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Non-interceptive profile measurements via light- emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques Cherry May Mateo- DITANET, CEA Saclay Co-authors: G. Adroit, R. Gobin, Y. Sauce, F. Senée, O. Tuske

Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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Page 1: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Non-interceptive profile measurements via light-emission based tomography technique

DITANET International Conference: Accelerator Diagnostic Techniques

Cherry May Mateo- DITANET, CEA Saclay

Co-authors: G. Adroit, R. Gobin, Y. Sauce, F. Senée, O. Tuske

Page 2: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

2

Motivation

Increased demand

It must not perturb the beam

It must not be destroyed by high current beam (kilowatt beam power)

Optical Profilers

Beam Induced Fluorescence (BIF) Monitor at GSI*

Beam Ionization Optical profile monitors

Non-destructive diagnostics

*F. Becker et al., Beam Induced Fluorescence Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams, Proceedings of DIPAC 2007, Venice, Italy

Schematic of BIF at GSI*

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 3: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Beam direction

rr

Optical beam profile

Page 4: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

4

Optical Profiler in IPN/CEA

*P. Ausset, et. al., Transverse Beam Profile Measurements for High Power Proton Beams, Proceedings of EPAC 2001, Paris, France

Beam profiles of proton beam

Profiles obtained with different gases but with constant gas pressure.

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

0 10 20 30 40 50 60 70

Intensité faisceau (mA)F

luo

resc

ence

(u.a

.)

656.2 nm

486.1 nm

434 nm

410.1 nm

Ha

Hb

Hg

Hd

0lum beamI I n

*Pottin, B, (2001) Etude d’un profileur optique de faisceaux intenses de protons par absorption laser, Doctor of Science thesis. Institut de Physique Nucléaire

Intensified CCD camera was used to capture beam image

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 5: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

5

TomographyTomography is the method used to reconstruct a 2D cross sectional image of an object given multiple flat scans taken from multiple angles around an object

Measurable

Solvable

 

 

x

y

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 6: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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How?Algebraic Reconstruction Technique for 2 Projections

f1 f2 f3

f4 f5 f6

f7 f8 f9

g1=

f1

+ f

4 +

f7

g2=

f2

+ f

5 +

f8

g3=

f3

+ f

6 +

f9

g4= f7 + f8 + f9

g5= f4 + f5 + f6

g6= f1 + f2 + f3

      

 

g A f

Projections Sparse Matrix Image

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 7: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

7

How?Interested in finding a vector solution f to the vector equation:

 

unknown slice vector

Sparse matrix or forward projection matrix

Projection data vector

Iterative Procedure

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 8: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

8

Initial Tests of the Algorithm

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 9: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

9

Initial Test

0˚ 30˚ 60˚

90˚ 120˚ 150˚

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Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

laserL1

L2

Rotatable mask

Gas- filled chamber

CCD camera

Reconstructed spatial distribution

G.E. Belyaev, I.V. Roudskoy, D. Gardes, P. Ausseth and A. Olivier, Nucl. Instr. and Meth. in Phys. Res. A 578, p. 47-54 (2007).

Page 10: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

10

Numerical Test

TEST IMAGE

0˚ 30˚ 60˚

90˚ 120˚ 150˚

I HAVE

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 11: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Dependence on number of Iterations

11

It .2 It.3 It.6 It.8

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It.15

Original Projections Reconstructed Projections

Projections measured at 90°

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 12: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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Numerical TestThe reconstructed image after 15 iterations

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y -profile x -profile0 50 100

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Reconstructed Measured

0° 90°

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 13: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

13

Original image

Comparison with the source image

20 40 60 80 100

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100

Reconstructed image

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 14: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

14

Experimental MeasurementsWith Ion Beams

?

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 15: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Vacuum Chamber specially designed for Measurements

15

Doppler shift effect spectroscopy

Spatial density reconstruction

90°

30°

Ion Beam

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 16: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Imaging and Detection

16

• Stingray F146B

• Fujinon HF25HA-1B objective

Labview

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 17: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements in BETSI test bench

17

Banc d’Etude et de Tests des Sources d’Ions

ECR sourceH2 dominated residual gasLow Intensity beams : 2mA H+ current at the beam stop

For valid

ation

ECR SOURCE Focusing solenoid

Analyzing Magnet

Tomographic chamber after the Magnet

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 18: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements in BETSI

18

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Measured

0˚ 30˚ 60˚

90˚ 120˚ 150˚

Bizarre ̎BANANA ̎ shape beam !NEED MORE VALIDATION

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 19: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements in SILHI

19

High Intensity Light Ion Source

ECRIS: 2.45 GHz - 875 Gauss. CW or pulsed mode. up to 130 mA at 95 kV kilowatt of beam power

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 20: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements in SILHI

20

Sole

noid

1

Sole

noid

2

Ste

ere

r 1

Ste

ere

r 2

Tomography chamber

Ion

Sou

rce

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 21: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements VS Sol 2 current

21

138A 142A 143A 147A 153A 159A

135 140 145 150 155 160 1650

20406080

100120140160180

0

5

10

15

20

25

projection intensity

Beam dump intensity

ISolenoid-2 (A)I b

eam

du

mp

(mA

)

I Reco

nst

ruct

ed

pro

ject

ion

Same Linear dependence

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 22: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Measurements VS Sol 2 current

22

138141143147153159

BUTBeam Shape Beam position have changed !

Non linearity of the solenoid for such beam size

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 23: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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Measurements VS Steerer current

Reconstructed image w ith correction

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Reconstructed image w ith correction

50 100 150 200 250 300 350 400 450 500

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Varying the steerer values

DH1 +0,2DV1 -0,7DH2 +0,5DV2 -0,5

DH1 0DV1 -0,2DH2 -0,9DV2 -0,3

Position has changed Intensity remains constant BUTBeam shape has changed !

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 24: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Copper « Profiler »

24

Water cooled copper block

Manual translator

Camera 1

Beam

Camera 1 for the copper « profiler » mounted on the 30° viewportBEAM SPOT

Camera 2 on the five 90°-viewport for tomographic reconstruction

Measurement region with camera 2

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 25: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Camera 1BEAM SPOT

Copper block inside

the chamber

BEAM

Camera 2TOMOGRAPH

Y on VP1 VP1VP2

VP3

VP4

VP5

Page 26: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Copper « Profiler »

26

100 200 300 400

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200

300

400

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60

Comparing the shape of the reconstructed image with 5 viewports with the copper ̎profiler ̎

Reconstructed

Measured

BEAM

Comparison between the beam spot and the reconstructed image shape is very much

comparable even with 5 projections

CAMERA1

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 27: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Summary• It was demonstrated that tomography technique

can reconstruct the spatial density of the beam both for low and high intensity beams.▫6 viewports seemed to be enough to

reconstruct smooth beams.• The algorithm written in MATLAB is very fast.

▫Future use of 6 simultaneous cameras is foreseen.

27Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 28: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Acknowledgements•This work is supported by the DITANET Marie

Curie European network. •CEA Saclay

▫ Romuald Duperrier▫ Wilfrid Farabolini▫ Guillaume Ferrand▫ Alain France ▫ Francis Harrault

28Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 29: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

29

Thank you for your attention

Page 30: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

30

Backup Slides

Page 31: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

31

Numerical Illustration

with MATLAB

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 32: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

32

Step 1 Image to Projections of the TEST IMAGE

0˚ 30˚ 60˚

90˚ 120˚ 150˚

TEST IMAGE

I HAVE

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 33: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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0 100 200 300 400 500 600 7000

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Step 2Construction of the Projection vector ̎ g  ̎

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Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 34: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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2000 4000 6000 8000 10000

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0.1

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1

Sparse matrix is constructedStep 3

6 projections101 x 101 image 606 x 10201 sparse matrix size

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 35: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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Step 4

0.5 1 1.5

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=

Must solve for f

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 36: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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2 4 6 8 10 12 14

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pix

el

valu

es

Step 5, iteration 2f is reshaped to 101× 101 image matrix

Reconstructed image

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Reconstructed Image

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 37: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

An Illustration

37

2 4 6 8 10 12 14

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10000

Number of iterations

pix

el

valu

es

f is solved iteratively

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 38: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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An IllustrationThe reconstructed image after 15 iterations

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Reconstructed Measured

0° 90°

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 39: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

An Illustration

39

It .2 It.3 It.6 It.8

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Reconstructed images with respect number of iterations

Original Projections Reconstructed Projections

Projections measured at 90°

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 40: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

40

Original image

An Illustration

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30

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Reconstructed image

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 41: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Cherry May Mateo/ High Intensity Beam Diagnostics Workshop/ 27.09.2011/Massy France

41

Algebraic Reconstruction Technique for more than 2 projectionsSparse matrix for more projection angles not equal to 0˚ and 90 ˚

How?

 

C4

C1

C2

C3 More angles more

complicated sparse matrix

Number of rows

 

Number of columns

 

Page 42: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Optical Profiler in IPN/CEA

42

*P. Ausset, et. al., Transverse Beam Profile Measurements for High Power Proton Beams, Proceedings of EPAC 2001, Paris, France

DlH3+

DlH2+

DlH+

Faisceau d'hydrogène

H+ H2+

H3+

Balmer H

656.2 nm

coscv

0

Doppler Shift Spectroscopy allows discrimination of different beam components

*Pottin, B, (2001) Etude d’un profileur optique de faisceaux intenses de protons par absorption laser, Doctor of Science thesis. Institut de Physique Nucléaire

H+

r

λ

H2+

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 43: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

Tomography

43

By Fourier Slice Theorem, EXACT value of f(x,y) can be calculated given an infinite number of projections

( ) ( ( , ), ( , ))

( cos sin , sin cos )

n n ng s f x s t y s t dt

f s t s t dt

g

2 2 ( cos sin )( , ) ( , )j t j x yg s e dt f x y e dxdy

g

Fourier Slice theorem:

θ

st

g(s,θ)

x

y

θ

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain

Page 44: Non-interceptive profile measurements via light-emission based tomography technique DITANET International Conference: Accelerator Diagnostic Techniques

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How?Iteration process

g Vector of projection dataf Vector of unknown slice dataA Matrix such that g = Afaij Value of element located at the ith

and jth column of matrix A

i Projection subscriptj Pixel subscriptgi Number of counts in the ith bin of the

projection datasetm Number of pixelsn Number of bins

1( ) ( )( )

k kk

Measured projectionsImage Image Normalized Backprojections of

Projections of image

1

1

1 1

( )( )

( )' '

'

knk j i

ijj n m kiij ij j

i j

ff a

a a f

g

Cherry May Mateo/ DITANET International Conference/ 11.11.2011/Seville, Spain