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NAUT Non-contact Air coupled Ultrasonic Testing) 1.Ultra High Power Ultrasonic Pulser & Receiver (1) Pulser: Square pulse wave, square burst waves, square chirp waves (2) Variable for voltage, wave numbers & frequency (3) Receiver band area : Broad band (4) Filter: Analogue filter, digital filter 2.Data Treatment Processing Equipment (1) Image pattern Processing A Scope : Receiving wave form, Full rectified wave, half rectified wave (positive). half rectified wave(negative) B Scope : Echo height envelope curve display(linked with specified cursor area ) C Scope: Plane projection picture, cylindrical plane surface picture (2) Color Gradation Display Color gradation RYB256, black & white 256 gradation (linked with slide bar threshold) and binarization (3) Other function 1) Enlargement (enlargement area specified by cursor) 2) Dimension measurement function (B, C scope) 3) Cursor position moving (automatic scanning specified area of probe by cursor on Cscope ) 4) Precise inspection mode for specified area by cursor 5) Rejected area calculation 6) Frequency analysis (FFT) 7) Others 3.Mechanical parts (1) Scanner: X-Y axis, θ-Z axis(rotation) (2) Scan Speed : Variable (3 ) Inspection pitch : variable We will design & manufacture to meet customer specification for mechanical parts & data processing and so on. Non Contact Air Coupled Ultrasonic Inspection Equipment 1-1-14 Nakamura-cho, Minami-ku, Yokohama, 232-0033 JAPAN TEL: +81-045-242-0531 FAX: +81-045-242-0541 http : //www.jp-probe.com E-mail:[email protected] The Latest Advanced Technology for Aiming of Future Japan Probe Co, Ltd NAUT21 Specification NAUT21 NAUT21-R Non Couplant Non Contact Inspection Patent number 4903032 Japan Probe Co, Ltd ジャパンプローブエアスキャナNAUT21(英).indd 1 2014/06/19 18:20:08

NAUT21 Non Contact Air Coupled Ultrasonic Inspection ... Scanner NAUT21.pdfInspection Ultrasonic specimen Reflection method Transmitter Transmitter Transmitter & receiving probe V

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Page 1: NAUT21 Non Contact Air Coupled Ultrasonic Inspection ... Scanner NAUT21.pdfInspection Ultrasonic specimen Reflection method Transmitter Transmitter Transmitter & receiving probe V

NAUT (Non-contact Air coupled Ultrasonic Testing)

1.Ultra High Power Ultrasonic Pulser & Receiver(1) Pulser: Square pulse wave, square burst waves, square chirp waves

(2) Variable for voltage, wave numbers & frequency

(3) Receiver band area : Broad band

(4) Filter: Analogue filter, digital filter

2.Data Treatment Processing Equipment(1) Image pattern Processing

A Scope : Receiving wave form, Full rectified wave, half rectified wave (positive). half rectified wave(negative)

B Scope : Echo height envelope curve display(linked with specified cursor area ) C Scope: Plane projection picture, cylindrical plane surface picture

(2) Color Gradation DisplayColor gradation RYB256, black & white 256 gradation (linked with slide bar threshold) and binarization

(3) Other function1) Enlargement (enlargement area specified by cursor)2) Dimension measurement function (B, C scope)3) Cursor position moving (automatic scanning specified area of probe by cursor on

Cscope )4) Precise inspection mode for specified area by cursor 5) Rejected area calculation 6) Frequency analysis (FFT)7) Others

3.Mechanical parts(1) Scanner: X-Y axis, θ-Z axis(rotation)

(2) Scan Speed : Variable

(3 ) Inspection pitch : variable

We will design & manufacture to meet customer specification for mechanical parts & data processing and so on.

Non Contact Air Coupled Ultrasonic Inspection Equipment

1-1-14 Nakamura-cho, Minami-ku,Yokohama, 232-0033 JAPANTEL: +81-045-242-0531 FAX: +81-045-242-0541

http://www.jp-probe.com E-mail:[email protected]

The Latest Advanced Technology for Aiming of Future

Japan Probe Co, Ltd

NAUT21 Specification

NAUT21

NAUT21-R

Non Couplant Non Contact InspectionPatent number 4903032

Japan Probe Co, Ltd

ジャパンプローブエアスキャナNAUT21(英).indd 1 2014/06/19 18:20:08

Page 2: NAUT21 Non Contact Air Coupled Ultrasonic Inspection ... Scanner NAUT21.pdfInspection Ultrasonic specimen Reflection method Transmitter Transmitter Transmitter & receiving probe V

Distribution image pattern of electrolyte solution(comparison of X ray & ultrasonic method)

Image pattern of de・lamination

Lithium ion extractionImage pattern of simulated air layer

X ray inspection image pattern

NAUT21 Image inspection pattern

Simulated defects

Round simulated defects

Small de・lamination

Large de・lamination

Small de・lamination Large de・lamination

AirCoupledInspection&Availableformeasuring �

Inspection Method

System

Application

Inspection Measurement Example

This is the latest technology of non contact air coupled ultrasonic testing method developed by Japan Probe. This is the image pattern processing system displaying A, B & C Scope.

1. Ultrasonic pulser & receiver

2. Data treatment processing equipment

3. Air probes

4. Outside pre-amplifier

5. Mechanical Parts

6. PC

● Inspection of CFRP, GFRP & other composite materials

● Inspection of metal, wood, rubber ● Sparkle polystyrene’s inspection ● Coating inspection● Inspection of gluing part & joint part ● Inspection of semi sintering● Lithium ion cell battery’s inspection

● Inspection of automobile parts such as brake pads

● Inspection of car wheel, hoists, brake shoes

● Inspection of ceramic materials● Inspection of defects in pipes,

measurement of length & thickness ● Others

Transmissionmethod

Receiving probe

Ultrasonic

Ultrasonic

UltrasonicInspectionspecimen

Reflectionmethod

Reflectionmethod

Transmitter Transmitter Transmitter &receiving probe

ReflectionmethodVtransmissionmethod

【Air probe】【System construction】

Flat type

Line focused probe Point focused probe

【CFRP】carbon fiber reinforced plastic

◦Inspection of inside defects & de・lamination【GFRP】

grass fiber reinforced plastic◦ Inspection of inside defects &

de・lamination

【Lithium ion cell battery’s inspection】◦Measurement of distribution for electrolyte solution & air layer, estimation of ion extraction, laminate film inspection

【Brake pads for cars】◦Inspection of crack & void (air layer)

【Gluing surface of acrylic resin】◦Inspection of bad gluing

Flat, line focused, point focused probe & other kinds of probes are prepared for many applications.

Image pattern picture

Image pattern picture of impact defect

Image pattern picture of artificial thunder defect specimen

Image pattern picture of specimen after tension

Round simulated defects

Impact de・lamination

De

・lamination(blue color)

Hole(red color)

de・lamination

Optical image pattern Inspection pattern of NAUT21

Round defect(void)

【Surface measurement】←Scanning→(Point focused probe)

Defect

Convex surface

Test specimen

Point focused probe

Focused beam

defect depth0.2mm0.3mm 0.1mm

Impossible to measure electrolyte solution distribution

Receiving probe

Penetration of electrolyte solution

Lithium ion extraction

Convex surface

Inspection image picture of small surface defect

Image pattern picture of surface shape

de・lamination

ジャパンプローブエアスキャナNAUT21(英).indd 2 2014/06/19 18:20:09