21
Parts Reliability and System Reliability Yuan Chen 1 , Amanda M. Gillespie 2 , Mark W. Monaghan 2 , Michael J. Sampson 3 , Robert F. Hodson 1 1 NASA Langley Research Center, 2 SAIC-LX-2, NASA Kennedy Space Center, 3 NASA Goddard Space Flight Center NEPP ETW 6-11-2012

Parts Reliability vs System Reliability - NASAParts Reliability and System Reliability Yuan Chen1, Amanda M. Gillespie 2, Mark W. Monaghan , Michael J. Sampson 3, Robert F. Hodson

  • Upload
    others

  • View
    9

  • Download
    1

Embed Size (px)

Citation preview

  • Parts Reliability and System Reliability

    Yuan Chen1, Amanda M. Gillespie2, Mark W. Monaghan2, Michael J. Sampson3, Robert F. Hodson1

    1NASA Langley Research Center, 2SAIC-LX-2, NASA Kennedy

    Space Center, 3NASA Goddard Space Flight Center

    NEPP ETW 6-11-2012

  • 2/21

    Purpose • Parts reliability and system reliability

    – Fundamental differences between basics – Relationship between parts reliability and system reliability – Impact of parts reliability on system reliability

    • Understanding the assumptions and limitations of each analysis – Questions:

    • Using system reliability to direct parts selection • Interpreting system reliability in absolute values

    – Example: flight computing architectures for common launch vehicles

    • Misconceptions on parts selection strategy

    Y. Chen // NEPP ETW 6-11-2012

  • 3/21

    Outline

    • Purpose • Flight computing architectures • System reliability analysis • Parts reliability impact on architecture

    reliability • Parts selection • Conclusion

    Y. Chen // NEPP ETW 6-11-2012

  • 4/21

    Flight Computing Architectures

    • Fully Cross-Strapped Switched Triplex Voter (FCSSTV) • Partially Cross-Strapped Switched Triplex Voter

    (PCSSTV) • Channelized Bussed Triplex Voter (CBTV) • Fully Cross-Strapped Switched Self-Checking (FCSSC) • Fully Cross-Strapped Bussed Self-Checking (FCSBSC) • Channelized Bussed Self-Checking (CBSC)

    3 Voter, 3 Self-Checking 3 Switched, 3 Bussed

    Highly Channelized, Partially & Fully Cross-Strapped Architectures

    Y. Chen // NEPP ETW 6-11-2012

  • 5/21

    Example of Architectures

    Instruments/Sensors Effectors/Actuators

    FC2FC1

    Switch1 Switch3

    INU1

    INU3

    INU2

    TVC1

    TVC3

    TVC2

    DAU1

    DAU2

    ECU1

    HCU1MPS1

    ECU2

    HCU2MPS2RGA1 RGA3RGA2

    Switch2

    PIC1RCS1 PIC2RCS2

    FC3

    Y. Chen // NEPP ETW 6-11-2012

  • 6/21

    Assumptions • Fault tolerance

    – One fault tolerance by design for all function element groups

    • Failure modes – Only hard or non-recoverable failures

    considered – No common failure mode included

    • Failure rate and failure criteria – Same for each type of sensors and effectors

    Y. Chen // NEPP ETW 6-11-2012

  • 7/21

    Architecture Reliability Plot

    0.35

    0.45

    0.55

    0.65

    0.75

    0.85

    0.95

    0 2000 4000 6000

    Relia

    bilit

    y

    Time (Hrs)FCSSTV PCSSTV CBTV FCSSC FCSBSC CBSC

    Y. Chen // NEPP ETW 6-11-2012

  • 8/21

    Architecture Reliability Table Architecture R (24 hrs) R (9 months)

    FCSSTV 0.999993 0.666999

    PCSSTV 0.999991 0.613596

    CBTV 0.999979 0.464581

    FCSSC 0.999992 0.648547

    FCSBSC 0.999992 0.646730

    CBSC 0.999960 0.357675

    Parts reliability does not matter for short missions??

    This is system reliability; it is system reliability which does not show much difference, NOT parts !!

    Y. Chen // NEPP ETW 6-11-2012

  • 9/21

    Exponential for System Reliability

    • Exponential

    λ/1lexponentia =MTTF

    Assumption: random defects; no infant mortality

    • Workmanship and proper build and assembly issues are not considered

    • Results misleading if one or some of the parts not properly screened or used under certain bias condition when different failure modes may occur

    Y. Chen // NEPP ETW 6-11-2012

  • 10/21

    Weibull for System Reliability

    • Weibull – Failure modes for β1

    • Weibull to replace Exponential in system reliability analysis and

    )11(*Weibull +Γ= βαMTTF

    Explore impact of parts operating in 3 regions by changing β

    Impact of β only: impact of parts reliability in terms of operating regimes, not lifetime, on system reliability

    lExponentiaMTTFMTTF =Weibull

    Assume the same parts lifetime

    Y. Chen // NEPP ETW 6-11-2012

  • 11/21

    System Un-reliability Distribution

    0%

    5%

    10%

    15%

    20%

    25%

    30%

    35%

    40%

    45%

    BUS

    CCDL

    DAU

    ECU FC

    HCU

    INU

    MPS PIC

    RCS

    RGA

    Switc

    h

    TVC

    C&C

    FCSSTV PCSSTV CBTV FCSSC FCSBSC CBSC

    Unre

    liabi

    lity C

    ontri

    butio

    n(%

    )

    Comoponents

    FC is the biggest contributor Assume different β while keeping the same MTTF

    Y. Chen // NEPP ETW 6-11-2012

  • 12/21

    Impact of β

    0.35

    0.45

    0.55

    0.65

    0.75

    0.85

    0.95

    0 2000 4000 6000

    Relia

    bilit

    y

    Time (Hrs)FCSSTV Beta 0.5 FCSSTV Beta 0.8 FCSSTV Beta 1.0FCSSTV Beta 2.0 CBSC Beta 0.5 CBSC Beta 0.8CBSC Beta 1.0 CBSC Beta 2.0

    Smaller β yields lower reliability, even with same MTTF

    The workmanship and effectiveness of screening have an impact on system reliability

    Y. Chen // NEPP ETW 6-11-2012

  • 13/21

    When Beta Changes

    35%

    45%

    55%

    65%

    75%

    85%

    95%

    0 1000 2000 3000 4000 5000 6000

    FCSSTVPCSSTVCBTVFCSSCFCSBSCCBSC

    Beta = 0.5Re

    liabi

    lity(

    %)

    Time (Hrs)

    Y. Chen // NEPP ETW 6-11-2012

  • 14/21

    When Beta Changes

    35%

    45%

    55%

    65%

    75%

    85%

    95%

    0 1000 2000 3000 4000 5000 6000

    FCSSTVPCSSTVCBTVFCSSCFCSBSCCBSC

    Beta = 0.8Re

    liabi

    lity(

    %)

    Time (Hrs)

    Y. Chen // NEPP ETW 6-11-2012

  • 15/21

    When Beta Changes

    35%

    45%

    55%

    65%

    75%

    85%

    95%

    0 1000 2000 3000 4000 5000 6000

    FCSSTVPCSSTVCBTVFCSSCFCSBSCCBSC

    Beta = 1.0Re

    liabi

    lity(

    %)

    Time (Hrs)

    Y. Chen // NEPP ETW 6-11-2012

  • 16/21

    When Beta Changes

    35%

    45%

    55%

    65%

    75%

    85%

    95%

    0 1000 2000 3000 4000 5000 6000

    FCSSTVPCSSTVCBTVFCSSCFCSBSCCBSC

    Beta = 2.0Re

    liabi

    lity

    (%)

    Time (Hrs)

    The workmanship and effectiveness of screening are the most influential differentiator for system

    reliability and architecture selection.

    Y. Chen // NEPP ETW 6-11-2012

  • 17/21

    System Un-reliability Distribution

    0%

    5%

    10%

    15%

    20%

    25%

    30%

    35%

    40%

    45%

    BUS

    CCDL

    DAU

    ECU FC

    HCU

    INU

    MPS PIC

    RCS

    RGA

    Switc

    h

    TVC

    C&C

    FCSSTV PCSSTV CBTV FCSSC FCSBSC CBSC

    Unre

    liabi

    lity C

    ontri

    butio

    n(%

    )

    Comoponents

    System reliability: should not focus on the absolute numbers, but on how to improve overall reliability

    System Improvement Paths

    Y. Chen // NEPP ETW 6-11-2012

  • 18/21

    When Beta Changes

    0%

    10%

    20%

    30%

    40%

    50%

    60%

    70%

    80%

    90%

    100%U

    nrel

    iabi

    lity

    Cont

    ribu

    tion

    (%)

    FCSSV Beta 0.5 FCSSTV Beta 0.8 FCSSTV Beta 1.0 FCSSTV Beta 2.0

    The change of one part’s operation regime may impact system reliability improvement paths

    Y. Chen // NEPP ETW 6-11-2012

  • 19/21

    Misconception I • Misconception: Less Stringent Component Selection Plan for

    Shorter Missions – Depends on the actual architecture – May yield a less stringent up-screening procedure – May suggest “lower grade parts” and “upgrading”

    • NASA NEPP cost model indicates more costly.

    Beta R (24 hrs)

    FCSSTV PCSSTV CBTV FCSSC FCSBSC CBSC

    0.5 0.995388 0.995412 0.994807 0.993915 0.993867 0.992985

    0.8 0.999935 0.999932 0.999878 0.999910 0.999923 0.999825

    1.0 0.999993 0.999991 0.999979 0.999992 0.999992 0.999960

    2.0 0.999986 0.999984 0.999985 0.999981 0.999994 0.999981

    Y. Chen // NEPP ETW 6-11-2012

  • 20/21

    Misconception II • System Reliability Analysis and System Level Testing are

    Sufficient for Component Selection and Component Level Testing

    – Roles and limitations of system reliability – early failures – Testing at system does not give full access to parts

    characteristics – translation – Impact of parts reliability on system reliability – depends

    Y. Chen // NEPP ETW 6-11-2012

  • 21/21

    Conclusions • Parts reliability, not only lifetime, but also the operation

    regimes, has direct impact on system reliability. – Workmanship and effectiveness of screening has greater

    impact on system reliability. • Critical for space missions to evaluate the risk, risk

    mitigations and impacts of the parts selection plan – Not technically justified:

    • a “less stringent” parts plan for shorter missions • an attempt to use system reliability analysis and testing

    for component selection or reliability – Both system reliability analysis and parts reliability

    analysis must be fully understood and fully implemented to ensure mission success. • Screening is the key!!

    Y. Chen // NEPP ETW 6-11-2012

    Parts Reliability and System Reliability PurposeOutlineFlight Computing ArchitecturesExample of ArchitecturesAssumptionsArchitecture Reliability PlotArchitecture Reliability Table Exponential for System ReliabilityWeibull for System ReliabilitySystem Un-reliability DistributionImpact of βWhen Beta ChangesWhen Beta ChangesWhen Beta ChangesWhen Beta ChangesSystem Un-reliability DistributionWhen Beta ChangesMisconception IMisconception IIConclusions