Upload
chuong
View
214
Download
0
Embed Size (px)
Citation preview
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
1/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 -
Lecture 20. Electrical Properties
Learning Objectives After this lecture, you should be able to do the following:
1. Describe intrinsic and extrinsic semiconductors (n-type and p-type
semiconductors) with their energy band structures.
2. Understand the conductivity in semiconductors.
Reading
• Chapter 18: Electrical Properties (18.10–15)
Multimedia• Virtual Materials Science & Engineering (VMSE):
http://www.wiley.com/college/callister/CL_EWSTU01031_S/vmse/
1
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
2/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
1. Semiconductors
(Intrinsic Semiconductors)
2
• Intrinsic semiconductors : the electrical behavior is based on the electronic structure
inherent in the pure material.
• They have a completely filled valence band, separated from an empty conduction band
by a relatively narrow band gap (< 2 eV) at 0 K:• Elemental semiconductors: silicon (Si) and germanium (Ge) have band gap energies of
approximately 1.1 and 0.7 eV.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
3/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 - 3
Charge Carriers in Semiconductors:
Concept of a Hole
Two types of electronic charge carriers:
Free Electron – negative charge (-1.6 X 10-19 C)
– in conduction band
Hole – positive charge (+1.6 X 10-19 C):same magnitude as that for anelectron, but of opposite sign – vacant electron state in
the valence band
Move at different speeds - drift velocities
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
4/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Conduction in Semiconductors
4
• To become free electrons, electrons must be promoted across the energy band gap and
into empty states at the bottom of the conduction band.
• The excitation energy is from a nonelectrical source such as heat or light.
• Thermal excitation: The number of electrons excited thermally (by heat energy) into the
conduction band depends on the energy band gap width as well as temperature.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
5/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 5
Energy Band Structures:
Insulators & Semiconductors• Insulators:
-- wide band gap (> 2 eV)
-- few electrons excitedacross band gap
Energy
filledband
filledvalence
band
f i l l e d s t a
t e s
GAP
empty
bandconduction
• Semiconductors:-- narrow band gap (< 2 eV)
-- more electrons excitedacross band gap
Energy
filledband
filledvalence
band
f i l l e d s t a
t e s
GAP?
empty
bandconduction
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
6/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Conduction in Intrinsic
Semiconductors
6
Electron bonding model of
electrical conduction in intrinsic
silicon: (a) before excitation, (b)and (c ) after excitation (the
subsequent free-electron and
hole motions in response to an
external electric field).
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
7/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 7
Intrinsic Semiconduction in Terms of
Electron and Hole Migration
electric field electric field electric field
• Electrical Conductivity given by:
# electrons/m
3 electron mobility
# holes/m3
hole mobility
• Concept of electrons and holes:
+-
electron holepair creation
+-
no applied applied
valence
electron Si atom
applied
electron holepair migration
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
8/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 8
Number of Charge Carriers
Intrinsic Conductivity
For GaAs ni = 4.8 x 1024 m-3
For Si ni = 1.3 x 1016 m-3
• Ex: GaAs
• for intrinsic semiconductor n = p = ni
σ = ni |e|( μ e + μ h)
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
9/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 - 9
Intrinsic Semiconductors:
Conductivity vs T• Data for Pure Silicon:
-- σ increases with T
-- opposite to metals
Adapted from Fig. 18.16,Callister & Rethwisch 9e.
material
Si
Ge
GaPCdS
band gap (eV)
1.11
0.67
2.252.40
Selected values from Table 18.3,
Callister & Rethwisch 9e.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
10/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 10
Intrinsic Semiconductors
• Pure material semiconductors: silicon (Si) &
germanium (Ge); Band gaps: 1.1 eV and 0.67 eV
– Group IVA materials• Compound semiconductors
– III-V compounds
• Ex: GaAs & InSb; 1.42 eV, 0.17 eV
– II-VI compounds
• Ex: CdS & ZnTe; 2.40 eV, 2.4 eV
– The wider the electronegativity difference between
the elements the wider the energy gap.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
11/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 - 11
The Periodic Table• Columns: Similar Valence Structure
Adapted fromFig. 2.8,
Callister &
Rethwisch 9e.
Electropositive elements:
Readily give up electrons
to become + ions.
Electronegative elements:
Readily acquire electrons
to become - ions.
g i v e
u p 1 e -
g i v e u
p 2 e -
g
i v e u p 3 e -
i n e r t g a s e s
a c c e p
t 1 e -
a c c e p
t 2 e -
O
Se
Te
Po At
I
Br
He
Ne
Ar
Kr
Xe
Rn
F
ClS
Li Be
H
Na Mg
BaCs
RaFr
CaK Sc
Sr Rb Y
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
12/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Table 18.3: Electrical Properties of
Semiconductors
12
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
13/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
2. Extrinsic Semiconductors
13
• Extrinsic semiconductors : the electrical behavior is determined by impurities.
• An impurity concentration of one atom in 1012 is sufficient to render silicon extrinsic at
room temperature (semiconductor devices: doping with dopants).
n-Type semiconductors p-Type semiconductors
Dopant (donor) : P, As, and Sb Dopant (acceptor) : P, As, and Sb
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
14/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
n-Type semiconductors: Electron
Energy Band Structure
14
n >> p
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
15/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
p-Type semiconductors: Electron
Energy Band Structure
15
p >> n
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
16/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 16
• Intrinsic:-- case for pure Si
-- # electrons = # holes (n = p)
• Extrinsic:-- electrical behavior is determined by presence of impuritiesthat introduce excess electrons or holes
-- n ≠ p
Intrinsic vs Extrinsic Conduction
3+
• p-type Extrinsic: ( p >> n)
no applied
electric field
Boron atom
4+ 4+ 4+ 4+
4+
4+4+4+4+
4+ 4+
hole
• n-type Extrinsic: (n >> p)
no applied
electric field
5+
4+ 4+ 4+ 4+
4+
4+4+4+4+
4+ 4+
Phosphorus atom
valenceelectron
Si atom
conduction
electron
Adapted from Figs. 18.12(a)
& 18.14(a), Callister &Rethwisch 9e.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
17/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Conductivity of Extrinsic
Semiconductors
17
n-Type semiconductors p-Type semiconductors
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
18/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Conductivity: Temperature
Dependence of Carrier Concentration
18
Intrinsic carrier concentration
as a function of temperature
Electron concentration versus
temperature for silicon (n-type)
Solid-state device
operation
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
19/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 19
Extrinsic Semiconductors: Conductivity
vs. Temperature• Data for Doped Silicon:-- σ increases doping
-- reason: imperfection sites
lower the activation energy toproduce mobile electrons.
• Comparison: intrinsic vs
extrinsic conduction...-- extrinsic doping level:1021/m3 of a n-type donor
impurity (such as P).
-- for T < 100 K: "freeze-out“,
thermal energy insufficient toexcite electrons.
-- for 150 K < T < 450 K: "extrinsic"
-- for T >> 450 K: "intrinsic"
Adapted from Fig. 18.17, Callister & Rethwisch
9e. (From S. M. Sze, Semiconductor Devices, Physicsand Technology. Copyright © 1985 by Bell Telephone
Laboratories, Inc. Reprinted by permission of John Wiley
& Sons, Inc.)
C o n d u c
t i o n e l e c t r o n
c o n c e n t r a t i o n ( 1 0 2 1 / m 3 )
T (K)6004002000
0
1
2
3
f
r e e z e - o u t
e x t r i n s i c
i n t r i n s i c
doped
undoped
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
20/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
Conductivity: Factors that Affect
Carrier Mobility
20
1. Dopant content
2. Temperature
Dependence of electron and hole mobilities in silicon as a function of the
dopant (both acceptor and donor) content at room temperature
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
21/27
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
22/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 -
4. Semiconductor Devices
22
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
23/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 - 23
• Allows flow of electrons in one direction only (e.g., usefulto convert alternating current to direct current).
• Processing: diffuse P into one side of a B-doped crystal.
-- No applied potential:
no net current flow.
-- Forward bias: carriers
flow through p-type andn-type regions; holes and
electrons recombine at
p-n junction; current flows.
-- Reverse bias: carriers
flow away from p-n junction;
junction region depleted of
carriers; little current flow.
p-n Rectifying Junction
++++
+-
--- -
p-type n-type
+ -
++ +
++
--
--
-
p-type n-type Adapted fromFig. 18.21,
Callister &
Rethwisch
9e.
+++
+
+
---
--
p-type n-type- +
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
24/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 - 24
Properties of Rectifying Junction
Fig. 18.22, Callister & Rethwisch 9e. Fig. 18.23, Callister & Rethwisch 9e.
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
25/27
MSE 3300 / 5300 UTA Spr ing 2015 Lecture 20 - 25
MOSFET Transistor
Integrated Circuit Device
• Integrated circuits - state of the art ca. 50 nm line width
– ~ 1,000,000,000 components on chip
– chips formed one layer at a time
• MOSFET (metal oxide semiconductor field effect transistor)
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
26/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 -
Summary
1. Semiconductors: intrinsic and extrinsic
semiconductors
2. Band structures of semiconductors3. Conductivity of semiconductors
4. Semiconductor devices
26
8/18/2019 MSE 3300-Lecture Note 20-Chapter 18 Electrical Properties
27/27
MSE 3300 / 5300 UTA Spring 2015 Lecture 20 -
Homework 10
• 18.4, 18.5, 18.8, 18.11, 18.17
• 18.21, 18.25, 18.29, 18.38
* Problems from Callister, 9th Edition
27