Fischer Dualscope FMP10-20 Instruction Manual

DELTASCOPE® FMP10ISOSCOPE® FMP10DUALSCOPE® FMP20

Operators Manual

Coating Thickness Material TestingMicrohardnessMaterial Analysis

Order number: Version 1.0901-093 08/08

DELTASCOPE® FMP10ISOSCOPE® FMP10

DUALSCOPE® FMP20Operator‘s Manual

Non-destructive measurement onmagnetic and non-magnetic

metallic base materials

© 2008 Copyright byHelmut Fischer GmbH

Institut für Elektronik und Messtechnik, Sindelfingen.All rights reserved. No part of this manual may be reproduced by any means (print, photocopy, microfilm, or any other method) or processed, multiplied or distributed by electronic means without the written consent of Helmut Fischer GmbH Institut für Elektronik und Messtechnik.

Operator's Manual FMP10 / FMP20 Seite 1

Table of Contents

1 Important Information . . . . . . . . . . . . . . . . . . . . . . . . . . 71.1 Trademarks and Liabilities . . . . . . . . . . . . . . . . . . . . . . . 71.2 Symbols and Conventions Used in the Manual . . . . . . . 71.3 Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81.4 General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81.5 Requirements on the Operating Personnel . . . . . . . . . . 81.6 Environmental Conditions . . . . . . . . . . . . . . . . . . . . . . . 91.7 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101.8 Handling, Storage and Transport of Calibration

Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111.9 Instrument Repairs . . . . . . . . . . . . . . . . . . . . . . . . . . . 111.10 Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

2 Description of the Instrument . . . . . . . . . . . . . . . . . . 132.1 LCD Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142.2 Control panel key functions . . . . . . . . . . . . . . . . . . . . 162.3 Accessories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 192.3.1 Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 192.3.2 Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . 20

2.4 Technical Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 212.5 Contents of Shipment and Options . . . . . . . . . . . . . . . 232.5.1 Standard Contents of Shipment of the Instrument . . . 232.5.2 Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

3 Measurement Methods for Coating Thickness Measurements 253.1 Magnetic Induction Method . . . . . . . . . . . . . . . . . . . . . 263.2 Eddy Current Method . . . . . . . . . . . . . . . . . . . . . . . . . . 263.3 Measurements With DUAL Probes . . . . . . . . . . . . . . 26

Seite 2 Operator's Manual FMP10 / FMP20

4 System Setup, Maintenance and Cleaning . . . . . 274.1 Power Supply . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 274.1.1 Installing or Replacing Batteries . . . . . . . . . . . . . . . . 28

4.2 Connecting Probes . . . . . . . . . . . . . . . . . . . . . . . . . . . 304.3 Turning the Instrument On/Off . . . . . . . . . . . . . . . . . . 334.3.1 Measurement Method of the Connected Probe . . . . 334.3.2 Power Up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 344.3.3 Measuring Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . 354.3.4 Turning Off the Instrument . . . . . . . . . . . . . . . . . . . . 35

4.4 Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

5 Probe Handling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 375.1 Handling During Measurements . . . . . . . . . . . . . . . . . 375.2 Assigning a New Probe . . . . . . . . . . . . . . . . . . . . . . 385.3 Setting Up the Dual Mode for DUAL Probes . . . . . . . 39

6 Normalization, Calibration and Master Calibration 416.1 Information Regarding Normalization, Calibration

and Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . 426.1.1 Recommended Number of Single Readings During

a Normalization, Calibration and Master Calibration . 436.2 Specific Features of DUAL Probes . . . . . . . . . . . . . . 446.3 Reference Measurements . . . . . . . . . . . . . . . . . . . . . 446.4 Normalization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 456.4.1 Normalization Procedure . . . . . . . . . . . . . . . . . . . . . 45

6.5 Corrective calibration . . . . . . . . . . . . . . . . . . . . . . . . . . 476.5.1 Selecting the Calibration Standards for the

Corrective Calibration . . . . . . . . . . . . . . . . . . . . . . . . 476.5.2 Corrective Calibration Procedure . . . . . . . . . . . . . . . 486.5.3 Deleting a Corrective Calibration . . . . . . . . . . . . . . . . 52

6.6 Calibration on a Coating . . . . . . . . . . . . . . . . . . . . . . . 536.6.1 Procedure for a Calibration on Coating . . . . . . . . . . . 53

6.7 Master Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . 576.7.1 Selecting the Calibration Standards . . . . . . . . . . . . . 586.7.2 Performing a User Master Calibration . . . . . . . . . . . . 586.7.3 Master Calibration Procedure . . . . . . . . . . . . . . . . . 59


6.7.4 Displaying Xn Ranges for Calibration Standards for the Master Calibration . . . . . . . . . . . . . . . . . . . . 63

6.8 Determination of the Normalized Countrate Xn of a Calibration Standard During a Master Calibration . 65

7 Measuring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 667.1 Preparing for a Measurement . . . . . . . . . . . . . . . . . . 667.2 Influencing Parameters . . . . . . . . . . . . . . . . . . . . . . . . 667.3 Making a Measurement . . . . . . . . . . . . . . . . . . . . . . . 677.3.1 Measurement Acquisition . . . . . . . . . . . . . . . . . . . . 697.3.2 Measurements With External Start Enabled . . . . . . . 707.3.3 Automatic Measurements . . . . . . . . . . . . . . . . . . . . . 707.3.4 Audible signals After the Measurement Acquisition . 737.3.5 Display of the measurement method in use when

making measurements with dual probes . . . . . . . . . 737.4 Erroneous Readings . . . . . . . . . . . . . . . . . . . . . . . . . . 747.4.1 Deleting Erroneous Readings . . . . . . . . . . . . . . . . . 74

7.5 Measurements in the Free-Running Display Mode . . 747.5.1 Turning the Free-Running Display Mode On/Off . . . . 757.5.2 Procedure For Making Measurements in the

Free-Running Display Mode . . . . . . . . . . . . . . . . . . 767.5.3 Analog Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 777.5.4 Measurements In the “Free-Running” Display Mode

Using Dual Probes . . . . . . . . . . . . . . . . . . . . . . . . . . 78

8 Evaluation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79

9 Data Transfer Using USB . . . . . . . . . . . . . . . . . . . . . 819.1 USB Connection to a PC . . . . . . . . . . . . . . . . . . . . . . 829.2 Installing the USB Driver . . . . . . . . . . . . . . . . . . . . . . . 829.3 Transfer of the Measurement Data to the Computer . 839.3.1 Online Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 839.3.2 Offline Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83

9.4 Transmission from the PC to the Instrument . . . . . . . . 849.4.1 Transfer Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . 849.4.2 Control Commands . . . . . . . . . . . . . . . . . . . . . . . . . . 84


10 Instrument Settings in the Service Function Menu 8610.1 Service Menu Overview . . . . . . . . . . . . . . . . . . . . . . . . 8710.2 System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8810.2.1 Language . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8810.2.2 Contrast . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8910.2.3 Lighting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9010.2.4 Automatic Switch Off . . . . . . . . . . . . . . . . . . . . . . . . 9210.2.5 Re-Initialization of the Instrument . . . . . . . . . . . . . . . 9310.3 USB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9410.3.1 Send Free-Running Mode . . . . . . . . . . . . . . . . . . . . 9410.4 Instrument Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9510.4.1 Restricted operating mode . . . . . . . . . . . . . . . . . . . . 9510.4.2 Analog Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9710.5 Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9810.5.1 Audible Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9810.5.2 Measurement Effect . . . . . . . . . . . . . . . . . . . . . . . . . 9910.5.3 External Start . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10010.5.4 Measuring Mode - Standard/Area Measurement/

Automatic Measurement . . . . . . . . . . . . . . . . . . . . 10210.5.5 Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10410.5.6 Dual Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10510.6 Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10610.7 Storage Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10710.8 Performing a Master Calibration . . . . . . . . . . . . . . . . 10710.9 About ... . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10810.10 Documentation of the Instrument Configuration . . . 108

11 Malfunctions and Messages . . . . . . . . . . . . . . . . . . 11011.1 Malfunctions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11011.2 Messages on the LCD Display . . . . . . . . . . . . . . . . . 114

12 Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123

13 Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 149



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1 Important Information
1.1 Trademarks and LiabilitiesDUALSCOPE®, DELTASCOPE® and ISOSCOPE® are registered trade-marks of Helmut Fischer GmbH Institute for Electronics and Metrology.

Great care has been exercised in creating this operator's manual. The Helmut Fis-cher GmbH Institute for Electronics and Metrology assumes no liability for po-tentially remaining erroneous or incomplete statements and their results. We would, however, appreciate if you can make us aware of potentially existing er-rors or incomplete information.

1.2 Symbols and Conventions Used in the ManualThe following symbols and conventions are used in this manual:

The fact that the trademark characters ® and ™ may be missing does not indicate that a name is a free trademark.

Indicates safety information referring to danger for per-sons and warnings regarding damage to the measuring instrument or to accessories.

Indicates particularly important information and hints.

Indicates a reference to a page or chapter in this manual.

1. Operation to be carried out by the operator at the instrument.

Listing.

ENTER Writing convention for instrument keys and command buttons on the display.

Operator's Manual FMP10 / FMP20 Page 7

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1.3 Intended Use
The instrument is to be used for coating thickness measurements on steel and iron base materials as well as on non-ferromagnetic, electrically conducting base ma-terials.Only accessories recommended and approved by Helmut Fischer GmbH ( be-ginning on Page 19) may be connected to this instrument.

1.4 General Information

1.5 Requirements on the Operating Personnel

In addition, basic knowledge of metrology according to DIN 1319 is essential for performing correct coating thickness measurements and evaluations.

Basic computer knowledge regarding configuration, operation and programing as well as knowledge of the software in use, which may be obtained from respec-tive instruction manuals, is required when using the instrument in conjunction with a computer.

The values shown for the measured coating thicknesses and the texts of the information lines of the LCD display serve as examples for possible displays. It is entirely possible that different values appear on the LCD display or in the printout without having made any mistakes.

The instrument should be operated only by staff trained for this purpose!

Page 8 Operator's Manual FMP10 / FMP20

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1.6 Environmental Conditions
EMCThe instrument complies with the laws concerning electromagnetic compatibility of instruments (2004/108/EC). The measured coating thickness values are not in-fluenced by the highest level of interference mentioned in the EN 61000-6-2 Standard (which references the Standards EN 61000-4-2, EN 61000-4-3 and EN 61000-4-4).In particular, the instrument is shielded effectively from strong electromagnetic fields (e.g., motors, power lines, radio transmission towers).

Low VoltageThe instrument adheres to the Low Voltage Directive 2006/95/EC.

Ambient Temperature Range During Operation: +10°C ... 40°C

Temperature Range During Storage and Transport: +5°C ... 60°C

Temperature behind glass panes (e.g., in cars) in direct sun-light easily rise above 60°C! To avoid damage from heat, do not store the instrument or accessories in such places.

The instrument and accessories (in particular the AC adapter) must not come in direct contact with water! Risk of electrical shorts! Instruments or accessories may be oper-ated, kept or stored only in places, where the relative humid-ity is between 30% and 90% (non-condensing).

Because the instrument and accessories are not acid resis-tant, avoid direct contact with acid or acidic liquids.

The instrument and accessories are not suited for operation in explosion-hazard areas!

Protect the instrument and accessories from static charges! Electrical discharges may damage internal components or delete internal memories.


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1.7 Probe Handling
Fig. 1-1 Probe handling

During the measurement, the magnetic poles of the probes are placed directly onto the specimen. Observe the following to keep wear of the magnetic poles dur-ing the contacting measurement to a minimum:

To avoid breakage of the wiring, do not bend the probe con-nector cable! The radius of rolled up probe connector cables should always be at least 50 mm!

Place the probes speedily yet gently on the specimen sur-face! Avoid hard impacts!

Do not drag the probe across the specimen surface.

Do not place standard probes on hot or acid-wetted sur-faces; do not immerse them in liquids. Special probe models are available for such applications (ref. the probe data sheets of the brochure “Measurement Probes and Measure-ment Aids - Optimized Probes - The Key to Successful Coat-ing Thickness Measurements”). You can obtain this brochure from the Helmut Fischer GmbH Institute for Elec-tronics and Metrology or from your authorized supplier.

Probe- connector ca-ble

R ≥ 50 mm !


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1.8 Handling, Storage and Transport of Calibration
StandardsThe instrument is calibrated using calibration standards in the form of foils or hard paper with various thicknesses. Proper condition of the calibration standards is an important prerequisite for a correct calibration, and thus for a correct measurement.

Observe the following to ensure the proper condition of the calibration standards:

1.9 Instrument RepairsNo repairs should be performed on the instrument.

To keep wear of the calibration standards during the contacting mea-surements to a minimum, use the calibration standards for the calibration only and not for test measurements!

Do not soil, bend or scratch calibration standards! Replace soiled, bent, scratched or cracked calibration standards or those with strong indentations with non-damaged standards. In particular foils with thicknesses of less than 50 ¬µm are subject to rapid wear. Rec-ommendation: Replace foils after no more than 100 to 200 measure-ments!

To protect the calibration standards from dirt or damage, keep them in their supplied case for transporting and storing.

The instrument may be opened only for replacing recharge-able or regular batteries ( Page 28). Other service opera-tions on the instrument or the accessories must be performed only by technical personnel authorized by Helmut Fischer GmbH.


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1.10 Warranty
The Helmut Fischer GmbH Institute for Electronics and Metrology will assume no warranties in the following instances:

Use of instrument or accessories for purposes other than the intended use.

Connection of accessories not recommended or approved by the Helmut Fis-cher GmbH Institute for Electronics and Metrology.

Repairs or structural changes to the instrument or accessories that have not been carried out by authorized persons.

Improper handling of instrument or accessories (e.g., use in explosion-haz-ard or very hot environments).

Disregard of information in this operator's manual.


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2 Description of the Instrument
Fig. 2-1 Front and rear view of the instrument, connections

1 Probe connector socket, Page 30

2 LCD Display, Page 14

3 Keys for directly retrieving functions, Page 16

4 USB port for connecting a PC

5 ON/OFF key to turn the in-strument on or off,

Page 33

6 Cover; additional function keys can be found under the cover, Page 16

7 Non-slip rubber supports

8 Foldable instrument stand

9 Battery compartment, Page 28

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2.1 LCD Display The LCD display consists of several display elements. When powering up the in-strument using ON/OFF ( Page 33), all display elements will appear briefly at the same time.
Display elements of the LCD display after power up (example)

Display element Explanation

A normalization is performed (on the uncoated specimen = base material)( beginning on Page 45).

A calibration is carried out( beginning on Page 47).

The measurement uses the magnetic induction method.

The measurement uses the eddy current method.

Padlock:

is enabled, i.e., the keys ZERO and CAL are not active, the service functions cannot be retrieved, applications cannot be deleted( beginning on Page 95).


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Arrow circle: “Free-running display” is enabled, measurements are displayed continuously when the probe is placed on the specimen( beginning on Page 74).

Alternatively:Display for area measurement

Display for automatic measurement

-8.8.8.8 Numeric elements for presenting readings, errors and warning messages.

Unit of measurement for the displayed reading.

Battery:The battery must be replaced or the rechargeable bat-tery must be charged because the voltage dropped be-low a minimum value ( beginning on Page 27).

Hourglass: Measurements are currently not possible because an in-strument-internal routine is running.

...SCOPE ...FKA...

Information lines:Instrument type:Instrument-internal software version

Display element Explanation


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2.2 Control panel key functionsFor easier opening:
Fig. 2-2 Opening the cover of the control panel keys

The overview on the following pages provides a brief description of the functions of the individual control panel keys:

Key Function

DEL Deletes the last measured reading2 x DEL: Deletes all readings

.. during normalization:1x DEL - Deletes the last reading,2x DEL - Deletes the measurement series of the base material.. during calibration:1x DEL - Deletes the last reading,2x DEL - Deletes the measurement series of the current cali-bration standard.Repeated pressing of DEL: Deletes the measurement series of the previous calibration standards ( beginning on Page 74)... in all menus:DEL - Returns to the previous menu or cancels the procedure.

1. Press on the corners of the cover and then

2. slide the cover downwards.


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FINAL-RES Retrieving the final result ( beginning on Page 78)

Repeated pressing of FINAL-RES: Displays the individual components of the final result (mean value, standard deviation, etc.) in succession.

.. and then ENTER: Ends the display of the final result (return to the measurement screen) and deletes the stored values.

.. and then ∧:Ends the display of the final result (return to the measurement screen) without deleting the stored values.

.. during calibration or normalization: Enables or disables the “free-running” display mode (display of the normalized countrates of the readings; readings will not be stored and will not be integrated in the calibration or normaliza-tion).

ON/OFF Turns the instrument on and off ( beginning on Page 33)

ZERO Retrieves the normalization ( beginning on Page 45)

CAL Retrieves the corrective calibration ( beginning on Page 47).. and then CAL: Cancels the corrective calibration.

.. and then DEL:Deletes the corrective calibration.

.. and then ZERO:Retrieves the calibration on the coating (possible only for mag-netic induction probes and the magnetic induction channel of dual probes).

.. and then ZERO:Retrieves the calibration on coating.

Key Function


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∧ With the calibration: Sets the target value of the used calibra-tion standard that will be displayed after the “CAL Target” noti-fication.With parameter selection: Selects the desired parameters.

The display will change faster if ∧ is pressed for longer than 3 seconds.

∨ Turns the “free-running” display mode on/off.

With the calibration: Sets the target value of the used calibra-tion standard that will be displayed after the “CAL Target” indi-cator.With parameter selection: Selects the desired parameters.

The display will change faster if ∨ is pressed for longer than 3 seconds.

SEND Transfers the values to a connected computer.

ENTER Confirms entries

5 x ENTER: Calls the service functionsThe instrument settings in the Service Functions menu are password-protected. “157” will be displayed after pressing EN-TER 5 times. Press ∧, 2 times to increase this value to the fac-tory-default password “159” and confirm the entry with ENTER.

Key Function


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2.3 Accessories
2.3.1 Probes

Various probe models are available for measurements on objects with different shapes and different surface properties. Special probes with different measure-ment ranges are available for the following areas of application, for example:

particularly rough or abrasive surfacesParticularly soft surfacesdamp, acidic contamination on the surfaceparticularly thick or thin coatingshot surfacesCoatings in pipes and bore holes

For available probe models and the probe model best suited for your application, see the respective probe data sheets of the brochure “Measurement Probes and Measurement Aids - Optimized Probes - The Key to Successful Coating Thick-ness Measurements”. You can obtain this brochure from Helmut Fischer GmbH Institute for Electronics and Metrology or from your authorized supplier.

All probes that can be connected to the instrument are equipped with a memory chip, a so-called EEPROM, in their connector plug. Probe-specific information (such as probe type, produc-tion number, measurement method or coefficients of the master characteristic, for example) is stored permanently - even with-out power supply - in this memory chip, which can be overwrit-ten as many times as desired.When powering up the instrument, this information is automat-ically retrieved and processed by the instrument; the instru-ment "recognizes" the connected probe.

Correct coating thickness measurements can be performed only if a probe that fits the measurement is used ( Chapter 5.2 ‘Assigning a New Probe’, beginning on Page 38).

Fig. 2-3 Probe plug of an FGAB 1.3 probe


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2.3.2 Calibration StandardsCalibration standards (in the form of foils or hard paper with different thickness-es) are used for the calibration; the standards are placed on the uncoated specimen in order to simulate a coating with a known thickness.
A probe-specific calibration standard set for the master calibration (can be or-dered as an option) and a probe-specific calibration standard set for the corrective calibration (included with the probe) are available for each probe model and have been compiled specifically for this probe model.You can obtain additional calibration standards of various thicknesses on request from Helmut Fischer GmbH Institute for Electronics and Metrology or from your authorized supplier.

Fig. 2-4 Calibration foil (example) and master foil (example)

At Helmut Fischer GmbH Institute for Electronics and Metrology, the foil thick-nesses of the calibration standards are determined using a mechanical axial cali-per. The function of the axial caliper has been verified using gauge blocks of the accuracy class I, which have been verified according to national standards.The guaranteed error limits stated on the calibration standards refer only to the identified reference area.

Due to the smaller error caused by deformation when compared to plas-tic foils, copper beryllium foils should be used for calibration standards with thicknesses of less than 30 µm.

Because copper beryllium is an electrically conducting material, CuBe standards may be used only for calibrating magnetic induction probes and/or for calibrating the magnetic induction channel of dual probes.

Masterfolie 2

75.0

Ordernumberof the calibration foil

Reference area

Foil thick-

Guaranteederror limit


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Certification of the Calibration StandardsCertificates for the calibration standards are available upon request from your au-thorized supplier or directly from the Helmut Fischer GmbH Institute for Elec-tronics and Metrology.

2.4 Technical Data

When measuring the thickness of foils with the same thickness but made of different materials (e.g., a 12 µm thick CuBe foil and a 12 µm thick plastic foil) on rough specimens, the values measured on these two foils may deviate by 1 - 2 µm from each other, depending on the roughness. This deviation is caused by the greater rigidity of the CuBe foil. (The rigid CuBe foil rests relatively plane on the roughness peaks while the soft plastic foil adjusts somewhat to the roughness due to the pressure force of the probe tip.) For this reason, the same foil material that is used for the calibration should also be used for the test measurements!

Instrument model DUALSCOPE® FMP20DELTASCOPE® FMP10ISOSCOPE® FMP10

Display Graphical backlit LCD display

Measurable coat-ings

Non-ferromagnetic coatings (NF) on steel or iron (Fe)Electrically non-conducting coatings (Iso) on non-ferromagnetic metallic base materials (NF)

Measuring modes Magnetic induction measurement methodAmplitude-sensitive eddy current method

Dimensions Instrument: 170 mm x 90 mm x 35 mm (L x W x H)LCD display: 44 mm x 57 mm (L x W)

Weight approx. 340 g (without probe, ready to operate)

Permissible ambi-ent temperature during operation

+10 °C ... +40 °C


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Permissible stor-age temperature
5 ... 60 °C

Permissible rela-tive air humidity

30 ... 90% (non-condensing)

Power supply

4 x 1.5 V batteries with about 50 h service life, (Size AA or Mignon) or4 x 1.5 V NiMH rechargeable batteries with about 45 h service life at 2100 mAh, (Size AA or Mignon)

Power consump-tion

0.3 W with the LCD display not illuminated0.5 W with the LCD display illuminated

Connectors Probe:10-pin round plugMini USB port

USB port

Mini AB

Minimum time between two measurements

About 0.2 seconds in the free-running mode

Minimum lift-off distance between two mea-surements

Dependant on the measurement range of the con-nected probe; at least 3 to 4 times the max. measur-able coating thickness

Measurement range, trueness and repeatability precision

Depends on the connected probe(These and other probe characteristics can be ob-tained from the brochure “Measurement Probes and Measurement Aids - Optimized Probes - The Key to Successful Coating Thickness Measurements”) of Helmut Fischer GmbH Institute for Electronics and Metrology or can be requested from your authorized supplier or directly from Helmut Fischer GmbH Insti-tute for Electronics and Metrology.)


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2.5 Contents of Shipment and OptionsAfter receiving the shipment, packaging and contents should be checked for po-tential damage. If the packaging, the contents or the accessories show signs of damage, retain the packaging. It might be needed to assert a claim for damages versus the shipping company.It is also advisable to keep the packaging for future transport.
Also verify that all components of the standard contents of the shipment and all ordered options are present. Notify your authorized supplier or the Helmut Fis-cher GmbH Institute for Electronics and Metrology if this is not the case.

2.5.1 Standard Contents of Shipment of the InstrumentThe standard contents of shipment of the instrument includes:

InstrumentBatteriesInterface cable FMP/PC,Carrying and storage case, carrying strapMini CD with USB driverOperator's ManualShort form operator's manual

2.5.2 OptionsAvailable options are:

Various measurement probesFoils - also with certificate - for the calibration and for verifying the calibrationProbe-specific calibration standard set for the master calibration - also with certificateCharger for NiMh batterySupport stand V12 for reproducible positioning of measurement probes on the specimenJig for angle probes for use in the support stand V12 (e.g., for probe FGABW 1.3)


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Jig for inside probes for use in the support stand V12 (e.g., for probe FGABI 1.3-150 mm)Support stand V12-AM for motor-controlled touch-down and lift-off of measurement probesPiston ring measuring stage V4FKB4 for measuring, for example, chrome coatings on piston rings and oil wiper ringsGuide device V5GW2/TW3 for angle probes for measurements at recessed or hard to reach areasPC-Datex software for transferring measurement data from the instru-ment to a Microsoft® Excel spreadsheet (add-in module for Micro-soft® Excel beginning with Version 95 under Windows® 95 to Windows® Vista)

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3 Measurement Methods for Coating Thick-ness Measurements
The following table shows an exemplary listing of FMP instruments and probes as well as the measuring application for which they can be used and the measure-ment method employed to measure the coating thickness.

Instrument Probe model Area of application Measurement method

DEL

TASC

OPE

FM

P10

DEL

TASC

OPE

FM

P 30 FGAB1.3 Determination of the thickness of

non-magnetic coatings on steel or iron. E.g, chrome, copper, zinc as well as paint, lacquer, enamel or plastic coatings on steel or iron.

Magnetic Induction Method According to DIN EN ISO 2178.

ISO

SCO

PE F

MP1

0IS

OSC

OPE

FM

P 30

FTA3.3 Determination of the thickness of electrically non-conducting, non-magnetic coatings on non-ferro-magnetic electrically conducting base materials. Paint, lacquer or plastic coatings on, for example, aluminum, copper, zinc, etc as well as anodized coatings on alu-minum.

Amplitude-Sensitive Eddy Current Method According to DIN EN ISO 2360.

DU

ALS

CO

PE F

MP2

0

D

UA

LSC

OPE

FM

P40

FD10 Determination of the thickness of non-magnetic coatings on steel or iron. E.g, chrome, copper, zinc as well as paint, lacquer, enamel or plastic coatings.

Magnetic Induction Method According to DIN EN ISO 2178.

Determination of the thickness of electrically non-conducting, non-magnetic coatings on non-ferro-magnetic electrically conducting base materials. Paint, lacquer or plastic coatings on, for example, aluminum, copper, zinc, etc as well as anodized coatings on alu-minum.

Amplitude-Sensitive Eddy Current Method According to DIN EN ISO 2360.


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3.1 Magnetic Induction Method
Contacting measurement method. The excitation current generates a low-fre-quency magnetic field with a strength that is dependent on the distance between the measurement probe and the base material. The magnetic field is measured by means of the measuring coil. The obtained measurement signal is converted in the instrument to a coating thickness value via the characteristic probe output function.

Glossary

3.2 Eddy Current MethodThe excitation current generates a high-frequency magnetic field that induces eddy currents in the material. The development of these eddy currents depends on the distance (coating thickness) between the measurement probe and the base material. The measurement signal, which captures the reaction of the magnetic field of the eddy currents on the original magnetic field, is converted into a read-ing that is proportional to the coating thickness.

Glossary

3.3 Measurements With DUAL Probes Dual probes (e.g., FD10) combine the magnetic induction and the eddy current methods. Thus, these probes can be used to measure both non-magnetic coatings or insulating coatings on steel or iron as well as insulating coatings on non-ferro-magnetic, electrically conducting base materials.


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4 System Setup, Maintenance and Clean-
ing

System setup consists of the following steps:

Providing the power supply for the instrument ( 4.1 ‘Power Supply’, beginning on Page 27)

Connecting a measurement probe to the instrument ( 4.2 ‘Connecting Probes’, beginning on Page 30)

Connecting a computer (if desired) to the instrument ( 9 ‘Data Transfer Using USB’, beginning on Page 81)

Selecting the language for the instrument if your language has not been set when the instrument was shipped ( 10.6 ‘Units’, beginning on Page 106)

4.1 Power SupplyElectrical power can be supplied to the instrument in the following ways:

4 x 1.5 V batteries (AA or mignon) or

4 x 1.5 V NiMh rechargeable batteries, 2100 mAh (AA or mignon).

To avoid electrical discharge, inserting a battery should be carried out only with the unit turned off! Even a small electri-cal discharge can delete the instrument’s memory.

The information in Chapter “1 Important Information” must be observed!


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4.1.1 Installing or Replacing Batteries
Procedure Battery Replacement

1. Use ON/OFF ( Page 33) to switch the instrument off (if not yet done).

2. Place the instrument with its back pointing up on the table. Open and remove the battery compartment cover on the rear of the instrument as depicted below.

Fig. 4-1 Opening the battery compartment cover

3. If old batteries are in the instrument, remove them from the unit. Other-wise, install new batteries directly; observe the correct polarity of the bat-teries

Indicator for battery replacement. Batteries or rechargeable bat-teries should be replaced.

If the battery voltage is too low, the instrument will turn off automatically.

Disposal: Do not dispose of batteries with regular household waste! Place damaged or used batteries / rechargeable batteries in designated collection containers! Please observe the guidelines in your region con-cerning proper handling of waste electrical and electronic equipment and accessories.


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4. Close the battery compartment cover.
Fig. 4-2 Inserting the batteries and closing the battery compartment cover

Use only type MIGNON, 1.5 V, LR6 - AA - AM3 - MN1500 batteries or 4 individual rechargeable batteries 1.2 V 2400 mAh Type AA.Using other batteries may lead to instrument damage.

Use only non-damaged batteries.

-

+

- - -

+ + +

LR6

1.5V

LR6

1.5V

LR6

1.5V

LR6

1.5V

Observe the cor-rect polarity when installing the bat-

teries.


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4.2 Connecting Probes
A measurement probe must be connected to the instrument to make coating thick-ness measurements. This must be an appropriate probe suitable for the base ma-terial.

1. Use ON/OFF ( Page 33) to switch the instrument off (if not yet done).

2. If the probe connected to the instrument is to be replaced, unscrew the knurled nut of the probe plug completely and pull the probe plug carefully from the connector socket of the instrument.

3. Plug the probe plug of the new probe into the probe connector socket of the instrument.

Connect probes only when the instrument is off!To turn the instrument off: Press the ON/OFF key on the right side of the control panel. The LCD display is not lit and no characters are visible.

Protect the instrument and accessories from electrostatic charges! Electrical discharges may damage internal components or delete internal memories. Such discharges may occur, for example, when connecting the probe to the instrument. Thus, please ensure that the person connecting a probe is properly grounded.It is recommended to store the instrument with the connected probe.


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Fig. 4-3 Probe plug and probe connector socket

4. Tighten the knurled nut of the probe plug.

Hold the plug tight to avoid an unintentional turning of the probe plug.

When inserting the plug, ensure that the key of the plug fits into the groove of the socket. Otherwise, an erroneous con-nection between the instrument and the plug may occur or the contact pins of the probe plug may be damaged.

To avoid damage to the contact pins of the probe plug, only the knurled nut may be turned! The probe plug must not be turned in the connector socket.

Groove (socket)Key (plug)


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Fig. 4-4 Connecting a probe

5. Use ON/OFF to turn the instrument on again. The instrument automati-cally recognizes the type of probe connected to it.

Exception: A flashing symbol for the measurement method on the LCD display indicates that the instrument does not recognize the connected probe. In such a case:

The probe must be assigned to the instrument ( 5.2 ‘Assigning a New Probe’, beginning on Page 38)

A new corrective calibration must be performed after the probe has been assigned ( Page 47)!

1.Probe connector plug

Connector socketInstrument

2.


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4.3 Turning the Instrument On/Off
4.3.1 Measurement Method of the Connected Probe After instrument power-up, the LCD display shows the measurement method of the connected probe or the measurement method of the last measurement carried out.With dual probes, the dual method set in the open Application will be displayed as well (For an explanation of the dual method: 5.3 ‘Setting Up the Dual Mode for DUAL Probes’, beginning on Page 39 / 10.5.6 ‘Dual Method’, begin-ning on Page 105).

To avoid erroneous readings, no metallic objects must be in close proximity to the probe tip when powering up the instrument. The minimum distance to be kept is probe-specific (Guideline: Five times the upper measurement range limit, i.e., a minimum distance of 25 mm should be maintained for a probe with the measurement range 0...5 mm).

Display Explanation

[ NF/Fe] Magnetic induction probe connected.

[ NC/NF] Eddy current probe connected.

[NF/Fe NC/NF] Dual probe connected and dual method set to [both] (i.e., in the open application, both methods can be used to make measurements).

[ NF/Fe NC/NF] Dual probe connected and dual method set to [NF/Fe] (i.e., in the open application, only the magnetic induction method can be used to make measurements).Or:The last time the probe has been placed on Fe material.

[NF/Fe NC/NF] Dual probe connected and dual method set to [NC/NF] (i.e., in the open application, only the eddy current meth-od can be used to make measurements).Or:The last time the probe has been placed on NF material.


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4.3.2 Power Up
Key se-quence

Detail of the LCD display

Explanation

ON/OFF Press the ON/OFF key to power up the in-strument.

You will hear an audible signal.

A monitoring routine will run automatically. All display elements of the LCD display will appear briefly at the same time ( Page 14).

At the end of the monitoring routine, the in-strument is ready to make measurements. The icon of the measurement method of the connected probe is displayed ( Page 33).

[μm] or [mm] or [mils]: Unit of measurement for the displayed reading

[Thickn.]: Measurement program “Coating thickness” ( 10.5.5 ‘Display’, beginning on Page 104)

[n=]: Number of the stored measurements

This error message appears briefly after power-up if no probe is connected to the instrument, if the probe is not connected properly or if the connected probe is defec-tive. It is not possible to make measure-ments without a connected probe.( 4.2 ‘Connecting Probes’, beginning on Page 30).


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4.3.3 Measuring Modes ( Chapter 10.5.5 ‘Display’, beginning on Page 104)Depending on the set measuring mode, one of the following can appear after power-up of the instrument:

a coating thickness reading d,

a normalized countrate Xn

a countrate X

d and Xs (countrate for a lifted-off probe) or

Xn and Xs .

4.3.4 Turning Off the Instrument Press the ON/OFF key to turn the instrument off manually.

The instrument shuts down automatically if for about 5 minutes no measurements are made or no key is pressed.

This warning appears briefly after power-up if a probe other than the last one used is connected to the instrument.( 5.2 ‘Assigning a New Probe’, begin-ning on Page 38).

Key se-quence


Explanation


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4.4 Cleaning
Soiled instruments or accessories should be cleaned using a plastic care product and a soft cloth.

The following should be observed during cleaning:

To avoid damage to the instrument due to electrical shock, the line plug of the AC adapter must be pulled before cleaning the instru-ment or the accessories!

Risk of electrical shorts!Water or other liquids must not enter the instrument or the acces-sories! Do not immerse or place the instrument or accessories into liquids to loosen dirt through soaking! Do not pour liquids on the instrument or accessories!

Wipe off dirt immediately to avoid it from drying onto the surface!

Do not use aggressive agents to clean the instrument or the accessories because they could attack the plastic housing!

To prevent damage, avoid scraping as a means of cleaning off dirt, in particular in the area of the probe tip.

Do not use aggressive agents to clean the calibration standards because they could damage the calibration standard! The use of damaged cali-bration standards (e.g., dirty or scratched standards) will lead to wrong measurement results! (For additional information: 1.8 ‘Handling, Stor-age and Transport of Calibration Standards’, beginning on Page 11)


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5 Probe Handling
5.1 Handling During Measurements

Always hold the probe at its grip sleeve (right fig-ure).

Always place the probe gently and at a right angle on the specimen surface.

Slide the grip sleeve to the specimen surface such that the sleeve rests on the specimen (center and bot-tom Figure, right).

With the default setting, a beep will signal the mea-surement capture.

Lift the probe off the specimen before making the next measurement.

Avoid hard impacts.Do not allow the probe to hover directly above the surface. Doing so will lead to erroneous readings.Do not bend the probe connector cable! Doing so can lead to broken wires.

Example:ProbeFGAB1.3

Grip sleeve

Specimen


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5.2 Assigning a New Probe
The instrument recognizes if the probe connected to the unit is different than the one expected according to the probe identification in the current Application.Reason: Each individual probe has a name consisting of the identification num-ber and the model designation (e.g., FGAB 1.3). The probe must be “registered” in the instrument under this name.

Potential Causes of Problems:

The probe received a different identification number after a repair.

A newly purchased probe has not yet been assigned.

If a user has more than one probe of the same probe model, a problem occurs if a not yet assigned probe is connected to the instrument. In such a case, it is advisable to identify the probes and/or instruments with numbers.

If the instrument is powered up and a probe other than the one used last is con-nected, the following display will appear:

Key sequ./ Action


Explanation

This warning appears briefly after power-up if a probe other than the last one used is connected to the instrument.

After a bief time, the display shown to the left will appear.Example: FD10 = Name of the connected probeDEL: Probe assignment startsENTER: Probe will not be assigned, mea-surement method display flashes

DEL DEL: All stored readings will be deleted.ENTER: The probe will not be assigned, measurement method display continues to flash


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5.3 Setting Up the Dual Mode for DUAL Probes If a DUAL probe is connected to the instrument, the menu Dual method will appear additionally in the menu Service Functions / Measurement ( 10.5.6 ‘Dual Method’, beginning on Page 105). Select the measurement method from this menu:

ZERO and CAL appear on the display.A normalization and a corrective calibra-tion must be performed ( beginning on Page 45).ENTER: The normalization will be skipped. Only a corrective calibration will be per-formed.DEL (2x): The existing corrective calibra-tion will be deleted.CAL: The action will be canceled. Neither the normalization nor the corrective cali-bration will be carried out.

Detail of the LCD display Explanation

NF/Fe: Measurements using the magnetic induction methodNC/NF: Measurements using the eddy current methodboth: Measurements are possible using the eddy current or the magnetic induction methods

Use the error keys ∧ or ∨ to make the selection.Confirm the selection by pressing ENTER.

Key sequ./ Action


Explanation


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If a dual probe is connected to the instrument, the dual method that has been set
up will be displayed on the LCD display after power-up ( 4.3.1 ‘Measurement Method of the Connected Probe’, beginning on Page 33):

If the dual method is set to both, both measurement methods can be used to make measurements. When the probe is placed on the specimen, the correct measure-ment method will be selected automatically.If the dual method is set to NC/NF or NF/Fe, only the respective selected mea-surement method can be used to make measurements. This can ensure, for exam-ple, that only the coating of interest of a multi-coating system is determined.For example, to measure the thickness of the Iso coating from Fig. 5-1, the NF coating must have a certain minimum thickness (e.g., for zinc about 60 µm) and the dual method must be set to NC/NF:

Fig. 5-1 Sample structure of a multi-coating system

If the setting is NF/Fe, the ferromagnetic base material will be taken into account and the thickness of the Iso coating plus the NF coating will be determined.However, if the setting is both, either the Iso coating alone (for relative thick NF coatings) or the thickness of the Iso coating plus the NF coating (for relatively thin NF coatings) will be determined depending on the thickness and electrical conductivity of the NF coating.

The measurement uses the magnetic induction method.

The measurement uses the eddy current method.

The dual method can be set up separately for each Application. The dual method settings of the other Applications will not be affected.

Insulating coating (Iso coating)Non-ferromagnetic metal (NF coating)

Ferromagnetic base material


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6 Normalization, Calibration and Master Calibration
Many factors influence the readings of a coating thickness measurement (7.2 ‘Influencing Parameters’, beginning on Page 66). These influences can be corrected through a normalization and a calibration.

A normalization is sufficient if these properties change only slightly. As a rule, a normalization should be performed in the uncoated reference area of the current specimen.

A corrective calibration is required if the changes in shape, magnetic perme-ability or electrical conductivity are greater and can no longer be corrected with a normalization.

A master calibration must be performed if the changes to the aforementioned properties are extremely large.

If an uncoated specimen is not a available, a Calibration on coating, i.e., a cal-ibration on a coated specimen can be performed. Only minor changes in speci-men shape can be corrected with a calibration on coating.

With the same type of specimen, a new normalization, corrective calibration or master calibration should be performed only if inad-missible deviations from a control sample are present. Most often, these deviations are caused by probe tip wear.

For the normalization, corrective calibration and master calibration, an uncoated material must be used that corresponds to the speci-mens to be measured in its base material and shape! The supplied reference part (Fe or Al base) must not be used for the normaliza-tion or calibration because its material properties do, as a rule, not correspond to those of the specimen. (It may be used for a function check, for example.)

A calibration on coating can be performed only with magnetic induc-tion probes or the magnetic induction channel of dual probes. A cal-ibration in coating is not possible with eddy current probes or the eddy current channel of dual probes.


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6.1 Information Regarding Normalization, Calibration and Master Calibration
The information in Chapter “1 ‘Important Information’, beginning on Page 7” should be observed with every normalization, calibration and master calibration!

All measurements should be performed with great care! Only in this manner can the trueness specified for the used probe be ensured during the subse-quent measurements.

Reference measurements should be performed after every normalization and calibration to verify the normalization and calibration.

CuBe calibration standards must be used for the calibration of magnetic induction probes or for the calibration of the magnetic induction channel of dual probes only, because the thickness of the CuBe standards can be mea-sured only with the magnetic induction method.

The information in Chapter 6.2 ‘Specific Features of DUAL Probes’, beginning on Page 44 should be observed when performing normalizations and calibrations that have been set up using a dual probe!

It is not possible to start a normalization, corrective calibration, calibration on coating or a master calibration as long as the restricted operating mode is enabled (indicated by on the LCD display) ( 10.4.1 ‘Restricted operat-ing mode’, beginning on Page 95)!

With external start enabled, a measurement acquisition can be triggered dur-ing a normalization or calibration by:- Pressing the FINAL-RES key,- Transmitting one of the ASCII characters “G0”, “ES”, “EN” or- the control character “ESC?” via the USB port (ESC = ASCII27). Enabling externally triggered measurement acquisition: 10.5.3 ‘External Start’, beginning on Page 100; 9.4.2 ‘Control Commands’, beginning on Page 84


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6.1.1 Recommended Number of Single Readings During a Nor-malization, Calibration and Master Calibration
In addition to the measurement probe, the number of individual measurements to be carried out depends to a great extent also on the specimen. The following pro-cedures are recommended:

A minimum of 5 single readings with typical (not very rough) technical sur-faces and only slightly curved measurement locations.

With rough surfaces, strongly curved measurement locations, soft coatings, inhomogeneous base materials, etc., individual measurements should be per-formed until the displayed standard deviation “s” is less than 1/20 of the tol-erance limit spread of the coating to be measured.

Example of a zinc coating:Upper Specification Limit USL: 25 µm (Upper Tolerance Limit)Lower Specification Limit LSL: 15 µm (Lower Tolerance Limit)Specification limit spread = USL - LSL = 10 µmMax. admissible standard deviation s = 0.5 µm

If the standard deviation “s” is still greater than admissible even after 5 - 10 single readings, either probe positioning aids (prisms, support stands, etc.) should be used or a probe that is better suitable for the measuring application should be selected.


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6.2 Specific Features of DUAL Probes The first measurement performed during a normalization or calibration with a dual probe determines the channel of the dual probe that is normalized or cali-brated (indicated on the display with “Fe” or NF). For example, if the first mea-surement for a normalization is performed on a ferromagnetic specimen, the magnetic induction channel of the dual probe will be normalized during the sub-sequent normalization.
6.3 Reference Measurements During a reference measurement, readings are obtained on a reference specimen. If the deviations of these readings exceed the limit values specified by the com-pany, the normalization or calibration that is checked using the reference mea-surement must be performed again.

A reference sample (coated specimen with a known thickness that corresponds to the parts to be measured in base material, coating material and shape) is required for a reference measurement.

Reference specimens are subject to wear caused by the contacting measurement. Reference specimens must be checked regularly and replaced by new reference specimens if wear is too great.


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6.4 Normalization
With the normalization, a new zero point is established for the calibration curve and stored in the instrument.

Required materialsReference part: Uncoated part from the production.

6.4.1 Normalization Procedure

Key sequ./ Action


Explanation

ZERO Use ZERO to start the normalization.ZERO appears and remains on the LCD display while the normalization is per-formed.

[s]: Standard deviation[n]: Number of measurements[Base material (Fe/NF)]: Measurements should be performed on an uncoated spec-imen (Fe or NF display for the type of base material).When using dual probes, the type of base material will be displayed only after the 1st measurement is completed.

[Cancel: ENTER]: Using ENTER cancels the normalization.


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Perform several check measurements by measuring the thickness of a cali-bration standard placed on the uncoated reference area in order to verify a correct normalization. The thickness of the standard should be close to the nominal thickness value of the coating to be measured.

Perform measurements on the uncoated specimen (base material).Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.The mean value of all readings obtained for the normalization will be displayed.

[s]: Standard deviation[n]: Number of measurements

[Base material]: Measurements should be performed on an uncoated specimen. The base material (NF) or (Fe) will be dis-played.[Delete: DEL]: Use DEL to delete the last measurement, 2x DEL to delete all read-ings obtained for the normalization.[OK: ENTER]: Using ENTER ends the normalization.

ENTER A confirmation indicating that the normal-ization has been carried out successfully appears.Pressing ENTER confirms the message.

ENTER The new characteristic will be computed automatically and stored. The instrument is again ready to make measurements. 2.1 ‘LCD Display’, beginning on Page 14).

Key sequ./ Action


Explanation


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if the obtained mean value is with the guaranteed error limits stated on the foil, delete the readings of the reference measurement before starting with the measurements on your specimens.
If the mean value is not within the guaranteed error limits, perform a correc-tive calibration.

6.5 Corrective calibration

With a corrective calibration, a new zero point and one additional point (one-point calibration with one calibration standard) or two additional points (two-point calibration with two calibration standards) are established for the calibra-tion curve and are stored in the instrument.

Required materials

Reference part (uncoated part from the production)

Calibration foils

6.5.1 Selecting the Calibration Standards for the Corrective Calibra-tion

A corrective calibration using the calibration standards included with the probe shipment provides the best measuring precision for the entire measurement range of the probe. To enhance the measuring precision in a certain thickness range, a foil with a thickness in this specific range may be used as well. However, the measuring precision outside of this particular thickness range will not be as good as with the corrective calibration using the probe-specific calibration standards.


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6.5.2 Corrective Calibration Procedure
Key sequ./ Action


Explanation

CAL Use CAL to start the corrective calibration.CAL appears and remains on the LCD dis-play while the corrective calibration is per-formed.


[Base material (Fe/NF)]: Measurements should be performed on an uncoated spec-imen (Fe or NF display for the type of base material), i.e., a Normalization is carried out.When using dual probes, the type of base material will be displayed only after the 1st measurement is completed.

[CAL-Delete: DEL]: Using DEL deletes the corrective calibration ( Page 52).

[Skip: ENTER]: Using ENTER skips the normalization (the stored normalization is retained unchanged).

[Cancel: CAL]: Using CAL cancels the corrective calibration (the stored corrective calibration is retained unchanged).

ZERO: Pressing ZERO starts the “calibra-tion on coating” procedure ( Page 53).


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Perform measurements on the uncoated specimen (base material) (normalization).Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.The mean value of all readings obtained for the normalization will be displayed.


[Base material]: Measurements should be performed on an uncoated specimen, i.e., a normalization is carried out. The used base material (NF) or (Fe) will be dis-played.[Delete: DEL]: Use DEL to delete the last measurement, 2x DEL to delete all read-ings obtained for the normalization.[OK: ENTER]: Using ENTER ends and stores the normalization.

ENTER [Entry: ∧∨]: Use the arrow keys to set the nominal thickness value of the calibration standard. The rated value is printed onto the calibration standard.The rated value can be set faster if a mea-surement is performed on the calibration standard and then the rated value is cor-rected using the arrow keys.

[CAL-rat.1: 23.70]: Display of the set rated value for the thickness of the calibration standard (Example: 23.7 µm)

[Cancel: ENTER]: Using ENTER cancels the calibration procedure

Key sequ./ Action


Explanation


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Place the calibration standard 1 (in the ex-ample with a thickness of 23.7 µm) on the uncoated specimen and perform measure-ments.Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.Displayed is the mean value of all mea-surements performed for this step.


∧ or ∨ [Entry: ∧∨]: Use the arrow keys to set the nominal thickness value of the calibration standard. The rated value is printed on the calibration standard. The rated value can be set faster if a measurement is per-formed on the calibration standard and then the rated value is corrected using the arrow keys.

This step is not required if - as shown in the example - the rated value for the thick-ness of the calibration standard coincides with the stored thickness.

[OK: ENTER]: Using ENTER ends the cur-rent calibration step.

ENTER If a corrective calibration is desired with 2 standards, proceed in the same manner with calibration standard #2.Otherwise: Use ENTER to end the correc-tive calibration.The new characteristic will be computed automatically and stored.The instrument is again ready to make measurements.

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Perform several reference measurements by measuring the thickness of the standards used for the calibration on the uncoated reference area in order to verify a correct corrective calibration.

If the obtained mean value is within the guaranteed error limits stated on the foil, delete the readings of the reference measurement before starting with the measurements on your specimens.

If the mean value is not within the guaranteed error limits, repeat corrective calibration.

ENTER A confirmation indicating that the correc-tive calibration has been carried out suc-cessfully appears.Pressing ENTER confirms the message.

Calibration standards are included with the probe shipment.To obtain a high measuring precision, it is recommended to select two standards for the corrective calibration as follows:1st calibration standard: The thickness corresponds approximately to the upper limit of the measurement range.2nd calibration standard: The thickness corresponds approximately to the lower tolerance limit of the measurement range.A corrective calibration with only one calibration standard is suffi-cient if coating thickness measurements are performed that are nar-rowly around a target value. In such cases, the thickness of the calibration standard should correspond approximately to the target coating thickness value.

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6.5.3 Deleting a Corrective Calibration
When deleting the corrective calibration of a dual probe, only the corrective calibration of the currently active channel will be deleted.

Key sequ./ Action


Explanation

CAL Use CAL to start the corrective calibration.

[CAL-Delete: DEL]: Using DEL deletes the corrective calibration.

[Cancel: CAL]: Using CAL cancels the corrective calibration (the stored corrective calibration is retained unchanged).

DEL [Yes: DEL]: The corrective calibration will be deleted.[No: ENTER]: Cancels the delete proce-dure.

DEL The corrective calibration will be deleted.The instrument is again ready to make measurements.


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6.6 Calibration on a CoatingWith a calibration on coating, an adjustment for the base material is made through an existing coating by making measurements on a calibration standard (included in the probe shipment) placed on this coating.
When should it be performed

A “calibration on coating” is necessary when no uncoated specimen is avail-able as a reference part, e.g., during the receiving inspection or for measure-ments on site.

Required materials

Reference part (coated part from the production)

Calibration standards (included with the probe shipment)

6.6.1 Procedure for a Calibration on CoatingA normalization is required before a calibration on coating can be performed ( Page 45).

The following error message appears if a normalization has not yet been per-formed:

Please note that a Calibration on coating does not provide as good an adjustment for the base material as a calibration with an uncoated refer-ence part. The additionally encountered measurement error depends on the coating thickness that is present during the calibration and on the thickness of the used calibration standard; for this reason, it is not possi-ble to provide a generally applicable value for this additional measure-ment error.If at all possible, an uncoated reference part should be used for the cali-bration.


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Key sequ./ Action


Explanation

CAL + ZERO Use CAL + ZERO to start the calibration on coating.ZERO + CAL appear and remain on the LCD display while the calibration on coat-ing is performed.


[Coating Sample]: Measurements should be performed on the uncoated specimen.

[Cancel: ENTER]: Using ENTER cancels the current calibration step.

Perform measurements on the coated specimen (base material).Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.The mean value of all readings obtained in this step will be displayed.


[CBase material.]: Measurements shall be performed on the coated specimen. The used base material (NF) or (Fe) will be displayed.

[Delete: DEL]: Use DEL to delete the last measurement, 2x DEL to delete all read-ings obtained for the normalization.

[OK: ENTER]: Use ENTER to end and store the calibration step.


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ENTER [∧ ∨]: Use ∧ or ∨ to set the rated value for the foil thickness (value printed on the cor-rection foil).This step is not required if the rated value for the foil thickness coincides with the stored foil thickness.

[Cancel: ENTER]: Use ENTER to cancel the calibration step.

Place the calibration standard on the coat-ed specimen and perform measurements.Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.The mean value of all readings obtained in this step will be displayed.

[Entry: ∧∨]: Use the arrow keys to set the nominal thickness value of the calibration standard. The rated value is printed onto the calibration standard.The rated value can be set faster if a mea-surement is performed on the calibration standard and then the rated value is cor-rected using the arrow keys.


[Delete: DEL]: Use DEL to delete the last measurement, 2x DEL to delete all read-ings obtained for the calibration.

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To verify the calibration on coating proceed as follows:

1. Through several reference measurements ( Glossary), determine the mean value of the thickness of the reference coating.

2. Through several reference measurements, determine the mean value of the total thickness, comprised of the calibration standard used for the calibra-tion and the reference coating.

3. Compute the difference of the two coatings. It must correspond to the engraved value of the calibration standard.

If the computed difference (thickness of the calibration standard) is within the guaranteed error limits stated on the standard, delete the readings of the reference measurements before starting with the measurements on your specimens.

If the computed difference is not within the guaranteed error limits, perform an additional calibration on coating.

ENTER A confirmation indicating that the calibra-tion on coating has been carried out suc-cessfully appears.Pressing ENTER confirms the message.

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6.7 Master CalibrationThe master calibration determines the coefficients of the master characteristic and stores them in the EEPROM of the probe plug. These coefficients determine the master characteristic, i.e.; the correlation between the measurement signal of the probe and the coating thickness.
The EEPROM in the probe plug contains memories for the coefficients of two master calibrations. These two master calibrations differ from each other in the following manner:

Factory Master CalibrationOne master calibration (factory master calibration) is performed at the facility of the Helmut Fischer GmbH Institute for Electronics and Metrology with a very high precision and, depending on the probe type, using at least 8 or more calibra-tion standards. It cannot be deleted or overwritten by the user.

User Master CalibrationYou can set up the user master calibration by yourself using 4 - 8 calibration stan-dards. This memory is empty when a new probe is supplied. Once the user has set up his “own” master calibration in the manner described below, he can over-write or even delete this calibration, if needed.

At least 4 calibration standards are required to set up a user master calibration. They are part of the optional probe-specific master calibration standard set. The Xn value of one of these calibration standards must be within the prescribed Xn range of the master calibration for all 4 Xn ranges to be “occupied”.

To increase the measuring precision in a certain measurement interval of the probe, up to 4 additional calibration standards with thicknesses in this interval can be used. This means that max. 5 calibration standards can be in an Xn range of the user master calibration.

If the user master calibration is deleted and an new one is not set up, the factory master calibration will be used automatically to make measurements.

An existing corrective calibration will be deleted after a user master calibration is set up or deleted. This means that after deleting the user calibration and continued measurement with the factory master calibration, a new corrective calibration should be performed - if necessary.


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6.7.1 Selecting the Calibration Standards
During the user master calibration, the master characteristic can be determined only if suitable calibration standards are used. The calibration standards are suit-ed for the user master calibration only if their normalized countrates Xn are with-in pre-established probe-specific Xn ranges. The Xn values can be displayed after the 1st step of the user master calibration (normalization) (Query of the probe-specific limits of the Xn ranges for the connected probe during the master cali-bration: Page 63.)

6.7.2 Performing a User Master Calibration

If a dual probe is connected, only the normalization and corrective calibra-tion of the measuring method in which the new master calibration has been performed will be deleted.

Required materials

Uncoated specimen with base material and shape that correspond to those of the actual parts to be measured

Probe-specific calibration standard set (master foils)

For the user master calibration, it is essential to use the probe-specific calibration standard set that is associated with the connected probe! Only in this manner can the trueness specified for the used probe be ensured during the subsequent measurements.

A user master calibration (hereafter simply referred to as a master cali-bration) must be performed only by experienced users.


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6.7.3 Master Calibration Procedure
The master calibration is retrieved from the Service function menu ( 10.8 ‘Performing a Master Calibration’, beginning on Page 107).

Key sequ./ Action


Explanation

5 x ENTER2 x ∧

Press ENTER 5 times to retrieve the “Ser-vice Function” menu and set the identifica-tion number 159 of the Service Functions using the arrow key ∧.Retrieve the master calibration from the Service Functions menu and use ENTER to start the procedure.

ENTER ZERO + CAL appear and remain on the LCD display while the master calibration is performed.


[MCL Delete: DEL]: Use DEL to delete an existing master calibration (appears only if a master calibration has already been per-formed). Use CAL if you do not wish to de-lete the master calibration.

[Cancel: CAL]: Using CAL cancels the master calibration.

If you press DEL again after deleting the master calibration in order to exit the menu, subsequent measurements will be made with the factory master calibration - without a corrective calibration.


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Key sequ./ Action


Explanation

Perform measurements on the uncoated specimen (base material).Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.The mean value of all readings obtained for the normalization will be displayed.


[Base material]: Measurements should be performed on an uncoated specimen, i.e., a normalization is carried out. The used base material (NF) or (Fe) will be dis-played.


[OK: ENTER]: Use ENTER to end and store the normalization. The previous nor-malization will be overwritten


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ENTER [Entry: ∧∨]: Use the arrow keys to set the nominal thickness value of the calibration standard. The rated value is printed onto the calibration standard.The rated value can be set faster if a mea-surement is performed on the calibration standard and then the rated value is cor-rected using the arrow keys.


[Cancel: ENTER]: Using ENTER cancels the calibration procedure

Pressing FINAL-RES:Determination of the Normalized Countrate Xn of a Calibration Standard During a Mas-ter Calibration Page 65.Pressing ZERO: Displaying Xn Ranges for Calibration Stan-dards for the Master Calibration Page 63.

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Place the calibration standard 1 (in the ex-ample with a thickness of 23.7 µm) on the uncoated specimen and perform measure-ments.Perform the number of individual measure-ments recommended in Chapter 6.1.1, Page 43 at various points of the reference area.Displayed is the mean value of all mea-surements performed for this step.




[OK: ENTER]: Use ENTER to end and store the calibration step.

∧ or ∨ Use ∧ or ∨ to set the rated value for the foil thickness (value printed on the correc-tion foil).This step is not required if the rated value for the foil thickness coincides with the stored foil thickness.

[OK: ENTER]: Using ENTER ends the cur-rent calibration step.

ENTER Proceed with calibration standard #2 (mas-ter foil #2) in the same as described for calibration standard #1. The same for all subsequent calibration steps.

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Perform several reference measurements by measuring the thickness of the master foils used for the calibration on the uncoated reference area in order to verify a correct master calibration. If the obtained mean values are outside the guaranteed error limits stated on the foils, the master calibration must be repeated.

Now, it is possible to make measurements. Delete the readings of the reference measurement before starting with the measurements on your specimens.

6.7.4 Displaying Xn Ranges for Calibration Standards for the Master Calibration

During the master calibration, the master characteristic can be determined only if suitable calibration standards are used.The calibration standards are suited for the master calibration only if their nor-malized countrates Xn are within pre-established probe-specific Xn ranges. The probe-specific limits of the Xn ranges for the connected probe can be queried dur-ing the master calibration without affecting the calibration.

ENTER After the last calibration step has been concluded using ENTER, the new calibra-tion curve will be computed automatically and stored, and a confirmation indicating that the master calibration has been car-ried out successfully appears.Pressing ENTER confirms the message.

Please note the information regarding the number of calibration stan-dards under 6.7 on Page 57.

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Key sequ./ Action


Explanation

5 x ENTER2 x ∧

Retrieve the master calibration from the Service Functions menu and use ENTER to start the procedure. Relevant explana-tions beginning on Page 59.

ZERO Using ZERO displays the probe-specific Xn range for calibration standard #1 (mas-ter foil #1).[0.0300<Xn<0.1500]: Xn range limits, the normalized countrates Xn of calibration standard #1 must be within this range.The specific limits for the probe FD10 are shown here as an example.

ZERO Using ZERO displays the probe-specific Xn range for calibration standard #2 (master foil #2) [0.1500<Xn<0.3500].



ZERO Use ZERO to end the display of the probe-specific Xn range.It is now possible to continue the master calibration.Or: Press CAL + DEL to return to the mea-suring mode.


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6.8 Determination of the Normalized Countrate Xn of a Calibration Standard During a Master Calibration
The normalized countrate Xn of a calibration standard can be determined as de-scribed below during a master calibration without affecting the calibration.

Because FINAL-RES triggers a measurement acquisition if external measurement acquisition is enabled, is not possible to determine the normalized countrate if external start is enabled during a calibration!

Key sequ./ Action


Explanation

FINAL-RES Retrieve the master calibration from the Service Functions menu and use ENTER to start the procedure. Relevant explana-tions beginning on Page 59.Press FINAL-RES to start the procedure.

Place the probe whose normalized coun-trate Xn is to be determined on the calibra-tion standard. The normalized countrate Xn of the calibration standard will be dis-played (the normalized countrate will not be stored!).

FINAL-RES [off: FINAL-RES]: Using FINAL-RES re-turns the free-running display mode to the disabled state.It is now possible to continue the calibra-tion.


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7 Measuring
7.1 Preparing for a Measurement The instrument and the measurement area must be prepared in the following manner before measurements can be made:

Agreement on the reference areas (determination on where several single readings are to be taken), according to DIN EN ISO 2064.

Ensuring that the reference areas are free of interfering contaminants (e.g., moisture, dirt or grease) and are not damaged.

Carrying Out the System Setup ( Page 27).

Switching on the instrument ( Page 34).

Determining the instrument configuration ( Page 86).

Verifying the normalization and calibration through reference measurements on an uncoated specimen and on a specimen with a known coating thickness ( Page 44).

7.2 Influencing ParametersThe following factors influence the readings of a coating thickness measurement:

Geometry of the specimen (size of the reference area = measurement area, curvature, surface roughness, base material thickness)

Magnetic permeability or electrical conductivity of the specimen

Probe handling by the operator, in particular during probe placement

The influences of these factors can be corrected through a normalization ( be-ginning on Page 41) or a calibration ( beginning on Page 47, Page 57).

The information stated in Chapter 1 ‘Important Informa-tion’, beginning on Page 7 must be observed when making measurements!


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7.3 Making a Measurement To make a measurement, place the probe at a right angle on the specimen surface ( Page 37). The probe can be lifted off after measurement acquisition, i.e., af-ter the reading appears on the display. The instrument is ready to make measure-ments.
Observe the following during the measurement:

Measurements should be made within the reference area.

To avoid erroneous readings, do not allow the probe to hover above the spec-imen.

How high the probe should be lifted off depends on the measurement range of the probe. To obtain a correct air value, the distance to the specimen should be at least 3 to 4 times the max. measurable coating thickness.

To allow sufficient time for a measurement acquisition, the time between individual measurements must be greater than 0.5 seconds.

Fig. 7-1 Measurement using an axial probe

Fig. 7-2 Measurement using an angle probe

1. Place the probe: 2. Lift the probe off:

Measurement

1. Place the probe: 2. Lift the probe off:

Measurement Ob-


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In addition, the following should be observed when using two-tip probes for the measurements:
With cylindrical specimens: Place the probe tips parallel to the longitudinal axis!

Place both probe tips simultaneously and with the same pressure on the spec-imen!

For specimens with a base material exhibiting a preferred magnetic direc-tion, it is recommended to generate the measured value from two averaged readings with the probe being rotated by 90° after the first measurement. A preferred magnetic direction may be created through specimen processing (e.g., rolling or drawing of sheet metal).

Measurements using two-tip angle probes on specimens with a preferred magnet-ic direction:

Fig. 7-3 Measurements using two-tip probes

90°

1. Place the probe

2. Lift the probe off

4. Place the probe

6. Rotate the

90°

Specimen with a preferred magnetic direction

3. Rotate the probe

5. Lift the


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7.3.1 Measurement Acquisition Measurement acquisition occurs automatically immediately after the probe is placed on the specimen.An audible signal will sound after the measurement acquisition (unless it has been disabled) ( 7.3.4 ‘Audible signals After the Measurement Acquisition’, beginning on Page 73).
With the “free-running” display mode on, measurement acquisition can be trig-gered in the following manner ( 7.5 ‘Measurements in the Free-Running Dis-play Mode’, beginning on Page 74):

Pressing the ENTER key

Transmitting one of the ASCII characters “G0”, “ES”, “EN” or

Transmitting the control character “ESC?” via the USB port (ESC = ASCII27)

( 9.4.2 ‘Control Commands’, beginning on Page 84)Regardless of how the measurement acquisition occurred, the reading will appear on the LCD display following the measurement acquisition.


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7.3.2 Measurements With External Start EnabledWhen an automatic measurement acquisition is not desired, e.g., when making measurements in pipes, boreholes or grooves, external start should be enabled and automatic measurement acquisition disabled. (Enabling externally triggered measurement acquisition and disabling automatic measurement acquisition:
Page 100)

With external start enabled, the measurement acquisition can be triggered manu-ally in the following ways once the probe is positioned on the measurement loca-tion:

Press the ∧ key (not with a normalization or calibration)

Press the FINAL-RES key (only during a normalization or calibration)

Transmitting the “ES” command via the USB port ( 9.4.2 ‘Control Commands’, beginning on Page 84)

7.3.3 Automatic Measurements A description of the two acquisition modes will follow under modes for automat-ic start of measurements after placing the probe. However, both methods will also work with externally triggered measurement acquisition ( Page 70), but not in the free-running-mode ( Page 74)!

With externally triggered measurement acquisition, the measurement acquisition can be delayed by up to 2.5 sec ( 10.5.3 ‘External Start’, beginning on Page 100)


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Measurement Capture Through Area Measurements With area measurements, the single readings are taken as fast as possible until the probe is lifted off. Only the mean value is stored.
This measuring mode is advantageous if a mean value is to be determined quickly within a reference area. This mean value is added to a measurement series as a single reading.With online output of the single readings via the USB port enabled, only this mean value will be output as well.

The magnetic poles are subject to increased wear when moving the probe across a surface.

Key sequ./ Action


Explanation

Switch area measurement on from the menu Service Functions / Measurement / Measuring mode ( 10.5.4 ‘Measuring Mode - Standard/Area Measurement/Auto-matic Measurement’, beginning on Page 102) and place the probe on the specimen. The LCD displays the sym-bol as long as the probe is on the speci-men. In addition, an audible signal sounds when the probe is placed on the specimen.Move the probe with a slight and uniform pressure across the specimen.

[Thickn.]: Displays the coating thickness readings[n=]: Number of the stored measurements

Lift the probe off the specimen.

An audible signal indicates the end of the measurement.


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Measurement Capture Through Automatic MeasurementsWith automatic measurements, a specified number of readings is taken with a se-lectable time interval between 2 measurements. In contrast to the area measure-ment, all single readings will be stored ( Page 70).
This measuring mode can be advantageous, for example, when the coating thick-ness distribution shall be determined along a line. If the probe is moved by hand or a suitable mechanical device along a line at a consistent speed, then the mea-surement points will be at equal distances.

Key sequ./ Action


Explanation

Switch “Automatic measurement” on from the menu Service functions / Measurement / Measuring mode and select the desired number of measurements and the time in-terval of the measurements ( 10.5.4 ‘Measuring Mode - Standard/Area Measurement/Automatic Measure-ment’, beginning on Page 102).

Place the probe on the specimen. The LCD displays the symbol for as long as the probe is on the specimen.An audible signal sounds for every mea-surement that occurred. All measurement data are evaluated statistically.


[Thickn.]: Displays the coating thickness readings[n=]: Number of the stored measurement data.


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7.3.4 Audible signals After the Measurement Acquisition An audible signal will sound after the measurement acquisition (unless it has been disabled). The measurement acquisition signal indicates that a signal arriv-ing from the probe has been recognized and that the probe can be lifted off the specimen.
As an option, the measurement acquisition signal can be disabled ( 10.5.1 ‘Audible Signal’, beginning on Page 98). The other audible signals cannot be disabled!

7.3.5 Display of the measurement method in use when making measurements with dual probes

After powering up the instrument, the measurement method of the connected probe appears on the LCD display ( 4.3.4 ‘Turning Off the Instrument’, begin-ning on Page 35). In addition, with dual probes, the measurement method used for the last per-formed measurement will be indicated.

Display Explanation

[ NF/Fe NC/NF] The magnetic induction method was used for the mea-surement with the dual probe.

[NF/Fe NC/NF] The eddy current method was used for the measurement with the dual probe.


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7.4 Erroneous Readings
7.4.1 Deleting Erroneous Readings If an erroneous reading is recognized directly after measurement acquisition, the reading can be deleted by pressing DEL. Pressing DEL twice will delete all readings.

7.5 Measurements in the Free-Running Display Mode When making measurements in the “free-running” display mode, the coating thickness distribution across the surface can be determined simply by moving the probe along the surface. In the “free-running” display mode,

the readings are displayed continuously, and

the readings are not accepted and stored automatically,

the data are output continuously via the USB port only if [Free-running transmit on] has been selected from the Service functions.

As long as the “free-running” mode is on, measurements acquisition can be triggered using ENTER.

Measurements that are outside the measurement range, e.g., when the probe is lifted off the surface, are also output to the USB port.


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7.5.1 Turning the Free-Running Display Mode On/OffTo enable the free-running display mode: Press the ∨ arrow key.
The “free-running” display mode remains enabled until it is disabled; i.e., it does not need to be enabled every time the instrument is powered up.

To disable the free-running display mode: Press the arrow key ∨ again.

As long as the “free-running” display mode is enabled,

will appear on the LCD display,

the acquisition of a reading can be triggered using ENTER or by transmit-ting one of the ASCII characters “G0”, “ES”, “EN” or the control charac-ter “ESC?” (ESC = ASCII27) via the USB port ( 9.4.2 ‘Control Commands’, beginning on Page 84),

the acquisition of reading can be triggered using ∧ if externally triggered measurement acquisition is enabled,

it is not possible to retrieve the service functions!


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7.5.2 Procedure For Making Measurements in the Free-Running Display Mode
The magnetic poles are subject to increased wear when moving the probe across a surface.

Key sequ./ Action


Explanation

∨ Press the arrow key ∨ to enable the free-running display mode.

will appear on the LCD display.

[Thickn.]: Displays the coating thickness readings (measurement program

10.5.5 ‘Display’, beginning on Page 104)[n= ]: Number of measurements

Place the probe on the specimen and move it across the surface of the specimen to determine the coating thickness distribu-tion.


∨ Use ∨ to disable the free-running display mode.


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7.5.3 Analog Display When making measurements in the “free-running” display mode, the analog dis-play facilitates a quick recognition of tendencies in the coating thickness chang-es. If analog display is enabled and measurements are made in the “free-running” display mode, the analog display with the set limits will appear in place of the information lines. The reading will appear between the limits as an analog bar. (To enable analog display: Page 97).
Key sequ./ Action


Explanation

∨ Press the arrow key ∨ to enable the free-running display mode.

will appear on the LCD display.

[22.00 25.00]: Limits for the analog dis-play (example).

Place the probe on the specimen and move it across the surface of the specimen to determine the coating thickness distribu-tion.

[22.00 25.00]: Limits for the analog dis-play (example).[ <= =>]: The lower or upper limit of the analog display is violated


∨ Use ∨ to disable the free-running display mode.The last reading taken before the free-run-ning display mode will be displayed.


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7.5.4 Measurements In the “Free-Running” Display Mode Using Dual Probes
The last measurement that has been made with a dual probe prior to turning on the “free-running” display mode determines the measurement method that will be used for the measurement in the “free-running” display mode. The last used measurement method is shown on the LCD display ( 7.3.5 ‘Display of the measurement method in use when making measure-ments with dual probes’, beginning on Page 73).

If the magnetic induction method was used before the “free-running” display mode was turned on, the measurements in the free-running mode will be made according to the magnetic induction method as well. The dual probe will then measure only on ferromagnetic base materials. The probe will not measure on other base materials, i.e., [- - - -] will remain on the LCD display.If the eddy current method was used before the “free-running” display mode was turned on, the measurements in the free-running mode will be made according to the eddy current method as well. The dual probe will make correct measurements only on non-ferromagnetic base materials; erroneous measurements will be taken on ferromagnetic base materials.If no measurements were made before the “free-running” display mode is turned on, the measurements in the free-running mode will be made according to the magnetic induction method.

Automatic base material detection and selection of the correct measure-ment method is not enabled for measurements in the “free-running” dis-play mode.


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8 Evaluation
The following parameters will be determined from the readings during the eval-uation and can be displayed:

Number of evaluated readings

Mean value th. ,

Standard deviation s ,

Lowest reading,

Highest reading, and

Range.

More detailed information about the individual computed parame-ters can be obtained from the Glossar.

Key sequ./ Action


Explanation

FINAL-RES Use FINAL-RES to start the evaluation.

[Info: CAL]: Press CAL to display an ex-planation of the computed parameter:

[n]: Number of evaluated readings.[th.]: Mean value th.[s]: Standard deviation s[min]: Minimum value[max]: Maximum value[R]: Range

[Leave open: ∧ ]: Press ∧ to end the evaluation without deleting the readings.


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ENTER + DEL

Use ENTER + DEL to end the evaluation and delete the readings.

[No: ENTER ]: Ends the evaluation with-out deleting the readings.

The instrument is again ready to make measurements.

Key sequ./ Action


Explanation


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9 Data Transfer Using USB
The USB port for the instrument is on the unit's rear side. Bi-directional data ex-change occurs via the USB interface.The following operations are possible when the USB port is connected to a com-puter (PC):

Transfer of the readings and the characteristic statistical data from the instru-ment to the PC.

Remote control of the instrument by sending commands from the PC to the instrument.

Requesting measurement data and other data (e.g., the name of the current Application) by sending commands from the PC to the instrument.

Transfer of data (e.g., designations for Applications) from the PC to the instrument by sending commands from the PC to the instrument.

Both commercial or one's own data processing programs can be used to process the data exported by the instrument. Information regarding import and processing of the data using such programs may be obtained from the respective manuals for these programs.

Use the USB to

transfer measurement data and additional information in the ASCII format, e.g., using PC-DATEX (additional information about the PC-DATEX pro-gram is available from Helmut Fischer GmbH or your authorized system supplier) directly into an EXCEL spreadsheet, and

transmit commands and data, e.g., via Windows® Hyper Terminal (only up to version Windows XP®), from the PC to the instrument.

Basic computer knowledge regarding configuration, operation and pro-graming as well as knowledge of the software in use, which may be obtained from respective instruction manuals, is required when using the instrument in conjunction with a computer.


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9.1 USB Connection to a PC Connect the USB port of the instrument with the USB port of the PC. Use the USB cable supplied with the instrument.
Fig. 9-1 Side view of the instrument with the USB port

9.2 Installing the USB Driver If there is no USB driver installed for the USB connection on your PC, proceed as follows:

1. Connect the instrument to the USB port of your PC. The “Found New Hardware Wizard” opens.

2. Follow the instructions of the Windows wizard. If the driver is not found automatically, select or enter the source to search for the USB driver (e.g., CD-ROM drive. removable media (CD, diskettes, ...) or local path).

The successful installation of the USB driver can be verified in the Windows De-vice Manager.

Open the Device Manager: Start/Control Panel/System, Hardware tab, Device Manager button.

If the USB driver was downloaded from a Website of Helmut Fis-cher GmbH: Before installing the driver, extract the downloaded driver file into a folder on your PC (e.g., C:\Programme\USB-Treiber\FMP-USB).

Windows XP®:Ignore the message for the Windows Logo Test (Window “Hardware Installation”). Click the Continue Installation button and continue the installation.


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You will find an additional COM port under “Ports (COM & LPT)”, e.g., USB Driver for FMP (COM3) if the instrument is connected to the PC via the USB interface.
9.3 Transfer of the Measurement Data to the Computer

1. Establish the USB connection: Page 82.

2. Select the data for online export: 10.4 ‘Instrument Mode’, beginning on Page 95.

3. Data transfer from the instrument to the PC .. during the measurement (online operation): 9.3.1, .. after the measurement (offline operation) Page 83.

4. Control the instrument from the PC: Page 84.

9.3.1 Online Operation For transferring measurement data during online operation, the instrument is con-nected to the computer during the measurement and the data are output immedi-ately (online) via the USB port.

9.3.2 Offline Operation With offline operation, the data stored in the instrument are output at a later time (offline) via the USB port. The data output is triggered by pressing SEND.

Knowledge regarding operation of the computer and the software in use, which may be obtained from respective instruction manuals, is required.


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9.4 Transmission from the PC to the Instrument
9.4.1 Transfer Formats

All input and output data are transferred as ASCII-Strings followed by a CR and a LF control character (Carriage Return Line Feed; CR = ASCII13, LF = ASCII10).

The max length of data received by the instrument is 20 characters.

9.4.2 Control Commands The instrument can be remote controlled and can request readings and other data by sending the control commands from the PC to the instrument. The requested readings or the data, respectively, are then transmitted by the instrument via the USB port and received by the PC.If sending the commands “DAM”, “DAT”, “GAN”, “GBN”, “SAN”, “SBN”, “SGS” or “SWA” results in an error, i.e., the respective function cannot be ex-ecuted, the instrument will return the ASCII character “NAK” via the USB port to the computer.

Response: ACK (ASCII6)Response in case of an error: NAK (ASCII21)

Command Function

STATE Requests information on the current state of the instrument. “1” is output if the instrument is ready to make measurements. “0” is output if the current Application has not been set up. “-1” is output for any other state (e.g., if the service functions are called at the particular time).

G0 or ES or EN orESC?

Triggers the measurement acquisitionMeasurement data are output by the instrument via the USB port.

XX orz

Requests the current count rateOutputs the current count rate but does not store it in the instrument.


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XN ory

Requests the current normalized countrate.Outputs the current normalized countrate, but does not store it in the instrument.

SAM Requests all measurement data.

ESC0 Operates the DEL key

ESC1 Operates the FINAL-RES key

ESC3 Operates the ON/OFF key

ESC4 Operates the ZERO key

ESC5 Operates the CAL key

ESC6 Operates the ∧ key

ESC7 Operates the ∨ key

ESC: Operates the SEND key

ESC; Operates the ENTER key

SER Requests the serial number of the instrument.

VV Requests the version designation of the instrument internal software (e.g., RBA12)

For information about operation, maintenance and care of the printer, consult the instruction manual of the printer.

Command Function


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10 Instrument Settings in the Service Func-
tion Menu

The instrument settings described below are configured from the Service func-tion menu.

How to access the “Service functions” menu:

How to exit the “Service functions” menu:

Key sequ./ Action


Explanation

ON/OFF5 x ENTER

Use ON/OFF to turn the instrument onAfter pressing ENTER 5 times, the identifi-cation number 157 appears on the LCD display.

2 x ∧ Enter the identification number 159 by pressing the arrow key ∧ 2 times.Use ENTER to confirm the setting.

ENTER The Service settings menu will be dis-played.Press the arrow keys ∧ or ∨ to select the desired service function.

Key sequ./ Action

Explanation

DEL Press the DEL key to exit the Service func-tions menu.The instrument is ready to make measure-ments.


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The default settings of the service function parameters (i.e., the as-shipped facto-
ry settings) are underlined below, e.g.,: [Histogram off]. A re-initialization will reset the settings in the service functions to the default settings ( Page 93). However, time, date and language are not reset by the re-initialization!

10.1 Service Menu Overview

The descriptions below assume that the service functions have been retrieved and not yet exited.

Service menu Functions Start on Page

System LanguageContrastLightingAutom. offInitialization

8889909293

USB Send free-running mode 94

Instrument mode Limited modeAnalog display

9597

Measurement audible signalMeasurement effectExternal startMeasuring mode - Standard/ Area measurement/Automatic measurementDisplaydual method

9899100

102104105

Units metric/imperial 106

Storage mode save/don't save/delete on off 107

About ... Information about the instrument configura-tion

108


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10.2 System
10.2.1 Language

Do not select a language for which you do not understand the charac-ters, e.g., Cyrillic! You might have difficulty returning to a language that is familiar to you!

Key sequ./ Action


Explanation

Select System from the service menu.Use ENTER to confirm the selection.

ENTER Select the Language by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired language by pressing the arrow key ∧ or ∨ and confirm the se-lection with ENTER.


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10.2.2 Contrast
Use the contrast setting to adjust the LCD display brightness continuously. The contrast value can be between 0 (brightest LCD display) and 99 (darkest LCD display). The default contrast setting is 60.

Key sequ./ Action


Explanation


ENTER Select the Contrast by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER

∧ or ∨

Use ENTER to confirm the “Contrast” se-lection, orspecify a new value by pressing the arrow key ∧ or ∨, then confirm the entry with EN-TER.

Use DEL at any time to cancel the proce-dure.


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10.2.3 Lighting
The following options are available for the light setting

“off after n sec”: The light turns off after n seconds.

“always off”: The light is always off.

“always on”: The light is always turned on.

Key sequ./ Action


Explanation


ENTER Select Light by pressing the arrow key ∧ or ∨ and confirm the selection with EN-TER.

ENTER Select the desired setting by pressing the arrow key ∧ or ∨ .

Use ENTER to confirm the desired setting.


∧ or ∨Enter

off after n secUse ENTER to confirm the value, or:specify a new value by pressing the arrow key ∧ or ∨.Pressing ENTER returns you to the menu in order to enter additional settings.

∧ or ∨Enter

always offAfter confirming the selection “always off” with ENTER you are immediately returned to the menu in order to enter additional set-tings.


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∧ or ∨Enter

always onAfter confirming the selection “always on” with ENTER, you are immediately returned to the menu in order to enter additional set-tings.

Key sequ./ Action


Explanation


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10.2.4 Automatic Switch Off
Key sequ./ Action


Explanation


ENTER Select Auto. switch off by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[off]: The instrument does not switch off automatically. The switch-off mode is dis-abled.

[on]: The instrument switches off automati-cally if for about 5 minutes no measure-ments are made or no key is pressed. The switch-off mode is enabled.



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10.2.5 Re-Initialization of the Instrument
The restoration of the default settings of the instrument is called re-initialization.With a re-initialization of the instrument,

all readings are deleted,

all settings in the service functions are reset to the default settings (i.e., to the factory settings) (exception: language); thus, if necessary the settings will have to be made again.

the coefficients of the master characteristic that is stored in the EEPROM of the probe plug are not changed because the re-initialization concerns only the memory of the instrument.

Key sequ./ Action


Explanation


ENTER Select the Initialization by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

ENTER [Yes: DEL]: Press DEL to carry out the re-initialization.

[No: ENTER]: Press ENTER to not carry out the re-initialization.

Press DEL only if the re-initialization is indeed desired!

DEL [Continue: ENTER]: Press ENTER to re-turn to the System menu.


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10.3 USB
10.3.1 Send Free-Running Mode

Key sequ./ Action


Explanation

Select USB from the service menu.Use ENTER to confirm the selection.

ENTER Select the desired free-running mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[off]: Measurement data that have been taken using the “free-running” display mode will not be transmitted via the USB port.

[on]: Measurement data that have been taken using the “free-running” display mode will be transmitted via the USB port.



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10.4 Instrument Mode
10.4.1 Restricted operating mode When the restricted operating mode is enabled, only the keys necessary for mea-surement and evaluation are active. This avoids erroneous measurements due to unintentional adjustments of instrument parameters.The following keys are not active in the restricted operating mode:

ZEROCAL

No actions are triggered and the LCD display will not change when pressing these keys while in restricted operating mode.

The restricted operating mode will remain enabled even after the instrument is switched off and on.

As long as the restricted operating mode is enabled, the LCD dis-play will show .

Key sequ./ Action


Explanation

Select the Device Mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select Restricted mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.


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Select the desired operating mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[off]: The restricted operating mode is dis-abled, i.e., all functions are enabled ac-cording to their settings.

[on]: The restricted operating mode is en-abled.


Key sequ./ Action


Explanation


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10.4.2 Analog Display
When making measurements in the “free-running” display mode, the analog dis-play facilitates a quick recognition of tendencies in the coating thickness chang-es. If analog display is enabled and measurements are made in the “free-running” display mode, the analog display with the set limits will appear in place of the information lines. The reading will appear between the limits as an analog bar.

Key sequ./ Action


Explanation

Select the Device Mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select Analog display by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired display mode by press-ing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[off]: Analog display disabled

[on]: Analog display enabled, i.e., when making measurements in the “free-run-ning” display mode, an analog bar will ap-pear in the information lines to indicated the measured value ( 7.5.3 ‘Analog Dis-play’, beginning on Page 77).



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10.5 Measurement
10.5.1 Audible Signal The audible signal, i.e., the measurement acquisition signal that sounds after ev-ery measurement can be disabled.

Key sequ./ Action


Explanation

Select Measurement by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select Audible signal by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.


[off]: No audible signal sounds when the probe is placed on the specimen.

[on]: An audible signal sounds when the probe is placed on the specimen.



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10.5.2 Measurement Effect
Key sequ./ Action


Explanation


ENTER Select Meas. signal by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired measurement effect by pressing the arrow key ∧ or ∨ and con-firm the selection with ENTER.

[off]: Measurement effect disabled, i.e., the reading will not be acquired automati-cally (automatic measurement acquisition disabled).

[on]: Measurement effect enabled, i.e., the reading will be acquired automatically once the probe is placed on the specimen (automatic measurement acquisition en-abled).



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10.5.3 External Start
Key sequ./ Action


Explanation


ENTER Select Extern start by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select “Extern Start on” or “Extern Start off” by pressing the arrow key ∧ or ∨ and con-firm the selection with ENTER.

[off]: External start is not possible (Exter-nal start disabled)

[on]: External start is possible (enabled), i.e., external measurement acquisition can be triggered by pressing the key ∧ (or FI-NAL-RES during a normalization or cali-bration).



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ENTER Select the desired “delay” by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[0 ms]: no pause after external start

[100 ms]: 100 ms pause after external startto[2500 ms]: 2500 ms pause after external start

[Page ∨: CAL]: Press CAL to leaf through the pages.


The combination “measurement effect off” and “external start off” is not permissible because it would not allow for a measurement acquisition. If this combination is set, the instrument will automati-cally reset the parameters to “measurement effect on” and “external start off”.

Key sequ./ Action


Explanation


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10.5.4 Measuring Mode - Standard/Area Measurement/Automatic
Measurement

Key sequ./ Action


Explanation


ENTER Select Measuring Mode by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired measuring mode by pressing the arrow key ∧ or ∨ .

The standard measuring mode will be acti-vated. Confirming with ENTER will return you to the menu for the measurement.Use DEL at any time to cancel the proce-dure.

Area measurement is possible (enabled), 7.3.3 ‘Automatic Measurements’, be-

ginning on Page 70.Confirming with ENTER will return you to the menu Measurement.Use DEL at any time to cancel the proce-dure.


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Select the mode for “Auto. Measurement” by pressing the arrow key ∧ or ∨.

Automatic measurement is possible (en-abled)

7.3.3 ‘Automatic Measurements’, be-ginning on Page 70.Use ENTER to confirm the selection.


ENTER Select the desired number of measure-ments by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.


ENTER Enter the time interval by pressing the ar-row key ∧ or ∨.

Confirming with ENTER will return you to the menu for the Measurement.


Key sequ./ Action


Explanation


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10.5.5 Display
Key sequ./ Action


Explanation


ENTER Select Display by pressing the arrow key ∧ or ∨ and confirm the selection with EN-TER.

ENTER Select the measurement data type by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

The readings will be presented on the LCD display corresponding to the selected measurement data type ( 4.3.3 ‘Measuring Modes’, beginning on Page 35).

Use ENTER to confirm the selection.Use DEL at any time to cancel the proce-dure.

With every modification of the type of mea-surement data, a prompt for deleting read-ings that are already stored in the Application will appear because it is not possible to evaluate different types of mea-surement data statistically. This prevents erroneous interpretations of the measure-ment results.

[Yes: DEL]: Press DEL to delete all read-ings that have been stored thus far.[No: ENTER]: Press ENTER to cancel the procedure.


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10.5.6 Dual Method
The menu option “Dual method” appears only if a dual probe is connected.

Key sequ./ Action


Explanation


ENTER Select Dual method by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.

ENTER Select the desired “dual method” by press-ing the arrow key ∧ or ∨ and confirm the selection with ENTER.

[NF/Fe]: In the open application, only the magnetic induction method can be used to make measurements.

[NC/NF]: In the open Application, only the eddy current method can be used to make measurements.

[both]: In the open Application, only the two methods can be used to make mea-surements.

ENTER Use DEL at any time to cancel the proce-dure.Press ENTER to confirm and store the measuring mode settings.The instrument is ready to make measure-ments.


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10.6 Units
Key sequ./ Action


Explanation

Select Units by pressing the arrow key ∧ or ∨ and confirm the selection with EN-TER.

ENTER Select the desired units by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.

[metric]: Units of measurement in µm or mm

[inch units]: Units of measurement in mils



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10.7 Storage Mode
10.8 Performing a Master Calibration

Performing the master calibration: 6.7 ‘Master Calibration’, beginning on Page 57.

Key sequ./ Action


Explanation

Select Storage mode by pressing the ar-row key ∧ or ∨ and confirm the selection with ENTER.


[store]: The readings are stored and will be retained even after the instrument is switched off

[do not store]: The readings will be dis-played but not stored

[delete at off]: All readings will be deleted when the instrument is switched off


Key sequ./ Action


Explanation

Select Master Calibration by pressing the arrow key ∧ or ∨ and confirm the selection with ENTER.


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10.9 About ...
10.10 Documentation of the Instrument Configuration

Key sequ./ Action


Explanation

Select About ... by pressing the arrow key ∧ or ∨ and confirm the selection with EN-TER.

ENTER Displays the software version, the internal state and the name of the connected probe.Pressing ENTER repeatedly displays the instrument configuration in succession (cv.

10.10 ‘Documentation of the Instrument Configuration’, beginning on Page 108).

Key sequ./ Action

Explanation

SEND With the service functions retrieved, the documentation of the instrument configura-tion (including the probe) can be output to the USB port by using the SEND com-mand ( Fig. 10-1). Using the print func-tion also exits the service functions and the instrument is again ready to make mea-surements.

9 ‘Data Transfer Using USB’, begin-ning on Page 81


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Fig. 10-1 Documentation of the instrument configuration with probe-specific data (example)

FISCHER DUALSCOPE FMP40 19.05.08 Software version : FKA00i08 internal state : 03000004fb Probe : FD10 Serial number : 0907VS0027 Meas. range 1 : 0.00 - 1300 Meas. range 2 : 0.00 - 800

Unit of meas. : metric Storage mode : store Auto. switch off : onLight [s] : always onHistogram : onContrast : 30Unit of meas. : metricLanguage : englishDisplay : coating thickn.Meas. signal : onExtern start : offdelay : 0 msGroup separator : offOutput to port : Single meas.Analog display : offDual method : both

Probe-specific data of the connected probe


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11 Malfunctions and Messages
11.1 Malfunctions

Malfunction/Mes-sage

Cause Correction from Page

No display Instrument not switched on.

Use ON/OFF to turn the instrument on.

33

Instrument has switched off automati-cally.

Use ON/OFF to turn the instrument on.

33

Battery discharged. Replace the recharge-able or regular battery with a new one.

28

No change on the display forZERO or CAL

restricted operating mode is enabled.

Use ON/OFF + ENTER to disable the restricted operating mode with the instrument switched off before-hand.

95

Unable to retrieve the service functions

“Free-running” display mode is enabled.

Use ∨ to disable the “free-running” display mode.

74

Probe does not mea-sure

Measurement acquisi-tion did not occur be-cause the previous measurement acquisi-tion was less than two seconds earlier.

Repeat measurement. 37

Computing the coating thickness is not possi-ble because the coat-ing is too thick.

Use a different speci-men.

--


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Wrong probe connect-ed.The indicator for the measurement method flashes on the LCD dis-play.

Connect the correct probe or assign a new probe.

3038

Wrong base material (measurements with magnetic induction probes are possible on-ly on ferromagnetic base materials).

Use a specimen with a ferromagnetic base material.

--

Wrong base material (measurements in the “free-running” display mode using a dual probe are not possible on base materials made of non-ferrous metal if the last measurement prior to enabling the 'free-running” display mode was carried out on a ferromagnetic base material).

Use a specimen with a ferromagnetic base material.

--

Wrong dual method set-ting. A measurement with a dual probe on non-ferromagnetic base materials is not possible if the dual method (NF/Fe) was set in the ser-vice function.

Use a specimen with a ferromagnetic base material, orSet the dual method (both) in the service function.

105




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Automatic measurement acquisi-tion disabled.

Enable automatic mea-surement acquisition from the service func-tions or trigger the ex-ternal measurement acquisition by pressing the ∨ key (or FINAL-RES during the nor-malization or calibra-tion).

102

Probe defective. Use properly function-ing probe.

--

Wrong readings Probe placed on speci-men incorrectly (e.g., probe hovers over specimen).

Place probe on speci-men correctly and ob-serve the minimum lift-off distance when lifting off the probe.

37

Wrong base material (correct measurements with eddy current probes are possible on-ly on non-ferromagnet-ic base materials).

Use a specimen with a non-ferromagnetic base material.

--

Wrong base material (correct measurements in the “free-running” dis-play mode using a dual probe are possible on non-ferrous base mate-rials only if the last mea-surement prior to enabling the 'free-run-ning” display mode was carried out on a non-fer-romagnetic base mate-rial).

Use a specimen with a non-ferromagnetic base material.

--




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Wrong readings Conducting metal close to the measurement lo-cation when making measurements using eddy current probes.(e.g., on the back side of a pc-board).

Use a specimen with-out a conducting metal.

--

Wrong dual method set-ting (A correct measure-ment with a dual probe on ferromagnetic base materials is not possible if the dual method (NC/NF) was set in the ser-vice function.

Use a specimen with a non-ferromagnetic base material or set the dual method (both) in the service function.

105

Incorrect normalization or calibration.

Perform a correct nor-malization or calibra-tion.

41

Probe tip worn. Use a probe with a proper probe tip.

--




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11.2 Messages on the LCD Display The error messages (E***) and warning messages (W***) that may occur during instrument operation are contained in the overview on the following pages.


Reading cannot be dis-played (because the value is greater than 9999 or smaller than - 9999)Cause: Measurement carried out incorrectly.

Perform the measure-ment correctly (e.g., do not allow the probe to hover over the speci-men before or after the measurement; ob-serve the minimum lift-off distance!)

37

Cause: Eddy current probe that is currently normalized on a non-ferromagnetic base ma-terial has previously been normalized on a ferromagnetic base ma-terial.

Continue normaliza-tion.

45

Instrument is not ready to make measure-ments.Cause: Re-initialization was carried out and the instrument was then switched off.

Use ZERO to start and perform the normaliza-tion.

45

Instrument-internal er-ror.

Use ON/OFF to turn the instrument off and then again on.If this error occurs re-peatedly: Inform cus-tomer service.

33

- - - -

E 001Math Error !


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The internal instrument memory is full.

Delete the stored mea-surement data.

74

Unable to perform the computation for the cali-bration on coating be-cause the thickness of the used calibration standard is insufficient.

Perform a calibration on coating with a suit-able calibration stan-dard (the used calibration standard should have a thick-ness of at least 50% of the coating thickness of the coated specimen that is used for the cali-bration on coating).

53

Unable to display read-ing because it is out of the probe's measure-ment range.Cause: Coating too thick.

Perform measure-ments on specimens with coatings that can be measured with the connected probe or use a different probe.

--

Cause: Measurement carried out incorrectly.

Perform the measure-ment correctly (e.g., do not allow the probe to hover over the speci-men before or after the measurement; ob-serve the minimum lift-off distance!)

37

Cause: Measurement with eddy current probe on a non-ferromagnetic base material after a normalization on a fer-romagnetic base mate-rial.

Perform a normaliza-tion with the eddy cur-rent probe on a non-ferromagnetic base material and repeat the measurement.

45



E 004Appl. memoryoverflow !

E 005Unable to det.introuvable !

E 006Measurementsout of range !


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Cause: ENTER was pressed during the measurement in the “free-running” display mode while the probe was lifted off.

Place the probe on the specimen and then press ENTER to trigger the measurement ac-quisition.

74

Outlier measurement recognized during nor-malization or calibra-tion.Cause: Measurement on calibration standard carried out incorrectly.

Repeat the calibration step and perform the calibration measure-ment correctly (e.g., do not allow the probe to hover over the stan-dard before or after the measurement; ob-serve the minimum lift-off distance!)

37

Cause: Measurement performed on a wrong calibration standard (e.g., a measurement on an uncoated base material instead of a calibration standard).

Repeat the calibration step and make the cali-bration measurement on a correct standard.

47

Connected probe not suitable or not support-ed (measurement meth-od of the connected probe does not fit the in-strument).

Connect a suitable probe.

30

Probe defective. Connect a properly functioning probe.

30



E 006Measurementsout of range !

E 007Measurementsinvalid !

E 010Meas. methodnot supported !


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Unable to complete cor-rective calibration.Cause: Measurement carried out incorrectly.

Repeat the corrective calibration and per-form the calibration measurement correct-ly (e.g., do not allow the probe to hover over the standard before or after the measurement; observe the minimum lift-off distance!)

47

Cause: Calibration standards used that did not exhibit the required coating thickness or are defective.

Repeat the corrective calibration with correct and good calibration standards.

47

Cause: Normalization carried out on calibra-tion standard instead of on uncoated specimen.

Repeat the corrective calibration and per-form the normalization on the uncoated speci-men.

45

Calibration standards were measured out of sequence during the corrective calibration (standard 1 mixed up with standard 2) and foil thickness was not adjusted correspond-ingly using the arrow keys.

Repeat the corrective calibration and mea-sure the standards in the correct sequence.

47



E 011Measurements outof interval !

E 012Invalid std.sequence !


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Unable to complete the master calibration.Cause: Measurement carried out incorrectly.

Repeat the master cali-bration and perform the calibration measure-ment correctly (e.g., do not allow the probe to hover over the stan-dard before or after the measurement; ob-serve the minimum lift-off distance!)

57

Cause: Calibration standards used that did not exhibit the required coating thickness or are defective.

Repeat the master cali-bration with correct and good calibration stan-dards.

57

Cause: Normalization carried out on calibra-tion standard instead of on uncoated specimen.

Repeat the master cali-bration and perform the normalization on the uncoated specimen.

4557

Instrument-internal er-ror: Unable to compute the coefficients of the master characteristic (original master charac-teristic will be retained).

Repeat the master cali-bration.If this error occurs re-peatedly: Inform cus-tomer service.

57

Unable to store master characteristic.Cause: Probe not plugged in and tight-ened properly.

Plug probe in and tight-en properly; repeat the master calibration.

30

Cause: Probe defective. Connect a properly functioning probe and if applicable repeat the master calibration.

3057



E 013Countrate outof interval !

E 014Unable to calc.parameters !

E 015Unable to storecal. in probe !


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The stored foil thick-nesses do not corre-spond to the measured standards.Cause: Calibration standards were mea-sured out of sequence during the master cali-bration (standard 1 mixed up with standard 2) and foil thickness was not adjusted corre-spondingly using the ar-row keys.

Repeat the master cali-bration and measure the standards in the correct sequence.

57

Unable to perform cor-rective calibration with the set foil thickness (e.g., because [Stan-dard 2: 0] was set).

Set the rated values for the used calibration standard and continue with the corrective cali-bration.

47

No probe connected. Connect a probe. 30

Probe not connected correctly.

Connect probe correct-ly.

30

Probe defective. Use properly function-ing probe.

30

Unable to perform a cal-ibration on coating with the connected probe (a calibration on coating can be performed only with magnetic induction probes or the magnetic induction channel of du-al probes).

Connect a suitable probe and repeat the calibration on coating.

53



E 016Std. and meas.not matching !

E 021Entered Standardinvalid !

E 022Missing probe !

E 026Cal. on coatingnot supported !


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Probe contents does not correspond to the test value.

Inform customer ser-vice.

--

Electric consumption of a connected USB de-vice too high (max. 100 mA permitted).

Check and/or replace connected USB device.

--

The measurement elec-tronics has not been balanced properly. Be-cause of this, measure-ment data may be incorrect.


--

Internal write/read error. Inform customer ser-vice.

--

The probe contains an unknown data format.

Perform a software up-date.

--

Unable to compute a measurement because a normalization has not been carried out on the current base material.

Perform a normaliza-tion.

45

Internal instrument er-ror.


--



E 030Probe damaged !

E 031USB overcurrent !

E 032Measurem. equip.not adjusted !

E 033Device damaged !

E 034UnsupportedProbe format !

E 035Please performa normalization !

E 999System error !!!


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Instrument corrected faulty settings autono-mously.

-- --

A procedure was can-celed (e.g., the correc-tive calibration was canceled using EN-TER).

Repeat the procedure if necessary.

--

Two-point calibration performed with calibra-tion standards with thicknesses that are not sufficiently far apart (will be considered a one-point calibration).

Repeat the corrective calibration with suitable calibration standards.The difference of the normalized count rates Xn of the two calibra-tion standards must be greater than 0.1: Xn Calibration standard 2- Xn Calibration standard 1

Δ Xn > 0,1

47

A probe of the same type but with a different serial number has been connected.

-- 30



W 003Optionscorrected !

W 004Actioncanceled !

W 0051-Pointcalibration !

W 006Probe changed !


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12 Glossary
Terms and Formulas

Adjustments Calibration

Application Measurement Application of the User. The instrument memory, where the coefficients from the corrective cali-bration/normalization (adjustment of the measurement system to the spec-imen / coating/base material adjustment, system adjustment), the param-eter settings and the measurement data for a certain measuring application of the user are stored is called an application.

Application Selection Menu page(s) in the instrument, where all Applications are listed that have been set up thus far. Use the command button APPL or use File/Open to select an Application.

Application Memory The instrument memory contains all data and measurements that are rele-vant to a measuring application.

Outliers Readings that are significantly lower or higher than the other readings of a measurement series and that can, therefore, be considered unexpected and not acceptable.

Outlier Rejection Is used to prevent the distortion of measurement results by Outliers. Out-lier rejection can be carried out using the Grubbs-Test or Sigma- Outlier Rejection (specification of a known spread). Measurements that are rec-ognized as outliers during outlier rejection are not included in the statisti-cal evaluations.

Evaluation Computation of statistical parameters such as mean value, standard devi-ation, etc. as well as the graphical presentation of the measurements, e.g., in a sum frequency chart.


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Evaluation Menu Selection menu for the evaluation and presentation of the measurements as well as for exporting the measurements, evaluations and presentations via the USB-port to a USB-stick or a printer. Use the EVALUATE button or Eval/Final result to call the evaluation menu.
Automatic Block Creation A block closure is carried out automatically each time a specified number of measurements is reached. In statistical evaluations, the block mean val-ues will be used instead of the single readings.

Baud Unit of the speed for transferring information (data). 1 Baud corresponds to a transfer rate of one bit per second.

Baud Rate Data transfer rate. Used mainly in connection with terminal programs for data transfer. Since data are transferred via a serial port, the transfer rate is calculated in bits per second.

Bidirectional Data Exchange Data can be transmitted and received by both participants (for example, from the instrument to the PC and from the PC to the instrument).

Bit (Binary Digit), binary number. 1 bit is the smallest unit in the binary num-ber system. The value of a bit is 0 or 1. Being the smallest unit of infor-mation in a computer, a bit forms the basis of every computer system. 8 bits are combined to a byte and several bytes to a word.

Block Grouping of single readings. Several measurements are combined into a block. A key symbol on the display indicates the end of each block (con-clusion of a block).

End of Block Mark after n single readings. As a rule, a key symbol on the display indi-cates the end of a block.

Block Result Statistical evaluation of the measurement data of a block. E.g., mean val-ue, standard deviation, coefficient of variation, range, minimum value, maximum value, number of single readings per block.


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Block Size Number of single readings that are combined to form a block.
Block Mean Value d. or ,

Block, open Group of single readings for which the block has not yet been ended.

Carriage Return (CR) CR is a character of the ASCII-character set (ASCII13) and has the fol-lowing function: When data or commands are entered, the line one is cur-rently working on will be closed by pressing the CR-key (Enter or Return key on the PC keyboard) and the information that has been entered will be processed accordingly. The curser is again placed at the beginning of the line. CR is usually used together with the LF (Line Feed) character to start the next line at the beginning of the line.

Chi-Squared-Test Statistical mathematical test method to determine an existing normal dis-tribution of the measurements (for more than 30 measurements).

Cp: Capability Indexes

Cpk: Capability Indexes

CR: Carriage Return (CR)

CuCopper

S1

d


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d. or Arithmetic mean value of the single readings, called arithmetic mean val-ue (d., ). The arithmetic mean value d. is the sum of all single readings di of a measurement series (of a block), divided by the number of measure-ments.
2

d.. Mean value of the block mean values of selected blocks. Analogous to the arithmetic mean value (d.), the block mean values are added up and divid-ed by the number of evaluated blocks nBl.

DUALSCOPE

Protected brand name of Helmut Fischer GmbH for the measuring instru-ment.

Standard Calibration Standard

Single Reading Measurement result that is displayed or printed after a single measurement at the measurement location.

Final ResultEvaluation of all measurements or selected blocks of an Application (mea-surement application memory).

External StartA setting in the menu function File/Properties/Measurement Accep-tance.Measurement Acceptance can be initiated by tapping the menu function Meas/Initiate External Start, the command button Ext, by transmitting commands from a connected PC.

Excess Curvature

d

d

d.d1 d2 d3 ... dn+ + + +

n--------------------------------------------------- 1

n--- di

i 1=

n

∑⋅= =d. Mean value (block mean val-

ue)n Number of single readings (in

a block)di Single readings (of a block)

d.. 1nBl------- d.i

i 1=

nBl

∑⋅=d.. Mean value of the block mean valuesnBl Number of blocksd.i Block mean values


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Capability Indexes The process capability is evaluated using the factors Cp and Cpk.The capability index Cp is a measure for the spread of a process and its ability for continuously producing parts according to specifications.The capability index Cpk takes the position of the mean value in relation to set specification limits into account.
and

d..: Average of all group mean values

: Estimated value for the theoretical standard deviation nBl: Number of blockssi: Standard deviation of the individual blocks USL: Upper specification limit LSL: Lower specification limit

FDD Evaluation Graphical presentation of the mean values of the measurement blocks (= Features) in an ascending rank order.Application:By using the FDD, existing systematic differences of coatings can be shown quickly and clearly in a graphical format Example 1: When painting car bodies, the desired homogeneous coating distribution is not achieved if the settings of one or more spray robots is wrong or dis-turbed. If the readings of one feature (e.g, the hood) are combined into one measurement block, then the systematic differences between various fea-tures (hood, roof, doors, trunk lid, etc.) can be recognized quickly using FDD, and corrective measures can be initiated promptly.Example 2:When electroplating racks, parts may be coated inadequately due to erro-neous current contacting or shadowing of flux lines. If the readings of ad-jacent parts of the rack are combined into one measurement block, then the groups, which statistically do not “fit” together with the other groups, i.e., which exhibit systematic differences, are identified clearly in the FDD evaluation. This allows for easy “localization” of the source of the error.

Fe Magnetizable material made of steel or iron.

Error Cone Confidence Borders

Cp OGW UGW–6 σ̂⋅

-----------------------------------= Cpk OGW d..–3 σ̂⋅

--------------------------- d.. UGW–3 σ̂⋅

---------------------------;⎩ ⎭⎨ ⎬⎧ ⎫

=

σ̂ σ̂ 1nBl------- si

2

i 1=

nBl

∑⋅=


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Free-Running ModeWith the probe placed on the specimen, measurements are displayed con-tinuously. Use the menu function Meas/Free-Running to enable the free-running mode.
Gaussian Normal Distribution Normal Distribution

Gaussian Probability Paper Sum Frequency Chart

Gaussian Distribution Normal Distribution

Accuracy Qualitative designation for the degree of approximation of a measurement result to the true value. Usually, the accuracy is divided into Trueness and Precision.

Bell Curve Normal Distribution

Specification LimitsThe upper specification limit (USL) is the highest reading and the lower specification limit (LSL) is the lowest reading allowed at the measurement location.

Maximum ValueMaximum value measured in a test series.

Grubbs TestTest method for outlier rejection. A method developed by Grubbs to test, whether the highest or lowest single reading should be considered an out-lier.

PopulationAll pieces or specimens to be measured. In practical applications, for ex-ample, all parts of a production unit, batch, etc.

Group SeparatorMark for the end of a block that can be transferred together with the mea-surement data to the PC. Default setting ASCII character 29.

Frequency Distribution Histogram


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HistogramGraphical presentation of all readings of an Application (measuring appli-cation memory) according to their portions in classes (e.g., coating thick-ness ranges), where the class frequencies are illustrated by the contents of rectangles. The class widths should be of equal size. Among other criteria, the informational value of statistical results depends on the shape of this distribution curve.
Interface Interface,

IsoInsulating material, electrically non-conducting, non-magnetizable.

Calibration Curve(Characteristic, master characteristic) Quantitative relationship between the signal of the probe and a scale for the coating thickness as represented by the calibration standards.

As long as no normalization (coating/base material adjustment, measuring system adjustment) or corrective calibration (adjustment of the measuring system to the specimen) has been performed, the calibration curve is iden-tical with the master characteristic. During a normalization or corrective calibration, the calibration curve is adjusted to the individual measuring application. The coefficients of the normalization or corrective calibration are stored in the active Application (measurement application memory).

CalibrationIn this manual, the term calibration is used as a comprehensive term for the adjustment and the calibration: Adjustment of the instrument using calibration standards to adapt the measuring system (instrument and probe) to the measuring application.

log d

Xn0 1

The coating thickness d is presented as a calibration curve as a function of the nor-malized count rate Xn. The mid portion of the calibration curve approaches a straight line and constitutes the range with the lowest relative measurement er-ror.


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Calibration Standard(Standards) Object with essentially the same attributes as the specimen, which differs only in the coating thickness and with a coating thickness that has been determined with a very accurate measurement method. May also be a foil.
Calibration Standards Calibration Standard

Characteristic Calibration Curve

ClassRange between a lower and an upper class boundary (limit values). The readings of a measurement series can be sorted according to such classes if they cover the entire measurement range without gaps. The class con-tents (frequency or number of measurements per class) plotted over the classes is called a histogram.

Minimum ValueMinimum value measured in a test series.

Kolmogoroff Smirnoff TestStatistical mathematical test method to determine the normal distribution of the readings (for 5 to 30 measurements).

System CheckA significant part of monitoring the measurement devices. Calibration standards or better yet, reference samples are used to check the calibra-tion and to ensure the measurement stability.

Corrective calibrationOne-point or two-point calibration. Adjustment of the instrument using 1 or 2 calibration standards. The corrective calibration includes calibration and adjustment. During the corrective calibration, the master characteristic (calibration curve) is adjusted to the individual measuring application. The obtained coefficients are stored in the active Application (measuring application memory). The master characteristic itself remains unchanged.

Kurtosis Curvature

LF Line Feed


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Line FeedLF line feed. Advances the printer paper by one line. Is usually used to-gether with the CR (carriage return) character to start the next line at the beginning.
Magnetic induction measurement method (DIN EN ISO 2178, ASTM B499)Contacting measurement method. The excitation current generates a low-frequency magnetic field with a strength that is dependent on the distance between the measurement probe and the base material. The magnetic field is measured by means of the measuring coil. The obtained measurement signal is converted in the instrument to a coating thickness value via the characteristic probe output.

Unit of MeasurementUnit for displaying measurement data. In coating thickness measurement, the common units are µm and mils. 100 µm = 3.9 mils.

Master characteristic(Characteristic probe output function) Original characteristic of the mea-surement system. The master characteristic is the basis for determining the measurements because it represents the relationship between the probe signal and the coating thickness. The coefficients of the master character-istic are stored in the probe plug.

MaxHighest measured value of a test series.

Maximum Max

Soft iron core of the probe

Low frequency alternating magnetic field

Coating material

ferrous base material

-Excitation current

U = f(d)

Measurement signal

Operating principle of the magnetic induction measuring method


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MeasuringTo measure means to compare! The probe signal generated at the measuring position is compared to the probe signal on the calibration standard. Using the calibration curve, the instrument converts the probe signal to the measurement result, which is presented in the specified unit of measurement.
Measuring ApplicationProperties of the test specimen with regard to measurement quantity, ge-ometry, geometric dimensions, permeability, etc. The test method, the measurement display mode, the probe and the type of instrument are all determined by the measurement application.

Measurement RangeThe range between two limit values within which a measurement is pos-sible at a specified trueness and precision. In a narrower sense, it refers to the range of the scale of an analog instrument. The measurement range de-pends on the measurement method, the design of the probe and the mea-suring application.

Measurement ErrorThe difference between the actual and the measured value of a measured quantity. For measuring instruments, there is a distinction between ran-dom (unpredictable) and systematic (correctable) measurement errors. Random errors determine the repeatability precision. Systematic errors affect the trueness and the reproducibility. Systematic measurement er-rors are far more prevalent in practical applications. Systematic measure-ment errors can be traced back to 1. faulty calibration, 2. operating or per-sonal errors and 3. deviations in the test conditions (inhomogeneities, instabilities, material aging, etc.). They tend to lean in one direction. With appropriate care, the influences 1. and 2. can usually be avoided or cor-rected or taken into account in the result.

Measurement Accuracy Accuracy

Instrument Memory Application


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Monitoring of the Test EquipmentA quality assurance task. It consists of ensuring at specified intervals that the test equipment (instrument, probe) is still operating properly and cal-ibrated correctly, and to take corrective measures, if necessary (recalibra-tion or repair of the instrument). System Check
Measuring ModeThis is the condition in which the instrument can capture and display mea-surement data. The display mode is determined by the respective mea-surement display settings.

Measurement ObjectObject on whose surface the measurements are performed to determine the coating thickness.

Measurement SeriesA series of single readings between two block or final results.

Measurement Probe Probe

Measurement LocationA limited and clearly defined location within a reference area of the spec-imen, where the coating thickness is to be determined.

Measurement Uncertainty u

Measurement MethodA procedure and process for obtaining information from the specimen concerning its properties. The measurement method is based on scientific knowledge and is determined by the measuring application.

ReadingNumeric reading of an instrument supplemented by the unit of measure-ment. The measurement can be obtained from the result of a single read-ing or from the arithmetic mean of several single readings (for example for the averaged display value (i individual values)).

Measurement Data PresentationRefers to the manner of presentation and evaluation of measurement data. In the FMP100, 3 presentation modes are available: Statistics display, his-togram display and specification limit display.

MinLowest measured value of a test series.


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Minimum Min
Mean Value d. or

Mean Value of the Block Mean Values d..

Mean Range R.

NF MetalsNon-ferrous, non-magnetizable metals.

NFNon-magnetizable material.

NiNickel

Standard Calibration Standard

Normal DistributionGaussian normal distribution, Gaussian distribution, bell curve.Probability distribution discovered by C. F. Gauß in 1794.If a quantity X is classified as having normal distribution, 68.3 % of the observed values X are within the σ-interval of the spread, around the mean value μ of the quantity X. I.e., the following applies to 68.3 % of the observed values: . In the following figure, this interval is identified by the gray areas underneath the curve.

μ σ– X μ σ+≤ ≤

Prob

abili

ty P

(X)

μ-σ μ μ+σ X

Probability distribution P(X) of a quantity X with a normal distribu-tion.


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The probability distribution P(X) is symmetrical around the mean value μ of the quantity X with normal distribution. Skewness and Curvature equal zero for the normal distribution.The populations that are examined for technical purposes often can be classified as having normal distribution. However, the following fact is of great significance: If several random samples of equal extent are drawn from any population (blocks) and their mean values (block mean values) are determined, these mean values will always have normal dis-tribution (central limits theorem).The mean value of these random sample mean values (block mean val-ues) is an estimated value ( = d.) for the mean value μ of the popula-tion. Due to the normal distribution, the measurement uncertainty u can be calculated using the standard deviation of the random sample mean values.The sum frequency chart shows, whether a quantity has normal distribu-tion, with a straight line indicating normal distribution. In the instrument, the test, whether the measurements at hand (random samples) have a normal distribution is carried out using the Kolmogoroff Smirnoff Test (for up to 30 readings) and the Chi-Squared Test (30 read-ings and up).
Normalized Count Rate Count Rate

NormalizationAdjustment of the instrument to the material properties of the coating and/or the base material (probe dependent). Thus, the normalization essential-ly defines the zero point or end point, respectively. A normalization is cru-cial for correct measurements due to the electrical conductivity and the permeability of the specimen materials. The coefficients of the adapted calibration plot are stored in the active Application (measurement appli-cation memory).

OfflineState of a peripheral device (printer or PC) connected to the instrument that does not allow it to receive data.

Open BlockGroup of readings for which the block has not yet been closed.

USLThe upper specification limit (USL) is the highest reading allowed at the measurement location.

μ̂


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OnlineState of a peripheral device (printer or PC) connected to the instrument that allows it to receive data. In this state, the device is ready for operation.
Parity)An error check method for data transmission, where the cross-sum of all error-free transmitted bit groups must always be even or odd. During data transfer, the parity bits are linked to the data bits of each character or byte to be transferred. In every word, this bit is set such that the sum of the Ones of a byte are always an even or odd number. This corresponds to an even or odd parity. The type of parity requirement must be defined prior to data transfer. By checking the parity, the recipient can determine if bit transfer errors occurred.

PrecisionAgreement between the individual measurement results under precisely defined test conditions; the precision is comprised of reproducibility and repeatability precision.

Specimen Measurement Object

Quality AssuranceAll measures taken in a plant that are concerned with ensuring that a con-trolled production within established quality requirements can take place. One partial aspect of it is quality monitoring of which coating thickness measurement is a part.

RThe range R equals the difference between the highest reading (Maxi-mum) dmax and the lowest reading (Minimum) dmin of a measurement se-ries.

R = dmax - dmin


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R.Mean range of all block ranges.
Range R

Reference AreaA defined partial area of the specimen surface with a known coating thick-ness.

TruenessAgreement between the “true” value and the mean value of a measure-ment result generally obtained under practical circumstances. The “true” value is considered a value known based on mathematical theoretical ap-proaches. Since such values are rarely available, a value traced to national or international standards is generally assumed to be “correct”. This “cor-rect” value is often called the “true” value.

USB PortInterface that is used for connecting instruments with PCs, printers, USB sticks and USB keyboards.

SSEstimated value for the standard deviation σ of the population. Is output only in the final result for Applications (measurement application memo-ries), for which automatic block creation has been enabled.

or for preset specification limits:

R. σ̂ d2⋅=R.: Mean range

: Estimated standard deviation σ of the populationd2: Factor, depends on the random sample size, can be obtained

from popular published tables.

σ̂

σ̂

σ̂ R.d2-----=

: Estimated value of the standard deviation σ of the populationR. Mean ranged2: Factor, depends on the random sample size, can be obtained from

popular published tables.

σ̂


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sThe standard deviation s is a measure for the spread of the single readings of a measurement series from their common mean value. It is equal to the mean square deviation of the single readings from the mean value and is calculated in the following manner:

The following figure points out that two very different measurement series can have different standard deviations even with the same mean value.

saSpread of the mean values of various groups (“Blocks” Block), corrected with regard to the spread of the single readings. To be able to calculate sa, the spread of the group mean values SII must be significantly greater than the spread of the single values SI within the group. If, for example, the same number of measurements per measurement spot is performed at several measurement spots, and the measurements per spot are combined in one group (block), then SI is a measure for the instru-

σ̂ OGW UGW–6 Cp⋅

-----------------------------------=: Estimated standard deviation σ of the population

USL: Upper Specification LimitLSL: Lower Specification LimitCp: Capability factor (default setting 1.33)

σ̂

s 1n 1–------------ d. di–( )2

i 1=

n

∑⋅=

s: Standard deviationd.: Mean value across all single readingsn: Number of single readingsdi: Single readings

Measurement series with the same mean value d. and different standard deviations


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ment spread and sa is the product spread adjusted by the instrument spread.
( Variance-analytical evaluation)

Estimated Value for the Coefficient of Variation VDach

Estimated Value for the Standard Deviation SS

SkewnessMeasure for the asymmetry of a single-peak probability distribution around its mean value. A positive skewness indicates a distribution with a peak that stretches more toward values that are greater than the mean val-ue. A negative skewness indicates a distribution with a peak that stretches more toward values that are smaller than the mean value. The skewness for a symmetric distribution (normal distribution) is zero.

InterfaceTransfer or connecting point between components, circuits or programs. A data exchange is carried out via the interface. With serial interfaces, the data are transferred in individual bits (i.e., one bit after another), with par-allel interfaces, several bits are transferred simultaneously.

Sigma Limits Around a Regression Line The sigma limits around the regression line constitute the confidence in-terval around the straight line, where the straight line is located at a con-fidence level of 95% (the value 95% is defined internally in the FMP100 unit).

sa SIFbeo 1–

nBl-------------------⋅=

FbeoSII

2

SI2

--------=

sa: corrected spread of the block mean valuesSI: Spread of the single readingsSII: Spread of the group mean valuesnBl: Number of measurement data groupsFbeo: Check value for decisions regarding the question

V̂

σ̂


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Supervisor CodePassword for a menu function to prevent unintended changes of the pa-rameter settings.Factory default password: 159The user can change the factory default password.
ProbeTransducer that delivers an electrical signal to the instrument based on a particular measurement method. This signal is proportional to the coating thickness and is converted in the instrument into a corresponding coating thickness value according to the master characteristic and the normaliza-tion and calibration coefficients of the open Application (measurement application memory). All probes of Helmut Fischer GmbH have been master-calibrated in the plant.

Probe FrequencyA generator feeds the measurement probe with an alternating current of a certain frequency. The applied frequency is determined by the measuring application and the probe type.

Probe Characteristic Master characteristic

Range R

Standard Deviation s

Start BitWith asynchronous serial data transfer, a start bit is transmitted before the data word to be transferred. With the logic One to logic Zero transition of the start bit, the receiver can be synchronized to the subsequent data bits.

StatisticsThe result of a measurement series, i.e., the compilation of a large number of single readings into a few characteristic quantities (e.g., mean value, standard deviation, etc.)

Statistical EvaluationCalculation using the measurement data according to statistical mathe-matical methods.


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Random SampleSome parts of the population. In practical applications, a small part of a production batch taken from the production according to random sam-pling methods; the results of the random sample are extrapolated to the en-tire batch (lot, production unit).
Stop BitWith asynchronous serial data transfer, the stop bit is added to the data word to be transferred. 1 to 2 bit logic Ones are used. After the stop bit, the transmitter remains at logic One until the start bit of the next character arrives.

Spread of the Block Mean Values sa

Student Factor t

Sum FrequencyThe sum frequency is that portion of parts (in percent), where the coating thickness is smaller or equal to a particular measurement. In a sum fre-quency chart, the sum frequency can be viewed referenced to the coating thickness. Example: One realizes that 9% of the parts exhibit a coating thickness of less than or equal to 39 µm (1.56 mils).

Sum Frequency ChartGraphical presentation method that can be used to check the measure-ments for normal distribution. A straight line in the sum frequency chart indicates a normal distribution.

Systematic Measurement Error Measurement Error

tThe student factor t can be obtained from popular published tables (e.g., Graf, Henning, Stange, Wilrich: Formeln und Tabellen der angewandten mathematischen Statistik [Formulas and Tables in Applied Mathematical Statistics by Graf, Henning, Stange and Wilrich]; Springer-Verlag) and is stated as follows:

Part Specimen

t1 α

2---–⎝ ⎠

⎛ ⎞ f;Example for a confidence level of 95 % and n > 200 (and thus, de-gree of freedom 199, since f = n - 1) the student factor is t97.5; 199 = 1.96.


Glo

ssar

y
Specification Limits Specification Limits

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y
uEvery instrument is subject to random measurement errors ( Accuracy). With a certain probability (the confidence level), the pre-sumed “true” value (μ) of the measured quantity lies within an interval around the measured mean value d. of a measurement series. The interval is also refereed to as confidence interval. The boundaries of this interval are at a distance u, the measurement uncertainty, from the mean value μ.
For a population with normal distribution, the measurement uncertainty u for a set confidence level (1 - α) is calculated according to the follow-ing formula: u is

By entering the coefficient of variation V in the equation, the relative measurement uncertainty urel in % is obtained.

Transfer Rate Baud Rate

LSL Lower specification limit; is the smallest reading allowed at the measure-ment location.

u-Scale Scale on the right ordinate in the printout of the sum frequency chart. Lin-ear transformation of the measurements into standardized features u. The transformation serves comparison and analysis purposes. The standard-ized feature values are without dimension; their arithmetic mean u is Zero and their standard deviation σ(u) is always 1.

d. u– μ d. u+≤ ≤

u t s⋅n

--------=t: Student factor (can be obtained from popular published tables,

e.g., “Formeln und Tabellen der angewandten mathematisch-en Statistik” [Formulas and Tables in Applied Mathematical Statistics] by Graf, Henning, Stange and Wilrich). For exam-ple, at a 95% confidence level and n > 200, the student factor is t97.5; 199 = 1.96.

s: Standard deviationn: Number of measurements

urelt V⋅

n--------- %[ ]=

u d μ–σ

------------=u: Feature valued: Measured valueμ: Mean value of the populationσ: Standard deviation of the population


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V Coefficient of variation. The spread of a measurement series in percent, i.e., the standard deviation in reference to the mean value. V [%] is a char-acteristic process constant. A sudden change in V [%] indicates a change in the process conditions. V is calculated in the following manner:
VDachEstimated value of the coefficient of variation.

Variance Mean squared deviation. The square root of the variance is called standard deviation (s).

Variance-Analytical Evaluation Statistical method for checking the mean values of various random sam-ples to determine, whether they are comparable or exhibit significant dif-ferences. The spreads of the group mean values is compared to the mean spread of the single readings within the groups.The check value Fbeo is determined ( sa) and based on a comparison with the table value FTab, a determination is made, whether a significant difference between the measurement groups exists.

Example: Variance analytical evaluation when measuring k random sam-ples (groups, “Blocks” Block), each with n single readings.

V sd.---- 100 %[ ]⋅=

V: Coefficient of variations: Standard deviationd. Mean value

V̂

V̂ σ̂d..------ 100 %[ ]⋅=

: Estimated value of the coefficient of variation: Estimated value of the standard deviation σ of the popula-

tiond.. Mean value across the block mean values

V̂σ̂

s2 1n 1–------------ di d.–( )2

i 1=

n

∑⋅=s2: Varianced.: Mean value of the single readingsdi: Single readingsn Number of measurements


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with:

If the condition Fbeo ≤ FTab is met, the mean values of the random samples belong to a common population. If Fbeo > FTab, then the mean values are significantly different. The characteristic value sa ( sa) states the spread of the mean values corrected with regard to the spread of the single readings.

Coefficient of Variation V

ReproducibilityTerm for the differences of the individual measurement results under re-producibility conditions. Reproducibility conditions refer to measure-ments on a specimen according to a specified method, e.g., at different times or with different instruments or with different observers or at differ-ent locations. Measurement results that have been obtained by different persons using different instruments at different locations on the identical specimen must be comparable. The reproducibility is the basis for com-puting the confidence interval for the expected value.

Confidence Interval u

Confidence BordersAn area of the sum frequency chart, where the sum plot can be found. With 95% certainty (confidence level), the true portion following below the respective feature value (e.g., coating thickness) can be found within these borders. For a normal distribution, the confidence borders ptop and pbottom are calculated as follows:

SI2 1

k--- sj

2

j 1=

k

∑= SI2: Mean value of the squared group spreads sj

2

k: Number of random samplesSII

2: Squared spread of the group mean valuesxj: Group mean value of the groupn Number of single readings per groupx Mean value of the group mean values

Fbeo Check value for deciding the answer to the question (in the instrument possibly designated with Fb)

SII2 n

k 1–----------- xj x–( )2

j 1=

k

∑=

x 1k--- xj

j 1=

k

∑=

FbeoSII

2

SI2

--------=

FTab Table value of the F-distribution with Ff1, f2, 1- α

f Degrees of freedom with f1 = (k-1) and f2 = k (n-1)α Significance level


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For measurements not having normal distribution, the confidence bor-ders are entered into the sum frequency chart as a polygon plot and com-puted as follows:

Confidence Level u

True Value Trueness

Probability Chart Sum Frequency Chart

Repeatability Repeatability Precision

puntend d.–

σ̂------------- 1,96 1

n---

d d.–σ̂

-------------⎝ ⎠⎛ ⎞ 2

2n 2–----------------------+⋅

⎝ ⎠⎜ ⎟⎜ ⎟⎜ ⎟⎛ ⎞

–=

pbottom: Lower confidence borderptop: Upper confidence borderd: Measured valued. Mean valuen: Number of all single readings

pobend d.–

σ̂------------- 1,96 1

n---

d d.–σ̂

-------------⎝ ⎠⎛ ⎞ 2

2n 2–----------------------+⋅

⎝ ⎠⎜ ⎟⎜ ⎟⎜ ⎟⎛ ⎞

+=

: Estimated value for the stan-dard deviation σ for the popu-lation

σ̂

punten i( ) yp i( ) 1,96 1n---

yp i( )( )2

2n 2–-------------------+⋅

⎝ ⎠⎜ ⎟⎛ ⎞

–=

yp(i): y-Values of the polygon (sum curve when the measure-ments do not have normal dis-tribution) where i = 1 to n - 1.

poben i( ) yp i( ) 1,96 1n---

yp i( )( )2

2n 2–-------------------+⋅

⎝ ⎠⎜ ⎟⎛ ⎞

+=


Glo

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y
Repeatability Precision Repeated measuring under consistent conditions at the same measurement location leads to random deviations of the measurement data. Consistent conditions means the same observer performing measurements according to a specified method on an identical specimen within short periods using the same instrument at the same location. The standard deviation of the measurement data obtained under repeatability conditions is a measure for the repeatability precision. A large standard deviation or measurement un-certainty of an instrument indicates a poor repeatability precision. The smaller the standard deviation, the better the repeatability precision. The repeatability precision is dependent on the measurement method and the properties of the instrument but also on the properties of the specimen. The repeatability precision can be improved by generating mean values of the measurement series (i single readings).
Eddy Current Method, Amplitude-Sensitive (DIN EN ISO 2360)The excitation current generates a high-frequency magnetic field that in-duces eddy currents in the material. The development of these eddy cur-rents depends on the distance (coating thickness) between the measure-ment probe and the base material. The measurement signal, which captures the reaction of the magnetic field of the eddy currents on the orig-inal magnetic field, is converted into a reading that is proportional to the coating thickness.

CurvatureThe curvature is a measure for how pointed (Excess) or how flat (Kurto-sis) a distribution is compared to a normal distribution. A positive curva-

Ferrite core of the probe

High frequency alternating magnet-ic field

Coating material

base material

induced eddy currents

Excitation current

U = f(d)

Measure-ment signal

Principle of the amplitude sensitive eddy current method

d


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ture is an indication for a relatively narrow and pointed distribution. A negative curvature indicates a relatively flat and wide distribution. The curvature for a normal distribution is Zero.
X Count Rate

XN Count Rate

Count RateX (Phi). Probe signal displayed as a number of electrical impulses. Phi corresponds directly to the measured quantity. The Phi values range be-tween the two extremes Xmin and Xmax. In general, displaying the count rate X serves the purpose of determining whether a noticeable measurement effect is present for a particular mea-suring application. The numeric values for the normalized count rate XN are between 0 and 1 and are calculated according to the following equation:

Random Measurement Error Measurement Error

Two-Point Calibration Corrective calibration

XN X X0–XS X0–--------------------=

XN: normalized count rateX: Count rate for the readingX0: Count rate of the pure, solid coating materialXS: Count rate in air (= no electrical conductivity)


13 Index

AAccessoires 19Accuracy 128Acoustic signals 72, 73, 98Air humidity 22Ambient Temperature 9Amplitude-Sensitive Eddy Current

Method 147Analog display 97Application 123

Save 41Application Memory 123Application Selection 123Area measurement 71, 102Arithmetic Mean Value 126Automatic Block Creation 124Automatic measurement 102Automatic measurement acquisition

70, 72

BBattery

Battery compartment 13Battery compartment cover 28Battery replacement 28Symbol 15

Baud 124Baud Rate 124Bell Curve 128, 134Bidirectional Data Exchange 124Bidirectional data exchange

Control commands 84Bit 124Block 124

Block Mean Value 125Block Result 124Block Size 125

End 124Open 125open 135

Block Creationautomatic 124

Block Mean Value 125, 126Block mean values 94Block Range 136Block Result 124Block Size 125

CCalibration 129

Corrective Calibration 130deleting 52Master calibration 57

Calibration Curve 129Calibration on coating 41, 53Calibration Standard 130

Certification 21Calibration Standards 11, 20,

130Capability Index 127Capability Indexes

Cp, Cpk 127Carriage Return 125Characteristic 129Chi-Squared-Test 125Class 130Coefficient of Variation 144Confidence Borders 145Confidence Interval u 145Confidence Level u 146Contents of Shipment 23Contrast 89Control commands 84Copper beryllium 20Corrective Calibration 130Corrective calibration 41, 47,

48

Operator's Manual FMP10 /FMP 20 Seite 149

Corrective Calibration deleting 52Count Rate 148Cp 127Cpk 127CR 125Curvature 147

DData Exchange

bidirectional 124Data transfer

virt. COM-Port 83Description

Technical Terms 123Device mode 95Display 104

free-running 15Driver installation 82DUAL

DUAL probe 26, 44Setting dual mode 39

Dual method 105Dual probe

Measurement method 73

EEddy Current Method

amplitude-sensitive 147EEPROM 19Eingeschränkter Bedienmodus

14EMC 9End of Block 124Environmental Conditions 9Error mesages 114Estimated Value 137Evaluation 123

statistical 140variance analytical 144

External Start 100, 126

FFDD Evaluation 127Fe 127Final Result 126Free-running display 15FreeRunning Mode 128Free-running mode 94Frequency Distribution 128

GGaussian Distribution 134Gaussian Normal Distribution

128, 134Gaussian Probability Paper 128Glossary 123Group Separator 128Group separator 94Grubbs Test 128

HHistogram 129

IInstrument

Contents of Shipment 23Dimensions 21On/Off 33Options 23Power Connection 27Power consumption 22Repairs 11Warrantee 12Weight 21

Instrument configuration 108Print form 108

Instrument mode 95Instrument setting 86

Service functions 86Instrument settings

Analog display 97Area measurement 102

Seite 150 Operator's Manual FMP10 /FMP 20

Automatic measurement 102Contrast 89Display 104Dual method 105External Start 100Instrument mode 95Language 88Lighting 90Limited operating mode 95Master calibration 107Measurement acquisition signal 98

Measurement effect 99Measurement output 94Measuring mode 104Re-initialization 93Storage mode 107Switch off mode 92Unit of Measurement 106

Insulating Material 129Intended Use 8Iso 129

KKeys 13

Arrow down 18Arrow up 18CAL 17DEL 16ENTER 18FINAL-RES 17ON/OFF 13, 17SEND 18ZERO 17

Kolmogoroff Smirnoff Test 130

LLanguage 88LCD Display 13, 14LCD display

Contrast 89Lighting 90

LF 131

Lift-off distance 22Lighting 90Limited operating mode 95Line Feed 131Low Voltage 9LSL 128, 143

Mm 131Magnetic Induction Measuring Me-

thod 131Making measurements

acoustic signals 73Malfunctions 110, 114Master Calibration

Normalized Countrate Xn of a Ca-libration Standard 65

Xn Ranges for Calibration Stan-dards 63

Master calibration 41, 57, 59, 107

Master Characteristic 129, 131Master foil 20Mean Value 126

Block Mean Value 126mean Value

arithmetic 126Measurement

Influencing parameters 66Making 67Preparation 66

Measurement Acquisition 69Area measurement 71

Measurement acquisitionacoustic signals 72Automatic 70, 72

Measurement Data Presentation 133

Measurement effect 99Measurement Error 132Measurement Location 133


Measurement Method 33, 133Amplitude-sensitive eddy current method 147

Measurement method 25Amplitude-sensitive eddy current method 25, 26

Magnetic induction 25, 26Measurement Object 133Measurement output 94Measurement Range 132Measurement Series 133Measuring Application 132Measuring Method

magnetic induction 131Measuring Mode 133Measuring mode 104Measuring modes 21, 35Messages 114mils 131Monitoring of the Test Equipment

133

NNormal Distribution 134

Gaussian 128, 134Normalization 41, 45, 135Normalized Countrate Xn 65

OOffline 135Offline operation 83On/Off 33One-Point Calibration 130Online 136Online operation 83Open Block 125, 135Operating Personnel 8Options 23Outlier rejection 123Outliers 123

PParity 136Peep tone 72, 73, 98Population 128Power Connection 9, 27Power consumption 22Power-Up 34Precision 136Probe 19, 140

Angle probe 67axial 67Connection 30Connector Socket 13Handling 10, 37Two-tip 68

probeassigning 38

Probe Characteristic 131Probe connector 30Probe connector socket 31Probe Frequency 140Probe plug 19, 31

QQuality Assurance 136

RR 136R. 136Random Sample 141Range 136

R 136R. 136

Reading 133Single Reading 126

ReadingsTransfer to PC 83

Rechargeable battery 28Reference Area 137Reference Measurements 44


Regression Line 139Reinigung 36Re-initialization 93Repairs 11Repeatability 136Repeatability Precision 147Reproducibility 136, 145

Ss 138Service function

Analog display 97Area measurement 102Automatic measurement 102Contrast 89Display 104Dual method 105External Start 100Instrument mode 95Language 88Lighting 90Master calibration 107Measurement effect 99Measurement output 94Measuring mode 104Re-initialization 93Storage mode 107Switch off mode 92Unit of Measurement 106

Service functions 86Sigma Limits 139Single readigngs 94Single Reading 126Skewness 139Specification Limit

LSL 128, 143USL 128

Spread 138s 138

Standard Deviation 138Estimated Value 137

Start Bit 140

Statistical Evaluation 140Statistics 140Stop Bit 141Storage mode 107Student Factor

t 141Student factor 141Sum Frequency 141Sum Frequency Chart 141Supervisor Code 140Supervisor Password 140Switch off mode 92Switch on 34System Check 130

Tt 141Technical Data 21Technical Terms 123Temperature

Operation 21Storage 22

Temperature Range During Storage and Transport 9

Transfer formats 84Trueness 137Turning Off the Instrument 35Two-Point Calibration 130

Uu 145, 146Unit of Measurement 106, 131USB

Connection 82Connector 13, 22, 81Driver 82Port 82

USB connection 81USB Port 137u-Scale 143


USL 128Specification Limit

USL 135

Vv 144Variance 144Variance Analytical Evaluation

144Voltage supply 22

WWarning messages 114Warrantee 12Weight 21

XXn 65


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Documents

Fischer Dualscope FMP10-20 Instruction Manual