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    Incandescent Glass Inspection with Machine Vision at the Molding Stage with NI LabVIEW

    Author(s):

    Sbastien Parent -AV&R Vision & Robotics

    Christian Marchand - AV&R Vision and Robotics Inc.

    Jean-Franois Bergeron - AV&R Vision and Robotics Inc.

    Glass is the main material used in the fabrication of lighting components. In the fabrication of reflectors and lenses, the process requires glass, melted at a high temperature, to give

    the final product shape. The lamp must be functional but also exempt from aesthetic defects that could influence the confidence of the end user in the product quality. In this case

    study, we present a network of four inspection processors linked to a centralized statistical analysis database performing the quality inspection of reflectors and lenses after the

    melted glass pressing.

    System Architecture

    When inspecting the products, our configuration divides the products into two major families: lenses and reflectors. For each of these families, the fabrication process is the same.

    We send an incandescent glass puck to a mold to be pressed to give the final shape to the glass piece. During the glass preparation process and the pressing process, problems can

    occur. The defects created could include foreign components embedded in the glass (like rocks or gas bubbles), wrong part dimensions, cracks, or locally missing material at the

    outer diameter of the parts. Some of these defects, like missing material at the circumference, can create leaks between the lens and the reflector when they are sealed together. The

    customers primary need was to avoid these kinds of defects at the presses.

    We at AV&R selected a PC-based system architecture. The advantage of such a solution is the flexibility for future improvements anticipated by the customer, based on the results

    from the actual inspection system. We achieved this flexibility using the National Instruments software library and toolkits. Our entire system network consists of four inspection

    computers connected via Ethernet to a fifth computer, which acts as a central statistical analysis engine and database.

    We used Prosilica GC1280 GigE Vision cameras for image acquisition. We selected the Ethernet protocol because of its robustness even when a highly electronic noise was emitted

    by the powerful glass induction oven. The enabled communication between the software and the cameras, and we created the image inspection routineNI-IMAQdx driver softwareusing the NI vision library. We manage the inspection results for the following two purposes: 1) we send the pass/fail result using an to theNI PCI-6514 digital I/O interface

    customer-line programmable logic controller (PLC) for rejection of defective parts, and 2) we send the inspection data via Ethernet to the statistical database computer for monitoring.

    In machine vision applications, we usually need to control all factors, such as acquisition devices and lighting, to ensure maximum performance. In this application, the product to

    inspect generates its own light because the glass is incandescent. As long as the glass temperature is controlled enough to stay in the cameras dynamic range, normalization of the

    image ensures enough product intensity stability to avoid external light sources in this rough environment. But these high-temperature conditions (as high as 160 F in summer)

    necessitate protection of the acquisition equipment. We must protect the camera with an enclosure and cool it down using a Venturi device working with compressed air. A security

    feedback device generates an alarm if the cooling system is not working properly, avoiding any deterioration of the equipment.

    Flexibility

    In this application, users must consider a large quantity of different products. Some differences between products could be as major as the product type (reflector versus lens) or the

    pattern embedded in the glass. We developed a solution that is configurable for any type of product with any kind of pattern. The challenge is in the generic capability of the learning

    procedure to cover all product types.

    Using the vast capabilities of the in the design of high-level graphical interfaces, we developed a complex interface for productNI LabVIEW graphical programming environment

    configuration, taking into account all common features. Hence, our system must detect and localize circular features, which are involved in all products. We developed referencing

    capabilities to anchor sequenced inspections and established regions with different detection and acceptance criteria based on the found features. We also had to design the learninginterface to be a small, configurable machine vision system in and of itself.

    For the defects in the embedded patterns, we developed our strategy to extract the defects from the normal pattern. Frequency analysis using 2D fast Fourier transform (FFT) tools

    demonstrates the capability to discriminate the information of the defect from the background signature.

    Data Monitoring

    We send the inspection results to a rejection station and a statistical processing tool to monitor the inspection performance and evaluate the trends in system efficiency and

    shrinkage. We then have some feedback in a dedicated computer, linked via Ethernet to the four inspection stations at the presses. We developed this functionality with the LabVIEW

    . The database uses MySQL. We designed the statistical analysis interface to show the systems efficiency and defect detail for a user-defined timeDatabase Connectivity Toolkit

    period. This functionality gives information to the user for correlation between production events and system capability.

    With this architecture, our configuration rejects the bad parts and the inspection system ensures that all the parts continuing in the fabrication process are compliant with the

    customer quality criteria. Performing such inspection and quality sorting directly at the press stage ensures that the customer does not continue adding value to a bad product.

    Another advantage of the inspection at this process stage is to give some live feedback to the operators during the process tuning. Finally, the central statistical analysis shows a

    general snapshot of the overall production performance.

    "Using the vast capabilities of the NI LabVIEW graphical programming

    environment in the design of high-level graphical interfaces, we

    developed a complex interface for product configuration, taking into

    account all common features. "- Sbastien Parent,AV&R Vision & Robotics

    The Challenge:

    Developing a machine vision system for the lighting industry to inspect formed, incandescent glass for production quality from a

    centralized computer for various product types (lenses and reflectors) with the same algorithms on four different production lines.

    The Solution:

    Implementing a system using a high-level learning procedure on each production line that has a computer with cameras, and

    sending the results of each line via Ethernet to a central computer for monitoring.

    A PC-Based Architecture of the Inspection

    System with Four Inspection Stations and One

    Statistical Analysis Station

    http://www.avr-vr.com/http://sine.ni.com/nips/cds/view/p/lang/en/nid/12892http://sine.ni.com/nips/cds/view/p/lang/en/nid/13575http://www.ni.com/labview/http://sine.ni.com/nips/cds/view/p/lang/en/nid/6429http://sine.ni.com/nips/cds/view/p/lang/en/nid/6429http://www.avr-vr.com/http://www.avr-vr.com/http://sine.ni.com/nips/cds/view/p/lang/en/nid/6429http://sine.ni.com/nips/cds/view/p/lang/en/nid/6429http://www.ni.com/labview/http://sine.ni.com/nips/cds/view/p/lang/en/nid/13575http://sine.ni.com/nips/cds/view/p/lang/en/nid/12892http://www.avr-vr.com/
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    Author Information:

    Sbastien Parent

    AV&R Vision & Robotics

    269 Prince

    Montreal H3C2N4

    Canada

    Tel: (514)-788-1420

    Fax: (514)-866-5830

    [email protected]

    A PC-Based Architecture of the Inspection System with Four Inspection Stations and One Statistical Analysis Station

    http://www.avr-vr.com/http://www.avr-vr.com/
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    We designed the learning interface as a small machine vision environment, configurable to consider all product types.

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    Lens with a Defect through the Normal Pattern

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    Defect Found through the Normal Pattern with the Developed Software

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