NIWeek 2 0 0 5 - National InstrumentsNIWeek Session Guide Must-See Sessions Do not miss the most popular NIWeek 2005 presentations. Partners in Design Session Learn about improving

PRELIMINARY CONFERENCE PROGRAMAugust 16-18 • Austin Convention Center • Austin, TX USA • ni.com/events/niweek

NIWeek 22000055

August 16-18 , 2005 • Alliance Day, August 15, 2005

ni.com/events/niweek

NIWeek 2005 • August 16-18 • Austin Convention Center • Austin, TX USA • ni.com/events/niweek2

Celebrate a Decadeof Virtual Instrumentation at NIWeek 2005

Join National Instruments for NIWeek 2005, the world’s leading virtual instrumentation conference andexhibition, which opens August 16 at the Austin Convention Center in Austin, Texas. The conference featuresthree full days of interactive technical sessions, exhibitions, and workshops on the latest technologies for controldesign, measurement, automation, manufacturing, and test.

Unlike other conferences, this annual event creates an atmosphere that is positively buzzing with energy fromkey decision makers and developers on trends and advancements in the measurement and automation world.

NIWeek is the ultimate learning environment for both novice and expert engineers. See how NI is revolutionizingthe way scientists and engineers work by providing the strongest, broadest portfolio of measurement andautomation products to help them work smarter, faster, and under budget.

At NIWeek 2005 you can:

• Network with more than 2,500 engineers, educators, scientists, and NI developers

• Learn up-to-the-minute developments in NI virtual instrumentation products

• Choose from more than 200 new, innovative technical training sessions, hands-on workshops, casestudies, user applications, and panel discussions

• Attend daily keynotes featuring leading-edge product demonstrations

• Improve your National Instruments LabVIEW knowledge, acquire training, and attend annual user group meetings

Registration Discounts:

• Volume Discount – Register three full-conference attendees and receive a fourth full-conferenceregistration for FREE!

• Educator Discount – Full-time faculty and graduate students at accredited colleges or universities areeligible for half off any registration fees.

Visit ni.com/niweek to view booth space, conference, and summitregistration fees.

© 2005 National Instruments Corporation. All rights reserved. CompactRIO, CVI,DIAdem, FieldPoint, LabVIEW, MATRIXx, Measurement Studio, National InstrumentsAlliance Partner, NI, NI-488.2, NI-CAN, NI-DAQ, NI-IMAQ, NI SoftMotion, NITestStand, NI-VISA, NIWeek, SignalExpress, and SystemBuild are trademarks ofNational Instruments. Other product and company names listed are trademarks ortrade names of their respective companies.

Simulink® is a registered trademark of The MathWorks, Inc.

A National Instruments Alliance Partner is a business entity independent from NI andhas no agency, partnership, or joint-venture relationship with NI.

Program ContentsKeynote Presentations . . . . . . . . . . . . . . . . . . . . . . . . . .3Registration Discounts . . . . . . . . . . . . . . . . . . . . . . . . . .2Evening Activities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3Paper Contest . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5

Session GuideEmbedded Control Engineering Summit . . . . . . . . . . .4RF and Wireless Communications Summit . . . . . . . . .4Sound and Vibration Summit . . . . . . . . . . . . . . . . . . . . .5Must-See Sessions . . . . . . . . . . . . . . . . . . . . . . . . . . .6-7DAQ, Instrumentation, and Analysis Track . . . . . .8-11Hot Technologies Track . . . . . . . . . . . . . . . . . . . . .12-13Real-Time Control and Embedded Track . . . . . . .14-15Software Development Techniques Track . . . . .16-19

Exhibition and InformationExhibition and Floor Plan . . . . . . . . . . . . . . . . . . . .20-21Alliance Day . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22Sponsors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23

Celebrate a Decade of Virtual Instrum

entation at NIW

eek 2005“Attending NIWeek is simply the fastest and most efficient way for me to keep

up-to-date on the latest products and ideas in the world of test and measurement.”

Robert CornwellSenior Program Manager

G Systems

Evening ActivitiesDiscover Austin – Live Music and Much MoreDiscover Austin, the beautiful capital of Texas. Surrounded by the rolling hill country of Central Texas,Austin’s distinct landscape and setting offer green trees, majestic cliffs, and two of the clearest lakes inTexas. Along with its world-renowned live music scene, full of legends and local heroes, Austin offersplenty to do and see. For information on live music venues and events in the Austin area, log on toaustinchronicle.com and austin.citysearch.com.

Alliance Appreciation Party1

NI is pleased to host the NIWeek National Instruments Alliance Partner Appreciation Party indowntown Austin. Join us for drinks, live music, and much more.Monday, August 15 7:00-10:30 p.m. Location TBD

Second Annual Exhibition ReceptionEveryone is invited to this event, which officially opens NIWeek 2005. Enjoy drinks, music, food, and more.Tuesday, August 16 4:30-6:00 p.m. Austin Convention Center, Exhibit Hall

Annual Conference Party1

Attend this Austin-style celebration where you can network, listen to live music, dance, and enjoygreat food and beverages. Party plans are in the works – check ni.com/niweek for updates. Sponsored byReed Business Group.Wednesday, August 17 7:00-10:30 p.m. Location TBD

1Special reminder: All drinks and food are on us, but be sure to bring your event ticket to get in the door. All full-conference passesinclude event tickets. Entertainment passes also are available for purchase. Shuttles run continually from the Austin ConventionCenter to the event locations.

MealsDaily Continental Breakfast8:00-10:00 a.m. – Ballroom Foyer

Daily Lunch11:15 a.m.-2:00 p.m. – Exhibit Hall

Afternoon BreaksEnjoy refreshments between sessionson the third floor outside Room 18.

Tuesday Breakfast is sponsored byNASA Tech Briefs.Wednesday Break is sponsored byControl Design.

Keynote PresentationsAhead of the Curve – Sneak Preview into Tomorrow’s TechnologiesTim Dehne Senior Vice President of R&D, National InstrumentsAt NIWeek 2005, see the newest generation ofmeasurement and control products coming out of theNational Instruments R&D labs and into your toolbox. NIproduct teams lead demonstrations spanning the latest inautomated testing approaches, new bus technologies,distributed and real-time control, and measurementtechnologies for greater performance and productivity.

Tuesday, August 16 8:30-10:00 a.m. Ballroom D

Beyond the PC – The Future of Virtual InstrumentationDr. James Truchard President, CEO, and Cofounder, National InstrumentsAs chief NI product strategist and technical visionary, Dr. Truchard traces the future evolution of virtualinstrumentation beyond the PC. This glimpse into tomorrowextends the user-defined virtual instrumentation approachwith an innovative graphical system design methodologythat opens new possibilities in test, control, and embeddeddesign projects.

Wednesday, August 17 8:30-10:00 a.m. Ballroom D

Guest Speaker A renowned guest speaker entertains and informs. Lookfor more details coming soon at ni.com/niweek.

Thursday, August 18 8:30-10:00 a.m. Ballroom D

3NIWeek 2005 • August 16-18 • Austin Convention Center • Austin, TX USA • ni.com/events/niweek


Embedded Control Engineering Summit

Tuesday, August 16-Wednesday, August 17Discuss the ways engineers are using leading-edge control design tools, techniques,and theory to achieve better efficiency and concurrency in the design of in-vehicle andaerospace embedded control and machine control systems. Also explore techniques forreal-time control system implementation, including rapid control prototyping and hardware-in-the-loop test. The summit sessions, which feature leading research professorsand industry speakers, also include hands-on training and cover FPGA programming,deterministic operation, targeting with National Instruments LabVIEW, dynamic systemmodeling methods, and control design techniques. Sessions include leading researchprofessors such as Dr. Karl Åström, professor of Automatic Control at the Lund Institute of Technology, and industry speakers such as ExpertControl and Cyth Systems.

Who Should AttendAerospace engineers, automotive engineers, machine builders, medical machine designers,researchers, professors, and graduate students interested in modeling dynamic systems andsynthesizing and implementing controllers.

Session Topics Include:• Dynamic System Modeling and Control System Design Using Maple and LabVIEW

• How a Suite of NI Tools Helped Develop a Next-Generation Hybrid Electric Vehicle

• Robust Control Design Using NI MATRIXx

• Prototyping and HIL Using NI LabVIEW, The MathWorks, Inc. Simulink®, and NI MATRIXx

• Test Automation of Embedded Control Systems

• Using LabVIEW for System Identification, Control Design, and Real-Time Implementation

RF and Wireless Communications Summit

Wednesday, August 17Learn from industry and research experts in the field about the latest RF and wirelesscommunications advances and how they are facilitating the design, development, and test ofthese types of products in a rapidly changing market. Explore topics such as RFID, wirelesssensors, software-defined radio, satellite radio, and multiple input, multiple output-orthogonalfrequency division multiplexing (MIMO-OFDM). This one-day summit features industryspeakers from companies such as Texas Instruments and leading universities such asthe University of Texas at Austin and the University of California, Berkeley.

Who Should AttendRF engineers, communication systems engineers, wireless systems engineers, researchers,and professors.

Session Topics Include:• Digital Signal Processing

• Low-Power Design Strategy in Wireless Communications

• MIMO

• The Outlook for Wireless in Measurement and Control

• RFID Basics

Learn about new trends and techniques by attending the new andreturning NIWeek 2005 summits. These one- and two-day eventsfeature targeted keynotes, product training, and demonstrations byNational Instruments developers and industry-leading researchers inembedded control, wireless communications, and sound and vibration.

NIWeek 2005 Expands Technical Offerings to Include Three New SummitsExplore New Technologies at Embedded Control Engineering, RF and Wireless Communications, and Sound and Vibration Summits


Second Annual Sound and Vibration Summit

Tuesday, August 16-Wednesday, August 17Sound and vibration professionals from around the world are invited to participate in sessionsfocusing on industrial vibration diagnostics, automotive noise and vibration design, and audioand electroacoustics test. Presentations include hands-on exercises showcasing the latestsound and vibration analysis technology and tips and techniques from the developers.Summit sessions feature expert speakers from companies such as MTS, Listen, Inc., DELTA,and Nexjen Systems.

Who Should AttendAnyone interested in noise, acoustics, audio, or vibration test and design, including audioDAC designers, consumer audio manufacturers, audio test engineers, maintenanceengineers, process engineers, plant engineers, automotive engineers, and mechanicalsystem designers.

Session Topics Include:• Acoustic Investigations

• Audio and Electroacoustics Testing

• Automotive Noise and Vibration Solutions

• Case Studies – Pushing the Sound and Vibration Envelope

• Gabor Order Extraction Techniques for Gear Mesh Quality Evaluation

• Industrial Vibration Applications

• Jump-Start Your Sound and Vibration Application Development

• Practical Issues in Portable Acoustic Noise Measurements

• Real-World Noise and Vibration Case Studies with MTS

• Sound and Vibration Measurement Challenges and Validation

• Vibration Monitoring of Nanoscale Facilities

Paper ContestPaper Contest Awards and Poster SessionJoin us as we announce the winners of the 2005 Virtual InstrumentationApplications Paper Contest, an annual NIWeek event during which customers share their most innovative and creative applications using NI products. Winning applicants present the most technicallychallenging, innovative, and cost-effective solutions based on NItechnologies throughout the conference.

All semifinalist and finalist papers are on display throughout NIWeek outside Ballroom G.

For more information visit ni.com/niweek.

to Include Three New Summits

Embedded Control Engineering, Sound and Vibration, and RF and W

ireless Comm

unications Summ

its

Communications, and Sound and Vibration Summits

NIWeek Session GuideMust-See Sessions

Do not miss the most popular NIWeek 2005 presentations.

Partners in Design SessionLearn about improving the integration among today’s design, prototyping, and testplatforms from technical experts at leading electronic design, mechanical design,embedded silicon, and mathematics software vendors such as Analog Devices,Electronics Workbench, SolidWorks, and others copresenting with National Instruments.

Session Topics Include:• Closing the Loop on Board-Level Design and Test

• Express Workbench Extends LabVIEW and Express Technology withSignalExpress and Control Design Assistants

• Mixed-Signal Converter Measurement Techniques with SignalExpress, LabVIEW, and PXI

Visit ni.com/niweek for the latest information on these sessions.

Machine Vision and Image Processing SessionsExplore ways to use vision tools to improve quality on a production line or analyzecells under a microscope with vision experts such as DVC Company and Innoventor.Also, visit the Vision Neighborhood in the Exhibit Hall to see leading companies incameras, lighting, optics, motion control, and automation systems.

• Camera Technologies for Life Sciences and Microscopy, DVC Company, page 16

• Developing Effective High-Speed Vision Applications, National Instruments, page 12

• From Camera to Computer – Architecture of an Image Acquisition System, National Instruments, page 9

• Machine Vision in the Frequency Domain, Innoventor, page 13

• Using LabVIEW to Add Your Own Functionality to Vision Builder for Automated Inspection, National Instruments, page 19

• Using NI-IMAQ for IEEE 1394 Cameras to Unlock the Full Potential of FireWire Cameras, National Instruments, page 19

Machine Builder SessionsGet the tools you need and participate in hands-on exercises to help decrease yourdevelopment time and increase your next machine’s performance and reliability. Explorethe latest control design technologies with leading industrial automation companyrepresentatives, who show you how to integrate advance control algorithms, analysis,I/O, vision, motion, industrial displays, and communications with National Instrumentsprogrammable automation controllers (PACs). Expert presenters include Drivven,CyboSoft, and VI Engineering.

• Advanced LabVIEW FPGA Programming Techniques, National Instruments, page 12

• Developing LabVIEW FPGA/Real-Time Applications for Optimal Code Reuse and Easier Debugging, National Instruments, page 16

• Dynamic System Modeling and Control Design System Using Maple and LabVIEW, National Instruments, page 12

• Introduction to LabVIEW FPGA and Reconfigurable I/O Hardware, National Instruments, page 15

• Performing Integer Math and Digital Signal Processing with LabVIEW FPGA, National Instruments, page 18

• Using LabVIEW for System Identification, Control Design, and Real-TimeImplementation, National Instruments, page 19


Emerging Technology SessionsLearn about next-generation technologies and applications through sessionsshowcasing wireless sensor networks, next-generation computing, embeddedsystems, graphical user interface advances, and other technologies that impactvirtual instrumentation. These sessions do not promote products – instead, theydiscuss technology trends, applications, and the current status of an emergingtechnology. Observe prototype demonstrations that illustrate research trends andhelp promote discussion.

• LabVIEW for Embedded Design, National Instruments, page 17

• Technologies for Graphical Configuration Timing and Triggering in LabVIEW, National Instruments, page 18

• USB-Based Controllers for Academic Teaching Applications, National Instruments, page 19

• Wireless Sensor Network Technologies, National Instruments, page 19

Hands-On Sessions• Hands-On – Data Mining Techniques for LabVIEW Users,

National Instruments, page 9

• Hands-On – Introduction to CompactRIO and LabVIEW FPGA, National Instruments, page 14

• Hands-On – Intermediate CompactRIO and LabVIEW FPGA, National Instruments, page 14

• Hands-On – LabVIEW 101, National Instruments, page 9

• Hands-On – LabVIEW PDA Module and CompactFlash DAQ, National Instruments, page 13

• Hands-On – LabVIEW Real-Time, National Instruments, page 14

• Hands-On – NI-DAQmx Crash Course, National Instruments, page 9

Functional Test SessionsOptimize your functional test systems and improve test ROI using the key test strategies andtechniques featured at these popular sessions. As electronic devices increase in complexitywith shorter development time, traditional test strategies are buckling under the stress.Functional test is forced to make a shift from reactive functional test focused on quality andthroughput to proactive functional test that emphasizes planning for greater product mix,system longevity, increased volume, shorter test development, and reduced maintenancecost. Learn new concepts and tools defined by a flexible, modular test architecture andexplore topics ranging from developing large test applications and driving down measurementtime to interfacing test components with XML and implementing hybrid test systems. Thesesessions include application successes from leading electronics manufacturers, such asTexas Instruments and VI Technology, and a hands-on workshop on building completeautomated test systems from scratch.

• Case Study – Automated Calibration Framework Architecture Design Steps,National Instruments, page 16

• Designing a Test System to Address Top Automated Test Challenges – Flexibility, Reusability, and Maintainability, National Instruments, page 16

• Driving Down Measurement Times – Optimizing GPIB, Ethernet, and USB in Windows, National Instruments, page 9

• Increasing Throughput and Lowering Test Costs – Architecting Test Systems to HandleConcurrent Testing of Multiple UUTs, VI Technology, page 17

• Maximizing System Longevity and Flexibility through Hybrid ATE Systems, National Instruments, page 10

• Test Express – Leveraging Express VI Technology for Measurement Applications at Texas Instruments, Texas Instruments, page 18


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NIWeek Session GuideData Acquisition, Instrumentation, and Analysis Track

20 LabVIEW Development Tricks Revealed by the ExpertsIn this session, LabVIEW developers reveal 20 little known but powerfulLabVIEW features that make development easier. Learn their secretsand improve the quality and efficiency of your LabVIEW code.Presented by National Instruments

Advanced DAQ System Development Using NI-DAQmxBecome familiar with new NI-DAQmx measurement servicessoftware features for professional developers such as simulateddevices, data compaction for high-speed streaming to disk,programmatic task creation, channels, and scales. Learn to makethe most of the timing and synchronization engine, internal devicesignal routing, and other data acquisition software features foradvanced developers.Presented by National Instruments

Advanced NI-DAQmx, Part 1 – Seven Habits of HighlyEffective NI-DAQmx ProgrammersExplore advanced programming techniques – including statecaching, data acquisition events, and data compression – to makedata acquisition programming easier and more efficient. This is thefirst part of a two-part series. Attend the second part of this series –the hands-on portion – to put this knowledge to use.Presented by National Instruments

Build PC-Based Nondestructive Test Systems Using NI ToolsLearn how to build a PC-based nondestructive test system using NI tools. Review basic test types, including ultrasonic and eddycurrent, and see how LabVIEW analysis and presentation featuresare useful for these tests. Also explore NI system components tolearn about the components’ motion, switches, multifunction I/O,and digitizer technology features. Learn which third-party productsand technologies are necessary to complete the entire test system. Presented by National Instruments

Calibrating Your DAQ SystemModel-Free Adaptive (MFA) control is the most promising technologyto end the PID-dominated era. MFA control works with complexsystems and requires no process models and no manual tuning. It is easy to configure, launch, and maintain. Learn how MFA controlcustomers are achieving great economic benefits from this technology.Presented by National Instruments

Choosing the Right Synchronization SchemeAt this technical session, learn about the different synchronizationtechniques you can implement with National Instruments dataacquisition and modular instrumentation hardware, includingphase-locked looping (PLL), TClk (Trigger Clock), and multichassissynchronization. Analyze the advantages and disadvantages of each

method, discuss the benefits of synchronization, and observe LabVIEWFPGA Module use with targets such as R Series reconfigurable I/O andthe NI PXI-665x timing and synchronization modules to implementcustom triggering. Presented by National Instruments

Create Your Own Express VIsExpress VIs can drastically reduce the complexity of your LabVIEWdevelopment tasks and, in turn, reduce your company’s overalldevelopment time. In this session, discuss the basic Express VIcomponents and learn tips and techniques to help developers atyour company create their own.Presented by National Instruments

Detecting Defects in Complex ImagesMany critical production machine vision inspection tasks require defectdetection in the presence of widely variant background intensities.There are a number of useful techniques for normalizing backgrounds tomaximize defects. At this presentation, observe PVI Systems demonstratetechniques for adaptive image preprocessing to enhance defectdetection. In addition, see image acquisition function demonstrations to learn how to enhance defects in situations where backgroundnormalization is not possible or desirable. Presented by PVI Systems

“I have been attending NIWeek as long as the event hasoccurred, and I can honestly say the longer one goes toNIWeek, the more one gets out of NIWeek. There is actually way too much to take in for just one person. We have been sending at least five people per year for the last five years, and the results are outstanding.“

Dean Streck, Chief Operating OfficerVI Engineering

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Driving Down Measurement Times – Optimizing GPIB,Ethernet, and USB in WindowsShorter test times can greatly impact your productivity. Mostautomated test systems use a combination of GPIB, Ethernet, andUSB instrument control buses with Virtual Instrument SoftwareArchitecture, Plug and Play, and other LabVIEW drivers on Windows.By understanding each component’s impact on test times, you canoptimize your systems. Explore advanced LabVIEW instrumentcontrol techniques for instruments that can communicate with USBand Ethernet in addition to GPIB. Using high-resolution counters, youcan measure the performance improvements. The demonstratedlessons and techniques can help you reduce your test times.Presented by National Instruments

From Camera to Computer – Architecture of an Image Acquisition SystemLearn everything you need to acquire image data from a camera andtransfer it into PC memory for processing at this session, a must forevery developer of PC-based machine vision applications. Discussthe advantages and disadvantages of camera buses includinganalog, Camera Link, IEEE 1394 (FireWire), and Gigabit Ethernet aswell as computer buses like PCI, PXI, and PCI Express. Review visionsystem requirements such as image reconstruction, triggering, andmemory handling. Lastly, explore the role of the driver and the layersrequired to provide a simple, powerful API.Presented by National Instruments

Going Deep into DAQ Technologies to Develop Control ApplicationsTake multifunction I/O data acquisition past test and measurementand into control applications. Because of recent data acquisitiondesign enhancements, you can use multifunction I/O data acquisitionin advanced control applications featuring PID, fuzzy logic control,and more. Through technical discussions and control demonstrations,experience how multifunction data acquisition improves the controlapplication space.Presented by National Instruments

Hands-On – Data Mining Techniques for LabVIEW UsersDo you collect a large amount of test data and struggle to find old tests,only to find that the data you were looking for is not as descriptive asyou had hoped? At this hands-on session, learn how to effectivelyharness new LabVIEW data storage technologies to meet thesechallenges. Step through several real-world examples that illustrate bestpractices for saving data using LabVIEW. Also get an introduction to newNI software technologies for mining measurement data. This is a must-see session if you are involved in the collection process and are sharingtons of test data as part of your daily work.Presented by National Instruments

Hands-On – LabVIEW 101New to LabVIEW? Learn the basics of this graphical developmentenvironment for creating flexible and scalable test, measurement,and control applications rapidly and at minimal cost. Hands-onexercises include navigating the LabVIEW environment, designing a user interface, communicating with instruments, acquiring data,analyzing it, and saving it to file.Presented by National Instruments

Hands-On – NI-DAQmx Crash CourseAre you ready to make the switch to NI-DAQmx? Attend this sessionto learn data acquisition programming fundamentals with the world’sbest data acquisition driver software, NI-DAQmx. Explore the API,code generation, and additional driver resources.Presented by National Instruments

High-Speed Data Streaming with NI InstrumentsExplore the PC architectures that shuffle data from the dataacquisition device to permanent memory and discuss recent NI driver technologies that increase streaming-to-disk speed. Learnabout potential bottlenecks – bus, hard drive, RAM, and processorspeed – and ways to choose the right combination of technologies for your application. Observe several streaming-to-disk systemdemonstrations, one of which features the Conduant StreamStorreal-time recorder.Presented by National Instruments

Hot Technologies for Sound and Vibration ApplicationsExplore some of the key disruptive technologies you can use todevelop sound and vibration applications for in-vehicle, portable, and high-channel-count data acquisition. Learn how LabVIEW field-programmable gate array (FPGA) technology applies to machinecondition monitoring and remote data acquisition. Also see how USBhigh-speed technology delivers ease of use and helps you maintainhigh performance for portable applications. Lastly, obtain anoverview of techniques for using the newest National InstrumentsPXI controllers to create distributed, high-channel-count noise andvibration systems that maximize performance.Presented by National Instruments

Jump-Start Your Sound and Vibration Application DevelopmentIn this one-hour session, learn how to acquire data from DSAhardware and make measurements using National InstrumentsLabVIEW and the LabVIEW Sound and Vibration Toolkit. Specifically,learn more about how to make practical measurements in machinecondition monitoring and noise, vibration, and harshness applications.Through hands-on exercises, cover topics including FFTs, distortion,THD, frequency response, swept-sine analysis, order tracking,visualization techniques such as waterfall plots, sound-levelmeasurements, and octave analysis. Presented by National Instruments

LabVIEW for Instrument ControlAre you ready to move beyond simple Virtual Instrument SoftwareArchitecture reads and writes for your LabVIEW instrumentcommunication? Learn advanced LabVIEW instrument controltechniques; when and how to use service requests to build moreefficient applications; the differences among NI-488.1, NI-488.2, andNI-VISA; and how to design for instruments that can communicatewith USB and Ethernet in addition to GPIB.Presented by National Instruments

NIWeek 2005 • August 16-18 • Austin Convention Center • Austin, TX USA • ni.com/events/niweek

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NIWeek Session GuideData Acquisition, Instrumentation, and Analysis Track (Continued)

Linux? Yes!In addition to LabVIEW, National Instruments now supports morethan 70 data acquisition devices on Linux. Attend this session toobserve LabVIEW and Linux in places you may have never seenbefore including PXI, PC104, and a PDA.Presented by National Instruments

Maximizing System Longevity andFlexibility through Hybrid ATE SystemsLearn how hybrid ATE systems provide automated test systemdevelopers with an effective solution for maintaining theirinvestments in current software and hardware while still takingadvantage of newer and lower-cost technologies available on themarket. By implementing a five-layer system architecture designed to integrate multiple test industry platforms, you can achieve easierexpansion of existing systems, maximum reusability of existingassets, clear connectivity and extensibility to newer technologies,and streamlined maintenance and upgrades. This test-system designapproach helps you benefit from a modular test system where the hardware is clearly separated from the software and makesreplacing software and hardware components easier, increasescomponent reuse, and extends system functionality and longevity.Developing and sustaining a modular, hybrid ATE system is easierand simpler with this long-term, layered approach.Presented by National Instruments

Mechanical Structure Analysis and Testing with LabVIEWSee how you can use cepstrum, bispectrum, parametric modeling,principal component analysis (PCA), independent component analysis(ICA), and other LabVIEW analysis functions for mechanical structureanalysis and testing. Although the focus of the demonstration anddiscussions is limited to sound and vibration, the principles introducedapply to more general mechanical structure analysis problems.Presented by National Instruments

New Tools for Developing Certified LabVIEW InstrumentDrivers and Effective Testing TechniquesObserve how to use new LabVIEW instrument driver developmenttools to create certified LabVIEW instrument drivers. Also discusstesting areas integral to developing high-quality instrument drivers aswell as tools such as instrument driver templates, control templates,guidelines, the icon art glossary, and the Instrument Driver VIAnalyzer Toolkit plug-in. For testing, explore functional testing, testcoverage, VI Analyzer testing, and testing approaches. In addition,review ways to debug and troubleshoot existing instrument drivers.Presented by National Instruments

PCI Express Applications and Industry RoadmapObtain a PCI Express technology overview and review the PCI Expressroadmap for the PC and test and measurement industries. Learn aboutnew data acquisition, machine vision, and instrumentation applications,as well as how PCI Express signaling will be incorporated into PXI.Presented by National Instruments

The Power of PXI for Test, Measurement,and Control ApplicationsLearn about PXI architecture and the latest PXI market developments.Explore PXI interoperability and the power of PXI triggering technology,as well as address the impact of the evolution of the PCI bus to PCIExpress on PXI.Presented by National Instruments

Sound Answers – NVH Application Stories and Case StudiesGet a head start on solving sound and vibration design challengeswith this session on best practices. MTS sound and vibrationconsultants demonstrate how the source-path-receiver modelprovides a practical and proven approach to sound and vibrationproblem solving. See how this process works through real challengesin several actual cases. Obtain technical and process details on toolsand practices and observe short product demonstrations includinglive measurement and analysis examples.Presented by National Instruments

Transient Signal Analysis TechniquesLearn how to effectively analyze transient signals with NI analysistools and review technologies such as wavelets, super-resolutionspectral analysis, and a variety of transforms. See demonstrations of live transient signals and the methodologies to break down thesesignals and extract meaningful results.Presented by National Instruments

Understanding Digital Technologies – LVDS, JTAG, and OthersRecently, new digital technologies, such as LVDS, FPGAs, and JTAG,have emerged, making it difficult for the system developer to keeppace. Review these trends and learn how you can use high-speeddigital devices to take advantage of new cutting-edge technologies.Presented by National Instruments

Using LabVIEW and SignalExpress to Minimize CommonExternal Error Sources and Ensure Measurement ReliabilityAttend this technical session to see how you can use NationalInstruments SignalExpress interactive measurement software and NI 200 MS/s modular instruments to characterize the world’s mostaccurate measurement device – the new NI PXI-5922 flexible-resolution digitizer.Presented by National Instruments

What’s the IQ of Your Sensors? TEDS and Smart Sensor TechnologiesSmart sensors are making it easier to manage measurement systemsthrough autodetection and autoconfiguration capabilities. Find outhow you can store sensor information, including detailed calibrationdata, directly on the sensor to achieve multipoint signal scalinginstead of single-point sensitivity for much greater measurementaccuracy. Learn about the new IEEE 1451.4 standard that defines thisTransducer Electronic Data Sheet (TEDS) technology. See the first NITEDS-enabled PXI module, the NI PXI-4462 for sound and vibrationapplication data acquisition, and get a sneak peek of future TEDS-enabled measurement devices.Presented by National Instruments


Why You Should Care about XML versus Binary versus ASCII for Storing LabVIEW DataIt sounds simple, but if you are collecting tons of test data, saving it forreuse, and sharing it with others, you know the challenges involved.Take a comprehensive look at several different LabVIEW data storagetechnologies to see how they apply to a variety of LabVIEWapplications. Furthermore, learn effective tips for documenting dataand the hidden features available for mining your test data. This is amust-see session if you are involved in the collection process andsharing a large amount of test data as part of your daily work.Presented by National Instruments

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Do Not Miss Out – Be Part of the FIRST LEGO League Challenge at NIWeek 2005Put your robotics skills to the test. Gather a team and compete against fellow NIWeekattendees, Austin-area FIRST LEGO League (FLL) student teams, and teachers to becomeNIWeek 2005 FLL champions. Teams have a total of three hours to build and program a robotusing LEGO Mindstorms and ROBOLAB software based on NI LabVIEW to compete in this year’sFIRST LEGO League NO LIMITS challenge.

Challenge winners receive a LEGO Mindstorms Team Challenge Kit and ROBOLAB software, plus NI awards an Austin-area classroom with hardware and software in honor of each winner.

Do not miss out – make this part of your NIWeek 2005 experience.

Build and Program: Gearing Up For the Challenge – Tuesday, August 165:30-8:30 p.m., Exhibit Hall

Challenge Night – Wednesday, August 175:30-7:00 p.m., Exhibit Hall

User Group Lounge in the Exhibit Hall Stop by the LabVIEW User Group Lounge in the Exhibit Hall to meet other user groupmembers, discuss user group meetings, learn about community activities inyour area, and share LabVIEW programming tips. This is the perfect opportunityto get more involved in a LabVIEW community group.


NIWeek Session GuideHot Technologies Track

10 Things I Hate about LabVIEW – A Love Letter to NIDiscuss LabVIEW strengths and weaknesses. This is not an open-forum “gripe session” but an opportunity to hear about the difficultiesand misunderstandings users have about LabVIEW, workarounds andpractices developers use to make their own LabVIEW programmingbetter, and ideas and aspirations programmers have for futureLabVIEW versions. The presenter, a LabVIEW certified architect,bases his presentation on feedback from users all over the countryand will include ideas solicited at NIWeek 2005.Presented by Innoventor

An In-Depth Look at USB 2.0Take a look under the hood of the fastest-growing external bustechnology, USB 2.0. Learn from NI experts who have developedUSB-based hardware, and discover how you can interface with any USB device in your LabVIEW program.Presented by National Instruments

Advanced LabVIEW FPGA Programming TechniquesWhen programming National Instruments reconfigurable I/O FPGAdevices with the LabVIEW FPGA Module, you need to understandcertain constraints to create efficient FPGA applications. Theseconstraints include limited size, limited speed, and integer-basedmath. Learn ways to recognize FPGA application inefficiencies andguidelines to follow when writing or reviewing applications. Alsodiscuss parallel operation creation, code pipelining, appropriate RAM use, and considerations when performing integer math. Presented by National Instruments

Choosing the Right Relay for Each ApplicationAs more relay options become available on the market, choosing the right switch for your test application may become more difficult.At this session, break down the pros and cons of each relay type (armature, reed, solid-state, FET, and more) based on keyspecifications and failure modes. Expect to see some live relayfailures as the presenters demonstrate what NOT to do with eachrelay type!Presented by National Instruments

Creating Autonomous Custom Instruments with PXI and LabVIEW Real-TimeDiscover how to quickly design a custom instrument that has all theflexibility and performance of a PC-based instrument as well as thereliability of an embedded real-time operating system. Observedemonstrations on how to build a custom stand-alone instrument by simply developing a LabVIEW application on a desktop PC anddeploying it to a PXI real-time system that can acquire signals atsample rates up to 200 MS/s and up to 26-bit resolution.Presented by National Instruments

Delivery Interoperability with Ethernet/IP, PROFIBUS, and DeviceNet Using LabVIEWLearn about the different technologies available on the market tocommunicate with existing industrial communication buses such asPROFIBUS, DeviceNet, MODBUS TCP/IP, PROFINET, and OPC usingeither LabVIEW or the LabVIEW Real-Time Module. Also discuss how industrial gateways can deliver interoperability with existingindustrial buses to preserve your investment in industrial systems.Presented by National Instruments

Design a Remote Monitoring System Using ASP .NET and LabVIEWLearn how to use the .NET Framework to create dynamic Web pagesfor remote monitoring and control. After covering ASP .NET basics,build a complete system that takes advantage of LabVIEW andMeasurement Studio with ASP .NET. Also discuss possible Webclients, including PDAs and cell phones.Presented by National Instruments

Deterministic Communication Techniques or Distributed Control and SimulationDiscuss technologies you can use for deterministic communication in complex distributed control and advanced simulation applications.Learn about industrial communication protocols as well as high-speed communication options using reflective memory, or Ethernet-based communication. See how you can use these technologies tosolve challenges in automotive and aerospace applications.Presented by National Instruments

Developing Effective High-Speed Vision ApplicationsDiscover how to develop high-speed vision applications usingindustry-standard technologies. Also learn how to use high-bandwidth buses, such as PCI Express, and how to write efficientcode to overcome common pitfalls, such as streaming-to-disk code.Presented by National Instruments

Dynamic System Modeling and Control System Design Using Maple and LabVIEWThe first step in developing a controller is to characterize the dynamicbehavior of the plant that needs to be controlled. However, in manycases, the physical plant has not yet been built, so you must create a“virtual” prototype of the plant using high-fidelity mathematical models.With most simulation tools, you have to manually translate the math toa simulation-oriented format, such as a schematic block diagramor program code, which can be time-consuming and prone to error.Learn how Maple can accelerate your control design process bysimply entering the math differential equations, transfer functions,and state-space equations as you would on a piece of paper; canrapidly determine the solution using its powerful numeric and symbolicmath solvers; and can transfer it to LabVIEW using the new MapleProfessional Math Toolbox for LabVIEW for real-time implementationand hardware-in-the-loop testing.Presented by Maplesoft

Engineering Information Management with DIAdemCapturing complex test and measurement data is only half therequirement of an integrated “engineering intelligence” system.Studies indicate that a significant portion of test data is either lost,mislabeled, or difficult to locate. Efficient data mining, corporateknowledge asset accumulation, and automated analysis are alltechniques you can dependably accomplish using DIAdem alongwith advanced techniques for engineering information management.Review both theoretical and real-world examples of the advantages a carefully constructed engineering database can provide and howto fully use the unique capabilities of DIAdem.Presented by VI Engineering

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Extreme Home Automation – NI EditionWho said you cannot use LabVIEW in your own house? See howyou can apply NI technologies to home automation. Entertain yourguests while controlling your music selection from a PDA. Let friendsinto your house while you work at your desk. Monitor your child’sroom from a LabVIEW Web server. Hear what NI employees andenthusiasts have accomplished and bring your ideas to discuss.Presented by National Instruments

Hands-On – LabVIEW PDA Module and CompactFlash DAQLearn how to build and run applications on handheld devices. Inaddition to walking through the development process step-by-step,receive tips and tricks for building well-designed mobile applications.Also participate in a brief PDA basics and supported devicesdiscussion as well as exercises using both Bluetooth communicationand CompactFlash DAQ.Presented by National Instruments

Implications of RF/Microwave Switching in Communications TestAt RF/microwave bandwidths, communications testing is particularlysusceptible to the harmful effects of improper switch selection. Atthis session, discuss the impact of switching on overall signal qualitythrough the key RF specifications of insertion loss, crosstalk/isolation,VSWR, and propagation delay. See examples of good and bad switchselections through RF/microwave switching demonstrations. Alsolearn how you can use the latest software tools to store calibrationinformation on each signal path in your RF ATE system.Presented by National Instruments

Introduction to .NET and Measurement Studio – Tools for Test and ControlLearn about the latest Microsoft platform and obtain an introductionto .NET fundamentals in test and measurement applications. Alsodiscuss how Measurement Studio turns Visual Studio .NET into anengineering workbench.Presented by National Instruments

Machine Vision in the Frequency Domain Get insight into the relationship of image characteristics and theassociated fast Fourier transform (FFT) through several imagingexamples. The image FFT plane represents the image frequencycontent. This frequency is similar to the FFT of a time signal where a time-based signal is mapped into its frequency contents. Thedifference is that position is mapped to spatial frequency and thereare two dimensions. You can conduct evaluations of certain imagequalities more easily by using the frequency domain rather than theoriginal image. The FFT domain presents unique filtering possibilitiesthrough simple masks. Explore these 2D FFT aspects through a fewinteresting applications.Presented by Innoventor

The Outlook for Wireless in Measurement and ControlA visit to any electronics store reveals a proliferation of wirelessnetworking technologies, each touted as the cure for a specific needand application – and that is just the consumer products sector. Newwireless technologies and communications protocols are introducedconstantly, and, as a result of this constant change, many engineersare hesitant to choose a wireless solution for their measurement orcontrol systems – even if the solution works well for their situations.This session helps scientists better understand wireless networkingtechnologies and address the issues they need to consider whenchoosing and developing wireless measurement systems.Presented by National Instruments

Secrets of the LabVIEW State Machine Explore the power of the state machine in creating applicationscapable of complex decision making. The state machine also is idealfor handling UI and other event-response applications. During thesession, learn the detailed LabVIEW state machine history and themany types of state machines LabVIEW developers can create, fromthe most basic (stacked sequence) to the most complex (producer-consumer queued message handler).Presented by ThinkG Consulting LLC

Test Data Management at National InstrumentsNational Instruments rigorously tests its hardware and softwareproducts individually and in integrated product configurations duringdevelopment and at various manufacturing stages to ascertainconformance to functional requirements, interoperability, andreliability in typical customer use-case scenarios. NI stores the datagenerated during these tests to facilitate real-time process control,advanced statistical analysis, efficient and effective debugging,benchmarking, and regression testing. To support these testingneeds, NI developed a complete test data management (TDM)framework that extensively uses NI software (NI TestStand, LabVIEW,LabWindows/CVI, and DIAdem), XML as the test data transmissiontechnology, and an Oracle database back end. At this session,discuss the TDM framework, the specific requirements that NIaddressed, and the architecture, including how and where engineersapplied NI software products and the substantial benefits achieved.Presented by National Instruments

Using Unified Modeling Language Tools to Model Graphical Systems in LabVIEW Learn how to take graphical programming one step further byvisualizing the structure and architecture of your system. UnifiedModeling Language (UML) provides a standardized graphicalnotation for systems modeling. Describing and documenting yoursystem structure and architecture before building it has manybenefits, including reducing bugs and making it easier to extend and modify your system later. In this session, explore UML featuresand benefits and see tools you can use to connect UML diagrams to automatically generated LabVIEW code.Presented by Endevo


NIW

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ot Technologies Track


NIWeek Session GuideReal-Time Control and Embedded Track

Advanced Communication Protocols for Distributed SystemsFor engineers who design real-time systems that interact with aremote host via Ethernet, one of the main challenges is building aneffective communication protocol between the target and hostcomputers. Learn how to implement an efficient TCP/IP messagingprotocol to enhance system performance, usability, maintainability,and scalability. Unlike raw TCP/IP communication, sending packageddata makes data manipulation more manageable and improvesthroughput by transmitting only the necessary data.Presented by National Instruments

Advanced Control – Beyond PIDLearn how Model-Free Adaptive (MFA) control is the most promisingtechnology to end the PID-dominated era. How does MFA controlwork? Why is a no-model approach possible? Get answers to thesequestions and discuss the control applications for which you can useMFA control as well as CyboSoft’s experiences using LabVIEW andNI hardware as a delivery platform. Examine how high-speed dataacquisition and high-resolution measurements can speed upresponse and eliminate steady-state offset errors when using PID inindustrial control applications. Investigate industrial controlapplication characteristics and case studies where high-speed dataacquisition with increased measurement resolution andsubmillisecond PID execution rates can help you optimize systemperformance and achieve tighter control. Presenters use theLabVIEW Real-Time and LabVIEW FPGA modules with CompactRIOand Compact FieldPoint to demonstrate how you can use high-speeddata acquisition and high-resolution measurements to increaseperformance and optimize control.Presented by National Instruments

Advanced DAQ Programming with LabVIEW Real-TimeDiscover how to program data acquisition for real-time applicationswith the latest NI-DAQmx driver. See how to reduce yourdevelopment time with configuration-based code generation forcommon real-time data acquisition tasks. Learn about NI-DAQmxfunctionality that is optimized for real-time performance, includingacquisition timing modes, synchronization, and real-time feedback.Presented by National Instruments

Compact FieldPoint – Closed-Loop Control BasicsDiscover the tricks, tips, and traps of closed-loop control based onLabVIEW and discuss the best programming practices to maximizesystem performance and minimize jitter on real-time platforms suchas NI Compact FieldPoint. Learn how to handle real-time-to-hostcommunication, first-in-first-out memory buffers and queues, built-intools that simplify the embedded development process, and theeffects of combining analog and digital I/O channels on the samecontrol system. Explore the Compact FieldPoint architecture and seehow to ensure that internal controller-to-bank communications arestreamlined in software as well as how to use new hardware andsoftware options to create tighter control loops and respond tosystem events with the smallest possible delay. Also learn howincorporating FPGA technology into new module architecturepromotes faster modules, faster memory and data management, and faster control.Presented by National Instruments

Developing Graphical Models for Embedded Control ApplicationsThe embedded control system represents a special software andhardware combination to manage real-world processes. You can usegraphical design packages like National Instruments LabVIEW andMATRIXx in the embedded control system design process to shortentime to market and improve test quality and product performance. Atthis session, review production examples to learn the key systemarchitecture, style, and testing principles necessary to effectivelymanage graphical modeling environments. Obtain simple guidelinesfor creating graphical models and walk through the application all theway to code generation and a silicon target.Presented by National Instruments

Hands-On – Intermediate CompactRIO and LabVIEW FPGA At this National Instruments CompactRIO hands-on session, youlearn intermediate programming skills such as FPGA/hostsynchronization and timing/triggering. You also explore programmingtechniques to get the most from your applications and take fulladvantage of NI CompactRIO flexibility and optimization.Presented by National Instruments

Hands-On – Introduction to CompactRIO and LabVIEW FPGA Learn CompactRIO reconfigurable control and acquisition systemprogramming fundamentals for developing data acquisition andcontrol systems. Attend this hands-on session to familiarize yourselfwith the basics of LabVIEW FPGA application development for NI CompactRIO. Topics include configuration, targeting, I/O, FPGA-to-host communication, and data scaling.Presented by National Instruments

Hands-On – LabVIEW Real-TimeTake a tour of the LabVIEW Real-Time Module with a hands-onsession using real-time hardware and software. Explore how you can extend LabVIEW power into robust, deterministic, embeddedapplications. Learn how to build a complete LabVIEW Real-Timeapplication, download it to an embedded processor, and control the application remotely over a network. Discover the increasedproductivity and performance that LabVIEW Real-Time provides by constructing a completely distributed control application injust minutes.Presented by National Instruments

High-End Control Design (H Infinity)In this presentation, explore high-end control techniques such as H infinity and predictive control using National Instruments MATRIXx. Presented by National Instruments

Implementing Digital Protocols Using LabVIEW FPGAYou can interface reconfigurable I/O (RIO) devices to a wide range of external devices, systems, and chips using custom and standardcommunication protocols. In this session, discuss communicationprotocol implementation using LabVIEW FPGA I/O tools and anumber of common programming architectures. LabVIEW FPGAcustomization and performance are ideal for integrating thesedifferent protocols quickly. Using RIO, National Instruments hasdeveloped specific protocols including SPI, I2C, and PS/2 for chipcommunication and testing; S/PDIF and I2S for digital audio testing;and custom protocols used in military and aeronautical designand development.Presented by National Instruments

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Introduction to Developing Distributed Real-Time Applications with LabVIEWLearn how to architect distributed applications that include a varietyof nodes on a network. Discuss how to manage the distributed systemdevelopment, including source code management and data transferamong real-time targets and supervisory computers. Get a sneak peekof new ways to design and develop a distributed application.Presented by National Instruments

Introduction to LabVIEW FPGA and Reconfigurable I/O (RIO) HardwareLearn about the reconfigurable technologies revolutionizing virtualinstrumentation and discuss LabVIEW FPGA and RIO technologybasics and applications. Also explore RIO hardware platforms suchas PXI, PCI, CompactRIO, and Compact Vision System.Presented by National Instruments

Methods for Benchmarking and Optimizing Real-Time ApplicationsDo you wonder how fast your real-time control loops can go? Learnhow NI developers benchmark LabVIEW Real-Time applications andsee what tools are available to gauge the performance of yoursystem. Also explore how you can optimize your application.Presented by National Instruments

Microsecond Software Timing and Beyond with the LabVIEW Timed LoopExplore advanced timing techniques for developing applications withmany time-critical tasks in LabVIEW Real-Time using the new LabVIEWtimed loop. See how you can schedule and prioritize up to 128 taskswith more than 2 billion priority levels. Learn how to programmaticallycontrol the timing and synchronization of real-time loops usingdynamic feedback and how to time loops with hardware events.Presented by National Instruments

On-Wing Aircraft Engine Diagnostic System Using CompactRIO The unique power and form factor of CompactRIO is key to the successof VI Engineering’s aircraft engine “on-wing” diagnostic systemdeveloped for a major international aircraft engine manufacturer.Normal aircraft engine maintenance requires considerable time toremove the engine from the wing before performance testing. Explorea testing module, featuring CompactRIO and developed using LabVIEW,that you can mount inside an aircraft wing during flight.Presented by VI Engineering

The Nuts and Bolts of LabVIEW FPGAWondering how LabVIEW FPGA runs LabVIEW code? Learn how tosynthesize a LabVIEW diagram down to the basic building blocks ofFPGA digital logic design. Explore ways to enforce LabVIEW dataflowexecution semantics, the hardware cost of language semanticenforcement, and ways to take advantage of the language whileminimizing semantic overhead. While this information is notnecessary for using LabVIEW FPGA, it helps you understand what thetool is doing for you behind the scenes. Session prerequisites includebasic introductions to LabVIEW FPGA and digital logic design. If youhave heard of a flip flop, you are ready for this session.Presented by National Instruments

Robust Control Design Using MATRIXxControl system development is typically based on a mathematicalmodel of the plant to be controlled. Most physical systems are toocomplicated to be exactly represented by a single tractablemathematical model. Typically, a variety of linear operators areintroduced in the model to capture the effects of nonlinear terms,higher-order unmodeled dynamics, and time variations due tochanging operating conditions. These linear operators have someamount of uncertainty associated with their behavior, so how can thisuncertainty be accounted for in the control design process and how

does it affect the performance of the controlled system? MATRIXxprovides analysis and synthesis techniques that you can use to developcontrol systems that guarantee stability and satisfactory performancefor these systems despite the uncertainty. Learn how to apply MATRIXxto improve your system robustness through the use of H infinity,LQG, and mu synthesis in controller design for uncertain systems.Presented by National Instruments

Thinking inside the CHIP – Embedded and FPGA TechnologiesAttend this session for technical insight into LabVIEW andprogrammable chips. Observe presenters using the LabVIEWEmbedded Development Module and the LabVIEW FPGA Module todemonstrate the different on- and off-platform options you have whendeveloping custom protocols, custom designs, and proprietary IP. Presented by National Instruments

Through 1,131 Eyes – LabVIEW for Industrial Control and PLC UsersExplore the relation of LabVIEW capabilities and IEC Standard 61131-3 for industrial control applications and discuss how LabVIEWhandles execution control and operating systems, data definitionsand data types, programming languages, and more. A key goal of the standard is to encourage effective software developmentapproaches that use encapsulation to facilitate software reuse,which LabVIEW covers well. Also see how you can use graphicallanguages to achieve more readable, self-documenting controlapplications. While not using the IEC 61131-3 languages, presentersshow how LabVIEW can deliver on this standard in a variety ofindustries and applications related to PLCs.Presented by National Instruments

NIW

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e Control and Embedded Track



NIWeek Session GuideSoftware Development Techniques Track

Advanced ANSI C Debugging Using LabWindows/CVIWhether you are calling C DLLs from LabVIEW or creating Capplications in LabWindows/CVI, attend this session to learnadvanced debugging techniques. Explore how to use remotedebugging and conditional breakpoints, find memory leaks, andeven prevent bugs before they happen.Presented by National Instruments

Advanced Techniques for Building and Deploying LabVIEW ExecutablesLearn tips and techniques you can use to efficiently create and deployLabVIEW executables and shared libraries to other computers andtargets. Explore the best practices for deploying LabVIEW executablesto other targets and PCs and discover how to best create LabVIEWexecutables and LabVIEW installers.Presented by National Instruments

Advanced Techniques for Designing Reusable, Maintainable LabVIEW CodeThis session covers the issues developers are concerned with whencreating an API. Learn the best tips, techniques, and resources forbuilding good LabVIEW APIs that remain easy to adapt and maintainas you reuse them in several applications.Presented by National Instruments

Analog and Digital Video ApplicationsAttend this session to learn analog and digital video fundamentalsincluding standards such as NTSC, PAL, and DVI. See the latest NIdigitizers and digital analyzers in action and explore how you can usethem in your applications to improve your video test. Discover interactivetools that can help you get started with your video application quickly.Presented by National Instruments

Camera Technologies for Life Sciences and MicroscopyLearn about the opportunities and challenges that imaging applicationsin the life sciences and microscopy fields present for LabVIEW users.See how success depends not just on LabVIEW expertise but on athorough understanding of scientific-grade digital camera technology.Presented by DVC Company

Case Study – Automated Calibration Framework Architecture Design StepsReview the design process of an automated calibration frameworkused to calibrate NI hardware. Learn the requirements, challenges,and methodology used to develop the solution as well as thebenefits and trade-offs of the chosen architecture. Also discusshow well the architecture addresses the major calibrationframework requirements. Presented by National Instruments

Creating Flexible, User-Configurable LabVIEW User InterfacesExplore several methodologies for programmatically enabling customconfiguration of LabVIEW user interfaces (UIs) at run time. Get anoverview of LabVIEW UI customization tools and examine UIcustomization use cases and architectural aspects. ObserveLabVIEW demonstrations on configurable fixed-position panelregions, drag-and-drop UI objects, and instantiated UI objects.Presented by G Systems

Designing Multilingual Applications in LabVIEWDoes your organization develop localized versions of LabVIEWapplications for worldwide use? In this session, discuss thedifference between static and dynamic localization and the pros andcons of each technique. Also observe demonstrations to learn aboutthe mechanics of each process.Presented by National Instruments

Designing Plug-In User Interface Modules in LabVIEWLearn how to design modular UIs that are both easily expandable andcustomizable. Through LabVIEW SubPanel container use, see howyou can design a UI framework that can accept plug-in modules.After a SubPanel overview, explore several modular UI examples,including a configuration file editor, a real-time data viewer, and aframework for adding plug-in calculation modules.Presented by G Systems

Designing a Test System to Address Top Automated TestChallenges – Flexibility, Reusability, and MaintainabilityHundreds of organizations have greatly lowered their cost to test andincreased their investment returns by developing a flexible, reusable,and maintainable test system using a software framework based onNI TestStand. Learn how to design this type of software framework,which helps engineers focus on test module developmentsequencing without having to integrate the modules into the testsystem. This approach not only improves test reusability but alsosystem maintainability. Explore several solutions for developing areusable software framework based on NI TestStand and see how touse a common user-defined operator interface, process models, steptypes, and reports.Presented by National Instruments

Developing LabVIEW FPGA/Real-Time Applications for Optimal Code Reuse and Easier DebuggingDiscuss how to architect LabVIEW Real-Time and LabVIEW FPGAapplications for better code reuse and easier debugging and explorethe best practices for transferring data between FPGA hardware anda real-time controller for control or data-logging applications. Learnhow to implement various data transfer methods depending onyour application.Presented by National Instruments

Express Workbench Extends LabVIEW and ExpressTechnology with SignalExpress and Control Design AssistantsExpress technologies pioneered with LabVIEW 7 Express introducedLabVIEW users to a new, configuration-based approach to graphicalprogramming. The new, higher-level programming methodologyprovided by the Express VIs, the LabVIEW System IdentificationAssistant, and the LabVIEW Control Design Assistant saves noviceand advanced LabVIEW users time through interactive measurementand analysis configuration. Discuss how the new Express Workbenchinteractive environment is extending LabVIEW and Expresstechnology for today’s engineers, scientists, and technicians. Presented by National Instruments

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NIW

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are Developm

ent Techniques Track

FFT Applications – Beyond the Power SpectrumThe familiar FFT (fast Fourier transform) is a class of efficient algorithmsthat many engineers know as a useful tool for calculating the powerspectrum of a signal. Did you know that you also can use the FFT formulticarrier digital communications, data interpolation, digital filterdesign, large number multiplication, statistics, and image processing?At this presentation, explore lesser known, but potentially equally asuseful, FFT applications.Presented by National Instruments

Fundamentals of Random Numbers and Noise with LabVIEWDuring this presentation, discuss the background theory and generationof random numbers and noisy signals in LabVIEW (lots of random stuff)and explore interesting applications where the richness of noise iscritical. Noise is serious but randomness is what gives life its spice!Presented by National Instruments

High-Speed Serial TechnologyHigh-speed serial interfaces are becoming the standard for many high-bandwidth communications applications. At this presentation, discusshigh-speed serial data standards – USB, IEEE 1394 (FireWire), RapidIO,SDI, SATA, SONET, Fibre Channel, XAUI, InfiniBand, Gigabit Ethernet,DVI/HDMI, and more – and the associated interfacing and testchallenges. Explore serial bus development trends in areas such asspeed, bandwidth, protocol analysis, compliance testing, and others.Presented by National Instruments

Improving the Internal Structure of LabVIEW Applications through RefactoringA key software development problem is the common need to addfeatures to a program or debug difficult-to-understand sources. Whenthese issues arise during your software development, considerrefactoring, which is the process of changing a software system toimprove its internal structure without altering the external behavior ofthe code. In this session, learn how to approach LabVIEW programrefactoring in a controlled manner to improve efficiency and maximizecode usability to mitigate problems when you add new features.Presented by National Instruments

Increasing Throughput and Lowering Test Costs – ArchitectingTest Systems to Handle Concurrent Testing of Multiple UUTsTesting multiple units under test (UUTs) concurrently is an ideal way toincrease test throughput and reduce test cost. Explore multiheadtesters and get insight into designing a test system with multiple testsockets where you can share and synchronize components of fixturessuch as PCs, instruments, data acquisition devices, chambers, andothers to test several units at one time. Discuss the NI TestStand paralleland batch process models and ways to design sequence files to takeadvantage of the process models’ multi-UUT testing capabilities. Alsolearn several techniques for synchronizing sequence file steps amongmultiple executions running simultaneously to share resources, controlinstruments, and perform data acquisition, and review NI TestStand testresult report formats.Presented by VI Technology

LabVIEW Component Oriented Design – A Modular Approach to LabVIEW Programming Explore the software models and design techniques presented in thebook A Software Engineering Approach to LabVIEW. Learn how usingthe techniques in the book to create LabVIEW Component OrientedDesign (LCOD) modules results in cleaner, more maintainable code thattakes less time to develop. See how the LCOD module object-orientedapproach differs from that of the Graphical Object-OrientedProgramming (GOOP) Toolkit and discover how the software design and development techniques presented can help LabVIEW developersof all skill levels. Review software programming techniques and LCODimplementations of various objects as well as learn how you can usethe LabVIEW VI Analyzer Toolkit to analyze LCOD code modules.Presented by VI Technology

LabVIEW for Embedded DesignExplore how you can use LabVIEW for embedded system design onNational Instruments real-time platforms with a path to custom 32-bit microprocessor-based hardware designs. Get insight into thefuture of NI real-time platforms for rapid embedded system proof-of-concept prototyping and for preserving your LabVIEW softwareinvestment when moving to custom embedded hardware designs.Presented by National Instruments

LabVIEW FPGA High-Speed Design TechniquesDo you need to get maximum speed out of your FPGAs? Review case studies to learn how you can develop powerful FPGAs.Presented by National Instruments

LabVIEW User Interfaces – Beyond the Good, the Bad, and the Ugly“The Good, the Bad, and the Ugly” is a classic LabVIEW tutorial that introduces many UI design concepts and their applications inLabVIEW. Explore UI design in LabVIEW more deeply and learn aboutnew features added to LabVIEW since the tutorial was introduced thataffect UI design. Investigate both UI principles and user interactivitydesign, and see how you can apply those principles in LabVIEW toimprove UI power, usability, and user satisfaction. Examine real-worldexamples of the principles described and collect references to helpyou explore the topic further.Presented by Innoventor

LabWindows/CVI at 200 MS/s with Modular InstrumentsLearn how to effectively use digitizers, arbitrary waveform editors,and RF hardware with National Instruments LabWindows/CVI.Discuss the variety of modular instrument APIs and ways to make the most of their integration with NI LabWindows/CVI.Presented by National Instruments

Managing Multigigabyte-Sized Data in LabVIEWIn LabVIEW, memory management is automatic and easy. However,because LabVIEW is a dataflow language, copies of data arenormal and frequent. This can be a problem when data sizes hit the multimegabyte range. Multigigabyte-sized data on disk also ischallenging because LabVIEW is a 32-bit application. In this session,learn how to successfully use LabVIEW with multimegabyte memoryobjects and multigigabyte disk objects.Presented by National Instruments



NIWeek Session GuideSoftware Development Techniques Track (Continued)

NI-DAQmx and .NET – The BasicsDiscover how to use the .NET Framework to create the most basic to the most complex data acquisition applications with NI-DAQmxmeasurement services software. This technical session begins with NI-DAQmx API fundamentals and ways you can use MeasurementStudio to interactively configure data acquisition tasks and generate.NET code. Also learn more advanced data acquisition programmingtechniques, including handling multiple tasks, events, and simulation.Presented by National Instruments

Open-Source LabVIEW Development through the Web When LabVIEW developers can read, redistribute, and modify sourcecode for a piece of software, that software evolves. People improveit, people adapt it, people fix bugs. And this can happen at a speedthat seems astonishing compared to the slow pace of conventionalsoftware development. Learn how LabVIEW users are taking advantageof a variety of Web tools, such as wikis, discussion forums, and blogs,to build productive code faster than ever before. Jim Kring, founderof OpenG.com, an online LabVIEW open-source initiative, introducesyou to the growing world of open-source software development.Presented by James Kring, Inc.

Performing Integer Math and Digital Signal Processing with the LabVIEW FPGA ModuleLearn the fundamentals of performing integer-based math operationson reconfigurable FPGA hardware and obtain tips on how to design yourcode for debugging/simulation, counter rollover, saturation arithmeticfunctions, division, and performance and FPGA utilization optimization.Discuss the pros and cons of integer-based FPGA implementationcompared to floating-point processors, and review downloadableLabVIEW FPGA Module IP cores that demonstrate digital signalprocessing techniques for machine control and preventive maintenanceas well as in-vehicle data acquisition and data logging. Examples includehigh-order antialiasing filters, decimation for data reduction, integrationfilters for inertial guidance measurements, root-locus filter design foradvanced control compensators, special alarming and level-meteringfilters for machine condition monitoring, and octave analysis.Presented by National Instruments

Prototyping and HIL Using NI LabVIEW, The MathWorks, Inc. Simulink®, and NI MATRIXxLearn three offline simulation performing methods using dynamicsystem models to build prototypes and hardware-in-the-loopsimulations with LabVIEW Real-Time hardware targets. ExploreThe MathWorks, Inc. Simulink®, National Instruments LabVIEW,and NI SystemBuild.Presented by National Instruments

Technologies for Graphical Configuration of Timing and Triggering in LabVIEWTo visualize and explain the timing and triggering nature of theirapplications, engineers may use graphical approaches, but they arelimited to the traditional method of setting parameters in numerousfunctions/VIs for their approaches. Or, if they are using FPGA-enabledI/O devices, engineers must use low-level logical constructs such asNAND gates and Boolean compares to build up higher-level timingand triggering functions. Learn methodologies for integrating graphicaltiming and triggering configurations into the LabVIEW diagram.Presented by National Instruments

Test Automation of Embedded Control SystemsEngineers designing embedded control systems need automated testtools throughout the design process. They often test control models inoffline software simulations early in the process (model-in-the-loop).Then they test software generated from models (software-in-the-loop). After they deploy the software to an embedded processor, theengineers perform hardware-in-the-loop testing to test the controlleragainst a complete physical system simulation. They need to reusetesting information, such as test vectors, at each test stage. Inaddition, embedded controllers have time-dependent characteristicsthat require tests to be executed in a real-time environment. In this session, explore the functions required in embedded controlapplication test automation, discuss automation challenges, andreview a case study.Presented by National Instruments

Test Express – Leveraging Express VI Technology forMeasurement Applications at Texas InstrumentsTest Express is a concept that uses LabVIEW Express VIs to deliver a complete, interactive, measurement-based, reusable module for test engineers. These modules work as free-standing VIs for designevaluation and debugging, or as plug-ins to NI TestStand sequenceswhen automating device characterization with the Texas Instruments (TI)Enterprise Level Framework (ACE). Test Express modules function much like a single piece of instrumentation during this operation,abstracting the user from configuring multiple, complex pieces ofequipment. TI has developed several different test suites based on theTest Express concept and Express VI technology. This has resulted in alibrary of more than 50 Express VIs.Presented by Texas Instruments

Thousands of Distributed I/O Points, Five IndustrialCommunication Protocols, and Just One LabVIEWLearn how you can use LabVIEW for applications that acquire and logdata from thousands of distributed, networked I/O points in NI andthird-party hardware. See how to publish and subscribe to data itemsfrom devices using standard industrial communications protocols,including DeviceNet, PROFIBUS, MODBUS, and others. Also obtain asneak preview of new features coming soon and some new ways todevelop and organize large tag sets as well as configure alarmingand data-logging applications.Presented by National Instruments

Tips and Techniques – How to Develop High-PerformanceSound and Vibration Applications with LabVIEWLearn directly from the developers how to get the most out of NI-DAQmxmeasurement services software, the LabVIEW Sound and VibrationToolkit, and the LabVIEW Order Analysis Toolkit. See how you can develophigh-performance systems for sound and vibration measurements,from production test to high-channel-count applications. Learn how tosimplify configuration with Transducer Electronic Data Sheet (TEDS)sensors, synchronize multiple DSA devices in no time, and reliablystream a large amount of data to disk. Explore how you can efficientlycombine a variety of audio measurements, improve frequencyresponse measurement speed, easily scale your system for multiplechannels, and select the most appropriate technique for order analysis.Presented by National Instruments

Using LabVIEW for System Identification, Control Design, and Real-Time ImplementationIn this presentation, use LabVIEW to analyze a multiple input, multipleoutput (MIMO) dynamic system; generate a model using systemidentification; and synthesize a controller using modern and classicalcontrol methods. Then demonstrate closed-loop system analysisusing the LabVIEW Simulation Module and controller implementationon an NI CompactRIO system. Presented by National Instruments

Using LabVIEW to Add Your Own Functionality to Vision Builder for Automated InspectionNI Vision Builder for Automated Inspection (AI) is a configurablemachine vision software package for building, benchmarking, anddeploying vision applications without programming. Learn how to usenew Vision Builder AI features to extend configurable machine visionlimits by customizing steps with your own LabVIEW code. The softwarepackage includes a software developer’s toolkit that you can use todevelop a custom Vision Builder AI step to implement application-specific solutions, such as report generation, or to interface hardwarenot natively supported by Vision Builder AI, such as a motion card. Alsosee how you can deploy your Vision Builder AI application using yourown user interface, written in the language of your choice, by drivingVision Builder AI with an ActiveX control. Lastly, explore how anoperator can interact with a running inspection through a humaninterface on a MODBUS TCP-enabled touch screen.Presented by National Instruments

Using LabVIEW within CMMI Software Engineering GuidelinesExplore how to use LabVIEW within Capability Maturity ModelIntegration (CMMI) guidelines throughout the software developmentprocess to achieve improved software quality and better overalldevelopment efficiency.Presented by National Instruments

Using NI-IMAQ for IEEE 1394 Cameras to Unlock the Full Potential of FireWire CamerasIn this session, see how to use NI-IMAQ for IEEE 1394 cameras tounlock all the powerful features of industrial FireWire cameras.Explore the new and improved functionality of the NI-IMAQ for IEEE1394 driver software such as FLIR thermal camera support, inlinebayer decoding, and broadcasting from a single camera to severalhost computers. Industrial FireWire cameras are built on the 1394Trade Association Industrial and Instrumentation Digital Camera (IIDC)Specification. The IIDC specification implements basic camera controland video transmission functionality as well as facilitates advancedfeatures. You can implement advanced features, also known as smartfeatures, through vendor-specific register sets in the camera controlregisters. Also learn how to use the low-level register methods of NI-IMAQ for IEEE 1394 cameras to query and control advanced registers.Presented by National Instruments

VIs – The Good, the Bad, and the UglyIn this interactive presentation, improve the UI appearance, usability,and design issues in several applications, including real-worldsubmissions and illustrative mock-ups. Explore design trade-offs andrationales and learn tips and techniques for improving VIs. Input fromattendees is encouraged.Presented by National Instruments

Wireless Sensor Network TechnologiesReview research findings on wireless sensor networks, whichconsist of more than 1,000 nodes that are dynamically addressablewith resource limitations (battery, computation, network, andmeasurement). Obtain a summary on state-of-the-art wirelessnetwork technology and discuss how NI software may work in this area.Presented by National Instruments

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Tools and Techniques for Large Application ProjectManagement and Accurate Estimating in LabVIEWDiscuss how to apply source lines of code (SLOC)-equivalent metricsto LabVIEW applications. Also learn how to apply metrics duringdevelopment to monitor projects as well as how to evaluate historicalmetrics to create new estimates. Because SLOC and SLOC-equivalentmetrics are dependent on style, explore the impact various designpatterns have on metrics.Presented by VI Engineering

USB-Based Controllers for Academic Teaching ApplicationsHear how a growing number of USB sensors and actuators, combinedwith small PC form factors using only USB and Ethernet ports,threaten to change the limits of what an “embedded” controller is and how it is assembled.Presented by National Instruments

Using Consumer Hardware and the LabVIEW Embedded Module for Engineering EducationProfessors in engineering labs often use embedded systems to teachproblem solving, programming, controls, robotics, and mechatronicsconcepts. Existing solutions, like many embedded systems, are difficultto program and have limited capability. Observe presenters using theGameboy Advance as the main processor with the LabVIEW EmbeddedModule to create a cost-effective, easy-to-program embeddedmechatronics controller for educational use. The resulting systemincludes a 32-bit CPU, an LCD display, PCM sound, a CMOS colorcamera, integrated motor controllers, and LabVIEW programmability.Presented by National Instruments

Using Execution Tracing to Improve LabVIEW Real-Time ProgrammingLearn the best programming practices in LabVIEW Real-Time usingthe LabVIEW Execution Trace Toolkit. With this new toolkit, LabVIEWReal-Time users can log and visualize VI and OS events such as threadexecution. Learn how VI and thread priorities affect application behaviorand how you can measure execution time, find sleep and wait spans,and identify memory allocations. See how careful event analysis canlead to intelligent programming decisions that improve applications.Presented by National Instruments


NIWeek 2005 ExhibitionNIWeek 2004 boasted record exhibition and attendancegrowth. Do not miss this opportunity to take advantage of allNIWeek has to offer. The NIWeek 2005 exhibition is 70 percentsold, so sign up today.

Exhibitor Contact InformationThere are four ways to register to exhibit at NIWeek 2005• Online – register online for your NIWeek booth space • By phone – contact Devin Shelgren at (512) 683 5622 • By e-mail – e-mail Devin Shelgren at [email protected] • By fax – download the exhibit space contract and fax it to (512) 683 5775

You also can contact our customer service representatives at (888) 564 9335.

Devin Shelgren, Exhibition SalesTel: (512) 683 5622Fax: (512) 683 [email protected]

Advanced Illumination ................................629Aeroflex Incorporated ................................814American Reliance Inc. ..............................401Apple Computer, Inc. ..................................602ASCOR Inc. ....................................................212ASSET InterTech ..........................................320B&B Technologies, Inc. ..............................180Basler Vision Technologies........................531Bayside Motion Group ................................908 Bloomy Controls Inc.....................................306Brüel & Kjær..................................................906CCS America ................................................532Christensen Display Products ..................703Chroma ATE Inc. ..........................................810Cohu Electronics Division ..........................728Concurrent Computer Corporation ..........820Condor Engineering ....................................807Cyth Systems ................................................132Davis Inoteck Instruments..........................104DVC Company ..............................................631Dynamic Technology, Inc. ..........................701Edmund Industrial Optics............................429Electrophysics Corp ....................................433ENDEVCO ......................................................303FLIR Systems Inc. ........................................528GÖPEL Electronic ........................................410Graftek Imaging, Inc. ..................519, 628, 630G.R.A.S. Sound & Vibration ........................910G Systems, Inc. ....................................213, 314Huntron, Inc...................................................402Hydro Technologies, Inc. ............................209Hypertronics Corp. ..............................901, 903InfoDat ............................................................215Innovative Technologies, Inc. ....................214Instrumentation Engineering ....................907Instrument Rental Labs ..............................920ITK Engineering ..........................................1108JTAG Technologies ......................................702Kistler Instrument Corporation ..................902

KYOWA Electronic Instruments Co., Lt. Japan ..................1305

Lebow Products, Inc. ..................................806Lion Precision................................................307LTR Publishing Inc. ......................................312MAC Panel Company ..................................809Macro Sensors ............................................322MAGMA, Mobility Electronics, Inc.....218, 220Maplesoft ......................................................207MAPRO Test Systems..................................811Men Micro Inc ..............................................318Millennial Net................................................208MTS Systems ................................................810Navitar ............................................................730Optimation Technology ......................707, 709Parker Bayside..............................................908PCB Piezotronics Inc. ..................................700Phase Matrix ................................................915Precision Metrology, Inc.............................821QSI Corporation ....................................300, 302Quanser..............................................1009, 1011RSI ..........................................................801, 803SigmaQuest ..................................................802SofTest Designs Corporation ....................160Sumaj ATE Engineering ..............................914Teclution ........................................................910Thermotron Industries ................................324Thin Film Technology ..................................816VI Engineering ..............................................501VI Security ..................................................1000VI Service Network......................................225VI Technology................................................502Viewpoint Systems ......................................721Virginia Panel Corporation ........................719ViTec Co Ltd. ..................................................711Weed Instrument..........................................815

Exhibitor List and Booth Numbers


NIW

eek 2005 Exhibition

If virtual instrumentation is your vision, thenNIWeek 2005 is the place to be. For more than10 years, the National Instruments worldwidevirtual instrumentation conference andexhibition has provided exhibitors withopportunities to meet face-to-face withengineers from a wide variety of industries,including automotive, aerospace, biomedical,electronics, government/defense, and academia.

New Exhibit HoursTuesday, August 16 10:00 a.m.-6:00 p.m.1

Wednesday, August 17 10:00 a.m.-6:00 p.m.2

Thursday, August 18 10:00 a.m.-2:00 p.m.

All booths must be show ready by 9:00 a.m., Tuesday, August 16.1Annual Exhibition Reception Party and Open Exhibition Hours2Reception in Exhibit Hall from 4:30 to 6:00 p.m.

Industrial Control Pavilion See products for engineers and machine builderswho design systems that require advanced controlalgorithms, I/O, motion, or industrial communications.Also learn how you can use NI LabVIEW to integrateNI programmable automation controllers (PACs) withproducts from leading industrial automationcompanies. Featured products include actuators,control algorithms, drives, stages, networkinghardware, and local displays.

Partners in Design Pavilion Visit with leading electronic design, mechanicaldesign, mathematics, and embedded silicon vendorsworking closely with NI to improve the connectivity ofNI LabVIEW and SignalExpress with today’s design

environments. NI and collaborators, including AnalogDevices Inc., Electronics Workbench, SolidWorks,Maplesoft, and more, present more than 10 livedemonstrations and technical sessions on theincreased productivity possible with these newintegrated technologies.

PCI Express PavilionExplore exciting new technologies on the PC market.Obtain information from industry experts about thenext evolution of the PCI bus, PCI Express. Visit thispavilion to see new architectures and products thatsupport PCI Express and learn how these newcomputer-based technologies will impact the nextgeneration of PXI. PCI Express sponsors include Inteland Xilinx.

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Visit ni.com/events/niweek toregister and view program andexhibit details.

August 16-18, 2005Austin Convention CenterAustin, TX USA


NIWeek 2005 Sponsors Alliance Day 2005Monday, August 15Alliance Day special events are reserved for developers, consultants, and system integrators in the National InstrumentsAlliance Partner program. Alliance Day coincides with the NI worldwide sales conference, so NI partners can sit shoulder-to-shoulder with the NI sales team and learn how to work together to win more business.

Keynote about Key Strategies – The keynote addresses both NI Alliance Partners and the NI worldwide sales and marketingorganization. Top NI executives give an assessment of the industry and the NI competitive position. This is a unique opportunityto hear about NI business, markets, and strategies and how they can enhance your business.

Technical Empowerment – Products and technologies form the basis of the business partnership between NI and AlliancePartners. Attend in-depth trainings and hands-on sessions for Alliance Partner engineering teams to get specializedassistance in developing products based on NI technologies. Also learn about the strategic implications of future productinitiatives during product strategy sessions.

Business Empowerment – As your business partners, NI wants to help Alliance Partners achieve success. Hear from key NI sales and marketing team members about the secrets to generating more leads and closing more sales. Learn how toleverage major NI marketing campaigns in your own marketing plans. Attend professional workshops on how to improve your business practices.

Do not miss out! Alliance Day is an opportunity to take your business to the next level. For more information,please contact National Instruments customer service representatives at (888) 564 9335. Register for NIWeekand Alliance Day now at ni.com/niweek.

Customer EducationExpand Your NIWeek Experience with New and Advanced TrainingTake advantage of new and advanced National Instrumentstraining courses along with NIWeek! Maximize theeffectiveness of your trip and save on travel expenses by attending a course prior to, during, or after NIWeek.

Offered at the NI Corporate campus,these courses help you:• Use structured programming practices in LabVIEW

• Use LabVIEW, LabWindows/CVI, NI TestStand, orDIAdem software

• Develop large, high-quality LabVIEW applications

• Develop optimized vision systems

• Design and develop reliable deterministic applications using the LabVIEW Real-Time Module

• Solve high-channel-count application challenges

• Set up high-performance instrument control systems

Earn Certification Credentials – While at NIWeek, take anyNI certification exam at a reduced price of $195. Certificationsavailable are Certified LabVIEW Developer, Certified LabVIEWArchitect, Certified TestStand Developer, Certified TestStandArchitect, and Certified LabWindows/CVI Developer. NI alsoconducts monthly, instructor-led online certificationpreparation courses.

To register for a course or learn more about the NIcertification program, visit ni.com/training or call (800) 890 2062.NIWeek 2005 • August 16-18 • Austin Convention Center • Austin, TX USA • ni.com/events/niweek22

350921C-01 2005-5226-518-101-D

Automation.com is a leading online destination for industrialautomation, process control and instrumentation professionalsproviding daily news updates, articles, product information,application tools, job postings, classifieds, and much more. Visit www.automation.com.

Desktop Engineering (DE) magazine, provides design solutions from concept through manufacture for hands-on design engineersand engineering management. DE covers the full range of computer-aided engineering and technologies including CAD/CAM/CAE,math/analysis software, data acquisition, rapid prototyping,EDM/PDM/PLM, workstations and peripherals, FEA/CFD, simulation,collaboration tools, visualization, and test and measurement. Eachissue provides design engineering solutions through extensiveproduct reviews, comparisons, technology updates, real-worldapplication stories, news, product resource guides, and new productreports. Free subscriptions are available to qualified U.S. residents atwww.deskeng.com.

Sensors magazine is the only resource that delivers practical, in-depth, and accessible information focused on the principles and applications of sensors and related technologies. Visitwww.sensorsmag.com.

Control magazine is the only magazine dedicated to satisfying theinformation needs of technical and management professionalsinvolved in the automation, control, and instrumentation of theprocess industries. Visit www.controlglobal.com.

®

Reed Business Information is the largestbusiness-to-business publisher in the UnitedStates and provides critical information andmarketing solutions to business professionals in the media, manufacturing, electronics,construction, and retail industries. Its market-leading properties include more than 100business-to-business publications, more than 75 Webzines and Web portals, as well as onlineservices, custom publishing, directories,research, and direct marketing lists. Visitwww.reedbusiness.com.

With an exclusive circulation to industrial OEMs and system integrators,Control Design magazine is dedicated to satisfying the informationneeds of technical design and management professionals involved inspecifying automation, instrumentation, and control technologies foruse in industrial machines. Visit www.controldesign.com

America's largest-circulation design engineering magazine, TechBriefs reports NASA innovations first to more than 196,000 engineersand managers throughout OEM industries. Discover a wealth of newproduct ideas and engineering solutions in electronics, computing,software, sensors, test and measurement, manufacturing, and muchmore. Tech Briefs is now available in a fully searchable PDF edition atwww. techbriefs.com.

The Reed Science Group is the leading provider of news andinformation to the scientific research and development community.It’s wide range of technology-focused media, including magazines,newsletters, Web sites, search engines, conferences, and Webcasts,are relied upon by scientists, researchers, engineers, technicalmanagers, and corporate R&D executives at leading research-basedorganizations in every industry, from life sciences to electronicand chemicals to communications, and throughout academia andgovernment. Reed’s market-leading publications include LaboratoryEquipment, R&D Magazine, and Scientific Computing & Instrumentation.


NIW

eek 2005 Sponsors

11500 N Mopac ExpwyAustin, TX 78759-3504

Documents

NIWeek 2 0 0 5 - National InstrumentsNIWeek Session Guide Must-See Sessions Do not miss the most popular NIWeek 2005 presentations. Partners in Design Session Learn about improving