Ou

tpu

t V

olt

age

(V)

103 events

49

(6V;380ns)

29

(1.8V;2.3us)

2

(3.4V;60ns)

23

(1.4V;145ns)


Transient characteristics vary with LET

LM124 Non inverting gain x11 Vcc=+/-15V Vin=0.5V TAMU LET

2

4

6

8

10

12

14

0.0E+00 2.0E-06 4.0E-06 6.0E-06 8.0E-06 1.0E-05 1.2E-05 1.4E-05 1.6E-05 1.8E-05 2.0E-05

Time (s)

Ou

tpu

t V

olt

age

(V)

LET = 9 MeVcm2/mg28 events

LET = 30 MeVcm2/mg103 events

24

4

51

4

2923


0

1

2

3

4

5

6

-5.0E-06 -3.0E-06 -1.0E-06 1.0E-06 3.0E-06 5.0E-06 7.0E-06 9.0E-06

Time (s)

Ou

tpu

t V

olt

age

(V)

laser test, measurement with a FET probe (C=11pF) laser test, device output

connected to the oscilloscopewith a coaxial cable

Test set-up may have significant effect onthe collected transient waveforms


Test set-up may have significant effect onthe collected transient waveforms

LM124 Non inverting gain x11 Vcc=+/-15V Vin=0.5V

-2

0

2

4

6

8

10

12

14

0.0E+00 5.0E-06 1.0E-05 1.5E-05 2.0E-05 2.5E-05 3.0E-05 3.5E-05

Time (s)

Ou

tpu

t V

olt

age

(V)

TAMU LET=30MeVcm2/mg102 events

BNL LET=37 MeVcm2/mg102 events

49

29

2

23 26

71

5


PM139 δδ Vin=1V

1.00E-06

1.00E-05

1.00E-04

1.00E-03

0.0 10.0 20.0 30.0 40.0 50.0 60.0 70.0

LET (MeVcm2/mg)

Xse

ctio

n (

cm2/

com

par

ato

r)

Transients of amplitude > 0.5V (1)

Transients critical for the application (2)

(1) After A. Johnston, IEEE Trans. on Nuc. Sci., vol. 47-6, p2624, Dec. 2000.(2) After Boeing data.

How good is the data to assess the SET impacton applications?


Testing GuidelinesIrradiation Conditions

• Flux must remain low enough not to cause pile-up of data collection

• A sufficient number of transients needs to be collected to get asignificant number of all the different transient waveforms:>400 events

• Minimum penetration range of ions:

> 30 µm


Testing GuidelinesBias Conditions

• A large set of different bias conditions is necessary to try to understand the device behavior and define worst case bias conditions.

• It is not often possible to define worst case bias conditions.

• It is often necessary to test the parts in their application conditions.– Laser testing and modeling may be useful to check other

bias conditions.


Testing GuidelinesData collection techniques

• Care must be taken in the selection of the type of oscilloscope probe used– Low capacitance active FET probe.

• All the transients collected need to be stored for further analysis.


Testing GuidelinesData Analysis & Reporting

• At minimum the report should include:– bias conditions– measurements conditions (triggering conditions)– the total cross section curve– traces of the different types of waveforms collected with

worst case characteristics (amplitude, duration) and how they contribute to the total cross section curve.


Testing GuidelinesData Analysis & Reporting

Pulse Width (µµs)0 2 4 6 8 10 12 14

Am

plit

ud

e (V

olt

s)

-4

-3

-2

-1

0

1

2

3

4

Slow Signal Decay TimeFast Signal Decay TimeGlitch

National LM124A0.65 Volts Bias



Summary


• SETs are voltage transients that appear on the outputs

linear devices exposed to ionizing particles in space.

• Unlike SETs in devices like memories, SETs in linears

can vary significantly based on operating conditions.

• NASA/GSFC has produced a document that provides

guidance to the community for SET testing of linear

devices.

Documents

Single Event Transient (SET) in Linear Devices, Testing ......Trigger LevelTrigger Level NEPP Workshop, Houston TX January 5, 2002- presented by Stephen Buchner 10 Various transient