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8/16/2019 Ramesh CoreEL VLSI VSAT Module1 2 [Compatibility Mode]
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VLSI VSAT Program
CoreEL University Program Team
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Contents
Introduction to Physical Design- Layout
ASIC Construction : Floorplanning, Placement &Routing ;
Physical verification: DRC, LVS
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Basics of Digital CMOS Design
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Design flow in VLSI / FPGA
Specifications
Design Entry
Functional Verification
S nthesis
Graphical
Simulation
S nthesizer
ASIC Specific
Flow
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Post-Synthesis Verification
PAR
Post-PAR Verification
Bit-Format
Post-syn simulation
Simulation
Verification
Layout
Fabrication
Verification
Physical Verification
Formal Verification
Layout Editor
Physical Verification
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Introduction to Physical Design
Basics of Layout Designing : Design Kits,
Standard Cells.
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Basics of Chip Designing
Foundry
Designer
GDS II
Design Kit
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(Fabricator)
CoreEl confidential
Chip
GDS = Graphic Database SystemIts the de facto industry standard for data exchange of IC layout artwork.
TSMC,UMC,Faraday, etc
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Transistors
a) Circuit Symbol b) Physical Realization
GateSource
DrainGate
SourceDrain
Bulk
Width
Length
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c) Layout View
Minimum Length=2λ
Width=4λSource Drain
Gate
d) Simple RC Model
Gate
Drain
Source
Cdrain
Csource
Ron
Cgate
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Files in Design Kit
Library Database: Layout, schematic, symbol, abstract, andother logical or simulation views.
Timing Abstract - provides functional definitions, timing,ower, and noise information for each cell
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DRC, LVS, PEX rule files.
Technology files: Layer specifications
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Cell List in Digital Design Kit
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Comparison General definitionmodule mux1( select, d, q );
input[1:0] select;
input[3:0] d;
output q;
Synthesized Code
// Verilog description for cell mux1,
// LeonardoSpectrum Level 3,
2010a.7
module mux1 ( select, d, q ) ;
input [1:0]select ;
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w re q;
wire[1:0] select;
wire[3:0] d;
assign q = d[select];
endmodule
output q ;
wire nx59, nx61;
mux21 ix23 (.Y (q), .A0 (nx59),
.A1 (nx61), .S0 (select[1])) ;
mux21 ix60 (.Y (nx59), .A0 (d[0]),.A1 (d[1]), .S0 (select[0])) ;
mux21 ix62 (.Y (nx61), .A0 (d[2]),
.A1 (d[3]), .S0 (select[0])) ;
endmodule
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Design Kit
Digital Design Kit
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Standard Cells
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ASIC Backend Flow
System Partitioning: Divide Large system intoASIC-sized Pieces
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Floorplan: Arrange the blocks of the netlist onthe chip
Placement : Decide the location of cells in ablock
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Floorplan
The input to a floorplanning tool is a hierarchical netlist thatdescribes the interconnection of the blocks
The goals of floorplanning are to:
arrange the blocks on a chip,
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decide the location and number of the power pads,
decide the type of power distribution, and
decide the location and type of clock distribution
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Placement
The goal of a placement tool is to arrange all the logic cellswithin the flexible blocks on a chip
Goals:
r n h r r n m l h r in
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Minimize all the critical net delays
Make the chip as dense as possible
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Placement Algorithms
Two Types of Algorithms used:
Min-cut algorithm
Eigenvalue method
-
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Algorithms
Min-Cut Algorithm Cut the placement area into two pieces.
Swap the logic cells to minimize the cut cost.
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epeat t e process rom step , cutt ng sma er p ecesuntil all the logic cells are placed.
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Routing
Process of placing and connecting signal and powerpaths between the standard cells or blocks
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Global & Detailed Routing
Global Routing A global router does not make any connections, it just
plans them.
The objectives of global routing are
Minimize the total interconnect length.
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complete the routing.
Minimize the critical path delay.
Detailed Routing The detailed router decides the exact location and
layers for each interconnect.
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Special Routing
Clock Routing :
Uses Higher metal Layer (has less resistance & capacitance )
Power Routing:
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• Each of the power buses has to be sized according to thecurrent it will carry.
• The required power-bus widths can be estimated
automatically from library information.
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Design flow in VLSI / FPGA
Specifications
Design Entry
Functional Verification
S nthesis
Graphical
Simulation
S nthesizer
ASIC Specific
Flow
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Post-Synthesis Verification
PAR
Post-PAR Verification
Bit-Format
Post-syn simulation
Simulation
Verification
Layout
Fabrication
Verification
Physical Verification
Formal Verification
Layout Editor
Physical Verification
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References
Application Specific Integrated Circuits-- By Smith– Pearson Publication
http://iroi.seu.edu.cn/books/asics/asics.htm#anchor11320
Physical design essentials: an ASIC design implementation perspective-
- By Khosrow Golshan– Springer Publication
Algorithms for VLSI Design Automation-- By Gerez– Wiley India Edition
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VLSI physical design automation: theory and practice– By Sadiq M. Sait,
Habib Youssef– World Scientific.
Introduction to Place and Route Design in Vlsis-- By Patrick Lee
CMOS: Circuit Design, Layout, and Simulation-- By R. Jacob Baker
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Physical Verification & PEX
Physical Verification DRC
LVS
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Physical Verification : DRC & LVS
DRC : Design Rule CheckingInputs: Layout -- GDSII, OASIS, etc.
Rule File
OutputsDRC ResultsReport
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: ayou ersus c ema cInputsLayout -- GDSII, OASIS, etc.Logic (for LVS) i.e SPICE / Verilog
Rule FileOutputs
LVS ResultsReport
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DRC Errors
Internal
Width:INT oxide
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LVS (Layout Vs Schematic)
RESET
S
D
G
Design View
• Design Architect• Composer
S
RESET
D
G Layout View• DESIGNrev• Virtuoso• StreamView
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DeviceExtraction
ConnectivityExtraction
SchematicCompilation
HDLCompilation
VERIFICATIONRESULTS
COMPARISONPHASE
LAYOUT NETLIST SOURCE NETLIST
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LVS Rule File
Device Statements
E.g. device r(pl) rpoly ipoly ipoly [20000]
Gate Recognition Statements LVS GROUND NAME VSS VSS1
LVS POWER NAME VDD VCC
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LVS RECOGNIZE GATES ALL Connectivity Statements
CONNECT metal1 metal2 BY via12
VIRTUAL CONNECT NAME vdd
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Shorts and Opens
Short circuits
Occur when nets that should be isolated are connected
Can lead to a difference between the number of nets:
# layout nets < # source nets
Open circuits
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entire length of a layout net Can lead to a difference between the number of nets:
# layout nets > # source nets
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Device
NET Y
ELEMENT = MN
M2
S
D
G
1. LVS defines the MNelement templatebased upon theDevice statement.
// Device StatementDEVICE MN NGATE POLY NSD NSD PWELL [0]
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LAYER PWELL 1LAYER OXIDE 2LAYER POLY 4LAYER NPLUS 5
PAREA = OXIDE AND PWELLNGATE = POLY AND PAREANOX = OXIDE AND NPLUSNSD = NOX NOT NGATE
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Parasitic Extraction
Extracts the parasitic values of each interconnect, via, andcontact that will be on the silicon wafer
Parasitic Formats: SPF, RPF and DSPF
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delay and loading due to parasitic resistance andcapacitance.
RSPF– Reduced SPF.
DSPF--- Detailed SPF , describes the actual parasiticresistance and capacitance components of a net.
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Physical Verification Flow using Calibre
Calibre LVS-H
LayoutGDSII
Sourcenetlist
Rule fileHcell list(optional)
Netlist extraction
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Extractionreport
Extractednetlist
LVSreport svdb
Locate errors usingCalibre RVE & Layout tool
Fix layouterrors
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References
Physical design essentials: an ASIC design implementationperspective-- By Khosrow Golshan– Springer Publication
http://www.mentor.com/products/ic_nanometer_design/verification-signoff/physical-verification/
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IC mask design: essential layout techniques-- byChristopher Saint, Judy Saint
CMOS: Circuit Design, Layout, and Simulation-- By R.Jacob Baker
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Basics of Digital CMOS Design
Basic Working of CMOS logic
Models of Digital Design
Pass Gate
Transmission Gate
Inverter
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Switching Characteristics
Sizing
Logic Effort
Types of Logic Circuits
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Complementary CMOS
Complementary CMOS logic gates
nMOS pull-down network
pMOS pull-up network
a.k.a. static CMOSpMOSpull-upnetwork
output
inputs
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nMOSpull-downnetworkPull-up OFF Pull-up ON
Pull-down OFF Z (float) 1
Pull-down ON 0 X (crowbar)
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Series and Parallel
nMOS: 1 = ON
pMOS: 0 = ON
Series : both must be ON
Parallel : either can be ON
(a)
a
b
a
b
g1
g2
0
0
a
b
0
1
a
b
1
0
a
b
1
1
OFF OFF OFF ON
(b)
a
b
a
b
g1
g2
0
0
a
b
0
1
a
b
1
0
a
b
1
1
ON OFF OFF OFF
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(c)
a
b
a
b
g1 g2 0 0
OFF ON ON ON
(d) ON ON ON OFF
a
b
0
a
b
1
a
b
11 0 1
a
b
0 0
a
b
0
a
b
1
a
b
11 0 1
a
b
g1 g2
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Conduction Complement
Complementary CMOS gates always produce 0 or 1
Ex: NAND gate
Series nMOS: Y=0 when both inputs are 1
Thus Y=1 when either input is 0
Requires parallel pMOSA
Y
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Rule of Conduction Complements
Pull-up network is complement of pull-down
Parallel -> series, series -> parallel
B
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Signal Strength
Strength of signal
How close it approximates ideal voltage source
VDD and GND rails are strongest 1 and 0 nMOS pass strong 0
But degraded or weak 1
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pMOS pass strong 1 But degraded or weak 0
Thus nMOS are best for pull-down network
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Why NMOS is week 1?
The nMOS transistor will stop conducting if VGS < VT.Let VT = 0.7V,
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As source goes from 0V 5V, VGS goes from 5V 0V.
When VS > 4.3V, then VGS < VT, so switch stopsconducting.VD left at 5V - VT = 5V - 0.7V = 4.3V or Vdd - VT.
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Pass Transistors
Transistors can be used as switches
g
s d
g = 0s d
g = 1
0 strong 0Input Output
g = 1
g = 1
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s 1 degraded 1
g
s d
g = 0
s d
g = 1s d
0 degraded 0
Input Output
strong 1
g = 0
g = 0
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Transmission Gates
Pass transistors produce degraded outputs
Transmission gates pass both 0 and 1 well
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Transmission Gates
Pass transistors produce degraded outputs
Transmission gates pass both 0 and 1 well
g = 0, gb = 1
Input Output
g g = 1, gb = 0
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g = 1, gb = 0
a b
s rong
1 strong 1gb
a b
a b
g
gb
a b
g
gb
a b
g
gb
g = 1, gb = 0
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CMOS Inverter
VDD
PMOS2λλλλ
V DD
PMOS Contacts
N Well
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Polysilicon
InOut
GND
Metal 1
NMOS
NMOS
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V I Ch i i C
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V-I Characteristic Curve
I Dn
V in = 2.5
V in
= 2
V in
= 0
V in
= 0.5 NMOSPMOS
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V out
V in
= 1.5V in
= 1
V in
= 0
V in = 0.5
V in
= 1V in = 1.5
V in = 2
V in
= 2.5
V in = 1V
in = 1.5
CMOS I VTC C
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CMOS Inverter VTC Curve
V out
1 .
5
2
2 .
5
NMOS sat
NMOS off
PMOS res
NMOS sat
PMOS res
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V in0.5 1 1.5 2 2.5
0 .
5
1
NMOS resPMOS off
NMOS res
PMOS sat
S it hi Ch t i ti
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Switching Characteristics
Define: Rise time tr = time required for a node to charge from the 10% point to 90% point
Fall time tf = time required for a node to discharge from 90% to 10% point
Delay time td = delay from the 50% point on the input to the 50% point on theoutput
Falling delay tdf = delay time with output falling Rising delay tdr = delay time with output rising
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N i M i
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Noise Margin
Noise margin = voltage difference between output of onegate and input of next. Noise must exceed noise margin tomake second gate produce wrong output.
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I t Si i
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Inverter Sizing
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In each case, the rise or fall time depends on the channelresistance, which in-turn, depends on the devicedimensions.
Gate Delay Components
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Gate Delay Components
Split delay of logic gate into three componentsDelay = Logical Effort x Electrical Effort + Parasitic Delay
Logic Gate
Cin
Cout
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Complexity of logic function (Invert, NAND, NOR, etc) Define inverter has logical effort = 1 Depends only on topology not transistor sizing
Electrical Effort Ratio of output capacitance to input capacitance Cout /Cin
Parasitic Delay Intrinsic self-loading of gate Independent of transistor sizes and output load
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Method of Logical Effort
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Method of Logical Effort
Easy way to estimate delays in CMOS process Indicates correct number of logic stages to use and
transistor sizes
Characterize process speed with single delay parameter: ττ, delay of inverter driving same-sized inverter (no parasitic)
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Logical Effort for Simple Gates
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Logical Effort for Simple Gates Define Logical Effort of Inverter = 1
For other gates, size to give same current drive as inverter
Logical Effort is ratio of logic gate’s input cap. to inverter’s input cap.
Relative2 2 4
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Widths
InverterInput Cap = 3 units
L.E.=1 (definition)
NANDInput Cap = 4 units
L.E.=4/3
NORInput Cap = 5 units
L.E.=5/3
2
1
2
2 1
4
1
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Logic Blocks
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Logic Blocks
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F = AB (C +D )
N-block implementation of a Boolean functionA series of N connection P(A,B)= AB;A parallel of N Connection P(A,B)= A+B;
CMOS Tristate & Buffer
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CMOS Tristate & BufferTristate CMOS Buffer
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X C output
0 0 High Z0 1 1
1 0 High Z
1 1 0
When long lines or chip outputsmust be driven buffer circuits,
which have the advantage thatthe output driving transistors aredirectly connected to the outputand ground or respectively
Types of Logic Circuits
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Types of Logic Circuits
Static CMOS
Dynamic CMOS
Pseudo NMOS
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Pass Transistor Logic
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Static CMOS
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Static CMOS
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Characteristics•At every point in time, each gate output is connected to either Vdd or Vss via alow-resistance path•It have rail-to-rail swing , no static power dissipation•Speed depends on the transistor sizing and parasitic that are involved with it.Disadvantage
•The problem with this type of implementation is that for N fan-in gate 2N number of transistors are required, ie, more area required to implement logic.This has an impact on the capacitance and thus the speed of the gate.
Dynamic CMOS
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Dynamic CMOS
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Characteristics•Dynamic CMOS circuits rely on the temporary storage of signal values on thecapacitance of high-impedance circuit nodes.•no static power dissipation.
•Disadvantage•the need for repeated charging and discharging even when the inputs do notchange their state.
Buffered dynamic CMOS (domino) logic
Pseudo NMOS
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Pseudo NMOS
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Characteristics•The advantage of pseudo-NMOS logic are its high speed and low transistorcount.
Disadvantage
•Static power consumption of the pull-up transistor as well as the reducedoutput voltage swing and gain, which makes the gate more susceptible tonoise.
Pass Transistor Logic
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Pass Transistor Logic
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Characteristics•The advantages of pass-transistor logic are
the simple design, the reuse of alreadyavailable signals.•Low contribution to static power.
Disadvantage•Output levels can be no higher than the input
level
Four-to-one multiplexer in pass-transistor logic
References
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References
CMOS: Circuit Design, Layout, and Simulation-- By R. Jacob Baker
CMOS Digital Integrated Circuits-- By Sung-Mo Kang, Yusuf Leblebici
CMOS logic circuit design-- By John Paul Uyemura Cmos Vlsi Design: A Circuits And Systems Perspective, 3/E-- By Weste,
Weste Neil H.E.
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Douglas A. Pucknell and Kamran Eshraghian, Basic VLSI Design, Third
Edition
http://www.iue.tuwien.ac.at/phd/schrom/node93.html
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Thank You
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