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S. Mandayam, ECE Dept., Rowan Univers Parametric Characterization Parametric Characterization of PSF of Split-D Core EC of PSF of Split-D Core EC Probes Probes Department of Electrical & Computer Engineering 201 Mullica Hill Road Glassboro, NJ 08028, USA engineering.rowan.edu Shreekanth Mandayam GE John F. Welch Technology Center Bangalore, India

S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

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Page 1: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Parametric Characterization of Parametric Characterization of PSF of Split-D Core EC ProbesPSF of Split-D Core EC ProbesParametric Characterization of Parametric Characterization of PSF of Split-D Core EC ProbesPSF of Split-D Core EC Probes

Department of Electrical & Computer Engineering

201 Mullica Hill RoadGlassboro, NJ 08028, USA

engineering.rowan.edu

Shreekanth MandayamShreekanth Mandayam

GE John F. Welch Technology CenterBangalore, India

Page 2: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

OutlineOutline• Objectives

• Approach– Parametric PSF Model– EC Signature Deconvolution

• Pre-Restoration Filtering

• Results– Simulated Image Template– SC EC Images

• Summary

Page 3: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

ObjectivesObjectives

• To design and develop a numerical parametric model for multiple EC probe PSFs

• To validate parametric PSF model by deconvolution of EC signatures for flaw characterization

Page 4: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Experimental Data (GEMTC)Experimental Data (GEMTC)

• SGE638 and SGE596 split-D core EC probes• EC-2000 system at 6-MHz• Copper wire (200-mils diameter) tip sharpened to

3-mil diameter embedded in 1” thick hard polystyrene foam.

• Ferrous tip• 500 x 500 TIFF files with a pixel resolution of 1-

mil x 1-mil

Page 5: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Experimental Data (GEMTC)Experimental Data (GEMTC)

Cu Tip Fe Tip SGE638

Page 6: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Parametric PSF Model (1-DOF)Parametric PSF Model (1-DOF)

2

22

2

)(

),( yx

eyxg

yyxpxyxqyyxgy

xyxgx

yxg ˆ),(ˆ),(ˆ),(ˆ),(),(

Page 7: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Parametric PSF Model (2-DOF)Parametric PSF Model (2-DOF)

2

2

2

2

22),( yx

yx

eeyxg

),(ˆ).,(),( yxgy

yyxgyxp

Page 8: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Parametric PSF Model (2-DOF)Parametric PSF Model (2-DOF)  PSF

Size

mils

mils

mils

SGE638 – Cu tip

44 x 42 19.802 11.002

SGE638 – Fe tip

51 x 43 17.852 12.752

SGE596 – Cu tip

121 x 36 12.102 32.672

SGE596 – Fe tip

109 x 31 10.92 32.702

2y2

x

Page 9: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

PSF: Fe Tip PSF Model

0

50

02040600

0.5

1

Comparison

0 20 40 600

0.2

0.4

0.6

0.8

1

Experimental

Model

SGE638

Page 10: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

PSF: Cu Tip PSF Model

0

50

02040600

0.5

1

Comparison

0 20 40 600

0.2

0.4

0.6

0.8

1

Experimental

Model

SGE638

Page 11: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

PSF: Cu Tip, SGE596 PSF Model

0

20

40

0501001500

0.5

1

Comparison

0 50 100 1500

0.2

0.4

0.6

0.8

1

Experimental

Model

SGE596

Page 12: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

PSF: Fe Tip, SGE596 PSF Model

020

40

0501001500

0.5

1

Comparison

0 50 100 1500

0.2

0.4

0.6

0.8

1

Experimental

Model

SGE596

Page 13: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

EC Signature DeconvolutionEC Signature Deconvolution

: Probe PSF model : Eddy-current inspection signature

: Deconvolved image (defect/flaw profile)

),( yxp ),( vuP

),( yxs ),( vuS

),( yxd ),( vuD

),(),(),(

),(*),(),(

vuPvuDvuS

yxpyxdyxs

Page 14: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Deconvolution MethodsDeconvolution Methods

Lucy-Richardson Algorithm

),(),(),(),(

),(),(1 yxdyxp

yxpyxdyxs

yxd ii

i

Wiener Filter

),(

),(),(),(

),(),(ˆ

2

*vuS

vuSvuSvuP

vuPvuD

ddnn

Page 15: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Simulated Image Template: Simulated Image Template: Effect of Anisotropic PSFEffect of Anisotropic PSF

Slot Template

d(x,y) * p(x,y) = s(x,y)

Wiener Lucy-Rich.

Page 16: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Simulated Image Template: Simulated Image Template: Effect of Isotropic PSFEffect of Isotropic PSF

Slot Template

d(x,y) * p(x,y) = s(x,y)

Wiener Lucy-Rich.

Blurred

Wiener Restored

Lucy-Richardson Restored

Page 17: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Pre-Restoration FilterPre-Restoration Filter

),(),(),( yxpyxdyxs

),(),(),( yxfyxsyxs f

),(),(),( yxhyxfyxp

),(),(),( yxhyxdyxs f

Anisotropic PSF

Pre-restoration filter

Isotropic PSF

Isotropic blur

Page 18: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Results: Simulated ImageResults: Simulated ImageSlot Template PSF Model: Grad(Gaussian)

Blurred

BlurredPre-Restoration Filter Pre-Filtered

Restoration PSFPSF Model: Grad(Gaussian) Pre-Restoration Filter

Lucy-Richardson Restored

d(x,y) * p(x,y) = s(x,y)

s(x,y) * f(x,y) = sf(x,y)

p(x,y) * f(x,y) = h(x,y)

L-C Restored

Anisotropic PSF

Pre-restorationfilter

Isotropic blur

IsotropicPSF

Page 19: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

Simulated Image; Simulated Image; Experimental PSFExperimental PSF

Blurred Cu TipPre-Filter Cu Tip Restoration PSF Cu Tip

Lucy-Richardson Restored: Cu Tip

s(x,y) p(x,y) f(x,y) h(x,y)

L-CRestored

PSF: Cu Tip

Page 20: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

SC-EC Images on DatabaseSC-EC Images on Databaseiimlgeaenge$ on 'bng1nas02.jfwtc.ge.com‘

DA718_H01_163S/DA718_H01_163S.S.1.030504.1459

EC Signature Binary

Original RestoredEC Signature Binary

Page 21: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

SC-EC Images on DatabaseSC-EC Images on Databaseiimlgeaenge$ on 'bng1nas02.jfwtc.ge.com‘

DA718_H01_163S/DA718_H01_163S.S.2.030504.1459

Original Restored

EC Signature Binary

EC Signature Binary

Page 22: S. Mandayam, ECE Dept., Rowan University Parametric Characterization of PSF of Split-D Core EC Probes Department of Electrical & Computer Engineering 201

S. Mandayam, ECE Dept., Rowan University

SummarySummary

• Parametric model for PSF of split-D core EC Probe

• Deconvolution algorithm to compensate for anisotropic probe PSF