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Investigation and application of impregnated scandate cathodes
Ji Lia,*, Suqiu Yana, Wensheng Shaoa, Qilue Chena, Min Zhub
aCathode Electronics Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100016, ChinabNational High Power Key Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100016, China
Received 23 September 2002; received in revised form 10 December 2002
Abstract
This paper describes the investigation and application of scandate cathodes in Beijing Vacuum Electronics Research Institute
(BVERI). The data of emission performance and lifetime were acquired both in closed-spaced diodes and in microwave tubes.
Evaporation rates and gas poisoning properties have been determined. From the results of a series of diode experiments and the
feedback information of practical usage in tubes, there are three key factors that in our opinion limit the practical application of
scandate cathodes in general. These are no obvious saturation onset of I/U characteristics, weak ion bombardment resistivity and
non-uniform emission. The authors conclude that to a certain extent, impregnated scandate cathodes (I-Sc) can be used as
alternative electron sources instead of M-type cathode in microwave tubes.
# 2003 Elsevier Science B.V. All rights reserved.
Keywords: Scandate cathodes; Impregnated cathodes; Emission characteristics; Lifetime
1. Introduction
Since scandate cathodes were originally described
in 1967 [1], there have been a large number of
publications related to emission mechanism and cath-
ode capability. Generally, scandate cathodes fall into
one of three categories, mixed pressed, impregnated
and ‘‘top-layer’’. It has been reported that maximum
emission current density of up to 460 A/cm2 (at
1030 8CW–B) are achievable in a UHV set-up with
‘‘top-layer’’ scandate cathodes prepared by laser
ablation deposition [2].
The investigation of scandate cathodes in Beijing
Vacuum Electronics Research Institute (BVERI) began
in 1981 and has included studies of all three classes of
cathode described above. Considering technology, cost
and performance, impregnated scandate cathodes (I-Sc)
were chosen for use in linear beam devices.
Our investigation of impregnated scandate cathodes
encompassed the following topics: tungsten substrate,
impregnation materials, emission properties, lifetime,
barium evaporation rate, gas poisoning, bulk and
surface analysis and fault models. The I-Sc cathode
has, thus far, been widely used in electron beam
devices, such as grid-controlled TWT (Travelling
Wave Tube), EMC TWT, mm-wave TWTand klystron
in BVERI.
2. Cathode technology
2.1. Preparation of tungsten matrix
Tungsten powder (with a grain size of around 5 mm)
was isostatically pressed and then sintered under
Applied Surface Science 215 (2003) 49–53
* Corresponding author. Tel.: þ86-10-64361731x2440;
fax: þ86-10-64362878.
0169-4332/03/$ – see front matter # 2003 Elsevier Science B.V. All rights reserved.
doi:10.1016/S0169-4332(03)00273-3
hydrogen to yield rough bars. After filling with copper
(or methyl methacrylate) the bars were machined to
give pellets of the desired dimensions. The filler was
then removed by chemical erosion, deoxidized in
hydrogen and evaporated under vacuum. After sinter-
ing under hydrogen at 2000 8C, the porosity of the
tungsten body is in the range of 24–28%.
2.2. Active impregnate materials
The active impregnate comprises the following com-
ponents, BaO, CaO, Al2O3 and Sc2O3 (2–6 wt.%).
Whilst a total of 22 variants were initially tested, this
was eventually narrowed down to three with the follow-
ing molar ratio compositions, 3:0.5:1; 4:0.5:1;
4:1:0:5 þ 3wt.% Sc2O3 that were used in different
kinds of devices.
The active materials were prepared by co-precipita-
tion. The advantage is that scandium can be dispersed
more homogeneously by co-precipitation than by
mechanical mix. The co-precipitation reaction process
[3] refers to the following:
BaðNO3Þ2 þ CaðNO3Þ2 þ AlðNO3Þ3 þ ScðNO3Þ3
þ ðNH4Þ2CO3 ! BaCO3 þ CaCO3 þ AlðOHÞ3
þ Sc2ðCO3Þ þ BaCaSc2ðCO3Þ5 þ BaSc2ðCO3Þ4
þ CaSc2ðCO3Þ4
The final precipitation product is very fine white
powder after baking.
While impregnating scandate materials into the
porous tungsten body under hydrogen, the reaction
equation [3] is
BaCO3 þ CaCO3 þ AlðOHÞ3 þ Sc2ðCO3Þþ BaCaSc2ðCO3Þ5 þ BaSc2ðCO3Þ4
þ CaSc2ðCO3Þ4 ! Ba2CaAl2O6 þ Ba2CaSc4O9
þ Ba3Al2O6 þ Ba3Sc4O9 þ CO2 "
3. Emission characteristics and lifetime
3.1. Closed-spaced diode test
The saturated emission current was defined as the
point at which a log(I)–log(V) curve begins to deviate
from linearity (the so-called ‘knee curve’). In order to
compare results, all cathodes were fabricated from the
same size pellets (3.0 mm diameter and 0.8 mm thick-
ness) impregnated with the compositions outlined
above and then surface cleaned and pre-treated on
exhaust. The anode–cathode distance was fixed at
about 1.0 mm. Given that the anode was water-cooled,
this meant that both CW and pulsed measurements
were possible. Nonetheless, the anode effect is still
present when very high currents as being delivered in
the CW mode test Fig. 1.
The diode emission current densities extracted from
I-Sc cathodes were above 13 A/cm2 at 1000 8CB
(practical temperature at 900 8CB because of electron
cooling effect) in the CW mode and above 55 A/cm2 at
900 8CB in pulsed mode (t ¼ 20 ms, f ¼ 1000 Hz),
respectively. The life tests were stopped after 20,000
and 8000 h while delivering 5 and 10 A/cm2 current
density in CW mode at practical temperatures of 950
Fig. 1. Water-cooled diode for cathode life test.
Fig. 2. Electron gun for cathode life test.
50 J. Li et al. / Applied Surface Science 215 (2003) 49–53
and 910 8CB, respectively. The degradations of current
were less than 3% [4].
3.2. Practical electron gun test
A cathode control electron gun (see Fig. 2) was used
to examine cathode emission capability and lifetime in
real tube operating environment. The cathode with
5.6 mm in diameter and 8.0 mm in spherical radius
was mounted into the electron gun.
The lifetimes were above 1000 and 2000 h at
current densities of 4.2 A/cm2 at 980 8CB [5] in CW
mode and 11 A/cm2 at 1000 8CB in pulsed mode
(t ¼ 10 ms, f ¼ 2000 Hz), respectively. The life tests
were suspended in 1996.
4. Evaporation rate
The barium evaporation rate was measured by the
Becker method. Fig. 3 shows the configuration of the
standard Becker diode in BVERI.
As shown in Fig. 4, for engineering applications the
evaporation rate [6] of I-Sc cathode is at the same level
as M-type cathode.
5. Gas poisoning studies
All I-Sc cathodes used for poisoning experi-
ments have the ability of delivering more than
700 mA (�10 A/cm2) current (knee point of log(I)
versus log(U) plot) at 1000 8CB (no compensation)
under CW mode. Before admission of the gas, the
current was set at 350 mA (5 A/cm2) at a tempera-
ture of 950 8CB. The emission degradation and
Fig. 3. Configuration of Becker diode.
Fig. 4. Evaporation rate of practical cathodes.
J. Li et al. / Applied Surface Science 215 (2003) 49–53 51
recovery was then determined for the various sam-
ples.
Fig. 5 shows emission poisoning thresholds (90% of
initial emission) for several gases [7].
6. Application in practical tubes
Since 1986, I-Sc cathodes have been used in TWT
applications in BVERI. Following improvements in
technology and engineering considerations, I-Sc cath-
odes have also found application in linear beam
devices including grid controlled TWT, broad-band
TWT, mm-wave TWT and klystron.
Generally, the lifetime is in the range of 1000–
10,000 h. It is necessary to point out that lifetime largely
depends on the operating condition and environment.
The I-Sc cathode was also successfully used in a
multi-beam klystron (MBK), which requires a current
density above 28 A/cm2 and lifetime not less than 500 h
under a duty cycle of 33.3%. An example is shown in
Fig. 6. Compared with M-type cathode, the operating
temperature of I-Sc cathode decreased from 1150 to
1050 8CB. It can be expected that longer life will be
achieved by I-Sc using cathode instead of M-cathode.
Presently, we are preparing to equip another MBK
with an I-Sc cathode, which can satisfy the require-
ments of 40 A/cm2 current density and not less than
1000 h lifetime.
Although I-Sc cathode has been used in many
kinds of tubes, there are still some issues to be solved.
The main problem encountered in practice is the
emission degradation after breakdown occurring
inside tubes.
In order to make I-Sc cathodes operate normally,
some measures have to be taken, such as electrode
polishing, carefully degassing parts inside tube, use of
a gas-selective getter, etc. The goal is to lower the
probability of breakdown happening inside tubes.
7. Discussion
Whether I-Sc cathode can sustain ion bombardment
depends on bombardment energy, ion beam current
and Sc replenishment ability from tungsten body. It is
related to the I-Sc cathode operating mechanism.
For M-type cathode, the coating of Os/or Ir/or
Os/Ru (3000–6000 A) has two main functions:
(i) To lower the work function of emission surface
and make it acquire more uniform barium and
oxygen distribution.
(ii) To withstand the ion bombardment unless the
coating is destroyed by ion beam of very high
energy.
In the case of I-Sc cathodes, scandium migration
to the cathode surface (assuming the Ba/Sc/O/W
Fig. 5. Poisoning thresholds of several gases.
52 J. Li et al. / Applied Surface Science 215 (2003) 49–53
monolayer mechanism) serves a similar function to
the sputtered coating in M-type cathodes. It may be
visualized as if to the coating of M-type cathode a very
‘‘thin’’ monolayer level of scandium is added. This
should prove beneficial provided:
(i) The scandium can be uniformly dispersed
throughout the tungsten body and/or the cathode
surface.
(ii) The tungsten body and/or surface scandium layer
(or tungsten/scandium alloy) has sufficient re-
sistance to ion bombardment.
Since it is difficult for scandium to migrate from
body matrix to the emission surface, the next work will
be mainly concerned with improvement of the physi-
cal performance of base matrix containing uniformly
dispersed scandium.
Recently, a series of experiments have been done to
check emission recovery of I-Sc cathode after ion
bombardment. The content of scandium in impregnant
is varying from 0.5 to 10 wt.%. All tested cathodes
were ion sputtered and 8–12 mm were removed on the
surface. Pulsed emission measurements were made
before and after ion sputtering. For cathodes with low
levels of scandium, the emission was similar to that
obtained for common tungsten cathodes, even after
reactivation and aging. For cathodes with higher levels
of scandium (above 8%), although the emission did
not fully recover to its original pre-ion sputtering
level, the emission was, nevertheless better than that
obtained with Os-coated cathodes run under the same
conditions and at the same temperature.
8. Summary
After more than 20 years studying and using I-Sc
cathode, we can draw the following conclusions:
(1) To a certain extent, I-Sc cathode can be used as
alternative to the M-type cathode.
(2) For tubes where high current densities are needed
but lifetime is not a critical factor, I-Sc cathodes
can be the optimum choice.
(3) Long life in tubes can be expected provided some
measures are taken such as electrode polishing,
fully degassing of parts inside tube, use of gas-
selective getter, etc. The goal is to lower the
probability of a breakdown.
(4) Emission uniformity and degradation are still
issues, so future work will pay more attention to
tungsten matrix containing scandium, in which
scandium is dispersed uniformly and hence this
kind of matrix (or alloy containing scandium)
will be more resistive to ion bombardment.
References
[1] A.I. Figner, et al., US Patent 3,358,178 (December 1967).
[2] G. Gaertner, P. Geittner, H. Lydtin, A. Ritz, Appl. Surf. Sci.
111 (1997) 11.
[3] Technical Report AG269/11-16-11023-3e, 1986.
[4] Technical Report AG269/11-16-11023-3a, 1986.
[5] Technical Report AG15.482/11–22(11037)-3b, 1996.
[6] Technical Report AG15.482/11–22(11037)-3a, 1996.
[7] Technical Report AG269/11-16-11023-3c, 1986.
Fig. 6. (a) 19-beam cathode. (b) 18-beam cathode.
J. Li et al. / Applied Surface Science 215 (2003) 49–53 53