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F R A U N H O F E R C E N T E R F O R S I L I C O N P H O T O V O LTA I C S C S P
2
PERC SOLAR CELLS: PROCESS AND FAILURE ANALYSIS
Passivated Emitter and
Rear Contact Solar Cells
� PERC solar cells entering mass
production
� Modified cell process: additional
rear side passivation and modified
contacting technology
� Advantages: reduced surface
recombination and improved optical
properties
� PERC PV-modules with increasing
market share
PERC-Specific Cell and Module
Diagnostics at Fraunhofer CSP
� Performance parameters: Electrical
and optical characterization of cells
and modules
� Rear-contact voids: identification,
quantification and characterization
� LID: Investigation of light induced
degradation (mono-Si, mc-Si)
� PID: Rapid potential induced degra-
dation testing of PERC cells and new
module materials
� Surfaces: Quantitative determination
of surface contaminations
1 LED solar simulator: illumination
with variable spectrum allowing
rapid EQE tests.
2 Microscopic analysis of solar cells
(µLBIC).
Fraunhofer Center for
Silicon Photovoltaics CSP
Otto-Eissfeldt-Str. 12
06120 Halle (Saale) | Germany
Contact
Dr. Marko Turek
Phone +49 345 5589-5121
www.csp.fraunhofer.de
1
Application 1: Cell Degradation
� Quantification of long-time cell stabi-
lity regarding light and temperature
induced degradation
� Physical and chemical root cause
analysis of degradation effects
� Investigation and quantification of
regeneration processes
� Localization of electrical losses,
e.g. surface vs bulk
� Quantification of yield losses during
module operation
1 2
Application 2: Rear Contacts and Voids
� Identification, classification and
quantification of voids
� Rear contact analysis: morphology,
composition and homogeneity
� Microstructure characterization of
voids, contact geometry, back surface
field
� Quantification of reduced rear side
passivation due to voids
Application 3: Mechanics
� Benchmarking of mechanical strength
including statistical analysis
� Prediction of breakage rates during all
processes
� Root cause analysis of cell breakage
(fractography, microstructural analysis)
� Electroluminescence strength mea-
surements of solar cells and modules
with bending setups
1 Spatially resolved
characterization of solar cell
before and after degradation.
2 Void and void free rear
contacts: collage of light
microscopy and scanning electron
microscopy.
3 LID test setup: LIDScope (left) and Light Soaker. 4 PID tester PIDcon.
initial
1 cm 200 μm
20 μm
degradation
(LID)