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Navrachana University School of Engineering and Technology Course: VLSI DESIGN Program: B. Tech (EEE) 7 th semester a) Faculty contact information: i) Name : Rohit Negi ii) Office room no. : 205 iii) Office hours : 9 am to 5 pm iv) For students to contact : Anytime b) Course coverage: Unit – 1 (08 hours) Introduction: Introduction to IC technology, CMOS fabrication, the p-well process, n-well process, twin tub process. Bi-CMOS technology. Basic electrical properties of MOS circuits, I-V relationships, Conductance and figure of merit. Unit – 2 (08 hours) MOS Circuit Design: The n-MOS inverter, pull-up to pull-down ratio, CMOS inverter and its characteristics, Design considerations in CMOS design- Latch up, Body effect, sheet resistance, delays, estimation and logical efforts, limits of miniaturization. Unit 3 (08 hours) MOS Circuit Design: n-MOS, CMOS Nand gate, CMOS Nor gate, Combinational circuit design, sequential circuit design, Scaling of MOS circuits, Limitations of Scaling. Placement floor planning, Routing, Parasitic Extraction.

Lesson Planning VLSI EEE 7th Sem

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Lesson plan for 4th year B.tech EEE students in VLSI

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Navrachana UniversitySchool of Engineering and TechnologyCourse: VLSI DESIGN Progra: !" Tech #EEE$ %th seestera$ &aculty contact inforation:i$ Name : 'ohit Negiii) Office room no. : 205iii) Office hours : 9 am to 5 pmiv) For students to contact : Anytime($ Course coverage: Unit ) * #+, hours$ Introduction: Introduction to IC technoo!y" C#O$ fa%rication" the p&'e process" n&'eprocess" t'in tu% process. (i&C#O$ technoo!y. (asic eectrica properties of #O$ circuits"I&) reationships" Conductance and fi!ure of merit.Unit ) - #+, hours$./S Circuit Design:*he nO$ inverter" pu&up to pu&do'n ratio" C#O$ inverter and itscharacteristics" +esi!n considerations in C#O$ desi!n& ,atch up" (ody effect" sheet resistance" deays" estimation and o!ica efforts" imits of miniaturi-ation. Unit ) 0#+, hours$./S Circuit Design: nO$" C#O$ Nand !ate" C#O$ Nor !ate" Com%inationa circuit desi!n" se.uentia circuit desi!n" $cain! of #O$ circuits" ,imitations of $cain!. /acement foor pannin!" 0outin!" /arasitic 12traction.Unit ) 1 #+, hours$Prograa(le logic Devices: Fu Custom +esi!n" $emi custom +esi!n" /ro!ramma%e o!ic structures" Fied pro!ramma%e !ate array 3F/4A)" Confi!ura%e o!ic %oc5 3C,()" Appication specific Inte!rated Circuits 3A$IC6s).Unit ) 2 #+, 3ours$C./S Testing: Need for testin!" +esi!n for testa%iity" Faut types and modes" (uit in sef&test 3(I$*)" /ac5a!in!" desi!n economics and parametric yied.c$ Te4t !oo5s:7. 1ssentias of ),$I circuits and systems 8 9amran 1shra!hian" 1shra!hian +ou!esand A. /uc5ne" /:I" 2005 1dition.2./rincipes of C#O$ ),$I +esi!n & ;este and 1shra!hian" /earson 1ducation" 7999.0" C#O$ +i!itaInte!rated Circuits"9an! 31n!ish)