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Metrology and Sensing
Lecture 6: Interferometry II
2018-11-20
Herbert Gross
Winter term 2018
2
Schedule Optical Metrology and Sensing 2018
No Date Subject Detailed Content
1 16.10. IntroductionIntroduction, optical measurements, shape measurements, errors,
definition of the meter, sampling theorem
2 17.10. Wave optics Basics, polarization, wave aberrations, PSF, OTF
3 30.10. Sensors Introduction, basic properties, CCDs, filtering, noise
4 09.11. Fringe projection Moire principle, illumination coding, fringe projection, deflectometry
5 13.11. Interferometry I Introduction, interference, types of interferometers, miscellaneous
6 20.11. Interferometry II Examples, interferogram interpretation, fringe evaluation methods
7 27.11. Wavefront sensors Hartmann-Shack WFS, Hartmann method, miscellaneous methods
8 28.11. Geometrical methodsTactile measurement, photogrammetry, triangulation, time of flight,
Scheimpflug setup
9 11.12. Speckle methods Spatial and temporal coherence, speckle, properties, speckle metrology
10 18.12. Holography Introduction, holographic interferometry, applications, miscellaneous
11 08.01.Measurement of basic
system propertiesBssic properties, knife edge, slit scan, MTF measurement
12 15.01. Phase retrieval Introduction, algorithms, practical aspects, accuracy
13 22.01.Metrology of aspheres
and freeformsAspheres, null lens tests, CGH method, freeforms, metrology of freeforms
14 29.01. OCT Principle of OCT, tissue optics, Fourier domain OCT, miscellaneous
15 05.02. Confocal sensors Principle, resolution and PSF, microscopy, chromatical confocal method
3
Content
Interferogram examples
Interpretation of interferograms
Fringe evaluation methods
4
Interferometer
Basic idea:
- compare a reflected perturbed wave with a calibrated (ideal) reference wave
- the energy division determines the contrast
- the fringes of the superposed wave determines the phase differences
- integrating of the gradient field gives the desired wave
Important properties:
- coherent laser illumination
- small cavity length / large common path
- two beam or multiple beam interference
Interferograms of Primary Aberrations
Spherical aberration 1
-1 -0.5 0 +0.5 +1
Defocussing in
Astigmatism 1
Coma 1
5
6
Diffraction Limit
Strehl of 80%
Defocus, spherical, coma, astigmatism
Ref: R. Shack, lecture notes
Perfect lens, tilt and defocus
Spherical aberration with tilt and defocus
Coma, various azimuths
Coma with defocus
Interferograms of Primary Aberrations
6
Astigmatism with tilt in Petzval focus in various
azimuths
Astigmatism with tilt in sagittal focus n various
azimuths
Astigmatism with tilt in tangential focus n various
azimuths
Interferograms of Primary Aberrations
7
9
Multi-Wavelength Interferometer (MWLI)
Different wavelengths:
- large measurement interval
- unique evaluation of distance
Mathematical combination of interferometric signals
Large range of unambiguity
Better accuracy than single wavelength interferometer (better than +/- 50 nm)
Calculation
Ref: B. Fleck
1 2 2 1/ 2 ( ) / ( )
Interferometry
Color fringes of a broadband interfergram
Ref: B. Dörband
9
11
White Light Interferograms
Typical interferograms
monochromatic / white light
Additional information by different
wavelengths
Ref: B. Dörband
12
Interferograms
Examples
13
Sample Interferograms
Modulated surface
(left: ripple plate)
Test piece with constant
high frequency ripple
(right: Fourier spectrum)
Ref: B. Dörband
Real Measured Interferogram
Problems in real world measurement:
Edge effects
Definition of boundary
Perturbation by coherent
stray light
Local surface error are not
well described by Zernike
expansion
Convolution with motion blur
Ref: B. Dörband
14
Interferogram - Definition of Boundary
Critical definition of the interferogram boundary and the Zernike normalization
radius in reality
15
16
Interferogram Examples
More complicated sample
Ref: Elta systems
17
Interferogram
Example Interferogram of a plate with step
Ref.: H. Naumann
Coherent Superposition of Perturbations
Twyman-Green interferometer
Coherent defects on sample surface
(scratches, dots,...)
Very sensitive amplitude superpostion
Problems in fringe evaluation
Strong dependence on size of source:
relaxed problem for partial coherence
due to finite source size
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0 0.5 1 1.5 2 2.5 3 3.5
RM
S d
es D
iffe
renzf
eld
es [
nm
]
Lichtquellengröße [mm]size of lightsource in [mm]
rms of
field
difference
17
Coherent Superposition of Perturbations
Coherent defects on sample surface
(scratches, dots,...)
Superposition creates error in phase
Optimization of source size to suppress perturbations
without creates too large errors of the signal
18
Shearing Interferograms
Typical shearing interferograms
of some simple aberrations
19
d
xz
2
Interpretation of Interferograms
xd
Distance between fringes: d
Bending of fringes: x
Relation of surface error z
accross diameter
20
Intensity of fringes
I(x,y,t) intensity of fringes
V(x,y) contrast of pattern
W(x,y) phase function to be found
j(x,y,t) reference phase
Rs(x,y) multiplicative speckle noise
IR(x,y,t) additive noise
Tracing of fringes:
- time consuming method, interpolation, indexing of fringes, missing lines
Fourier method:
- wavelet method
- FFT Method
- gradient method
- fit of modal functions
Evaluation of Fringes
),,(),(),,(),(cos),(1),(),,( 0 tyxIyxRtyxyxWyxVyxItyxI RS j
21
23
Interferometry
General description of the measurement quantity:
superpostion of spatially modulated signal and noise
Io: basic intensity, source
T: transmission of the system, including speckle
j: phase, to be found
IN: noise, sensor, electronics, digitization
Signal processing, SNR improvement:
- filtering
- background subtraction
Ref: W. Osten
0( , ) ( , ) ( , ) cos ( , ) ( , )NI x y I x y T x y x y I x yj
original signal
filtered signal
background
processed signal
24
Interferometry
perfect interferogram
reduced contrast due
to background intensity
with speckle
with noise
Ref: W. Osten
Basic configuration
Test surface rotated by 180°
Cats eye configuration
Calibration
plane
mirror
1. Basic configuration
2. Surface rotated by 180°
3. Cats eye position
surface
under test
condenser
1 Re( , ) ( , ) ( , ) 2 ( , )f KondW x y W x y W x y S x y
2 Re( , ) ( , ) ( , ) 2 ( , )f KondW x y W x y W x y S x y
3 Re
( , ) ( , )( , ) ( , )
2
Kond Kondf
W x y W x yW x y W x y
1 2 3 3
1( , ) ( , ) ( , ) ( , ) ( , )
4S x y W x y W x y W x y W x y
Absolute Calibration of Interferometer
24
26
Fringe Evaluation
1. Fringe Tracking
2. Fourier-Transform Method
3. Spatial Phase Shifting
4. Phase Sampling Technique
5. Heterodyne Technique
6. Phase-Locking Method
7. Ellipse-Fitting Technique
Ref: R. Kowarschik
27
Evaluation of Fringe Pattern
Ref: R. Kowarschik
Static Methods Dynamic Methods
Fringe Tracking Phase Shifting Methods
Fourier-Transform Heterodyne Technique
Spatial-Carrier Frequency Phase-Locking Method
Spatial Phase Shifting
+ Only 1 interferogram Very variable+ No specific components Accuracy better /100
- Difficult to automatize Calibration
- Accuracy below /100 Additional components
28
Phase Sampling
Diversification
Various possibilities for changes
Ref: R. Kowarschik
29
Fringe Tracking for Fringe Evaluation
Ref: R. Kowarschik
Fringe Tracking (fringe skeletonizing)
- Intensity distribution 1. Identification of local extrema
2. Fringe sampling points for interpolation
- determination of points with integer or half-integer order of interference
- absolute order has to be identified additionally
- relatively low accuracy of phase measurements
Processing:
- improvement of SNR by spatial and temporal filtering
- creation of the skeleton (segmentation)
- improvement of the skeleton shape
- numbering the fringes
- reconstruction of the phase by interpolation
30
Fringe Tracking for Fringe Evaluation
Skeletonizing method
Ref: W. Osten
interferogram segmentation
improved
segment skeleton
phase map
Method of carrier frequency
- tilt creates carrier frequency
- essential signal: deviation from linearity
Evaluation in frequency space:
carrier frequency eliminated by filtering of the Fourier method
Equation: carrier frequency n
Carrier Method of Fringe Evaluation
without tilt same wave with tilt 20'
30
0( , ) ( , ) ( , ) cos ( , ) ( , )NI x y I x y T x y x y x I x yj n
Method of carrier frequency
- tilt creates carrier frequency
- creation by tilting the reference
- essential signal: deviation from linearity
Evaluation in frequency space:
- carrier frequency eliminated by filtering
of the Fourier method
- much better separation of low-frequency
components
Example:
water droplet as phase bump
Carrier Method of Fringe Evaluation
interferogram reconstructed phase
large
phase
bump
small
phase
bump
31
33
Carrier Method of Fringe Evaluation
Ref: W. Osten
interferogram
interferogram
with carrier
amplitude
spectrum
spectrum filtered
and shifted
unwrapped
phaseunwrapped phase
34
Carrier Method of Fringe Evaluation
Fourier spatial demodulation technique
Overlay of carrier frequency
Filtering of the spectrum: only one order
Inverse transform
Ref: G. Kaufmann
Interferogram Interferogram with carrier spectrum reconstructed phase
35
Carrier Frequency Interferogram
Evaluation of data
With filtering step
Ref: B. Dörband
36
Fourier Method of Fringe Evaluation
Intensity in interferogram
Substitution
gives
Fourier transform
interpretation:
A: low frequencies, background
C, C* : same information
Filtering with bandpass:
elimination of A and C*:
Inverse Fourier transform
Pointwise calculation of phase
Unwrapping of the phase for 2
for a smooth surface
Ref: W. Osten
( , ) ( , ) ( , ) cos ( , )I x y a x y b x y x y
( , )1( , ) ( , )
2
i x yc x y b x y e
*( , ) ( , ) ( , ) ( , )I x y a x y c x y c x y
*J( , ) ( , ) ( , ) ( , )A C Cn n n n
J( , ) ( , )Cn n
( , )1( , ) ( , ) ( , ) ( , )
2
i x yI x y F J c x y b x y e n
Im ( , )( , )
Re ( , )
c x yx y
c x y
Fourier method:
- representation in frequency domain
- A: noise
- filtering of noise and asymmetrical contribution
Phase information
),(),(),(),( * vuCvuCvuAvuI
),(Re
),(Imarctan
yxC
yxCj
| I(u,v) |
spatial
frequency
u
A(u,v)
C (u,v)* C (u,v)
filter-
function
H(u,v)
Fourier Method of Fringe Evaluation
36
38
Fourier Method of Fringe Evaluation
Fourier method
Ref: W. Osten
interferogram amplitude filtered amplitude
wrapped phase phase mapunwrapped phase
Phase shifting method (PSI):
Gathering several interferograms by change of absolute phase
Realization:
- additional z-offset z
- shift of wavelength
Phase Shifting Method of Fringe Evaluation
38
reference offset /4 / +90° offset /2 / +180°
reference
black gray white
Phase shifting method TPMI
( temporal phase measuring interferometry )
- additional phase term a
- three different phases aj sequencially
measured (at least 3)
- elimination of phase values
background
contrast
- alternatively 4 frame method
- more phase values increase accuracy
aj ),(cos),(),(),( yxyxbyxayxI
3/2/13/2/1 cos aj baI
321231132
321231132
sinsinsin
coscoscosarctan
aaa
aaaj
IIIIII
IIIIII
2
3,,
2,0 4321
aa
aa
31
24arctanII
II
j
Phase Shifting Method of Fringe Evaluation
2 2
1 3 2 4
0
1
2C I I I I
I
1,4
1
4B j
j
I I
38
41
Phase Shifting
Errors of phase shifting, calibration:
- Nonlinearities of the detector
- Modulo 2
- Other systematic errors
- non-ideal reference surfaces
- aberrations of optical elements
- diffraction, ghosts
- digitization
- air turbulence
- mechanical vibrations
- detector noise
- frequency shift
Ref: R. Kowarschik
42
Phase Shifting Method for Fringe Evaluation
Ref: W. Osten
I2(90)
unwrapped
phase
I4(270)
I3(180) I1(0)
wrapped phase
TPMI method variants
- 3-frame
- 4-frame
- 5-frame
Carre method:
- only phase differences essential
- higher accuracy
Comparison of accuracies:
larger number of frames is
more precise
PV-phase
error in
phase
error
a
0.05
10
in %
200-10-20
0.015-Frame
3- , 4-Frame
Carre
Phase Sifting Method
40
Zernike Polynomials
+ 6
+ 7
- 8
m = + 8
0 5 8764321n =
cosj
sinj
+ 5
+ 4
+ 3
+ 2
+ 1
0
- 1
- 2
- 3
- 4
- 5
- 6
- 7
Expansion of wave aberration surface
into elementary functions / shapes
Zernike functions are defined in circular
coordinates r, j
Ordering of the Zernike polynomials by
indices:
n : radial
m : azimuthal, sin/cos
Mathematically orthonormal function
on unit circle for a constant weighting
function
Direct relation to primary aberration types
n
n
nm
m
nnm rZcrW ),(),( jj
01
0)(cos
0)(sin
)(),(
mfor
mform
mform
rRrZ m
n
m
n j
j
j
44
Deviation in the radius of normalization of the pupil size:
1. wrong coefficients
2. mixing of lower orders during fit-calculation, symmetry-dependent
Example primary spherical aberration:
polynomial:
Stretching factor of the radius
New Zernike expansion on basis of r
166)( 24
9 Z
r
14
24
44
2
949
23
)(13
)(1
Z
rZrZZ
0.9 0.91 0.92 0.93 0.94 0.95 0.96 0.97 0.98 0.99 10
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
c4
c1
c9 / c
9
Zernike Coefficients for Wrong Normalization
45
Conventional calculation of the
Zernikes:
equidistant grid in the entrance
pupil
Real systems:
Pupil aberrations and distorted
grid in the exit pupil
Deviating positions of phase
gives errors in the Zernike
calculation
Additional effect:
re-normalization of maximum
radius
46
Zernike Calculation on distorted grids
5% radial distorted grid with both signs:
+5%: pincushion
-5% barrel
Wavefront of only one selected Zernike is re-analyzed
on distorted re-normalized grid:
Effects of distortion:
- errors in the range of some percent
- cross-mixing to other zernikes of same symmetry
- neighboring Zernikes partly influenced until 20%
- larger effects of higher order Zernikes
- slightly larger effects for pincushion distortion
47
Zernike Calculation on distorted grids
48
Zonal Method for Wavefront Reconstruction
Primary data of measurement:
derivatives / gradients of the wave W(x,y)
Zonal reconstruction:
- derivatives by finite differences in every cell
of the pixel grid
Collecting all mesh values:
- matrix representation
- sparse bandwidth matrix B
Inversion of the linear system of equations
Problems:
- local integration suffers from problems in case of noise
- sequence of connecting the cells creates non-unique results in case of singular
points
x
y
j
Wj,1,1 W
j,2,1
Wj,1,2
x
y
Sj,x
Sj,y
SW W
xj x
j j
,
, , , ,
2 1 1 1
S
W W
yj y
j j
,
, , , ,
1 2 1 1
S B W
W B B B ST T
1
49
Modal Method of Wave Reconstruction
Expansion of the wave into orthonormal set of functions F
Analytical derivates used to describe the direct measurement values
System of equations to be solved
Solution by inversion of the the linear system
by SVD methods
Properties:
- modal function work as a low pass filter, more robust fitting
- eigenvalues indicate an unsufficient functional system
- unique solution, usually more accurate
W x y a F x yn n
n
( , ) ( , )
W
xa
F x y
xn
n
n ( , )
W
ya
F x y
yn
n
n ( , )
S A a
a A A A S
T T
1
50
Modal Method of Wave Reconstruction
Example 1:
Zernike expansion
Example 2:
Fourier modal functions
j
j
im
mn
m
nnm ea
rRcmi
W
,
jW
rc
d Rr
a
drenm
n
m
n m
im
,
xR
n
W
x
R
n
W
r
W
r'
' 'cos
sin
j
j
jy
R
n
W
y
R
n
W
r
W
r'
' 'sin
cos
j
j
j
ci n
ma
W
x
W
yR
r
ae r dr dnm n
m
a
im
( )sin cos
12
00
2
2
j
j j
j
Z m n
Nepq
i
Npm qn
( , )1
2
W m n a Z m npq pq
p q
( , ) ( , ),
N
q
N
p
qpWFeqpWFe
a
yN
ip
xN
iq
pq
22
22
sinsin4
),(ˆ1),(ˆ1