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    Universities' Power Engineering Conference (UPEC),

    Proceedings of 2011 46th International

    Date 5-8 Sept. 2011

    Chowdhury, S. (7)

    Chowdhury, S. P. (6)

    Conlon, Michael F. (4)

    Taylor, G. A. (4)

    Redfern, Miles A. (4)

    Chen, Zhe (4)

    Shateri, H. (4)

    Kling, W. L. (4)

    Haddad, A. (4)

    Bo, Z. Q. (4)

    Vermeulen, H. J. (4)

    Ametani, Akihiro (3)

    Harid, N. (3)

    Jamali, S. (3)

    Irving, M. R. (3)

    Kockar, Ivana (3)

    Barbulescu, Constantin (3)

    Kilyeni, Stefan (3)

    Ault, Graham (3)

    Asare-Bediako, B. (3)

    Papadopoulos, T. A. (3)

    Papagiannis, G. K. (3)

    Yip, Tony (3)

    Taylor, Gareth (3)

    Galloway, Stuart (3)

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    Design and Analysis of Heat Regeneration Technique inCombined Cycle Power Plant

    Sim, Hadi Sanjaya ; Rusyadi, Rusman

    | PDF (527 KB)

    Investigation of Substation Installed Shunt Active PowerFilter in AC Electrified Railway Systems

    Hosny, Wada ; Park, Han-Eol ; Song, Joong-Ho

    | PDF (468 KB)

    Investigation of Sectioning Post Installed Shunt ActivePower Filter in AC Railway Systems

    Hosny, Wada ; Park, Han-Eol ; Song, Joong-Ho

    | PDF (515 KB)

    Analysis and simulation of switching phenomenon inelectrical networks and reduction of its undesirable effectsby using close resistance and switch

    Javadi, Shahram ; Jamshidi, Heshmatolah

    | PDF (561 KB)

    Economic Load Dispatch with Daily Load Patterns UsingParticle Swarm Optimization

    Rugthaicharoencheep, N. ; Thongkeaw, S. ; Auchariyamet, S.

    | PDF (463 KB)

    Discrete Time Simulation of Electrical Power Network with

    Intermittent GenerationOthman, Saharuddin ; Irving, Malcolm R. ; Taylor, Gareth

    | PDF (579 KB)

    Technical and Economic Assessment of Power Generationfrom Dairy Farm-based Biogas Plants in South Africa

    Boadzo, A. ; Chowdhury, S. ; Chowdhury, S. P.

    | PDF (569 KB)

    Technical and Economic Assessment of Landfill Gas-basedCHP Plants in South Africa

    Sekgoele, K. ; Chowdhury, S. ; Chowdhury, S.P.

    Displaying Results 1 - 25 of185Filter Results

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59&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chowdhury,%20S.%20P..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Chowdhury,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Boadzo,%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125658http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125658&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Taylor,%20Gareth.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Irving,%20Malcolm%20R..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Othman,%20Saharuddin.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125657http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125657&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Auchariyamet,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Thongkeaw,%20S..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rugthaicharoencheep,%20N..QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125656http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125656&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Jamshidi,%20Heshmatolah.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Javadi,%20Shahram.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125655http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125655&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Song,%20Joong-Ho.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Park,%20Han-Eol.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hosny,%20Wada.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125654http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125654&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Song,%20Joong-Ho.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Park,%20Han-Eol.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hosny,%20Wada.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125653http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125653&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Rusyadi,%20Rusman.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Sim,%20Hadi%20Sanjaya.QT.&newsearch=truehttp://www.ieee.org/sitemap.htmlhttp://spectrum.ieee.org/http://standards.ieee.org/http://www.ieee.org/http://www.ieee.org/conferences_events/conferences/organizers/http://www.ieee.org/web/conferences/callforpapers/http://www.ieee.org/conferences_events/http://googleads.g.doubleclick.net/aclk?sa=L&ai=C1ajMYvS_UYOhIYXN8AO0nYDIAp76p4QFAAAQASDWysYaUO-c89UDYKcDyAEC4AIAqAMByAOdBKoEpQFP0BQyBVgnLO5GCTyuxnslGGVpxo5Ox-a-p0SOqGDCDnZ3ySYDJU9f9mH5pKiEG95ZvyOYUQzc-yYuv8d8mv50O7WPUSFY56yFwLJSrqaOBV27sTudlm4jks6Cx9kuIV-Jprrekis71ijM9x9Esp7H7TweNJGS4h9sAi4w60Wu_Ly2Vgr5aS5XWMQQZH8_ZMBtEw1xB7O1xJ6XUMU70-ejHOaSZBHgBAGgBhQ&num=0&sig=AOD64_1LzOGjEHDl5s9NRT5-1aoXZMqUjw&client=ca-pub-7515522322310000&adurl=http://open.ieee.org/authors.htmlhttp://googleads.g.doubleclick.net/aclk?sa=L&ai=CLWNZYvS_UYKhIYXN8AO0nYDIAs6Ph8QDAAAQASDWysYaUJHnxcn4_____wFgpwPIAQLgAgCoAwHIA50EqgSuAU_Qve7Lm4n-XYRVAMGqFOUS1ZDnk31_x59AVSF2RNK5U1Lu7QYuvHimrI-cQRxCwSDTGa6aKdNavmrJMPX1Taei7y554lxRvi47ehu4hdCQUa_0q0fbZ0iPjtXrQMuo8EB48NyJPXtur8K2yc0ZShL4YrodBvZk5t-m1P6pJGM6Ce3o6lcwzQYrQ1TWdshiojUJD9y1X3lIUdlAg20CzjZdm6It-CC7yXZjaaKZXOAEAaAGFA&num=0&sig=AOD64_2M5DVuSDkDjzyjeFO3SKWpzlI6TQ&client=ca-pub-7515522322310000&adurl=https://www.changesciences.net/%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http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125485&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yip,%20Tony.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Bo,%20Zhiqian.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Pan,%20Zhencun.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Dong,%20Xinzhou.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Wang,%20Bin.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125484http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125484&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Kling,%20W.%20L..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Frunt,%20J..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Haan,%20J.%20E.%20S.%20de.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125483http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125483&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Al-Naseem,%20Osama%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.El-Sayed,%20Mohamed%20A..QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125482http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125482&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hutasoit,%20Yan%20Maret.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Waluyo,%20-.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125481http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125481&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Eguchi,%20Junichi.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Mouri,%20Tadaharu.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Inokuchi,%20Masayuki.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yokoyama,%20Ryuichi.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Yoshimi,%20Koichiro.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ito,%20Yuki.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Hida,%20Yusuke.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Koyanagi,%20Kaoru.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125480http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125480&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Parui,%20Sukanya.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Basak,%20Biswarup.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125479http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125479&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Barbosa,%20F.%20P.%20Maciel.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Ferreira,%20C.%20M.%20Machado.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Pestana,%20Rui.QT.&newsearch=truehttp://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.QT.Santos,%20P.%20I.%20Domingues%20dos.QT.&newsearch=truehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125478http://loginredirect%28%27savetoprojectrequiressignin%27%29/http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6125478&sortType%3Dasc_p_Sequence%26filter%3DAND%28p_IS_Number%3A6125473%29http://ieeexplore.ieee.org/search/searchresult.jsp?searchWithin=p_Authors:.Q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