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Photon isolation efficiency study. Zhijun Liang University of Oxford. Introduction. Motivation : Estimate photon isolation efficiency from electron sample from Z->ee Isolation defintion: Leakage correction Ambiant energy correction Selection cut : - PowerPoint PPT Presentation
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Zhijun Liang University of Oxford
Photon isolation efficiency study
Introduction
Motivation : Estimate photon isolation efficiency from electron sample from
Z->ee Isolation defintion:
Leakage correction Ambiant energy correction
Selection cut : Period D~H, EF_e20_medium, Egamma stream Two opp charge , tight electron , pT>25GeV , eta cut 85Gev<M(ee)<95Gev
Systematic : In-time pileup uncertainty Out-of-time pileup uncertainty pT dependence Discrepancy between electron isolation shape and photon isolation
shape
In-time pileup uncertainty(1fb-1 data)
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
npV<33<=npV<=45<=npV<=6Npv>=7
Photon isolation efficiency in different NPV bins(1fb-1 data)
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
npV<33<=npV<=45<=npV<=6Npv>=7
Out of time pileup effect(1fb-1 data) (bunch position dependence)
Bunch position <=34<=Bunch position <=67<=Bunch position <=9Bunch position >9
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
Out of time pileup effect(1fb-1 data) (bunch position dependence)
Bunch position <=34<=Bunch position <=67<=Bunch position <=9Bunch position >9
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
pT dependence effect(1fb-1 data)
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
Pt<35GeV35GeV<=pT<=40GeV40GeV<=pT <=45GeVpT>45GeV
pT dependence effect(1fb-1 data)
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
Pt<35GeV35GeV<=pT<=40GeV40GeV<=pT <=45GeVpT>45GeV
Discrepancy between electron and photon
Unconverted photon from Z->ee+gammaConverted photon from Z->ee+gammaElectron isolation from Z->ee
Etcone40_corr[GeV] Etcone30_corr[GeV]
Etcone20_corr[GeV]
Summary
Working progress report . Plan for Final result and systematic:
In-time pileup uncertainty Out-of-time pileup uncertainty pT dependence Discrepancy between electron isolation shape and
photon isolation shape