M. Steller

Space Research Institute, Graz

EDI Gun FM2Performed Tests and

Results

1IWF/ÖAW GRAZ

2IWF/ÖAW GRAZ

Overview EDI Gun Tests Components Level (valid for all FM’s)

Radiation verification tests for bipolar transistors 2N2222 and 2N2907 Up-screening of components for HV opto-coupler Electrical characterization and thermal cycling of HV opto-coupler

Board Level Electrical test Thermal test

Electronics Assembly Electrical and functional test Thermal cycling (not performed for FM2)

Assembled Gun Short functional test (prior to calibration and transport) Calibration

Reports available at: ftp://ftp.iwf.oeaw.ac.at/pub/EDI_MMS/EDI_FM2/GUN/

3IWF/ÖAW GRAZ

Radiation Verification Test

NPN Transistor 2N2222 Two batches, two different lots Dose rate 25krad/h = 6,94rad/sec First batch: hFE ~150 => ~55 @75 krad

Second batch: hFE ~160 => ~25 @ 75krad

PNP Transistor 2N2907 Two batches, two different lots Dose rate 25krad/h = 6,94rad/sec First batch: hFE ~200 => ~65 @75 krad Second batch: hFE ~145 => ~50 @ 75krad

4IWF/ÖAW GRAZ

Test & Assembly HVOC

Manufacturing flow Adoption of Ir-LEDs to fit to the HV diode Up-screening by external source Assembly of Ir-LED with HV diode Packing into housing

5IWF/ÖAW GRAZ

Up-screening of HVOC

Screening and serialization performed by SACTEC Procedure follows IEEE-INST-002 (EDI-IWF-PRO-0028) Mechanical tests were excluded

Ir-Diode HV-Diode

6IWF/ÖAW GRAZ

Selection of HVOC Electrical characterisation

Five HV levels 1kV to 5kV Seven current levels for Ir-LED

(1, 2, 5, 10, 15, 20, 25mA)

Detailed characterisation for selection (since FM3) HV sweep from 0 to 5kV with 100V steps

Seven current levels for Ir-LED(1, 2, 5, 10, 15, 20, 25mA)

HV-Supply

1kV

Current SourceKeithley 6221

10mAUSB

I(µA)

1kV

U(V)

Fluke 89 IV

Keithley 2601

7IWF/ÖAW GRAZ

Board Level Tests

Electrical Test Board mounted onto dedicated test adapter with spring loaded electrical

contacts Standard BLT uses in- and output pins only Additional test points in case detailed measurements necessary Pre-defined step procedures Test is performed semi-automatically Scripts control stimuli and read-out Scripts for generation of graphs

8IWF/ÖAW GRAZ

Board Level Test DEFL1

Functional Test Supply current REF voltage to HV controller

(D2, D3, D6, D7) Sweep input from 0 to 3.5V Trimming in case deviation

is larger than 0.2% Sweep repeated in case of trimming Check of resistor ring

(generation of REF voltages)

Thermal Test Ambient pressure, -20°C ... 70°C Recording of HV output, HK values

and supply currents

Report EDI-IWF-REP-0264

9IWF/ÖAW GRAZ

Results for DEFL1

HV Outputs Deflection D2: 0/+3000V => 0/+2998V Deflection D3 : 0/+3000V => 0/+3004V Deflection D6 : 0/+3000V => 0/+3006V Deflection D7 : 0/+3005V => 0/+2997V

Inputs to HV Controller Deflection D2: 998.6V => 997V 2501.4V => 2497V

Deflection D3: 998.6V => 998V 2501.4V => 2503V Deflection D6: 998.6V => 999V 2501.4V => 2505V Deflection D7: 998.6V => 996V 2501.4V => 2498V

10IWF/ÖAW GRAZ

Board Level Test DEFL2

Functional Test Supply current REF voltage to HV controller

(D1, D4, D5, D8) Sweep input from 0 to 3.5V Trimming in case deviation is larger than 0.2% Sweep repeated in case of trimming Check of resistor ring

(generation of REF voltages) Check of HK multiplexer (test signal 3.5V)

Thermal Test Ambient pressure, -20°C ... 70°C Recording of HV output, HK values

and supply currents

Report EDI-IWF-REP-0265

11IWF/ÖAW GRAZ

Results for DEFL2

HV Outputs Deflection D1: 0/+3000V => 0/+3006V Deflection D4 : 0/+3000V => 0/+3002V Deflection D5 : 0/+3000V => 0/+3000V Deflection D8 : 0/+3005V => 0/+3005V

Inputs to HV Controller Deflection D1: 998.6V => 999V 2501.4V => 2505V

Deflection D4: 998.6V => 999V 2501.4V => 2502V Deflection D5: 998.6V => 997V 2501.4V => 2500V Deflection D8: 998.6V => 999V 2501.4V => 2504V

12IWF/ÖAW GRAZ

Board Level Test OPT_DEFL

Functional Test Supply current REF voltage to HV controller

(UD, UI) Sweep input from 0 to 3.5V Trimming in case deviation is larger than

0.2% Sweep repeated in case of trimming Check of HK multiplexer (test signal 3.5V) Calibration of temperature sensor

Thermal Test Ambient pressure, -20°C ... 70°C Recording of HV output, HK values

and supply currents

Report EDI-IWF-REP-0266

13IWF/ÖAW GRAZ

Results for OPT_DEFL

HV Outputs U_Deflector: 0/+3000V => -1/+3007V U_Injector: 0/+2000V =>

0/+2000V

14IWF/ÖAW GRAZ

Board Level Test BEAM

Functional Test Supply current REF voltage to HV controller

(Anode, Focus, Cathode) Sweep input from -1.5 to 3.5V

(range depends on channel) Trimming in case deviation is larger than

0.2% Sweep repeated in case of trimming Timing measurement for chopper circuit

Report EDI-IWF-REP-0263

15IWF/ÖAW GRAZ

Results for BEAM

HV Outputs Anode: 0/+3000V => 0/+3001V Focus: 0/-1500V => 0/-1501V Cathode: 0/-1500V => 0/-

1498V

Chopper Delay: 20.7ns Rise time: <10ns => 2.0ns Fall time: <10ns => 2.9ns

16IWF/ÖAW GRAZ

Gun Electronics Assembly (1)

Integration steps for gun electronics stack Beam board with external harness/ Optics deflection board / HV FIL board First intermediate electrical test

Resonance frequency of HV converter, cascade output voltages Functional test of beam and optics deflection Filament supply and Wehnelt driver

Deflection1 and deflection 2 Second intermediate electrical test

Check of external harness Test of deflection system

Isolation test Electric strength

Installation of deflection system

17IWF/ÖAW GRAZ

Gun Electronics Assembly (2)

Functional test of gun electronics stack Power consumption All HV outputs: sweep from minimum to maximum

Record output and housekeeping Test of chopper signal

Rise and fall time Test of filament supply

Filament voltage and housekeeping Test of Wehnelt driver

Voltage versus HK frequency Derive Anode voltage for beam energy 1keV, 500eV and 250eV

Electrode settling time for all HV outputs

18IWF/ÖAW GRAZ

Results from Intermediate Tests

Functional test of gun electronics stack Deviation of HV outputs

Deflection 2: max. -5V Deflection 3: max. 8V Deflection 6: max. 110V Deflection 7: max. -5V Deflection 1: max. 15V Deflection 4: max. 10V Deflection 5: max. 5V Deflection 8: max. 38V Anode: max. 5V Cathode: max. 4V Focus: max. 9V

Chopper signalRise and fall time <10ns: Rise 2.13ns, fall 2.35ns

Electrode settling time:<10ms full scale => < 1ms, for all outputs except Cathode

19IWF/ÖAW GRAZ

Gun Calibration Preparation

Installation into chamber Short functional test Pumping after 2 hours OFF time

Preparation for Calibration Adjustments for polar angle 0 Reference position for movable platform

(centre of target)

Calibration 1keV, 500eV, 250eV Focus adjustment

(0, 20, 40, 60, 80, 90°, 95° polar, every 30° azimuth)

Calibration of deflection system Beam profile measurements (same position as

focus adjustment)

Beam tests: Coding, beam split, maximum beam current

20IWF/ÖAW GRAZ

Results from Calibration

Calibration table XD, YD for every polar angle

( 2° steps, 1° steps for polar angle above 70°) Corrected polar angle

Content of calibration report Deviation from theoretical formula Beam current versus polar angle Spatial deviation from reference Content of calibration table displayed in graphs Beam profiles (2D and 3D graphs) Results from beam test

Report EDI-IWF-REP-0281 (0081)