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HD HD - - 4000 4000 Profile Optimization Profile Optimization Through Process Through Process Enhancement Enhancement Shannon Dunn Shannon Dunn 2004 Symposium on Polymers

HD-4000 Profile Optimization Through Process Enhancement · 2021. 1. 12. · HD-4000 4000 Profile Optimization Through Process Enhancement Shannon Dunn 2004 Symposium on Polymers

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  • HDHD--40004000 Profile Optimization Profile Optimization Through Process Through Process EnhancementEnhancement

    Shannon DunnShannon Dunn

    2004 Symposium on Polymers

  • 5/04 S.Dunn5/04 S.Dunn

    AbstractAbstractPolyimides have been frequently used as stress release layerPolyimides have been frequently used as stress release layer for wafer level packaging [WLP] especially with Cfor wafer level packaging [WLP] especially with C--4 bumped 4 bumped die. HDdie. HD--4000 is a high Tg photosensitive polyimide [PSPI] 4000 is a high Tg photosensitive polyimide [PSPI] developed to replace earlier nondeveloped to replace earlier non--photosensitive wetphotosensitive wet--etch etch polyimides thereby improving wafer throughput as well as polyimides thereby improving wafer throughput as well as resolution. Over the years a number of processing resolution. Over the years a number of processing enhancements have been developed to improve the wall slope enhancements have been developed to improve the wall slope of wetof wet--etch polyimide to achieve improved side wall coverage, etch polyimide to achieve improved side wall coverage, reduce stress and limit the pinch points in subsequent underreduce stress and limit the pinch points in subsequent under-- bump metal [UBM] layers. This presentation will focus on a bump metal [UBM] layers. This presentation will focus on a variety of process optimizations done in conjunction with HDvariety of process optimizations done in conjunction with HD-- 4000 to achieve similar smooth side4000 to achieve similar smooth side--wall profiles and their wall profiles and their resulting impact on sidewall slope of cured PSPI films.resulting impact on sidewall slope of cured PSPI films.

  • 5/04 S.Dunn5/04 S.Dunn

    Standard HDStandard HD--4000 Process 4000 Process ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90 Proximity HotplateProximity Hotplate SVG TrackSVG Track

    ExposureExposure mJ/cm2mJ/cm2 115115 II--linelineUltratechUltratechStepperStepper

    Post ExposurePost ExposureBakeBake C/secC/sec 80/6080/60 Proximity HotplateProximity Hotplate SVG TrackSVG Track

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    Thickness Thickness -- 5um5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    Standard HDStandard HD--4000 Profile4000 Profile

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    Profiles with Focus Offset AdjustProfiles with Focus Offset Adjust

  • 5/04 S.Dunn5/04 S.Dunn

    Post Develop Bake ProcessPost Develop Bake Process

    ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90ProximityProximityHotplateHotplate SVG TrackSVG Track

    ExposureExposure mJ/cm2mJ/cm2 115115 II--linelineUltratech Ultratech StepperStepper

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    Post DevelopPost DevelopBake Bake C/secC/sec 150/100+200/100150/100+200/100

    Proximity Proximity HotplateHotplate SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    Thickness Thickness -- 5um5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--40004000 Post Develop Bake ProfilePost Develop Bake Profile

  • 5/04 S.Dunn5/04 S.Dunn

    Post Develop Bake with Focus AdjustPost Develop Bake with Focus Adjust

  • 5/04 S.Dunn5/04 S.Dunn

    Post Exposure Queue Process Post Exposure Queue Process

    ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90ProximityProximityHotplateHotplate SVG TrackSVG Track

    ExposureExposure mJ/cm2mJ/cm2 115115 II--linelineUltratech Ultratech StepperStepper

    Post ExposurePost ExposureQueueQueue minsmins 3030

    Wait before Wait before DevelopDevelop N/AN/A

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    ThicknessThickness--5um 5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--4000 Queue Profile4000 Queue Profile

  • 5/04 S.Dunn5/04 S.Dunn

    Queue with Focus AdjustQueue with Focus Adjust

  • 5/04 S.Dunn5/04 S.Dunn

    Post Exposure Queue with Post Post Exposure Queue with Post Develop Bake Process Develop Bake Process

    ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90ProximityProximityHotplateHotplate SVG TrackSVG Track

    ExposureExposure mJ/cm2mJ/cm2 115115 II--linelineUltratech Ultratech StepperStepper

    Post ExposurePost ExposureQueueQueue minsmins 3030

    Wait before Wait before DevelopDevelop N/AN/A

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    Post DevelopPost DevelopBake Bake C/secC/sec 150/100+200/100150/100+200/100

    Proximity Proximity HotplateHotplate SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    ThicknessThickness--5um 5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--4000 Queue with Hardbake 4000 Queue with Hardbake ProfileProfile

  • 5/04 S.Dunn5/04 S.Dunn

    Queue with Hardbake thru Focus Queue with Hardbake thru Focus AdjustAdjust

  • 5/04 S.Dunn5/04 S.Dunn

    Broadband ProcessBroadband Process

    ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90Proximity Proximity HotplateHotplate SVG TrackSVG Track

    Exposure Exposure mJ/cm2mJ/cm2 100100 BroadbandBroadbandUltratechUltratechStepperStepper

    Post ExposurePost ExposureBakeBake C/secC/sec 80/6080/60

    Proximity Proximity HotplateHotplate SVG TrackSVG Track

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    Post DevelopPost DevelopBake Bake C/secC/sec 150/100+200/100150/100+200/100

    Proximity Proximity HotplateHotplate SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    Thickness 5umThickness 5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--4000 Broadband Profile4000 Broadband Profile

  • 5/04 S.Dunn5/04 S.Dunn

    Broadband Exposure with Queue Broadband Exposure with Queue ProcessProcess

    ProcessProcess UnitUnit ConditionCondition RemarkRemark EquipmentEquipment

    CoatCoat rpmrpm 25002500 Thick.Thick.-- 11um11um SVG TrackSVG Track

    SoftbakeSoftbake C/secC/sec 85/90 + 95/9085/90 + 95/90Proximity Proximity HotplateHotplate SVG TrackSVG Track

    Exposure Exposure mJ/cm2mJ/cm2 100100 BroadbandBroadbandUltratechUltratechStepperStepper

    Post ExposurePost ExposureQueueQueue minsmins 3030

    Wait before Wait before Develop Develop N/AN/A

    DevelopDevelop secsec 4545 Solvent SpraySolvent Spray SVG TrackSVG Track

    Post DevelopPost DevelopBake Bake C/secC/sec 150/100+200/100150/100+200/100

    Proximity Proximity HotplateHotplate SVG TrackSVG Track

    CureCure C/minC/min 200/30 + 375/60200/30 + 375/60N2 Purge,N2 Purge,

    Thickness Thickness -- 5um5um Koyo OvenKoyo Oven

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--40004000 Broadband with Queue ProfileBroadband with Queue Profile

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--4000 Profile Optimization4000 Profile Optimization SummarySummary

    Process modifications can be utilized to Process modifications can be utilized to achieve desired profile of HDachieve desired profile of HD--4000. Some 4000. Some of those process modifications are:of those process modifications are:

    Focus Offset adjustmentFocus Offset adjustmentPost develop bake Post develop bake Post exposure queuePost exposure queueChange of exposure wavelength Change of exposure wavelength

    It is also possible to combine several It is also possible to combine several process modifications to achieve the process modifications to achieve the required profile.required profile.

  • 5/04 S.Dunn5/04 S.Dunn

    HDHD--4000 Processing Summary4000 Processing SummaryCondition Profile Pros Remarks

    PEB with Focus Adjust Reduce Crown Stepper Needed

    Queue with FocusAdjust

    Reduce Crown/Increase Footing

    Throughput Delay/Queue Time

    Post Develop Bake (PDB) Eliminate Crown

    Increased ProcessingTime

    Queue withPost Dev Bake

    No Crown Shallow Slope

    Increase Processing/Decrease Throughput

    BroadbandExposure

    Reduce Crown/ChangeSlope Tool Dependent

    BroadbandQueue/PDB

    No Crown/ShallowSlope

    Tool Dependent/Increased Processing/Queue Time

    HD-4000 Profile Optimization Through Process EnhancementAbstractStandard HD-4000 Process Standard HD-4000 ProfileProfiles with Focus Offset AdjustPost Develop Bake ProcessHD-4000�Post Develop Bake ProfilePost Develop Bake with Focus AdjustPost Exposure Queue Process HD-4000 Queue ProfileQueue with Focus AdjustPost Exposure Queue with Post Develop Bake Process HD-4000 Queue with Hardbake ProfileQueue with Hardbake thru Focus AdjustBroadband ProcessHD-4000 Broadband ProfileBroadband Exposure with Queue ProcessHD-4000�Broadband with Queue ProfileHD-4000 Profile Optimization�SummaryHD-4000 Processing Summary