ATE Line A standard Seica ATE combined with a NI PXI rack meet together for optimized testing

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MINI ATE LINE HIGHLIGHTS· Industry 4.0 compliant· Up to 640 direct channels for In-Circuit, functional testing and On-Board Programming · DSP-based measurement system· Integrated power supply unit for powered tests · Compatible with 19” rack· Compatible with 19” rack

COMBINED APPLICATION · Suitable for automotive product testing · Reduced costs of integration · Minimized development time · LabViewTM/TestStandTM Software Manager · Highest quality standards

Combinational test solutions,with a PXI rack, MINI ATE and single interface implementing a complete In-Circuit and functionaltest with a unique fixture and test program.and test program.

Seica provides integration of ICT and Functional test with PXI technology

SEICA WORLDWIDE

The testing of automotive products is one of the most complex and difficult to manage above all, because of the fast technology changeover, the increased complexity of solutions, and of the continued limited time-to-market. If we add to this, the demand for highest quality standards, it is easy to understand how testing requires quick answers, as well as the introduction of innovative solutions.

In order to meet this requirement, Seica has combined the capabilities provided by a PXI system with its own technology for In-circuit and functional test within a PXI system with its own technology for In-circuit and functional test within the same system, thus facilitating the implementation of combinational testers.

Through a dedicated interface, it is possible to connect a MINI ATE unit with a PXI chassis, thus fulfilling the demands for ICT testing while managing the product via a single mechanical fixture solution.

The integration involves both the hardware, and software, whose capabilities have been enhanced to provide the opportunity to use all functions from LabViewTM/TestStandTM environments via a single test sequence. environments via a single test sequence. The “calling” to Seica proprietary software, which includes all the featured routines and benefits of an In-Circuit test platform are therefore available from the National Instrument development environment. This way, it is possible to reduce set up times as well as execution times, thus providing a valuable tool for the production environment. The Mini and PXI solution will optimize the total process and its related costs, and is a viable solution in today’s automotive production environment.