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P. Baron CEA IRFU/SEDI/LDEF ACTAR Meeting Santiago de Compostela March 11, 2008 1
A review of AFTER+ chipA review of AFTER+ chipIts expected requirementsIts expected requirements
At this time, AFTER+ must fit the specifications of:•ACTAR/GANIL•TPC/GLAD/R3B/FAIR•TPC&ACTIVE TARGET/MSU•TPC/CENBG
2ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+: AFTER+: ArchitectureArchitecture
Main features for AFTER+:Main features for AFTER+:
•72 Analog Channels; Slow Control & test.72 Analog Channels; Slow Control & test.
Main features for the channelMain features for the channel
•Input Current Polarity: positive Input Current Polarity: positive oror negative. negative.
•CSA + PZC + Filter (semi-Gaussian order 2). CSA + PZC + Filter (semi-Gaussian order 2).
[Possibility to bypass the CSA and to enter directly to the filter or SCA input].[Possibility to bypass the CSA and to enter directly to the filter or SCA input].
•511 analog memory cells. 511 analog memory cells.
•Auto Triggering: discriminator + threshold (DAC) + inhibition.Auto Triggering: discriminator + threshold (DAC) + inhibition.
Main features for the readoutMain features for the readout
•Analog OR of the 72 discriminator outputs [1 current output].Analog OR of the 72 discriminator outputs [1 current output].
•Address of the hit channel (through slow control link).Address of the hit channel (through slow control link).
•4 SCA readout modes.4 SCA readout modes.
Serial Interface Mode CKIn Test CSA;CR;SCAin (N°1)
Asic “Spy” Mode
Readout
Mode
AFTER+
511 cells
SCAFILTER
tpeak
CSA
1 channel
x72
in(7
6ou
t)
76 to 1
SCA MANAGERSLOW CONTROLW / R CK
ADC
TEST
Charge range
Power on
Reset
BUFFERΣ 72 discriminator outputs
ADC
DACDiscri
inhibit
external 12-bit ADC[AD9229]
BUFFER
3ACTAR Meeting Santiago de Compostela March 11, 2008
ADC
AFTER+
SCAFILTER
CSA
1 channel
x72
in(7
6ou
t)
76 to 1
SCA MANAGERSLOW CONTROL Write Read TEST
DAC Discriinhibit
BUFFER
AFTER+: AFTER+: Mode of operationMode of operation
Trigger_out
Discri_inDiscri_in
Discri_outDiscri_out
Hit_channelHit_channel
Trigger_outTrigger_out
Write_SCAWrite_SCARead_Address_hit channelRead_Address_hit channel
ResetReset
Read_SCARead_SCA
Data_SCA_outData_SCA_out
Asic management(local or global)
SCA read: READ & CKread
SCA write: Write & CKwrite
Slow control: Din, Dout, CK, CS
Test: DACDAC
ADC control
Trigger control: multiplicity & detection
Reset: hit_channel register Reset
SCA_inSCA_in
Channel iChannel i
Stop Sampling:Stop Sampling: on external or local Triggeron external or local Trigger
SCA writeSCA write address readaddress read SCA readSCA read SCA writeSCA write
4ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: Charge measurementCharge measurement
Charge Range
• 3 charge ranges 120fC [750keV], 1pC [6.25MeV] & 10pC [62.5MeV]
• Adjustable / channel
Charge Measurement
• Output dynamic range: 2V (differential); match the ADC specification [12-bit ADC AD9229]
• I.N.L: < 2%
Peaking Time
• 16 values: 50ns to 1µs• Adjustable / chip
Charge Resolution
• Configuration: Charge Range:120fC; Peaking Time: 200ns; Cin Asic < 30pFasked: < 600 e- rms; possibility: < 850 e- rms.
5ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: SCASCA
SCA memory cells
• 511
Sampling frequency
• 1 MHz to 100 MHz
Time Resolution
• Correlated to the sampling frequency• Jitter: < 2ns
Reading frequency
• 20 MHz to 25 MHz
6ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: triggertrigger
Discriminator solution
• L.E.D• Inhibition: / channel
Trigger output
• Current: Σ 72 discriminators
OR_hit channelOR_hit channel
Iin I=Iin
Hit channel 01
Iin I=Iin
Hit channel 02
Iin I=Iin
Hit channel i
Iin I=Iin
Hit channel 72
72 x72 x IIinin
Slow Control Register(2 bits)
Iin
Trigger time resolution
• The trigger time resolution will be dependent on the input charge, threshold & peaking time value => no spec.
7ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: triggertrigger
Input dynamic range
• 5% of asic input dynamic range• IN.L: < 5 %
Threshold value
• Common DAC: 3 bits + 1 bit of polarity
• Individual DAC: 4 bits
Comment: DACLSB = 0.04% of asic input dynamic range
Minimum threshold value
• Minimum value: ≥ noise
Comment: [Preliminary result] 120fC; 30pF; 200nsminimum # 3 keV ( 0.5fC; 0.4 % of asic input dynamic range)
8ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: ReadoutReadout
Readout frequency
• 20 MHz to 25 MHz
Readout mode: 1 channel means 511 SCA cells
• All channels [Treadout # 2ms]• Hit channels [Treadout # 26µs x nchannel]• Specific channels [Treadout # 26µs x nchannel]
internal Readout buffer
• 2 [controlled by slow control]Comment: for all the 4 readout modes ??
Readout mode: 1 channel means 511, 256 or 128 SCA cells
Comment: for all the 3 readout modes ??
9ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: TestTest
Calibration
• External capacitor; test on 1 channel / 72
“test”
• 3 internal capacitors (1 / charge range); test on 1 channel / 72
Functional
• 1 internal capacitor/channel; test on 1, few or all channels
10ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: Counting rate & PowerCounting rate & Power
Counting Rate
• 1 kHz max. [CENBG]
Power consumption
• < 10 mW / channel
11ACTAR Meeting Santiago de Compostela March 11, 2008
AFTER+ Requirements: AFTER+ Requirements: ConclusionConclusion
• The design of the chip could be started if all the requirements are defined, approved and fixed.
• Don’t forget that this chip is only one element of the global readout electronic.
• Generally, the specifications for the asic and the global electronic architecture are defined in the same time.