Intermetalic Compound

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    InterfacialReactionsandIntermetallicCompoundsinSolderJoints

    Peng Sun,Ph.D.CandidateSMITCenter,DepartmentofMicrotechnology andNanoscience

    ChalmersUniversityofTechnology&

    SinoSwedishMicrosystemIntegrationTechnology(SMIT)Center,ShanghaiUniversity

    [email protected]

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    Solders

    in

    electronic

    packaging

    and

    assembly

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    Solderjointinterconnectioniscompletedbytheformationofintermetallic compounds(IMC)attheinterfacebetweenthesolderandsubstratemetallization.

    Athin,continuousanduniformIMClayerisanessentialrequirementforgoodbonding.AthickIMClayerissensitivetostressandsometimesprovidessitesfortheinitiationandpropagationofcracks.

    Arelativelywellestablishedknowledgebasedonphysical,metallurgicalandreliabilityissuesofleadfreesoldersisstillinconstruction,whichwasveryimportantforthereliabilityofelectronicproducts.

    Background

    on

    intermetallic

    compounds

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    BinarySnCu BinarySnNi

    Phase

    diagram

    in

    common

    use

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    1: Cu6Sn5

    2:Cu3Sn

    Cu6Sn5&

    Cu3Sn

    in

    Sn

    Ag

    Cu

    joint

    12

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    Cu6Sn5on

    fracture

    surface

    in

    Sn

    Ag

    Cu

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    Sn

    Cu

    Cu6Sn5&

    Cu3Sn

    on

    fracture

    surface

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    Sn37Pb,Ni3Sn4

    Sn36Pb2Ag,Ni3Sn4

    Sn

    Pb/Sn

    Pb

    Ag soldering

    on

    Ni

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    Sn-3.5Ag,Ni3Sn4

    Sn-0.7Cu,(Cu,Ni)6Sn5

    Sn

    Ag/Sn

    Cu soldering

    on

    Ni

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    Sn-4.0Ag-0.5Cu,Ag3Sn &(Cu,Ni)6Sn5

    Sn-3.8Ag-0.7Cu,Ag3Sn &(Cu,Ni)6Sn5

    Sn

    Ag

    Cu

    soldering

    on

    Ni

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    Sn-9Zn,Ni-Zn

    Sn-8Zn-3Bi,Ni-Zn

    Sn

    Zn/Sn

    Zn

    Bi soldering

    on

    Ni

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    Sn-0.7Cu, Cu6Sn5

    Sn-3.5Ag, Ag3Sn Sn-4.0Ag-0.5Cu, Ag3Sn, Cu6Sn5

    IMCs in

    the

    solder

    matrix

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    Ag3Sn

    in

    Sn

    3.8Ag

    0.7Cu

    solder

    joint

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    Eutectic

    point

    in

    Sn

    Co

    Cu

    system

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    Soldermatrix

    Interface

    IMCs in

    Sn

    Co

    Cu

    solder

    joint

    CoSn2Cu6Sn5

    (Cu,Ni)6

    Sn5

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    Solder,IMCs inthematrix,IMCs onCusubstrate,IMCs onNisubstrate

    SnPb No Cu6Sn5 Ni3Sn4

    SnPbAg Ag3Sn Cu6Sn5 Ni3Sn4SnAg Ag3Sn Cu6Sn5 Ni3Sn4SnAgBi Ag3Sn Cu6Sn5 Ni3Sn4

    SnAgCu Ag3Sn,Cu6Sn5 Cu6Sn5 (Cu,Ni)6Sn5,(Ni,Cu)3Sn4SnCu Cu6Sn5 Cu6Sn5 (Cu,Ni)6Sn5SnCoCu Cu6Sn5,CoSn2 Cu6Sn5 (Cu,Ni)6Sn5SnZn No Cu5Zn8 Ni5Sn21SnZnBi No Cu5Zn8 Ni5Sn21

    DependedontheCucontentinthesolderalloy.

    Conclusion

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    Aging

    Aging

    Sn3.5Ag

    Sn4.0Ag0.5Cu

    Afterhightemperaturestorage(HTS)

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    1

    2

    3

    4

    crystalsinNiPphase

    TEMobservationinSnAgCujoint

    1:Ni3Sn42:Prich

    3:Ni(P)

    4:Cu

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    19Eutectic

    Sn

    Pb solder

    joint

    after

    thermal

    cycling

    (TC)

    test

    flux

    CoarseninSn37Pbjoints

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    20Ag3SnevolutioninLFSnAgCuPBGAsolderjointduringTC

    CoarseninSn3.8Ag0.7Cusolderjoints

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    21Sn3.8Ag0.7CuPBGAsolderjointafter6000cycles

    IMCs andcrack,componentside

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    22Sn3.8Ag0.7CuPBGAsolderjointafter6000cycles

    IMCs andcrack,PCBside

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    CBGATC,SungK.Kang,IBMT.J.WatsonResearchCenter

    Drop

    test,

    Jorma Kivilahti,

    Helsinki

    University

    of

    Technology

    Discussionfracturemode

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    Couplingbetweenoppositesubstrates

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    25Interfacialproductevolutionduringprolongedreflow

    CouplinginSnAgBisolderjoint1min 5min

    10min 20min 60min

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    AnalysisresultsoftheSnNiCuinterfacialIMCs

    (Cu+Ni):Sn=57:43,(Cu,Ni)6Sn5

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    At

    N

    MfATJ

    Cu

    Cu

    = 01

    tM

    NfTJ

    Cu

    Cu

    = 0

    x

    CCDJ 21

    =

    TheCuatomicfluxfromtheCusubstratetotheNi(P)metallizationlayercouldbecalculatedbythefollowingexpression:

    Tistheintermetallic compoundthickness,3.1

    m

    Aisthepadareaofsoldering

    isthedensityofCu6Sn5phase,8.27g/cm3,

    fCuistheCuweightfractioninCu6Sn5,0.39

    MCuis

    the

    molecular

    weight

    of

    Cu,

    63.5gN0istheAvogadrosnumber,6.0210

    23

    trepresentsthereflowtime,60s

    CudiffusioninSnAgBisolderjoint

    D=1.1105cm2/s

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    Cu/Niside

    Cuside

    After60minreflowat240oC

    CouplinginSnZnBisolderjoint

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    CouplinginSnZnBisolderjoint

    Sn3.5Ag3Bi/Ni,3.80

    1010cm2/s;Sn8Zn3Bi/Ni,2.93

    1012cm2/s

    Sn3.5Ag3Bi/Cu,1.441010cm2/s;Sn8Zn3Bi/Cu,1.361010cm2/s

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    SixthEUproject,FlexEman (Flexiblesolderingcellsforagileelectronicsmanufacture)underthecontractNo:COOPCT2003507983

    Appreciation is extended to the Shanghai Science andTechnologyCommission,ChinaunderresearchcontractsNo:045107006and035007031.

    Financial support provided by the SMITCenter membercompanies including Avantec, France; Flextronics, HellerIndustries, USA; ToyoKohan, Sumitomo Chemicals andHitachiChemicals,Japan;Nera andConpart,Norway;MydataAutomation, Note, Svensk optoelektronik, ngstrmsAerospaceCoandFoab Elektronik,Sweden.

    Acknowledgement

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    Thanksforyourattention!

    May

    24,

    2007