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Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

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Page 1: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

KEEE 4426 VLSI

WEEK 2

REVIEW

Page 2: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFET

Page 3: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

CMOS

Page 4: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

CMOS

Page 5: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Technology evolution

Page 6: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

ITRS(1)

Page 7: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

ITRS(2)

Page 8: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

ITRS(3)

Page 9: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

ITRS(4)

Page 10: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Feature size

Page 11: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Capacitance Modeling

Page 12: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Gradual Channel Approximation

Page 13: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Classification of deviceand circuit simulators

Page 14: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Design flow

Page 15: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Process and Device simulator(1)

Page 16: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Process and Device simulator(2)

Page 17: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Circuit simulators

Page 18: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFETS Mode of Operation(1)

Page 19: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFETS Mode of Operation(2)

Page 20: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFETS Mode of Operation(3)

Page 21: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFETS Mode of Operation(4)

Page 22: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

MOSFETS Mode of Operation(5)

Page 23: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Memory technology(1)

Page 24: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Memory technology(1)

Page 25: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

P-N Junction

Page 26: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Equilibrium(1)

•The -ve acceptor atoms in the P-type material repel the mobile electrons on the N-type side of the join (Junction). The +ve donors in the N-type material also repel the holes on the P-type side of the junction.

•The free electrons inside the N-type material need some extra energy to overcome the repulsion of the P-type's acceptor atoms. If they don't have enough energy, they can't cross the depletion zone & reach the P-type material. If they do manage to get past this energy barrier some of their kinetic energy will have been converted into potential energy

Page 27: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Equilibrium(2)

The free electrons inside the N-type material need some extra energy to overcome the repulsion of the P-type's acceptor atoms. If they don't have enough energy, they can't cross the depletion zone & reach the P-type material. If they do manage to get past this energy barrier some of their kinetic energy will have been converted into potential energy

This means the amount of energy converted from kinetic to potential form (or vice versa) when an electron crosses the depletion zone is where e is the charge on a single electron.

Page 28: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Depletion Zone

depletion zone •is free of charge carriers •the electrons/holes find it difficult to cross this zone. •very little current to flow when we connect an external voltage supply & apply a small potential difference between the two pieces of semiconducting material. (Here, ‘small’ mean small compared with    , which an electron requires to get over the potential barrier.)

Page 29: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Reversed Biased

•The effect of applying a bigger voltage depends upon which way around it's connected.

•When we make the N-type side more +ve (i.e. drag some of the free electrons out of it) & the P-type more -ve (drag holes out of it) will increase the difference in potential across the barrier.

•This makes it even harder for a stray electron or hole to cross the barrier.

Page 30: Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006 KEEE 4426 VLSI WEEK 2 REVIEW

Norhayati Soin 05 KEEE 4426 WEEK 2 06/01/2006

Forward biased

When we make to N-type side more -ve & the P-type side more +ve we force lots of extra electrons & holes into the two pieces of material. To understand the effect of this, let's concentrate on the electrons.

The electrons in the N-type region near the junction are repelled by the fixed acceptor atoms in the P-type. However, they're also repelled by the other electrons drifting around inside the N-type material.