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Ps formation, cooling and emission into vacuum
from porous materials
Positron in Astrophysics 19 march 2012 – Murren
R.S. Brusa Department of Physics –University of Trento
main motivation
Many experiments with positrons require high yield of cooled Ps
In particular we need cooled Ps for AEgIS Hbar experiment and Ps spectroscopy at
CERN
eHPsp**)(
Outline
•Positronium emission from surface
•Ps collisional cooling and
Ps thermalization in porous material
Ps at surfaces
Backscattered Ps
SOLID
Hot Ps, Ps* from epithermal e+
Hot Ps, Thermal Ps from thermal e+
After Steiger and Conti 1992
Calculated density of e+ returning at the Al surface, solid line 1keV e+
dashed line 50 eV e+
1 Thermal e+ 2 Epithermal e+ 3 Backscattered e+
Time of flight measurement with e+ beams
The perpendicular velocity is measured v2
22
2
1
t
zmvmE ePs
Backscattered Ps and Ps by epithermal e+
After Howell 1986
Backscattered Ps has a energy dependence approximately as E-1 where E is the e+ incident energy
TOF spectra of Ps emitted from Cu Hatched area , spectrum of Ps from epithermal e+
Ps formation and emission by thermal e+
Direct Ps formation Ps formation by trapped positron at the surface
Direct Ps formation and emission by thermal e+
Possible when the positronium formation potential is negative
Pink: No surface Ps emission εPs >0 -White : Ps emission εPs < 0 Blue: competition between Ps emission and e+ emission
continuous energy spectrum up to the Fermi energy level in metals.
Thermal Ps emission- surface trapping
After Shultz and Lynn 1988
e+ can fall in a trapped state localized In few Amstrong from the surface e+ is strongly correlated with the electron cloud. In figure two extreme: image potential - bare positron Van der Waals - virtual positronium-like
Al Ps emission require an energy Ea , and thermal activation is possible
Ps emission from dielectrics •Ps formation by thermal positron reaching the surface is, in most cases, energetically forbidden. The 6.8 eV energy gain of Ps formation is not enough to extract an electron •Formation of Ps can occur in the bulk. Ps reaching the surface can be emitted If its work function is negative •Ps can form and be hosted by open volumes in dielectrics. If there is a open volume defect network , hopping diffusion may lead to Ps emission into vacuum
In quartz and amorphous SiO2 two different Ps components were observed : One around 1 eV attributed to Ps formed in the bulk One around 3 eV by electron capture of an electron at The surface
Nagashima et al. 1998
1nm Ps
e+
Ps
Ps
Ps
e+
e+
Ps cooling using porous SiO2 based materials
1nm Ps
e+
Ps
Ps
Ps
e+
e+
Ps is formed with eV energy but lose energy by collision with the walls of the connected porosities. Ps energy is normally insufficient for electronic excitation, Ps lose energy by exciting atomic motion A fraction of oPs can reach the surface and can be emitted cooled into the vacuum.
Ps cooling by collisions
Competitive effect : Ps pick-off
oPs 2γ
L
vPsoffpick
Pick off : when the e+ in Ps has an
overlap with an e- of the walls in
an interaction region R
It is expected : to depend from cooling time: ie. permanence
in the excited states
Ps cooling and quantum confinement
Ps cooling process can be described in two regimes:
HIGH ENERGY LIMIT: de Broglie wavelength is small respect to the dimension d of the cavity
meVd
nm
dm
hE
o
206
4 2
2
E
meVnm
206
Ps can be considered a free object of size:
Ps collisions can be treated as a classical elastic scattering ( Sauder , J. Res. Natl. Bur. Stand. § A ,72, (1968) 91)
Ps cooling and quantum confinement
LOW ENERY REGIME
The interaction between the Ps atom and the walls can be described in terms of the contact between a confined Ps atom with the solid as a whole. An estimation of the minimum T permitted for a Ps atom confined in nano-pores and nano-channels, when the temperature is lowered, can be made by modeling the Ps cooling by creation and destruction of phonons at the surface of the pores. (Mariazzi ,Salemi, Brusa, PRB 2008).
meVd
nm
dm
hE
o
206
4 2
2
the maximum variation of the momentum magnitude of Ps due to the exchange of a single phonon at the first order
1-8
maxmax m10*7.1
2
mvkkk sI
Ps cooling and quantum confinement
0 5 10 15 20 25 30
10
100
b)
Ps tem
pera
ture
[K
]
Side a [nm]
0,0
2,0x103
4,0x103
6,0x103
8,0x103
a)
222
2
a
n
mE m
222
33
2
a
n
mkE
kT m
BB
Minimum energy and minimum temperature of a Ps atom confined in a cubic box of size a
mn is the lower accessible level
Dashed line :ground level in a cubic box
Continuous line : ground state = minimum level in Nano-channels (infinite well)
Mariazzi S, Salemi A and Brusa R S 2008 Phys. Rev. B 78 085428
Ps
Positronium converter
Positron beam
Ps
Ps
Vacuum
Ps
Ps
222 / amEg
gB EkT )3/2(
the minimum temperature is:
Mariazzi S, Salemi A and Brusa R S 2008 Phys. Rev. B 78 085428
#0 (4-7 nm) mini T is 180-60 K #1 (8-12 nm) min T is 45-20 K
160 K
Nano-size and Ps thermalization
Si p-type 0.15-0.21 Ohm/cm current from 4-18 mA/cm2 , 15’
produced by electrochemical etching, as for porous silicon but adapting times and current for obtaining nano- structures
10 nm #0 #1 #2 #3 #4
100 nm
#5
Possibility of tuning: #0 = 4-7 nm #1=8-12 nm #2= 8-14 nm # 3= 10-16 nm #4= 14-20 nm #5= 80-120 nm
Mariazzi S, Brusa R S et al Phys. Rev. B 81, 235418 (2010)
Tuning the size of nanochannels
Trento slow positron beam (50 eV-30 keV)
470 480 490 500 510 52010
0
101
102
103
104
coun
ts
energy ( keV )
2γ rays peak area
o-Ps 3γ rays valley area
Annealed 1h 300°C
Annealed 2h 100°C #0
10 nm
a) b)
0.1 1 10
0.0
0.1
0.2
0.3
0.4
0.5
Mean positron implantation depth [nm]
not oxidized
0.5h 100°C
2h 100°C (#0)
4h 100°C
1h 300°C
1h 400°C
F3 (
o-P
s fr
actio
n)
Positron implantation energy [keV]
10 1000
Optimum oxidation for the Ps yield
0.1 1 10
0.1
0.2
0.3
0.4
0.5
Mean positron implantation depth [nm]
F3 (
o-P
s fr
actio
n)
Positron implantation energy [keV]
#3
#4
#5
0.1
0.2
0.3
0.4
0.5
#0
#1
#2
10 1000
ECEBEAEF )(3
12
1
121
E
E
eFFFEA
6.1
0
1
1
E
EEB
2
2
21
1
C
E
E
CCKEC
o-Ps formation
o-Ps out diffusion probability
o-Ps annihilation via 3γ into pores
Ps yield and channel size
#0 = 4-7 nm #1=8-12 nm #2= 8-14 nm # 3= 10-16 nm #4= 14-20 nm #5= 80-120 nm
200
400
600
800
1000
1200
1400
1600
#0 #1 #2 #3 #4 #5
o-P
s d
iffu
sio
n length
[nm
]
Sample
The o-Ps fraction out-diffusing at 10 keV positron implantation energy is still 10 % in #0 = 4-7 nm 17 % in #1 = 8-12 nm 23-25 % in #2, #3, #4 and #5 15 - 100nm
Up to 42 % of implanted positrons at 1 keV emitted as o-Ps
LPs
0.1 1 10
0.1
0.2
0.3
0.4
0.5
Mean positron implantation depth [nm]
F3 (
o-P
s fr
actio
n)
Positron implantation energy [keV]
#3
#4
#5
0.1
0.2
0.3
0.4
0.5
#0
#1
#2
10 1000
0 2 4 6 8 10 12 14 16 180
10
20
30
40
50
60
70
Inte
nsity [
%]
Positron implantation energy [keV]
I1
I2
I3
0.2
0.4
0.6
20
30
40
50
60
1
2
3
Life
tim
e [n
s]
2 channeltrons
target position
5 NaI scintillators
Trento TOF Apparatus BEAM
Prompt peak 16 ns
zo
The TOF apparatus of Trento is now at the intense positron source NEPOMUC at the FRMII reactor in Munich and will be set up at the reactor hall in June-July. NEPOMUC gives 10 9 e+ /s
zo
o-Ps Time of Flight measurements
where
tf
tp
z0
If tp ˂˂ tf tm tf
Mariazzi S, Brusa R S et al., Phys. Rev. Lett. 104 243401 (2010)
0 50 100 150 200 250
0.068 eV
co
un
ts [
arb
itra
ry u
nits]
o-Ps time of flight [ns]
7 keV, T = 150 K
2
0.076 eV
7 keV, T = 200 K
0 100 200 300 400
FWHM = 23 ns
counts
[arb
. units
]
Time of flight [ns]
Prompt
0.096 eV
7 keV, T = 300 K3
4
8
0.140 eV 4 keV, T = 300 K
After smoothing, subtraction of the background, and correction by multiplying by
142
exp1 tt
Ps cooling - 5-8 nm channels
0.0 0.1 0.2 0.3
T=1515±15K
T=305±10K
T=1425±25K
T=195±10K
T=1260±15K
T=145±10K
7 KeV, T = 300 K
7 KeV, T = 200 K
7 KeV, T = 150 K
log(
dN
/dE
) [a
rbitr
ary
uni
ts]
o-Ps kinetic energy [eV]
dEENdttN )()(
3)()( ttNEN
0 50 100 150 200 250
0.068 eV
co
un
ts [a
rbitra
ry u
nits]
o-Ps time of flight [ns]
7 keV, T = 150 K
2
0.076 eV
7 keV, T = 200 K
0 100 200 300 400
FWHM = 23 ns
counts
[arb
. units
]
Time of flight [ns]
Prompt
0.096 eV
7 keV, T = 300 K3
4
8
0.140 eV 4 keV, T = 300 K
The two lines in log-lin graph are proportional to at two different T.
Ps energy
Mariazzi , Bettotti, Brusa, 2010 Phys. Rev. Lett. 104 243401
With A and B , normalization factors
Analysis of the Ps energy spectra
Cool distribution
Warm distribution
Ps
Positronium converter
Ps
Ps
Vacuum
Ps
Ps
Permanence time of Ps in nano-channels before escaping into vacuum
<tm> = <tp> + <tf>
tf
tp
z0
Measurements at three different distances z0 allow to evaluate <tp>
Measurements were done at 7 keV e+ energy
0.00 0.05 0.10 0.15 0.20
z0 = 3 cm, 7 keV
z0 = 2 cm, 7 keV
1130±115 K
339±30 K
910±90 K
331±10 K
1688±150 K
290±17 K
log
(dN
/dE
) [
arb
. u
nit
s.]
Ps kinetic energy [eV]
z0 = 1 cm, 7 keV
Ps energy spectra Ps energy spectra
<tm> of the cold and
warm distribution
<tm> = <tp> + z0/v
tf tp
z0
<tcp> =18±6 ns
<tcw> < 7 ns
Cooling time of Ps
conclusion with a question
Study of Ps formation and annihilation in complex materials and porous complex materials at low temperature are lacking Could be more data useful for understanding signal of Ps annihilation in ISM ?
Thanks for listening and Thanks to the organizers
for the invitation and the wonderful workshop
From Schilthorn