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Recent Advances in900 V to 10 kV SiC MOSFET Technology
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
900 V to 10 kV SiC MOSFET Technology
David Grider, Ph.D.Wolfspeed, a Cree [email protected] or 919-607-8185
D. Grider, J. Casady, V. Pala, E .Van Brunt, B. Hull, S-H. Ryu, G-Y. Wang, J .Richmond, S. Allen,J. Palmour, P. Killeen, B. McPherson, K .Olejniczak, B. Passmore, D. Simco, T. McNutt
2
© 2015 Cree, Inc. All rights reserved.
3
• Cree/Wolfspeed Gen 3 MOSFETs– Specific RDSON of 900V-1700V MOSFETs– Rel data for smaller (65mOhm) 900V MOSFETs
• 900V, 10mOhm SiC MOSFET chip characteristics– Static, dynamic, short-circuit, reliability
• 1.2kV & 1.7kV Gen 3 SiC MOSFETs• 3.3kV & 6.5kV SiC MOSFETs
OUTLINE
Power and RF Division
© 2015 Cree, Inc. All rights reserved.
• 3.3kV & 6.5kV SiC MOSFETs– DC over temperature (3.3kV)– Dynamic characteristics at temperature (3.3kV)
• 10kV SiC MOSFETs– DC over temperature– Dynamic characteristics at temperature
• Summary
Cree/WolfspeedGen 3 SiC MOSFETs
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
Cree/WolfspeedGen 3 SiC MOSFETs
5
Optimized doping
Reduced pitch
© 2015 Cree, Inc. All rights reserved.
Gen 2 DMOS Gen 3 DMOS
Commercially released in 2013 as “C2M” product family at 1.2-1.7kV
Commercially released in 2015 as “C3M” product 65
Design and automotive qualify 32mm2 chip which has >2X lower RDSON than any commercial FET
6NEXT-GEN SiC DMOS LOWERS RON,SP DRAMATICALLY
10
100
(mc
m2)a
tVG
=20
V
3.3 kV
10 kV
15 kV
6.5 kV
2011 release(1200V)
•Gen 3 SiC DMOS haslowest RON,SP in market
•Gen 3 SiC DMOS haslower RON,SP thantrench SiC MOSFET
© 2015 Cree, Inc. All rights reserved.
1
10
100 1,000 10,000
RO
N,S
P(m
Breakdown Voltage (V)
3.3 kV
Gen 3 C3M900V
Gen 2, C2M Family1.2 kV
Gen 1, CMF Family1.2 kV
R&D 1.2 kV
2013 release(1200V & 1700V)
2015 release(900V)
2
2
7CREE SiC MOSFET PORTFOLIO SUMMARY
© 2015 Cree, Inc. All rights reserved.
TO-220-3 TO-247-3 TO-263-7
8LIFETIME PROJECTIONS FOR C3M065090 (900V, 65mOhm)
1E+04
1E+05
1E+06
1E+07
1E+08
1E+09
Pro
jec
ted
Lif
eti
me
(Ho
urs
)
T1% (slope based on Gen 2)
© 2015 Cree, Inc. All rights reserved.
• 900V rating results in 65 years before the first projected 1% of failures
• At 1kV continuous voltage, projected failure time for first 1% is 9 years
• Avalanche rated: zero fails in 1,000 hours at 50 μA, V > 1200V
1E+01
1E+02
1E+03
500 600 700 800 900 1000 1100 1200 1300
Pro
jec
ted
Lif
eti
me
(Ho
urs
)
Vd Stress (Volts)
First failurein avalanche
9LIFETIME PROJECTIONS FOR C3M065090 GATE OXIDES
MTTF (T50%)
~600M hours~10M hours
© 2015 Cree, Inc. All rights reserved.
• Extrapolated VGS lifetime of ~600M hours at +15V (DC recommended operating point)
• Passed AEC-Q101 qualification of 3 lots x 77 parts with Ø fails in 1,000 hrs at VGS=15V, 150C
Tested to Failure35 parts per step
T=150°C
10SIMPLIFY DC FAST CHARGERS:FB LLC RESONANT CONVERTER
Resonant Tank
© 2015 Cree, Inc. All rights reserved.
Silicon (overcome HV):600V MOS to get >800V DC LinkThree-level LLC Full bridge
Typical switch 100 kHz – 200 kHz
Complicated topology and control Additional clamp diodes
Silicon Carbide:900V SiC MOS (reliable up to 1kV)Two-level FB ZVS LLC resonant
Target switch >200 kHz – 400 kHz Reduce BOM cost by 20% & efficiency Simplify the converter design Reduce resonant tank size
Three-level (3L)Resonant Tank
Two-level (2L) Resonant Tank
Si to SiC
11
Voltage Rating &Technology
Part # On-resistance &Current at Tc = 100C
Distribution priceper 100
900VSilicon
IPW90R120C3 120 mohm23 A
$11.50
900VSilicon Carbide
C3M0065090J 65 mohm23 A
$9.62
COST COMPARISON BETWEEN SILICON, SiC, AND GaN
© 2015 Cree, Inc. All rights reserved.
Silicon Carbide 23 A650VGaN
GS66508P-E05-TY 50 mohm23 A
$27.07
For High Speed Switches, SiC is currently the least expensive at 900V
900V, 10mOhm SiC MOSFETDie Characteristics
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
900V, 10mOhm SiC MOSFETDie Characteristics
13
• Comparing 900V SiC MOSFET to 650V Si
• Lower positive temperature coefficient than Si superjunction MOSFET– 900V SiC MOSFET– 650V Si MOSFET
• No knee voltage as found in IGBT
35
40
45
) 100
120
So
urc
eC
urr
ent
© 2015 Cree, Inc. All rights reserved.
0
5
10
15
20
25
30
35
25 50 75 100 125 150 175
ON
Res
ista
nce
(m
Temperature (C)
0
20
40
60
80
0 0.5 1 1.5 2 2.5
Dra
in-S
ou
rce
Cu
rren
t
Drain-Source Voltage
Infineon 650V 100 A IGBT, Part No. IGZ100N65H5, http://www.infineon.com/dgdl/Infineon-IGZ100N65H5-DS-v02_01-EN.pdf.
14
• The 900V 10 m SiC MOSFET chip is capable of extremely fast transitions.
• In TO-247-3, LS in the gate driver loop will limit the switching speed.TO-247-3 package and TO-247-4 package evaluated.
• TO-247-4 has a separate source return pin for the gate driver equivalentcircuit. VG,KS is not affected by the voltage drop in the source inductance LS2introduced by the di/dt of the drain-source current.
© 2015 Cree, Inc. All rights reserved.
D
KS
G
S
TO-247-4
TO-247-3
15
• LEFT: Comparison of Turn-OFF for 900V, 10 m SiC MOSFET inTO-247-3 and TO-247-4 packages (RG GS=-4V/+15V)
• RIGHT: Comparison of Turn-ON for 900V, 10 m SiC MOSFET inTO-247-3 and TO-247-4 packages (RG GS=-4V/+15V)
160800RG = 5 OhmsTJ = TAmb = 25 °CVDS
TO-247-4
160800RG = 5 OhmsTJ = TAmb = 25 °C
Turn-OFF Turn-ON
© 2015 Cree, Inc. All rights reserved.
-40
0
40
80
120
-200
0
200
400
600
0 50 100 150 200 250 300
Dra
in-S
ourc
eC
urr
ent
(A)
Dra
in-S
ou
rce
Vol
tag
e(V
)
Time(ns)
TO-247-4TO-247-3
IDS
TO-247-4TO-247-3
-40
0
40
80
120
-200
0
200
400
600
1200 1250 1300 1350 1400 1450 1500
Dra
in-S
ourc
eC
urr
ent
(A)
Dra
in-S
ourc
eV
olt
age
(V)
Time(ns)
IDS
TO-247-4TO-247-3
VDS
TO-247-4TO-247-3
16
• LEFT: Switching Energy losses at 25 C for 900V, 10 m SiC MOSFET in TO-247-3package (RG GS=-4V/+15V, VDD=600V)
• RIGHT: Switching Energy losses at 25 C for 900V, 10 m SiC MOSFET in TO-247-4package (RG GS=-4V/+15V, VDD=600V)
7
8RG=5 T T = 25 C 7
8RG=5 T T = 25 C
~3.5X lower switching energy with Kelvin Source contact
© 2015 Cree, Inc. All rights reserved.
0
1
2
3
4
5
6
7
10 20 30 40 50 60 70 80 90 100
Sw
itch
ing
En
erg
yL
oss
(mJ
)
Drain-Source Current
ESW
EON
EOFF
TJ = Tamb = 25 C
0
1
2
3
4
5
6
7
10 20 30 40 50 60 70 80 90 100
Sw
itch
ing
En
ergy
Los
s(m
J)
Drain-Source Current
ESW
EON
EOFF
TJ = Tamb = 25 C
TO-247-3L TO-247-4L
TO-247-3TO-247-4
900V SIC MOSFETB D P
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
900V S C MOSFETBODY DIODE PERFORMANCE
Third Quadrant Operation – Maximizing Efficiency
-20
-10
0
10
20
30
40
ID(A
)
CMF20120D MOSFET at 25C
0V
5V
10V-20
-10
0
10
20
30
40
ID(A
)
CMF20120D MOSFET at 25C
0V
5V
10V
© 2015 Cree, Inc. All rights reserved.
-40
-30
-20
-5 -2.5 0 2.5 5
VDS (V)
10V
15V
20V
-40
-30
-20
-5 -2.5 0 2.5 5
VDS (V)
10V
15V
20V
• SiC MOSFETs Have Built-In Body Diode That Can Be ExploitedIn Applications Requiring Antiparallel Conduction
• Third Quadrant IV Characteristics are Parallel Combination of SiC MOSFET and PN diode
• Applying Positive Gate Bias Turns the SiC MOSFET Fully On
• Conduction is Symmetric for Positive and Negative VDS – Synchronous Rectification
19
• LEFT: 3rd Quadrant characteristics of the 900V, 10 m MOSFET at 175C
• RIGHT: Reverse recovery waveforms of the 900V, 10 m MOSFET at 25Cand 150C
• Body diode with 3rd quadrant an excellent option for bidirectional flow
• Reverse recovery time is only 56 ns.
0-6 -5 -4 -3 -2 -1 0
T =175 C 80
100
QRR is 510 nC
© 2015 Cree, Inc. All rights reserved.
-120
-100
-80
-60
-40
-20
0
Dra
in-S
ourc
eC
urr
ent
Drain-Source Voltage
VGS=-4 V
VGS=0V VGS=15V
TJ=175 C
-40
-20
0
20
40
60
80
1000 1025 1050 1075 1100 1125 1150 1175 1200
Dra
in-S
ou
rce
Cu
rren
t(A
)
Time (ns)
25 C
150 C
QRR is 510 nCVR=600V
IF=90Adi/dt=1200A/us
20SHORT-CIRCUIT TESTING OF 900V, 10mOHM SiC MOSFET IN TO-247-3L
• Tested 4us with VGS = 19V• IDS was not captured on scope, but was >406A• At VDS = 500V, peak voltage was 645V, and device survived• At VDS = 600V, peak voltage was 755V, and device failed• Consistent with or above typical commercial SiC MOSFETs capability
IDS off scope (>406A) IDS off scope (>406A)
© 2015 Cree, Inc. All rights reserved.
VDS=500V; tSC=4us; VGS=+19V VDS=600V; tSC=4us; VGS=+19V
Device survivedDevice failed
Test results courtesy of:
900V SiC MOSFETHalf-Bridge Module
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
Half-Bridge ModuleCharacteristics
22900V, 400-800A, SiC HALF-BRIDGE POWER MODULES
•
chips in ½ - bridge module–
–
• HTRB (150°C) completed
© 2015 Cree, Inc. All rights reserved.
– 6 modules (48 MOSFETs)– 1000 hrs; Zero failures
• HTRB (175°C) completed– 5 modules (same modules
– 850 hrs; Zero failures
23BENCHMARK 900V SiC & 650V Si POWER MODULES• 900V SiC XAB350M09HM3 compared with
650 V EconoDUAL3 Si IGBT
• 250 V higher blocking voltage
• 10-20x lower body diode recovery, gatecharge, and reverse transfer capacitance.
• Symmetrical 3rd quadrant conduction
• Lower on-state losses
© 2015 Cree, Inc. All rights reserved.
Parameter Wolfspeed XAB350M09HM3 silicon FF450R07ME4_B11Package HT-3000 (custom) EconoDUAL3Blocking voltage (V) 900 650TJ,MAX (°C) 175 150RDS, ON 2.5 / 3.6 N/AIDS @ 150°C (A) 405 430QG (nC) 648 4800QR @ 150°C (µC) 2.02 (0.504 x 4) 35.5Input capacitance, Ciss / Cies (nF) 15.7 (3.93 x 4) 27.5
Rev. transfer cap, Crss / Cres (pF) 72 (18pF x 4) 820
24900V, HALF-BRIDGE – 4 DIE/SWITCH; SWITCHING ENERGY
10
15
20
Swit
chin
gEn
erg
y(m
J)
900 V, 10 mΩ Half-Bridge Module (XAB700M09HM3)(Vbus = 600 V, RG,ext = 5 Ω, L = 16 uH)
Total Switching Energy
Turn-on Energy
• 900V SiCXAB350M09HM3
• 4 MOSFETs /switch
• Switching 600V
© 2015 Cree, Inc. All rights reserved.
Switching energies 4-7X lower than comparable Si IGBT modules
0
5
0 50 100 150 200 250 300 350 400
Swit
chin
gEn
erg
y(m
J)
Drain-Source Current (A)
Turn-off Energy
Switching 600V
• ET =5mJ @ 100A
• ET =10mJ @ 200A
25IMPACT OF 900V SiC IN EV
•Assume Ford Focus EV equipped with 90kW IPM motor
•C-Max 90kW Si IGBT inverter or Wolfspeed 88kW SiC inverteras the traction drive
•Synchronous rectification of SiC devices; no diodes in
Compared with Si inverter, SiC reduces inverter losses ~67%in combined EPA drive cycle
© 2015 Cree, Inc. All rights reserved.
•Synchronous rectification of SiC devices; no diodes inparallel with SiC MOSFETs
Simulation data courtesy ofFord Motor Company,based on measured resultsof Wolfspeed 900V, C3M10mOhm SiC MOSFETs
1200V and 1700V SiC MOSFET data
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
1200V and 1700V SiC MOSFET data
271.2kV & 1.7kV GEN 3 SiC MOSFETs
1.7kV SiC MOSFET1.2kV SiC MOSFET
Spec RDSON 2.7m cm2
© 2015 Cree, Inc. All rights reserved.
• Nominally a 67A SiC MOSFET• RDSONmax at room temp• RDSONmax
• Nominally a 75A SiC MOSFET• RDSONmax at room temp ~• RDSONmax
Spec RDSON 2.7m cm2
3300V and 6500V SiC MOSFET data
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
3300V and 6500V SiC MOSFET data
293.3kV & 6.5kV GEN 3 SiC MOSFETs
6.5kV SiC MOSFET3.3kV SiC MOSFET
Spec RDSON 11m cm2
© 2015 Cree, Inc. All rights reserved.
• Nominally a 20-30A SiC MOSFET• RDSONmax at room temp• RDSONmax
• Nominally a 40A SiC MOSFET• RDSONmax at room temp• RDSONmax
Spec RDSON 11m cm2
30
0.5
1
1.5
2
2.5
3
On
Re
sist
ance
,RD
SO
N(p
.u.)
IDS = 50 A
VGS = 20 Vtp < 50 μs
20
40
60
80
100
120
On
Re
sist
ance
,RD
SO
N(m
)
TJ = 150 C
TJ = 100 C
TJ = 25 C
VGS = 20 Vtp < 50 μs
DSON vs T and IDS
25°C
150°C
100°C
IDS = 50A
VGS=20V
© 2015 Cree, Inc. All rights reserved.
Normalized On-Resistance vs. Temperature On-Resistance vs. Drain Current
0
0.5
25 50 75 100 125 150
On
Re
sist
ance
,R
Junction Temperature, TJ (C)
0
20
0 10 20 30 40 50
Drain-Source Current, IDS (A)
tp < 50 μs
• 2.5X increase in RDSON from 25°C to 150°C• Positive temperature coefficient• Devices can be readily paralleled
VGS=20V
tp < 50µs
31GEN3 3.3kV 45m SIC MOSFET-INITIAL HTRB DATA
100
1000
• Accelerated HTRB Testing (3.3kV – at 150°C ) of
• No Accelerated HTRB Failures Observed Up To 660 Hours
© 2015 Cree, Inc. All rights reserved.
0.1
1
10
100
0 100 200 300 400 500 600 700
I DSS
(μA
)
Time (h)
32
© 2015 Cree, Inc. All rights reserved.
• SiC body diode can eliminate external anti-parallel SiC diode• Elimination of external anti-parallel diode saves cost and space• Third quadrant operation of MOSFET possible for additional savings
33GEN3 3.3KV SIC MOSFET
VDS = 0V/+2.2kV
IDS = 0A/+250A
© 2015 Cree, Inc. All rights reserved.
Switching Speed <150ns; Minimum Overvoltage (No Snubber)
343.3kV SIC MOSFET SWITCHING LOSS PERFORMANCE @ 25°C
Vlink = 2.2 kV, Ids = 250 A
Double Pulse Test
© 2015 Cree, Inc. All rights reserved.
• At 2.2kV, 180A switching event, 45mJ total switching energy• 3.3kV SiC MOSFETs switching losses are 10-15x lower than 3.3kV Si IGBTs
35SiC XHP STYLE MODULE - INDUSTRY STANDARD HOUSING
• Engineering Samplesales
• Up to 12 MOSFETs/switch available
• Ultra-Fast Switching,Low Inductance (<20nH V+ to V-)
• Companion gate
© 2015 Cree, Inc. All rights reserved.
• Companion gatedriver
• Desaturation protection,temperature sensing,programmable UVLOwith hysteresis, galvanicsignal isolation, & on-board isolated powersupplies.
10kV SiC MOSFETs
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
10kV SiC MOSFETs
37
16
18
208.1 mm
• Very Small Difference in On-Resistance (RDS,on) at 150 C
• Enhanced Short Circuit 10 kV SiC MOSFET has Higher Threshold Voltage
Measured I-V Characteristics at 150C of Enhanced Short CircuitCapability and Baseline Gen3 10 kV/350 mOhm SiC MOSFETs
18
20
Enhanced Short Circuit Gen310kV/350mOhm SiC MOSFET
Baseline Gen3 10kV/350mOhmSiC MOSFET
© 2015 Cree, Inc. All rights reserved.
0
2
4
6
8
10
12
14
16
0 2 4 6 8 10 12 14
IDS
(A)
VDS(V)
8.1
mm
0
2
4
6
8
10
12
14
16
0 2 4 6 8 10 12 14
IDS
(A)
VDS (V)
0,5 V
15, 20 V
5, 10,15,20 V
0 V
10 V
38
Short Circuit Simulation/Test of Gen 3 10 kV/350 mOhmSiC MOSFETs With Enhanced Short Circuit Capability
• Demonstrated Gen310 kV/350 mOhm SiC MOSFETsCapable of SustainingShort Circuit CurrentFor > 13 µsec at 5000V
© 2015 Cree, Inc. All rights reserved.
For > 13 µsec at 5000V• Measurement and Simulation
Courtesy of Al Hefner at NIST
39
• 10 kV body diode is bipolar – lower resistance than a 10 kV JBS diode at hightemperatures
• Reverse conducting antiparallel SiC JBS diode can be eliminated
10 kV SIC MOSFET BODY DIODE STATIC CHARACTERISTICS
16
18
20
16
18
2025 C 150 C
© 2015 Cree, Inc. All rights reserved.
0
2
4
6
8
10
12
14
0 5 10 15
Am
per
es(A
)
VF (V)
0
2
4
6
8
10
12
14
0 5 10 15
Am
per
es(A
)
VF (V)
40Gen3 10kV/350mOhm SiC MOSFET Body Diode Switching -Body Diode Has Low Reverse Recovery Loss
• Body Diode Has Excellent Dynamic Characteristics Low Reverse Recovery
© 2015 Cree, Inc. All rights reserved.
41Gen3 10kV/350mOhm SiC MOSFET Body DiodesExhibit Stable Performance Under Constant Bias Stress
0
2
4
6
8
10
12
0 100 200 300 400 500 600
Bo
dy
Dio
de
VF
(V)
Hours
10 kV SiC MOSFET
© 2015 Cree, Inc. All rights reserved.
0
2
4
6
8
10
12
0 100 200 300 400 500 600
MO
SF
ET
VD
S,O
Na
tI D
S=
20
A
Stress Time (Hrs)
51.8 mm2 devices
65.6 mm2 devices
42½ BRIDGE CONFIGURED MEASURED SWITCHING ENERGIES AND WAVEFORMS
ETS =21mJat 7kV, 15A,
ETS measured10-33mJ
© 2015 Cree, Inc. All rights reserved.
½ bridge configuration used for switching
in both the high position and low positions.
at 7kV, 15A,G
43
• SiC MOSFETs released in 2011
• > 20 SiC MOSFET discretes in market
• Gen 3 SiC MOSFETs entering market
900-1700V low-profile 62mm
900-1700 V lowprofile
SUMMARY 900V TO 10kV GEN 3 SiC MOSFETS
VDSmax(V) Chip RDSON Comments
900 10 65m released 2015
© 2015 Cree, Inc. All rights reserved.
3.3-6.5 kVHalf-Bridge
10kV XHV-6Half-bridge
900 10 65m released 2015Engineering samples
1200 16 Engineering samples1700 20 Engineering samples3300 41 Engineering samples6500 100 Engineering samples
10000 350 Engineering samples
44
© 2015 Cree, Inc. All rights reserved.
Questions or Discussion?ACKNOWLEDGMENT
The information, data, or work presented hereinwas funded in part by DOE-EERE (DE-EE0006920),
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY
was funded in part by DOE-EERE (DE-EE0006920),DoD-ONR (N00014-D-0145), and DoD-ARL (W911NF-12-2-0064)
EV drive cycle data analysis based on measured 900V SiC MOSFET dataprovided by Dr. Chingchi Chen and Dr. Ming Su, Ford Motor Company
© 2015 Cree, Inc. All rights reserved.© 2015 Cree, Inc. All rights reserved.A CREE COMPANY