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8/11/2019 Intermetalic Compound
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InterfacialReactionsandIntermetallicCompoundsinSolderJoints
Peng Sun,Ph.D.CandidateSMITCenter,DepartmentofMicrotechnology andNanoscience
ChalmersUniversityofTechnology&
SinoSwedishMicrosystemIntegrationTechnology(SMIT)Center,ShanghaiUniversity
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Solders
in
electronic
packaging
and
assembly
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Solderjointinterconnectioniscompletedbytheformationofintermetallic compounds(IMC)attheinterfacebetweenthesolderandsubstratemetallization.
Athin,continuousanduniformIMClayerisanessentialrequirementforgoodbonding.AthickIMClayerissensitivetostressandsometimesprovidessitesfortheinitiationandpropagationofcracks.
Arelativelywellestablishedknowledgebasedonphysical,metallurgicalandreliabilityissuesofleadfreesoldersisstillinconstruction,whichwasveryimportantforthereliabilityofelectronicproducts.
Background
on
intermetallic
compounds
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BinarySnCu BinarySnNi
Phase
diagram
in
common
use
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1: Cu6Sn5
2:Cu3Sn
Cu6Sn5&
Cu3Sn
in
Sn
Ag
Cu
joint
12
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Cu6Sn5on
fracture
surface
in
Sn
Ag
Cu
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Sn
Cu
Cu6Sn5&
Cu3Sn
on
fracture
surface
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Sn37Pb,Ni3Sn4
Sn36Pb2Ag,Ni3Sn4
Sn
Pb/Sn
Pb
Ag soldering
on
Ni
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Sn-3.5Ag,Ni3Sn4
Sn-0.7Cu,(Cu,Ni)6Sn5
Sn
Ag/Sn
Cu soldering
on
Ni
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Sn-4.0Ag-0.5Cu,Ag3Sn &(Cu,Ni)6Sn5
Sn-3.8Ag-0.7Cu,Ag3Sn &(Cu,Ni)6Sn5
Sn
Ag
Cu
soldering
on
Ni
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Sn-9Zn,Ni-Zn
Sn-8Zn-3Bi,Ni-Zn
Sn
Zn/Sn
Zn
Bi soldering
on
Ni
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Sn-0.7Cu, Cu6Sn5
Sn-3.5Ag, Ag3Sn Sn-4.0Ag-0.5Cu, Ag3Sn, Cu6Sn5
IMCs in
the
solder
matrix
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Ag3Sn
in
Sn
3.8Ag
0.7Cu
solder
joint
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Eutectic
point
in
Sn
Co
Cu
system
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Soldermatrix
Interface
IMCs in
Sn
Co
Cu
solder
joint
CoSn2Cu6Sn5
(Cu,Ni)6
Sn5
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Solder,IMCs inthematrix,IMCs onCusubstrate,IMCs onNisubstrate
SnPb No Cu6Sn5 Ni3Sn4
SnPbAg Ag3Sn Cu6Sn5 Ni3Sn4SnAg Ag3Sn Cu6Sn5 Ni3Sn4SnAgBi Ag3Sn Cu6Sn5 Ni3Sn4
SnAgCu Ag3Sn,Cu6Sn5 Cu6Sn5 (Cu,Ni)6Sn5,(Ni,Cu)3Sn4SnCu Cu6Sn5 Cu6Sn5 (Cu,Ni)6Sn5SnCoCu Cu6Sn5,CoSn2 Cu6Sn5 (Cu,Ni)6Sn5SnZn No Cu5Zn8 Ni5Sn21SnZnBi No Cu5Zn8 Ni5Sn21
DependedontheCucontentinthesolderalloy.
Conclusion
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Aging
Aging
Sn3.5Ag
Sn4.0Ag0.5Cu
Afterhightemperaturestorage(HTS)
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1
2
3
4
crystalsinNiPphase
TEMobservationinSnAgCujoint
1:Ni3Sn42:Prich
3:Ni(P)
4:Cu
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19Eutectic
Sn
Pb solder
joint
after
thermal
cycling
(TC)
test
flux
CoarseninSn37Pbjoints
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20Ag3SnevolutioninLFSnAgCuPBGAsolderjointduringTC
CoarseninSn3.8Ag0.7Cusolderjoints
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21Sn3.8Ag0.7CuPBGAsolderjointafter6000cycles
IMCs andcrack,componentside
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22Sn3.8Ag0.7CuPBGAsolderjointafter6000cycles
IMCs andcrack,PCBside
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CBGATC,SungK.Kang,IBMT.J.WatsonResearchCenter
Drop
test,
Jorma Kivilahti,
Helsinki
University
of
Technology
Discussionfracturemode
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Couplingbetweenoppositesubstrates
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25Interfacialproductevolutionduringprolongedreflow
CouplinginSnAgBisolderjoint1min 5min
10min 20min 60min
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AnalysisresultsoftheSnNiCuinterfacialIMCs
(Cu+Ni):Sn=57:43,(Cu,Ni)6Sn5
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At
N
MfATJ
Cu
Cu
= 01
tM
NfTJ
Cu
Cu
= 0
x
CCDJ 21
=
TheCuatomicfluxfromtheCusubstratetotheNi(P)metallizationlayercouldbecalculatedbythefollowingexpression:
Tistheintermetallic compoundthickness,3.1
m
Aisthepadareaofsoldering
isthedensityofCu6Sn5phase,8.27g/cm3,
fCuistheCuweightfractioninCu6Sn5,0.39
MCuis
the
molecular
weight
of
Cu,
63.5gN0istheAvogadrosnumber,6.0210
23
trepresentsthereflowtime,60s
CudiffusioninSnAgBisolderjoint
D=1.1105cm2/s
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Cu/Niside
Cuside
After60minreflowat240oC
CouplinginSnZnBisolderjoint
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CouplinginSnZnBisolderjoint
Sn3.5Ag3Bi/Ni,3.80
1010cm2/s;Sn8Zn3Bi/Ni,2.93
1012cm2/s
Sn3.5Ag3Bi/Cu,1.441010cm2/s;Sn8Zn3Bi/Cu,1.361010cm2/s
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SixthEUproject,FlexEman (Flexiblesolderingcellsforagileelectronicsmanufacture)underthecontractNo:COOPCT2003507983
Appreciation is extended to the Shanghai Science andTechnologyCommission,ChinaunderresearchcontractsNo:045107006and035007031.
Financial support provided by the SMITCenter membercompanies including Avantec, France; Flextronics, HellerIndustries, USA; ToyoKohan, Sumitomo Chemicals andHitachiChemicals,Japan;Nera andConpart,Norway;MydataAutomation, Note, Svensk optoelektronik, ngstrmsAerospaceCoandFoab Elektronik,Sweden.
Acknowledgement
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Thanksforyourattention!
May
24,
2007