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8/11/2019 FGH80N60FD.pdf
1/9
2007 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FGH80N60FD Rev. C2
FGH80N60FD
600VFieldStopIGBT
November 2013
Absolute Maximum Ratings
Notes :
(1) Repetitive rating : Pulse width limited by max. junction temperature
Thermal Characteristics
Symbol Description Ratings Unit
VCES Collector-Emitter Voltage 600 V
VGES Gate-Emitter Voltage 20 V
ICCollector Current @ TC= 25C 80 A
Collector Current @ TC= 100C 40 A
ICM (1) Pulsed Collector Current @ TC= 25C 160 A
PDMaximum Power Dissipation @ TC= 25C 290 W
Maximum Power Dissipation @ TC= 100C 116 W
TJ Operating Junction Temperature -55 to +150 C
Tstg Storage Temperature Range -55 to +150 C
TLMaximum Lead Temp. for solderingPurposes, 1/8 from case for 5 seconds
300 C
Symbol Parameter Typ. Max. Unit
RJC(IGBT) Thermal Resistance, Junction-to-Case -- 0.43 C/W
RJC(Diode) Thermal Resistance, Junction-to-Case 1.5 C/W
RJA Thermal Resistance, Junction-to-Ambient -- 40 C/W
G
C
E
EC
G
COLLECTOR(FLANGE)
FGH80N60FD600 V Field Stop IGBT
Features
High Current Capability
Low Saturation Voltage: VCE(sat) = 1.8 V @ IC= 40 A
High Input Impedance
Fast Switching
RoHS Complaint
Appl icat ions
Induction Heating, PFC, Telecom, ESS
General Descript ion
Using novel field stop IGBT technology, Fairchild's field stop
IGBTs offer the optimum performance for induction heating,
telecom, ESS and PFC applications where low conduction and
switching losses are essential.
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2007 Fairchild Semiconductor Corporation 2 www.fairchildsemi.com
FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Package Marking and Ordering Information
Electrical Characteristics of the IGBT TC= 25C unless otherwise noted
Part Number Top Mark Package Packing Method Reel Size Tape Width Quantity
FGH80N60FDTU FGH80N60FD TO-247 Tube N/A N/A 30
Symbol Parameter Test Conditions Min. Typ. Max. Unit
Off Characteristics
BVCES Collector-Emitter Breakdown Voltage VGE= 0 V, IC= 250 uA 600 -- -- V
BVCES /
TJ
Temperature Coefficient of Breakdown
Voltage
VGE= 0 V, IC= 250 uA-- 0.6 -- V/C
ICES Collector Cut-Off Current VCE= VCES, VGE= 0 V -- -- 250 uA
IGES G-E Leakage Current VGE= VGES, VCE= 0 V -- -- 400 nA
On Characteristics
VGE(th) G-E Threshold Voltage IC= 250 uA, VCE= VGE 4.5 5.5 7.0 V
VCE(sat) Collector to Emitter
Saturation Voltage
IC = 40 A, VGE= 15 V -- 1.8 2.4 V
IC = 40 A, VGE= 15 V,
TC= 125C-- 2.05 -- V
Dynamic Characteristics
Cies Input Capacitance
VCE = 30 V, VGE= 0 V,
f = 1 MHz
-- 2110 -- pF
Coes Output Capacitance -- 200 -- pF
Cres Reverse Transfer Capacitance -- 60 -- pF
Switching Characteristics
td(on) Turn-On Delay Time
VCC= 400 V, IC= 40 A,
RG= 10 , VGE = 15 V,
Inductive Load, TC = 25C
-- 21 -- ns
tr Rise Time -- 56 -- ns
td(off) Turn-Off Delay Time -- 126 -- ns
tf Fall Time -- 50 100 ns
Eon Turn-On Switching Loss -- 1 1.5 mJ
Eoff Turn-Off Switching Loss -- 0.52 0.78 mJ
Ets Total Switching Loss -- 1.52 2.28 mJ
td(on) Turn-On Delay Time
VCC= 400 V, IC= 40 A,
RG= 10 , VGE = 15 V,Inductive Load, TC = 125C
-- 20 -- ns
tr Rise Time -- 54 -- ns
td(off) Turn-Off Delay Time -- 131 -- ns
tf Fall Time -- 70 -- ns
Eon Turn-On Switching Loss -- 1.1 -- mJ
Eoff Turn-Off Switching Loss -- 0.78 -- mJ
Ets Total Switching Loss -- 1.88 -- mJ
Qg Total Gate Charge
VCE= 400 V, IC= 40 A,
VGE= 15 V
-- 120 -- nC
Qge Gate-Emitter Charge -- 14 -- nC
Qgc Gate-Collector Charge -- 58 -- nC
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FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Electrical Characteristics of the Diode TC= 25C unless otherwise noted
Symbol Parameter Test Conditions Min. Typ. Max Unit
VFM Diode Forward Voltage IF= 20 ATC= 25C - 2.3 2.8 V
TC= 125C - 1.7 -
trr Diode Reverse Recovery Time
IF=20 A,
diF/ dt = 200 A/s
TC= 25C - 36 - nsTC= 125C - 105 -
Irr Diode Reverse Recovery CurrentTC= 25C - 2.6 - ATC= 125C - 7.8 -
Qrr Diode Reverse Recovery ChargeTC= 25C - 46.8 - nCTC= 125C - 409 -
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FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Typical Performance Characteristics
Figure 1. Typical Output Characteristics Figure 2. Typical Saturation VoltageCharacteristics
Figure 3. Typical Saturation Voltage Figure 4. Transfer Characteristics Characteritics
Figure 5. Saturation Voltage vs. Case Figure 6. Saturation Voltage vs. VgeTemperature at Variant Current Level
0 2 4 6 8 100
40
80
120
160
20V
TC= 25oC
12V
15V
10V
VGE= 8VCollectorCurrent,IC[A]
Collector-Emitter Voltage, VCE[V]
0 2 4 6 8 100
40
80
120
160
20V
TC= 125oC
12V
15V
10V
VGE= 8VCollectorCurrent,IC[A]
Collector-Emitter Voltage, VCE[V]
25 50 75 100 1251.0
1.5
2.0
2.5
3.0
3.5
80A
40A
20A
Common Emitter
VGE= 15V
Collector-EmitterVoltage,V
CE
[V]
Case Temperature, TC[oC]
4 8 12 16 200
4
8
12
16
20
IC= 20A
40A
80A
Common Emitter
TC
= 25oC
Collector-EmitterVoltage,
VCE[V]
Gate-Emitter Voltage, VGE[V]
0 1 2 3 4 5 60
40
80
120
160
Common Emitter
VGE= 15V
TC= 25oC
TC= 125oC
CollectorC
urrent,IC[A]
Collector-Emitter Voltage, VCE[V]
2 4 6 8 10 120
40
80
120
160Common Emitter
VCE= 20V
TC= 25oC
TC= 125oC
CollectorCurrent,IC[A]
Gate-Emitter Voltage,VGE[V]
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FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Typical Performance Characterist ics (Continued)
Figure 7. Saturation Voltage vs. Vge Figure 8. Capacitance Characteristics
Figure 9. Gate Charge Characteristics Figure 10. SOA Characteerist ics
Figure 11. Turn-Off Switching SOA Figure 12. Turn-On Characteristi cs vs. Characteristics Gate Resistance
4 8 12 16 20
0
4
8
12
16
20
IC= 20A
40A
80A
Common Emitter
TC= 125oC
Collector-EmitterVoltage,
VCE
V
Gate-Emitter Voltage, VGE[V]0.1 1 10
0
1000
2000
3000
4000
5000Common Emitter
VGE= 0V, f = 1MHz
TC= 25oC
Crss
Coss
Ciss
Capacitance[pF]
Collector-Emitter Voltage, VCE[V]30
1 10 100 10000.01
0.1
1
10
100
1ms
10 ms
DCSingle Nonrepetitive
Pulse TC= 25oC
Curves must be derated
linearly with increase
in temperature
10s
100s
CollectorCurrent,Ic[A]
Collector-Emitter Voltage, VCE[V]
400
0 50 100 1500
3
6
9
12
15Common Emitter
TC= 25oC
300V200V
Vcc
= 100V
Gate-E
mitterVoltage,
VGE
[V]
Gate Charge, Qg[nC]
0 10 20 30 40 50
10
100
200
Common Emitter
VCC= 400V, VGE= 15V
IC= 40A
TC= 25oC
TC= 125oC
td(on)
tr
SwitchingTime[ns]
Gate Resistance, RG
51 10 100 1000
1
10
100
Safe Operating Area
VGE
= 20V, TC= 100
oC
CollectorCurrent,IC[A]
Collector-Emitter Voltage, VCE[V]
200
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2007 Fairchild Semiconductor Corporation 6 www.fairchildsemi.com
FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Typical Performance Characterist ics (Continued)
Figure 13. Turn-Off Characteristi cs vs. Figure 14. Turn-On Characteristi cs vs.Gate Resistance Collector Current
Figure 15. Turn-Off Characteristics vs. Figure 16. Switching Loss vs Gate Resistance Collector Current
Figure 17. Switching Loss vs Collector Current
0 10 20 30 40 5010
100
1000
Common Emitter
VCC= 400V, VGE= 15V
IC= 40A
TC= 25oC
TC= 125oC
td(off)
tf
SwitchingTime[ns]
Gate Resistance, RG[ ]
2000
20 40 60 8010
100
Common Emitter
VGE= 15V, RG= 10
TC= 25
oC
TC= 125
oC
tr
td(on)
SwitchingTime[ns]
Collector Current, IC[A]
200
20 40 60 80
100
500Common Emitter
VGE= 15V, RG= 10
TC= 25
oC
TC= 125
oC
td(off)
tf
SwitchingTime[ns]
Collector Current, IC[A]
200 10 20 30 40 50
1
0.3
Common Emitter
VCC
= 400V, VGE
= 15V
IC= 40A
TC= 25
oC
TC= 125
oC E
on
Eoff
SwitchingLo
ss[mJ]
Gate Resistance, RG[ ]
5
20 40 60 80
0.1
1
10Common Emitter
VGE
= 15V, RG
= 10
TC= 25
oC
TC= 125
oC
Eon
Eoff
SwitchingLoss[mJ]
Collector Current, IC[A]
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2007 Fairchild Semiconductor Corporation 7 www.fairchildsemi.com
FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Typical Performance Characterist ics (Continued)
Figure 18. Transient Thermal Impedance of IGBT
Figure 19. Forward Characteristi cs Figure 20. Stored Charge
Figure 21. Reverse Recovery Time Figure 22. Reverse Recovery Current
0 1 2 3 40.1
1
10
100
TC= 75oC
TC= 25oC
TC= 125oC
Forward Voltage , VF[V]
ForwardCurrent,
IF[A]
100 200 300 4000
100
200
300
400
500
600
125oC
25oC
StoredRecoveryCharge,
Qrr
[nC]
di/dt ,[A/s]
100 200 300 40020
40
60
80
100
120
140
125oC
25oC
ReverseRecoveryTim
e,
trr
[ns]
di/dt, [A/
s]
5 100 200 300 4000
5
10
15
20
125oC
25oC
ReverseRecoveryCurrent,Irr
[A]
di/dt, [A/
s]
5
1E-5 1E-4 1E-3 0.01 0.1 11E-3
0.01
0.1
1
0.2
0.5
0.1
0.05
0.010.02
single pulse
ThermalResponse[Zthjc]
Rectangular Pulse Duration [sec]
Duty Factor, D = t1/t2
Peak Tj= Pdm x Zthjc + TC
t1
PDM
t2
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2007 Fairchild Semiconductor Corporation 8 www.fairchildsemi.com
FGH80N60FD Rev. C2
FGH80N60FD600VFieldStopIGBT
Mechanical Dimensions
Figure 23. TO-247 3L - TO-247,MOLDED,3 LEAD,JEDEC VARIATION AB
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchilds worldwide terms and conditions, specif-
ically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductors online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TO247-003
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FGH80N60FD Rev. C2
TRADEMARKS
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intended to be an exhaustive list of all such trademarks.
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMERFAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILDS WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
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As used here in:
1. Life support devices or systems are devices or systems which, (a) areintended for surgical implant into the body or (b) support or sustain life,and (c) whose failure to perform when properly used in accordance withinstructions for use provided in the labeling, can be reasonablyexpected to result in a significant injury of the user.
2. A critical component in any component of a life support, device, orsystem whose failure to perform can be reasonably expected to causethe failure of the life support device or system, or to affect its safety oreffectiveness.
PRODUCT STATUS DEFINITIONSDefinition of Terms
AccuPowerAX-CAP*BitSiCBuild it NowCorePLUSCorePOWERCROSSVOLTCTLCurrent Transfer LogicDEUXPEED
Dual CoolEcoSPARK
EfficentMaxESBC
Fairchild
Fairchild Semiconductor
FACT Quiet SeriesFACT
FAST
FastvCoreFETBenchFPS
F-PFSFRFET
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OptoHiTOPTOLOGIC
OPTOPLANAR
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Saving our world, 1mW/W/kW at a timeSignalWiseSmartMaxSMART STARTSolutions for Your SuccessSPM
STEALTHSuperFET
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SyncFET
Sync-Lock
*
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TINYOPTOTinyPowerTinyPWMTinyWireTranSiCTriFault DetectTRUECURRENT*SerDes
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Rev. I66