MX2 Training Program 04B Phased Array Probes

8/19/2019 MX2 Training Program 04B Phased Array Probes

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Phased Array Probes

OmniScan MX2 Training Program


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OmniScan MX2 Training – Phased Array Probes Overview

Material in this section of the MX2 training program is a summary ofphased array probes typical used in OmniScan MX2 applications. The

information is taken primarily from of the Olympus probe catalog and

Olympus technical resources and is intended to provide an overvie of the

various features that optimi!e individual applications.


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OmniScan MX2 Training – Phased Array Probes Overview cont.

Phased array probes come in a variety of shapes and si!es for different

applications. The most common types are listed belo. Typical array probes from Olympus have a fre"uency range beteen #$

#% M&! and have beteen '$2() elements.

There are * primary #+ probe types for use ith OmniScan MX2,

#. Angle beam probes.

2. -urved probes.%. mmersion/Straight beam probes.

*. ntegrated edge probes.


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OmniScan MX2 Training – Phased Array Probes Overview cont.

#+ 0inear array probes are the most idely used for industrial

inspection and the only type that is supported directly in the OmniScanMX2 softare 1i!ards3.

Phased array probes other than #+ linear must use focal las

generated from an e4ternal calculator for import into MX2.


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OmniScan MX2 Training – 1D Linear Probes Deinition

#+ linear array probes are defined by the folloing parameters.

5 Si!e or 6Pitch7 of the elements. 1.2($2mm3 5 8umber of elements. 1'9 #)9 %29 )*9 #2'9 2()3

5 :re"uency. 1#$#; M&!3

5


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OmniScan MX2 Training – 1D Linear Probe !"ement Parameters

The dimensional parameters of a #+ linear phased array probe are

defined as follos,

A = Aperture. Total length of all elements in active plane. 1Pitch X

element count3& = >lement height in the passive plane. Also called element elevation.

P = Pitch. -enter to center distance beteen to ad?acent elements.

> = Si!e. The idth of an individual element.

@ = @ap. The spacing beteen to ad?acent elements.


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OmniScan MX2 Training – 1D Linear Probe !"ement Parameters cont.

The OmniScan MX2 focal la calculator re"uires only the pitch for

generation of focal las. The OmniScan MX2 probe database re"uires pitch and total elements to

prevent programation errors by the operator.

The number of elements for # focal la and the total number of elements

available on the probe are directly related to the instrument configuration.

1#),#)9 #),)*9 %2,#2'9 etc3 This is covered in a later section.

A = Aperture. Total length of all elements in active plane. 1Pitch X

element count3

P = Pitch. -enter to center distance beteen to ad?acent elements.


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OmniScan MX2 Training – 1D Linear Probes # Pitch

The pitch of the probe is directly related to the ma4imum si!e or 6Aperture 6 of the

beam based on the available pulsers on the OmniScan MX2 ac"uisition module.1#),)*9 %2,%29 etc3

elo are to lo fre"uency deep penetration probes that differ in both pitch and

total number of elements. 1A* and A(3

Only a %2,XXX ac"uisition module can utili!e all %2 elements of the A( probe for a

sector scan. More elements of a smaller si!e increase beam steering limits9

energy9 and focusing. 1%2X .;(mm = 2*mm aperture3

A #),XXX ac"uisition module can create a larger aperture using the A* probe

because the pitch is larger. 0arger element pitch reduces beam steering. :eer

elements reduces focus. 1#)X 2mm = %2mm3

A$ A%


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OmniScan MX2 Training – 1D Linear Probes – Pitch cont.

Most probeBedge combinations for angle

beam inspection are designed for asteering range of appro4imately %C$;C

degrees.

As the si!e of the element pitch is

reduced9 beam steering is improved.

+efining the limits of any probeBedgecombination ith respect to beam steering

is dependent on many factors including

sound path re"uired for the application9

si!e of reflector9 and hat is an acceptable

A$scan signal to noise ratio for any onecustomer.

:or this reason9 the OmniScan MX2

softare does not attempt to limit or

predict acceptable steering limits in the

softare.


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OmniScan MX2 Training – 1D Linear Probe !"ement &dentiication

#+ linear array probes have elements aligned in one a4is and are

numbered #$#)9 #$%29 etc so the element iring direction is knon to theuser and the probe can be installed correctly in the system or on the

edge.

Some Olympus probes have an arro to indicate the direction of element

iring and no numbers are present.

The probe element iring can be reversed in the softare. This is afunction of the edge orientation and is e4plained in another section.


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OmniScan MX2 Training – 1D Linear Probes – Tota" !"ements

The total number of elements on one or more probes that can be used ith the

OmniScan MX2 or any phased array system is dependent on the ac"uisitionmodule configuration 1XX,#2'9 XX,)*9 XX,%29 etc3 and available probe adapters or

splitters. The second of the to numbers is relevant for total element utili!ation.

>4ample #, The image belo is of a single %2 element phased array probe using

one sector scan group. The minimum module configuration to perform this

inspection using all elements ould be a %2,%2 module. A #),XXX instrument using

the same probe is capable of only D the ma4imum aperture and ould only utili!ethe first #) of the available %2 elements.


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OmniScan MX2 Training – 1D Linear Probes – Tota" !"ements

>4ample 2, The image belo is of a scanner ith to (0)*$A2 probes. >ach probe

contains )* elements re"uiring a module configuration of XX,#2'. A #),#2' ac"uisition module can fully utili!e both probes. Any one A$scan or focal

la ould have a ma4imum aperture of E.)mm 1#) X .)mm3

A %2,#2' ac"uisition module can fully utili!e both probes. Any one A$scan or focal

la ould have a ma4imum aperture of #E.2mm 1%2 X .)mm3


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OmniScan MX2 Training – 1D Linear Probes # 're()ency Most ultrasonic fla detection is performed ith probe fre"uencies

beteen 2$#CM&! although manufacturing is available from #$#;M&!.

As ith conventional probes9 fre"uency selection is a compromise beteen

resolutionBsensitivity and penetration.

The probe fre"uency has a significant affect on the near field length that is

directly related to ma4imum focal length of the probe.

0oer fre"uency probes provide better penetration and are necessary onmaterials like SS%C* and SS%#).

Although fre"uency is not an essential element of the focal la calculator9

hen probe fre"uency is knon by the softare the filters and pulse idth

can be automatically set and ma4 focusing from near field calculation

knon.


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OmniScan MX2 Training – 1D Linear Probes – &nterna" *adi)s

The addition of an inner radius curvature to the #+ linear array combines

mechanical beam focusing in the passive a4is ith phased array beam steering andfocusing in the active a4is.

nternally focused probes are becoming more idely used9 especially for pipeline

and small diameter piping inspections.

A c t i v

e a + i s

Passive a+is


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OmniScan MX2 Training – 1D Linear Probes – &nterna" *adi)s cont.

The primary benefit of the internally focused array is to improve length si!ing on

the -$scan. :or girth eld inspection in the a4ial a4is9 the smaller the diameter of the pipe9 the

greater the distortion of reflected sound from the curved pipe surface resulting in

the over si!ing of defects on the -$scan and $scan. 10ength si!ing3

The -obra9 Pipe i!ard9 in$line manufacturing9 and other inspections systems use

mechanically focused probes for improved results.

,#scan "ength si-ing with "at 1D robe.

,#scan "ength si-ing with interna" radi)s oc)sed 1D robe.


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OmniScan MX2 Training –– O"ym)s Probe Deinition

The Olympus probe definition is belo and can be found in the current Olympus

probe catalog.


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OmniScan MX2 Training –– O"ym)s Probe /o)sings

Olympus probes are sold ith common housings to minimi!e the amount of

edges and accessories. elo is pictured a standard (0)*$A2 probe that uses the same housing as the

2.2(0)*$A2. All A2 probes are compatible ith A2 edges and are listed in the

OmniScan MX2 database independently to account for different pitch and

position.


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OmniScan MX2 Training – O"ym)s Probe ,ab"e Otions

Olympus phased array probes are not consumables and have a very lo fail rate.

-able lengths come in standard 2.( and ( meters lengths. -ustom cable lengths available.

-ommon sources of failure due to misuse and abuse are the cable and cable

connection to the housing. -are should be taken not to bend it e4cessively beyond

EC degrees or allo e4cessive eight on the cable.

+ue to the number of micro solder connections and coa4ial cables9 probe cablescannot easily be repaired.

-ables for most probe models are available ith optional armor shielding.


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OmniScan MX2 Training – Probe Management in MX2 Sotware

The OmniScan MX2 has options for both single or multiple phased array probe

inspections but only one standard #2' pin connector on the instrument. :or multi$probe phased array inspections a F splitter or adapter is re"uired to split

the #2' connector into to separate connectors.

1#0$

0%#12

12312

12312


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OmniScan MX2 Training – Probe Management in the MX2 Sotware cont.

n addition to multi$probe phased array inspection these accessories also support

conventional GT inspections by using pulsers from the #2' element phased array

connector or a dedicated lemo or 8- connector on the instrument.

These are necessary for a variety of both dedicated and complimentary conventional

GT applications including TO:+.

This hardare is e4plained in detail in a later section and can be found in the

Olympus industrial scanners catalog.


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OmniScan MX2 Training –– 4niversa" Probes or )se with MX2

Gniversal probes such as A#C9 A##9 A#29 And

A#* are designed for hand scanning or

automated inspections for a ide range of

applications including eld inspection and

corrosion monitoring.

Pitch and fre"uency makes these probes ideal

for thicknesses in carbon steel up to #CCmmH

for ne construction and in$service inspection. Specific scanner adapters for automated

inspections and lo profile edges to reduce

the need for diameter contouring and improve

stability.

*Depending on acquisition module i.e. 32:128


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OmniScan MX2 Training –– Sma"" 'ootrint Probes or )se with MX2

Small footprint and access probes such

as the ACC9 AC9 A#( and 8#B2B% aredesigned for confined areas and difficult

access inspections.

Special small footprint edges ith lo

profile attachment points.

-ustom probe direction for e4it from side

or top. 1AC only3

Typical applications include aerospace

inspections and composite inspections

here near all coverage is re"uired.


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OmniScan MX2 Training –– Dee Penetration Probes or )se with MX2

+eep penetration probes such as the

A%9 A*9 and A( are designed forheavy all inspections and coarsegrain materials.

Typical applications include theinspection of large plates9 castings9and forgings here ma4imum

penetration and poer is needed. 0arge element pitch and elevation ith

lo fre"uency options make the deeppenetration probes ideal for stainlesssteel and course grain materialinspection over long sound paths.


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OmniScan MX2 Training –– Pie"ine 5e"d Probes or )se with MX2

Pipe i!ard probes such as thePI series are the orkhorse ofthe Olympus pipeline phased arraysystems.

Typical applications include highspeed precision inspection using!one discrimination and amplitudetechni"ues on pipeline girth elds.

Suitable for manual and automatedinspections.

Speciali!ed edges used ith thePI include carbide ear pins andsophisticated irrigation channels.

nternal radius focusing for

improved length si!ing of pipelineflas. 1Sharp -$scan and $scan3

Short cable and front cable e4itavailable for scanneraccommodation.

%L62#P576 robe )sed or insection o inch X 28mm iing.


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OmniScan MX2 Training – Sma"" Diameter ,,!9 Piing Probes # ,obra

Probes for the Olympus -obra

scanner and other tight clearance

scanners are optimi!ed for the

small piping diameter inspection.

The Olympus -->J probes have

an internal radius of %(mm and

are suitable for thickness range of

appro4imately *$2(mm. &ave a lo profile element design

and hen used ith the Olympus

-obra scanner system need only

#2mm pipe to pipe clearance.

Are available in a range of

fre"uencies for carbon steel andaustenitic material inspection.

%L10,,!9#A1% or insection o %mmX8mm SS68$ iing.


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OmniScan MX2 Training # &mmersion Probes or )se with MX2

Olympus immersion probes are designed

to be used ith a ater edge or in animmersion tank.

Typical application include thin plate or

tubing inspection9 composite inspection9

inline thickness testing9 and any

immersion application.

They are longitudinal ave probes that

can be set up for refracted angle shear

ave inspections using a edge or ater.

Acoustic impedance matches ater.

0inear scanning allo coverage of %C$

ECmm in one line.

-orrosion resistant steel casing and

aterproof up to #meter under ater.


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OmniScan MX2 Training – 1D Linear Power Piing ,rac: Si-ing Probes

+esigned to be used ith the OmniScan MX29

Olympus offers * different housing types ithcompatible edges for shear and longitudinal

ave inspection of stainless and carbon steel

poer piping.

#.( $ ( M&! :re"uency and a range of pitch and

apertures for manual crack detection and si!ing.

Small footprint edges and ergonomic probecasings for hand scanning and access in small

spaces and on small diameters for precision

measurement.

SS%C* 2mm S+& depth of %'mm SS%C* 2mm S+& depth of )mm SS%C* + notch $ )'mm X %% inch diameter.


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OmniScan MX2 Training – D)a" Matri+ Array ;T*L< Probes

+ual matri4 arrays or 6T


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$#( Ske C Ske K#( Ske

OmniScan MX2 Training –– D)a" Matri+ Array ;T*L< Probes cont.

+esigned for longitudinal inspection ith a steering range of

%C$'C degrees and capable of a beam ske of K/$ 2C degreesfrom the center of the probe.

0o fre"uency 1#.( M&!3 for ma4imum penetration of difficult

materials like spun cast stainless steels and inconel.


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OmniScan MX2 Training –– 2D Matri+ Array Probes

2+ matri4 arrays allo off a4is beam ske up to EC degrees.

2D array insection o cree damage in /A7 o we"d.


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OmniScan MX2 Training –– 2D Matri+ Array Probes cont.

&D ?otch detected at @8 degree beam s:ew

&D ?otch detected at 08 degree beam s:ew

&D ?otch detected at 8 degree beam s:ew

8 degree

08 degrees

@8 degrees


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OmniScan Probe Man)act)ring – Probe ,ata"og

Presented in this training is only a sample of Olympus probe manufacturing

capability. The complete Olympus probe catalog9 probe specific information and

application notes can found on the Olympus eb site at .olympus$ims.com


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OmniScan MX2 Training – O"ym)s Probe Seciication ,onormance

Olympus probes are delivered from the factory

ith a specification sheet that includes test

parameters9 test results9 and acceptance criteria

for the folloing parameters, Median aveform.

Median aveform ::T.

$)d center fre"uency average.

$) d percent bandidth.

Peak to peak sensitivity.

$2C d pulse idth.

$*C d pulse idth.


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MX2 Training – Probe Sec ,onormance – Median 5aveorm

The median aveform graph displays a typical median pulse$echo response

from the test target from one element. &alf of the return pulses from the probe

elements ill have a peak 5 peak voltage greater than or e"ual to the median

element 1%( belo3. The other half ill have a smaller value.


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MX2 Training – Probe Sec ,onormance – Median 5aveorm ''T

The median aveform ::T graph shos the calculated spectrum for the median

aveform over a range of !ero M&! to tice the probes fre"uency for #

representative element that represents the median curve.


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MX2 Training – Probe Sec ,onormance #0 d ,enter 're( Average

The $) d center fre"uency bar graph displays a calculated center fre"uency

value for each of the probeLs elements spectrum 1::T3 data at the $) d level.

The average value of all the probeLs elements is displayed at the top of the

graph.


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MX2 Training – Probe Sec ,onormance #0 d B andwidth

The $) d bandidth bar graph displays a calculated percent bandidth value

for each of the probeLs elements. This value is determined by using the length

1n fre"uency3 of an imaginary line intersecting a given elementLs spectrum

1::T3 data at the $) d level. The average value of all the probeLs elements is

displayed at the top of the graph.


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MX2 Training – Probe Sec ,onormance – Pea: to Pea: Sensitivity

The peak to peak sensitivity bar graph displays a value for each of the probeLs

elements representing the sensitivity of the probe. This value is calculated by

using the magnitude of the e4citation test pulse sent to each element and the

peak to peak voltage measurement of that elementLs pulse echo return from the

test target. The reported value is $2C multiplied by the log of the ratio of these

to magnitudes. The average value of all the probeLs elements is displayed at

the top of the graph.


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MX2 Training – Probe Sec ,onormance – P)"se 5idth

The various pulse idth bar graphs display values representing the a4ial resolution of

the elements pulse echo returns at various levels such as $2C d9 $%C d9 and $*C

d. These values are calculated by measuring the return pulses idth in

nanoseconds at the desired level. A4ial resolution is an important measure of the

ability to distinguish individual pulse returns from one another during normal probe

operation. The average value of all the probeLs elements is displayed at the top of

the graph.


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OmniScan MX2 Training – 1D Linear Probes – Dead !"ements

A dead element refers to a dead ultrasonic channel. The OmniScan MX2 uses

modules that can have %29 )*9 or #2' channels meaning they could support a probe

ith the same amount of elements.

-ause of dead elements or channels is in the array housing9 the probe side

connector9 the cable9 the instrument side connector9 or a pulser in the instrument.

ater intrusion9 e4cessive voltage9 cable damage9 etc can result in dead elements.

+ead elements can have an adverse effect on beam formation. A procedure or the

ability to calibrate or achieve satisfactory A$scan is hat determines the limit. >lements and pulsers are checked by programming a single focal la or A$scan for

each individual element in the probe and visuali!ing the S$scan. This allos both

the elements of the probe9 the cable9 and the instrument pulsers to be verified.


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OmniScan MX2 Training – O"ym)s Probe 5arranty

Olympus guarantees probes for one year against material and manufacturingdefects. The complete probe arranty is available on the probe specificationssheets and the Olympus probe catalog.


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OmniScan Probe Man)act)ring 'aci"ity – State ,o""ege3 PA

Olympus probe shop is a ;CCC S" :t state of

the art manufacturing facility located in State

-ollege9 PA.

ith over %C employees utili!ing the latest

pie!ocomposite technology the Olympus probe

shop are orld leaders in standard off the shelf

probes and custom comple4 matri4 arrays.


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OmniScan Probe Man)act)ring 'aci"ity – State ,o""ege3 PA cont.

Streamed lined design and production engineering for reduced lead times and cost.

ndustry leading "uality standards. -ustom probe accommodation and engineering assistance for application

development.

Production super cells for lean manufacturing.

Olympus global sales distribution netork and support centers.


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OmniScan MX2 Training – Probe Management in MX2 Sotware

Olympus probes are delivered ith a proprietary connector that contains a chip for

auto detection of probe model and parameters in the OmniScan MX2 softare.

Probes can also be manually selected from an editable database of all common

Olympus probe models.

:or multi$probe inspection auto probe detect must be off and the probes selected

manually from the database.


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OmniScan MX2 Training – Probe Management in MX2 Sotware cont.

The probe sub menu in the OmniScan MX2 softare is available in to places,

#. The group set up i!ard.

2. The group probe and part sub menu.

hen probe auto detect is on the probe selection is disabled and all probe

parameters are available based from the chip in the probe.

ith auto detect off the probe selection is enabled and the probe may be selected

manually or created and saved in the OmniScan MX2 softare.


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OmniScan MX2 Training – Phased Array ,a"c)"ator *eview

Nuestion,

hat are the essential parameters of #+ linear arrayprobe that are re"uired by the OmniScan MX2 softare

#. Probe model number.

2. >lement pitch.%. >lement "uantity.

*.


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OmniScan MX2 Training – Phased Array ,a"c)"ator *eview

Nuestion,

hat are the essential parameters for the phased

array calculator

#. Probe parameters.

2. edge parameters.%. Material Jelocity

*. eam :ormation.

Anser, All of the above.


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Documents

MX2 Training Program 04B Phased Array Probes