Europe EMC Guide

More online at interferencetechnology.eu

Belgique........................... 145 česká Republika / Slovensko........................ 149 Deutschland......................49 España...............................111 France...................................77 Italia.......................................99 Nederland........................ 137 Österreich........................ 162 Polska.................................119 Schweiz..............................131 United Kingdom..............11

2011

Europe EMC Guide

Bringing the world technical articles and EMC buyers’ guidesfrom multiple countries, in multiple languages.

ITEMTM

www.interferencetechnology.eu

The International Journal of Electromagnetic Compatibility

2012 EUROPE EMC GUIDE

1 interference technology eUroPe emc gUide 2011interferencetechnology.eu interference technology 1

4 Letter from the editor

6 european reSourceS standards organizations, government sites, institutes and trade associations

8 caLendar of eVentS

164 indeX of adVertiSerS

united Kingdom

12 productS & SerViceS

17 reSourceS

20 european emc directiVeS graham mays, emc consultant

26 hemp fiLter deSign to meet miL-Std-188-125 pci teSt requirementS antoni Jan nalBorczyK, mPe limited

34 Jedec & tape reeL iSSueS roBert J. vermillion, rmv technology group, llc

deutschland

50 produkte und SerViceS

54 reSSourcen

56 neuerungen in der emV emiSSionSmeSStechnik (changes to EMC Emission Measurement ) stePhen Braun, gauss instruments gmbh

66 emV auf ic-eben (EMC at Chip Level: Assessment of IC Immunity to Pulse Disturbances) sven Konig, langer emv-technik gmbh

70 neue emV-teSteinrichtung fÜr hybrid-, eLektro- und brennStoffzeLLenantriebe (New EMC Test System for Hybrid, Electric and Fuel Cell Drives) s. Klein, J. mooser, mooser emc technik gmbh

Contents 2011 Europe EMC Guide

S u b s c r i p t i o n sITEM, InterferenceTechnology—The EMC Directory & Design Guide, The EMC Symposium Guide, The EMC Test & Design Guide and the Europe EMC Guide are distributed annually at no charge to engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. Subscriptions are available through interferencetechnology.com.

Translations available at


2 interference technology eUroPe emc gUide 2011

France

78 produitS et SerViceS

80 reSSourceS

82 conception aSSiStée par meSure champ proche (Aided Design Near Field Measurement) sÉBastien serPaud, loic arnal, nexio; Blaise ravelo, david Baudry, eSigelec/irSeem

92 eLectromagnetic attackS caSe StudieS on cryptographic hardWare acceLeratorS laurent sauvage, et al, institut telecom, telecom Paristech

italia

100 prodotti e SerVizi / riSorSe

102 come un riceVitore compLetamente digitaLe pienamente conforme può ridurre L’incertezza di miSura neLLe proVe di emiSSione per compatibiLità eLettromagnetica (Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests) domenico Festa, iBd international Business development

esPaña

112 productoS y SerVicioS

114 recurSoS

116 diStorSion armónica en SiStemaS de enSayoS de inmunidad (Harmonic Distortion in Immunity Test Systems ) Jason smith, Pat malloy, Jr., ar/rF microwave instrumentation

PolsKa

120 produkty i uStugi

122 zaSoby

124 StatuS dyrektWy emc

126 KoreKcja Niedopasowań w Torze pomiarowym przewodzoNych zaburzeń radioeleKTryczNych (Corrections of Mismatches in the Measurement of Conducted Disturbance) Jan sroKa, emc testcenter zurich ag

Contents2011



interferencetechnology.eu interference technology 3

schweiz

132 reSSourcen / produkte und SerViceS

134 the effectS of the neW eSd Standard on eSd SimuLatorS Bruno straumann, haefely test ag

nederland

138 producten en SerViceS

139 middeLen

140 a change in internationaL emc LegiSLation; do induStriaL premiSeS become outLaWed? mart coenen, emcmcc bv

BelgiQue

146 reSSourceS

148 produitS et SerViceS

ČESKÁ REPUBLIKA / SLovEnSKo

150 Výrobky a SLužby / zdroJe

154 měřeNí emc v časové oblasTi: Nová meToda cispr vhodNá pro aNalýzu přechodNých rušivých vyzařováNí v oblasTi průmyslu a auTomobilNí eleKTroNiKy (EMC Measurements in Time Domain) wolFgang winter, marKus herBrig, zuzana wood, emv gmbh

Österreich

163 produkte und SerViceS / reSSourcen

Europe EMC Guide

InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, and The EMC Test & Design Guide are distributed annually at no charge to qualified engineers and managers who are engaged in the application, selection, design, test, specification or procurement of electronic components, systems, materials, equipment, facilities or related fabrication services. To be placed on the subscriber list, complete the subscription qualification card or subscribe online at InterferenceTechnology.com.

ITEM PublIcaTIonS endeavors to offer accurate information, but assumes no liability for errors or omissions in its technical articles. Furthermore, the opinions contained herein do not necessarily reflect those of the publisher.

ITEMTM, InterferenceTechnology™—The Annual EMC GuideTM, and Interference Technology.comTM are trademarks of ITEM PublIcaTIonS and may not be used without express permission. ITEM, InterferenceTechnology—The Annual EMC Guide, The EMC Symposium Guide, The EMC Test & Design Guide and InterferenceTechnology.com, are copyrighted publications of ITEM PublIcaTIonS. contents may not be reproduced in any form without express permission.



4 INTERFERENCE TECHNOLOGY EUROPE EMC GUIDE 2011

USA1000 Germantown Pike, F-2

Plymouth Meeting, PA 19462Phone: (484) 688-0300

Fax: (484) 688-0303E-mail:

[email protected]

CHINA, TAIWAN, HONG KONGLeadzil

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E-mail: [email protected]

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Miho Toshima+81-44-980-2092

E-mail: [email protected]

ITEM PUBLICATIONS endeavors to offer accurate information, but assumes no liability for errors or omissions. Information published herein is based on the latest information available at the time of publication. Furthermore, the opinions contained herein do not necessarily refl ect those of the publisher.

I T E M T M , I n t e r f e r e n c e T e c h n o l o g y ™ a n d Inter ferenceTechnology.comTM are trademarks of ITEM PUBLICATIONS and may not be used without express permission. ITEM, InterferenceTechnology and InterferenceTechnology.com are copyrighted publications of ITEM PUBLICATIONS. Contents may not be reproduced in any form without express permission.

Copyright © 2010 • ITEM Publications • ISSN 0190-0943

PublisherPaul Salotto

EditorSarah Long

Production ManagerAmelia McKean

Business Development ManagerBob Poust

Business Development ExecutivesTim Bretz

Daryl McFadyenLeslie Ringe

Jan Ward

Administrative ManagerEileen M. Ambler

Production CoordinatorJacqueline Gentile

Circulation ManagerIrene H. Nugent

Product Development ManagerHelen S. Flood

Administrative AssistantKaren Holder

Publisher EmeritusRobert D. Goldblum

PresidentGraham S. Kilshaw

ITEM™

There is a saying in the USA about the Golden Gate bridge in San Francisco. It is so long that the moment the painters have fi nished painting it, they need to go

back and immediately start all over again. It is a continuous job! And yes, developing a publication about the world of EMC in Europe feels very similar. No sooner had we sent it to press, than updated IEC regulations hit our inboxes.

And herein lies both the need for a comprehensive European EMC publication, and at the same time the challenge of how to do it. On the one hand, EMC legislation for electronic products and devices is largely driven by the European EMC Directive (Directive 2004/108/EC). But that’s not the whole picture. Many manufacturers and electronics OEMs must also be cognizant of the ongoing requirements published by the IEC (www.iec.ch), including CISPR, CENELEC (European Committee for ElectroTechnical Standardization, www.cenelec.eu) and ETSI (European Telecommunications Standards Institute www.etsi.org) to mention but a few. In addition, the regulatory bodies of diff erent European countries (BSI, VDE, SEV etc) also have local standards or local interpretations of the European standards. It is an ongoing minefi eld of information, and therefore a central source of European information would seem to be a helpful thing.

We will be the fi rst to say, however, that the new Europe EMC Guide can barely begin to unravel the continuous web of European and local requirements in a single edition, but we can at least make a start, and here it is – the fi rst ever truly European Interference Technology Europe EMC Guide. You will see as you turn the pages, it’s not just about the regulations – local events, local suppliers and representatives, directories, resources, and technical articles also make up the new Europe EMC Guide.

As we researched the idea of a European EMC publication, two key challenges quickly became evident:

#1: We surveyed you the readers in Europe and you told us that you want content in your own language. So how could we accommodate multiple language needs?

#2: You also told us you wanted it in print (a single, annual edition) that you could carry around, and easily reference. So with all the regulatory activity, how could we keep the information up to date?

When I tell you our answers to these challenges, you will see how the Europe EMC Guide works.

#1: Language. e Guide is divided into 11 sections, one section for each country, with each section in the language of that country. But this created another problem. How would, for example, an English electronics engineer read the German articles, or a French engineer the Czech articles? Solution: All non-English content is translated into English and in some cases, other languages too, and available online at www.interferencetechnology.eu

#2: Updates. e information here in our 2011 edition could never contain everything we would like to publish. Also, since this edition was printed, new information like standards updates, new suppliers, and new information about EMC events have arisen. Solution: Over the next year, we will regularly publish updated versions of this 2011 edition online. Sign up to receive free updates at www.interferencetechnology.eu

You can imagine the amount of work required to publish something like this. We would like to take this opportunity to acknowledge all those from Europe and around the world who contributed to this premier edition, and of course our advertisers without whom the publication would not exist.

WELCOME TO THE EUROPE EMC GUIDE

Sarah Long ITEM Publications

Letter from the Editor

StandardS organizationS

CEn, thE EuropEan CommittEE for StandardizationCEN is a provider of European Standards and technical specifica-tions. It is a recognized European organization according to Direc-tive 98/34/EC for the planning, drafting and adoption of European Standards in all areas of economic activity with the exception of electrotechnology (CENELEC) and telecommunication (ETSI).CEN-CENELEC Management Centre, Avenue Marnix 17, B-1000 Brussels, Belgium; + 32 2 550 08 11; Fax: + 32 2 550 08 19; www.cen.eu/cenorm/homepage.htm

CEnELEC- EuropEan CommittEE for ELECtrotEChni-CaL StandardizationCENELEC’s mission is to prepare voluntary electrotechnical stan-dards that help develop the Single European Market/European Economic Area for electrical and electronic goods and services removing barriers to trade, creating new markets and cutting compliance costs.17, Avenue Marnix, B-1000 Brussels, Belgium; +32 2 519 68 71; Fax: +32 2 519 69 19; www.cenelec.org

EuropEan tELECommuniCationS StandardS inStitutERecognized as an official European Standards Organization by the European Union, ETSI produces globally applicable standards for Information & Communications Technologies including fixed, mobile, radio, broadcast, internet, aeronautical and other areas. ETSI Secretariat: 650, Route des Lucioles, 06921 Sophia-Anti-polis Cedex, France; +33 (0)4 92 94 42 00; Fax: +33 (0)4 93 65 47 16; [email protected]; www.etsi.org

intErnationaL ELECtrotEChniCaL CommiSSion (iEC)The IEC prepares and publishes International Standards for all electrical, electronic and related technologies — collectively known as electrotechnology.IEC Central Office, 3, rue de Varembé, P.O. Box 131, CH - 1211 Geneva 20, Switzerland; +41 22 919 02 11, Fax: +41 22 919 03 00; [email protected], www.iec.ch

• iEC’s EmC zone: www.iec.ch/zone/emc/emc_entry.htm• CiSpr: The principal task of CISPR, the International Special

Committee on Radio Interference, is at the higher end of the frequency range, from 9 kHz upwards, preparing standards that offer protection of radio reception from interference sources such as electrical appliances of all types, the elec-tricity supply system, industrial, scientific and electromedical RF, broadcasting receivers (sound and TV) and, increasingly, IT equipment (ITE). www.iec.ch/zone/emc/emc_cis.htm

intErnationaL organization for Standardization A developer and publisher of international standards, ISO is comprised of a network of the national standards institutes of 163 countries, one member per country, with a Central Secretariat in Geneva, Switzerland, that coordinates the system.ISO Central Secretariat: 1, ch. de la Voie-Creuse, Case postale 56, CH-1211 Geneva 20, Switzerland; +41 22 749 01 11; Fax +41 22 733 34 30; www.iso.org

govErnmEnt SitES

CEoC intErnationaLSecretariat, Rue du Commerce 20-22, B-1000 Brussels, Belgium; +32 2 511 5065; Fax: +32 2 502 5047; [email protected]; www.ceoc.com/

Efta (EuropEan frEE tradE aSSoCiation)Headquarters: 9-11, rue de Varembé, CH-1211 Geneva 20, Swit-zerland; (+41 22) 332 2626; Fax: (+41 22) 332 2677; [email protected]; www.efta.int/

EuropEan CommiSSionSecretariat-General, B-1049 Brussels, Belgium; http://ec.europa.eu

• European new Legislative framework for marketing of prod-ucts: http://ec.europa.eu/enterprise/policies/single-market-goods/regulatory-policies-common-rules-for-products/new-legislative-framework/

EuropEan CommuniCationS offiCE Nansensgade 19, 3rd floor, 1366 Copenhagen, Denmark; +45 33 89 63 00; Fax: +45 33 89 63 30; [email protected]; www.ero.dk/

EuropEan EnvironmEnt agEnCyKongens Nytorv 6, DK - 1050 Copenhagen K, Denmark; +45 3336 7100; Fax: (+45) 33 36 71 99; www.eea.europa.eu/

EuropEan unionCouncil of the European Union: Rue de la Loi / Wetstraat, 175, B-1048 Brussels, Belgium; (32-2) 281 61 11: Fax: (32-2) 281 73 97 / 81; http://europa.eu/

rapExEU consumer alerts about unsafe productsEuropean Commission, Health & Consumers Directorate-Gener-al, B – 1049 Brussels, Belgium; http://ec.europa.eu/consumers/dyna/rapex/rapex_archives_en.cfm

inStitutES & tradE aSSoCiationS

ELECtromagnEtiC CompatibiLity induStry aSSoCiation (EmCia)Nutwood UK Limited, Eddystone Court, De Lank Lane, St Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871; [email protected]; www.emcia.org

ELECtromagnEtiCS SoCiEty (aCES)President Osama Mohammed, ECE Department, Florida Interna-tional University, 10555 W. Flagler Street, EAS-3983, Miami, FL 33174 USA; +1-305-348-3040; [email protected]; http://aces.ee.olemiss.edu/

EnErgy inStitutE (Ei)61 New Cavendish Street, London W1G 7AR, United Kingdom; +44 (0) 20 7467 7100; [email protected]; www.energyinst.org

6 interference technology europe emc guide 2011

Resources Europe

EuropEan fEdEration for non-dEStruCtivE tESt-ing (Efndt)European Building Services scrl, 80, avenue de l’Opale, B-1030 Bruxelles; +3227432980; Fax: 3227432990; www.efndt.org/

EuropEan fEdEration of nationaL aSSoCiationS of mEaSurEmEnt, tESting and anaLytiCaL Laborato-riES (EuroLab)Eurolab Secretariat, Jean-Marc Aublant, LNE, France, EURO-LAB, 1, rue Gaston Boissier, 75724 Paris CEDEX 15 France; +33 1 40 43 39 23; [email protected]; www.eurolab.org

iEC SyStEm for Conformity tESting and CErtifiCa-tion of ELECtriCaL EquipmEnt (iECEE)Executive Secretary IECEE, c/o IEC Central Office, 3, Rue de Varembé, PO Box 131, 1211 Geneva, Switzerland; +41 22 919 02 34; Fax: +41 22 919 03 00, www.iecee.org

iEEE EmC SoCiEtyIEEE Corporate Office, 3 Park Avenue, 17th Floor, New York, N.Y. 10016-5997 USA; +1 212 419 7900; Fax: +1 212 752 4929; www.ewh.ieee.org/soc/emcs

• i E E E p r o d u c t S a f e t y E n g i n e e r i n g S o c i e t y : http://ewh.ieee.org/soc/pses/

inartE, intErnationaL aSSoCiation for radio, tELE-CommuniCationS and ELECtromagnEtiCS840 Queen Street, New Bern, NC 28560 USA; +1-252-672-0200; +1-800-89-NARTE; Fax: +1-252-672-0111; www.narte.org

inStitution of EnginEEring and tEChnoLogyMichael Faraday House, Stevenage, Herts SG1 2AY United King-dom; +44 (0)1438 313 311; Fax: +44 (0)1438 765 526; [email protected]; www.theiet.org

intErnationaL aCCrEditation forum, inC. (iaf)IAF Corporate Secretary, John Owen, PO Box 819, Cherrybrook, NSW 2126, Australia; +612 9481 7343; [email protected]; www.iaf.nu/

intErnationaL Laboratory aCCrEditationCoopEration (iLaC)The ILAC Secretariat, PO Box 7507, Silverwater, NSW 2128, Australia; +61 2 9736 8374; Fax: +61 2 9736 8373; [email protected]; www.ilac.org/home.html

intErnationaL tELECommuniCationS unionPlace des Nations, 1211 Geneva 20, Switzerland; +41 22 730 5111; +41 22 733 7256; [email protected]; www.itu.int/home

EuropEan dirECtivES & rEguLationS

atEx - ExpLoSivE atmoSphErES dirECtivEEuropean ATEX Directive 94/9 /EC, ht tp: //ec.europa.eu/enterprise/sectors/mechanical/documents/guidance/atex/application/

CE marking dirECtivEEuropean CE Marking Directive 93/68/EEC, http://tiny.cc/xujgp

EmC - ELECtromagnEtiC CompatibiLity dirECtivEGuidelines for the EMC Directive 2004/108/EC, http://ec.europa.eu /enterprise /sectors /electrical / f iles /emc_guide_ _up dated_20100208_v3_en.pdf

E.u. ELECtriCaL SafEty ht tp : / /ec.europa.eu /enterprise /sectors /electrical / lvd / index_en.htm

E.u. ELECtromagnEtiC CompatibiLityhttp://ec.europa.eu/enterprise/sectors/electrical/emc/

E.u. rEaCh rEguLation(Registration, Evaluation, Authorisation and Restriction of Chemicals), Regulation (EC) No 1907/2006 of the European Parliament and of the Council, http://ec.europa.eu/enterprise/sectors/chemicals/reach/index_en.htm

Eup - ECo-dESign rEquirEmEntS for EnErgy-uSing produCtS dirECtivEEuropean Directive 2009/125/EC (EuP), http://ec.europa.eu/enterprise/policies/sustainable-business/documents/eco-design/

gEnEraL produCt SafEty dirECtivEEuropean Directive 2001/95/EC (GPSD), http://ec.europa.eu/consumers/safety/prod_legis/index_en.htm

Lvd - Low voLtagE dirECtivEEuropean Directive 2006/95/EC (LVD), http://ec.europa.eu/enterprise/sectors/electrical /documents/lvd/legislation/index_en.htm

maChinEry dirECtivE Text of European revised Machinery Directive 2006/42 /EC, ht tp: //ec.europa.eu/enterprise/sectors/mechanical / documents/legislation/machinery/

rohS - rEStriCtion of thE uSE of CErtain hazard-ouS SubStanCES in ELECtriCaL and ELECtroniC EquipmEntFrequently Asked Questions on European Directive 2002/95/EC (RoHS) , ht tp: //ec.europa.eu/environment /waste/pdf/faq_weee.pdf

r&ttEEuropean Directive 1999/5/EC, Radio equipment and Telecom-munications Terminal equipment Directive, http://ec.europa.eu/enterprise/sectors/rtte/documents/

wEEE - waStE ELECtriCaL and ELECtroniC EquipmEnt dirECtivEText of European Directive 2002 /96 /EC (WEEE) , ht tp: / /ec.europa.eu/environment/waste/weee/index_en.htm

— List compiled with help from Graham Mays


EMC UK 2010

• WHEN:12-13October• WHERE:TheRacecourse,Newbury,UnitedKingdom• WHAT: EMC Technology is relevant to all industries;

it can affect every piece of electronic and electricalequipment,anditcanseriouslyaffectthedesigncycle,delayproductionandtimetomarket.Inshortitcancostmoneyandreduceprofits.Keepuptodatewiththenewdirectives,components,testtechniques,testequipmentandlatestEMCModellingsoftware.Over60companieswithexpertsontheirstandsthatcangiveyouthefreeadviceyouneed.Plusafullconferenceprogram,EMCtrainingcourses,andfreedemonstrationsbytheIEEEEMCSocietyUKRIChapter.

• INFORMATION:www.emcuk.co.uk

EMC ESD Clinic

• WHEN:27October2010• WHERE:UniversityofAmsterdam,TheNetherlands• WHAT:Sponsoredby theDutchEMCESDAssociation,

thethemeoftheclinicisSafety&Security.Theclinic,atraditional combination of lecture andscholarship, willfeaturea fullprogramofvariousworkshops, toursandactivitiesandknowledgetransferprogram.

• INFORMATION:[email protected]

ISAP 2010

• WHEN:23-26November• WHERE:Macau,China• WHAT:ISAPisthepremierforumforpresentationofthe

currentstatusandfuturetrendsinthefieldofantennaandpropagation.TheconferenceisjointlyorganizedbytheUniversityofMacauandtheStateKeyLaboratoryof Millimeter Waves at City University of Hong Kong,technically co-sponsored by Institute of Electronics,InformationandCommunicationEngineers(IEICE),IEEEAntennas and Propagation Society (IEEE AP-S), IEEE(HK) Antennas & Propagation / Microwave Theory &Techniques(IEEEHKAP/MTTChapter).

• INFORMATION:www.isap2010.org/

Asia-Pacific Microwave Conference 2010

• WHEN:7-10December• WHERE:Yokohama,Japan• WHAT:ConferencetopicswillincludeActiveDevicesand

Circuits(Low-NoiseDevicesandCircuits,High-PowerDevicesandCircuits,MicrowaveTubes,MMICs,ActiveandAdaptiveAntennas),PassiveComponents(Filtersand Resonators, Ferrite and Acoustic Wave Compo-nents, Packaging, Waveguides and Striplines, OpticalComponents,Metamaterial,RFMEMS,LTCCDevices),Systems(WirelessandCellularCommunicationSystems,Signal Processing Circuits and Systems, MicrowaveMedicalandBiologicalApplications,EMC,RadarsandSensors, Satellite Systems, Digital Broadcasting) andBasicTheoryandTechniques(ScatteringandPropaga-tion, Electromagnetic Field Theoryand CAD,AntennaTheory,MicrowaveAntennas,MicrowavePhotonics).

• INFORMATION:www.apmc2010.org

Instrumentation, Analysis & Testing Exhibition• WHEN:23February2011• WHERE:Northamptonshire,UnitedKingdom• WHAT:RunbytheEngineeringIntegritySociety,theex-

hibitionprovidesvisitorswithanopportunity toseeandevaluate the latest industrydevelopmentswithin the In-strumentation,Analysis&Testingenvironment.

• INFORMATION:www.e-i-s.org.uk

EMV 2011

• WHEN:15-17March• WHERE:Stuttgart,Germany• WHAT:TheeventoffersawiderangeofEMC-specific

topics.Meettheindustry’sleadingcompaniesforEMCequipment,componentsandEMCservices.ProductsandsolutionsfromvariousfieldsofEMCwillbepresentedbycompanies.TheworkshopsofEMVisanapplication-orientedplatformforinformationandcommunicationintheareaofelectromagneticcompatibility.

• INFORMATION:www.mesago.de/en/EMV/home.htm

Electronic Environment 2011

• WHEN:5-6April• WHERE:StockholmAlvsjo• WHAT:Thisiswherepracticingengineers,technicians,

designers,developmentandqualitymanagers,buyers,consultants,policymakersandothersgathertodiscussissuesrelatedtoEMC,ESD,electrical,mechanicalandthermalenvironments.

• INFORMATION:www.electronicenv.se

Someimportanteventsintheelectromagneticcompatibilitycommunity.Visitusonlineatwww.interferencetechnology.euforthelatestlistings.Pleaseemaildetailsofyoureventstoslong@interferencetechnology.com

Continued on Page 10

UpcomingEvents

8 interference technology eUrope emc gUide 2011

2011 Asia-Pacific EMC Symposium

• WHEN:16-19May• WHERE:JejuIsland,Korea• WHAT:FollowingthetraditionofAPEMC,thesymposium

willcovertheentirescopeofelectromagneticcompat-ibility, including electromagnetic interference, EMCmeasurement techniques,system-levelandPCB-levelEMC,lightningandpowersystemEMC,highpowerEMC,transportationandautomotiveEMC,antennaandwavepropagation issues, computational electromagnetics,nanotechnologyforEMCandsemiconductor&chip-levelEMC.

• INFORMATION:www.apemc2011.org/main

CIEN - Carrefour de l’Industrie Electronique & Numérique)

• WHEN:24,25and26May2011• WHERE:Tobedetermined• WHAT: The electronic and numeric industry exhibi-

tion strives to bring together all those involved (pro-duction equipment manufacturers, components andsubassemblies, electronics manufacturing, electronicmeasurement, engineering and design consultancies,distribution, universities, engineering schools, financ-ing, competitiveness clusters, laboratories and more)todebate,exchange,decide,makecontactsandmoveforwardcollectively.

• INFORMATION:www.cien-expo.com

Techno-Frontier

• WHEN:20-21July2011• WHERE:TokyoBigSight,Japan• WHAT: TECHNO-FRONTIER is an integrated event of

cutting-edge professional exhibitions, technical sym-posiaandaconference,all targetingprofessionalsofthefield.Whiletheexhibitionsshowcaseproductsandtechnologies,currenttechnologicalchallengesarebeingdiscussedatthesymposia.

• INFORMATION:www.jma.or.jp/tf/en/

IEEE International Symposia on EMC

• WHEN:14-19August2011• WHERE:LongBeach,California,USA• WHAT: The IEEE Electromagnetic Compatibility Soci-

etyistheworld’slargestorganizationdedicatedtothedevelopmentanddistributionofinformation,toolsandtechniquesforreducingelectromagneticinterference.Thesociety’sfieldofinterestincludesstandards,mea-surementtechniquesandtestprocedures,instrumenta-

tion,equipmentandsystemscharacteristics, interfer-ence control techniques and components, education,computational analysis, and spectrum management,alongwithscientific,technical,industrial,professionalorotheractivitiesthatcontributetothisfield.

• INFORMATION:http://ewh.ieee.org/soc/emcs/

EMC Europe 2011

• WHEN:26-30September• WHERE:York,England• WHAT:Theintentofthisconferenceistobringtogether

thoseworkinginthefieldofEMCaswellasspectrummanagement,monitoringandcongestionfromEuropeancountriesandfromthecountriesofotherpartsoftheworldandcreateanexcellentforumforusefulcontactsand exchange of scientific and technical informationbetween researchers and practicing engineers fromacademia,researchlaboratories,industryandgovern-mentagencies.Thesymposiumpresentstheopportunitytoexchangeideas,discussdifferentpointsofviewandshareexperienceswithcolleaguesinvolvedinelectro-magneticcompatibilityofdevicesandsystemsspectrummanagement,monitoringandcongestion.

• INFORMATION:www.emceurope2011.york.ac.uk/

European Microwave Week (EuMW) 2011

• WHEN:9-14October• WHERE:Manchester,UnitedKingdom• WHAT:Microwavedevices,systemsfortelecommunica-

tions(bothterrestrialandspaceborne),transportation,medical, radar and new fields of application are justsomeoftheareascoveredintheprogram.Inadditionto the conferences, the weekshowcases a variety ofworkshopsandshortcoursesaswellastheEuropeanMicrowave Exhibition which constitutes the largesttradeshowonRFandmicrowavesinEurope.

• INFORMATION:www.eumweek.com

EMCCompo 2011 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits

• WHEN:6-9November• WHERE:Dubrovnik,Croatia• WHAT: The achievements in terms of operating fre-

quency and integration of semiconductor technologyareconstantlycreatingnewchallengesinEMC,whichmustnecessarilybeaddressedattheintegratedcircuitlevel.EMCCompoisintendedtobeaplaceforexchangeofthelatestresearchachievementsandexperiencesinIC-level EMC and it is addressed to researchers bothfromindustryandfromacademia.

• INFORMATION:www.emccompo.org

Continued from Page 8

UpcomingEvents


UNITED KINGDOM

12 PRODUCTS & SERVICES

17 RESOURCES

ARTICLES

20 Europe EMC Directives

The United Kingdom’s interpretation of European EMC Directive 2004/108/EC and the policy and structure of the policing and enforcement of the UK EMC RegulationsGRAHAM MAYS, EMC CONSULTANT, LANARK, UK

26 HEMP Filter Design To Meet MIL-STD-188-125 PCI Test Requirements

ANTONI JAN NALBORCZYK, CENG, MIET, MPE LIMITED

34 JEDEC and Tape & Reel Issues

Supply chain materials validation for the prevention of non-conforming or suspect counterfeit packaging for in-process manufacturing and long-term storage of ultrasensitive Class 0 ESD devicesROBERT J. VERMILLION, CPP/FELLOW, NASA-AMES RESEARCH CENTER

1-9

3C Test LtdSilverstone Technology Park, Silverstone Circuit, Towcester, Northampton NN12 8GX, United Kingdom; +44(0)1327 857500; Fax: +44(0)1327 857747; Pete Sheppard, [email protected]; www.3ctest.co.ukProducts & Services: Testing

A

Aaronia UKBellringer Road, Trentham, Lakes South, Stoke-on-Trent, ST4 8GB Staffordshire, United Kingdom; +44 (0 ) 845-4379092; Fax: +44(0)870-8700001; [email protected]; www.aaronia.co.uk Products & Services : Antennas, Shielding, Test Instrumentation

Accurate Controls Ltd25 Cowley Road, Poole, Dorset, United Kingdom; +4 4 (0 ) 1202 678108 ; info @accurate-controls.ltd.uk; www.accurate-controls.ltd.uk Products & Services: F iber Optic Systems

ACT LtdUnit 4 , Cleton Business Park , Cleton Street, Tipton -1, DY4 7TR, United King-dom; 44-121-557 7064; Fax: 44-121-557 5324; Yasin Zaka, [email protected] & Services: Conductive Materials

AEF SolutionsUnit 46 Thomas Way, Lakesview Business Park, Canterbury, Kent CT3 4JJ, United Kingdom; +44 1227 711455; Fax: +44 2380 455022; www.aefsolutions.com; Paul Lawrence; [email protected] & Services: Filters, Cables & Connectors, Surge & Transients, Mis-cellaneous

Aeroflex Test SolutionsLongacres House, Six Hills Way, Steve-nage, SG1 2AN, United Kingdom; 44-1438-772038; Fax: 44-1438-772218; www.aeroflex.comProducts & Services: Test Instru-mentation

Agilient Technologies UK LtdScotstoun Avenue, South Queensferry, Edinburgh, EH30 9TG, Scotland, United Kingdom; +44 (0)131 331 1000; Fax: +44 (0)131 331 3000Products & Services: Test Instru-mentation

AH SystemsSystemWare Europe, Bedfordshire, United Kingdom; 44 (0) 1462 734777; Fax: 44 (0) 1462 835777; [email protected]; www.AHSystems.comProducts & Services: Antennas, Test Instrumentation, Testing

Albacom LtdGeorge Buckman Drive, Dundee, DD2 3ST United Kingdom; 44 (0)1382 889311; 44 (0)1382 810171; www.albacom.co.uk; Martin Mackin, [email protected] & Services: Amplifiers

Albatross Projects GmbHDaimlerstraße 17, 89564 Nattheim, Ger-many; +49 - 7321 730 500; Fax: +49 - 7321 730 590; [email protected]; www.albatross-projects.de/Products & Services: Shielded Rooms & Enclosures, Anechoic Chambers

Alrad Instruments LtdAlder House, Rurnpike Road Industrial Estate, Newbury, Berkshire, RG14 1NS, United Kingdom; 44 1635 32630, [email protected], www.alrad.co.ukProducts & Services: Test Instru-mentation

Anritsu EMEA Ltd 200 Capability Green, Luton, Beds, LU1 3LU, Great Britain; +44 1582 433200; Fax: +44 1582 731303; [email protected]; www.eu.anritsu.comProducts & Services: Test Instrumen-tation, Testing

Ansoft UK1st Floor, Unit 8 Bracknell Beeches, Old Bracknell Lane West, Bracknell, RG12 7BW, Great Britain; +44 (0)870 010 4456; Fax : + 4 4 ( 0 ) 870 010 4 4 57; uksales @ansoft.comProducts & Services: EMC Design Software

AQL EMC Limited16 Cobham Road, Ferndown Industrial Estate, Wimborne, Dorset , BH21 7PG United Kingdom; 44 (0)1202 86 11 75; Fax: 44 (o)1202 86 11 76; www.aqlemc.co.ukProducts & Services: Consultancy, Testing

AR United Kingdom LtdUnit 8 TORC MK , Chippenham Drive, Kingston, Milton Keynes , England Bucks MK10 OAE; +44 (0)1908 282766; Fax: +44 (0)1908 288249; Dr. Tom Cantle, [email protected]; www.uk-ar.co.ukProducts & Services: Amplif iers, Antennas, Cables & Connectors, Shielded Rooms & Enclosures, Surge & Transients, Test Instrumentation

+44 (0)1675 468 200; Ann Timmons, Int’l Marketing, [email protected]; www.cm-products.co.uk Products & Services: Shielding

Cabletec ICS LtdSunnyside Road, Weston-Super-Mare, Somerset, BS23 3PZ, Great Britain; 01934 424900; Fax: 01934 636632; Karen French, Managing Director, [email protected]; www.cabletec.com Products & Services: Shielding

Caltest Instruments Ltd PO Box 7717, Lockerbie, DG11 1YF United Kingdom; 44 1387 811 910; Fax: 44 1387 810 195; www.caltest.co.uk; [email protected] & Services: Test Instru-mentation

CASS Industries LtdBlackbrook Trading Estate Weybrook Road, Levenshulme, Manchester, M19 2QD United Kingdom; 44 161 4424 200; Fax: 44 161 4424 283; www.cassindustries.comProducts & Services: Testing

CCQS UK LtdSuite B, Regal Court 112 London Road, Headington, Oxford, OX3 9AW United Kingdom; 44 1865 741 105; Fax: 44 1865 423 693; [email protected] & Services: Certification Services

Cherry Clough ConsultantsStafford, Staffordshire, United Kingdom; +44 1785 660 247; www.cherryclough.com, Keith Armstrong, [email protected] & Services: Training, Semi-nars & Workshops, Design and Manage-ment Consultancy

Cobham Microwave148 Stocks Lane, Bracklesham Bay, Chich-ester, West Sussex, PO20 8NT United Kingdom; 01243 670711; Fax: 01243 672907; www.cobham.com/microwave; Dean Ter-rett, Key Account Manager, [email protected]]Products & Services : Antennas, Cables & Connectors, Filters, Shielded Rooms & Enclosures

Conformance Services Ltd24 Tidnock Avenue Congleton, Cheshire, CW12 2HW United Kingdom; 4 4 1260 270729 ; Fax: 44 1260 270729; [email protected]; www.conformance-services.comProducts & Services: Testing

CoreshieldSt. Margaret’s School, Gosfield Hall Park, Gosfield, Halstead, Essex, CO9 1SE, Great Britain; +44 (0 )1787-472134; Fax: +44 (0)1787-73589; www.coreshield.eu; John Corbett, [email protected] & Services: Shielding

CPI - Communications &Power Industries Europe 28 Manor Road, Walton-on-Thames, Sur-rey KT12 2QF, United Kingdom; +44 (1932) 256 930 or +44 (1932) 256 939; Fax: +44 (1932) 241 271; www.cpii.com/cmp; Tony Johns, [email protected] & Services: Amplif iers, Microwave Power

Arka Technologies235 Funts Pond Road, Fareham, Hants, PO14 4PJ, Great Britain; [email protected] ; ht tp : / /arkatech.co.uk /pages /products/emi.aspProducts & Services: Shielding

B

BAE Systems Kent, Faraday Test Centre, Airport Works, Rochester, ME1 2 X X , Great Bri tain ; +44 (0 )1634 204457; Fax: +44 (0 )1634 203647; Paul Davison, [email protected]; www.baesystems.com/faradaytestcentreProducts & Services: Testing

Bal Seal Engineering 29th Floor 1 Canada Square, Canary Wharf, London, E14 5DY, Great Britain; +44 (0)20 7712 1514; Fax: 44 (0)20 7712 1501; W. Young, [email protected]; www.balseal.com;Products & Services: Shielding

BFi OPTiLAS LtdWolverton Mill South, Milton Keynes, MK12 5 Z Y Uni ted K ingdom ; 4 4 19 0 8 326326; 44 1908 221110; [email protected]; www.bfioptilas.co.ukProducts & Services : Shielding, Testing

Blackwood Labs8 Woodfieldside Business Park, Pontl-lanfraith, Blackwood, South Wales, NP12 2DG, United Kingdom; +44 (0) 1495 229219; [email protected]; www.blackwood-labs.co.uk;Products & Services: Testing

Brand-Rex LtdViewfield Industrial Estate, Glenrothes, Fife., KY6 2RS United Kingdom; 44 (0) 1592 772124; Fax: 44 (0) 1592 775314; Audrey O’Brien, Marketing Communications Manager, [email protected]; www.brand-rex.com Products & Services: Cables & Con-nectors

BRE LtdBucknalls Lane, Wat ford, WD25 9X X United Kingdom; 44 1923 664000; [email protected]; www.bre.co.ukProducts & Services: Testing

Brian Jones89 Widney Road, Knowle, Solihull B93 9EA, United Kingdom; +44 1564 773319; Fax: +44 1564 773319; [email protected] & Services: EMC Consultant and Competent Body Signatory special-izing in standards and regulations

BulginMelville Court, Spilsby Road, Romford, Es-sex, RM3 8SB, Great Britain; +44 (0)1708 343800; Simon, Howard, Managing Direc-tor, [email protected] & Services: Filters

C

Cable Management Products LtdCMG House, Station Road, Coleshill , Birmingham, B4 6 1HT, Great Bri tain ;


UNITED KINGDOM | Products and Services

Cranage EMC & SafetyMarket Drayton, Shropshire, United King-dom; +44 1630 658568; Fax: +44 1630 658 921; [email protected]; www.cranage.co.ukProducts & Services: Testing Labo-ratories

Cre8 Associates Ltd Bruntingthorpe Proving Ground, Bath Lane, Lutterworth, Leicestershire, LE17 5QS, Great Britain; +44 (0)1162 479787; David Hobbs, Commercial Manager, [email protected]; www.cre8-associates.com Products & Services: Cables & Con-nectors, Filters, Testing

Credowan Ltd Stocks Lane, Bracklesham Bay, Chich-ester, West Sussex P020 8NT, United Kingdom; 44 (0 ) 1243 670711 Fax: +44 (0) 1243 672907; www.credowan.co.uk; [email protected] & Services: Shielded Rooms & Enclosures

CST UK LtdNottingham, United Kingdom; 44 115 9061 120; [email protected]; www.cst.comProducts & Services: Test Instrumen-

tation, Testing

D

DEM ManufacturingHargreaves Way, Sawclif fe, Industrial Park, Scunthorpe, North Lincolnshire DN15 8RF United Kingdom; 44 (0) 1724 273200; Fax: 44 (0) 1724 280353; Diane Kilminster, Marketing Executive, [email protected]; www.dem-uk.com Products & Services: Filters, Surge & Transients

Dexter Magnetic TechnologiesBerkshire, Uni ted K ingdom ; + 4 4 ( 0 ) 1189-602430; @dextermag.com; www.dextermag.comProducts & Services: Ferrites, Shield-ing, Surge & Transients

E

ElectroMagnetic Technologies (EMT) LtdHesperides, Inniscarra, Co. Cork, Ireland;

021 487 1437; http://emtcork.biz/Products & Services: Consultancy, Testing , Training

Electromagnetic Testing Services LtdPratts Fields Lubberhedges Lane, Steb-bing, Essex, CM6 3BT United Kingdom; 44 1371 856061; Fax: 44 1371 856144; www.etsemc.co.uk; ubfi@9

Electronic Test & Calibration LtdCaddsdown Industrial Park, Clovelly Road, Bideford, EX393DX, Great Britain; +44 (0)1237 423388; Fax: +44 (0)1237 423434; www.etcal.co.uk; [email protected] & Services: Antennas, Cali-bration, Testing, Training

Electrostatic Solutions Ltd13 Redhill Crescent , Basset t , South-ampton, Hampshire, SO16 7BQ, United Kingdom; +44 (0)23 8090 5600; Dr. Jeremy Smallwood, Smallwood, [email protected]; www.static-sol.com/index.htm Products & Services: Consultancy

Elmac ServicesWareham, Dorset, United Kingdom; 44 01929 558279; www.elmac.co.uk; [email protected] & Services: Consultancy, Training

EM Software & Systems/ FEKOAubrey Consulting Ltd., 8 Stranding Str., Eastleigh, Hampshire, SO50 5GQ, United Kingdom; + 44 2380 610272; [email protected]; www.feko.infoProducts & Services: Test Instrumen-tation, Testing

EM Test AGFrequensys Ltd., 10 Abbey Court, Fraser Road, MK44 3WH Bedford, United King-dom; +44 (0)1142 353 507; Fax: +44 (0)1234 831 998; [email protected]; www.frequensys.co.ukProducts and Services: Surge & Transients, Test Instrumentation, Testing

interferencetechnology.eu INTERFERENCE TECHNOLOGY 13

Quality Engineering Service

Ferrites for EMI Suppression

Fair-Rite Manufactures Components For:EMI Suppression

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Antenna/RFID ApplicationsCustom Machining Available

Fair-Rite Products Corp.Your Signal Solution™PO Box 288, One Commercial Row, Wallkill, NY 12589-0288 www.fair-rite.com | [email protected](888) FAIRRITE (324-7748) or (845) 895-2055 | Fax (845) 895-2629

Visit Our Online Catalog @ www.fair-rite.com

EMC Consultants LtdStebbing Hall, Lubberhedges Lane, Steb-bing, Essex, CM6 3BU United Kingdom; 01371 856 964; 01371 856 984; http://emc-consultants.co.uk; [email protected] & Services: Consultancy

EMC Hire LtdUnit 1, Ivel Road, Shefford, Bedfordshire, SG17 5JU United Kingdom; 44 1462 817111; 44 1462 817444; www.emchire.co.ukProducts & Services: Test Instru-mentation

EMC Partner UK Ltd1A Golf Link Villas, The Common, Downley, High Wycombe, HP13 5YH, Buckingham-shire United Kingdom; +44 (0)1494 44 42 55; Fax: +44 (0)1494 44 42 77; David Castle, [email protected]; www.emcpartner.co.ukProducts & Services: Surge & Tran-sients, Test Instrumentation

EMC Resources LtdWillow House, Greenrig Road, Hawksland, Lanark, ML11 9QA United Kingdom; +44 ( 0 ) 15 5 5 -8 9 0 -515 ; w w w.f inda-train-ing-course.co.uk; [email protected] & Services: Consultancy

EMC Solutions LtdUnit 6, Century Park Starley Way, Bick-enhill; Solihull, B37 7HF United Kingdom; 44 (121) 782-2705; www.emcsolutionsltd.comProducts & Services: Filters, Testing

ERA Technology Ltd Leatherhead, Surrey, United Kingdom; +44 (0) 1372 367030; www.cobham.com/technicalservicesProducts & Services: Consultancy

E-Song EMC Co. Ltd602 Byucksan Digital Valley (V) 60-73 Gasan-dong Geumcheon-gu Seoul 153788 Korea; +82- (0)2-2082-5420 (rep) ; Fax: +82-(0)2-2082-5424; [email protected]; www.esongemc.comProducts & Services: Shielding

ETC LtdCaddsdown Industrial Park Clovelly Road, Bideford, EX39 3DX United Kingdom; 44 (0)1237 423388; Fax: 44 (0)1237 423434; www.etcal.co.uk/emc_cont.htm; [email protected] & Services: Testing

ETS - Lindgren LtdUnit 4 Eastman Way, Pin Green Indus-trial Area, Stevenage, SG1 4UH, United Kingdom; +44 (0)1438 730700; Fax: +44 (0)1438 730750; [email protected]; www.ets-lindgren.comProducts & Services : Antennas, Cables & Connectors, Filters, Shielded Rooms & Enclosures, Shielding, Test Instrumentation, Testing

European EMC Products Unit 4, Saffron Business Centre Elizabeth Way, Saffron Walden, Essex, CB10 2BL United Kingdom; 44 1799 523073; Fax: 44 1799 521191; www.euro-emc.co.uk; [email protected] & Services: Shielding

Euroquartz LtdBlacknell Lane, Crewkerne, Somerset TA18 7HE, United Kingdom; 44 (0)1460 230000; Fax: 44 (0)1460 230001; John Dale, Sales & Marketing, [email protected]; www.euroquartz.co.uk/oscillators.aspx Products & Services: Filters

F

Fair-Rite Products Corp.Dexter Magnetic Technologies Europe, Ltd., Unit 12, Tavistock Industrial Estate Ruscombe Park Twyford, Berkshire RG10 9NJ, United Kingdom; +44(0) 1189 602430; Fax: +44(0) 1189 602431; [email protected]; www.fair-rite.comSchaffner Ltd., Ashville Way, Molly Mil-lars Lane, Wokingham, Berkshire RG41 2PL, United Kingdom; +44 118 977 0070; Fax: +44 118 979 2969; www.fair-rite.com; [email protected] Products & Services: Ferrites, Filters, Shielded Rooms & Enclosures, Shielding

G

GETELEC375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.comProducts & Services: Shielding

Glenair UK Ltd40 Lower Oakham Way, Mansfield, NG18 5BY, Great Britain; +44 (0)1623 638154; Fax : +4 4 (0 )1623 638111; Jane Moss, [email protected]; www.glenair.com Products & Services: Cables & Con-nectors

Global EMCProspect Close Lowmoor Road Industrial Estate, Kirby-in-Ashfield, NG17 7LF United Kingdom; 44 1623 755539; Fax: 44 1623 755719; www.globalemc.co.uk/home.htmlProducts & Services : Shielding, Testing

Globec (UK) LtdUnit 15, Watchfield, Oxfordshire, SN6 8TZ, Great Britain; +44 1793 780790; Fax: 44 1793 780776; Peter Harris, [email protected]; www.globec.co.uk/emc/filters/filter7.html Products & Services: Cables & Con-nectors, Filters

H

Habia Cable Inc.Unit 10 Short Way Thornbury Industrial Estate, Bristol, BS35 3UT United Kingdom; 44 1909 483 896; www.habia.com Products & Services: Cables & Con-nectors

Haefely EMC Division H.T.T. (UK) Ltd, Unit 6, Northend Industrial Estate, Bury Mead Road, Hitchin, Herts., SG5 1 RT, Great Britain; +44 1462 486866; Fax: +44 1462 486054; www.httuk.co.uk; Roland Brunisholz, [email protected] & Services: Surge & Tran-sients, Test Instrumentation

HarwinFitzherbert Road, Farlington, Portsmouth, PO6 1RT, Great Britain; +44 (0) 23 9231 4545; www.harwin.comProducts & Services: Cables & Con-nectors

HITEK Electronic Materials Ltd15 Wentworth Road, South Park Industrial Estate, Scunthorpe, Great Britain; +44 (0)1724 851678; Fax: +44 (0)1724 280586; www.hitek-ltd.co.uk; John Terry, [email protected] & Services: Conductive Materials

Horiba Insruments UK Service CenterKyoto Close, Summerhouse Road Moulton Park, Northampton, NN3 6FL United King-dom; 44 1604 542 500; www.horiba.comProducts & Services: Testing

HTT (UK) LtdUnit 6 Northend Industrial Estate, Bury Mead Road, Hitchin, SG5 1RT, Great Bri tain ; + 4 4 ( 0 )14 62 4 8 6 8 6 6 ; Roland Brunisholz, [email protected]; www.httuk.co.uk Products & Services: Test Instrumen-tation, Testing

Hursley EMC ServicesUnit 16, Brickfield Lane Chandlers Ford, Eastleigh, Hampshire, SO53 4DP United Kingdom; 44 23 8027 1111; Fax: 44 23 8027 1144; www.hursley-emc.co.uk; [email protected] & Services : Consultancy, Testing

I

IFI - Instruments for IndustryDowding & Mills, Wilbury Way Hitchin Hert-fordshire SG4 OTA; +44 462421234; Fax: +44 462420012; Brian Epton, brian.epton@ dowd-ingandmills.com; www.dowdingandmills.com Products & Services: Amplif iers, Antennas, F il ters, Shielded Rooms & Enclosures, Test Instrumentation, Testing

Instrument Plastics LtdUnit 35, Kings Grove Industrial Est, Maid-enhead, Berkshire, Maidenhead, United Kingdom SL6 4DP; www.instrumentplastics.co.uk; [email protected] & Services: Shielding

J

J. M. Woodgate and Associates 3 Bramfield Road East, Rayleigh, Essex, SS6 8RG, Great Bri tain ; + 4 4 ( 0 )126 8 747839 ; Fax : 4 4 ( 0 )1268 777124 ; John Woodgate, consul tant , jmw @ mwa.demon.co.uk; www.jmwa.demon.co.uk Products & Services: Consultancy

K

Kemtron Ltd19-21 Finch Drive, Springwood Industrial Estate, Braintree, Essex, CM7 2SF, United Kingdom; +44 1376 348115; Fax: +44 1376 345885; www.kemtron.co.uk; [email protected] & Services: Conductive Ma-terials, Ferrites, Filters, Shielding

KnitMesh TechnologiesGreenfield, Holywell, Flintshire CH8 9DP United Kingdom; 01732 717600; Fax: 01732 714909 ; Colin Barnes, colin.barnes @knitmeshtechnologies.com; www.knitmeshtechnologies.com Products & Services: Shielding, Con-ductive Materials

KTL (TracGlobal)Saxon Way Priory Park West, Hull, HU13 9PB United Kingdom; 44-1482-801801; www.ktl.comProducts & Services: Testing

L

Laplace Instruments Ltd3B, Middlebrook Way, Cromer, Norfolk, NR27 9JR, United Kingdom; +44 (0) 12 63 51 51 60; www.laplaceinstruments.com; [email protected] & Services: Amplif iers, Antennas, Shielded Rooms & Enclosures, Test Instrumentation

Link Microtek LtdHigh Point, Church Street, Basingstoke, RG21 7QN, Great Britain; +44 (0 )1256 355771; Fax: +44 (0)1256 355118; Hugo Bibby, [email protected]; www.linkmicrotek.com Products & Services: Test Instru-mentation

M

M.Buttkereit LtdUnit 2 , Britannia Road, Ind. Est . Sale Cheshire, M33 2AA, Great Britain; 0161 969 5418; [email protected] & Services: Cables & Con-nectors

Magnetic Shields LtdHeadcorn Road, Staplehurst, Kent TN12 ODS United Kingdom; 00 44 01580 891521; Fax: 00 44 01580 893345; [email protected]; www.magneticshields.co.uk Products & Services: Shielding

MDL Technologies Ltd Technologies House, 60 Manton Road, Herts, SG4 9N, Great Britain; +44 1462 431981; Fax: +44 560 315 2515; www.mdltechnologies.co.uk/company.html



Products & Services: Testing

Mead Testing Ltd Unit 25 Mead Industrial Park River Way, Harlow, Essex, CM20 2SE United Kingdom; 44 1279 635864; 44 1279 635874; www.meadtest.comProducts & Services: Testing

Mentor Graphics Mechanical Analysis Div.81 Bridge Road, Hampton Court, Surrey, KT8 9HH, Great Britain; 44 208 487 3108; Fax: 44 208 487 3001; John Parry, Research Manager, john _ parr y @ mentor.com ; www.mentor.com/products/mechanical Products & Services: Software

METECC4 Chestnut Grove, Hurstpierpoint, BN6 9SS, Great Britain; +44 (0)7725 079956; Peter Metcalfe, [email protected]; www.metecc.eu Products & Services: Testing, Training

Milmega LtdRyde Business Park, Nicholson Road, Ryde, United Kingdom; + 4 4 ( 0 )198 3-618004; Fax: 44 (0)1983-811521; [email protected]; www.milmega.comProducts & Services: Amplifiers

MIRA Ltd Watling Street Nuneaton, Warwickshire, CV10 0TU United Kingdom; 44 (0)24 7635 5576; Fax: 44 (0)24 7635 8576; www.mira.co.ukProducts & Services: Testing, Training

MPE LtdHammond Road, Knowsley Industrial Park, Liverpool, Merseyside, L33 7UL, United Kingdom; +44 (0) 151 632 9100; Fax: +44 (0) 151 632 9112; www.mpe.co.uk; John Jephcott, [email protected] & Services: Filters

Murata Electronics UK Oak House, Ancells Road, Ancells, Busi-ness Park, Fleet, GU51 2QW, Great Brit-ain; +44 (0) 1252 8111666; Aya Tonooka, Marketing Of f icer UK , ayatonooka @murata.co.ukProducts & Services: Amplifiers, Fer-rites, Filters, Surge & Transients

O

Optical Filters Ltd14 Bertie Road, Thame, 0X9 3FR United Kingdom; 44 1844 260 377; Fax: 44 1844 260 355; www.opticalfilters.co.uk/home.htmlProducts & Services: Filters, Shielding

Oxley Developments Co.Priory Park, Cumbria, Ulverston, LA12 9QG, United Kingdom; +44 0 1229 840519; www.oxleygroup.com; [email protected] & Services: Ferrites, Filters, Surge & Transients

P

P & P Technology LtdBraintree, Essex, United Kingdom; +44 ( 0 ) 1376 55 0525 ; + 8 6-512-6 3 3279 6 6 ; www.p-p-t.co.ukProducts & Services: Conductive Materials, Die Cut Shielding Material, EMI Gaskets, Shielding

Panashield (UK) LtdThe Bothy, 38 Smarts, Heath Road, Wok-ing, GU22 0NP, Great Britain; +44 (0)1483 722020; Fax: +44 (0)1483 770330; [email protected] & Services: Filters, Shielded Rooms & Enclosures, Shielding, Testing

Peak Electromagnetics 139 Bank Street Macclesfield, Cheshire, SK11 7AY United Kingdom; 44 1625 269808; www.peak-em.co.uk; [email protected] & Services: Consultancy

PGMC LtdProduct Compliance, Suite 34, Gunnery House, 9 Gunnery Terrace, London, SE18 6SW, United Kingdom; +44 (0) 20 7193 1730 ; Fax: +44 (0 ) 7713 628173; Pablo Garcia, [email protected] & Services: Consultancy, Information Technology and Telecom-munications

PHI @ FalmouthTech-Rep UK Ltd, 1 Marco Polo House, Cook Way, Bindon Road, Taunton, Som-

erset, TA1 1SZ, Great Britain; +44 01823 358912; [email protected] Industrial Park, Falmouth, Corn-wall, TR11 4RY, Great Britain; +44 0 1823 352 572; Heidi Acton, TechRep (sister comp), [email protected]; www.phi-falmouth.co.uk/scifsProducts & Services: Shielded Rooms & Enclosures

PPI (Power Products International) LtdCommerce Way, Edenbridge, Kent, TN8 6ED, Great Britain; 01732 866424; Fax: 01732 866399; Geoff Robinson, [email protected];www.ppi-uk.com/premo-filters.php Products & Services: Filters

PPM (Pulse Power & Measurement) Ltd65 Shrivenham Hundred Business Park, Watchfield, Swindon, SN6 8TY, United Kingdom; +44 1793 784389; [email protected]; www.point2point.co.uk Products & Services: Cables & Con-nectors, Shielded Rooms & Enclosure, Shielding, Test Instrumentation, Testing

Precision MicroPO Box 162 30 Curzon St., Birmingham, B4 7XD United Kingdom; 44 114 284 4484; Fax: 44 114 286 9447; www.precisionmicro.comProducts & Services: Shielding


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Q

Q-par Angus LtdBarons Cross Laboratories, Leominster, Herefordshire, HR6 8RS, United Kingdom; 01568 612138; [email protected]; www.q-par.comProducts & Services : Antennas, Filters, Testing

QinetiQCodyTechnology, Park Rm 1005, A5 Bldg, Ively, Farnborough, GU14 OL X, Great Britain Products & Services: Testing

R

Rainford EMC SystemsSt. Helens, United Kingdom; +44 (0)1942 296190; www.rainfordemc.comProducts & Services: Shielding

Rasmi Electronics LtdMorrison Road, Annfield Plain, Stanley, Durham, DH9 7RX, Great Britain; 01207 291300; Dr. Surendra, Managing Director, [email protected]; www.rasmi.com Products & Services: Antennas, Fil-ters, Shielded Rooms & Enclosures

RFI Global Services LtdBasingstoke, Hampshire, United Kingdom; 919-622-4088; www.rfi-global.comProducts & Services: Testing

Richard Marshall LtdThe Dappled House, 30 Ox Lane, Harpen-den, Herts. AL5 4HE, United Kingdom; www.design-emc.co.uk; +4 4 ( 0 )1582 460815; [email protected] & Services: Consultancy

Rittal Ltd Braithwell Way Hellaby Industrial Estate, Hellaby, Rotherham, Yorks S66 8QY United Kingdom; 44 1709 70 40 00; www.rittal.co.uk; [email protected] & Services: Shielded Rooms & Enclosures

RN Electronics Ltd Arnolds Court, Arnolds Farm Lane, Brent-wood, Essex CM13 1UT United Kingdom; 01277 352219; Fax: 01277 352968; Paul Darragh, [email protected];www.rnelectronics.com Products & Services: Testing

RS Coatings LtdUnit 8, Miras Business Estate, Lower Keys Park, Cannock, Staffordshire, WS12 2FS United Kingdom; 01543 274 999; http://rscoatings.com/default.asp?pgid=3; Lau-rie Richardson, [email protected] & Services: Shielding

S

Schlegel Electronic MaterialsKemtron L imited, 19-21 F inch Drive, Braintree, Essex, CM7 2SF; +44 (0)1376 348115; Fax: +44(0)1376 345885; David Wall, [email protected];

www.kemtron.co.ukProducts & Services: Conductive Materials, Shielding

Schurter UK LtdUnit 8 Clock Park, Shripney Road, Bognor Regis, PO22 9NH, Great Bri tain ; + 4 4 (0)1273 810810; Fax: +44 (0)1273 810800; Richard Baldwin, [email protected] & Services: Filters, Shielding

Sematron UK LtdSandpiper House, Aviary Court, Wade Road, Basingstoke, RG24 8GX, Great Brit-ain; +44 (0)1256 812222; Fax: +44 (0)1256 812666; www.sematron.com; Glenn Toal, [email protected] & Services: Cables & Con-nectors, Test Instrumentation

Slater PlasticsUnit 7, Hanborough Business Park Lodge Road, Long Hanborough, Oxon, OX8 8LG United Kingdom; +44 1785 213 861; Fax: 44 1785 243 204; www.slaterplastics.com; [email protected] & Services: Filters, Shielding, Test Instrumentation

Sulis Consultants LtdMead House, Longwater Road, Eversley, Hampshire, RG2 7 0NW; + 4 4 ( 0 )79 4 6 624317; Charlie Blackham, [email protected]; www.sulisconsultants.com Products & Services: Product Approv-als, CE Marking, Regulatory Compliance Management

Suppression DevicesUnit 8 - York St Business Centre, Clith-eroe, Lancashire, Great Britain; 44 1200 444497; http://suppression-devices.com; Campbell Barker, [email protected] & Services: Filters

Syfer Technology LtdOld Stoke Road, Arminghall, Norwich, NR14 8SQ, United Kingdom; +44 1603 723310; Fax: +44 1603 723301; www.syfer.com; [email protected] & Services: Filters

T

T C Shielding, LtdUnit 2, Ashburton Industrial Estate Ross on Wye, Herefordshire, HR9 7BW United Kingdom; 44 1989 563 941; [email protected]; www.tcshielding.com Products & Services: Shielding

TBA Electro-ConductiveProductsPO Box 56 Rooley Moor Road, Rochdale, OL12 7E4 United Kingdom; (4 4) 1706-647718; Fax: (44) 1706-646170; www.tbaecp.co.uk Products & Services: Conductive Materials, Shielding, Surge & Transients

Tecan IncTecan Way, Weymouth, INTL DT4 9TU United Kingdom; 44 1305 765432; Fax: 877-990-4700; www.tecan.co.ukProducts & Services: Shielding

Tech-Etch, Inc.TBA Electro Conductive Products, P.O. Box 56, Rooley Moor Road, Rochdale, Spotland, Lancs. OL12 7EY England; +441706 647718; Fax: +441706 646170; www.tech-etch.com; [email protected]

Products & Services: Conductive Materials, Shielding

Teledyne ReynoldsNavigation House, Canal View Road, New-bury, Berkshire, RG14 5UR, Great Britain; www.teledynereynolds.co.uk; Olivier Dilun, Southern Europe regional sales manager, [email protected] & Services: Cables & Con-nectors

Telonic Instruments LtdToutley Industrial Estate, Toutley Road, Wokingham, RG41 1QN, Great Britain; +44 (0)118 978 6911; www.telonic.co.uk; Bob Lovell, [email protected] & Services: Filters, Test Instrumentation

Teseq Ltd5 Ashvil le Way, Molly Millars Lane, Wokingham, Berkshire, RG41 2PL, Great Britain; +44 (0)8450 740660; Michael Hill, [email protected]; www.teseq.co.uk Products & Services: Amplif iers, Antennas, Test Instrumentation, Testing

The Lighting AssociationLaboratoriesStafford Park 7, Telford, Shropshire, TF3 3BQ, Great Britain; +44 (0) 1952 290907; Fax: +44 (0) 1952 290908; www.lightingassociation.com; [email protected] & Services: Surge & Tran-sients

Thurlby-Thandar Instruments (TTI)Glebe Road, Huntingdon, Cambridgeshire, INTL PE29 7DR United Kingdom; 44 1480 412451; www.tti-test.com Products & Services: Test Instrumen-tation, Testing

Tioga LtdSt Thomas House, Mansfield Road, Derby, DE1 3TN, Great Britain; 01332 360884; Fax: 01332 360885; www.tioga.co.uk; Angela Bond, [email protected] & Services: Testing

TMD Technologies LtdSwallowfield Way, Hayes, Middlesex UB3 1DQ, United Kingdom; +44 20 8573 5555; Fax: +44 20 8569 1839; www.tmd.co.uk; [email protected] & Services: Amplif iers, Antennas, Filters, Test Instrumentation

Toroid International Ltd7 George House Princes Court , Beam Heath Way, Nantwich, CW5 6GD United Kingdom; 01270 611368; www.toroid.co.uk; [email protected] & Services: Ferrites, Surge & Transients

TRAC Global, Ltd100 Frobisher Business Park, Leigh Sinton Road, Malvern, Worcestershire, WR14 1BX, Great Britain; 44 1684 571700; Fax: 44 1684 571701; www.tracglobal.com; [email protected] & Services: Testing

TRW ConektStratford Road, Solihull, B90 4GW United Kingdom; 44 (0) 121 627 4242; Fax: 44 (0) 121 627 424; www.conekt.net Products & Services: Consultancy, Testing

TUV Product Service LtdOctagon House, Concorde Way, Segen-sworth North, Fareham, Hampshire, PO15 5RL, Great Britain; Fax: 44 (0)1489 558100; www.tuvps.co.ukProducts & Services: Testing

U

Uvox Ltd Building 14/Unit 3, Stanmore Industrial Estate, Bridgnorth, Shropshire, WV15 5HR, Great Britain; +44 (0) 1746 769 369; Fax: +44 (0) 1746 766 001; Robin Shed-den, Sales Manager, [email protected]; www.uvox.co.uk Products & Services: Shielding

V

Vector Fields Ltd / Cobham Technical Services24 Bankside, Kidlington, OX5 1JE United Kingdom; 44 1865 370 151; Fax: 44-1865-370277; www.vectorfields.com Products & Services: Shielding

Visteon Engineering Services LtdVisteon Technical Centre, Laindon, Basil-don, SS15 6EE , Great Bri tain ; 0124 5 359363; www.visteon.com/testing; Martin Black, [email protected] & Services: Testing

W

WemtechBordesley Hall The Holloway, Alvechurch, B48 7QQ United Kingdom; 44 1527 595066; 44 1527 595033; www.wemtech.co.ukProducts & Services: Consultancy, Training

Westbay Technology Ltd Main St. Baycliff Nr Ulverston, Ulver-ston, LA12 9RN United Kingdom; +44 1229 869-108; Fax: +44 1229- 869-108; www.westbay.ndirect.co.ukProducts & Services: Testing

Wurth Electronics UK Ltd4th Avenue, The Village, Trafford Park, Manchester, M17 1DB, Great Britain; +44 (0)161 872 0431; Fax: +44 (0)161 872 0433; [email protected] & Services: Cables & Con-nectors, Ferrites

Y

York EMC Services LtdYork, North Yorkshire, United Kingdom; 01904 434440; www.yorkemc.co.ukProducts & Services: Signal Gen-erators

Z

Zytronic Displays Ltd Whitely Road Blaydon-on-Tyne, Tyne & Wear, NE21 5NJ United Kingdom; 44-191-414-5511; Fax: 44-191-414-0545; www.zytronic.co.ukProducts & Services: Filters

Contact Sarah Long at [email protected] for additions and corrections to the Products and Services directory.



AssOCIATIONs

ELECTROMAGNETIC COMPATIBILITY INDUsTRY AssOCIATIONNutwood UK Limited, Eddystone Court, De Lank Lane, St Breward, Bodmin, Cornwall. PL30 4NQ; +44 (0) 1208 851 530; Fax: +44 (0) 1208 850 871; [email protected]; www.emcia.org

INsTITUTION OF ENGINEERING AND TECHNOLOGYMichael Faraday House, Stevenage, Herts, SG1 2AY, UK; +44 (0)1438 313 311; Fax: +44 (0)1438 765 526; [email protected]; www.theiet.org

RADIO sOCIETY OF GREAT BRITAIN 3 Abbey Court, Fraser Road, Priory Business Park, Bedford MK44 3WH, England; 01234 832700; Fax: 01234 831496; [email protected]; www.rsgb.org

UNITED KINGDOM & REPUBLIC OF IRELAND IEEE EMC sOCIETY CHAPTER Paul Duxbury (term expires 31 December 2010), CST UK Ltd, Strelley Hall, Main Street, Strelley, Nottingham NG8 6PE, United Kingdom; +44 115-906128; Fax: +44 115-9061115; [email protected]

NOTIFIED BODIEs

BLACKWOOD COMPLIANCE LABORATORIEsUnit 8 Woodfi eldside Business Park Pontllanfraith, Blackwood NP12 2DG, United Kingdom; Phone: +44 (0) 1495 229219; Fax: +44 (0) 1495 228331; [email protected]; www.blackwood-labs.co.ukNotifi ed Body number: 1902Directive: 2004/108/EC Electromagnetic compatibility

BRITIsH APPROVALs BOARD FOR TELECOMMUNICATIONsBalfour House Churchfi eld Road, Walton-on-Thames Surrey KT12 2TD, United Kingdom; Phone: +44 (0) 1932 251200; Fax: +44 (0) 1932 251201; [email protected]; www.babt.comNotifi ed Body number: 0168Directives: 96/98/EC Marine Equipment99/5/EC Radio and telecommunications terminal equipment2004/108/EC Electromagnetic compatibility

CCQs UK LTDSuite B, Regal Court, 112 London Road, Headington, Oxford OX3 9AW UK, United Kingdom; Phone: +44 (0)1865 741 105; Fax: +44 (0)1865 423 693; [email protected]; www.ccqs.co.ukNotifi ed Body number: 1105Directives: 2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

CEM INTERNATIONAL LTDThe Atrium Business Centre Curtis Road, Dorking Surrey RH4 1XA, United Kingdom; Phone: +44 (0) 1306 646388; Fax: +44 (0) 1306 646389; [email protected] ed Body number: 1942Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

COBHAM TECHNICAL sERVICEsCleeve Road, Leatherhead Surrey KT22 7SA, United Kingdom; Phone: +44 (0)1372 367000; Fax: +44 (0)1372 367099; [email protected]; www.cobham.com/technicalservicesNotifi ed Body number: 1893Directive: 2004/108/EC Electromagnetic compatibility

CONFORMANCE sERVICEs LTD24 Tidnock Ave., Congleton Cheshire CW12 2HW, United King-dom; Phone: +44 (0)1260 270729; Fax: +44 (0)1260 270729; [email protected]; www.conformance-services.comNotifi ed Body number: 1894Directive: 2004/108/EC Electromagnetic compatibility

EMC PROJECTs LTDHolly Grove Farm Verwood Road, Ashley Ringwood BH24 2DB, United Kingdom; +44 (0) 1425 479979; Fax : +44 (0) 1425 480637; [email protected] ed Body number : 0886Directives: 2004/108/EC Electromagnetic compatibility99/5/EC Radio and telecommunications terminal equipment

ERICssON LIMITEDBETE (UK) Approvals Test Centre Stratford House New Century Park, Coventry CV3 1JG, United Kingdom; Phone: +44 (0) 24 76 562 000; [email protected] ed Body number: 1916Directive: 2004/108/EC Electromagnetic compatibility

HURsLEY EMC sERVICEs LTDBrickfi eld Lane, Chandler’s Ford Hampshire SO53 4DP, United Kingdom; Phone: +44 (0)23 8027 1111; Fax: +44 (0)23 8027 1144; [email protected] ed Body number: 1890Directive: 2004/108/EC Electromagnetic compatibility

INTERTEK TEsTING & CERTIFICATION LTDIntertek House, Cleeve Road, Leatherhead, Surrey KT22 7SB, United Kingdom; Phone: +44 (0) 1372 370900; Fax: +44 (0) 1372 370999; daniel.griffi [email protected]; www.intertek.comNotifi ed Body number: 0359Directives: 89/106/EEC Construction products


UNITED KINGDOM Resources

2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels92/42/EEC Hot-water boilers93/42/EEC Medical devices94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres99/5/EC Radio and telecommunications terminal equipment2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

LAIDLER CERTIFICATIONBelaisis Business Centre Coxwold Way Billingham, Cleveland TS23 4EA, United Kingdom; Phone: + 44 (0) 8700 111375; Fax: + 44 (0) 8700 111395; [email protected]; www.laidler.co.ukNotified Body number: 0870Directives: 2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

LLOYD’s REGIsTER VERIFICATION LIMITED71 Fenchurch St., London EC3M 4BS, United Kingdom; +44 (0)24 7651 8612; Fax: +44 (0) 24 7630 5854; [email protected]; www.lr.orgNotified Body number: 0038

Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels89/106/EEC Construction products94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres96/98/EC Marine Equipment96/48/EC Interoperability of the Trans-European high-speed rail system99/36/EC Transportable pressure equipment2001/16/EC Interoperability of the trans-European conventional rail system2008/57/EC Interoperability of the rail system within the Com-munity (Recast)2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

MIRA LIMITEDWatling Street, Nuneaton Warwickshire CV10 0TU, United Kingdom; Phone: +44 (0) 247 635 5482; Fax: +44 (0) 247 635 8482; [email protected]; www.mira.co.ukNotified Body number: 0888Directives: 89/106/EEC Construction products99/5/EC Radio and telecommunications terminal equipment2000/14/EC Noise emission in the environment by equipment for use outdoors

2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

MMRA LTDDevon House 12-15 Dartmouth St., London SW1H 9BL, United Kingdom; Phone: +44 (0)20 7340 2267; Fax: +44 (0)20 7233 0574; [email protected] Body number: 2192Directive: 2004/108/EC Electromagnetic compatibility

RFI GLOBAL sERVICEs LTDPavilion A, Ashwood Park, Ashwood Way, Basing-stoke RG23 8BG, United Kingdom; Phone: +44 (0) 1256 312000; Fax: +44 (0) 1256 312001; [email protected]; www.rfi-global.comNotified Body number: 0889Directives: 99/5/EC Radio and telecommunications terminal equipment2004/108/EC Electromagnetic compatibility 1999-94-EC Vehicle Directive

sAFENET LIMITEDDenford Garage, Denford, Kettering, Northants NN14 4EQ, United Kingdom; Phone: +44 (0) 1832 732 174; [email protected]; www.safenet.co.ukNotified Body number: 1674Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

sAI GLOBAL AssURANCE sERVICEs LTDWinterhill House Snowdon Drive, Milton Keynes MK6 1AX, United Kingdom; Phone: +44 (0) 1908 249912; Fax: +44 (0) 1908 609825; [email protected];

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UNITED KINGDOM | Resources


www.saiglobal.comNotified Body number: 2056Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels89/106/EEC Construction products89/686/EEC Personal protective equipment2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

sAMsUNG ELECTRONICs EURO QA LABBlackbushe Business Park Saxony Way, Yateley Hampshire GU46 6GG, United Kingdom; Phone: +44 (0)1252 863 800; Fax: +44 (0)1252 863 805; [email protected] Body number: 1891Directive: 2004/108/EC Electromagnetic compatibility

sGs UNITED KINGDOM LIMITEDSouth Industrial Estate Bowburn, County Durham DH6 5AD, United Kingdom; Phone: +44 (0) 191 377 2000; Fax: +44 (0) 191 377 2020; [email protected]; www.uk.sgs.comNotified Body number: 0890Directives: 99/5/EC Radio and telecommunications terminal equipment2004/108/EC Electromagnetic compatibility

TECHNOLOGY INTERNATIONAL (EUROPE) LTD56 Shrivenham Hundred Business Park Shrivenham, Swindon Wiltshire SN6 8TY, United Kingdom; Phone: +44 (0) 1793 783 137; Fax: +44 (0) 1793 782 310; [email protected]; www.iti.co.ukNotified Body number: 0673Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2090)2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

3C TEsT LIMITEDSilverstone Technology Park Silverstone Circuit, Silverstone Northamptonshire NN12 8GX, United Kingdom; Phone: +44 (0)1327 857500; Fax: +44 (0)1327 857747; [email protected]; www.3ctest.co.ukNotified Body number: 1889Directive: 2004/108/EC Electromagnetic compatibility

TRAC EMC & sAFETY LTD100 Frobisher Business Park Leigh Sinton Road, Malvern Worcestershire WR14 1BX, United Kingdom; Phone: +44 (0) 1684 571000; Fax: +44 (0) 1684 571701; [email protected]; www.tracglobal.comNotified Body number: 0891Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres (31/12/2090)99/5/EC Radio and telecommunications terminal equip-ment2000/14/EC Noise emission in the environment by equip-ment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

TRAC TELECOM & RADIO LTDUnit E South Orbital Trading Park Hedon Road, Hull HU9 1NJ, United Kingdom; Phone: +44 (0)1482 801801; Fax: +44 (0)1482 801806; [email protected]; [email protected]; www.tracglobal.comNotified Body number: 1321Directives: 99/5/EC Radio and telecommunications terminal equipment2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

TUV PRODUCT sERVICE LTDOctagon House Concorde Way Segensworth North, Fareham Hampshire PO15 5RL, United Kingdom; Phone: +44 (0)1489 558230; Fax: +44 (0)1489 570586; [email protected]; www.tuvps.co.ukNotified Body number: 1895Directives: 2004/108/EC - Electromagnetic compatibility2006/96/EC – Low Voltage93/42/EEC – Medical Devices90/385/EEC – Medical Devices – Active Implantable98/79/EC – Medical Devices – In Vitro Diagnostic1999/5/EC – R&TTE

YORK EMC sERVICEs (2007) LTDMarket Square University of York, Heslington York YO10 5DD, United Kingdom; Phone: +44 (0) 1904 434440; Fax: +44 (0) 1904 434434; [email protected]; www.yorkemc.co.ukNotified Body number: 1892Directive: 2004/108/EC Electromagnetic compatibility

OTHER

COMMIssION FOR COMMUNICATIONs REGULATIONBlock DEF, Abbey Court, Irish Life Centre, Lower Abbey Street, Dublin Ireland; +353 1 804 9610;Fax: +353 1 804 9671; Gerard Costello, [email protected]

ENVIRONMENTAL AND TECHNICAL REGULATIONDepartment of Trade and Industry (DTI)151 Buckingham Palace Road, UK-London SW1W 9SS; +44 171 215 13 49; Fax: +44 171 215 13 40; Peter Howick, [email protected]

Montrose Compliance Services, Inc. Electromagnetic Compatibility and Product Safety

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Resources | UNITED KINGDOM

Graham maysEMC Consultant Lanark, United Kingdom

aBsTraCT

This article initially describes the concept of European Direc-tives and their legal status. It

then discusses the European EMC Directive 2004/108/EC [EMCD] and how the United Kingdom interprets the EMCD’s requirements during its transposition into the UK EMC Regu-lations [EMCR]. Finally, it reports on the policy and structure of the policing and enforcement of the EMCR, and how this varies across the UK.

The article will only concentrate on the main points of both the EMCD and the EMCR; and it is beyond its scope to describe all the possible exceptions and exclusions.

A European Directive is a legislative act of the European Union, which re-quires Member States [MS] to achieve a particular result without dictating the means of achieving that result. Directives normally leave MS with a certain amount of leeway as to the ex-act national rules to be adopted. Thus individual MS can, and do, enact subtly different national rules.

When adopted, Directives give MS a timetable for the implementation of the intended outcome. MS are required to make changes to their laws — com-monly referred to as “transposition” — in order for the Directive to be implemented correctly. If a MS fails to pass the required national legislation

the European Commission may initi-ate legal action against the MS in the European Court of Justice.

Directives were originally conceived only to be legally binding on MS of the E.U. and not on Organisations, Com-panies or Individuals. The latter were bound by the national laws that were transposed from the Directives. How-ever, the European Court of Justice has since developed the doctrine of “direct effect” where unimplemented or badly implemented Directives can actually have direct legal force. The court found that MS could be liable to pay damages to individuals and companies who had been adversely affected by the non-implementation of a Directive.

The EMCD was adopted on 15 December 2004 and published in the Official Journal (OJ) of the European Union on 6 January 2005. It replaces and repeals Directive 89/336/EC, the previous EMCD.

Considering that EMC is a com-plex high technology topic it is quite remarkable that the EMCD covers its legislation with this non technical document.

The EMCD was originally adopted by the E.U. to harmonise its national laws for protection against electromag-netic disturbance in order to “guaran-tee the free movement of electrical and electronic products” without lowering existing justified levels of protection in the MS.

It is important to note at the start, that unlike other “New Approach” Di-rectives, this Directive does NOT deal with safety. In other words, compliance

European EmC DirectivesThe United Kingdom’s interpretation of European EMC Directive 2004/108/EC and the policy and structure of the policing and

enforcement of the UK EMC Regulations

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with the EMCD does not mean that a product is “safe” to use.The fundamental aims of the EMCD are enshrined in

the “essential requirements”, and they are so important that they are stated verbatim below

1. Protection requirementsEquipment shall be so designed and manufactured, having regard to the state of the art, as to ensure that:a) the electromagnetic disturbance generated

does not exceed the level above which radio and telecommunications equipment or other equipment cannot operate as intended;

b) it has a level of immunity to the electromagnetic disturbance to be expected in its intended use which allows it to operate without unacceptable degradation of its intended use.

2. Specific requirements for fixed installationsInstallation and intended use of components

A fixed installation shall be installed applying good engineering practices and respecting the information on the intended use of its compo-nents, with a view to meeting the protection requirements set out in Point 1. Those good engineering practices shall be documented and the documentation shall be held by the person(s) responsible at the disposal of the relevant na-tional authorities for inspection purposes for

as long as the fixed installation is in operation.You will notice that there are specific requirements for

fixed installations in addition to all other apparatus. This is so because, whereas apparatus may move freely within the Community - a prime motivator for the EMCD’s adop-tion; fixed installations on the other hand are installed for permanent use at a predefined location, but of course they could still exceed the required protection requirements.

Does the EMCD state how a manufacturer can show compliance? Yes, by simply saying that compliance must be shown by conducting an electromagnetic compatibility assessment of the product.

Whilst it doesn’t mandate how this assessment should be conducted, it does clearly promote using the relevant European harmonised standards by declaring that the cor-rect application of these standards “shall be equivalent” to the carrying out of the assessment.

This “standards route” to compliance as it is known only works with standards that are adopted by the various European standardisation bodies, European Committee for Standardisation (CEN), European Committee for Electro-technical Standardisation (CENELEC) and Eu-ropean Telecommunications Standards Institute (ETSI). CEN, CENELEC and ETSI are recognised as the competent institutions in the field of the EMCD for the adoption of harmonised standards. Once the reference to such a stan-

dard has been published in the OJ, compliance with it should raise a “presumption of conformity” with the relevant essential requirements, although other means of demonstrating such conformity should be permitted.

Although conformity assessment should be the responsibility of the manufacturer, without any need to involve an independent conformity assess-ment body, manufacturers should be free to use the services of such a body if they so choose. The whole process of conformity assessment, followed if appropriate by CE Marking and a Declaration of Conformity etc., is a “self certification” exercise.

Article 3 instructs MS to take “all appropri-ate measures” to ensure that equipment is placed on the market and/or put into service only if it is compliant “when properly installed, maintained and used for its intended purpose”. This clearly extends the manufacturers responsibilities into the lifetime of the product whilst protecting them from any misuse.

Article 8, the ‘CE’ marking article states that compliant products must carry the CE mark as proof of compliance; whilst Annex IV describes the Technical Documentation and EC Declaration of Conformity that must be produced along with the CE mark.

Due to their specific characteristics, fixed instal-lations need not be subject to the affixation of the ‘CE’ marking or to the Declaration of Conformity.

Finally Article 16 deals with the Transposition of the EMCD by instructing MS to “adopt and publish the laws, regulations and administrative provisions necessary to comply with this Directive by 20 January 2007.”

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As with the previous EMCD the EU has published and continually updates a “Guide for the EMC Directive 2004/108/EC” last updated 8th February 2010 (at time of writing). It is beyond the scope of this article to include this document in any detail; but it is worth noting very briefly that the document starts with a significant number of dis-claimers and caveats. Chief amongst those are:• These guidelines assist in the interpretation of the

Directive but do not substitute for it; they explain and clarify some of the most important aspects related to its application.

• These Guidelines are publicly available, but they are not binding in the sense of legal acts adopted by the Commu-nity. The legally binding provisions are those transposing the EMC Directive at national level.

• The Commission accepts no responsibility or liability whatsoever with regard to the information in this guide.

• This information is not necessarily comprehensive, complete, accurate or up to date;

• This information is not professional or legal advice.It is noteworthy that whilst the EMCD itself runs to 14

pages, the associated “guidance” document runs to 67 pages!The EMCD was transposed into UK law by the publi-

cation of STATUTORY INSTRUMENTS 2006 No. 3418 ELECTROMAGNETIC COMPATIBILITY, known as The Electromagnetic Compatibility Regulations 2006 [EMCR]

There are, in fact, contained within this Statutory Instru-ment some 65 Regulations divided into 7 Parts. We will concentrate on the parts that add, enhance or are different to the requirements of the EMCD.

Part I sets out the implementation of the regulations.These Regulations implement the current EMCD and

they revoke and replace the 2005 regulations. Regulations 4 and 5 impose the same “essential requirements” concerning the EMC of equipment as the EMCD

This Part does contain some important definitions including:-• “authorised representative” means a person established

within the Community and appointed by the manufac-turer (whether or not established in the Community) to act on his behalf;

• “responsible person” means—• (g) in relation to apparatus (i) the manufacturer estab-

lished in the Community; (ii) the manufacturer’s au-thorised representative; or iii) where the manufacturer is not established in the Community and he has not appointed an authorised representative, the person who places the apparatus on the market or puts it into service; (h) in relation to a fixed installation, the person who, by virtue of their control of the fixed installation is able to determine that the configuration of the installation is such that when used it complies with the essential re-

Mays United Kingdom

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quirements N.B. The above definitions clearly mean that the UK authorities will hold somebody who is resident in the E.U. as being responsible for CE Marking and all relevant Documentation.

• “equipment” means any apparatus or fixed installationPart II covers the application of the Regulations and the

exclusions. These are fundamentally the same as the EMCD.Part III sets out the general requirements relating to

equipment.Regulations 15 and 16 state that equipment may not be

placed on the market/ put into service unless the essential requirements are complied with under the same conditions as the EMCD.

Regulations 18, 19 and 20 repeat the EMCD’s methodol-ogy for showing compliance, including the optional use of a notified body.

Regulations 21, 22 and 23 cover CE marking and the issue and retention of an EC declaration of conformity by the “responsible person.”

Part IV sets out the provisions relating to the appoint-ment and functions of United Kingdom notified bodies. This part is outside of the scope of this article.

Part V sets out the general requirements relating to the putting into service of fixed installations. It explains the ex-emptions for certain equipment and the required evidence of compliance. (Regulations 34, 35 + 36) These are all in direct accord with the EMCD.

To better understand some of the complexities of the powers of both the courts and the enforcement authorities in the UK, it is necessary to have a basic understanding of the structure of the United Kingdom. The UK is a political and economic union of four previously independent countries, England, Scotland, Wales and Northern Ireland. Despite being in a very close and long standing union, each of these countries retains, amongst other things, it own legal system - thus complicating any UK Rules and Regulations; as you will see. Another complication is that the term “Great Brit-ain” is commonly used instead of the word “UK”. However they are NOT the same at all, in that Northern Ireland is NOT part of Great Britain but obviously is part of the UK.

Part VI sets out provisions relating to the enforcement of the Regulations.

Regulation 37 appoints the enforcement authorities as follows:• (1)(a) in Great Britain: • (i) OFCOM [Office of Communications] in connection

with the the protection of the radio spectrum; and (ii) local weights and measures authorities;

• (1)(b) in Northern Ireland: • (i) OFCOM as above; and (ii) the Department of Enter-

prise, Trade and Investment.• (2) The Secretary of State may enforce these Regulations

with the exception of electricity meters; which have their own authorities.So what is the remit and operating principles for the

above authorities. It can easily be seen that the major por-tion of enforcement falls upon local weights and measures authorities; known as Trading Standards Officers [TSO]. TSO are “local government” employees reporting to local county and borough councils. Local government is largely independent from central government; therefore the UK

Government has no direct authority over them. A very large part of a TSO workload is determined by the level of com-plaints received from the local community on a very broad range of trading standards. Few, if any TSO have received any particular training concerning these regulations, and no additional budget was allocated to local councils for this enforcement activity. The consequences are that enforce-ment is “complaint driven”, has a very low priority and varies between each and every local council.

The above authorities have the following powers:• Make test purchases • Enter any premises other than a person’s residence to

inspect equipment or documentation.• Seize and detain any equipment, or incapacitate any

fixed installation, where reasonable grounds exist of non-compliance.

• Seize and detain any equipment and/or documentation that is required

(i) as possible evidence (ii) by an authority from another MS (iii) which has reasonable grounds for suspecting that it may be liable to be forfeited

• Require any person having authority to do so to open any container; and/or themselves open or break open any such container

• A warrant may be issued by a Justice of the Peace [JP], if he is satisfied by any written information on oath, where it is suspected that an offence has been committed on any premises [including residential property] giving authority to enter the premises, if need be by force.

Note 1 - In Scotland reference to the JP should read a Sheriff and “any written information on oath” should read “evidence on oath”. Note 2 - In Northern Ireland reference to “any written information on oath” should read “any complaint on oath”.

• Issue Compliance notices. These notices consist of either (i) a suspension notice or (ii) notice of court proceed-ings. In the case of (ii) this can only be done if previous notice in writing has been served upon the responsible person and the non-conformity continues beyond a speci-fied time. A suspension notice can be issued on the user or responsible person where an enforcement authority has reasonable grounds for suspecting non-compliance; this suspends the manufacture/use etc. of the equipment for not more than six months.

• Require production of all relevant documents and in-formation which includes an EC declaration of conformity, or technical documentation, or evidence of compliance, or such information as he may reasonably require from the (i) “responsible person” or (ii) any person who is in possession of such documentation.

Any person shall be guilty of an offence if they• Place on the market or put into service any non-com-

pliant equipment• Contravene a suspension notice• Make any statement which he knows is false or mis-

leading• Falsely or wrongfully affixes the CE Mark• Issues a false, improper or incomplete EC declaration

of conformity • Intentionally obstructs, fails or refuses to comply with

any requirement or fails or refuses to give any other assis-

EuropEan EMC DirECt ivEsUnited Kingdom


tance to any officer of an enforcement authority• Falsely pretend to be an officer of an enforcement

authority• Fail to retain, or make available to the enforcement

authority on request, any relevant documentation or evi-dence of compliance.

Regulation 52 provides for a defence of “due diligence.”This is an unusual rule in that it provides for a defence

against a prosecution!In proceedings against any person for an offence, it

shall be a defence for that person to show that he took all reasonable steps and exercised all due diligence to avoid committing the offence.

We are advised by UK Government sources that the wording “all reasonable steps” was included to ensure that there was no discrimination against very small enterprises - e.g. it was thought to be an unreasonable burden that a very small enterprise should be expected to undertake the same intense EMC assessment as a very large multi-national company. The difficulty with this defence is there is no guidance available as to what is “reasonable”, except for any precedent set in previous court decisions!

If a guilty verdict is declared in court, the court has the following powers:• Penalties - Depending upon the offence, the guilty party

can be either or both:• (i) imprisoned for a term not exceeding three

months; or (ii) fined not exceeding level 5 on the standard scale. In addition he/she can be made to remedy the non-compliance.

• Forfeiture - In England, Wales and Northern Ireland a Magistrates Court has the authority to make an order for the forfeiture of any non-compliant equipment .

• In Scotland an application for forfeiture is made by the procurator-fiscal to the court. If found proven the Sheriff then issues an order for forfeiture. All forfeit equipment is either: (i) most commonly destroyed, or maybe (ii) sent for repairing or reconditioning or (iii) scrapped.

• Additional Costs - The court may order the guilty party, in addition to all fines and other financial losses, to reimburse an enforcement authority for any expenditure which has been incurred by that authority in investigating the offence, and, in having the apparatus tested.Part VII covers the Miscellaneous and Supple-

mental Regulations

sUmmaryWhen the original EMCD was adopted by the EU, the UK already had some “interference” regulations in place which the UK Government of the day con-sidered adequate. Thus the new requirements were seen as both “excessive” and “potentially damag-ing” to the UK electronics industry. To overcome this the Government decided that whilst they had no choice in passing new legislation, they would take a “light touch” approach to its enforcement. Thus the enforcement system described above, which continues to this day, has no central Gov-

ernment control, no mandatory surveillance activity and no support for testing etc.. Any occasional enforcement activ-ity that does occur, is as a result of the relevant authority receiving a “complaint” of interference.

Graham Mays has spent most of his 48 year career in EMC and RF & Microwave Communications. After spending 12 years as a Communica-tions Engineer in the Royal Air Force, he went on to work in a variety of senior positions for leading International Companies including Rohde & Schwarz, Chase EMC (now part of Teseq), and the Intertek Group.

For more than 10 years, Graham has run his own successful sales and consultancy company; enjoying particular success as the European Distributor for the TILE EMC Software suite. He is currently enjoying developing a web based training and consultancy business at www.finda-training-course.co.uk.

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Antoni JAn nAlborczyk Technical Director MPE Limited Liverpool, United Kingdom

Philosophies for the best method of HEMP protection have been around for a long time. MIL-

STD-188-125 -1 and -2 are more recent specifications for defining require-ments for HEMP protection. They specify PCI (pulse current injection) testing techniques to demonstrate the integrity of the protection system, but require specialist test equipment capable of injecting high voltage high current pulses. The residual current let-through of the protection system plus other parameters are monitored as a measure of the effectiveness and compliance of the protection system.

Because the demand for HEMP protection systems is specialised and not high volume, the practical method of meeting the MIL-STD-188-125-1

and -2 specifications has normally been based on adapting certain types of standard catalogue EMI facility filters. However, most catalogue EMI filters are designed for CW insertion loss performance, so are usually not ideal for pulse applications.

The approach described here is to design filters to meet a pulse attenua-tion performance rather than to meet an insertion loss specification. This en-ables a filter circuit and components to be used which are optimised for pulse applications to achieve a more efficient design with a good pulse performance.

This article describes the design process and validation of the design by testing using the MIL-STD-188-125 specified pulses.

i. introDUctionMIL-STD-188-125-1 and -2 specifi-

cations [1] & [2] cover HEMP protec-tion requirements for fixed and trans-portable ground based installations respectively. They define three PCI pulse types for testing the integrity of the protection system, E1 (short pulse) 20/500ns 2.5kA peak, E2 (intermediate pulse) 1.5/4000µs 250A peak, and E3 (long pulse) 0.2/20s 1000A peak. The filter design discussed in this article addresses protection against the E1 and E2 pulses. Different techniques are needed to address the E3 pulse.

The procedure for checking com-pliance of a HEMP filter with the specification for the E1 pulse is to inject the pulse into the front end of the filter and monitor the residual cur-rent flowing through a 2 ohm resistive

HEMP Filter Design to Meet Mil-StD-188-125 Pci test requirements

26 inTErfErEncE TEchnoLogy EUroPE EMc gUiDE 2011

Figure 1. E1 pulse injection testing.

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load connected between the output terminal and earth – see figure 1. For higher current filters the resistive load is replaced by one of value given by V/I where V and I are the voltage and current ratings of the filter. The simplified circuit shown is indicative only to show the key lumped elements. For the E1 pulse, the generator source resistance is specified as 60 ohms as shown in Figure 1, so the peak applied voltage supplied by the generator needs

to be 150kV. The maximum acceptable residual current through the 2 ohm load is 10A peak, and there are also limitations on residual pulse risetime and energy.

For the E2 test, pulses are injected in a similar manner but there is no requirement to monitor the residual pulse. However, the filter must survive the pulse without damage.

To strictly comply with the require-ments of the MIL-STD, every filter

needs pulse testing both before and after installation.

ii. norMAl AProAcH to HEMP ProtEction

It is usually considered that there is insufficient demand for EMP pro-tection systems to justify dedicated designs, so it is normal to select a stan-dard catalogue EMI filter and adapt it as necessary to meet the requirement. It is generally recognised that it is best to use an inductive input filter where possible and fit high energy transient suppressors at the front end to provide the pulse protection. When tested, the pulse attenuation performance offered

may not be sufficient to meet the MIL-STD requirement, so remedial measures in the form of additional filter and suppression components may be needed to ensure compliance. Although with this approach there is little initial design cost, there may be major hidden costs in terms of the remedial action required to achieve compliance.

iii. DEDicAtED DESiGn APProAcH

Because most catalogue EMI filters are designed for CW insertion loss performance rather than pulse handling, it was decided to design a range of filters from first principles to suit the pulse requirement of MIL-STD-188-125, i.e. to attenuate the magnitude of a 2500A 20/500ns E1 pulse to less than 10A, and to tolerate the E2 pulse. The transient suppressor, and filter capacitive and inductive com-ponents were treated as an integrated solution. Circuits were built and tested and pulse currents and voltages were monitored at each stage in the circuit to analyse the effect and contribution of each component and also the inter-action between components.

iV. DESiGn PHiloSoPHyIt was not practical to carry out

development testing using the defined MIL-STD pulse waveforms because of their specialist nature, so it was neces-sary to use commercially available test equipment. This comprised an 8/20µs pulse tester for bulk current handling tests with a pulse current of up to 5kA, and a 5/200ns pulse tester for risetime checks. The energy content of the 8/20µs pulse is higher than the MIL-


HEMP FiltEr DEs ignUnited kingdom

Table 1. Comparison of MPE Laboratory pulse tests with MIL-STD-188-125 E1 pulse.

Figure 2. Initial circuit configuration.

Figure 3. MPE pulse test results on test circuit. Trace 1 = Voltage across varistor = 880V peakTrace 2 = Residual voltage across 2 ohm load = 134V peakTrace 3 = Applied 8/20µs current pulse = 2360A peakTrace 4 = Residual current through 2 ohm load = 65A peak

8/20µs~1Ω source (high energy) 5/200ns (low energy)

MPE Laboratory Test Pulses

Up to 5kA line to ground (8/20µs) <1kA (5/200ns)

Measure residual voltage and residual current for comparison with MIL STD

Up to 5kV (8/20µs)~12kV (5/200ns)

Pulse Shape (Double exponential)

Peak Applied Current

Peak Applied Voltage

Residual Let-through Current

20/500ns 60Ω source

2.5kA line to ground 5kA with coupled lines

Up to 150kV (300kV for 5kA)

10A into 2Ω load

MIL-STD-188-125 E1 Pulse


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STD E1 pulse but its risetime is much slower. The 5/200ns pulse was used to demonstrate the speed of response of the system although its energy was very low, so most testing was concentrated on the 8/20µs pulse with a view to meet-ing the E1 residual current limit of 10A.

A comparison of MPE laboratory testing capability com-pared to the MIL-STD pulse requirement is given in table 1.

To meet the requirements of the E1 and E2 pulses, many types of transient suppression device were evaluated including spark gaps, metal oxide varistors (MOV’s), and silicon avalanche diodes. The varistor was finally chosen for this filter design because of its good combination of reac-tion time, when mounted effectively, and energy handling characteristics, making it suitable for both the E1 and E2 pulse requirements.

V. DEVEloPMEnt tEStinGCircuits were built and tested based on the circuit shown

in figure 2, as it was initially thought that two stages of transient suppression would be needed to meet the difficult residual pulse current requirement of the MIL-STD. Dif-ferent values of capacitance and inductance and different types of transient suppressor were tried in more than fifty different circuit configurations. Each time the current and voltage in each part of the circuit was monitored.

When testing the initial circuit, an injected 8/20µs pulse current, I1 in figure 2, of 2280A was reduced to a residual current, I2, of 256A in the 2 ohm load resistor. Subse-quently, by carefully adjusting the filter components, the second stage of transient suppression was eliminated, and the circuit was further improved and simplified, resulting in a 65A residual current for an injected pulse current of 2360A.

Plots of the pulses measured on the improved circuit are shown in figure 3.

It is not easy to read across the laboratory 8/20µs pulse test results to the MIL STD E1 pulse because of the dif-ference in energy content of the pulse, the non-linear behaviour of the filter inductors, saturation of inductor core material, and parasitic capacitance of the inductors. However, for the 8/20µs pulse, a significantly higher re-sidual current than 10A was expected due to the energy content of the pulse.

What was not certain was what value of residual current for the 8/20µs waveform would relate to the 10A require-ment when testing with the proper MIL-STD E1 waveform.

Because there is no filter insertion loss requirement within MIL-STD-188-125, a standard design was devel-oped to be commensurate with the MIL-STD-188-125 shielding attenuation requirement of 20dB at 10kHz and 80dB from 10MHz to 1GHz.

Accepting that there would be other applications re-quiring higher insertion loss to satisfy supplementary requirements such as EMI, two additional designs with higher insertion loss performance, were also developed. These designs are shown in Figure 4.

Figure 5 shows the test set-up of one of the three final designs in a screened test room in the MPE laboratory. The current and voltage monitoring probes and also the two pulse testers can be seen in the photograph.

Vi. AccEPtAncE tEStinGAfter completing the filter designs and testing in the

MPE laboratory, it was necessary to validate the designs by subjecting them to the correct MIL-STD pulses. This procedure is described in MIL-STD-188-125 as Acceptance Testing.

Figure 4. Three final HEMP filter designs.

a. Standard performance design, 20dB 10kHz, 80dB 10MHz – 1GHz.

b. Enhanced performance design, 50dB 10kHz, 100dB 40kHz – 1GHz.

c. Very High Performance Design, 100dB 10kHz – 10GHz.

Figure 4abc. Three final HEMP filter designs.

Figure 5. Pulse test set-up.


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CMX/SMX Series • .01-1000 MHzSMX301 .01-1000 300/100 55/50SMX302 .01-1000 300/200 55/53SMX303 .01-1000 300/300 55/55SMX501 .01-1000 500/100 57/50SMX502 .01-1000 500/200 57/53SMX503 .01-1000 500/300 57/55CMX10001 .01-1000 1000/100 60/50CMX100010 .01-1000 1000/1000 60/60

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SMC Series • 80-1000 MHzSMC250 80-1000 250 54SMC500 80-1000 500 57SMC1000 80-1000 1000 60

SMX-CMX Series • .01-1000 MHzSMX100 .01-1000 100 50SMX200 .01-1000 200 53SMX500 .01-1000 500 57

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MMT Series • 5-150 Watts, 18-40 GHzT2618-40 18-26.5 40 46T4026-40 26.5-40 40 46

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All three new designs were subjected to the correct MIL-STD E1 and E2 pulses at an independent test laboratory. This consisted of applying the E1 pulse at various current levels up to 2.5kA to check that the design worked over a range of pulse currents. The residual current was monitored along with the dI/dt (risetime) and root integral (energy content) of the residual pulse. The circuits were then sepa-rately subjected to the E2 pulse. The insertion loss of the filters and varistor parameters were measured before and after application of the pulses as a check that the circuits had not suffered degradation as a result of either the E1 or the E2 pulse testing.

VII. ACCEPTANCE TESTING RESULTSAll three designs were found to pass all tests very com-

fortably, being within the limits by a large safety margin. The most important parameter is the residual current and even the standard circuit achieved a residual current of less than 1.5A with a 2.5kA injected pulse, compared with the specification requirement of less than 10A. The results of

the residual current for different applied peak currents can be seen graphically in figure 6.

The residual currents are significantly better than those expected from a modified catalogue filter. The higher per-formance circuits gave even better pulse performance than the standard design as well as offering a higher insertion loss. The testing as described above was carried out on filters of 16A current rating. Further tests were subsequently car-ried out on a range of filter designs in current ratings from 6A to 200A, all of which passed the tests in a similar man-ner to the 16A filters. As the filter rated current increases, it becomes more difficult to achieve the residual current requirement. However, in all designs up to 200A current rating, a residual current lower than 4.5A was achieved providing a comfortable safety margin within the specifica-tion requirement.

Viii. conclUSionSThe final standard filter design, as shown in figure

7, proved to offer an extremely low residual pulse current performance, much better than would be expected from an adapted catalogue filter. This was achieved in a smaller and lighter package than would be possible for a modified catalogue EMI filter. The circuit design also provided additional benefits of lower leakage current and lower heat dissipation compared to normal catalogue EMI filters. The smaller size and weight provide benefits of ease of installation and a potentially more cost effective solution to HEMP protection.

Most EMP protection applications will benefit from such a design but the ones which will benefit the most are those where size and weight are critical parameters. These include mobile shelters, vehicles, telecoms cabinets, and Homeland Defence.

Applications which only need compliance with MIL-STD-188-125-1 or -2 can benefit from the small size and low weight of the standard circuit. Applica-tions which need additional insertion loss perfor-

mance to satisfy EMI, shielding or other requirements can still benefit from the good pulse performance of

the new design philosophy with one of the higher perfor-mance circuits.

iX. SUMMAryA dedicated HEMP power filter design can give better

pulse performance than an adapted catalogue EMI filter and provide additional benefits in terms of size, weight, leakage current, power dissipation and cost-effectiveness.

rEFErEncES• [1] MIL-STD-188-125-1 17 July 1998 “High-Altitude Electromagnetic

Pulse (HEMP) Protection For Ground Based C4I Facilities Performing Critical, Time-Urgent Missions, Part 1 Fixed Facilities”

• [2] MIL-STD-188-125-2 3 March 1999 “High-Altitude Electromagnet-ic Pulse (HEMP) Protection For Ground Based C4I Facilities Perform-ing Critical, Time-Urgent Missions, Part 2 Transportable Systems”

JAN NALBORCZYK graduated from Birmingham University with a BSc degree in Physics in 1973. He has worked for MPE Limited since 1979 and is currently Technical Director for MPE Limited in Liverpool, UK.

Figure 6. Measured residual current response for various E1 pulses injected into the standard filter circuit.

Figure 7. Final design of standard performance HEMP filter cut away to show MOVs in the input terminal compartment.


nalborczyk United kingdom

www.AHSystems.com?IT

RobeRt J. VeRmillion, CPP/Fellow Certified ESD & Product Safety Engineer RMV Technology Group, LLC NASA-Ames Research Center (ARC) Moffett Field, California, USA

Editor’s Note: This article is the second part of “The Dip Tube,” which appeared in May in the 2010 Interference Technology EMC Directory & Design Guide. A digital version is available at www.interferencetechnology.com.

Over the past several years, both European- and U.S.-based or-ganizations have sacrificed the

traditional “internal auditing pro-cess” with over reliance on offshore contract manufacturers, distributors and suppliers to do the right thing. To compound the problem, organizations will accept supplier specifications as adequate proof in utilizing a product within their supply chain. Since it is now common for organizations to utilize Ultra-sensitive (Class 0) devices at <50 volts (Reference 1), the inspec-tion of Ultra-sensitive (Class 0) ESD susceptible parts is very important. However, without special safeguards, the additional handling to remove and repack the product for validation can cause both physical and ESD damage in the process. For parts, including those that are sensitive to static electricity, measures must be implemented to detect, inspect and validate the pack-aging, as well as the incoming parts.

Preventative protection measures against suspect counterfeiting during transport for electronic circuit cards and ESD sensitive devices must be con-sidered. Dog food, medical products,

jewelry, consumer goods and other items have made the news. Three in-dustry sectors are of absolute concern: aerospace & defense, medical device and pharmaceutical drugs.

In this segment, the article will fo-cus on two major packaging types that are utilized to protect Ultra-sensitive devices to and from the distributor by the device manufacturers, then re-ceived by the customer for in-process manufacturing.

To the surprise of aerospace and distributor alike, non-compliant or suspect counterfeit conductive or static dissipative JEDEC Trays and antistatic Tape & Reel (T&R) pose real issues during incoming inspection and manufacturing of Ultra-sensitive ESD devices. In the May edition of the In-terference Technology 2010 EMC Direc-tory & Design Guide, non-conformance of antistatic Dip Tube rails was illus-trated to compromise compliant ESD sensitive components by using suspect counterfeit, non-conforming or recy-cled ESD packaging products. Several aerospace engineers stated that this problem had never been considered in developing a Suspect Counterfeit inspection process.

In comparison to the pharma-ceutical and medical device sectors, aerospace is a relative newcomer to the implementation of anti-counter-feiting measures. In the 1990s, the semiconductor sector incorporated countermeasures to identify suspect counterfeit packaging and materi-als. By using innovative packaging engineering designs and advanced

JeDeC and tape & Reel issuesSupply chain materials validation for the prevention of non-conforming or

suspect counterfeit packaging for in-process manufacturing and long-term storage of Ultra-sensitive (Class 0) ESD devices

34 iNTERFERENCE TEChNoLoGy EURoPE EMC GUiDE 2011

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materials to protect ESD-sensitive devices, tampering and substitution was mitigated.

Due to proprietary technology sets, many industry sec-tors do not share information. Whereas some major aero-space organizations may not employ packaging engineers, a major pharmaceutical company could have as many as 50 degreed packaging engineers on staff that develop innova-tive designs to prevent tampering.

In the pharmaceutical sector, some packaging supplier machine centers produce fiberboard and corrugated packag-ing graphics of high lithographic quality. It is not uncom-mon for machine centers to cost up to $10 million or more. For suspect counterfeit protective package using innovative materials, RFID antenna circuit lines can be preprinted onto engineered paperboard, post printed or applied during manufacturing. By identification of packaging vendors that supply both pharmaceutical and medical device sectors,

the aerospace and defense sectors could reduce costs per unit, especially when the product is space bound and return material authorizations (RMAs) would have no value.

Traditionally, the aerospace and defense sectors have relied upon packaging expertise from suppliers or distribu-tors who rely upon their vendors for innovative ideas. In most cases, this does not pose an issue with simple packag-ing schemes. However, with advanced suspect counterfeit mitigating technologies such as electrostatic shielding corrugated packaging, holographic labels and the real pos-sibility of LEDs printed onto paperboard substrates [1] as countermeasures, a suspect counterfeiter’s efforts can be kept at bay (for now). It is not uncommon for unauthorized substitutions or replacement packaging practices to occur without customer knowledge.

On 18-19 November 2010, a Suspect Counterfeit Aero-space & Defense materials and packaging course is sched-uled for Oxford University School of Continuing Education. For details, see the ad at the end of this article.

“Repackaging ban most powerful tool to prevent coun-terfeiting in Europe”Phil Taylor, 24 Jun 2008 In-Pharmatechnologist.com

“European pharmaceutical manufacturers stepped up calls for a blanket ban on repackaging of pharmaceuticals last week, suggesting that this would be the single most ef-fective way to seal the supply chain for counterfeiting drugs.

“As an industry we are prepared to make the necessary investment so that we can track and trace our products. But that will have no value if people are allowed to take and destroy our packaging,” he stressed.

Increasingly for the past few years, the author has con-sulted with both aerospace/defense and space agencies for supplier non-compliance. Products have been placed in quarantine, launches have been delayed and product failures with satellites have been identified.

Even though requirements for correct procedures and validation methods are pushed down to the contract manu-facturer, countermeasures by the aerospace OEM need to insure that a formalized material qualification process is in place. This process requires a customer to take physical measurements. A frequent occurrence with OEMs, however, is the reliance upon a vendor to resolve corrective actions without proper oversight. Resolution without corrective


JEDEC anD TapE & REEl IssuEsUnited Kingdom

Figure 1. (top) JEDEC Tray being validated (bottom left) Tape & Reel (noncompliant storage) (bottom right) Tape & Reels in static shielding bags for compliance

Courtesy of Frontier Electronics Systems Corp., OK, USA

Reference 1. ESD Sensitivity Roadmap from ITRS.

ITRS Technology Roadmap for Semiconductors – Electrostatics - 2005

actions may not take place without verification. In 2008, for example, long-term storage issues had contaminated prod-ucts for a launch. Because the space agency had very little expertise in packaging engineering disciplines, the issue lingered for months when third party packaging engineer-

ing expertise could have put the issue to rest within weeks.Antistat migration was found to be the source of the

problem for the space agency. Moreover, there was very little evidence, if any, that the antistat wrap had been tested for contamination and undergone accelerated aging. In fact, the vendor’s product specification sheet appeared to be the only criteria for acceptance.

Leadership in clearly defining an Anti-counterfeiting Roadmap must be driven down by the customer! In my opinion, distributor practices must be subjected to physical audits of packaging materials, not just processes, to insure supplier conformance. If a supplier does not have the neces-sary resources or “know how” to bring innovative methods to the table, the user must define requirements and physi-cally audit the supply chain.

CASe StUDY: JeDeC nonConfoRmAnCeWill removal during inspection of ESD sensitive compo-nents cause failures if the JEDEC tray is noncompliant or suspect counterfeit? In Figure 2, the black JEDEC tray was not static dissipative and had a 2-point resistance (ANSI/ESD STM11.13-2004) of 6.2 x 1011 ohms; this finding is insulative or above the limit of 1.0 x 1011 ohms.

The packaged components were also found to be suspect. Consequently, it was very unlikely that the suspect coun-terfeit JEDEC tray packaging was designed to be ANSI/ESD S541-2008 compliant. Thereafter, intimate contact with a metal tweezers tip and the leads of the surface mount device resulted in an ESD event at 561 volts (see Figure 3).

The suspect non-shielding corrugated Lock Front Mailer with an antistatic Polyethylene (PE) foam insert measured insulative at 1.09 x 1012 ohms and 1.2 x 1012 ohms for the base and lid (Figure 4). The inner antistatic bubblewrap measured insulative at 1.1 x 1012 ohms and 1.7 x 1012 ohms. Both 2-point and surface resistance readings were insulative. Each measurement was taken between 50%RH to 53.3%RH. This finding is significant since testing for ANSI/ESD S541-2008 compliance or qualification requires 12%RH, +/-3%RH at 730F, +/-50F after 48 to 72 hours of preconditioning. European winter conditions can easily produce environments of <7%RH. One would expect bet-ter readings for humidity dependent materials at moderate relative humidities. For example, testing another PE foam sample produced surface resistance readings of 5.1 x 1010 ohms at 50%RH and 1.3 x 1012 ohms (failing) for 12%RH after 48 hours of preconditioning.

The aerospace and defense engineer needs to understand that non-conforming or suspect counterfeit packaging ma-terials are a major cause for concern. Compliant ESD sensi-tive components are at risk if the packaging was qualified by accepting a vendor’s specification sheet without validation by in-house or 3rd party testing. Consequently, one can expect the unexpected.

JEDEC packaging may be subjected to charging during the box sealing or taping process. Therefore, a corrugated container should be electrostatic discharge shielding or the JEDEC tray needs to be placed into a metalized Type 1 shielding bag.

During the box sealing validation process, approximately 20 microprocessors inserted into a vacuum formed anti-static polymer insert were subjected to the taping process



Figure 2. 2-Point Resistance of JEDEC Tray (failed)

Figure 3. Non-compliant JEDEC Tray charged to +1kV and grounded with tweezers making contact to the leads of ESD sensitive devices to cause a spark as seen in red.

Figure 4. JEDEC Tray Box with non-compliant pink PE foam and failing bubble wrap.

Figure 6. (left) Strapping under the corrugated pad in close proximity to ESD sensitive devices; (right) -3000 volts recorded for a JEDEC tray white strapping which did not use a corrugated shielding pad.

Figure 5. (top) Packing Tape off reel charging to over 20,000 volts; (center) 6.8kV penetrating a Kraft corrugated box with no shielding protection to cause all the microprocessors to fail; (bottom) Only 0.98kV penetrating the box while being taped in proximity to 80kV voltages where no microprocessors failed.

interferencetechnology.eu iNTERFERENCE TEChNoLoGy 39

(see Figure 5). Because adhesion is important, large rolls of tape are positioned opposite the top and bottom box flaps in a conveyor system.

Another school of thought is that the distance between the top and bottom of the corrugated container at a said distance offers enough space to withstand ESD events. This may have some validity in an ESD Protected Area (EPA) where charge can be controlled. However, the rolls of tape without ionization were measured over the measuring ca-pability of a chopper stabilized electrostatic field meter at +20kV, blowing a sensor. Later, at 6 inches, using an indus-trial grade static locater, the voltage was found to be 80kV.

The microprocessors were placed inside the vacuum formed insert and the Kraft (non-shielding) B-Flute Regular Slotted Container (RSC) was closed by hand. Peak voltage seen inside the box during the automatic taping process

was measured at 6.8kV. As a result, all 20 microprocessors were non-operational. Later, 20 new prototype microprocessors were placed inside a validated static shielding (with an inner conductive liner) corrugated B-flute RSC where all flaps met. In this case, however, there were no failures observed after the taping process.

After undergoing ESD S20.20 training, the distributor identified a non-conforming JEDEC box (see Fig-ure 6). The product was quarantined and evaluation of the strapping using a non-contact computer interfaced voltage probe system recorded a peak charge of -3000 volts. Unfortunately, strapping had been affixed to the JEDEC tray directly over ESD sensitive devices at 6 positions. The OEM should have inserted the JEDEC tray into a Type 1 Aluminum moisture barrier bag and then applied the strapping under ionization. Visual inspection of the JEDEC tray should alert receiving inspection that the package was non-

conforming and also could be “suspect” counterfeit. Applying an ANSI/ESD S541-2008 compliant electro-

static shielding paperboard pad and shielding layer making intimate contact with static dissipative JEDEC trays would be an accepted minimal practice. However, lack of sound ESD compliant safeguards made it necessary to place the JEDEC box in quarantine In short, ESD packaging engi-neering protocols and innovative design methods can be utilized to insure protection against suspect counterfeit-ing or supplier non-conformance. One practice worthy of consideration is the development of a change notification that lists detailed packaging engineering modifications and provides traceable testing results of the package.

Customers need to be informed of countermeasure implementation. For example, the use of RFID tags would constitute a sound protective package safeguard. Likewise,

Figure 7. What a Tape & Reel looks like when mounted in the factory.

Figure 8. (left) Concentric ring measurement of inside of the reel; (right) Using a 2-point probe to measure difficult to reach areas in the reel.

Figure 9. Using small profile resistance probe to measure inside the carrier cavities. Probe on the top is 2-point probe and the bottom right photo probe is 1-Point for volume resistance.

subjecting one’s supplier to a formal-ized qualification sequence for JEDEC trays reinforced with a certificate of conformance (COC) authentication can prevent suspect counterfeit or non-conforming ESD materials and packag-ing from being utilized in combination with Ultra-sensitive ESD devices.

tAPe & Reel PACKAGinG iSSUeSDespite claims that issues with Tape & Reel have been put to rest, supplier non-conformance, suspect counterfeit ESD sensitive devices and packaging present major problems in producing a quality product. Problems present themselves when a suspect counter-feit or non-conforming Tape & Reel package pose issues during the parts inspection process with ESD sensitive devices. The act of tape removal from the carrier can generate electrostatic fields that kill ESD sensitive devices upon contact with tweezers or during pick and place.

The separation process (see Figure 7) can be likened to pulling Scotch Tape from a dispenser if the cover tape is non-compliant. As seen in the previous section, packing tape was witnessed to charge over 20kV. To mitigate potential issues, subjecting the Tape & Reel to resistance validation per ANSI/ESD STM11.11-2006 (IEC 61340-2-3), ANSI/ESD STM11.12-2007 (IEC 61340-2-3) and ANSI/ESD STM11.13-2004 (2-point resistance) can lead to better yields.

Figure 8 illustrates how an orga-nization validates a static dissipative reel before incorporation into the manufacturing process. The lower left figure is a surface resistance measure-ment in accordance with ANSI/ESD STM11.11. To the right, one can see the use of a 2-point probe per ANSI/ESD STM11.13. As a result, the product failed at 11.7%RH and at 50.3%RH for a blue antistatic coated reel (Table 1).

It is clear from the findings (see Ta-ble 11) that a topically coated antistatic reel exhibits humidity dependence as the results fluctuated from 50%RH to 11.7%RH for failing readings. Subject-ing product to a formalized qualifica-tion sequence can prevent costly ESD related issues during manufacturing and assembly.

A package (see Figure 10) was re-ceived by incoming inspection. The



http://www.interferencetechnology.com

the cover tape (using ANSI/ESD STM11.13) produced an insulative reading of 2.1 x 1011 ohms for the outside and 9.4 x 1011 ohms on the inside of the cover tape (Figure 12).

The next step is to see what happens to the cover tape upon separation from the carrier (see Figure 13). Separation generated a peak of -4055 volts. The reel was placed upon a grounded stand and contact between one of the component’s lead was made with tweezers while wearing a wriststrap. An ESD event of 293 volts is illustrated by the Novx antenna (see Figure 13).

The current discussion represents what could take place during the inspection and validation process by Incoming Receiving. One needs to consider if packaging used to protect ESD sensitive components is suspect counter-feit or non-conforming.

The inspection and validation process of removing a device from a problematic package can lead to failures with Ultra-sensitive (Class 0) devices. In March 2010, the author gave a presentation at NASA Cape Canaveral titled “Non-compliant or Suspect Counterfeit Mate-rials Can Lead to ESD Hazards and Long-Term



Figure 10. Non-conforming moisture barrier bag with 3-seams when 2-seams are required for ESD compliance. The bottom right photo shows a vacuum was pulled too much which crushes the devices. A trustworthy supplier would not pull an excessive vacuum. Thus, visual inspection to the knowledgeable incoming inspector would identify this package as suspect! (Courtesy of Ed Dimmler, PCX, Inc. QA &ESD Program Manager)

QA distribution manager noticed that the Type 1 metal-lized moisture barrier bag had drawn a vacuum that would crush the components in the carrier tape. Upon review, the author found the bag to have three seams. This observation would be a red flag because an electrostatic shielding bag requires two seams. Electrical continuity is essential to in-sure charge bleed off. Consequently, the bag was tested for surface resistance on the inside and outside of the shielding structure as illustrated in Figure 11a.

The results in Figure 11a were failing for the inside and

outside of the Type 1 bag. As illustrated in Figure 11b,

six (6) conforming Tape & Reel Type 1 humidity independent (IDP) ESD Moisture Barrier Bags (MBB) were evaluated at 3.5%RH over 72 hours at 73.40F to simulate the environment inside a MBB when a vacuum is pulled before inserting a desiccant. A suspect counter-feit Type 1 bag may appear compliant, however, aside from a typical 3-seam appearance, the only way to verify compli-ance is by taking resistance measurements.

Guidelines that a suspect counterfeiter will likely ignore can be found in MIL-PRF-81705D, w/AMENDMENT 1, 14 July 2004 for PERFORMANCE SPECIFICATION of BARRIER MATERIALS, FLEXIBLE, ELECTROSTATIC PROTECTIVE, HEAT-SEALABLE.

The results in Table 2 were favorable at 3.5%RH which represents an environment seen inside a moisture barrier bag after drawing a vacuum. If the bag looks suspect and tests as non-conforming (see Figure 11a), then one would test the cover tape as a validation step. As a result, at 55%RH,


VERmIll Ion United Kingdom

Table 1. RMV test finding for TI white paper, courtesy of Albert Escusa.

Antistatic-Coated Reel, Dipped Blue

Inner Surface AInner Surface BInner Surface COuter Surface AOuter Surface BOuter Surface COuter Surface D Outer Surface D

Outer Surface COuter Surface BOuter Surface A

Inner Surface AInner Surface BInner Surface C

AverageMedian

MinimumMaximum

St. Dev.

AverageMedian

MinimumMaximum

St. Dev.

4.90E+101.30E+111.30E+094.50E+10

1.30E+094.90E+106.48E+101.10E+112.20E+109.60E+10

1.30E+114.79E+10

100v100v100v100v100v100v100v

100v100v100v100v100v100v100v9.20E+12

3.30E+13

1.18E+133.30E+131.50E+117.40E+121.05E+134.70E+117.40E+121.90E+134.10E+121.50E+11

Location C.V.STM11.11(Ω)LocationC.V.STM11.11(Ω)Ambient Conditions [50.3%RH, 71.5°F] Low RH [11.7%RH, 73.2°F after 48 Hours]

Table 3. Surface Resistance & Volume Resistance.



Figure 11a. (left) Measuring a 3-seam suspect counterfeited bag for surface resistance which produced failing results. Figure 11b. (above) Humidity Independent (IDP) moisture barrier bag.

Table 2. Compliant Results at 3.5%RH for 72 hours of preconditioning.

Compliant Results at 3.5%RH for 72 Hours of Preconditioning

Storage Issues.” Feedback from the aerospace community constituted a lack of awareness that suspect counter-feit materials and packaging were being utilized throughout the supply chain. The next phase will focus upon actual readings secured during an assessment at a DoD contract manufacturer’s Tape & Reel operation.

Despite the reel’s black appearance indicating a carbon loaded static dis-sipative or conductive material, the reel measured insulative (see Figure 15).

During actual production using a non-conforming Tape & Reel package (see Figure 16), ESD events were nu-merous. Even if the devices were found to be compliant, the non-conforming or suspect counterfeit Tape & Reel package promotes Triboelectrifica-tion leading to Field Induced Model Discharges. Suspect counterfeit pack-aging can cause production delays and component failure due to electrostatic discharge.

In contrast, a conforming Tape & Reel (see Figure 17) utilized in the

manufacturing process did not pro-duce significant issues and was under a +/-100 volt threshold as set forth in the company’s ESD program manual.

In short, it appears that Tape & Reel packaging has been targeted for suspect counterfeiting. ESD packaging materials must undergo validation to

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Figure 12. 2-point resistance of the carrier cover tape (outside and inside)

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rigorous standards to insure ESD compliance.

RefeRenCeS• 1. Xth International Seminar on the Technology of Inherently Con-

ductive Polymers, Progress in Light Emitting Polymer and Dendrimer Technology, 23-25 June 2003, Presentation by Cambridge Display Technology

• 2. Non-compliant or Suspect Counterfeit Materials Can Lead to ESD Hazards and Long-Term Storage Issues, Bob Vermillion, NASA QLF, Kennedy Space Center, 18 March 2010

• 3. Electronic Part Damage by Antistat Vapor, John Kolyer, Ph.D., Arie Passchier, Ph.D. and W. Greg Peterson, The Boeing Company

• 4. ESD from A to Z, Dr. John Kolyer and Watson, 2nd Edition• 5. Mil Handbook 1686C-1995• 6. Mil Handbook 263B-1994• 7. EIA STANDARD• 8. Packaging Materials Standards for ESD Sensitive Items, EIA-541,

June 24, 1988, Appendix C “Triboelectric Charge Testing of Intimate Packaging Materials”

• 9. ANSI/ESD S20.20-2007 [IEC or EN 61340-5-1:2007 & TR 61340-5-2 © IEC:2007]

• 10. ANSI/ESD S3.1-2006 [EN 61340-5-1:2007] • 11. ANSI/ESD STM4.1-2006 • 12. ANSI/ESD STM11.11-2006 [ANSI/ESD STM11.11-2006 [CEI

IEC 61340-2-3] • 13. ANSI/ESD STM11.12-2007 [ANSI/ESD STM11.11-2006 [CEI

IEC 61340-2-3]

• 14. ANSI/ESD STM11.13-2004• 15. ESDA Adv. 11.2-1995• 16. Using An ESD Packaging Materials Qualification Matrix for Con-

tract Manufacturing and Supplier Conformance, Sep 1, 2006, Albert Escusa, Texas Instruments and Bob Vermillion, RMV Technology Group, LLC

• 17. Ed Dimmler, PCX Inc. for Suspect Counterfeit Tape & Reel and Type 1 Bag Specimen

• 18. Dr. John M. Kolyer, Ph.D., Rockwell International, telephone interview in 2004

• 19 The Charged Device Model & Work Surface Selection, John Kolyer and Donald Watson, October 1991, pp. 110-117

• 20. Humidity & Temperature Effects on Surface Resistivity, John Kolyer and Ronald Rushworth, Evaluation Engineering, October 1990, pp. 106-110

• 21. Military Handbook-263B-1994• 22. Triboelectric Testing at KSC Under Low Pressure and Tempera-

ture, ESD Association Proceedings 2002, Dr. Ray Gompf, PE• 23. ITRS Technical Requirements – Electrostatics, The ITRS is devised

and intended for technology assessment only and is without regard to any commercial considerations pertaining to individual products or equipment

• 24. Intel Website, Moore’s Law• 25. 25. Intrinsically Static-Dissipative Reel, Texas Instruments, Janu-

ary 2004, Albert Escusa and Lance Wright from RMV Technology Group, LLC Lab work (Courtesy of Albert Escusa)

• 26. Carrier Specimens (Figure 9), Kurt Edwards, Lubrizol



Figure 13. (left) Shows the charge of -4055 (top) on the carrier tape as captured by a yellow colored non-contact voltage probe and the corresponding ESD event of 293 volts (as captured by the black ESD event antenna) when a stainless steel tweezers makes contact with one of the lead of the ESD sensitive devices that the Tape & Reel is packaging.

Figure 14. (right) Charge separation of the carrier tape of –400 volts.

Figure 15. 2-point resistance of non-compliant or suspect counterfeit Reel

• 27.NovxSeries7000ScreenCapturewithESDEventAntenna,NOVXFigures3and13Special Thanks to Daibochi Plastics forrunningandprovidingsixspecialHumidityIndependent(IDP)Tape&ReelType1Mois-ture Barrier Bag Specimens and SelectedIllustrationsandData

BoB Vermillion, CPP/Fellow, is a Certified eSD & Product Safety engineer-inArTe with expertise in the mitigation of Triboelectrifica-tion for a mars surface and in troubleshooting robotics or systems in aerospace, disk drive, medical device & pharmaceutical, automo-tive and semiconductor sectors. A co-author of several AnSi level eSD documents, Bob serves on the BoD with inArTe and is a member of the eSD Association Standards Committee and conducts eSD Seminars in the USA and abroad. Bob is Chief Technology officer of rmV Technology Group, llC, a 3rd Party eSD materials Testing and Consulting Company. You can reach Bob at 650-964-4792 or [email protected].

Suspect Counterfeit Detection, Avoidance and Mitigation 18-19 November 2010, Department for Continuing Education, Rewley House, University of Oxford

Are you or your supply chain properly handling Class 0 ESD sensitive devices with validated packaging during the parts inspection process? This two-day course is in an interactive case study format and will review non-conformance related issues, as well as validation methods often overlooked in a Suspect Counterfeit Countermeasure Program.

Issues:• Supplier Non-Conformance• Long Term Storage Issues• Outdated Standards• Lack of Class 0 Device Training• Incoming Inspection Practices• Inadequate Inspection of• Sensitive Components• Packaging Inspection? • Validation beyond Parts! • Physical Audits of Packaging

Materials – Not Just Processes!

Course provides in-depth technical review of validation issues:• Where do counterfeits come from?• How can counterfeits be identified?• How can counterfeiting be combated?• Are proper ESD measures being employed?• Does your inspection process compromise Class 0 ESD sensitive devices?• How are parts coded, tracked and safeguarded by employing RFID?

Who is this course for?Engineers & quality assurance, procurement engineering and supply chain management professionals who utilize or purchase components from systems integrators, manufacturers and distributors. Industry sectors: Aerospace & defense, semiconductor, medical device, disk drive, automotive and telecommunications.

Course presentersBob Vermillion, RMV Technology Group, LLC at NASA-Ames Research Center (ARC) Douglas Smith, author of “High Frequency Measurements and Noise in Electronic Circuits”

Further Informationhttp://cpd.conted.ox.ac.uk/electronics/courses/counterfeit_detection.asp; Tel: +44 (0)1865 286958; Email: [email protected]

interferencetechnology.eu interferencetechnology 47

Vermill ion United Kingdom

Figure 16 (left). Non-conforming tape & reel carrier results during actual production and placement of ESD sensitive devices which generated many discharges with no ionization. .

Figure 17 (below). Using ionization with a compliant tape & reel, very low magnitude ESD events with rare occurrences took place.

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emscreen GmbHWallbergstraße 7, Taufkirchen, 82024 Deutschland; +49 89 614171-0; Fax: +49 89 614171-71; www.emscreen.com; Ariane Wahrmann, [email protected] und Services: Abgeschirmte Räume und Gehäuse, Abschirmung

emv - Elektronische Meßgeräte Vertriebs GmbHWallbergstraße 7, Taufkirchen 82024 Deutschland; +49 89 614171-0; Fax: +49 89 614171-71; www.emvgmbh.com; Ariane Wahrmann, [email protected] und Services: Testausstat-tung, Verstärker, Antennen

AR RF/Microwave InstrumentationEMV GmbH, Wallbergstr.7, Taufkirchen, Deutschland D-82024; +49-89-614-1710; Fax: +49-89-614-17171; Wolfgang Winter, [email protected]; www.emvGmbh.de; www.ar-worldwide.comProdukte und Services: Verstärker, Antennen, Kabel und Stecker, Abge-schirmte Räume und Gehäuse, Überspan-nung und Einschaltstöße, Testausstattung

Atmel MARCOM74072 Heilbronn, CA, Deutschland; +49 7131 6 7-2 0 81; w w w.atmel .com /A D /AUTOMOTIVE; susanne.van-clewe @hno.atmel.comProdukte und Services: Testausstat-tung

B

Bajog electronic GmbH Mühlstraße 4, Pilsting, 94431 Deutsch-land; Fax: 49 9953 3002-13, 49 9953 3002-0; www.bajog.de; [email protected] und Services: Filter

BLOCK Transformatoren-Elektronik GmbH & Co. KGMax-Planck-Str. 36-46, 27283 Verden, Deutschland; +49 4231 678-0 ; Fax: 49 4231 678-177; www.block-trafo.de; Jens Kramer, UK Marketing, [email protected] und Services: Filter

Boger ElectronicsGrundesch 15 , Aulendor f, D- 8 8 3 2 6 , Deutschland; 011 (49) 7525 451; Fax: 11(49) 7525 2382; www.boger.de; [email protected] Produkte und Services: Verstärker, Testen

BONN Elektronik GmbHRudolf-Diesel-Str.18, Hohenbrunn, DE-85662, Deutschland; 49 89 608 754 0; Fax: 49 89 608 754 99; www.bonn-elektronik.com; Robert Bonn, [email protected] und Services: Verstärker, Filter

C

Carl Zeiss Optronics GmbH 73446 Oberkochen, Deutschlandf; 49 7364 20-3222; Fax: 49 7364 20-3684; www.zeiss.de; [email protected] und Services: Verstärker

Cascade Microtech GmbHHeisenbergbogen 1, D - 85609, Aschheim

/ Dornach, Deutschland, +49-89-9090195-0, Fax: +49-89-9090195-25, www.cmicro.com

Produkte und Services: Testen

CEcert GmbH Alter Holzhafen 19, Wismar, D-23966, Deutschland; www.cecert.com; Fax:49 (0)3841 - 2242 926; 49 (0)3841 - 2242 906; [email protected] Produkte und Services: Testen

1-9

7 layersBorsigs t rasse 11, Rat ingen 4 0 8 8 0 , Deutschland; +49 2102 749 0 ; Fax: +49 2102 749 350 ; [email protected]; Bri-gitte Lewis, [email protected]; Thomas Hoell, [email protected]; www.7layers.com Produkte und Services: Antennen, Testausstattung, Testen

A

Aaronia AGGewerbegebiet Aaronia AG, DE-54597 Strickscheid, Deutschland; ++49(0)6556-93033; Fax: ++49(0)6556-93034; [email protected]; www.aaronia.de Produkte und Services: Antennen, Abschirmung, Testausstattung

AH Systems, Inc.Pro Nova Elektronik GmbH, Ludwigsburg, Deutschland; 49 7141-2858 20; Fax: 49 7141-2858 29 ; pne @ pronovagmbh.de;

www.AHSystems.comProdukte und Services: Antennen, Testausstattung, Testen

Albatross Projects GmbHDaimlers t raße 17, 8 9 5 6 4 Nat theim, Deutschland; ++49 - 7321 730 500; Fax: ++49 - 7321 730 590; info @ albatross-projects .com ; T imo Greiner, [email protected]; www.albatross-projects.com Produkte und Services: Abgeschirmte Räume und Gehäuse, Anechoic Chambers

Alfatec Kerafol GmbHMeckenloher Str. 11, Rednitzhembach, D-91126, Deutschland; 011-499-12297960; Fax: 011-499-122979660; www.alfatec.de; Holger Schuh, [email protected] und Services: Testausstat-tung

AMS Technologies AGFraunhofers trasse 2 2 , Mar t insr ied, INTL, D-82152, Deutschland; 011-498-989577561; Fax:011-498-989577199; Silke Steingrover, [email protected] Produkte und Services: Verstärker, Kabel und Stecker, Filter, Testausstat-tung, Sonstiges

DEUTSCHLAND | Produkte und Services

50 interferencetechnology eUroPeeMcgUiDe2011

EMV Testhaus GmbHGustav-Her t z-StraBe 3 5, S traubing, D-94315, Deutschland; Fax: 49 9421 56868-100, 49 9421 56868-0; [email protected], Charlotte Klein; www.emv-testhaus.com Produkte und Services: Testen

ETS - Lindgren Ltd.Unit 4 Eastman Way, Pin Green Industrial Area, Stevenage, SG1 4UH, Great Britain; +44 (0 )1438 730700 ; Fax: +44 (0 )1438 730750; Malcolm Charsley, [email protected] und Services: Antennen, Kabel und Stecker, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Tes-tausstattung, Testen

euro EMC GmbHSchlossstr. 4, Oberkoellnbach, 84103 Postau, Deutschland, Fax: 49 (0)8774-9 6 855-9, 4 9 ( 0 ) 8774 -9 6 855-0 ; w w w.emc-positioning.de/, [email protected] und Services: Antennen, Verstärker

F

Fair-Rite Products Corp.Industrial Electronics, Hauptstr. 71 - 79 D-65760 Eschborn Deutschland; +49-6196-927900 ; Fax : +49-6196-927929 ; [email protected] Elektronik GmbH, Schoem-perienstrasse 12B D-76185 Karlsruhe Deutschland; +49 7215 6910; Fax: +49 7215 69110 ; [email protected]; www.fair-rite.comProdukte und Services: Ferrit, Filter, Abgeschirmte Räume und Gehäuse, Abschirmung

Federal Network Agency Canisiusstr 21, Mainz, INTL, D-55122, Deutschland, 49 6131 18 0; [email protected]; www.bundesnetzagentur.de Produkte und Services: CE marking

Feuerherdt GmbH Mot zener S trae 2 6 b, Berlin, 12 2 7 7, Deutschland; Fax: 49 30 710 96 45 – 99; 49 30 710 96 45 – 51; Clemens Feuerherdt, clemens.feuerherdt @ feuerherdt .de ; www.shielding-online.com Produkte und Services: Leitungsma-terialien, Abschirmung

Frankonia EMCIndustrie Strasse, 16, Heideck, D-91180, Deutschland; Fax: 011-(49) 91 77-98520; (49) 91 77-98 500; www.frankonia-emc.com; Philippe Capron, [email protected] Produkte und Services: Testausstat-tung

FS Antennentechnik GmbHMorsestr. 6, D-85716, Unterschleissheim, Deutschland, +49-089-37 44 86-0; Fax: +49-089-37 4 4 86-55 ; info @ fsant .de; www.fsant.de

Produkte und Services: Antennen

FUSS-EMVJohann-Hittorf-Strasse 6, D-12489 Berlin, Deutschland, +49 30 - 4 04 40 04, Fax: +49 30 - 4 04 31 50, www.fuss-emv.de, info(a)fuss-emv.deProdukte und Services: Filter

G

GAUSS Instruments GmbH H a f e r w e g 1 9 , M u n i c h , 8 1 9 2 9 Deutschland ; + 4 9.89.9 9 627826 ; Fax : + 4 9.18 0 3 .5518 4 4 5 85 ; Dipl .-Ing. Arnd Frech, [email protected]; www.gauss-instruments.comProdukte und Services: Testausstat-tung; Testen

GETELEC375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.comProdukte und Services: Abschirmung

germania elektronik GmbHGutenbergring 41, Norderstedt, 22848, Deutschland; +49 40 5935 58 0; Fax: +49 40 5935 58 20; www.germania-elektronik.de; [email protected] Produkte und Services: Abschirmung, Leitungsmaterialien, Ferrit, Filter

GIGACOMP GmbHRichard-Wagner-Str. 31, D-82049 Pullach, Deutschland; +49 89 32208783; Fax: +49 89 32208958; www.gigacomp.de; [email protected] und Services: Testausstat-tung

H

Haefely EMC DivisionEMCO Elektronik GmbH, Bunsenstrasse 5, D-82152 Planegg, Deutschland; +49 089 895565 0; Fax: +49 089 89590376; Christine Seel, [email protected]; www.emco-elektronik.deProdukte und Services: Überspan-nung und Einschaltstöße, Testausstattung

H+H High Voltage Technology GmbHIm kurzen Busch 15, D-58640 Iserlohn, Deutschland; Fax: 49 (0)2371.157722; 49 (0)2371.7853-0; www.hundh-highvoltage.de; [email protected]; Klaus Hornickel, Managing DirectorProdukte und Services: Testausstat-tung

HF-SHIELDING Joachim Broede GmbHIndustriestraße 6, D-49170 Hagen a.T.W., Deutschland; Fax: 49 54 05 - 99 99 06; 49 54 05 - 99 99 04; www.hf-shielding.de; Joachim Broede, [email protected] Produkte und Services: Testen

HILO-TESTHennebergstrasse 6, D 76131, Karlsruhe, Deutschland; Fax: 49 0721 931 09-39; 49 721 931 09 ; www.hilo-test.de; Edourd Pohlner, [email protected] Produkte und Services: Testausstat-tung

Hirschmann Car Communication GmbHStut tgar ter Strae 45-51, Neckar ten-zlingen, 72654, Deutschland; Fax : 49 7127 14 – 1689; 49 7127 14 1437; www.hirschmann-car.com; [email protected] Contact: 1116 Centre Road, Auburn Hills, MI, 48326, Fax: 248 276-2350, 248 373-7150, www.hirschmann-car.com, [email protected] und Services: Testen

I

i. thomas gmbhA n der B7 3 - 2 0 0a, D-216 8 4 S tade, Deutschland; Fax: +49 04141 – 84461; +49 04141 – 82920; www.schirmkabinen.de; [email protected] Produkte und Services: Filter, Ab-schirmung, Software

IBH Elektrotechnik GmbHGutenbergring 35, Norderstedt, INTL, 2 2 8 4 8 , Deut schland ; Fax : 011- 4 9 4 -05239709 ; 011-494-052305228 ; www.ibh-elektrotechnik.de; Michaela Kluckert, [email protected] Produkte und Services: Kabel und Stecker

IFI - Instruments for Industry

EMCO Elektronik, Bunsenstr. 5, D-82152 Planegg Deutschland; +49 898955650 Fax : + 4 9 8 9 8 95 9 0 3 76 ; Diego Waser, dwaser @ emco-elek tronik .de ; w w w.emco-elektronik.dePischzan Technologies - EMV Messtech-nik und mehr, Thomas-Mann-Straße 57 D-63477 Maintal Deutschland; +49 (0) 61 09 - 77 19 48; Fax: +49 (0) 61 09 - 77 19 49; Gregor Pischzan, [email protected]; www.pischzan-tech-nologies.deProdukte und Services: Verstärker, Antennen, Filter, Abgeschirmte Räume und Gehäuse, Testausstattung, Testen

IMST GmbHCarl-Friedrich-Gauss-Str. 2 , D-47475, Kamp-Lintfort, Deutschland; Fax: 49 2842 981 199; 49 2842 981 0; www.imst.com, [email protected]; [email protected] und Services: Software

inn-co GmbHErlenweg 12 , Schwarzenfeld, 92521, Deutschland; Fax: +49 - (0)9435-3066-99; +49 - (0)9435-3066-0; www.innco-systems.de; [email protected] und Services: Testen

J

Jacob GmbH Elektrotechnische Fabrik, Gottlieb-Daim-ler-Str. 11, 71394 Kernen, Deutschland; +49 (0)7151 56806-60; Fax: +49 (0)7151 56806-79; www.jacob-gmbh.de; [email protected] Produkte und Services : Testausstat-tung

K

KE Kitagawa GmbHElbinger Strasse 3-5, D-63110 Rodgau-Jügesheim, Deutschland; 06106-8524-0; Fax: 06106-8524-30; [email protected]; www.kitagawa.deProdukte und Services: Ferrit

L

Langer EMV-Technik GmbHNoethnitzer Hang 31, Bannewitz, 01728, DE, 0351-430093-23; www.langer-emv.de; [email protected] Produkte und Services: Test and measurement, training

Luethi Elektronik-Feinmechanik AGParkstrasse 6, 4402 Frenkendorf / BL, Deutschland; 061 902 1210; Fax: 061 902 1211; www.luethi-ag.ch Produkte und Services: Test and measurement

M

Maschek ElektronikAdolf-Scholz-Allee 4a, 86825, Bad Wör-ishofen, Deutschland; +49 (0) 82 47 - 95 98 07; Fax: +49 (0) 82 47 - 95 98 09; www.maschek.de; [email protected] und Services: Testausstat-tung

maturo GmbHBahnhofstr. 26, 92536, Pfreimd, Deutsch-land; Fax: 49 (0) 9606/923913-29; 49 (0) 9606 923913-0; www.maturo-gmbh.de; Markus Saller, [email protected] Produkte und Services: Antennen, Testen

MB-technology GmbH Kolumbusstr. 19+21, 71063 Sindelfi ngen, Deutschland; Fax: 49 7031 686-4500; 49 7031 686-3000; www.mbtech-group.com; [email protected] und Services: Testen

Mesago Messe Frankfurt GmbHRotebuehls t rasse 8 3 - 8 5 , S tu t tgar t , D-70178, Deutschland, Fax: 49 711 61946 806, 49 711 61946 26, www.mesago-online.de, [email protected] und Services: Events

Produkte und Services | DEUTSCHLAND


DEUTSCHLAND | Produkte und Services

Mician GmbHSchlachte 21, 28195 Bremen, Deutschland; +49 (421) 168 993 51; Fax: +49 (421) 168 993 52; [email protected]; www.mician.comProdukte und Services: Software

MOOSER Consulting GmbHAmtmannstrabe 5, Egling / Thanning, 82544, Deutschland; 49-8176 92250; Fax: 49-8176 92252; http://mooser-consulting.de; Mario Kantner, [email protected], Produkte und Services: Verstärker, Testen

MTS Systemtechnik GmbHGewerbepark Ost 8, D-86690 Mertin-g e n , + 4 9 ( 0 ) 9 0 7 8 . 9 1 2 9 4 - 0 , F a x : +49(0)9078.91294-7, www.mts-system-technik.de, [email protected] und Services: Antennen, Testausstattung

NNarda Safety Test Solutions GmbHSandwiesenstrasse 7, 72793, Pfullingen, Deutschland, +49 (0) 7121-97 32-777 Fax: +49 (0) 7121-97 32-790, www.narda-sts.de, [email protected] und Services: Antennen, Testausstattung, Sonstiges

Neosid Pemetzrieder GmbH & Co. KGP.O. Box 1354, D-58543 Halver, Deutsch-land; Fax: 49 2353 7154; 49 2353 71-0, ; [email protected]; www.neosid.deUS Location: Electronic Coils, Inc., 53 Main Line Drive, Westfi eld, MA 01086, Fax:(413) 562 7749, (413) 562 7684, [email protected] und Services: Ferrit, Filter

Neuhaus Elektronik GmbHDrontheimer Str. 21, D-13 359 Berlin, Deutschland; Fax : 49 ( 0 ) 30 497 695-30; 49 (0)30 497 695-0; www.neuhaus-elektronik.de; neuhaus-elektronik@ t-online.deProdukte und Services: Leitungs-materialien

NexioEmco Elektronik, Bunsenstr.5, D-82152 Planegg, Deutschland; +49 89 8 95 56 50; Fax : +49 89 8 95 90 376; www.emco-elektronik.de; [email protected] Produkte und Services: Testausstat-tung, F il ter, Überspannung und Ein-schaltstöße

P

PFLITSCH GmbH & Co. KGErnst-Pfl itsch-Straße 1 industriegebie, Nord 1, D-42499 Hückeswagen, Deutsch-land; +49 2192 911-0; Fax: +49 2192 911-220; www.pfl itsch.de; info@pfl itsch.deProdukte und Services: Kabel und Stecker

Phoenix Testlab GmbHKonigswinkel 10, Blomberg, D-32825, Deutschland; Fax: 49 (0)5235-9500-20; 49(0)5235-9500-0; www.phoenix-testlab.de; offi [email protected] und Services: Testen

Pontis - Audiv GmbHAudivo GmbH,Irrenloher Damm 17, 92521 Schwarzenfeld, Deutschland; +49 (0) 9435 / 5419-0; Fax +49 (0) 9435 / 5419-19; www.audivo.com; [email protected] und Services: Abschirmung

R

Rohde & Schwarz GmbHMuhldorfstrasse 15, Munchen, D-81671, Deutschland; Fax: 49 89 4129-121 64, 4989 4129 12 748, www2.rohde-schwarz.com, sigrun.Berghammer@ rohde-schwarz.com Produkte und Services: Antennen, Abgeschirmte Räume und Gehäuse, Ab-schirmung, Testausstattung

ROLEC GEHÄUSE-SYSTEME GmbHKreuzbreite 2, 31737 Rinteln, Deutsch-land; +49 (0) 5751 4003-0; www.rolec-enclosures.co.uk; [email protected] und Services: Abgeschirmte Räume und Gehäuse

S

Schlegel Electronic MaterialsElectrade GmbH, Lochhamer Schlag 10b, 82166 Graefelfi ng, Deutschland; +49 (0) 89 898 10 50; Fax: +49 (0) 89 854 49 22; Frau Anja Schmidt, [email protected]; www.electrade.comProdukte und Services: Leitungsma-terialien, Abschirmung

Schlenk Metallfolien GmbH & Co. KGBarnsdorfer Hauptstr. 5, D-91154 Roth, Deutschland, Fax: 49 9171 808 200, 49 9171 808 280, www.schlenk.de, [email protected], Gerhard LoecklerUS Sales Contact : 330 498 0980 ; Fax: 330 494 0468, [email protected] Produkte und Services: Abschirmung

Schlöder GmbHHauptstrasse 71, D-75210, Keltern-Weiler, Deutschland, Fax; 49 (0) 7236 / 9396 – 90, 49 (0) 7236 / 9396 – 0, www.schloeder-emv.de, [email protected], Friedrich Schloeder, President Produkte und Services : Testen, Testausstattung

Schwarzbeck Mess - ElektronikAn der Klinge 29, D 69250, Schönau, Deutschland, Fax: 49 (0) 6228 / 1003, 49 (0) 6228 / 1001, www.schwarzbeck.de, [email protected] und Services: Antennen, Testausstattung

ServiceForce.Com GmbHKleyerstraße 92, 60326, Frankfurt am Main, Deutschland, +49 69 365090-5500, www.serviceforce-com.deProdukte und Services: Testen

Siemens Energy & Automation EMC-CentreDirector test centers, Guenther-Scha-rowsk y-S tr. 21, Er langen, D-910 5 8 , Deutschland, Fax : 49 (9131) 7-25007,

49 (9131) 7-32977, www.automation.siemens.com, [email protected] und Services: Testen

SINUS Electronic GmbHSchiefweg 10, Untereisesheim, D-7427, Deutschland, 49 7132 9969 0, 49 7132 9969 50, www.sinus-electronic.de, [email protected] und Services: Filter, Übers-pannung und Einschaltstöße

Sonderhoff ChemicalsGmbHRichard-Byrd-Straße 26, 50829 Köln, Deutschland, +49 221 95685-0, Fax +49 221 95685-599, www.sonderhoff.com, [email protected] und Services: Testen

SOSHIN Electronics Europe GmbHWesterbachstrasse 32, D-61476, Kronberg im Taunus, Deutschland, 49-6173-993108, Fax: 49-6173-993206, www.soshin-ele.comProdukte und Services: Filter

Spitzenberger & Spies GmbH & CoSchmidstraße 32-34, D-94234, Viechtach, Deutschland, +49 (0)9942 / 956, www.spitzenberger.de, [email protected] Produkte und Services: Verstärker, Testausstattung

Statex Produktions & Vertriebs GmbHKleiner Ort 11 , 28357 Bremen, Deutsch-land, Fax: 49 (0)421-273643, 49 (0)421-275047/8, [email protected] , www.statex.deProdukte und Services: Abgeschirmte Räume und Gehäuse, Abschirmung, Lei-tungsmaterialien

Stolberg HF-Technik AG Muensterau 168, 52224, Stolberg-Vicht, Deutschland, Fax: 49-2402-99777-900, 4 9 -24 0 2-9 9 7 7 7- 0, w w w.stolberg-hf.com, harald.landes@ stolberg-hf.com, Harald LandesProdukte und Services: Verstärker, Kabel und Stecker, Testausstattung

T

Tactron Elektronik Bunsenstraße 5 / 2. Stock, 82152 Planegg, Deutschland, +49 (0)89/895569-0, Fax:+49 (0)89/857760-5, www.tactron.de, [email protected] TDK Produkte und Services: Software

TDK Electronics Europe Wanheimer Strasse 57, Dusseldorf, INTL, D-40472, Deutschland, 44 1344 381515, w w w.tdk .de, sjackson @ eu.tdk .com, Stuart JacksonInternational Location: Summit House, London Road, Bracknell, Berkshire, INTL, RG12 2XH, GB, 44 1978 810 147, [email protected], Andy CollinsProdukte und Services: Verstärker, Antennen, Ferrit , Filter, Abgeschirmte Räume und Gehäuse, Abschirmung, Tes-tausstattung, Testen

Tech-Etch, Inc.Feuerherdt GmbH, Motzener Str. 26 b, 12277 Berlin, Deutschland; +49 30 710 964 5 52; Fax: +49 30 710 964 5 - 99; emc@

feuerherdt.deProdukte und Services: Leitungsma-terialien, Abschirmung

Telemeter Electronic GmbHJoseph-Gansler-Strasse 10, Donauworth, D-86609, Deutschland, 49 906 70693 0, Fax: 49 906 70693 50, www.telemeter.info, [email protected] und Services:

TESTEC Elektronik GmbHWesterbachstr. 58, 60489 Frankfurt am Main,vDeutschland, Fax: 49 (0)69 943335 55, 49 (0)69 943335 0, www.testec.de, [email protected] Produkte und Services: Testausstat-tung

Teseq GmbHLandsberger Strasse 255, 12623 Berlin / Deutschland, +49 30 5659 8835, Fax: +49 30 5659 8834, [email protected], www.teseq.deProdukte und Services: Verstärker, Antennen, Testausstattung, Testen

THORA Elektronik GmbHWinn 6, Herrieden, 91567, Deutschland, Fax : 0 9 825 / 92 8 0-9 0, 0 9 825 / 92 8 0-19, www.thora.com, Edyta Danner, [email protected] Produkte und Services: Ferrit, Con-nectors

TTV GmbHSude t ens t r. 5 3 , 8 2 5 3 8 gere t sr ied , Deutschland, +49-8171-3469-0, Fax:+49-8171-3469-29, [email protected], www.go-ttv.comProdukte und Services: Filter

TÜV SÜD SENTON GmbH Äußere Frühlingstraße 45, 94315 Straub-ing, Deutschland; 09421-5522-22; Fax: 09421-5522-99; http://www.tuev-sued.de/senton; Stefan Kammerl, senton @tuev-sued.deProdukte und Services: Testen

V

Vacuumschmelze GmbHGruner Weg 37, Hanau, D-63450, Deutsch-land, Fax: (49) 6181/38-2645, (49) 6181/38-22 75, www.vacuumschmelze.com, [email protected] und Services:

W

Willtek Communications Gutenbergstr. 2 – 4, Tucson, INTL, 85737, Deutschland, Fax: 49 (0)89 99641 440, 49 (0)89 99641 200, www.willtek.com, [email protected], Achim GrolmanProdukte und Services: Abschirmung

Wurth Elektronik GmbH & Co. KGMax Eyth Str. 1-3, Waldenburg, 74638, Deutschland, Fax: 49 7942-945430, +49 7942-945120, www.we-online.de, [email protected], Alexander GerferProdukte und Services: Ferrit, Kabel und Stecker


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AssociAtion

iEEE EMc sociEtY cHAPtER GERMANY Frank Sabath, Federal Ministry of Defense, Armament Director-ate IV 6, Am Steinberg 9, Garstedt 21441, Germany; +49 4173-58-17-20; Fax: +49 4173-58-17-21; [email protected]

notifiEd bodiEs

cEtEcoM GMbHIm Teelbruch 116, 45219 ESSEN, Germany; +49-2054 9519.283; Fax: +49-2054 9519 903; [email protected]; www.cetecom.deNotified Body number : 0680Directive: 004/108/EC Electromagnetic compatibility

EMc tEst nRW GMbHEmil-Figge-Straße 76, 44227 Dortmund, Germany; +49 (231) 9742753; Fax: +49 (231) 9742755; [email protected]; www.emc-test.deNotified Body number : 1946Directive: 2004/108/EC Electromagnetic compatibility

EMccERt dR. RAsEK GMbHB o e l w i e s e 5 , 9 13 2 0 E B E R M A N S TA D T, Ge r m an y ; +49:9194:9016;Fax: +49:9194:8125; [email protected]; www.emcc.deNotified Body number : 0678Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099)2004/108/EC Electromagnetic compatibility

EuRofins PRoduct sERvicE GMbHStorkower Straße 38c, 15526 REICHENWALDE, Germany; +49 33 63 18 88 700; Fax: +49 33 63 18 88 660; [email protected]; www.pt.eurofins.comNotified Body number : 0681Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099)2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

KRAuss-MAffEi WEGMAnn GMbH & co. KGAugust-Bode-Straße 1, 34127 Kasse, Germany ; +49 (561) 1052713; Fax: +49 (561) 1052832; [email protected]; www.kmweg.deNotified Body number : 1947Directive: 2004/108/EC Electromagnetic compatibility

MiKEs-tEstinGPARtnERs GMbHOhmstraße 2-4, 94342 Strasskirchen, Germany; +49 (9424) 94810; Fax: +49 (9424) 9481240; [email protected]; www.mikes-testing-partners.com

Notified Body number : 1948Directives: 2004/22/EC Measuring Instruments Directive2004/108/EC Electromagnetic compatibility

MitsubisHi ElEctRic EuRoPE b.v.Mündelheimer Weg 35, 40472 Düsseldorf, Germany; +49 (211) 17149712; Fax:+49 (211) 17149727; [email protected]; www.mitsubishielectric.deNotified Body number : 1965Directive: 2004/108/EC Electromagnetic compatibility

obERinG. bERG & luKoWiAK GMbHLöhner Straße 157, 32609 Hüllhorst, Germany; +49 (5744) 92960; Fax: +49 (5744) 929615; [email protected]; www.obl-gmbh.deNotified Body number : 1949Directive: 2004/108/EC Electromagnetic compatibility

PAnAsonic custoMER sERvicEs EuRoPE a Division of Panasonic Marketing Europe GmbHWinsbergring 15, 22525 Hamburg, Germany; +49 (40) 85493590; Fax: +49 (40) 85493540; [email protected]; www.panasonic.deNotified Body number : 1966Directive: 2004/108/EC Electromagnetic compatibility

PHoEniX tEstlAb GMbHKöningswinkel 10, 32825 Blomberg, Germany; +49 5235 9500 24; Fax: +49 5235 9500 28; [email protected]; www.phoenix-testlab.deNotified Body number : 0700Directives: 99/5/EC Radio and telecommunications terminal equipment (31/12/2099)2004/108/EC Electromagnetic compatibility

sGs GERMAnY GMbH ZERtifiZiERunGsstEllE MüncHEnHofmannstraße 50 81379 München, Germany; +49 (89 ) 787475132; Fax: +49 (89) 787475122; [email protected]; http://www.sgs-certification-body.de/Notified Body number : 2150Directives: 99/5/EC Radio and telecommunications terminal equipment2004/108/EC Electromagnetic compatibility

siEMEns AGSan-Carlos-Straße 7, 91058 Erlangen, Germany ; +49 (9131) 733177; Fax:+49 (9131) 733265; [email protected]; www.siemens.deNotified Body number : 196Directive : 200 4 /108 / EC Electromagnetic compatibili t y SLG PRÜF UND ZERTIFIZIERUNGS GMBHBurgstädter Strasse 20, 09232 Hartmannsdorf, Germany; +49:3722:7323-0; Fax:+49:3722:7323-899; [email protected];


DEUTSCHLAND Ressourcen

www.slg.de.comNotified Body number: 0494Directives: 88/378/EEC Safety of toys93/42/EEC Medical devices97/23/EC Pressure equipment2000/14/EC Noise emission in the environment by equipment for use outdoors (31/12/2099)2004/108/EC Electromagnetic Compatibility2006/95/EC (ex-73/23/EEC) Low voltage directive2006/42/EC Machinery

sonY dEutscHlAnd GMbHHedelfinger Straße 61, 70327 Stuttgart, Germany; +49 (711) 5858336; Fax:+ 49 (711) 5858203; [email protected]; www.stuttgart.sony.deNotified Body number : 1968Directive: 2004/108/EC Electromagnetic compatibility

tüv RHEinlAnd lGA PRoducts GMbHTillystraße 2, 90431 Nürnberg, Germany; +49:221:806 2048; Fax: +49:221:806 3935; [email protected]; www.tuv.comNotified Body number: 0197Directives: 88/378/EEC Safety of toys89/686/EEC Personal protective equipment90/385/EEC Active implantable medical devices93/42/EEC Medical devices98/79/EC In vitro diagnostic medical devices99/5/EC Radio and telecommunications terminal equipment (31/12/2099)2000/14/EC Noise emission in the environment by equipment for use outdoors (31/12/2099)2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

tüv süd PRoduct sERvicE GMbHRidlerstraße 65, 80339 München, Germany; +49 (180) 3324242; Fax: +49 (89) 51551202; Email: [email protected]; ww.tuev-sued.de/psNotified Body number: 0123Directives: 88/378/EEC Safety of toys89/106/EEC Construction products89/686/EEC Personal protective equipment90/385/EEC Active implantable medical devices2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels93/42/EEC Medical devices94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres94/25/EC Recreational craft98/79/EC In vitro diagnostic medical devices2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

tüv tEcHniscHE übERWAcHunG HEssEn GMbHRüdesheimer Straße, 119, 64285 Darmstadt, Germany; +49:61:51 6000; Fax: +49:61:51 600323; Email: [email protected] Body number: 0091Directives: 95/16/EC Lifts

97/23/EC Pressure equipment99/36/EC Transportable pressure equipment (31/12/2099)2004/108/EC Electromagnetic compatibility

vdE - PRüf- und ZERtifiZiERunGsinstitut GMbHMerianstraße, 28, 63069 Offenbach (AM MAIN), Germany; +49:69:8306 228; Fax: +49:69:8306 855; [email protected], www.vde-institut.deNotified Body number: 0366Directives: 88/378/EEC Safety of toys2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive (31/12/2099)2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

otHER

fEdERAl MinistRY of EconoMics And tEcHnoloGY RAdio fREquEncY PolicY, ElEctRoMAGnEtic coM-PAtibilitYVillemombler Straße 76 53123 Bonn; +49 228 99615-3258; Fax.: +49 228 99 615- 3264; Michael Scharnberg, [email protected]


Ressourcen | DEUTSCHLAND






Fair-Rite Products Corp.Your Signal Solution!PO Box 288, One Commercial Row, Wallkill, NY 12589-0288 www.fair-rite.com | [email protected](888) FAIRRITE (324-7748) or (845) 895-2055 | Fax (845) 895-2629


Stephan BraunGAUSS Instruments GmbH München, Deutschland

I. eInLeItunGMit der Aufnahme des “FFT-based Measuring Instruments” in die Fach-grundnorm 16-1-1 sind die Weichen für einen Technologiewechsel im Bereich der Funkstörmessempfänger gestellt. Solche neuartigen Messgeräte können die Zuverlässigkeit von Emissionsmes-sungen für komplexe Systeme erhöhen, die Prüfzeiten reduzieren, und damit die heutigen Anforderungen an immer kürzeren Innovationszyklen im Bereich der Produktentwicklung erfüllen.

In diesem Artikel wird zum einen ein Überblick über die Historie der Technologie über die letzten 10 Jahre gegeben.

Die Entwicklung schneller Digi-taltechnik, sowie von Hochleistungs A/D Wandlern ermöglichte es in den letzten Jahren derartige Messgeräte zu entwickeln. Zum anderen wird ein kurzer Abriss über die historische Entwicklung im Bereich der Normen zu diesem Thema gegeben.

Ferner wird erklärt, warum das FFT-based Measuring Instrument kein anderes Prüfverfahren ist, sondern die Fachgrundnorm CISPR 16-1-1 lediglich im Rahmen eines Maintenance Cycle Reports um diese Technologie erweitert wurde.

II. eMV-eMISSIOnSMeSSunGZur Qualifizierung von elektrischen und elektronischen Geräten und Anla-

gen werden frequenzselektive Messun-gen durchgeführt. Hierzu werden Funk-störmessempfänger eingesetzt, welche üblicherweise Superheterodynemp-fänger sind. Funkstörmessempfänger führen eine frequenzselektive Messung durch, in dem das Eingangssignal auf eine Zwischenfrequenz gemischt wird, mittels eines Zwischenfrequenzfilters gefiltert wird und anschließend mit-tels eines oder mehrerer Detektoren ausgewertet wird. Erste Messempfän-ger wurden bereits in den 30er Jahren des letzten Jahrhunderts von Siemens, General Electric [1] sowie Stoddard hergestellt und zur Messung elektro-magnetischer Störungen eingesetzt. Moderne Funkstörmessempfänger führen die Filterung des Zwischen-frequenzsignals sowie die Bewertung mittels der Detektoren digital durch [2]. Dadurch konnte eine Verbesserung der Reproduzierbarkeit von Emissionsmes-sungen erreicht werden. Da bei einer Emissionsmessung mehrere tausend Frequenzpunkte gleichzeitig gemessen werden müssen und dies bei Funk-störmessempfängern üblicherweise sequentiell erfolgt, ergeben sich bei der Messung mittels Funkstörmessemp-fängern für eine Charakterisierung der Störaussendungen eines Messobjektes mehrere Stunden Messzeit.

Zur Reduktion der Testzeiten wurde ein Verfahren entwickelt, welches zunächst eine schnelle nicht normgere-chte Vormessung durchgeführt und anschließend eine normgerechte Nach-messung erfolgt [3]. In der Praxis zeigt sich, dass dieses Verfahren zuverlässig bei stationären Schmalbandstörern

neuerungen in der eMV emissionsmesstechnik

56 Interference tecHnoloGy eUrope eMc GUIDe 2011

Deutschland

Translations available

at www.interferencetechnology.eu

ar europe

Andere ar Abteilungen: • modular rf • receiver systemsNational Technology Park, Ashling Building, Limerick, Irland • 353-61-504300 • www.ar-europe.ie


Alle sprechen über Qualität, wir jedochglauben nur, was wir sehen.

Viele Lieferanten nehmen für sich in Anspruch, „Qualitätsprodukte“ herzustellen. Aber ist Qualität noch dasselbe wie einst? Bei AR bestimmt ja. Wir haben mehr als 40 Jahre lang den Ruf für zuverlässige Erzeugnisse aufgebaut, die keinen Vergleich zu scheuen brauchen. (Und dann

noch einige) Erzeugnisse, die schneller, kleiner und effizienter sind. Erzeugnisse, die viel länger halten, viel mehr leisten und viel besserfunktionieren als die anderer Unternehmen. Und dazu hat jedes einzelne weltweiten Support und die besten ernsthaften Garantien der Branche.

Nach unserem Dafürhalten zeigt sich Qualität in den Ergebnissen. Wenn ein Erzeugnis in der realen Welt nicht Hervorragendes leistet,erhält man nicht das erwünschte Echo. Und wir sprechen auch nicht die loyalen Kunden an, die wir suchen.

Es geht jetzt also um Unternehmen und Kunden, die Qualität noch immer beachten – und fordern.

EMI-Empfänger•Sie haben nichts mit Tasten, Schaltern

und Druckknöpfen zu tun. •CISPR kompatibel, erfüllt MIL-STD, Anforderungen des PKW und DO-160.

Neue Verstärker der Serie A 10 kHz - 250 MHz, bis zu 16 000 Watt.

•Breitere Frequenzbandbreite – Test nach allen Standards. •25 % bis 50 % kleiner – passt in Ihren Kontrollraum.

•Die Einheiten haben eine hochstehendeHybridkühlsystemtechnologie, die für größere

Zuverlässigkeit und Lebensdauer sorgt.

Neue Verstärker der Serie S 0,8 – 4,2 GHz, bis zu 800 Watt

•Handlicher und tragbar. •Bessere Leistung dank erhöhter Effizienz.

•Linear mit niedriger Harmonik und 100 % Fehlanpassungskapazität.

HF-leitungsgebundene Störfestigkeitsprüfungssysteme 3 unabhängige Modelle mit integriertem Leistungsmessgerät

und Signalgenerator. Frequenz- und Stufenwertbildung für Fehleranalyse.

Subampability™: (sub-amp-ability). Substantiv: Fähigkeit, einen Verstärker individuell zu verwenden

oder als Baublock, wo die Leistung inkrementellhinzugefügt werden kann.

Neuer ATR26M6G-1 26 MHz - 6 GHz, bis zu 5000 Watt

•Höchste Eingabeleistungskapazität für stärker bestrahlte Felder. •60 % niedriger als Standard Log-Periodika.

•Erfüllen Sie die allermeisten Ihrer Testbedürfnisse mit einer einzigen Antenne.

Wanderfeldröhrenverstärker •Liefert mehr Leistung als Festkörper (CW und Puls).

•Frequenzbereiche bis zu 45 GHz. •Schlafmodus – bewahrt die Langlebigkeit, schützt die Röhre.

AS Systeme •Alles, was Sie benötigen, in einem umfassenden Testsystem.

•Lösungen von der Stange oder individuelle Lösungen. •Größte Palette an Ausrüstung von einer einzigen

Gesellschaft verfügbar.

Verstärker Serie W Gleichstrom - 1000 MHz, bis 4000 Watt

•Subampability: erstreckt sich im Laufe derZeit von 1000 bis 4000 Watt.

•Intelligenter Verstärker - Selbstdiagnose. •Zuverlässig

Hybridmodule•Leistung bis 37 dBm von 6 bis 18 GHz.

•Ausgezeichnete Linearität, ausgezeichneter Zugewinn und ausgezeichnete Flachheit. •Als Baublock irgendwo in Ihrem Plan verwenden. •Individuell anpassbar in unserem eigenen Mikroelektroniklabor,das dem neuesten Stand der Technik entspricht.

Weltgrößte Auswahl von Feldtests •Größter verfügbarer Frequenzbereich- 5 kHz bis 60 GHz.

•Unglaublich kompakt, erfordert nie Batterien. •Verbesserter mechanischer Aufbau und verbesserte Achsenkennzeichnung.

•Erkennt Felder von 2 V/m bis 1000 V/m. •Automatische Geräuschreduktion und automatischer Temperaturausgleich.

Hornantennen•Volle Auswahl von 200 MHz bis 40 GHz.

•Leistung bis 3000 Watt. •Justierungseinstellung erhalten.

•Kurzfristig Höhen- und Rotationsanpassungen vornehmen. •Spart Zeit und Geld, bewahrt die Testgenauigkeit.

In Deutschland kontaktieren Sie EMV GmbH, [email protected] oder rufen Sie +49-89-614-1710 an.


http://www.ar-europe.ie

funktioniert. Bei intermittierenden Störern sowie driftenden Schmalbandstörern kann dieses Verfahren allerdings zu Fehlmessungen führen falls die Verweilzeit bei der Vormes-sung zu gering ist oder der Störer sich zwischen Vor- und Nachmessung ändert. Ein derartiges Verfahren verlangt vom Operator Erfahrung, sowie Kenntnisse über das Emis-sionsverhalten des Prüfl ings. Zur Vormessung werden auch Spektrumanalysatoren eingesetzt, da diese üblicherweise schneller sweepen können. Durch die eingschränkte Puls-dynamik ist hier insbesondere bei pulsförmigen Störern auf die Übersteuerung zu achten. Ferner können diese auch nur an einem Frequenzpunkt gleichzeitig eine Messung durchführen.

Mittels diskreter Fourier Transformation (DFT) lässt

sich das Spektrum aus einem Signal im Zeitbereich berechnen. Ein Berechnungs-verfahren der DFT, welches die Anzahl der Multiplikationen reduziert, ist die schnelle Fourier Transformation (engl. fast Fourier transform, FFT) [4]. Ein weiteres Verfahren, welches aus einem Signal im Zeitbereich ein Spektrogramm berechnet, ist die Kurzzeit-FFT (engl. Short time FFT, STFFT) [5]. Ein Überblick über wissenschaftliche

Veröff entlichungen auf dem Gebiet der Emissionsmesstech-nik ist in Tabelle I dargestellt.

Erste Systeme basierten auf einem Aufbau bestehend aus einem Speicheroszilloskop und einem PC zur digitalen Signalverarbeitung [23],[17],[13].

Im Jahr 2005 wurde eine Anordnung aus mehreren Ana-log-digital-Wandlern vorgestellt, welche es ermöglicht-digital [8] transiente Vorgänge mit hohem Signal-Rausch-Abstand zu digitalisieren, und damit die Dynamikanforderungen für Pulse zu erreichen. Lückenlose Auswertung auf FPGAs wurde in [6] vorgestellt. Dabei ist es erstmalig möglich alle Funktionen eines konventionellen Messempfängers digital an mehreren Frequenzpunkten gleichzeitig zu realisieren.

III. EMV-ZEITBEREICHSMESSSYSTEM TDEMIDas Eingangssignal wird mittels einer Analog-Digital-Wandler-Einheit zur Messung im Frequenzbereich 9 kHz -1 GHz abgetastet und digitalisiert. Für Mes-sungen oberhalb 1 GHz erfolgt eine breitbandige Frequenzumsetzung.

Die spektrale Berechnung erfolgt mittels Kurzzeit-FFT. Ein Blockschaltbild eines EMV-Zeitbereichsmess-systems ist in Abbildung 1 dargestellt. Für gestrahlte Emissionsmessung verwendet man typischerweise eine breitbandige logarithmischperiodische Antenne. Alternativ können Messungen mittels Absorberzange oder Netznachbildung durchgeführt werden. Zur Untersuchung der Einkopplung an Antennen im KFZ kann das EMV-Zeitbereichsmesssystem direkt ang-eschlossen werden. Das Eingangssignal wird mittels eines mehrstufi gen Analog-Digital-Wandler-Systems digitalisiert. Durch das mehrstufi ge Analog-Digital-Wandler-System erfolgt die Digitalisierung in eine Gleitkommazahl [24]. Dies erlaubt es einen äquiva-lenten Dynamikbereich von ca. 20 Bit zu erreichen. Damit ist es möglich die eine hohe Sensistivität von ca. −20 dBμV (Band B) zu erreichen und gleichzeitig Pulse

von mehreren Volt zu erfassen. Mittels leistungsfähiger FP-GAs mit einer Rechenleistung, welche ca. 20 handelsüblichen PCs entspricht, erfolgt die Auswertung in einer Bandbreite von 162,5 MHz lückenlos in Echtzeit. Ein derartiges EMV-Zeitbereichsmesssystem wurde erstmalig in [6] vorgestellt.

Die Messung konnte hierbei um einen Faktor 1000 beschleunigt werden. Das kommerziell erhältliche System TDEMI 1G arbeitet über den gesamten Frequenzbereich mit Basisbandabtastung und reduziert die Messzeit um bis zu einen Faktor 4000.

Das System TDEMI 18G mit zusätzlicher Frequenzum-setzung deckt den Frequenzbereich bis 18 GHz ab.


NEUERUNGEN IN DER EMV EMISS IONSMESSTECHNIKDeutschland

Abbildung 1. EMV-Zeitbereichsmesssystem

Abbildung 2. Filterbank

Abbildung 3. Emission eines Elektromotors






A. Kurzzeit-FFTDie Kurzzeit-FFT wird als eine FFT-Berechnung über einen begrenzten Abschnitt verstanden, welche im Zeitbereich ver-schoben wird. Mittels Kurzzeit-FFT wird ein Spektrogramm berechnet, welches einer Darstellung des Spektrums über der Zeit entspricht. Während stationäre Signale ein konstantes Spektrum über der Zeit aufweisen, zeigt sich beim Spektro-gramm das instationäre Verhalten des Störsignals. Die math-ematische Definition der Kurzzeit-FFT is gegeben durch:

Da die Fensterfunktion w[n] symmetrisch ist, existie-ren mehrere Möglichkeiten Gl. 1 umzuformen. Zur realen Berechnung erfolgt die Umwandlung derart, dass nicht die Fensterfunktion verschoben wird, sondern das Eingangssig-nal. Weitere Vereinfachungen sind möglich, insbesondere für die Applikation der Störemssionsmessung, da hier die Phase nicht weiter ausgewertet wird. w[n] ist die Fensterfunktion, welche das ZF-Filter eines Messempfängers nachbildet [12].

B. Vergleich zu einem konventionellen Messemfänger

Es ist aus der Literatur bekannt, dass die Kurzzeit-FFT äquivalent zu einer Anordnung von Basisbandmischern und einer Filterbank ist [5],[25]. Die Kurzzeit-FFT kann eb-enfalls aus einer Anordnung einer Filterbank hergeleitet [26] werden. Ein Blockschaltbild einer derartigen Anordnung ist in Abbildung 2 dargestellt. Das Verhältnis des Dezimators ist gegeben durch:

M = fs/fsbb, (2)

wobei fs die Abtastrate des Analog-Digital-Wandlers ist, und fsbb die inverse Schrittweite der Kurzzeit-FFT, welche

der Basisbandabtastfrequenz entspricht. W[f] ist die diskretisierte Übertragungsfunktion. Die Basis-bandabtastfrequenz fsbb muss so groß sein, dass die

Nyquistbedingung im Basisband beispielsweise bei der digitalen Implementierung des Quasispitzenwert-detektors eingehalten wird. Ein zu geringe Abtastrate führt zu Messfehlern bei transienten Signalen.

IV. NORMGERECHTE MESSUNGEN NACH CISPR• Die CISPR 16-1-1 [27] verlangt ein bestimmtes An-zeigeverhalten eines Instruments für unterschiedli-che Prüfsignale. Man unterscheidet zwischen: • Anzeigeverhalten für Sinus und Pulsfolgen• Anforderungen an die Dynamik• Anforderungen für Ein- und Ausgänge

Diese Punkte werden von den TDEMI Geräten eingehalten.

A. HistorieAls in den Jahren 2002 - 2004 EMV Zeitbereichs-messsysteme vorgestellt wurden, hatten diese aufgrund des damaligen Stand der Technik noch Einschränkungen gegenüber der CISPR 16-1-1. So war es damals nur möglich über sehr schmalbandige Bereiche eine kontinuierliche Auswertung durch-zuführen [15], [15]. Derartige System konnten aufgr-und der begrenzten Dynamik auch nicht vollständig die CISPR 16-1-1 hinsichtlich Dynamik erreichen. Ein weiterer Ansatz war eine sehr breitbandige Digitalisierung mit 1 GHz Bandbreite. Allerdings aufgrund der sehr großen Datenmengen, wurde eine Datenreduktion durchgeführt [12]. Der Nachteil bestand darin, dass bestimmte Anforderungen der Norm wie z.B. die Knackratenanalyse eine lückenlose

Jahr Beschreibung Autor [Ref.]

2006 STFFT, lückenlos Braun, [6] , [7]

2005 STFFT, Hohe Dynamik Braun, [8] , [9], [10]

2004 FFT, Abschätzung Keller [11]

2004 FFT, statistisches Modell Braun, Krug [12]

2002 FFT Krug [13]

2002 FFT Parvis [14]

2002 STFFT, frequenzumsetzend Nickel [15] , [16]

2001 FFT Keller [17] , [18], [19], [20]

1989 FFT Bronaugh [21] , [22]

NeueruNgeN iN der eMV eMiss ioNsMesstechNikDeutschland



Zwei Funktionen mit einer Dichtung

Antikorrosion

H e r s t e l l e r v o n E M I / R F I A b s c h i r m m a t e r i a l

Leitende Dichtungenfür Ihre militärische Applikation

Getelec-94x140 ALL:getelec pub 31/08/10 17:09 Page1

Tabelle 1. Wissenschaftliche Veröffentlichungen auf dem Gebiet der Emissionsmessung im Zeitbereich



Auswertung benötigen.In den Jahren 2004 - 2005 fanden weitere Arbeitskreissit-

zungen statt. Bei diese wurde diskutiert, ob die Norm CISPR 16-1-1 geändert werden soll, um derartige Prüfverfahren in die Norm zu integrieren. Auf der einen Seite stand die Reduk-tion der Testzeiten, und damit ein wichtiger wirtschaftlicher Faktor. Gleichzeitig musste man sicherstellen, dass die Prüfqualität nicht durch ein derartiges neues Verfahren verringert wird. Es wurde darüber nachgedacht Verfahren, welche nicht mathematisch äquivalent sind in sogenannten round robin tests auf Zuverlässigkeit zu prüfen. In den Jahren 2005 und 2006 wurden an der Technischen Universität München die Verfahren derart weiterentwickelt, dass die damals gültige Norm CISPR 16-1-1 vollständig hinsichtlich Anzeigeverhalten, Dynamik zu erreichen. Ferner war ein Ziel, dass die durchgeführte Signalverarbeitung mathematisch vollständig der eines Funkstörmessempfängers entspricht. In ersten Veröff entlichungen wurde [8], [9], [10] gezeigt, dass es möglich ist, mittels mehrer Analog-Digital-Wandler ausreichend Dynamik für pulsförmige Störer zu erreichen. Im Jahr 2006 [6], [7] wurde dann gezeigt, dass eine lück-lose Auswertung an mehreren tausend Frequenzpunkten möglich ist, dies allerdings ca. eine Rechenleistung von 20 PCs benötigt, bzw. die tausendfache Rechenleistung des in-tegrierten DSPs eines damaligen Funkstörmessempfängers. Derartige technische Neuerungen beendeten die Diskussion um die Einführung mathematisch nicht äquivalenter Mess-verfahren, und es wurde immer deutlicher, dass derartige

Messgeräte auch die Norm CISPR 16-1-1 vollständig erfüllen können und müssen.

B. Maintainance Cycle ReportIn weiteren Arbeitskreissitzungen in den Jahren 2006 und 2007 wurde unter den neuen Gesichtspunkten über eine Integration in die Norm CISPR 16-1-1 diskutiert. Da es nun-mehr möglich geworden war, STFFT basierende Messgeräte bereitzustellen, welche damals fast vollständig die Dynamik erreichten und lückenlos die Berechnung durchführten und in der Berechnung an je einem Frequenzpunkt der Berech-nung welche intern in einem Funkstörmessempfänger durch-geführt wurde entsprachen, wurde die geplante Änderung der Norm dahingehend abgewandelt, dass die Norm nur noch um die technischen Errungenschaften erweitert werden sollte. Ein Erreichen der Dynamik für den Isolated Impulse war aufgrund der Weiterentwicklungen absehbar. Da nun keine Änderungen der Norm CISPR 16-1-1 hinsichtlich der Anforderungen mehr nötig waren, und es nur darum ging eine neue Technologie zu würdigen wurde ein Maintainance Cycle Report (MCR) erzeugt, welcher in den folgenden Jahren in der JTF FFT (initiert von CISPR/A und CISPR/D) ausgear-beitet wurden. Die neuen Möglichkeiten von Prüfstrategien wurden in CISPR 16-2-X ebenfalls als MCR erzeugt.

Um die mathematische Äquivalenz und den Stand der Technik zu dokumentieren wurde die Norm CISPR 16-3 um einen technischen Report zu diesen Verfahren erweitert.

C. Heutige Normen Die Entwürfe der MCRs wurden im April 2010 je mit

100 Prozent der internationalen Stimmen angenommen. Aufgrund dieser Tatsache wurde der FDIS Status über-sprungen, und die Normen treten derzeit in Kraft. Mit der CISPR 16-1-1 am. 1 ed. 3 ist nunmehr die Norm um das “FFT-based measuring Instrument” erweitert, welches ein “Receiver” ist [28].

Mit der CISPR 16-2-3 am. 1 ed. 3 werden Verfahren beschrieben welche die Emissionsmessung an gestrahlten

Messobjekten mittes des FFT-based measuring in-struments beschleunigen können [29]. Der Einsatz für leitungsgeführte Messungen, sowie Messungen mit der Absorberzange wird in den Normerweiterungen zu CISPR 16-2-2 und CISPR 16-2-1 beschrieben, welche in den nächsten Monaten Standard werden wird.

V. MESSBEISPIELEEin Vorteil welcher sich bei derartigen Messsyste-men zeigt, ist die Möglichkeit, dass EMV-Störungen wirtschaftlich mit den geforderten Verweilzeiten gemessen werden können. Grundsätzlich wird dies von den Normen CISPR 16-2-X heute schon ge-fordert, ist aber aufgrund des sequentiellen Scans eines Funkstörmessempfängers nicht wirtschaftlich durchführbar. Der Eff ekt bei Messungen mit zuger-inger Messzeit, welche in der Norm CISPR 16-2-X dokumentiert sind, wurde hier mittels des TDEMI untersucht. Dabei wurde die Reproduzierbarkeit einer Messung in Abhängigkeit der Verweilzeit ausgewertet. Die Messungen erfolgten mit dem Spitzenwertdetek-tor. Die Messergebnisse sind in Abbildung 3 dargestellt.

NEUERUNGEN IN DER EMV EMISS IONSMESSTECHNIKDeutschland


Abbildung 4. Emissionsmessung Kaffeautomat

Abbildung 5. Leitungsgebundene Emissionsmessung

Derartige Untersuchungen können nur mit Zeitbereichs-messmethoden effizient durchgeführt werden. Die Messung mit 2 s Verweilzeit würde mit einem Messempfänger ca. 9 Stunden dauern. Mit dem TDEMI-System dauerte die Un-tersuchung weniger als 3 Minuten.

Unterschiedliche Betriebszyklen können mittels des ge-wichteten Spektrogrammodus in Echtzeit gemessen und über die Zeit beobachtet werden. In Abbildung 4 ist die Emission eines Kaffeeautomaten über der Zeit dargestellt.

In den ersten 3 Sekunden wird der Kaffee gemahlen. Anschließend erfolgt das Vorbrühen und Brühen. Nach 14 Sekunden wird das verbrauchte Kaffepulver ausgeworfen. Nach 18 Sekunden wird die Mechanik in den ursprünglichen Zustand zurückgefahren.

Energiesparlampen erzeugen Schmalbandstörer, welche driften und zusätzlich verjittert sind. Im folgenden wurde eine Emissionsmessung in Anlehnung an CISPR 15 [30] oder EN55015 durchgeführt. Der Vorteil bei einem Zeitbereichs-messsystem besteht insbesondere darin, dass die Messung mit den Detektoren Quasispitzenwert und Mittelwert jeweils in 2 Scans erfolgen kann. Die vollständige Messzeit beträgt ca. 32 s pro Leiter. Durch die Ansteuerung der LISN und den automtisierten Programmablauf, wird die Messung für eine 2-Leiter Netznachbildung in weniger als 2 Minuten durchge-führt. Aus den Messdaten wird ein Report generiert, welcher den Anforderungen der CISPR 16-2-1 genügt. Das Ergebnis der Messung ist in Abbildung 5 dargestellt.

A. ZusammenfassungEmissionsmessungen im Zeitbereich ermöglichen es Messzeiten zu reduzieren, sowie die Zuverläs-sigkeit von Messungen zu erhöhen. Die Erweiter-ung der Norm CISPR 16-1-1 um diese Technologie schafft Klarheit hinsichtlicher der Spezifikation für derartige Messgeräte. Das TDEMI erfüllt diese Anforderungen.

In den Normerweiterungen CISPR 16-2-X werden die Möglichkeiten beim Einsatz derartiger Messgeräte für Abnahmemessungen (engl. Compli-ance Measurements) gezeigt. Eine Reduktion der Messzeit sowie eine Vereinfachung der Prüfver-fahren ist nun möglich. Durch die Möglichkeit sehr schneller Scans und normgerechter Messungen in einem einzigen Scan ist es nunmehr möglich zuver-lässig und schnell unbekannte Störungen zu messen und eine Beurteilung gemäß den Fachgrundnormen und Produktnormen durchzuführen.

Durch den gewichteten Spektrogrammodus ist es z.B. möglich bei Automaten einzelne Funktion-szyklen zu analysieren und damit die einzelnen Komponenten auf EMVkonformität zu unter-suchen. Dies ermöglicht es bereits in der Entwick-lungsphase eines Produktes derartige Störquellen zu erkennen und zu entstören.

RefeRenzen• [1] C. R. Barhydt, “Radio noise meter and its application,” in

General Electric Rev. Vol. 36, pp. 201–205, 1933.• [2] H. F. Boss, “Development of a novel digital quasi-peak

detector for EMI-measurements,” in 14th International Zu-rich Symposium On Electromagnetic Compatibility, Zurich,

Switzerland, 20.–22.2.2001, pp. –, no. 68K5, 2001.• [3] M. Stecher, “Automated measurement of emissions from equipment

and systems,” in 2002 IEEE International Symposium On Electro-magnetic Compatibility Digest, August 19–23, Minneapolis, USA, pp. 593–598, 2002.

• [4] J. W. Cooley and J. W. Tukey, “An Algorithm for the Machine Cal-culation of Complex Fourier Series,” in Math. Computation, vol. 19, pp. 297–301, 1965.

• [5] A. V. Oppenheim and R. W. Schafer, Discrete–Time Signal Processing. ISBN 0-13-214107-8, Prentice-Hall, 1999.

• [6] S. Braun, M. Al-Qedra, and P. Russer, “A novel realtime time-domain emi measurement system based on field programmable gate arrays,” in

• 17th International Zurich Symposium on Electromagnetic Compatibility, Digest, (Singapore), pp. 501–504, Feb. 2006.

• [7] S. Braun and P. Russer, “Taking time-domain emi measurements according to international emc standards,” Compliance Engineering Journal, vol. XXIII 2006 Annual Reference Guide, pp. 45–54, March 2006.

• [8] S. Braun and P. Russer, “The dynamic range of a time-domain emi measurement system using several parallel analog to digital converters,” in 16th International Zurich Symposium on Electromagnetic Compat-ibility, February 13-18,Zürich, Switzerland, 2005.

• [9] S. Braun, P. Russer, “A fpga based time-domain emi measurement system for quasi-peak detection and disturbance analysis,” in German-Microwave Conference Gemic 2005, April 5-7, Ulm, Germany, 2005.

• [10] S. Braun, F. Krug, and P. Russer, “A novel multiresolution high-dynamic ultra-broadband time-domain emi measurement system,” in

Braun Deutschland


33

http://www.pn-com.de


http://www.AHSystems.com

IEEE MTT-S 2005 International Microwave Symposium, Long Beach, USA, 2005.

• [11] C. Keller, Schnelle EMV-Emissionsmessung im Zeitbereich. ISBN 3- 8322-3149-8, Shaker Verlag, 2004.

• [12] S. Braun, F. Krug, and P. Russer, “A novel automatic digital quasi-peak detector for a time domain measurement system,” in 2004 IEEE Inter-national Symposium On Electromagnetic Compatibility Digest, August 9–14, Santa Clara, USA, vol. 3, pp. 919–924, Aug. 2004.

• [13] F. Krug and P. Russer, “Ultra-fast broadband EMI time-domain mea-surement system,” in 2002 International Symposium On Electromagnetic Compatibility Digest, September 9–13, Sorrento, Italy, pp. 379–384, 2002.

• [14] M. Parvis, G. Perrone, and A. Vallan, “A precompliance EMC test-set based on a sampling oscillocope,” in 2002 IEEE Instrumentation and Measurement Technology Conference Proceeding, May 21–23, Anchor-age, USA, pp. 1197–1201, 2002.

• [15] G. Vogl and J.-C. Nickel, “EMV-Messung im Zeitraffer,” Elektronik Praxis, vol. 16, pp. 26 – 30, August 2002.

• [16] J.-C. Nickel, “EMV-Messung mit Nachbrenner: FFT für Abstrah-lungsmessungen,” in EMV 2004, Elektromagnetische Verträglichkeit, 12. Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, (Messe Düsseldorf), pp. 90 – 95, February 2004.

• [17] C. Keller and K. Feser, “Fast Emission Measurement In Time Do-main,” in 14th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 20.–22.2.2001, pp. –, no. 70K7, 2001.

• [18] C. Keller and K. Feser, “A New Method of Emission Measurement,” in 2002 IEEE International Symposium On Electromagnetic Compatibility Digest, August 19–23, Minneapolis, USA, pp. 599–604, 2002.

• [19] C. Keller and K. Feser, “Schnelle Emissionsmessung im Zeitbereich,” in 10. Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, Düsseldorf, Germany, 9.–11.4.2002, pp. 347–354, 2002.

• [20] C. Keller and K. Feser, “Improvements in the Fast Emission Mea-surement in Time Domain,” in 2002 International Symposium On Electromagnetic Compatibility Digest, September 9–13, Sorrento, Italy, pp. 397–402, 2002.

• [21] E. L. Bronaugh and J. D. M. Osburn, “New Ideas in EMC Instrumen-tation and Measurement,” in 10th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 1993, pp. 323–326, no. 58J1, 1993.

• [22] E. L. Bronaugh, “An Advanced Electromagnetic Interference Meter for the Twenty-First Century,” in 8th International Zurich Symposium On Electromagnetic Compatibility, Zurich, Switzerland, 1989, pp. 215–219, no. 42H5, 1989.

• [23] U. Reinhardt, K. Feser, and K. Feurer, “Vergleich von EMV-Messun-gen im Frequenz- und Zeitbereich anhand praktischer Beispiele aus der Fahrzeugtechnik,” in 5. Internationale Fachmesse und Kongress für Elek-tromagnetische Verträglichkeit, Düsseldorf, Germany, 20.–22.2.1996, pp. 729–738, 1996.

• [24] S. Braun and P. Russer, “A Low-Noise Multiresolution High-Dy-namic Ultra-Broad-Band Time-Domain EMI Measurement System,” IEEE Transactions on Microwave Theory and Techniques, vol. 53, pp. 3354–3363, Nov 2005.

• [25] F. J. Harris, “On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform,” in Proceeding of the IEEE, vol. 66, no.

1, pp. 51–83, 1978.• [26] J. Allen and L. Rabiner, “A unified approach to short-time Fourier analysis and synthesis,” in Proceedings of the

IEEE, vol. 65, pp. 1558–1564, 1977. • [27] C.-.-. E. 3, Specification for radio disturbance and immunity measuring apparatus and methods Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring apparatus. Interna-tional Electrotechnical Commission, 2010.• [28] CISPR16-1-1 Ed. 3 am. 1, Specification for radio disturbance and immunity measuring apparatus and methods Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring ap-paratus. International Electrotechnical Commission, 2010.• [29] CISPR 16-2-3-am1 ed3.0, Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-3: Methods of measurement of disturbances and immunity – Radiated disturbance measurements. International Electrotechnical Commission, 2010.• [30] CISPR 15 Consol. Ed. 7.1, Limits and methods of measure-ment of radio disturbance characteristics of electrical lighting and similar equipment . International Electrotechnical Commission, 2007.

STEPHAN BRAUN studierte Elektro- und Informationstechnik an der Technischen Universität München, und erhielt 2003 seinen Abschluss als Dipl.-Ing. Von 2003 bis 2007 arbeitete er als Wissen-schaftlicher Assistent am Lehrstuhl für Hochfrequenztechnik und erhielt 2007 den Titel des Dr.-Ing. Derzeit ist er Geschäftsführer der Firma GAUSS Instruments GmbH. Stephan Braun erhielt für seine Dissertation den E.ON Future Award. Seine wissen-schaftlichen Interessen umfasssen, EMV Emissionsmesstechnik, Hochfrequenzschaltungen, Signalverarbeitung sowie schnelle digitale Schaltkreise. Stephan Braun ist Mitglied beim VDE und IEEE. Er arbeitet im Gremium UK767.4 mit sowie bei CISPR/A WG1 und WG2.

NeueruNgeN iN der eMV eMiss ioNsMesstechNikDeutschland



http://www.emco-elektronik.de

http://www.ifi.com

EMV 2011 – Themen, Trends und Technologie in Stuttgart Energieeffizienz, alternative Energien, E-Mobility – dies sind nur einige der Themen, die die EMV-Industrie vor neue Herausforderungen stellt. Die Antworten der Branche finden Sie auf der EMV, Europas führender Messe mit Workshops für elektromagnetische Verträglichkeit.

Die Messe. Eine gelungene Arbeitsatmosphäre und gute Stimmung waren die Merkmale der EMV 2010. 3.425 Interessierte besuchten die Messe vom 9. bis 11. März 2010 in Düsseldorf. Die Mehrheit der Fachbesucher kam aus den Bereichen der Elektronik und Elektrotechnik und arbeitet in der Konstruktion und Entwick-lung. Mit 76% war der Anteil der an Unternehmensentschei-dungen beteiligten Besucher sehr hoch. Entsprechend hoch

war die Zufriedenheit der Aussteller mit der Qualität der Besucher. Mit einem Auslandsanteil von 50% der Aussteller bietet die EMV nicht nur ein breites, sondern auch ein internationales Angebotsspektrum. „Die EMV 2010 war zukunfts-orientiert und hatte eine professionelle Atmosphäre für Aussteller und Besucher. Für uns, TKD Electronic Europe, waren es drei erfolgreiche Tage mit hohem Kundenpotential,“ fasste Dietmar Rebl von TKD Electronic Europe seine Erfahrungen vor Ort zusammen. Gute Aussichten für die nächste EMV verspricht die Tatsache, dass sich direkt nach der Veranstaltung bereits 80% der Aussteller für eine Teilnahme an der EMV 2011 vom 15. bis 17. März in Stuttgart ausgesprochen haben. Mehr als 100 Aussteller werden wieder erwartet. Der Kongress. Mit 1.048 Buchungen hat der EMV Kongress 2010 seine Bedeutung für die Branche bestätigt. Das Programm bestand aus 92 Sessions, 12 Tutorials, 8 Workshops und einem Seminar des EMV Fördervereins NRW e.V. Mehr als 100 Referenten deckten Themen aus u.a. den Bereichen Mess- und Prüftechnik, Kraftfahrzeug-technik sowie EMV-Richtlinien und -Standardisierung ab. Auf der EMV 2011 stehen wieder 36 Halbtags-Workshops auf dem Programm. Diese Workshops vermitteln praxisorientiertes Fachwissen und sind eine hervorragende Weiterbildungsmöglichkeit. Die Auswahl und Zusammenstellung des Workshop-programms übernimmt ein Komitee, zusammen-gesetzt aus Experten der Branche, unter Vorsitz von Prof. Dr. Marco Leone von der Otto-von-Guericke Universität Magdeburg. Weitere Informationen: www.e-emv.com

Interview mit Prof. Dr.-Ing. Marco Leone

Herr Prof. Leone, was sind die Trend-Themen der EMV-Branche? Wie wird sich die Bedeutung der EMV in Zukunft entwickeln? Die EU-Staaten haben sich gemeinsam verpflichtet, ihren CO2-Ausstoß um 8% im Vergleich zu 1990 zu senken und bis 2020 will die EU den Treibhaus-

gasausstoß sogar um mindestens 20% reduzieren. Das gesetzte Ziel ist, den Anteil an erneuerbaren Energien bis 2020 auf 20% zu erhöhen. Somit gewinnen die Themen Solar- und Windenergie, Smart Grids und Elektromobilität an Bedeutung. Diese neuen Technologien werfen neue Fragestellungen hinsichtlich der EMV auf. Sie sind nicht nur rein technischer Natur, sondern haben auch Auswirkungen auf die Normung, z.B. was die Festlegung von Grenzwerten und die Wahl geeigneter Mess- und Analyseverfahren angeht. Insgesamt wird die Bedeutung der EMV angesichts immer komplexerer Systeme und zunehmender Integration weiter wachsen. Was macht die Arbeit im Komitee der EMV so interessant? Das Komitee setzt sich aus Angehörigen von Hochschulen, Industrie und Forschungseinrichtungen zusammen. Sie alle sind ausgewiesene Spezialisten auf den unterschiedlichen Gebieten der EMV. Neben dem Austausch untereinander ist es eine spannende Aufgabe alle Interessengebiete unter einen Hut zu bringen und die Veranstaltung auf die richtigen Trends auszurichten. Abschließend noch eine persönliche Frage: Was ist Ihr Steckenpferd im Bereich EMV? Es ist gerade die thematische Vielfalt, die dieses Fachgebiet so interessant macht und immer wieder neuartige Fragestellungen hervorbringt. Nichtsdestotrotz fußt alles auf dem sicheren Fundament der elektrotechnischen Grundlagen. Es ist daher keine Problemstellung – so komplex sie auch sein mag – nicht prinzipiell systematisch lösbar. Meine Arbeitsrichtung ist die physikalische Durchdringung von Störphänomenen, um so einfache und effektive Möglichkeiten der Ursachenbekämpfung identifizieren bzw. Optimierungen vornehmen zu können. Hier spielt die rechnerische Analyse und Simulation eine immer größere Rolle. Viele EMV-Probleme haben ihren Ursprung im elektronischen Schaltkreis. Daher widme ich mich seit vielen Jahren der EMV-Analyse auf Leiterplattenebene.

Sven KönigLanger EMV-Technik GmbH Bannewitz, Deutschland

einleitung

Mikrocontroller begleiten uns heute auf Schritt und Tritt. Ob in einem MP3-Player,

einem Mobiltelefon, in der Waschmas-chine oder in einem Auto - überall arbeiten die kleinen Controller und erleichtern uns das Leben.

Die Eigenschaften der in dieser Elektronik eingesetzten integrierten Schaltkreise (IC; engl. Integrated Cir-cuit) bestimmen in hohem Maße die EMV-Eigenschaften eines gesamten Gerätes. Bei Mikrocontrollern geht die Entwicklung der Siliziumstrukturen unter 100 nm. Aktuelle Chipsätze im PC-Segment weisen derzeit Strukturen von 45 nm und weniger auf.

Die damit verbundene Senkung der Betriebsspannungen und der Schaltschwellen erhöht die Empfind-lichkeit der Mikrocontroller gegenüber Störbeeinflussung teilweise um das 10-fache im Vergleich zu den Vorgän-germodellen. Der Logikpegel, die Schaltzeiten und damit der Störabstand wurden reduziert. Dadurch können die in den IC eingedrungenen Störimpulse mit einer Flankensteilheit kleiner einer Nanosekunde die Funktionen des IC beeinflussen.

Die immer höher werdende Inte-grationsdichte von Schaltkreisen in elektronischen Geräten treibt die Ent-wicklung und Verwendung von ICs im Ball Grid Array (BGA)-Gehäuse weiter

voran.Untersucht werden soll deshalb

ein aktueller 32-bit Mikrocontroller, welcher auf einem ARM® Cortex®-M3 Prozessor basiert. Dieser arbeitet mit CPU-Frequenzen bis 96 MHz und bietet neben einem Highspeed USB Controller alles was heutige Mikrocon-troller ausmacht. Angeboten wird der IC in unterschiedlichen Gehäusetypen. Von Interesse sind hier die Varianten des Controllers im 144 Pin Low Profile Quad Flat Package (LQFP) sowie im 144 Pin Low-Profile Fine-Pitch BGA (LFBGA)-Gehäuse.

Wie verhalten sich unterschiedliche Gehäusetypen der ICs hinsichtlich der Störfestigkeit (Teil 1) und der Störaussendung (Teil 2)? Ist ein IC im BGA-Gehäuse störfester als sein Pendant im QFP? Oder wird die Emp-findlichkeit hier gar erhöht? Welche Auswirkungen hat die Verwendung der teils wesentlich kleineren BGA-Typen auf die Störaussendung gegenüber eines QFP-Typs?

Ziel der StörfeStigKeitSprüfung von iCSDas Ziel ist es, die Prüfimpulse, wie sie bei den ESD- und Burstprüfun-gen für Geräte an den ICs auftreten, nachzubilden. Dies ermöglicht die Störfestigkeitsprüfung der einzelnen ICs, unabhängig vom Gerät oder der Baugruppe. Durch genauere Fehleranal-yse können die Schwachstellen der ICs erkannt werden. Daraus ist es möglich, in der Applikation gezielt Gegenmaß-nahmen zu ergreifen. Sind die EMV-

eMv auf iC-ebeneTeil 1: Pulsstörfestigkeit von IC mit unterschiedlichen Packages

66 InTErfErEnCE TECHnoLoGy EuroPE EMC GuIDE 2011

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English translation available


EMC at Chip Level: Assessment of IC Immunity to Pulse Disturbances

Eigenschaften eines IC bekannt, können diese während der Entwicklung beim Hersteller bzw. für den Einsatz beim An-wender berücksichtigt werden. Nur so lassen sich erhebliche wirtschaftliche Risiken in Grenzen halten und letztendlich eine sichere Funktion gewährleisten.

teStSYSteMe und BedingungenDie Festlegung der Prüfi mpulse für ICs erfolgt aus den

Prüfverfahren für Geräte. Die entsprechenden Prüfanor-dnungen erzeugen im Gerät elektrische und magnetische Störgrößen. Diese Störgrößen wirken auch lokal an der Schnittstelle zum IC-Gehäuse. Prüfgeneratoren für ICs müssen diese elektrischen und magnetischen Störungen allgemeingültig und reproduzierbar nachbilden. Abbildung 1 zeigt den prinzipiellen Verlauf einer Burst- oder ESD- Einkop-plung in ein Gerät. Der angelegte Prüfi mpuls uG(t) erzeugt einen durch die Baugruppe fl ießenden Stromimpuls i(t). Im Gerät entsteht ein Spannungsabfall ∆u(t). Aus der Spannung ∆u(t) entstehen elektrische Pulsfelder E(t). Aus dem Strom i(t) entsteht das Pulsmagnetfeld H(t). Diese Pulsfelder wirken indirekt über die von außen angeschlossenen Leiterzüge auf den IC oder direkt auf das IC-Gehäuse.

Das Magnetfeld induziert Störspannung in bestehende Leiterschleifen. Über das elektrische Feld gelangt Verschiebe-strom direkt in die Leiterzüge. Der resultierende Störstrom fl ießt über die angeschlossenen Leitungen in die IC-internen Strukturen und beeinfl usst die Funktion des ICs.

Bei der direkten Störbeeinfl ussung des ICs spielen die elektrischen und magnetischen Felder von sehr schnellen Vorgängen (z.B. der ESD-Kontaktentladung) eine besondere Rolle. Durch den internen konstruktiven Aufbau des ICs (Pin – Bonddraht – Lidframe – Chip...) entstehen Schleifen, die vom Störmagnetfeld durchsetzt und in denen Störspan-nungen induziert werden. Auf Grund der Bauhöhe des ICs sind seine internen Strukturen einer höheren Feldbelastung ausgesetzt als z.B. Leitungen auf der Leiterplatte. Die E- und H-Felder können auch direkt vom Testgenerator ausgehen und zur Beeinfl ussung führen.

Um die Störbeeinfl ussungen, wie sie am IC bei der ESD- bzw. Burstprüfung für Geräte auftreten, nachzubilden, ent-wickelte die Firma Langer EMV-Technik GmbH das IC-Test-system. Mit diesem System ist es möglich, unter defi nierten Bedingungen und mit reproduzierbaren Ergebnissen, die Störfestigkeit von ICs zu testen. Für die leitungsgebundene Störbeeinfl ussung stehen die Generatoren (Probes) der Serie P200/P300 zur Verfügung. Mit den Probes P200 werden nie-derohmige Pins, wie z.B. die Versorgungsleitungen, getestet. Für hochohmige Eingangs- und Ausgangsports werden die Probes P300 verwendet. Diese Generatoren unterscheiden sich in ihrer Störcharakteristik.

Als Pulsfeldquelle dient die Probe P1200 zur Einkopplung von Störmagnetfeld in den IC oder die P1300 zur Beaufschla-gung mit elektrischen Feld.

In Abbildung 2 ist der Aufbau zur direkten Störeinkop-plung in den LFBGA-Baustein zu sehen. Der IC ist auf eine dafür angefertigte IC-Adapterleiterkarte aufgebracht und die Balls werden zu den jeweiligen Einkoppelpads auf der gegenüberliegenden Seite durchkontaktiert. In diese Einkop-pelpads können die Störgrößen mit den Probes der Serien P200/P300 direkt in die Balls des BGAs injiziert werden.

Der Chip arbeitet mit seiner vom Hersteller festgeleg-

ten externen Beschaltung. Zusätzlich sind Filterelemente in Versorgungs- und Signalleitungen vorgesehen, um das Abfl ießen des Störimpulses zu verhindern und so defi nierte Bedingungen herzustellen. Die Adapterleiterkarten inklusive des ICs werden in eine Ground-Plane eingelegt und sind einfach austauschbar.

Die Einkopplung in die Pins des LQFP gestaltet sich dage-gen einfacher, da diese direkt mit der Probe erreichbar sind.

Der gleiche Aufbau wird auch zur Puls-Feldeinkopplung

interferencetechnology.eu InTErfErEnCE TECHnoLoGy 67

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Abbildung 1. Entstehung der physikalische Störgrößen im Gerät

Abbildung 2. Aufbau zur leitungsgebundene Störpulseinkopplung

Abbildung 3. Schematischer Aufbau zur E-Puls-Feldeinkopplung

benutzt (siehe z.B. Abbildung 3). Dies ermöglicht eine kostengünstige und schnelle Prüfung der ICs auf ihre lei-tungs- sowie feldgebundene Störfestigkeit.

ergeBniSSeDer bereits erwähnte 32-bit Mikrocontroller im LFBGA- und LQFP-Gehäuse wurde hinsichtlich seiner leitungs- und feldgebundenen Störfestigkeit untersucht.

In Tabelle 1 sind die Ergebnisse einiger ausgewählter Pins sowie die Empfi ndlichkeiten des Controllers auf elek-trisches und magnetisches Feld in beiden Gehäuseformen zum Vergleich aufgeführt.

Es zeigten sich nur geringe Unterschiede zwischen den Gehäusetypen bei der leitungsgebundenen Störpulseinkop-plung auf die Pins (oberer Teil in Tabelle 1). Beide Controller reagierten bei denselben Störpegeln mit den identischen Fehlersymptomen. Bei genauerer Betrachtung der Ergebnisse wird man aber feststellen, dass die Fehlerschwellen beim Controller im LQFP-Gehäuse gleich oder z.T. geringfügig höher liegen als beim BGA. Das kann daran liegen, dass die Impedanz der wesentlich längeren Bonddrähte im LQFP-Gehäuse die leitungsgebundenen Störungen bedämpft.

Erhebliche Unterschiede sind jedoch bei verschiedenen Pins desselben Controllers festzustellen. Die Core-Versor-gung (VDDCORE) ist im Gegensatz zur Versorgung der GPIO-Ports (VDDIO) sehr empfindlich und muss vom Anwender im Layout kritischer betrachtet werden. Auch die Oszillatorpins XIN und XOUT unterscheiden sich in ihrer

Störfestigkeit erheblich.Die in Tabelle 1 dargestellten Fehlerarten reichen dabei

von einfachen Datenfehlern, über eine Resetauslösung bis hin zu Hardwarefehlern, bei denen der Controller einfach stehen bleibt. Bei hohen Störpegeln kommt es teilweise auch zu irreversiblen Fehlern wie ein Latch Up oder dem Defekt der internen Oszillatorschaltung. Bestimmte Regionen des Controllers reagieren empfi ndlicher. Eine Ursache kann der in dieser Region liegende Kern des Controllers mit seiner Peripherie sein.

Maßnahmen, die vom Anwender getroff en werden müs-sen, um die Störfestigkeit der Geräte sicherzustellen, sind individuell abhängig von Aufbau und Funktion des gesamten Gerätes.

Empfi ndliche Leitungen müssen z.B. zwischen GND-La-gen eingeschlossen sein, um elektrisches oder magnetisches Feld abzublocken. Des weiteren können diese Leitungen zusätzlich über Filterelemente geschützt werden. Die Ab-blockkondensatoren nahe am Versorgungspin verringern die Schleifengröße, in die eventuell Störspannungen induziert werden können.

Wesentliche Unterschiede gibt es auch bei der Störfestig-keitsmessung der ICs auf Pulsfelder im Abstand von 3 mm (unterer Teil in Tabelle 1). Hier ist die größere Fläche des LQFP, und damit die größeren Schleifen und Koppelfl ächen im Inneren des Gehäuses, von Nachteil. Der IC im LFBGA zeigte bei der Einkopplung von elektrischem Feld erst bei ho-hen Spannungen eine Beeinfl ussung. Bei dem LQFP-Gehäuse

EMV AUF iC -EBEnEdeutschland

68 InTErfErEnCE TECHnoLoGy EuroPE EMC GuIDE 2011

Tabelle 1. Störfestigkeit des Mikrocontrollers im LFBGA- und LQFP-Gehäuse

ESR/EMI_2010-08-10

EMC Consulting and Testing EMC Certification EMC Components EMC Calibration EMC Seminars

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sind die ersten Fehler bei 5,1 kV feststellbar. Gegenüber ESD-Magnetfeldern ist der LQFP ebenso der empfindlichere Controller. Hier macht sich zudem eine Richtungsänderung des magnetischen Feldes deutlich im Test bemerkbar. In der Ursprungsrichtung 0° traten die ersten Fehler bei ein-gestellten 4,4 kV ein. Dreht man die Sonde um 90°, lässt sich der Controller auch von den maximal 9,5 kV nicht in seiner Funktion stören.

Diese Erkenntnisse zum Verhalten des ICs auf Pulsfeld-beeinflussungen sind für die Platzierung des Schaltkreises auf der Leiterplatte bzw. der Baugruppe entscheidend. E-Feld empfindliche ICs sollten nicht in Bereichen mit hoher Feld-stärke wie z.B. nahe eines nicht mit Ground verbundenen Metallgehäuses angeordnet werden. Eine weitere Möglichkeit wäre das Schirmen des IC gegen die Feldeinkopplung. Ein mit Ground verbundenes Bauelement wie z.B. ein Elektrolyt-kondensator in der Nähe der ICs kann als Schutzmaßnahme schon Helfen.

Der getestete Controller im LQFP-Gehäuse würde durch ein stromtragendes Metallteil in seiner Ursprungsrichtung einen Fehler bei Plusmagnetfeldbeeinflussung auslösen. Die Drehung des ICs um 90° auf der Leiterplatte könnte das Problem vollständig lösen.

Des weiteren sollten diese Bauelemente nicht am Rand der Leiterplatte angeordnet werden, da hier erfahrungsgemäß die Stärke des elektrischen oder magnetischen Feldes und damit

die Störbeeinflussung am Größten ist.

ZuSaMMenfaSSungDie vorliegenden Messergebnisse zur Störfestigkeit eines

aktuellen Mikrocontrollers zeigen, dass die Gehäuseart nur einen geringen Einfluss auf die leitungsgebundene Störfes-tigkeit hat. Der Mikrocontroller im LQFP zeigte höhere Empfindlichkeiten auf ESD-H- sowie ESD-E-Felder. Es kann also bedenkenlos auf Mikrocontroller im BGA-Gehäuse zugegriffen werden.

Um die ICs störfester zu entwickeln, muss bei den IC-Herstellern das entsprechende Know-how vorhanden sein. Die Erkenntnisse aus den Messungen mit dem Testsystem der Firma Langer EMV-Technik GmbH können in die IC-Ent-wicklung einbezogen werden. Elektronikentwickler können diese Erkenntnisse für die EMV-gerechte Layoutgestaltung ihrer Baugruppen verwenden.

Die Firma Langer EMV-Technik GmbH bietet die entspre-chenden Testmittel mit denen die EMV-Eigenschaften von ICs evaluiert werden können.

SVEN KÖNIG is responsible for the tests and measurement equipment for electronic semiconductors at Langer EMV-Technik GmbH in Ban-newitz. König was born in Dresden and studied electrical engineering at the “Studienakademie” in Bautzen. He has been an engineer at the Langer EMV-Technik GmbH since 2007.


EMP/TempestPower Line Filters

Konig deutschland

interferencetechnology.eu InTErfErEnCE TECHnoLoGy 69


http://www.emcc.de


S. Klein, J. MooSerMooser EMC Technik GmbH Ludwigsburg, Deutschland

PrüfStandStechniK für die ZuKunftHybrid-, Elektro- und Brennstoffzel-lenantriebe im Automobil erfordern für die Gewährleistung der elektro-magnetischen Verträglichkeit neue Testeinrichtungen. Die Mooser EMC Technik GmbH in Ludwigsburg hat dafür das zurzeit wohl modernste und leistungsfähigste EMV-Prüfzentrum in Betrieb genommen. Es erfüllt alle derzeitigen und in den nächsten Jahren zu erwartenden Anforderungen.

Durch den hohen Zeit- und Kos-

tendruck in der Automobilindustrie ist es üblich, die EMV-Erprobung nicht erst im Auto durchzuführen, sondern möglichst früh auf Kompo-nentenebene. Das gilt auch für die neue Hochvolttechnologie bei Hybrid-, Elek-tro- und Brennstoffzellenantrieben, wo Versorgungsspannungen von meh-reren hundert Volt, Ströme von einigen hundert Ampere und Elektromotoren mit Leistungen von 50 Kilowatt und mehr keine Seltenheit sind.

Mit einem Testbereich von bis zu 1000 Volt, 300 Ampere und 100 Kilowatt Leistung der Hochvolt-versorgung und des Bremsmotors bietet das Prüfzentrum von Mooser optimale Voraussetzungen für EMV-Tests von Wechselrichtern, Motoren,

neue eMV-testeinrichtung für hybrid-, elektro- und Brennstoffzellenantriebe:

0 – 1000 V, ± 300 a, 100 kW

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70 inTErfErEnCE TECHnoLoGy EuropE EMC GuiDE 2011

deutschland


at www.interferencetechnology.com

New EMC Test System for Hybrid, Electric and Fuel Cell Drives: 0 – 1000 V, ± 300 A, 100 kW

Abbildung 1. Prinzipaufbau der neuen Absorberkabine

emv GmbHElektronische Meßgeräte Vertriebs GmbH

Wallbergstraße 7 82024 TaufkirchenTel: +49 89 614171-0

Fax: +49 89 [email protected] www.emvgmbh.de

EMV- und HF-Messtechnik HF- und Mikrowellenverstärker Programmierbare AC-/DC-Quellen Antennen-Messsysteme Halbleitertester (ESD und Latch-Up) Schlüsselfertige Komplettsysteme Technischer Service

Durchdachte Lösungen für Messtechnik & Systeme

Hochvoltbatterien und Gesamtsystemen. Herkömmliche EMV-Messkabinen mit einer Auslegung nur auf 12- und 24-Volt-Bordnetze eignen sich nicht dafür. Da der Umgang mit so hohen Spannungen und Strömen – zumindest am Anfang – etwas gewöhnungsbedürftig ist, sind die Einrich-tungen entsprechend abgesichert und das Personal wurde extra geschult.

GeKoPPelt und doch entKoPPeltUm die Wechselrichter, Motoren, Hochvoltbatterien und Gesamtsysteme unter realen Bedingungen prüfen zu kön-nen, sind neben der externen Stromversorgung (eine Bat-terienachbildung mit der Möglichkeit der Rückspeisung von elektrischer Energie), ein Motorprüfstand in der Kabine und ein externer Motor erforderlich. Der externe Motor dient im Fahrbetrieb als Bremse und im Bremsbetrieb (Rekuperationsphase) als Antrieb für den Prüfling. Die Aufspannvorrichtung für den Prüfling ist bewusst uni-versell ausgelegt. Zudem ist für die Prüflinge eine externe Flüssigkeits-Kühlanlage vorhanden. Für Tests, bei denen noch kein Elektromotor zur Verfügung steht, besteht die Möglichkeit, einen Wechselrichter mit einer Lastnachbil-

dung zu prüfen.Im Bild ist auch eine geschirmte HV-LISN zu erkennen.(Aus Gründen der Geheimhaltung sind die Prüflinge im

Bild verfremdet.)Eine wichtige Anforderung ist die mechanische Koppe-

lung beider Motoren, ohne dadurch die Schirmwirkung der EMV-Kabine zu beeinträchtigen. Dazu müssen die Motoren aber schwingungstechnisch gedämpft und voneinander ent-koppelt sein, was durch zwei getrennte Motorfundamente mit einigen Tonnen Gesamtgewicht gewährleistet wird.

Die Absorberkabine mit den speziellen Hochvoltfiltern und den Hochvoltdurchführungen hat Albatross Projects konstruiert. Ebenso die mechanische Durchführung von Motor 2 (Prüfling) zu Motor 1 (Brems- und Antriebsmas-chine). Die Anforderungen an diese Durchführung waren Neuland. Bei einer Drehzahl von einigen tausend Um-drehungen pro Minute und einem Drehmoment von bis zu 300 Newtonmeter ist eine Schirmwirkung der Kabine von ≥ 100 dB angeraten. Dank des Filterkonzepts und der speziellen Durchführung für den Motorantrieb wird auch ein Eindringen der Wellenströme des externen Motors in die Kabine verhindert.

KoMPlett aBGeSchirMtUm den ungestörten Radio- und Funkemp-fang im Fahrzeug zu gewährleisten, müssen die Komponenten bestimmte Grenzwerte einhalten. Bei den Elektroantrieben wird aus einer hohen Gleichspannung durch Zerhacken eine 3-Phasen-Wechselspannung mit variabler Frequenz erzeugt. Dadurch ent-stehen sehr hohe und breite hochfrequente Störspektren. Allein durch die wesentlich höheren Spannungen sind die Störungen in der Größenordnung Faktor 50 (34dB) höher als bei herkömmlicher Kraftfahrzeug-Elek-tronik. Der komplette Hochvoltbereich (High Voltage-Bereich, HV), einschließlich der Steckverbinder, ist deshalb geschirmt. Das geschlossene Schirmkonzept ist eine Grund-voraussetzung bei den EMV-Messungen und hat weitere Sonderentwicklungen zur Folge, etwa Impedanzanpassungen der HV-Gleichspannungs-Versorgungsleitungen.

Zwischen dem Elektroantrieb (HV-


Neue eMV-TesTe iNrichTuNgdeutschland

Abbildung 2. Testaufbau in der neuen AbsorberkabineIm Bild ist auch eine geschirmte HV-LISN zu erkennen.(Aus Gründen der Geheimhaltung sind die Prüflinge im Bild verfremdet.)

Abbildung 3. Leerfeld in der Kabine mit drehendem externen Motor. In das Messdiagramm sind die Grenzwertkurven 5 für Peak und Average-Bewertung nach CISPR 25 eingezeichnet.

EEEMMMVVV SSSoooffftttwwwaaarrreee,,, vvviiieeelllssseeeiiitttiiiggg,,, fffllleeexxxiiibbbeeelll uuunnnddd wwwiiirrrtttsssccchhhaaaffftttllliiiccchhh,,, sssooowwwooohhhlll fffüüürrr kkkllleeeiiinnneee UUUnnnttteeerrrnnneeehhhmmmeeennn aaalllsss aaauuuccchhh fffüüürrr iiinnnttteeerrrnnnaaatttiiiooonnnaaallleee KKKooonnnzzzeeerrrnnneee...

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Bereich) und dem 12-Volt-Bordnetz (Low-Voltage-Bereich, LV) gibt es zahlreiche funktionale Verbindungen, weshalb beide Bereiche durch Schirme und Filter ebenfalls konse-quent getrennt sein müssen. Diese Trennung ist ebenfalls Teil der EMV-Prüfungen. Bei den Prüfungen ist deshalb das Gesamtsystem aufgebaut, bestehend aus HV- und LV-Komponenten.

Bitte Keine StörunG!Die Rahmenbedingungen bei Störaussendungsmessungen nach CISPR 25 gelten analog auch für die Messverfahren der Störfestigkeit. In den ISO-Normen 11452 sind die Basis-Messverfahren für die Störfestigkeit an Kfz-Komponenten beschrieben. Die geforderte Störfestigkeit liegt meistens zwischen 100 und 300 Volt pro Meter, in einigen Fällen auch

bei 600 Volt pro Meter.In den internationalen

Normen CISPR 25 (Co-mité International Spé-cia l des Perturbations Radioélectr iques) und den ISO-Normen 11452 sind auch die prinzipiel-len Messauf bauten für Komponententests von herkömmlicher Automo-bil-Elektronik beschrieben. Die Messeinrichtungen des EMV-Prüfzentrums erfül-len selbstverständlich auch diese Anforderungen. Bei der Halterung für die Elek-tromotoren handelt es sich um eine massive Stahlkon-struktion auf einem Mas-chinenbett mit mehreren Tonnen Gewicht. Die Kon-struktion ist so gelöst, dass sie die Messergebnisse nur unwesentlich beeinflusst.

Mit enerGie VerSorGtDie Energieversorgung für die Prüflinge ist ein er probtes u nd le icht modifiziertes System des Pr ü f tech n i ka nbieters Kratzer Automation aus München. Die Eckdaten sind eine variable Span-nung von Null bis 1000 Volt, Ströme von Null bis 300 Ampere und ein Elek-tromotor mit 100 Kilo-watt Leistung. Die Anlage versorgt die Prüflinge mit Energie und kann während der Rekuperationsphase die zurückgespeiste En-ergie aufnehmen. Auch

schnelle Lastsprünge sind möglich. Die Energieversorgung, der externe Steuerrechner und die Prüfsoftware von Kratzer Automation bilden mit dem externen 100 Kilowatt-Motor und dessen Steuerung von ABB einen kompletten Motor-prüfstand in einer EMV-Kabine. Über die Schnittstellen zum Steuerrechner können die Ingenieure die Testpro-gramme auf dem EMV-Prüfstand abfahren.

Parallel zu der Absorberkabine hat Mooser einen Prüfstand für elektrische Tests an Hochvoltkomponenten aufgebaut. Auf diesem Prüfstand wird bei HV-Geräten die Störfestigkeit gegen Restwechselspannungen, Dips und Drops und andere Eventualitäten geprüft. Diese Tests sind auch in einem 1000-Liter-Temperaturschrank mit einem Temperaturbereich von -45 bis +185 Grad Celsius durchführbar.

Neue eMV-TesTe iNrichTuNgdeutschland


Abbildung 4. Störabstrahlung nach CISPR 25 mit einem Referenzstrahler. Grün: Referenzkurve vergleichbare Absorberhalle

Abbildung 5. Störfestigkeitskurven nach ISO 11452-2. Benötigte Ansteuerleistung für 50 V/m im Referenzpunkt. Grün: Referenzkurve vergleichbare Absorberhalle. Rot: Messkurve der Absorberhalle für HV-Komponenten und E-Antriebe.

Teseq GmbH Berlin DeutschlandT + 49 30 5659 8835 www.teseq.de

WÄHLEN SIE FÜR EMV-TESTS DIE A-KLASSE –DIE CBA-SERIE DER TESEQ- LEISTUNGSVERSTÄRKER!

Die CBA-Serie von Teseq umfasst die komplette Palette Halbleiter-Powerverstärker der Klasse A. Diese sind punkto Frequenz und Leistung speziell auf EMV-Störfestigkeits-tests zugeschnitten. Mit ihrer robusten und zuverlässigen Art garantiert die Serie jeder-zeit zuverlässigen Einsatz. Und dies verblüffend günstig! Auch in Zukunft hat Teseq die Nase vorn. Als weltweiter Leader halten wir unser Verstärkerportfolio konsequent auf dem neusten Stand der Frequenz- und Leistungsanforderungen.

Leistungsverstärker der Klasse A in Halbleiter-Ausführung

Speziell für EMV-Anwendungen (Kurzschluss- bzw. Leerlauftest)

Modelle ab 10 kHz und bis zu 6 GHz

3 Jahre Herstellergarantie

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faZitMit dem neuen EMV-Prüfzentrum für Hybrid-, Elektro- und Brennstoff zellenantriebe dürfte die Mooser EMC Technik GmbH die zurzeit wohl modernste und leistungsfähigste Anlage dieser Art betreiben. Durch ihre zukunftsweisende Konzeption erfüllt sie alle derzeitigen und in den nächsten Jahren zu erwart-

ende Anforderungen an ein EMV-Prüfzentrum für Hochvoltanwendungen. Die aus den EMV-Tests von Wechselrichtern, Motoren, Hochvoltbatterien und Gesamtsystemen gewonnenen Erkenntnisse fl ießen nicht nur in die Entwicklungsprojekte der Kunden ein, sondern werden auch für die Weiterentwicklung der nationalen und internationalen Normenarbeit verwendet.

S. Klein is an EMC engineer at Mooser EMC Technik GmbH.J. Mooser is manag-

ing director of Mooser EMC Technik GmbH and Mooser Consult-ing GmbH. He has worked with a focus on EMC for more than 30 years, especially for the automotive industry. Mooser is a member of several national and international EMC standardization com-

mittees in the au-tomotive industry.

MOOser deutschland

interferencetechnology.eu inTErfErEnCE TECHnoLoGy 75

Abbildung 6. Energieversorgung 0 – 1000 V, +- 300 A, 100 kW

Abbildung 7. Elektrische Tests wie Dips, Drops, Restwechselspannung an HV-Komponente unter Temperaturbedingungen

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FRANCE

ARTICLES

78 PRODUITS ET SERVICES

80 RESSOURCES

82 Conception Assistée par Mesure Champ Proche

Approche industrielle et innovante des mesures champs proches dans le processus de conception et de modélisation des émissions rayonnées

SÉBASTIEN SERPAUD, LOIC ARNAL, DAVID BAUDRY, BLAISE RAVELO, NEXIO

92 ElectroMagnetic Attacks Case Studies on Non-Protected and Protected Cryptographic Hardware Accelerators

LAURENT SAUVAGE, OLIVIER MEYNARD, SYLVAIN GUILLEY, JEAN-LUC DANGER, INSTITUT TELECOM, TELECOM PARISTECH

ment de contrôle, Contrôles

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NEXIO46 Avenue du General de Croutte, Toulous, 31100 France; +33 561 440 247; Fax: +33 561 440 567; www.nexio-online.com; Frederic Amoros, President, [email protected] et services: Instrument de contrôle, Divers

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PranaZ.I. La Marquisie, Avenue du 4 Juillet 1776-B.P.24, Brive Cedex 19101 France; Fax: 33 555 86 4930, 33 5 55 86 4932; www.prana-rd.com; Dennis Dumont , [email protected] Produits et services: Amplifi cateurs

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Teseq Holding AGTeseq Sarl, 50, route de Pontoise, 95870 Bezons / France; +33 1 39 47 42 21; Fax: +33 1 39 47 40 92; www.teseq.fr; [email protected] et services: Amplifi cateurs, Antennes, Instrument de contrôle, Con-trôles, Divers

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AA Opto-ElectronicAA sa, 18, rue Nicolas Appert, F-91898, Orsay Cedex, France, +33 (0)1 76 91 50 12, Fax: +33 (0)1 76 91 50 31, http://opto.braggcell.com, [email protected] et services: Filtres, Instru-ment de contrôle

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AH Systems Inc.AR FRANCE, Gennevilliers, France; 33 1 47 91 75 30; Fax: 33 1 47 91 75 35; [email protected]; www.AHSystems.comProduits et services : Antennes, Instru-ment de contrôle, Contrôles

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AR France7 rue du Fosse Blanc, Bat D1, Gennevil-liers, France 92230; +33-1-47-91-75-30; Fax: +33-1-47-91-75-35; Bernard Bessot, [email protected]; www.arfrance.eu, Produits et services: Amplifi cateurs , Antennes ,Câbles et connexions, Espaces sous protection et clôtures,Hausse et éléments temporaires, Instrument de contrôle

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CST / SimLab Software GmbHLe Segala Pradines, F-46090D-8 FRANCE, Fax : 3 3-565-5 3999022 , 3 3-565-5 32 22 3, 33-672700156, www.cst.com, [email protected], [email protected], Klaus SchrackProduits et services: Instrument de contrôle, Contrôles , Divers

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EM Test FranceLe Trident - Parc des Collines, 36, Rue Paul Cézanne, 68200 Mulhouse, France; +33 (0)3 89 31 23 50; Fax: +33 (0)3 89 31 23 55; [email protected]; www.emtest.frProducts and Services: Hausse et élé-ments temporaires, Instrument de contrôle, Contrôles

EMC Partner France Monsieur Pascal Poiret, 2 Chemin des Hauts D’Ayras FR - 19360 Cosnac France; +33 5 55 74 31 68; Fax: +33 5 55 87 47 69; [email protected]; www.emc-partner.fr Produits et services : Hausse et éléments temporaires, Instrument de contrôle

EMI TECH3, rue des Coudriers - CAP 78, ZA de l’Observatoire, Montigny le Bretonneux 78180 France, Fax: 33 1 30 57 8640, 33 1 30 57 5555; Mathieul Cognet, CEO,[email protected]; www.emitech.fr Produits et services: Contrôles

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Haefely EMC DivisionEURO-SYSTEM, 31 Chemin du Moulin des Loups, F - 01000 Bourg en Bresse, France; +33 4 74 22 09 48; Fax: +33 4 74 22 09 78; Jean-Michel Clerc, [email protected]; www.euro-system.infoProduits et services : Hausse et éléments temporaires, Instrument de contrôlen

I

IFI - Instruments for IndustryEMC PARTNER France, 2 Chemin des hauts d’Ayras, 19360 COSNAC - France; +33(0)5 55 74 31 68; Fax: +33(0)5 55 74 31 68; Pascal Poiret, [email protected]; www.emc-partner.frProduits et services: Amplifi cateurs, Antennes, Filtres, Amplifi cateurs, Instru-


FRANCE | Produits et Services

ar europe

Autres divisions ar : • modular rf • receiver systemsNational Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

Tous droits réservés © 2010 AR. La bande orange sur les produits AR est enregistrée au US Patent & Trademark Office

Nos nouveaux amplificateurs reconfigurés de la Série « A » sont tellement puissants et tellement efficaces que nous pouvonsles rendre 25% à 50% plus petits tout en conservant la même puissance de sortie. Ils sont maintenant plus légers, plus portables, ettiennent facilement dans une salle de commande, ce qui se traduit par un très bon rapport qualité /prix pour vous. Et pourtant, ilsproduisent toujours 500, 1 000 et 2 500 watts de puissance, et même plus, selon le modèle que vous choisissez.

Nous nous sommes également plus étendus. Nos amplificateurs de Série « A » couvrent maintenant la gamme desfréquences entre 10 kHz et 250 kHz.

Ce qui vous permet de faire des essais en fonction de pratiquement n’importe quelle norme. Ils bénéficient de la technologie TEC de pointe, et peuvent être contrôlés à distance avec des interfaces IEEE, RS-232, USB

et autres interfaces Ethernet. En plus de toutes ces caractéristiques innovatrices, nos amplificateurs de Série « A » consommentmoins d’énergie, ce qui est un avantage pour vous et pour l’environnement. Notre nouvelle série « A » est également équipéed’une technologie de refroidissement améliorée.

À 40 ans, AR dépasse encore les attentes en matière de qualité, de valeur, de technologie, de savoir-faire et de service après vente.

Ce qui fait de ces nouveaux amplificateurs de Série « A » une évidence.

En France, contactez AR France, [email protected] ou appelez le +33-1-47-91-75-30

Notre nouvelle Série « A » consomme moins d’énergie, produit plus de puissance, est plus légère, plus petite, et fournit un meilleur rapport prix / performance.

On aurait peut-être dû l’appeler la série « A+ ».

CertifiéISO 9001:2008



AssociAtions

AssociAtion FrAnçAise de lA compAtibilitÉ electromAGnÉtiQUe (AFcem) Pour la promotion et le développement de la Compatibilité Elec-troMagnétique Association régie par la loi du 1er juillet 190128, route de Marolles - 94 440 Santeny; 01 43 86 13 96; Fax: 01 43 86 09 40; [email protected]; www.afcem.org/index.asp

ieee emc societY cHApter FrAnceAndré Berthon, Admittance, 11 rue Bertron, F-92330 Sceaux, France; +331 43345231; [email protected]

notiFied bodies

Aemc lAb19 rue françois Blumet, ZI de l’Argentière, F38360, Sassenage,

France; 33 4 76 27 83 83; Fax: 33 4 76 27 77 00; [email protected] Body number : 1900

AseFA33 avenue du Général Leclerc, 92260 Fontenay-aux-Roses, France; +33 1 40 95 63 34; Fax: +33 1 40 95 88 18; [email protected] Body number : 1969

AseFA - plAte Forme F 03 - scHneider electric in-dUstries37 quai Paul Louis Merlin, 38050 Grenoble cedex 9, France ; +33 4 76 39 85 51; Fax: +33 4 76 57 99 38; www.schneider-electric.com; [email protected] Notified Body number : 1970

AseFA - plAte Forme n 01 - Alstom trAnsport23-25 avenue Morane Saulnier, 92364 Meudon-la-Forêt cedex, France; +33 1 46 29 15 03; Fax: +33 1 46 29 12 74; [email protected]; www.alstom.transport.comNotified Body number : 1971

AseFA - plAte Forme p 01 - leGrAnd128 avenue du Maréchal de Lattre de Tassigny, F87045 Limoges cedex, France; +33 5 55 06 87 87; Fax: +33 5 55 06 88 88; [email protected] Body number : 1903

centre tecHniQUe des indUstries mecA-niQUes52 avenue Felix Louat - BP 80067, F60304 SENLIS CE-DEX, France; +33 3 44 67 30 00; Fax: +33 3 44 67 34 00; [email protected]; www.cetim.frNotified Body number: 0526

emitecH AtlAntiQUeRue de la Claie 15, ZI Angers-Beaucouzé, 49070 BEAUCOUZE, France; +33-2.41.73.26.27; Fax: +33-2.41.73.26.40; [email protected]; www.emitech.frNotified Body number: 0726

emitecH - cHAssieU7, rue Georges Méliès, F 69680 CHASSIEU, France; 33 4 78 40 66 55; Fax: 33 4 72 47 00 39; [email protected]; www.emitech.frNotified Body number: 0573

emitecH GrAnd sUdRue du Massacan 145, ZI Vallée du Salaison, BP 25, 34741 VENDARGUES CEDEX, France; +33-4.67.87.11.02; Fax: +33-4.67.70.94.55; [email protected]; www.emitech.fr






Fair-Rite Products Corp.Your Signal Solution!PO Box 288, One Commercial Row, Wallkill, NY 12589-0288 www.fair-rite.com | [email protected](888) FAIRRITE (324-7748) or (845) 895-2055 | Fax (845) 895-2629



FRANCE Ressources

Notified Body number: 0725

emitecH ile de FrAnceZ.A. de l’Observatoire 3 rue des Coudriers, 78180 MONTIGNY LE BRETONNEUX, France; +33 1 30 57 55 55; Fax: +33 1 30 43 74 48; [email protected]; www.emitech.frNotified Body number: 0536

emitecH - le rHeU2 allée du Chêne Vert F35650 le Rheu, Le Rheu, France; 33 2 99 14 59 14; 33 2 99 14 64 54; [email protected]; www.emitech.frNotified Body number: 1899

eUrocem364, rue Armand Japy Technoland, 25460 Etupes, France; +33 3 81 90 75 90; Fax: +33 3 81 32 36 28; [email protected]; www.eurocem.frNotified Body number: 1120Directive: 2004/108/EC Electromagnetic compatibilityGYL TechnologiesParc d’activités de Lanserre 21 rue de la Fuye F49610 Juigne sur Loire, Juigne sur loire, France; 33 2 41 57 57 40; Fax: 33 2 41 45 25 77; [email protected] Body number: 1896

GroUpe d’etUdes et de recHercHes AppliQUÉes à lA compAtibilitÉ105 avenue du Général Eisenhower BP 23705 F 31037 Toulouse cedex 01, Toulouse, France, 33 5 61 19 46 50; Fax: 33 5 61 19 46 68; [email protected] Body number: 1898

institUt nAtionAl de l’enVironnement indUstriel et des risQUesParc Technologique Alata BP 2 , F 6 055 0 Ver-neuil-en-Halatte, France; +33.3.44.55.66.77; Fax: +33.3.44.55.66.99; [email protected]; www.ineris.frNotified Body number: 0080

lAborAtoire centrAl des indUstries elec-triQUes33 avenue du Général Leclerc BP 8, F92266 Fontenay-aux-Roses cedex, France; +33 1 40 95 60 60; Fax: +33 1 40 95 54 07; [email protected]; www.lcie.frNotified Body number: 0081

lAborAtoire nAtionAl de mÉtroloGie et d’essAis 1, rue Gaston Boissier, 75724 PARIS CEDEX 15, France; +33 1 40 43 37 00; Fax: +33 1 40 43 37 37; [email protected]; www.lne.fr Notified Body number: 0071

lAborAtoire centrAl des indUstries elec-triQUes - etAbissement sUd-estZI Centr’Alp 170 rue de Chatagnon, F38430 Moirans, France; +33 4 76 07 36 36; Fax: +33 4 76 55 90 88; [email protected]; www.lcie.frNotified Body number : 1905

tHUrmelecAire de la Thur BP 8 F68840 Pulversheim, Pulversheim,

France; 33 3 89 28 33 60; Fax: 33 3 89 28 33 50; [email protected]; www.thurmelec.frNotified Body number: 1897

Union tecHniQUe de l’AUtomobile, dU motocYcle et dU cYcleAutodrome de Linas-Montlhéry BP 20212, 91311 Montlhéry Cedex, France; +33 1 69 80 17 00; Fax: +33 1 69 80 17 17; www.utac.com Notified Body number: 0069

otHer

ministÉre de l’economie, des FinAnces et de l’indUstrie diGitip/spic/sQUAlpi diGitip 5Le Bervil, 12 rue Villiot, F-75572 Paris Cedex 12; +33 01 53 44 97 03; Fax: + 33 01 53 44 98 88; Michel Berger, [email protected]

Vos commentaires et vos avis revêtent une grande

importance à nos yeux. Merci de bien vouloir consulter

le site www.interferencetechnology.eu et remplir un

petit questionnaire qui nous permettra d’améliorer le

guide Europe CEM.

FAITES-NOUS PART DE VOTRE RÉFLEXION


Ressources | FRANCE



PIONEER TECHNOLOGY


PIONEER TECHNOLOGY












SébaStien Serpaud Loic arnaLNEXIO Toulouse, France

bLaiSe raveLo david baudryESIGELEC/IRSEEM Rouen, France

i. introduction

Il existe un grand nombre de mé-thodes de mesure normalisées permettant de valider le bon fonc-

tionnement électromagnétique d’un produit. Ces méthodes sont très bien adaptées pour évaluer un produit dans son environnement d’utilisation. Toutefois en cas d’échec du test, ces méthodes se prêtent difficilement à la localisation et à l’identification précise de la source. Le temps d’investigation

peut être long et couteux.L’utilisation d’outils de simula-

tion se heurte malheureusement à la complexité des systèmes. La modélisation d’un système d’essai normalisé est souvent trop com-plexe pour pouvoir être reproduit fidèlement en simulation. Sans prendre en compte les problé-matiques liées à la simulation, la modélisation d’un équipement industriel est une tâche complexe nécessitant une pluridisciplinarité liée à la nature très diverse des composants constituant ce sys-tème (composants actif/passif, mi-crocontrôleur, PCB, connecteurs, câbles, boitiers…).

Les travaux présentés dans ce papier ont été réalisé dans le cadre du projet EPEA (EMC Platform for Embedded Applications) du pôle de compétitivité “Aerospace Valley”. Une des taches de ce projet était de développer un moyen d’essai pour réaliser des mesures en champ proche et de travailler sur le traitement des données de mesure.

ii. MeSure en cHaMp procHe

Les mesures en champ proche sont un moyen simple de caractéri-ser les émissions électromagnétiques émises par un produit. Cette méthode d’investigation permet une mesure du champ proche environnant le produit afin d’évaluer sa pollution électromag-nétique. Les informations apportées sont ainsi très utiles pour caractériser et analyser le comportement CEM d’un produit.

Ce moyen d’essai a plusieurs avan-tages intéressants dans un contexte industriel. A l’instar des méthodes normatives, il n’est pas nécessaire de développer une carte de test spécifique. Les mesures peuvent être réalisées sur un système industriel dans son environnement. A la différence des mesures en champ lointain, le champ proche contient des informations sur la source qui l’a fait naitre. Conjugué avec la mesure en cartographie, cette méthode d’essais permet de localiser et de caractériser avec une très bonne précision les sources de forte émission.

Depuis une dizaine d’années, les mesures en champ proche connaissent un important développement poussé

conception assistée par Mesure champ proche

Approche industrielle et innovante des mesures champs proches dans le processus de conception et de modélisation des émissions rayonnées

82 INTERFERENCE TEChNOLOGy EuROpE EMC GuIdE 2011

France ConCeption Assistée pAr Mesure ChAMp proChes

Figure 1. Banc de mesure champ proche..

Translations available






par un fort intérêt industriel. Les principaux développe-ments se sont portés sur la calibration et le développement de nouvelles sondes toujours plus performantes [3][4][5][6][7][8][9][10] Toutefois il reste un long chemin pour utiliser cette quantité importante d’informations que constituent les données champ proche dans les processus de modéli-sation de composants et équipements électroniques. Trois étapes préliminaires doivent être franchies afin d’atteindre cet objectif dans un contexte industriel.

a. Réduction du temps de mesureLa réduction du temps de mesure est le premier défit

dans un contexte industriel. Une cartographie en champ proche par nature demande un temps certain inhérent à la répétition des phases de capture du signal reçu par la sonde pour chaque point de mesure. Suivant le type de source, les mesures demandent une très grande résolution. Le nombre de point de mesure peut vite devenir important.

La première piste pour réduire le temps de mesure est l’optimisation des équipements de test. L’optimisation des paramètres du contrôleur moteur des axes, comme le ré-glage précis des correcteurs numériques (PID, rampe de vi-tesse…), permet de gagner jusqu'à 15% du temps de mesure. Le récepteur de mesure peut également être optimisé pour réduire le temps de capture et de transfert des données.

Les algorithmes de mesure peuvent également être op-timisés pour répondre aux contraintes liées aux mesures champ proche. Nous travaillons sur des algorithmes pou-vant réduire le temps de mesure d’un facteur 4. Couplé avec un post-traitement des données, ces algorithmes de mesure peuvent réduire très significativement les phases d’investigation sans pour autant dégrader la qualité des mesures. Le plus simple des algorithmes est l’algorithme adaptatif qui permet de réaliser une cartographie par passe successive. A chaque passe la résolution est réduite d’un facteur . Cet algorithme est adapté dans les phases d’investigation. Il permet d’avoir rapidement un aperçu du

champ dans la zone demandée. Remarque : Cette méthode de mesure peut être complétée par un algorithme de post traitement par interpolation.

Comme nous venons de le souligner, la dernière piste pour réduire le temps de mesure se trouve dans l’utilisation d’algorithme de post traitement. Nous présenterons plus loin dans ce papier un deuxième algorithme (§3) permettant de réduire le nombre de composante de champ à mesurer.

b. Mesure vectorielle en champ proche Les mesures en champ proche sont communément

réalisées en amplitude à l’aide d’un analyseur de spectre. Pour obtenir un modèle utilisable sur des outils de simula-tion ou pour traiter les résultats de mesure, il est nécessaire d’obtenir la phase du champ en plus de son amplitude. Le problème de la mesure de phase est l’obtention d’une ré-férence de synchronisation. Dans un contexte industriel, il est très contraignant, voir impossible, de se connecter directement sur le produit pour recueillir ce signal de référence (horloge par exemple). Une méthode consiste à introduire une seconde sonde de mesure qui servira de référence. Elle sera positionnée au dessus d’un composant bruyant représentatif de l’activité que l’on veut mesurer (quartz, µC, régulateur à découpage…). Cette sonde de ré-férence est connectée à l’entrée R de l’analyseur de réseau. La deuxième sonde de mesure sera connecté à l’entrée A de l’analyseur de réseau. L’acquisition des signaux A et A/R est réalisé afin de permettre l’extraction du champ en module et phase (en complexe plus exactement).

A l’aide de cette méthode de mesure, il est ainsi possible d’utiliser les mesures en champ proche dans des outils de modélisation numérique.

c. Echange des données champ procheLa dernière étape est relative à l’échange de données.

Pour pouvoir manipuler et échanger les données, il est vital de définir un format de donnée des mesures champ proche. La première initiative a été lancé par le groupe PASTEUR, il y a maintenant plusieurs années. Le flambeau a été repris par le groupe de normalisation français UTE/IEC. Une annexe technique nommé IEC 61967-1-1 Ed. 1.0 est sortie en 2009. Elle défini cette proposition de standard et tente de faire référence comme format d’échange pour les données champ proche (en émission et immunité). Afin de promouvoir ce format, nous avons développé l’outil NFSViewer distribué gratuitement sur notre site [1].

Cet éditeur de données champ proche respecte les préconisations du format défini par l’IEC. NFSViewer est ouvert au développement collaboratif. Académiques et industriels peuvent y ajouter leur propre algorithme de post-traitement.

Nous avons également travaillé avec les éditeurs de logiciel de simulation comme CST pour qu’ils intègrent ce format de données. L’intégration de ce format dans leur suite logicielle est en cours et nous espérons que d’autres éditeurs suivent le pas.

iii. aLGoritHMe de poSt-traiteMentLe traitement des données de mesures est très important.

Il permet de convertir les résultats de mesure en données exploitables en simulation (traitements des fonctions de


ConCeption Assistée pAr Mesure ChAMp proChesFrance

Figure 2. Synoptique d’un essai en mesure champ proche

Figure 3. Algorithme de déplacement adaptatif

EMV 2011 – sujets, tendances et technologies à Stuttgart

L’efficacité énergétique, les énergies alternatives, l’E-Mobility – ce sont que quelques-unes des sujets qui représentent les nouveaux défis pour la branche EMC. Pour connaître ses répliques, visitez l’EMV, la foire européenne la plus importante avec des ateliers pour la compatibilité électromagnétique.

La foire. L’EMV 2010 a été caractérisée par une atmosphère de travail efficace et conviviale. 3 425 visiteurs se sont rendus à la foire qui se tenait du 9 au 11 mars 2010 à Düsseldorf. La majorité des visiteurs provenait des domaines de l’électronique et du génie électrique et travaille dans la construction et le développement. A la grande satisfaction des exposants, le public était d’une qualité élevée avec une part très élevée de décideurs (76%).

Avec une part des étrangers de 50% des exposants, l’EMV offre non seulement un large éventail de produits, mais aussi une offre d’envergure internationale. « L’EMV 2010 a été tournée vers l’avenir, offrant une atmosphère professionnelle pour les exposants et les visiteurs. Pour TKD Electronic Europe, ce furent trois jours de succès avec un nombre de clients potentiels élevés », résume Dietmar Rebl TKD Europe Electronic son expérience sur place. De bonnes perspectives pour la prochaine EMV, car immédiatement après l’événement, 80% des exposants ont déclaré vouloir participer à la prochaine EMV 2011 du 15 au 17 mars à Stuttgart. On s’attend alors à plus de 100 exposants.

Le congrès. Avec 1 048 entrées, le congrès EMV de 2010 a confirmé son importance pour la branche. Le programme consistait en 92 séances, 12 didacticiels, 8 ateliers et un séminaire de l’association de soutien à l’EMV NRW e.V. Plus de 100 orateurs ont abordés des sujets dans les domaines de la mesure et du contrôle, dans la technologie automobile, les directives EMV et les normalisations. L’EMV 2011 proposera à nouveau 36 ateliers. Ils permettent d’acquérir des compétences pratiques et constituent un excellent outil de formation. Le comité responsable de la sélection et la compilation des programmes des ateliers est composé d’experts de la branche et est présidé par le Professeur Marco Leone de l’Université Otto-von-Guericke de Magdebourg.

Pour de plus amples informations, adressez-vous à : www.e-emc.com

Interview avec Prof Dr Marco Leone

M. Prof Leone, quelles sont les sujets principaux de la branche EMC?Comment la signification de l’EMV va-t-elle se développer à l’avenir ?Les pays membres de l’UE se sont engagés conjointement à réduire leurs émissions de CO2 de 8% jusqu’en 2020 par rapport à 1990. L’UE vise même à

réduire les émissions de gaz à effet de serre jusqu’à 20%. L’objectif fixé est d’accroître la part des énergies renouvelables à 20% d’ici 2020. Ainsi, les sujets « Energie solaire et éolienne », les réseaux intelligents et les véhicules électriques gagnent en importance. Ces nouvelles technologies soulèvent de nouvelles questions quant à la compatibilité électromagnétique. Elles ne sont pas seulement de nature purement technique, mais elles ont aussi des implications sur la normalisation, par exemple la fixation de valeurs limite et le choix des mesures et d’analyses appropriées. Dans l’ensemble, l’importance de l’EMV va continuer à croître en raison des systèmes de plus en plus complexes et de l’intégration croissante.

Qu’est-ce qui rend le travail dans le comité de l’EMV si intéressant ? Le comité est composé de membres du milieu universitaire, industriel et celui des instituts de recherche. Ce sont tous des spécialistes chevronnés dans les différents domaines de l’EMV. En plus des leurs échanges, c’est un défi passionnant de réunir tous ces domaines d’intérêt et d’ajuster l’événement selon les tendances actuelles.

Pour conclure, voilà une question personnelle : Quelle est votre violon d’Ingres dans le domaine de l’EMV ? C’est précisément la diversité thématique qui rend ce domaine si intéressant et qui pose toujours de nouveaux défis. Cependant, tout est basé sur le fondement solide du génie électrique. Il n’existe donc aucun problème – aussi complexe ne soit-il – qui ne puisse pas être résolu de façon systématique. Je travaille dans le domaine de la pénétration physique des phénomènes d’interférences pour identifier les moyens les plus simples et les plus efficaces de lutter contre leurs origines et pour apporter des améliorations. Ici, l’analyse mathématique et la simulation sont de plus en plus importantes. De nombreux problèmes d’EMV ont leur origine dans les circuits électroniques. Par conséquent, je me consacre depuis de nombreuses années à l’analyse de l’EMV au niveau des circuits imprimés.

Advertorial

transfert des sondes/câbles/amplificateur/récepteur, filtrage du bruit, interpolation/extrapolation …). Nous proposons d’illustrer un exemple d’algorithme permettant de réduire le nombre de plans de mesure.

La méthode de décomposition du champ en spectre d’ondes planes (PWS) est particulièrement bien adaptée à la propagation d’une source si cette dernière est connue dans un plan [11][12][13]. En considérant la propagation d’une onde monochromatique dans un espace libre, il est possible de trouver une solution à l’équation d’Helmholtz et de définir la décomposition du champ en spectre d’ondes planes comme le montre l’équation suivante :

En considérant dans l’équation d’Helmholtz, on peut définir la relation entre les vecteurs d’onde relatifs et les différentes composantes du champ.

L’expression du vecteur d’onde pour une composante peut être définie en fonction du champ magnétique comme le montre l’équation suivante :

Le champ magnétique à une distance z > 0 peut être facilement calculé en utilisant l’équation suivante :

Il est ainsi possible de calculer analytiquement la composante Hz du champ magnétique en fonction des composantes tangentielles Hx et Hy dans le plan z=0 mais aussi Hx, Hy et Hz pour tout plan à z>0. Cet outil mathé-matique nous permet de réduire significativement le temps de mesure. Deux plans sont suffisants pour pouvoir calculer les trois composantes du champ n’importe où au dessus du plan de mesure. Cette théorie peut également s’appliquer

sur le champ électrique. Les figure 6 et figure 7 présentent quelques résultats

d’utilisation de la théorie du PWS pour la génération de la troisième composante du champ.

Nous constatons qu’il y a très peu de différences entre les cartographies du champ simulées et les cartographies du champ calculées que ce soit à partir de cartographie du champ magnétique ou du champ électrique.

La figure 8 illustre les résultats d’extrapolation des car-tographies du champ au dessus du plan de mesure. Là encore les résultats sont tout à fait satisfaisants.

Avant d ’ implémenter l ’algorithme sur le logiciel NFSViewer, nous avons étudié l’influence de différents paramètres sur la précision des résultats en utilisant sur le logiciel Scilab.

b. Etude d’influence du zéro-padding :Le calcul du PWS introduit l’utilisation de la transformée

de Fourrier 2D. Il est usuel de réaliser une opération de « zéro-padding » afin d’améliorer la résolution spectrale. Cette opération consiste à augmenter la dimension des données d’entrées par un remplissage de zéro. Remarque : même si il y a plus d’échantillon en sortie, il n’y a pas plus d’information ajouté par l’opération du zéro-padding. Il y a simplement plus de points calculés et donc une meilleure résolution comme le montre la figure 9 sur une FFT 1D.

Le zéro-padding permet de résoudre le problème dit « d’effet de bord. Sans l’opération d’ajout de zéro, la matrice d’origine peut ne pas être correctement conditionnée et l’on obtient un repliement de spectre après application de la transformé de Fourier. La figure 10 illustre ce propos.

Cette opération à un coût de calcul non négligeable. Le fait de rajouter uniformément des données autour de la matrice d’origine augmente très fortement la taille de la matrice sur laquelle on effectuera la FFT 2D. Le calcul du PWS introduit un iFFT (3) suivi d’une FFT (1). Il est donc doublement couteux, mais cependant nécessaire, d’augmenter la taille de la matrice d’origine. Afin de dimen-sionner correctement cette opération, nous avons étudié l’influence de ce paramètre. La figure 11 présente un des résultats de cette analyse.

Les résultats montrent que l’amplitude n’est pas forte-ment affectée par la dimension du zéro-padding. Très vite, les effets de bord sont supprimés. La phase présente toutefois

Δ



Figure 5. NFSViewer - outil d’analyse des résultats de mesure en champ proche.

Figure 4. Principe de mesure vectoriel en champ proche

LLL’’’iiinnnnnnooovvvaaatttiiiooonnn aaauuu ssseeerrrvvviiiccceee dddeee vvvooosss cccooonnntttrrraaaiiinnnttteeesss CCCEEEMMM

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n e x i o La CEM pour raison d’être

Aéronautique Etude par modélisation des effets directs de la foudre sur structure avion. Réalisation d’un modèle de dimensionnement du couplage sur les accès antennaires d’un aéronef

Analyse du placement des composants sur une carte PCB par des mesures d’émission champ proche

Spatial

Analyse de risque CEM d’équipements RF satellites type récepteur et convertisseur

Simulation TLM (transmission line method) de l’efficacité de blindage d’un boitier équipement et validation en CRBM

Automobile Investigation d’un défaut d’immunité composant face à une injection BCI par mesure et simulation de paramètres S.

Investigation numérique ESD sur équipement automobile et définition de règles de routage Modélisation de lignes de transmission couplées par méthode de Kron (MKCE)

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Dernières réalisations

ETUDE ET SIMULATION Composant, PCB, Equipement et Système Aide à la conception, investigation,

règles de routage, analyse de risque, guide méthodologique, …

Simulation numérique et utilisation des savoir-faire dans toutes les phases d’un projet

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RECHERCHE ET INNOVATION

Externalisation de la R&D Projets collaboratifs européens

une plus grande sensibilité. L’erreur devient acceptable après un padding de 500%.

c. Etude d’influence du bruit de mesure :Afin de simplifier la validation de l’algorithme, nous

avons travaillé sur des données de simulation. Toutefois cet algorithme est destiné à être utilisé sur des résultats de mesures. Pour évaluer l’influence de ce bruit de mesure sur les résultats du calcul, nous avons utilisé des résultats de simulation sur lesquels nous avons ajoutés un bruit banc caractéristique d’un bruit de mesure. Là encore, nous avons constaté que la phase présenté une plus grande sensibilité au bruit que l’amplitude. Toutefois l’algorithme reste très robuste au bruit additif et multiplicatif pouvant affecter les mesures.

iv. concLuSionDans un contexte industriel, il est nécessaire de dis-

poser d’outils fiables et ergonomiques. Le projet EPEA a été l’occasion de capitaliser et d’appuyer les dernières innova-tions en mesure champ proche (BAT-Scan [2] et NFSview-er[1]). Cet article a présenté les avancées dans la mesure de l’émission champ proche en vue d’utiliser ces informations pour la modélisation des émissions. Ces développements récents ont été éprouvés pour des applications industrielles. Nous n’avons présenté volontairement que les mesures

champ proche en é m i s s i o n . B i e n q ue le s t r av au x sur l ’ immunité en champ proche soi-ent moins avancés que ne le sont ceux de mesures en émis-sion, il faut noter que le développement des mesures champ proche en immu-nité est en forte aug-mentation depuis quelques a n nées [14][15][16]. Cette tendance est por-tée par un fort in-térêt des industriels pour cette méthode d’investigation de la susceptibilité des composants et des cartes électroniques « in-situ».

reFerenceS• [1] NFSViewer - http://www.nexio.fr/nfs-viewer/• [2] BAT-SCAN- http://www.nexio.fr/• [3] R. R. Goulette, "The Measurement Of Radiated Emissions From

Integrated Circuits", IEEE Int. Symp. on EMC, August 1992.• [4] J.J. Laurin, Z. Ouardhiri, J. Colinas, “Near-field Imaging of Radi-

ated Emission Sources on Printed-Circuit Boards”, in Proc. IEEE Int. Symp. on EMC, 2001, pp. 368-373.

• [5] JR. Regué, M. Ribó, “A Genetic Algorithm Based Method for Source Identification and Far-Field Radiated Emissions Prediction from Near-Field Measurements for PCB Characterization”, IEEE Trans. Electromagn. Comp., vol. 43, pp. 520-530, November 2001.

• [6] J. Shi, M.A. Cracraft, J. Zhang, R.E. DuBroff, K. Slattery, M. Yamaguchi, “Using Near-Field Scanning to Predict Radiated Fields”, in Proc. IEEE Int. Symp. on EMC, Santa Clara, USA, vol. 1, August 2004, pp. 14-18.

• [7] D. Baudry, A. Louis, and B. Mazari, “Characterization of the open-ended coaxial probe used for near-field measurements in emc applica-tions” Progress In Electromagnetics Research, PIER 60, 311–333, 2006

• [8] B. Essakhi, D. Baudry, O. Maurice, A. Louis, L. Pichon and B. Mazari, "Characterization of radiated emissions from power electronic devices: synthesis of an equivalent model from near-field measure-ment", in Eur. Phys. J. Appl. Phys., vol. 38, pp. 275-281, May 2007.

• [9] D. Baudry, P. Fernandez-Lopez, B. Ejarque, N. Bigou, L. Bouche-louk, M. Ramdani, S. Serpaud, "Near-field probes characterization and inter-laboratory comparisons of measurements", in Proc. EMC Compo 09, Toulouse, November 2009.

• [10] M. Kanda, “Standard Probes for Electromagnetic Field Mea-surements”, IEEE Trans. Ant. Prop., Vol. 41, Issue 10, oct. 1993, pp. 1349-1364



Figure 6. Calcul de la composante Hz en fonction de Hx et Hy.

Figure 7. Calcul de la composante Ez en fonction de Ex et Ey.

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nology, vol. 3, Issue 1, p. 72-83, January 2009• [14] F. Lafon, F. De-Daran, J. Dupois, "Near

Field Immunity cartography method to characterize an IC to fields radiated by an ESD", ICONIC, UPC, Barcelona, Spain, June 8-10, 2005.

• [15] Boyer, A. Bendhia, S. Sicard, E., "Char-acterisation of electromagnetic susceptibil-ity of integrated circuits using near-field scan", in Electronic Letters, vol. 1, January 2007, pp. 15-16.

• [16] D. Baudry, A. Louis and B. Mazari, "Using a near field test bench for immunity investigation", in Proc. ICONIC 2007 conf., St. Louis, MO, USA, pp. 290-295, June 2007.

• [11] D. T. Paris, W. Leach, E. Joy, "Basic theory of probe-compensated near-field measurements", IEEE Trans. On Antennas and Propagation, vol. 26, May 1978, pp. 373-379

• [12] J. J. H. Wang, "An examination of the theory and practices of planar near-field measurement", IEEE Trans. On Antennas and Propagation, Vol. 36, NO. 6, June 1988, pp. 746-753

• [13] D. Baudry, M. Kadi, Z. Riah, C. Arcam-bal, Y. Vives-Gilabert, A. Louis, B. Mazari, "Plane wave spectrum theory applied to near-field measurements for EMC investiga-tions", IET Science, Measurement & Tech-

S.SERPAUD et L.ARNAL sont ingénieurs à NEXIO. NEXIO est une société française interve-nant exclusivement dans le domaine de la CEM/RF/FOUDRE. Autour de 3 activités stratégiques (Automatisation d’essais, Ingénierie Essais et Études-Simulation), NEXIO s’est imposé comme un acteur majeur du domaine auprès de grands groupes Aéronautique, Spatial, Automobile et Industrie électronique. Depuis 2006, la stratégie NEXIO est soutenue par son pôle Innovation et sa présence à l’export (Europe, USA, Asie).

Dr D. Baudry et Blaise Ravelo sont ensei-gnant-chercheur à l’ESIGELEC.L’ESIGELEC (Ecole Supérieure d’ingénieurs en Génie élec-trique) a défini ses trois (bientôt quatre) thé-



Figure 8. Extrapolation de plans Hx, Hy, Hz à 3 et 4mm à partir des plans Hx et Hy à 2mm

Figure 11. Analyse de l’application du zéro-padding.

matiques d’activités (Electronique, Automatique, Instrumentation et Informatique et bientôt Energie) en liaison étroite avec ses partenaires

industriels et universitaires. De nombreux partenariats aussi bien aca-démiques qu’industriels en France et à l’international ont été établis et l’intégralité de l’activité est consacré à la recherche, au développement et au transfert.

interferencetechnology.eu INTERFERENCE TEChNOLOGy 91

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Figure 9. EM field at X = 0.416 cm and Y = 1 cm.

Figure 10. Calcul de Hz avec et sans zéro-padding.

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Laurent SauvageInstitut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France OLivier Meynard Institut TELECOM, TELECOM ParisTech DGA CELAR, Bruz, France SyLvain guiLLey Institut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France Jean-Luc danger Institut TELECOM, TELECOM ParisTech Secure-IC S.A.S., Paris, France

abStract

Electromagnetic analysis (EMA) is an important class of attacks against cryptographic devices.

In this article, we present two attacks to disclose the key of cryptographic implementations in FPGAs by tak-ing advantage of EMA. The first one shows how the Correlation-based on EMA (CEMA) on a non-protected hardware AES module is possible from a distance as far as 50 cm. An analysis of the leakage structure shows that the Hamming distance model, although suitable for small distances gets more and more distorted when the antenna is displaced far from the device. We pre-characterized a physi-cal model using a first order templates construction which allowed us to enhance the CEMA by a factor up to ten. Therefore, we conclude that EMA at large distance is feasible with our amplification strategy coupled to an

innovative training phase. The second case is about a 3DES cryptoprocessor protected with Dual-rail with Pre-charge Logic (DPL). We experimentally show that this countermeasure can be broken by an EMA method which relies on two stages, the first being a lo-calisation phase by means of the chip’s cartography, and the second being the EMA attack itself on the most relevant area. We conclude that both far and near field attacks are possible: the first ones exploit the radiation of the board, while the second one the radiation of the cryptographic component.

i. intrOductiOnNowadays the design of mathemati-

cal cryptographic algorithm is very secure and believed unbreakable, but their hardware implementation leads to a latent vulnerability against physi-cal attacks. Physical attacks designate the analysis of the variation of different physical magnitudes during the com-putation of the data by a cryptographic component. An attacker is able to eavesdrop different side channels such as timing, power or electromagnetic emanation. From those measurements, she can guess cryptographic secrets thanks to statistical tools that are used as distinguishers between several hypotheses.

In 1999, Kocher et al described a side channel attack (SCA) suitable for smartcards: the power line, supplied from the card reader, was spied. Hence

electroMagnetic attacks case Studies on non-Protected and Protected

cryptographic Hardware accelerators

92 InTERFEREnCE TEChnOLOGy EuROPE EMC GuIDE 2011

France ElEctroMagnEtic attacks casE studiEs

© 2010 IEEE. Reprinted, with permission, from 20109 IEEE EMC Society Symposium.

the name Differential Power analysis (DPA) given to this attack. With this cryptanalysis method an attacker can successfully reconstruct the secure data [1].

Two years later, Gandolfi et al introduces the principles of the EMA, ElectroMagnetic Analysis [2]. In fact Gandolfi applies the very method of the DPA to Electromagnetic emanations. EMA exploits correlation between secret data and variation in power radiation emitted. Several labora-tories have worked on this topic, thus in [3], [4], Agrawal


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Getelec-94x140 FR:getelec pub 31/08/10 17:24 Page1

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Figure 1. Far-field EM measurement test bench with its antenna on a plastic rod..

Figure 2 (above). CEMA on sbox #1 at a distance d = 50 cm.



http://www.ifi.com


http://www.emc-partner.fr

highlights that a EM probe can yield multiple EM signals via demodulation of different carriers in near and in far fields.

With the contribution of Brier et al, who introduced the CPA Correlation Power Analysis [5], Electromagnetic analysis becomes an important class of attacks against cryptographic, and more particularly Correlation-based on ElectroMagnetic Analysis (CEMA). Thanks to this crypt-analysis technique and the wealth of components in the spectrum of the Electromagnetic waves, we are now able to perform attack at Distance from the chip and in near field to defeat the protection used to avoid easy attack.

In section II, we present the last results on the CEMA at distance. It is noticeable that current experimental set-ups allow to manage an attack at 50 cm on unprotected cryptographic components. Moreover in this section we propose a way to enhance the attack by reducing the num-ber of measurements. Then, the section III describes the EMA applied to disclose the protection in Near Field, by cartography. Finally, section IV gives with the conclusion and the perspectives for further works.

ii. ceMa at diStance On a nOn-PrOtected aeS HardWare MOduLe

Correlation-based on ElectroMagnetic Analysis (CEMA) has been well studied in near-field. Some far-field experi-ments have been shown to be promising. However, no in-depth analysis has been carried out so far about EMA at distance. Here we introduce such kind of systematic study.

A. Model of Power Consumption or EM Radiation

Classically most power analysis exploit a dependence of the Hamming weight of a sensitive variable. This is referred

to as the “Hamming weight model”, that consist in the num-ber of bits in a data word set to ‘1’. But since 1998 and the introduction of CPA by Brier et al, the Hamming distance model is more widely used. It is assumed that the data leak-age through the power side channel depends on the number of bits switching from one state to another one at a given time. If we consider the fact that the transition from state to state are triggered by events such as the edges of the clock signal, we can deduce that the current consumed is related to the energy required to flip the bit from one state to the next. After having introduced the model of consumption, we can now present the statistical process based on Pearson Correlation Factor for guessing the secret key.

B. Pearson Empirical Correlation FactorClassical statistics introduce the Pearson correlation

factor ρ(W, H) between the Hamming distance model and the measured power. It is defined as:

where W represents the measurement and H the Ham-ming distance. To obtain the Hamming distance model few hypotheses on the key are done. We notice that ρ(W, H) follows the Cauchy-Schwarz inequality: -1 ≤ ρ(W, H) ≤ +1. The correct key is obtained when for the right key hypothesis tends to ±1.

For further experiments we use this tool to conduct attacks.

C. The Test BenchThe device whose EM emanations are studied is ca-

ElEctroMagnEtic attacks casE studiEsFrance


Figure 3. Pre-characterized leakage model at 50 cm for the Sbox #1.

Table 1. Comparison of the Number of Traces to Break a Sub Key Thanks to CPA vs Pre-Characterized Model.

Figure 4. Correlation obtained on sbox #1 at 50 cm with the pre-characterized model.

denced by a clock running at 24 MHz. For these low frequencies, the usage of a Faraday cage [6] is not needed as it would induce some EM reflections and could alter the measurements. Furthermore, the size of the absorber would be too large for this range of frequencies. The material is placed on a plastic table that limits the reflection of

EM radiation and avoids the conducted radiation. A plastic rod is placed perpendicularly to the board and is considered as a vertical axis to move the antenna by steps of 5 cm, as shown in Figure 1.

The targeted device is a Field Programmable Gate Array (FPGA) Virtex II by Xilinx. It embeds one AES [7] Rijndael supporting 128-bit keys. The attacked chip has no coun-termeasure against EMA: its implementation adheres in a straightforward manner to the NIST FIPS 197 standard.

Moreover a trigger signal is outputted, each time an en-cryption is beginning. This saves synchronisation problems. We take care of keeping far away the supply power from the chip board, in order to avoid any coupling between the radiated waves and the power supply. We record the emana-tions on the side with the decoupling capacitors, because the signal on this part of the board has the best quality.

D. The Attack at distance on the Cryptographic Implementation of AES

Firstly we check that for different distances, the curves for the same plaintext are scaled down, according to an inverse power law. We notice, as expected, that the useful signal decreases following 1/di law of attenuation (where d is the distance and i a positive real number). We make the assumption that the noise reaches a limit. Indeed, the closer we get to the electronic board, the more the noise level increases, because we capture the perturbations from the board components in addition to the ambient noise. To confirm these hypotheses, we have performed an attack on the AES, when the antenna was placed much further away, at 50 cm from the FPGA board. In practice, the signal was amplified of 60 dB and averaged by a factor of 4,096. The attack needs 51,519 measurements to break the substitution box (sbox, called SubBytes in AES) #1, whereas only 1,000 are required at d = 0 cm. The correlation curve is represented in Figure 2. The correlation does not clearly stand out.

At this large distance we assume that the attack requires too many traces to fully disclose the key because the Ham-ming model is not holding anymore. That is why we propose a method to build an improved model based on the con-struction of 28 = 256 templates [8]. We indeed assume the leak of individual bit amongst the 8 that are targeted still complies with that described in II-A. Thus our approach differs from that of [9], which takes into account a dis-symmetry on the transitions edges, we will describe in Sec. III (notably in Fig. 9). However, the contribution of each bit and possible interference between them is encompassed by our template construction. We search the index tc of the maximal correlation, that corresponds to the moment when the data are stored in the register on the last round. We compute for this index the average and the variance for the

256 possible Hamming distances, the key and the message being known. This precharacterized leakage model is shown in Figure 3.

We observe that the standard deviation is almost inde-pendent of the byte distances. Therefore, most of the model information is contained in the mean leakage value. As a consequence, we adopt a tabulated leakage model consist-ing in a look-up to the corresponding estimated averages. After this characterization, we launched a correlation attack on sbox #1 with the newly obtained model. The attack is considerably enhanced: the key byte entering this sbox is disclosed with as few as 5,003 traces. The correlation curve for the correct key guess is shown in Figure 4. The peak at t = tc is clearly visible, especially when contrasted with the cor-relation curve obtained with a classical CEMA in Figure 2.

These experiments confirm that the leakage model based on the Hamming distance model is not optimal at distance (Refer to Table I for attacks figures).

iii. eMa cartOgraPHy On a PrOtected 3deS HardWare MOduLe

In this section, we propose a method to locate any cryptographic coprocessor protected with Dual-rail with Precharge Logic. We first present the principle of this side-channel analysis countermeasure, and the cryptographic application we intend to attack. Then, we expose our lo-calization technique, and finally give experimental results showing the gain it is able to achieve.

A. Dual-rail with Precharge LogicThe objective of Dual-rail with Precharge Logic (DPL)

is to make constant the power consumption, and in turn the electromagnetic radiations, of an integrated circuit. To

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Figure 5. Schematic of a DPL AND gate.

Figure 6. Floorplan of the system-on-chip programmed in a Stratix.

a complete System on Programmable Chip (SoPC) includ-ing a master processor for I/O communication and three cryptoprocessors achieving the triple Data Encryption Stan-dard (3DES) [10]. Although DES has been replaced by the Advanced Encryption Standard (AES) [7] since year 2001, the American National Institute of Standards and Technol-ogy (NIST) considers 3DES to be appropriate through year 2030, and the electronic payments industry still uses it for its compactness when implemented in hardware, with an area representing a quarter of AES’s. DES1 and DES2, on the top left and bottom left corners of Figure 6, are two un-protected modules which serve as reference to evaluate the security gain conveyed by the protected one. WDDL (Wave Dynamic Differential Logic [11]), the module protected by DPL, is located on the right of the SoPC floorplan. The placement is constrained by the LogicLock (LL) feature of Quartus. We have programmed this real-life application in an EP1S25 “Stratix” Altera FPGA (130-nanometer technol-ogy), embedded on a “SHIX2.0”, an 8-layer PCB (Printed Circuit Board) professional board. Note that this FPGA is not EM-shielded, thus our attack is totally non-invasive.

C. Spotting by CartographyThe principle of EM cartography is to measure the EM

field for every point of a 2D grid covering all or only a part of the chip. This grid corresponds to the set of positions of the antenna placed by means of an X-Y motor driven table. The measurements are typically made with a spec-trum analyser when working in the frequency domain, or with a digital oscilloscope in the temporal domain. Lastly, post-processing has to be applied on these measurements to obtain the final map. In the EMC area, it traditionally corresponds to extract the maximum amplitude of the EM field for each frequency component, and check it does not exceed thresholds required by standards. In the SCA topic, the post-processing has to bring out point(s) where the EM field is correlated to the cryptoprocessor activity. To locate a cryptoprocessor protected with DPL, our technique simply consists in targeting the activity of the signals controlling the alternate between the precharge and evaluation phase. In our implementation, these phases occur on the rising edge of the SoPC clock, whose frequency is 8.333 MHz. Therefore, the internal frequency of the DPL DES crypto-processor can be viewed as being equal to half of that of the SoPC clock, and thus equal to 4.166 MHz.The map for this latter is given in Figure 8. The dashed rectangle is a land-mark which delimits the ASIC of the FPGA. On the right, the scale gives the voltage dynamic range at the output of the antenna (proportional to the EM field).

The EM field has been collected using an antenna of the “HZ-15 Probe Set” from “Rohde and Schwarz” [12], a 60 dB – 100 kHz to 3 GHz pre-amplifier, and an “54855 Infiniium Agilent” [13] oscilloscope, whose bandwidth is 6 GHz and maximal sample rate is 40 GSa/s. The antenna is mounted on a 2D motorized table and moved over the FPGA through an area of 2.08 cm x 2.00 cm. The resolution is of 50 points on X and on Y. In other words, the mechanical step equals 400 µm. Figure 7 is a photograph of the EMA experimental setup, with the antenna over the most leaking point.

In Figure 8, five areas stand out: two at the top, two at the bottom, and one large to the right of the figure. A first

reach this goal, each bit is represented by a couple of sig-nals, and calculations alternate between a precharge (PRE) and an evaluation (EVA) phase. Figure 5 is an example of a DPL AND gate. In PRE, all of the inputs on the left are forced to ‘0’, which in turn forces the true output yT and the false output yF to ‘0’. Then, in EVA, after inputs toggle, only exclusively yT or yF will be set to ‘1’. This way, whatever the temporal transition, either EVA to PRE or PRE to EVA, and whatever the processed data, only one of the differential outputs commutes, yielding a constant transition count. As the power consumption is directly related to the number of transitions in CMOS technology, the activity is constant as well, whatever the variables’ values.

B. The FPGA-based Cryptographic SoPCTo illustrate the efficiency of our method, we apply it to



Figure 7. The antenna over the “SHIX2.0” board and the FPGA.

Figure 8. EM field at 4.333 MHz.

validation of our method is that highlighted areas are mostly on the right, which corresponds to the place of the DPL DES module in the floorplan (refer to Figure 6). The validation will be completed by analysing the results of the attack on these five points. We detail them in the following section.

D. EMA AttackFor all the relevant areas, new acquisitions have been

launched to perform a classical CEMA. For clarity of explanation, only the best results will be presented in the rest of the paper. They have been obtained for the large area marked “Most leaking area” in Figure 8, whose center is located at X=0.416 cm and Y=1 cm. With an eye to illustrate particular phenomenons, a 256 times averaged temporal trace of the EM field at this point is depicted in Figure 9, on the left. We can observe that the EM field is positive for the precharge, negative for the evaluation. This could be explained by the current inversion of the CMOS capacitors. At the beginning of the precharge phase, the CMOS gates of DPL go from 1 to 0, whereas this is the other way round when switch-ing from the precharge phase to the evaluation phase.

Tab. II reports the statistics for a classical Power Analysis (PA): the number of Measurements To Dis-close (MTDs) the key, with the worst value grayed, the Signal over Noise Ratio (SNR) and the covariance factor at disclosure. The SNR indicator illustrates the ratio between the level obtained with the right key and those from the strongest wrong key. Results for the EMA are reported in Tab. III. Its superiority to the C/DPA is well illustrated as the number of MTDs for the unprotected

19


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Table 2. Statistics for the Power Analysis on a 3DES Module.

Table 3. Statistics for the Electromagnetic Analysis on a 3DES Module.

33

2,610 1,4544,9023,056 3,637 2,804 655

62,976

(a)UnprotectedDESModule—DEMA(DPAwithEMAsignals)in4-bitHammingDistance

MeasurementsToDiscloseCovariancefactor[%]SNR@Disclosure

Parameter\SBox#

Parameter\SBox#

(b)WDDLDESModule—CPAin1-bitHammingWeight


S1 S2 S3 S4 S5 S6S7S8

7.81 6.32 5.657.43 7.17 4.69 4.24 7.83

5,422

32,768 45,31214,59227,1363,840 37,120 27,648

S1 S2 S3 S4 S5 S6S7S8

25.65 28.93 30.2560.9737.23 32.16 26.87 44.69

5.80 4.20 3.634.755.04 4.13 5.08 5.39

(a)UnprotectedDESModule—CPAin4-bitHammingDistance

S1 S2 S3 S4 S5 S6 S7 S8478,720 197,056464,128614,720 418,944 348,288 134,080709,056

5,508,224

5.58 6.23 5.844.78 5.42 4.47 4.58 8.236.22 6.41 6.237.03 6.37 5.294.57 8.08



(b)WDDLDESModule—CPAin1-bitHammingWeight

S1 S2 S3 S4 S5 S6 S7 S8

5,469,440 1,368,000557,2483,597,184 1,116,6722,876480 134,0805,508,224

1.89 0.88 3.271.08 2.48 1.75 1.77 1.643.66 3.79 3.704.69 4.80 3.94 4.18 4.63

Parameter\SBox#

Parameter\SBox#

http://www.arfrance.eu



DES module is hundreds of times less. For DPL, CEMA able to retrieve the secret key in less than 62,976 encryp-tions. By considering the worst MTDs and cross-comparing them, we can conclude that the security gain of our implementation of DPL equals 7.8 against CPA, 11.6 against CEMA. It confirms that DPL brings a certain protection against EMA, yet insuf-ficient with respect to the 5,508,224 measurements needed to disclose the key with CPA. To conclude, the pro-posed method is thus experimentally validated by successfully attacking a FPGA-based DPL 3DES cryptoproces-sor. The accurate X-Y location of the antenna permits to gather the activity of only the targeted module, discard-ing the activity of others parts of the FPGA, acting as noise for an attacker.

iv. cOncLuSiOn & Future WOrKS

This paper shows that the electro-magnetic measurements represent a very efficient manner to capture the activity of a device in order to extract the secret information it conceals. We illustrate a first attack that succeeds with an antenna located at 50 cm from the targeted device. This proves that the attacker can be relatively far from the circuit by taking advantage of this non-intrusive method. The second attack is performed near the chip and allows the adversary to recover the key of a cryptoprocessor protected by DPL. Compared to DPA or CPA, the

corresponding DEMA or CEMA needs much less traces. In both cases there is an evidence that the leakage is largely broadcast via the electromagnetic side channel. However some extra pro-cessing is needed to fully exploits the leaked information as it is either the sum of many electromagnetic sources (far EMA) or has to be spatially de-tected (near EMA). The far-field EMA exploits the global EM radiations emit-ted by the complete PCB, notably the power lines and the decoupling capaci-tors. On the contrary, the near-field EMA exploits the local EM radiations emitted by the chip’s power network.

The traces obtained from electro-magnetic acquisitions have not yet revealed all their potential as there are also many parameters like the phase and frequency which could produce relevant information. Future works will then improve in a concomitant manner the processing of the traces and the attack algorithms. This im-plies a better knowledge of how the electromagnetic signal is generated and where are the exact sources or the best locations to consider.

reFerenceS• [1] P. C. Kocher, J. Jaffe, and B. Jun, “Dif-

ferential Power Analysis,” in Proceedings of CRYPTO’99, ser. LNCS, vol. 1666. Springer-Verlag, 1999, pp. 388–397, (PDF).

• [2] K. Gandolfi, C. Mourtel, and F. Ol-ivier, “Electromagnetic Analysis: Concrete Results,” in CHES, ser. LNCS, vol. 2162. Springer, May 14-16 2001, pp. 251–261,

Paris, France.• [3] D. Agrawal, B. Archambeault, J. R. Rao,

and P. Rohatgi, “The EM Side–Channel(s),” in Cryptographic Hardware and Embedded Systems – CHES, ser. LNCS, B. S. Kaliski Jr., C¸ etin Kaya Koc¸, and C. Paar, Eds., vol. 2523. Springer, 2002, pp. 29–45, Redwood Shores, USA.

• [4] D. Agrawal, J. R. Rao, and P. Rohatgi, “Multi-channel attacks,” in CHES, ser. LNCS, vol. 2779. Springer, 2003, pp. 2–16.

• [5] E. Brier, C. Clavier, and F. Olivier, “Cor-relation Power Analysis with a Leakage Model,” in CHES, ser. LNCS, vol. 3156. Springer, August 11–13 2004, pp. 16–29, Cambridge, MA, USA.

• [6] Y. Souissi, J.-L. Danger, S. Mekki, S. Guilley, and M. Nassar, “Techniques for electromagnetic attacks enhancement,” in DTIS (Design & Technologies of Integrated Systems), ser. IEEE. IEEE, March 23-25 2010, Hammamet, Tunisia.

• [7] NIST/ITL/CSD, “Advanced Encryption Standard (AES). FIPS PUB

• 197,” Nov 2001, http://csrc.nist.gov/publica-tions/fips/fips197/fips-197.pdf.

• [8] S. Chari, J. R. Rao, and P. Rohatgi, “Tem-plate Attacks,” in CHES, ser. LNCS, vol. 2523. Springer, August 2002, pp. 13–28, San Francisco Bay (Redwood City), USA.

• [9] E. Peeters, F.-X. Standaert, and J.-J. Quisquater, “Power and electromagnetic analysis: Improved model, consequences and comparisons,” Integration, The VLSI Journal, special issue on “Embedded Crypto-graphic Hardware”, vol. 40, pp. 52–60, Janu-ary 2007, DOI: http: //dx.doi.org/10.1016/j.vlsi.2005.12.01310.1016/j.vlsi.2005.12.013.

• [10] NIST/ITL/CSD, “Data Encryption Standard. FIPS PUB 46-3,” Oct 1999, http://csrc.nist.gov/publications/fips/fips46-3/fips46-3.pdf.

• [11] K. Tiri and I. Verbauwhede, “A Logic Level Design Methodology for a Secure DPA Resistant ASIC or FPGA Implementation,” in DATE’04. IEEE Computer Society, Febru-ary 2004, pp. 246–251, Paris, France. DOI: 10.1109/DATE.2004.1268856.

• [12] Rohde and Schwarz: http://www.rohde-schwarz.com/.

• [13] Agilent Technologies: http://www.agilent.com/.

Figure 9. EM field at X = 0.416 cm and Y = 1 cm.

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102 Come un ricevitore completamente digitale pienamente conforme può ridurre l’incertezza di misura nelle prove di emissione per Compatibilità Elettromagnetica

DOMENICO FESTA, IBD INTERNATIONAL BUSINESS DEVELOPMENT



berto Grego, [email protected] Prodotti e servizi: Amplifi catori, An-tenne, Strumentazione per test

S

Schlegel Electronic MaterialsSirces Srl, Via C. Boncompagni 3/B, 20139 Milano Italia; +39 02 55231395; Fax: +39 02 55231395; Mario Crippa, [email protected]; www.sirces.itProdotti e servizi: Materiali conduttivi, Schermatura

Soliani EMC SRLVia Varesina 122, 22100 Como, Italia; +39.031.5001112; Fax: +39.031.505467; www.solianiemc.com; [email protected] e servizi: Materiali conduttivi, Stanze e spazi schermati, Schermatura

T

Tech-Etch, Inc.Sirces Srl. Italia, Via C. Boncompagni 3/B, 20139 Milano - MI, Italia; +0039 02 55231395; Fax: +0039 02 56816112; [email protected] e servizi: Materiali conduttivi, Schermatura

Technopartner srlVia Delle Imprese, 44/46, 24041, Brembate Sotto (BG), Italia; +39 035 4874010; Fax: +39 035 4826473; www.technopartner.it; [email protected] e servizi: Schermatura

TEMAS EngineeringVia Milano 72, 22070 Bregnano CO, Italia; +39-031-772348; Fax: +39-031-773897; www.temas.it; [email protected] e servizi: Schermatura

TESEO S.p.A. Corso Alexander Fleming, 25/27/29 10040 Druento (TO) Italia; +39-011-99.41.911; Fax: +39-011-99.41.900; www.teseo.net; [email protected] e servizi: Test

Teseq LtdNarda Safety Test Solutions S.r.l., +39 02 26 99 87 71; [email protected]; www.narda-sts.itProdotti e servizi : Ampli f icatori , Antenne, Strumentazione per test, Test

A

AR / RF MicrowaveInstrumentationTeseo S.p.A., C.so Alexander Fleming, 25/27/29, Druento, Italia 10040, +39-011-994-1911, Fax: +39-011-994-1900,www.teseo.net, Marco Dealessi, [email protected] e servizi : Amplif icatori , Antenne, Cavi e connettori , Stanze e spazi schermati , Oscillazioni di tensione e sovratensioni temporanee , Strumen-tazione per test

AFJ INTERNATIONAL SrlVia G. Watt, Milano, 12 -20143 Italia; 39 02 89159140; Fax: 39 02 89159226; www.afj.it; [email protected] e servizi: Filtri, Strumentazi-one per test

AH Systems, Inc.NARDA Safety Test Solutions, Segrate, I talia ; +39 02 269 9 8702 ; Fax : +39 02 26998700; [email protected] TESEO S.p.A., Druento, Italia; 39 011 99.41.911; Fax: 39 011 99.41.900; [email protected]; www.AHSystems.comProdotti e servizi: Antenne , Strumen-tazione per test , Test

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Em Test AGVolta S.p.A., Via del Vigneto 23, 39100 Bolzano, Italia; +39 0471 56 11 20; Fax: +39 0471 56 11 00; [email protected]; www.volta.itProdotti e servizi: Oscillazioni di tensione e sovratensioni temporanee, Strumentazione per test, Test

EMC PartnerAFJ Istruments Srl, Mr. Marco Mozzi, Via Corno di Cavento 5; IT - 20148 Milano Italia; +39 02 91 43 48 50; Fax: +39 02 91 43 48 77; [email protected]; www.afj-instruments.com Prodotti e servizi : Oscillazioni di tensione e sovratensioni temporanee,

Strumentazione per test

ETS - LindgrenUnit 4, Eastman Way, Pin Green Industrial Area, Stevenage, Hertfordshire, SG1 4UH, United Kingdom; +44- (0) -1438-730700; Fax : + 4 4 - ( 0 ) -14 3 8 73 0 75 0 ; uk @ ets-lindgren.com; www.ets-lindgren.com Prodotti e servizi: Antenne, Cavi e connettori, Filtri, Stanze e spazi scher-mati, Schermatura, Strumentazione per test, Test

F

Fair-Rite Products Corp.Schaf f ner E MC Sr l , V ia Gal i leo Gal i -le1,471-20092 Cinisello Balsamo (MI), Italia; +39 02 6604 3045; Fax: +39 02 6123 943; [email protected], Via Delle Imprese, 44/46 Ang Murari, Brembate Sotto 24041 Italia; +39 035.4874010; Fax: +39 035.4826473; [email protected]; www.fair-rite.comProdotti e servizi : Ferrit ici, F il tri, Stanze e spazi schermati, Stanze e spazi schermati

Filtemc Electronic Equipment Co., Ltd#9 Lanxiang Road,Tianqiao Industrial Area Jinan, Shandong, 250032, China 0086-531-85708588, 85715366 85707366; Fax:¦ 0086-531-85717366; www.fi ltemc.com; fi ltemc@fi ltemc.com; info@fi nmotor.comProdotti e servizi: Filtri, Test

Finmotor srlVia Edison, 217, 20019 Settimo Milanese, (Milano) - Italia, +39.02.48910020, Fax: +39.02.48910053, ht tp: //finmotor.com, info@fi nmotor.comProdotti e servizi: Filtri

G

GETELEC375 rue Morane Saulnier BP 80235, 78532 Buc, France; (33168) 505-4299; www.getelec.comProdotti e servizi: Schermatura

Ghiringhelli MarioVia Luigi Riva, 10 - 21013 Gallarate - (VA) Italia; +39 0331 700525; Fax: +39 0331 700526 ; www.ghiringhellimario.com; [email protected]

Prodotti e servizi: Schermatura

H

Haefely EMC DivisionInsitec Elettronica S.r.l., Via del parco degli Scout 7, 20091 - Bresso - Milano, Italia; +39 02 6650 1075; +39 02 6650 1096; Roberto Landriscina, [email protected]; www.insitec.itProdotti e servizi : Oscillazioni di tensione e sovratensioni temporanee, Strumentazione per test

I

IFI - Instruments for Industry L .P. Instruments, Rome Of fice, 00155 Roma (RM) - Via Bardanzellu, 46; +39 0640800491; Fax: +39 0640800493; [email protected]; www.lpinstruments.it Trezzano Offi ce, 20090 Trezzano Sul Navi-glio (MI) - Viale Leonardo Da Vinci, 255/a; +39 0248401713; Fax: +39 0248401852; [email protected]; www.lpinstruments.itProdotti e servizi : Ampli f icatori , Amplif icatori, F il ters, Stanze e spazi schermati, Strumentazione per test, Test

International BusinessDevelopmentVia San Rocco, 8/a, 25032 Chiari (BS), Italia; +39 (030) 71 00 618; Fax: +39 (030) 700 28 03; www.ibdonline.it; [email protected] e servizi: Test

L

LP InstrumentsMilano: Via Via Leonardo Da Vinci, 255A, 20090 Trezzano sul Naviglio (MI) ; 02-4 8 4 0 .1713 ; Fax 0 2- 4 8 4 0 .18 52 ; info @lpinstruments.it; www.lpinstruments.itRoma: Viale Bat tista Bardanzellu, 46, 0 015 5 Roma; 0 6 - 4 0 8 0 .0 4 91; Fax 0 6 -4080.0493; [email protected] e servizi: Test

N

Narda Safety Test Solutions S.r.l.Via Leonardo da Vinci, 21/23 - 20090 Seg-rate (Milano), Italia; +39 02 2699871; Fax: +39 02 26998700; www.narda-sts.it; Ro-


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Domenico Festa IBD International Business Development Chiari, Italia

Sommario — L’incertezza è ormai parte integrante e significativa del modo di esporre i risultati

delle misure EMC: richiesta da norme e enti di accreditamento, essa è dive-nuta elemento imprescindibile e quali-ficante per quei laboratori che riescono a ottenere valori di incertezza parti-colarmente interessanti. Considerato che il ricevitore di misura - l’elemento tecnicamente più complesso di una catena di ricezione - gioca un ruolo di rilievo nel mantenere l’incertezza a livelli bassi, questo articolo fa un confronto della figura di incertezza ottenibile con un ricevitore analogico con quella che consegue all’uso di un ricevitore digitale di nuova con-cezione pienamente conforme alle norme CISPR. Vengono brevemente indicati i miglioramenti e i vantaggi che si possono ottenere utilizzando un ricevitore completamente digi-tale nelle prove di emissione EMC, a beneficio sia dei laboratori di misura, sia dei costruttori delle apparecchia-ture in prova, sia del cliente finale.

PremessaIl problema delle interferenze ra-dioelettriche alle trasmissioni radio è vecchio quanto la radio stessa, tant’è vero che il CISPR, Comitato Inter-nazionale Speciale per le Perturba-zioni Radioelettriche, venne costituito già nei primi anni ’30 per studiare i fenomeni di interferenza elettro-

magnetica e redigere delle norme che regolamentassero la materia (il CISPR è un Comitato Speciale della IEC, l’International Electrotechnical Commission). Chiaramente in quegli anni era decisamente prematuro par-lare di incertezza di misura in senso stretto, ma gli estensori della prima norma CISPR – con una preveggenza assolutamente fuori dal comune – studiarono i limiti di disturbo in modo tale che le grandi variabilità insite in una misura di emissione EMC fossero in qualche modo già “incluse” nel limite stesso: rispettare il limite significava dunque avere la ragionevole certezza di non creare disturbi alle radio riceventi. Poi, col passare degli anni, limiti, metodi di misura e caratteristiche della stru-mentazione vennero continuamente aggiornati e adattati – ad esempio per includere anche le interferenze alle trasmissioni televisive e così via - ma sempre utilizzando il concetto iniziale di considerare l’incertezza di misura già inclusa nel limite: questo approc-cio si è rivelato vincente sino ai giorni nostri, anche se adesso questo modo di operare inizia a mostrare segni di inadeguatezza.

D’altra parte, negli ultimi vent’anni l’approccio all’incertezza di misura è cambiato drasticamente e ciò è ben rappresentato dai concetti espres-si nella famosa “GUM”, la Guida all ’Espressione dell ’Incertezza di Misura, e relative appendici e supple-menti [1].

S p i nt i a n c h e d a g l i e nt i d i accreditamento – che richiedono tas-

come un ricevitore completamente digitale pienamente conforme può ridurre l’incertezza di misura nelle

prove di emissione per compatibilità elettromagnetica

102 InterferenCe teChnology europe emC guIDe 2011

italia



Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests

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sativamente di esprimere l’incertezza di ogni misura – pure nel mondo EMC ci si è via via resi conto che non era più possibile trascurare di dichiarare l’incertezza di misura che un laboratorio era in grado di ottenere, e pertanto si è iniziato un lungo lavoro preparatorio che sta iniziando a

dare i primi frutti sotto forma di norme internazionali EMC che includono specifi ci capitoli a riguardo dell’incertezza di misura [2]. La parte incertezza di misura inclusa nelle norme EMC informa l’utilizzatore su come approcciare il problema, come stabilire dei valori di incertezza massimi

accettabili, da suggerimenti operativi e quant’altro necessario ad impostare correttamente il lavoro.

Ad ingarbugliare ulteriormente un poco le cose occorre ricordare che il settore della Compatibilità Elettromagnetica tratta due grossi temi: emis-sione e immunità. Mentre per il primo aspetto, l’emissione, ci si confronta con una caratteristica misurabile dell’apparecchiatura in prova e quindi si adotta un approccio consolidato già in molti altri ambiti – seppure complicato dal fatto che qui si hanno incertezze estremamente ampie, specie se ci si rapporta ad altre discipline – per ciò che riguarda l ’immunità diviene difficile introdurre il concetto di incertezza per la “con-dizione” passa/non passa che si determina a carico dell’apparecchiatura in prova quando sottoposta a diversi stimoli esterni; semmai si può indicare l’incertezza con la quale si è in grado di generare lo stimolo applicato all’apparecchiatura in prova.

In questo articolo tutte le considerazioni sono riferite a strumentazione (ricevitore, antenna, LISN, camera semianecoica, ecc.) completamente conforme ai dettami delle rispettive norme della serie CISPR 16-1-x e ai relativi metodi di misura in pieno accordo con quanto riportato nella serie CISPR 16-2-x.

Per disporre di riferimenti precisi, si prende come riferimento il ricevitore PMM 9010 (10 Hz – 30 MHz), che è completamente digitale, e il suo complemento per le alte frequenze PMM 9030, che va da 30 MHz a 3 GHz (o PMM 9060, da 30 MHz a 6 GHz), che, per limiti tecnologici, è solo parzialmente digitale ma adotta specifi che soluzioni circuitali per poterlo accoppiare al PMM 9010 mantenendo i vantaggi dell’approccio nu-


2 funzioni per uno guarnizione

Anticorrosione

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F a b r i c a n t e d i g u a r n i z i o n i c o n d u c t i v e s c h e r m a t i

Getelec-94x140 ITA:getelec pub 31/08/10 17:28 Page1

Figura 1. Diagramma a blocchi del ricevitore completamente digitale PMM 9010.

Come un riCev itore Completamenteitalia




merico. Questi ricevitori sono pienamente con-formi alle norme CISPR da 10 Hz sino a 3 GHz o a 6 GHz e, grazie alla particolare architettura, consentono di collegare il ricevitore alta fre-quenza direttamente all’antenna e di utilizzare poi una discesa in fi bra ottica dall’antenna – o da qualsiasi altro trasduttore – sino al laboratorio.

Un nUoVo ricEVitorE di misUra complEtamEntE digitalEÈ da molti anni che nei ricevitori di misura e negli analizzatori di spettro si stanno via via introducendo sottoassiemi digitali per svolgere questa o quella funzione specifi ca (dai DSP in frequenza intermedia, alla gestione digitale dei rivelatori, ecc.), ma il “cuore” dello strumento resta pur sempre analogico e sostanzialmente basato su un’architettura supereterodina che prevede uno o più oscillatori locali e uno o più miscelatori.

Con la componentistica disponibile oggigiorno è però possibile costruire ricevitori completamente digitali fi no ad alcune decine di MHz, ricevitori cioè dove il segnale venga subito convertito in digitale e poi gestito attraverso alcuni adatti algoritmi matematici; in fi gura 1 un possibile schema a blocchi, che nel caso specifi co è quello del ricevitore PMM 9010 qui preso come riferimento. Come si può intuire, dopo un attenuatore e un preselettore di ingresso che non possono che essere analogici – e rimanere tali anche per l’avvenire – vi è subito una conversione analogico-digitale, dopodiché tutte le operazioni e i comportamenti di un ricevitore sono modellati matematicamente attraverso opportuni algoritmi appositamente studiati.

Inutile dire che un ricevitore di questo tipo consente di rispettare pienamente qualsiasi prescrizione CISPR presente o futura, perché il ricevitore emula in tutto e per tutto il compor-tamento del corrispettivo strumento analogico: il miscelatore è simulato numericamente; i fi ltri sono descritti utilizzando la tecnica FIR (Finite Impulse Response) e rispondono alle specifi che CISPR con una perfezione assoluta; i rivelatori sono routine software che seguono esattamente il comportamento teorico indicato dalla norma.

Questo modo di operare, accuratamente stu-diato e progettato, porta numerosissimi vantaggi, con l’unico inconveniente che, purtroppo, la com-ponentistica odierna non consente di utilizzare questo approccio oltre i 30-50 MHz, limite oltre il quale i convertitori analogico-digitali iniziereb-bero a rispondere in modo improprio.

Dato che però 30 MHz è il limite di misura per i disturbi condotti, è comunque possibile adottare l’approccio completamente digitale sino a tale frequenza, con i seguenti rilevanti vantaggi:• Dopo preselettore e attenuatore d’ingresso

nessuna necessità di taratura periodica del ricevitore per l’intera vita dello strumento (i numeri non invecchiano!);

• Filtri IF dalla risposta eccezionale e inalterabile nel tempo: la fi gura 2 mostra il fi ltro a 200 Hz,

dalle caratteristiche pressoché perfette;• Rivelatori emulati matematicamente, la cui risposta

non varia al variare del segnale d’ingresso e che per-tanto lavorano sempre in modo ideale, senza necessità di taratura alcuna per tutta la vita dello strumento in virtù della loro stabilità;

• Riferimento interno di frequenza termicamente com-pensato per le massime prestazioni. Come detto, non è possibile al momento operare una

33

Figura 2. la perfetta risposta del fi ltro CISPR a 200 Hz modellatomatematicamente con la tecnica FIR.

FeSta italia



http://www.teseo.net


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immediata conversione analogico-digitale per frequenze che arrivano ai GHz, ma è però possibile, con tecniche semi-convenzionali, convertire op-portunamente tali frequenze e poi far gestire i segnali ottenuti al ricevitore completamente digitale. Questo è esattamente il modo di operare del PMM 9030 (o PMM 9060), il cui schema a blocchi viene raffigurato nella successiva fi gura 3.

Le dimensioni particolarmente compatte e l’alimentazione a batteria consentono il suo montaggio diret-tamente sull’antenna di misura (o su qualsiasi altro trasduttore, es. pinza per la misura della potenza radiata); il collegamento con l’unità base av-viene per mezzo di una fi bra ottica su cui viene fatto circolare un segnale con apposito protocollo ideato per servire al meglio le attività di misura. La larghezza di banda delle frequenze intermedie utilizzate nel PMM 9030 è tale da non introdurre praticamente alcuna incertezza aggiuntiva.

I vantaggi di questa soluzione combinata non devono essere sot-tovalutati: ai benefici propri di un ricevitore digitale si aggiungono ulte-riori vantaggi dovuti al fatto che per collegare il trasduttore al ricevitore tra 30 MHz e 3 o 6 GHz non si utilizzano più i cavi coassiali, notoriamente uno degli anelli “più deboli” della catena in termini di incertezza e problematiche connesse. Basta infatti considerare che in una tipica configurazione “tradizionale” troviamo, partendo dal ricevitore, un primo spezzone di cavo coassiale che collega detto ricevitore alla paratia con la camera semian-ecoica di misura; poi si trova un altro spezzone che da questa paratia con-

duce al pozzetto posto in prossimità del palo d’antenna; da notare che solo pochissimi costruttori di camere si preoccupano di installare cavi tarati a bassa perdita e a bassa incertezza, e anche questo è un elemento da considerare attentamente. Poi dal pozzetto dell’antenna si ha un ultimo spezzone di cavo – che deve neces-sariamente essere particolarmente fl essibile – che collega l’antenna e che segue i movimenti di scansione verti-cale della stessa; sovente quest’ultimo pezzo di cavo viene corredato di nu-merose ferriti per ridurre al minimo le correnti indesiderate che derivano dall’accoppiamento con l’antenna (e con l’EUT, in alcuni casi). In totale dunque almeno 6 connessioni N-N (il connettore N è obbligatorio per queste applicazioni, preferibilmente la versione a 10 GHz o meglio a 18 GHz): antenna-cavo, cavo-pozzetto, pozzetto-cavo, cavo-paratia, paratia-cavo e infi ne cavo-ricevitore. Oltre a ciò occorre considerare che il cavo dall’antenna al pozzetto è sottoposto a continui movimenti e stress mec-canici, variando in continuazione le posizioni relative con l’antenna e con il piano di massa con conseguenti accop-piamenti indesiderati continuamente variabili ad ogni scansione d’antenna (le ferriti sul cavo non eliminano questi accoppiamenti ma evitano che le correnti conseguenti siano ecces-sivamente ampie).

A questo punto diviene assoluta-mente evidente il grosso vantaggio che deriva dal collegare il ricevitore direttamente all’antenna di misura (o a qualsiasi altro trasduttore: si pensi, come già accennato, alla pinza di cor-rente per le prove di potenza radiata

dal cavo): non solo il rapporto S/N è decisamente migliore, ma anche l ’incertezza ne guadagna in modo considerevole, e tutto ciò non varia con la frequenza! È noto infatti che se sino ad 1 GHz le perdite del cavo sono in qualche modo più o meno sempre accettabili, al di sopra di tale fre-quenza si hanno crescite vertiginose delle perdite, sino ad arrivare a non poter più eff ettuare la misura se non utilizzando adatti preamplifi catori a bassa fi gura di rumore e ad amplissima banda passante. Da ultimo, ma non per questo meno importante, il vantaggio del non dover più tarare tutti questi cavi e connessioni per valutarne la perdita in funzione della frequenza. Queste tarature e verifiche devono essere infatti relativamente frequenti in particolare per il cavo che collega l’antenna, che può danneggiarsi e per il quale qualche ferrite può spostarsi o anche rompersi a seguito degli urti, ecc.

sorgEnti di incErtEzza in Una proVa di EmissionE Emc

Da quanto già accennato si può continuare osservando che in una prova di emissione EMC si possono identifi care 3 aree principali che con-tribuiscono in modo signifi cativo alla fi gura di incertezza globale (per una più completa trattazione della materia si veda ad esempio la [3]):A. L’EUT, inteso come un assieme

composto da hardware – principale e ausiliario, ove necessario - soft-ware e cablaggi, in una specifi ca confi gurazione, allestito in un de-terminato modo opportuno e fatto funzionare secondo criteri defi niti;

Figura 3. Diagramma a blocchi del ricevitore PMM 9030/9060, con IF a banda larghissima.



EMV 2011 – Temi, tendenze e tecnologia a Stoccarda

Efficienza energetica, energie alternative, e-mobility: questi sono solo alcuni dei temi che l’industria EMC presenta come nuove sfide, Le risposte del settore le trovate all’EMV, la fiera europea leader con workshop per la compatibilità elettromagnetica.

La fiera. L’EMV del 2010 è stata caratterizzata da un'ottima atmosfera di lavoro e da buon umore. Sono state 3.425 le persone che hanno visitato la fiera dal 9 all’11 marzo 2010 a Düsseldorf. La maggior parte dei visitatori professionali provenivano dai settori dell’elettronica e dell’elettrotecnica e lavorano nel settore della costruzione e dello sviluppo. La percentuale dei visitatori che si occupano di decisioni aziendali è stata molto alta: 76%. E altrettanto elevato è stato il grado di soddisfazione degli espositori

con la qualità dei visitatori. L’EMV, con una percentuale di espositori stranieri del 50%, offre non solo una gamma di offerta ampia, bensì anche internazionale. Dietmar Rebl della TKD Electronic Europe ha riassunto la sua diretta esperienza con le seguenti parole „L’EMV 2010 è stata una fiera orientata al futuro e presentava un’atmosfera professionale sia per gli espositori che per i visitatori. Per noi della TKD Electronic Europe sono stati tre giorni molto fruttuosi con un elevato potenziale di clienti“. Le prospettive per la prossima EMV sono buone, infatti immediatamente in seguito alla conclusione della manifestazione, già l’80% degli espositori ha confermato la propria partecipazione all’EMV 2011 che si terrà dal 15 al 17 marzo a Stoccarda. Sono più di 100 gli espositori attesi.

Il congresso. Con 1.048 prenotazioni il congresso EMV 2010 ha confermato la sua importanza nel settore. Il programma era composto da 92 sessioni, 12 tutorial, 8 workshop e un seminario dell'associazione promotrice MV Fördervereins NRW e.V. Più di 100 relatori hanno coperto temi del settore della tecnica di misurazione e collaudo, della tecnologia automobilistica, delle direttive EMC e della standardizzazione. Per l’EMV 2011 sono di nuovo in programma 36 workshop di mezza giornata. Questi workshop trasmettono conoscenze specialistiche orientate alla pratica e rappresentano una formidabile possibilità di perfezionamento. La scelta e la combinazione del programma dei workshop spetta al comitato composto da esperti del settore, sotto la presidenza del prof. Marco Leone dell’Università Otto-von-Guericke di Magdeburgo.

Per maggiori informazioni: www.e-emc.com

Intervista con il prof. Marco Leone

Prof. Leone, quali sono i temi attuali del settore EMC? Come evolverà in futuro l’importanza dell’EMC? Gli stati membri UE hanno assunto l’impegno di limitare le emissioni di CO2 dell’8%, rispetto al 1990, entro il 2012. Entro il 2020 l’UE vuole ridurre le emissioni dei gas serra di addirittura il

20%. Si è inoltre posta l’obiettivo di aumentare la quota di energie rinnovabili del 20% entro il 2020. In questo contesto temi quali tecnologia solare, tecnologia eolica, smart grid ed elettromobilità assumono notevole importanza. Queste nuove tecnologie sollevano nuove questioni rispetto all’EMC. Non sono di natura puramente tecnica, infatti influenzano anche la standardizzazione, p.es. per ciò che concerne la determinazione dei valori limite e la scelta dei procedimenti di misurazione e di analisi adatti. Complessivamente, considerando i sistemi sempre più complessi e la crescente integrazione, l’importanza dell’EMC continuerà ad aumentare.

Che cosa rende tanto interessante il lavoro nel comitato dell’EMV? Il comitato è composto da membri di università, dell’industria e di centri di ricerca. Sono tutti grandi specialisti dei più svariati settori dell’EMC. Oltre all’intercambio con colleghi di altri settori specialistici è un compito appassionante radunare assieme tutti i settori d’interesse e indirizzare la manifestazione secondo le giuste tendenze.

Per concludere ancora una domanda personale: qual è il suo settore nell’ambito dell’EMC?

È proprio la varietà tematica che rende questo settore tanto interessante e che crea sempre nuove questioni. Ciò nonostante tutto poggia sulla base sicura dei principi elettrotecnici. Quindi non si tratta di un problema, per quanto complesso possa essere, che non può essere risolto regolarmente in modo sistematico. Il mio settore di lavoro è quello della comprensione fisica dei fenomeni di disturbo per poter identificare le possibilità più semplici ed effettive per contrastarli e per procedere all’ottimizzazione. In questo campo l’analisi e la simulazione a computer giocano un ruolo sempre maggiore. Molti problemi relativi all’EMC hanno origine nel circuito elettronico. Per questo motivo da molti anni mi dedico all’analisi EMC a livello di circuiti stampati.

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B. L’ambiente di prova: il banco di misura, la camera schermata o semianecoica, la cella TEM, le condizioni al contorno;

C. Le apparecchiature di misura: ricevitore, cavi, antenne o sensori o trasduttori vari, il software di misura, ecc.

A. L’EUTQuando l ’EUT è un apparecchio semplice e senza software (o con un software minimo), la situazione è rela-tivamente semplice, perché di solito questo genere di apparecchiature non ha collegati molti cavi. In questi casi l’incertezza dovuta all’EUT è di solito piuttosto ridotta o è comunque agevole ripetere più volte la misura sull’EUT per verificare se ci siano elementi di criticità in questo senso.

Nel caso invece di EUT complessi, con molte funzioni, software e/o fi r-mare operativo articolato e numerosi cavi di ingresso/uscita, allora la situ-azione può essere veramente intricata perché le condizioni operative e di

configurazione possono essere let-teralmente migliaia. Inoltre anche l’allestimento di prova può incidere in modo estremamente rilevante e può addirittura rappresentare di gran lunga il maggior contributo di incertezza in una prova di emissione.

Per questa ragione di solito le norme e le procedure che defi niscono una misura cercano, nel limite del possibile, di stabilire delle regole di confi gurazione e di allestimento che possano aiutare l ’operatore a con-tenere l’incertezza di misura entro limiti accettabili, anche se la cosa non

è sempre né possibile né facile.Per gli scopi di questo articolo il

contributo dovuto all’EUT può però essere “trascurato” in quanto non varia al variare delle apparecchiature di misura.

B. L’ambiente di misuraNegli ultimi anni si sono scritte mi-gliaia di pagine sull ’inf luenza che l’ambiente di misura (es. camera semi-anecoica, cella TEM, banco di prova, ecc.), ha sulle misure e sul contributo dello stesso alla fi gura di incertezza fi nale. Fermo restando che una misura

Figura 4. Come eliminare il cavo coassiale di collegamento tra l’antenna e il ricevitore PMM 9010.

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corretta e ben fatta non può prescindere da un ambiente di misura idoneo, ben costruito e allestito, di prestazioni note e stabili nel tempo e ben tenuto, per gli scopi di questo articolo si può trascurare anche il contributo all’incertezza dovuto all’ambiente di misura perché, come per l’EUT, non varia al variare dell’apparecchiatura di misura.

C. L’apparecchiatura di misuraIn una tipica confi gurazione di misura di emissione il con-tributo all’incertezza dovuto alle apparecchiature di misura si può ulteriormente suddividere in 3 elementi cardine: a) un trasduttore (di solito un’antenna, una LISN, una pinza di corrente o un sensore); b) l’apparecchio di misura vero e proprio (il ricevitore di misura o, in alternativa, un analiz-zatore di spettro); e c) i cavi di connessione tra il trasduttore e il ricevitore.

Le prestazioni e le caratteristiche del trasduttore sono ben specifi cate nelle apposite norme di riferimento (per lo più la serie CEI EN 55016-1-x): il loro contributo alla fi gura totale di incertezza è noto, o valutabile a partire dai dati di ingresso, e in condizioni normali resta relativamente stabile per la durata della misura, a patto che i segnali raccolti dal trasduttore restino entro le specifi che operative dello stesso e non siano tali da ingenerare fenomeni di sovraccarico, saturazione o altro. Va inoltre notato che in molti casi il trasduttore (si pensi ad un’antenna) è un dispositivo passivo caratterizzato da prestazioni che sono funzione delle caratteristiche meccaniche – dimensioni, materiali, geometria, ecc. – e che non mostra signifi cative variazioni di tali prestazioni al pas-sare del tempo, sempre a patto che la sua integrità meccanica sia preservata.

Le prestazioni del trasduttore non variano al variare del ricevitore di misura, mentre invece l’accoppiamento tra il trasduttore e il cavo coas-siale di collegamento – un contributo di incertezza a volte molto importante – può essere totalmente eliminato quando si possa sostituire il cavo coas-siale con una fi bra ottica.

Essendo il pezzo più complesso e delicato della catena di misura, il ricevitore è anche l’elemento su cui focalizzarsi maggiormente per ben valutare una fi gura totale di incertezza: le sue prestazioni possono variare col tempo, con la temperatura, in funzione del segnale misurato, in presenza di componenti di disturbo e così via, anche se usualmente il comportamento di un ricevitore è molto più prevedibile – e molto più control-labile - di quello, ad esempio, dei cavi coassiali di collegamento.

Di grande importanza è anche l’invecchiamento della strumentazione: un ricevitore analogi-co tradizionale è un circuito estremamente complesso, con numerosi circuiti e migliaia e migliaia di componenti. Le derive che conseguono all’invecchiamento dei vari circuiti sono avvert-ibili e misurabili e giocano un ruolo importante nel determinare il valore dell’incertezza di misura associata. L’unico modo per tenere sempre sotto controllo questo comportamento e per avere dati di incertezza aggiornati e affi dabili è provvedere

ad una taratura periodica del ricevitore presso un idoneo centro SIT.

In [3] vengono forniti degli esempi per i parametri usu-almente considerati come sorgente di incertezza, sempre tenendo presente che in un ricevitore analogico tradizio-nale la variazione delle prestazioni nel tempo prevista tra una taratura e la successiva può subire un’accelerazione, anche considerevole, dovuta a fenomeni non prevedibili.

Per ciò che concerne i cavi di collegamento, non solo il loro contributo può essere molto signifi cativo, ma sovente può anche essere del tutto imprevedibile, con variazioni di parametri notevoli in funzione di accoppiamenti indesid-erati e incontrollati tra cavo e trasduttore (cavo e antenna allineati, ad esempio), per via di esposizione a fonti di calore (un cavo al sole in poche ore cambia in modo rilevante le proprie caratteristiche alle alte frequenze), a causa di stress meccanici (pieghe, schiacciamenti), e così via. Tutti questi contributi sono usualmente di diffi cile – se non impos-sibile - controllo e non possono pertanto essere tabulati a priori: si confronti ad esempio la [3], dove – in modo se vogliamo poco realistico ma molto pragmatico - si è seguito l’approccio di considerare il cavo sempre perfettamente adattato e non si sono considerati quegli elementi del tutto imprevedibili. È chiaro che nell’operatività quotidiana oc-correrà aggiungere un “margine” di incertezza dovuto a questi aspetti di diffi cile valutazione, con la conseguenza

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Un EsEmpio di BUdgEt di incErtEzzaPiuttosto che compilare una tabella con solamente dei

valori quantitativi, può essere istruttivo fare anche un confronto tra ricevitore analogico con cavo coassiale e ricevitore digitale con fibra ottica. In questo caso i valori esatti di incertezza potranno essere calcolati caso per caso, in funzione delle apparecchiature ausiliarie di prova e della configurazione in esame. Si noti che i parametri indicati nella seguente tabella 1 sono gli stessi riportati in [3], tabella da A4 a A7, anche se restano in buona parte applicabili anche per le tabelle da A1 a A3 della stessa norma.

conclUsioniL’adozione di un ricevitore completamente digitale per

misure EMC può rappresentare un miglioramento signifi-cativo in termini di incertezza di misura. Paragonato ad un ricevitore tradizionale, uno strumento digitale pienamente conforme ha prestazioni di incertezza uguali o superiori in tutte le caratteristiche, col vantaggio che inoltre con esso è possibile diminuire moltissimo - o in qualche caso annullare completamente – alcuni dei contributi dovuti al ricevitore; l’adozione di un collegamento in fibra ottica per frequenze superiori a 30 MHz permette di estendere questi benefici anche alle situazioni in cui si usano elementi critici come cavi e antenne, a tutto vantaggio della figura

di incertezza globale. Inoltre un ricevitore digitale si dimostra superiore anche in termini di costo di gestione, perché, ad esempio, non necessita di tara-ture della parte digitale, non ha bisogno di tempi di attesa all’accensione (“warm-up”), manutenzione e riparazioni sono immediate e possono essere fatte ovunque. In altri termini, la confidenza as-sociata al risultato può essere maggiore quando si effettuano misure con un ricevitore digitale, con grande beneficio della qualità delle misure e della velocità di esecuzione delle stesse.

BiBliografia• [1.] CEI UNI ENV 13005:2005 Guida all’espressione dell’incertezza di misura• [2.] IEC 61000-4-6 Ed. 3 Electromagnetic compat-ibility (EMC) – Part 4-6: Testing and measurement tech-niques – Immunity to conducted disturbances, induced by radio-frequency fields• [3.] Bozza di norma CISPR 16-4-2 Specification for radio disturbance and immunity measuring apparatus and methods – Part 4-2: Uncertainties, statistics and limit modelling – Uncertainty in EMC measurements, IEC, 2010 (CISPR/A/901/CDV).• [4.] Domenico Festa, Roberto Grego, Michele Zingarelli “Better Measurement Uncertainty Using Fully Digital Receivers in EMC Emission Tests” - 2008 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19 th International Zurich Symposium On Electromagnetic Compatibility

Dopo qualche anno di lavoro in IBM sui fenomeni elettro-magnetici associati alla lettura e scrittura di dischi rigidi, floppy e ottici, il Dr. Domenico Festa si avvicina nel 1985 alla Compatibilità Elettromagnetica e dal 1987 svolge il ruolo di Coordinatore EMC per IBM Italia e Semea.

di aumentare la figura totale di incertezza associata al risultato della misura.

Utilizzando un ricevitore sufficientemente piccolo da poter essere collegato direttamente al trasduttore di misura - come illustrato in Figura 4 - e veicolando poi il segnale misurato con una fibra ottica, tutti questi numerosi elementi di incertezza sono automaticamente cancellati, con grande vantaggio in termini di incertezza di misura.


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Grandezza

Incertezza sulla letturaInvecchiamento

Attenuazione:Antenna-ricevitore (LISN-ricevitore è analogo)CaviConnessioni

Correzioni al ricevitore:Tensione sinusoidaleRisposta all’impulso - ampiezzaRisposta all’impulso – ripetizione (@ 20 Hz)

Disaccoppiamento:antenna-ricevitoreantenna-cavocavo-cavo

Bilanciamento dell’antennaAccoppiamento tra cavi e massaAccoppiamento tra cavi e antennaTBD significa che c’è sicuramente un contributo all’incertezza, ma esso è da determinare

Analogico

±0,1TBD

±0,1TBDTBD

±1,0±1,5±1,5

+0,9/-1,0TBDTBD

±0,9TBDTBD

Digitale (PMM 9030)

Uguale o miglioreAssente

UgualeAssenteAssente

±0,3±0,5±0,2

UgualeAssenteAssente

MiglioreAssenteAssente

Digitale (PMM 9010)

Uguale o miglioreAssente

Uguale sino a 30 MHzUguale sino a 30 MHzUguale sino a 30 MHz

±0,15±0,2±0,2

Tabella 1. Ricevitore analogico e ricevitore digitale a confronto.




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IFI - Instruments for Industry Adler Instrumentos, S.L., C/Antonio de Cabezon, 83 28034 Madrid España; +34 913584046; Fax: +34 913581383; Millian Fernandez, [email protected]; www.adler-instrumentos.esProducts & Services: Amplifi cadores, Antenas, Filtros, Habitaciones y recintos aislados, Instrumentación para pruebas, Pruebas

INTACTRA. AJALVIR, KM. 4 28850, Torrejon de Ardoz, España; +34 91 520 1200; www.inta.esProductos y servicios: Pruebas

ITAMARIA DE LUNA, 8 50018 Zaragoza, España; +34 976716250; www.ita.esProductos y servicios: Pruebas

ITEAvda. Juan de la Cierva, 24. (Parque Tec-nológico de Valencia ) , 4 6 9 8 0 Paterna, España; +34 961366670; www.ite.esProductos y servicios: Pruebas

L

Labien TecnaliaParque Tecnológico de Bizkaia. C/Geldo, Edifi cio 700, 48160, Derio, España; +34 94 607 33 00; Fax: +34 94 607 33 49, www.labein.esProductos y servicios: Pruebas

LACECALE.T.S. Ingenieros Industriales, Paseo del Cauce s/n 47011, Valladolid, España; +34 983423343; Fax: 983 423 996; www.lacecal.es; [email protected] y servicios: Pruebas

LCOEJosé Gutiérrez Abascal, 2, 28006, Madrid, España; +34 91562511; Fax: 91 561 8818; www.ffi i.es/lcoe/lcoe_portada.aspProductos y servicios: Pruebas

Lifasa International

E

Eldonvasa ABP° de la Finca, 1 Edifi cio 13, Madrid 28223, España; +34 95 355 10 00; Fax: +34 95 355 15 39; [email protected]; www.eldon.com Productos y servicios: Habitaciones y recintos aislados

EM Test AG

ALAVA Ingenieros S.A., C/ Albasanz 16 - Edifi cio Antalia, 28037 Madrid, España; +34 (0)91 567 97 00; Fax: +34 (0)91 570 26 61; [email protected]; www.alava-ing.esProducts and Services: Sobrecargas y transitorios, Pruebas Instrumentation, Pruebas

EMC Partner AGWAVECONTROL, Pallars, 65 - 71 ES - 08018 Barcelona España; +34 933 20 80 55; Fax: +34 933 20 80 56; Jordi Accensi,[email protected];

www.wavecontrol.comProducts & Services : Sobrecargas y transitorios, Instrumentación para pruebas

FFair-Rite Products Corp. Redislogar, Anabel Segura, 11 Centro de Negocios Albatros, Edifi cio B 28108 - Alcobendas Madrid, España; +34 902 50 99 80; Fax: +34 91 659 1436; [email protected]; www.fair-rite.comProducts and Services: Artículos con ferrita, Filtros, Habitaciones y recintos aislados, Aislamiento

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GCEMUPC Campus Nord. Building C4, c/ Jordi Girona 1-3., 08034, Barcelona, España; +34

934011021; Fax: 34-934011021, www.upc.edu/web/gcem; [email protected] y servicios: Pruebas

H

Haefely EMC DivisionRohde & Schwarz Espana S.A., Avda. Al-calde Barnils, 64-68, Edifi ci Testa Mod.C,


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ASSOCIATIONS

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SECRETARÍA DE ESTADO DE TELECOMUNICACIO-NES Y PARA LA SOCIEDAD LGAI TECHNOLOGICAL CENTER, S. A./APPLUSCampus UAB, Apto Correos 18, 08193 Bellaterra (Bar-celona), España; +34 935 672 000; Fax: +34 935 672 001; [email protected]; www.appluscorp.comNotifi ed Body number : 0370

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ESPAÑA | Los Recursos

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http://www.adler-instrumentos.es

Jason smithApplications Engineering Manager Pat malloy, sr. Application Engineer AR/RF Microwave Instrumentation Souderton, Pennsylvania, USA * Traducido por Jordi Accensi, Wavecontrol, Barcelona, España

Con las prisas de finalizar ensayos de inmunidad radiada a tiempo, es bastante usual pasar por alto

las limitaciones de los equipos. Mien-tras algunas características de los equi-pos, como los armónicos de los ampli-ficadores de potencia, son obviamente un factor de limitación, la característica de banda ancha de antenas, acopla-dores, vatimetros y sondas isotrópicas difícilmente se pueden considerar como factores limitadores en la mayoría de las aplicaciones.

Sin embargo, cuando se utilizan con amplificadores de potencia que pueden generar niveles altos de armónicos durante los ensayos de inmunidad, sus características de banda ancha añaden incertidumbre y errores de medida inaceptables.

Un ejemplo de ello son las sondas de campo isotrópicas que muestran una lectura del nivel de campo de la energía total de todas las frecuencias incluidas en su banda de funcionamiento. En el caso ideal de disponer de un tono puro sinusoidal, estas sondas ofrecen una lectura precisa, pero si tenemos en cuenta que otras frecuencias pueden estar presentes, se producen errores durante la lectura. Dependiendo de la

cantidad y el nivel de estas frecuencias existentes, se puede llegar a un punto donde la lectura del nivel de campo deja de ser representativa del nivel de campo requerido a la frecuencia deseada.

Las frecuencias no deseadas mas problemáticas son los armónicos generados por las no linealidades del sistema RF. A menudo los amplifi-cadores de potencia, especialmente aquellos que se utilizan hasta su punto de saturación, son la mayor fuente de armónicos. En un menor grado, las fuentes de señal, como los generadores, pueden mostrar alguna no linealidad que también provoca el aumento de los niveles de los armónicos. En conse-cuencia, la norma IEC/EN 61000-4-3 ha introducido requisitos en los sistemas de RF utilizados durante los ensayos para limitar los niveles de armónicos en el campo de ensayo.

Si bien es imperativo considerar los niveles de armónicos suministrado por los fabricantes de cada instrumento, los ingenieros de ensayo también deben confirmar los datos del fabricante me-diante verificaciones.

¿Qué son los armónicos?Armónicos son frecuencias no deseadas generadas por no linealidades del sistema. Son múltiplos de la frecuencia fundamental del ensayo, y normalmente a medida de aumenta el múltiplo de la frecuencia fundamental (numero de armónico) su nivel se reduce.

Todos los sistemas reales tienen no linealidades y por eso todos generan distorsión armónica. El ingeniero de ensayo debe determinar los niveles

Distorsion armónica en sistemas de Ensayos de inmunidad

116 InTERFEREncE TEchnology EURoPE EMc gUIdE 2011

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Harmonic Distortion in Immunity Test Systems

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Copyright © 2010 AR. La franja naranja en los productos AR está registrada en la Oficina de marcas registradas y patentes de EE.UU.


Tan fácil como coser y cantar.

Para realizar Pruebas de inmunidad conducida de radiofrecuencia según las normas IEC, militares y del sector de la automoción.

Los Sistemas de prueba de inmunidad conducida originales de AR consiguieron facilitar un proceso complicado y aumentar su precisión. Simplificarontodos los aspectos que implica el proceso: calibración, pruebas, solución de problemas de DUT y generación de informes. El Sistema CI presenta la flexibilidadintegrada de realizar pruebas personalizadas y control de software que incluye selección de normas, calibración, ejecución de pruebas y generación de informesdirectamente en Microsoft® Word o Excel.

Estos excelentes sistemas presentan, además, un alcance de sensibilidad más amplio, excelente velocidad y la posibilidad de realizar precisas pruebas de margen.

Ningún otro producto se le había, ni siquiera, acercado. Hasta ahora. Porque ahora AR presenta su nuevo Sistema de CI, el CI00401A. Gracias a los tres Sistemas de pruebas de inmunidad conducida que puede elegir, no

tendrá que volver a realizar nunca más laboriosos procedimientos de prueba de CI manuales, ni tampoco tendrá que preocuparse de la fiabilidad de los resultados. Nadie puede mejorar los resultados de AR Systems: 1. Modelo CI00250A (amplificador de 75 vatios, 10 kHz – 250 MHz): soluciones de pruebas completa para las siguientes normas: EN/IEC 61000-4-6,

IEC 60601-1-2, EN 50130-4, EN 61000-6-1/2 y EN 55024. 2. Modelo CI00400A (amplificador de 100 vatios, 10 kHz – 400 MHz): soluciones de pruebas completa para las siguientes normas: Pruebas

MIL-STD-461D y E CS114, DO160D y E BCI, EN/IEC 61000-4-6, IEC 60601-1-2, EN 50130-4, EN 61000-6-1/2, EN 55024. 3. Modelo CI00401A (amplificador de 150 vatios, 100 kHz – 400 MHz): soluciones de pruebas completa para las siguientes normas:

ISO 11452-4, GMW 3097, ES-XW7T-1A278-AC, DC-11224, BMW GS95002 y otras normas del sector de la automoción. AR distribuye una amplia variedad de soluciones de radiofrecuencia exclusivas a algunas de las empresas más conocidas de todo el mundo. Nuestros

productos están respaldados por la garantía más potente y completa del sector, y por una red de asistencia técnica internacional sin igual. Llame a su asociadocomercial de AR para solicitar una demostración.

En España, póngase en contacto con WAVECONTROL, S.L., www.wavecontrol.com o llame al número de teléfono +34-933-208-055

CI00250A CI00400A

CI00401A


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aceptables de armónicos. Esta determinación esta basada principalmente en las indicaciones de las normas. En apli-caciones como los ensayos EMC, la principal causa de ar-mónicos son los amplificadores RF de potencia.

EntEnDiEnDo armónicos En un amPlificaDorTodos los amplificadores de potencia generan distorsión armónica. Mientras algunas aplicaciones no se ven afectadas por estos armónicos, niveles altos de distorsión en la señal pueden introducir errores inaceptables en los ensayos de inmunidad durante ensayos de compatibilidad electromagné-tica (EMC). Por eso, la distorsión armónica es un parámetro crítico en las especificaciones de los amplificadores. Ha sido probado que un amplificador de clase A cuando se opera en su zona lineal genera niveles aceptables de armónicos y son una elección ideal para aplicaciones de compatibilidad elec-tromagnética (EMC) en detrimento de otros diseños como los Clase AB o Clase B.

Tenga en cuenta que incluso el mejor diseño de un am-plificador de clase A no garantiza disponer de un ensayo libre de armónicos. Incluso con el sacrificio de disponer de una señal de salida de menor nivel es de vital importancia operar con los amplificadores dentro de su zona lineal. Hacer funcionar un amplificador mas allá de su zona lineal nos ayudará a disponer de mayores niveles de campo, pero la distorsión armónica generada en este caso nos introducirá incertidumbres y errores en las lecturas del campo generado.

Al final, la pregunta que nos hacemos es “¿cual es el nivel máximo de la señal de entrada para asegurar la puridad de-seada en una aplicación especifica?”. Las pruebas muestran que un amplificador para ensayos EMC no debe operarse por encima de 1dB de de compresión. De hecho, operar incluso en una zona mas lineal, por debajo de 1dB de compresión, reduce considerablemente los armónicos.

Otra solución, no tan deseable, es utilizar filtros de armónicos a la salida de los amplificadores. Esta opción al aumentar el coste, aumentar las perdidas de inserción y añadir complejidad al sistema, solo debe considerarse cuando no hay ninguna otra opción posible. Por ejemplo, algunos amplificadores de tubos (TWTA) necesitan utilizar filtros de armónicos para reducir su distorsión.

Al ser completamente imposible predecir los efectos acu-mulativos de cada uno de los componentes del sistema en la puridad del campo, es necesario realizar una verificación del nivel del sistema completo.

Se tienen que consultar los datos suministrados por los fabricantes, y aunque nos fiemos de estos datos, para probar la viabilidad del diseño de un sistema, lo mejor es realizar una verificación mediante ensayos de los niveles del sistema completo.

¿como afEcta la influEncia DE múltiPlEs sEñalEs a las mEDiDas DE PotEncia?

La mayoría de sondas de campo y sensores de potencia utilizan diodos con características de banda ancha. Estos equipos no son selectivos en frecuencia y miden todas las señales dentro de su margen de funcionamiento. La lectura resultante es la raíz cuadrada de la suma de los cuadrados de la amplitud de la señal fundamental y todos sus armónicos presentes. Claramente los armónicos introducen incertidum-

bres y errores en la medidas del campo. Los armónicos son inevitables y eliminarlos completa-

mente sería una solución extremadamente costosa. Así pues, la interrogante es determinar cual es un nivel aceptable de armónicos.

Afortunadamente, la norma IEC 61000-4-3 ofrece una guía en este sentido. La última versión de esta norma espe-cifica que para todas las frecuencias en las que se producen armónicos a la salida del amplificador, el rechazo de estos armónicos en el campo en 6dB por debajo de la fundamental es adecuado. En otras palabras, ahora hay un requisito en cuanto a la distorsión armónica de -6 dBc. La unidad dBc es la medida del nivel de un armónico especifico respecto el nivel de la señal portadora. Una medida de - 6dBc por definición significa que la amplitud del armónico es 6 dB menor que el nivel de la portadora.

Anteriores versiones de la norma IEC 61000-4-3 especifi-caban la distorsión armónica a la salida del amplificador. En la última versión de la norma toma en consideración el sistema completo al especificar los –6 dBc. Este nivel tiene en cuenta el hecho que una antena transmisora opera mas eficientemente en el 3er armónico que en la fundamental. Es usual ver hasta 5 dB de variación en la ganancia. Según las indicaciones del anexo D de la norma IEC 61000-4-3, limitar los armónicos en el campo de test hasta –6 dBc ayuda a con-tener el error de lectura del nivel de campo por debajo del 10%. Con un nivel de armónicos de -6 dBc una lectura de 10V/m de una sonda de hecho representa 9V/m de la portadora. Si el ensayo necesita mejor precisión, por ejemplo como máximo un 5% de error en la lectura del nivel de campo, la distorsión armónica deberá ser al menos de -10dBc. Las normas que no toman en consideración el efecto de las antenas transmisoras se enfocan en los armónicos generados por los amplificado-res. Por ejemplo, versiones anteriores de la IEC 61000-4-3 limitaban la distorsión armónica del amplificador a -15dBc.

Si lo comparamos con el nuevo requisito de -6dBc de distorsión total, la limitación de -15dBc ofrecía un error ligeramente inferior en la lectura del campo.

Pat Malloy has been the sales application engineer at Amplifier Research, now AR, since 1987. Previous work experience includes four years with the U.S. Navy as a guided-missile electronic technician, seven years in an engineering group at AT&T Bell Laboratories, and 16 years as a senior sales engineer for Tektronix. He graduated from Lafayette College in 1972 with a B.S.E.E. He can be reached at [email protected]

Jason Smith has been the applications engineering manager at AR since 2004. Previous work experience includes test engineer and EMC lab manager at Radiation Systems and EMC lab manager at Analalb, LLC. Jason has over 10 years experience in EMC testing experience with military, avionics, commercial, medical, telecom and automotive applications. He is a member of the USNC to SC77B and SC77C and a participating member of WG10 (IEC 61000-4-3, -6). He graduated from the University of Delaware in 1997 with a B.S. in Engineering Technology. He can be reached at [email protected]

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National Institute of Telecommunications-PolandSzachowa Str. 1, 04-894 Warsaw, Polska; (+48 22) 51 28 100; Fax: (+48 22) 51 28 625; www.itl.waw.pl; [email protected] i usługi: Testowanie

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Popek Elektronikul. Jasminowa 28,22-400 Zamosc Polska; 48 84 639-49-84; Fax: 48 84 639-41-36; www.popek-elektronik.com; [email protected] i usługi: Wzmacniacze

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Radiotechnika Marketingul. Fabryczna 20, Pietrzykowice, 55-080 Kąty Wrocławskie, Polska; +48 71 327 07 00; Fax: +48 71 327 08 00; http://radiotechnika.com.pl; offi [email protected] i usługi: Filtry, Kable i złącza

Rohde & Schwarz Oesterreich Sp. z o.o.ul. Stawki 2, 00-193 Warszawa, Polska; (+48 22) 860 64 90 do 98; Fax: (+48 22) ,860-64-99; [email protected]; www.rohde-schwarz.com.pl Produkty i usługi: Przyrządy pomiarowe

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Schlegel Electronic MaterialsDomar Mariusz Dowbor Sp.J., ul. Botaniczna 54/56, 04-543 Warsaw Polska; +48228721200; Fax: +48228721205; Tomasz Gilewski, [email protected]; www.domar.waw.plProdukty i usługi: Materiały przewodzące, Ekranowanie

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Teseq LtdAstat sp. z o.o.; +48 61 849 80 61; [email protected]; www.astat-emc.com.plProdukty i usługi: Wzmacniacze, Anteny, Przyrządy pomiarowe, Testowanie

Tespol Sp. z o.o.ul. Klecinska 125, 54-413 Wrocław, Polska; 71 783 63 60; Fax: 71 783 63 61; www.tespol.com.pl; [email protected] i usługi: Przyrządy pomiarowe

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Fair-Rite Products Corp.Industrial Electronics, Hauptstr. 71 - 79 D-65760 Esch-born, Polska; +49-6196-927900; Fax: +49-6196-927929; [email protected]; www.fair-rite.comProdukty i usługi: Rdzenie ferrytowe, Filtry, Ekranowane pomieszczenia i obudowy, Ekranowanie

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Instytut Logistyki i Magazynowaniaul E. Estkowskiego 6, 61-755 Poznan, Poland, +48 61 850 49 89, 850 94, 850 48 90, Fax: +48 61 852 63 76, www.ilim.poznan.pl, [email protected] i usługi: Testowanie

IFI - Instruments for Industry Unitronex Corporation, Ul. Grzybowska 87, 00-844-War-saw Polska; 4822-631-2643; Fax: 4822-632-7559; Marek Jachna, [email protected]; www.unitronex.comProdukty i usługi: Wzmacniacze, Anteny, Filtry, Ekranowane pomieszczenia i obudowy, Przyrządy po-miarowe, Testowanie

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KemtronAstat sp z.o.o, Dabrowskiego 441, 60-451 Poznan, Polska; +48 61 848 88 71; Fax: +48 61 848 82 76; [email protected]; www.astat-emc.com.plProdukty i usługi: Materiały przewodzące, Rdzenie fer-rytowe, Filtry, Ekranowanie

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Meratronik S.A.Ul. Indiry Gandhi 19, 02-776 Warszawa, Mazowieckie, Polska; (22)8553432; 6441207; Fax: (22)6442556; Janusz Rzysko, [email protected]; www.meratronik.pl Produkty i usługi: Przyrządy pomiarowe

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ABC Elektronik Sp. z o.o.38-300 Gorlice, ul. Kolejowa 10, Polska; +48 18 353-66-65; Fax: +48 18 353-68-33; www.abcpol.pl; [email protected] Produkty i usługi: Anteny, Filtry, Rdzenie ferrytowe, Ekranowanie

AH SystemsAM Technologies, ul. Nakielska 3, 01-106 Warszawa, Polska; 48 22 53 22 801; Fax: 48 22 53 22 828; www.amt.pl; [email protected]; www.AHSystems.comProdukty i usługi: Anteny, Przyrządy pomiarowe, Testowanie

AR RF/Microwave InstrumentationUrzadzenia Elektroniczne Import, ul. Kierbedzia 4 pok. 203, Warszawa, Polska 00-728; +48 (22) 313 17 35; Fax: +(022) 313 1736; Dr. inz Marek Synowiec, [email protected]; www.ar-worldwide.com Produkty i usługi: Wzmacniacze, Anteny, Kable i złącza, Ekranowane pomieszczenia i obudowy, Zabezpieczenia przepięciowe i przebiegu przejściowego, Przyrządy pomiarowe

ASTAT Sp. z o.o.Dabrowskiego street 441, Posnan, 60-451 Polska; Fax: 48 61 849 80 61; 48 602 354 067; www.astat.com.pl; [email protected] Produkty i usługi: Testowanie

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EM TEST Polska, ul. Ogrodowa 31/35, 00-893 Warszawa, Polska; +48 518 643 512; [email protected]; www.emtest.com/plProdukty i usługi: Zabezpieczenia przepięciowe i prze-biegu przejściowego, Przyrządy pomiarowe, Testowanie

EMC Partner ASTAT sp. zo.o, ul. Dabrowskiego 441, PL - 60 451 Poznan Polska; +48 61 849 80 61; Fax: +48 61 848 82 76; Lukasz Wilk; [email protected]; www.astat.com.pl Produkty i usługi: Zabezpieczenia przepięciowe i prze-biegu przejściowego, Przyrządy pomiarowe

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CertyfikatISO 9001:2008

Technologia gięcia elementów firmy AR umożliwia ograniczenie rozmiarów aż do 75% oraz zapewniadoskonałe parametry techniczne.

Nasza gama anten krzyżowych o giętych elementach, pracujących w zakresie od 26 MHz do 6000 MHz, to urządzenia mniejsze nawet o 75%, lżejsze i bardziej kompaktowe niż standardowe anteny logarytmiczno-okresowe. Obsługują one szeroki zakres częstotliwości, oferująwzmocnienie na poziomie 6 dB i wytwarzają wysokie pola nawet w najtrudniejszych aplikacjach. Małe wymiary to nie tylko większa mobilność,ale również mniejsze straty w zakresie „obciążenia pomieszczenia”.

Dzięki tym innowacyjnym antenom, firma AR rozwinęła technologię anten logarytmiczno-okresowych. Konstrukcja jest na tylerewolucyjna, że musieliśmy ją opatentować, aby ją chronić.

Nasza najnowsza antena krzyżowa definiuje jeszcze śmielsze granice. Antena ATR26M6G-1 (zakres od 26 do 6000 MHz/moc wejściowa5000 W) wykracza ponad obowiązujące wymagania w zakresie czułości, dzięki czemu jest dobrze przygotowana do przyszłych zastosowań. A solidna konstrukcja odpowiednio wspiera poziomy wysokiej mocy, które są wymagane do wytworzenia skutecznych pól typu E.

Wszystkie anteny krzyżowe są dopasowane pod kątem częstotliwości i mocy do wzmacniaczy AR. Można je również kalibrować w celuprzeprowadzenia testów emisyjnych.

Nic dziwnego, że ta małe anteny cieszą się takimi powodzeniem!

W Polsce należy skontaktować się działem Urządzenia Elektroniczne Import,

[email protected] lub zadzwonić pod numer +48 (022) 313 17 35

Nagięliśmy zasady.



ASSOCIATION

IEEE EMC SOCIETY CHAPTERFryderyk Lewicki, Orange Labs, Telekomunikacja Polska S.A. ul. B. Prusa, 9, 50-319 Wroclaw, Poland; +48 71-321-0924; Fax: +48 71-321-0952; [email protected]

NOTIFIED BODIES

ELTEST M. JEWTUCH SPOLKA JAWNAul. Ratuszowa 11, 03-450 WARSZAWA, Poland ; +48 (22) 619 39 66; Fax: +48 (22) 619 39 66; [email protected]; www.eltest.com.plNotifi ed Body number : 1465Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

INSTYTUT ELEKTROTECHNIKIul. Pozaryskiego 28, 04-703 WARSZAWA, Poland; +48 22 812 00 21; Fax: +48 22 615 75 35; [email protected]; www.iel.waw.plNotifi ed Body number : 1460Directives: 88/378/EEC Safety of toys2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility

INSTYTUT LOGISTYKI I MAGAZYNOWANIAul. E. Estkowskiego 6, 61-755 POZNAN, Poland; +48 61 850 48 90; Fax: +48 61 852 63 76; offi [email protected]; www.ilim.poznan.plNotifi ed Body number : 1664Directives: 99/5/EC Radio and telecommunications terminal equipment2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

INSTYTUT MECHANIZACJI BUDOWNICTWA I GORNICTWA SKALNEGOul. Racjonalizacji 6/8, 02-673 Warszawa, Poland; +48 22 843 27 03; Fax : +48 22 843 27 03; [email protected]; www.imbigs.org.plNotifi ed Body number : 1454Directives:89/106/EEC Construction products2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

INSTYTUT ZAAWANSOWANYCH TECHNOLOGII WYT-WARZANIAUl. Wroclawska 37 A, 30-011 KRAKOW, Poland; +48 12 63 17 100; Fax: +48 12 63 39 490; [email protected]; www.iztw.krakow.pl

Notifi ed Body number : 1455Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

INSTYTUT TELE- I RADIOTECHNICZNYul. Ratuszowa 11, 03-450 Warszawa, Poland; +48 22 619 22 41; Fax: +48 22 619 29 47; [email protected]; www.itr.org.plNotifi ed Body number : 1941Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

JEDNOSTKA OPINIUJACA, ATESTUJACA I CERTYFIKU-JACA WYROBY TEST SP. Z O.O.ul. Wyzwolenia 14, 41-103 Siemianowice Slaskie, Poland ; +48 32 73 08 200; Fax: +48 32 73 08 200; [email protected]; www.joac-test.plNotifi ed Body number : 2057Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility 2006/42/EC Machinery

OSRODEK BADAN ATESTACJI I CERTYFIKACJI OBAC SP. Z.O.O.ul. Jasna 31, 44-122 GLIWICE, Poland ; +48 32 239 44 82; Fax: +48 32 239 44 87;Email : [email protected]; www.obac.com.plNotifi ed Body number : 1461Directives: 94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

OSRODEK BADAWCZO-ROZWOJOWY CENTRUM TECHNIKI MORSKIEJ S.A.ul. Dickmana 62, 81-109 Gdynia, Poland; +48 58 66 65 300; Fax: +48 58 66 65 304; [email protected];www.ctm.gdynia.plNotifi ed Body number : 2075Directive: 2004/108/EC Electromagnetic compatibility

OSRODEK BADAWCZO-ROZWOJOWY PREDOM-OBRul. Krakowiakow 53, 02-255 WARSZAWA, Poland ; +48 22 846 19 51; Fax: +48 22 846 19 51; [email protected]; www.predom.com.plNotifi ed Body number : 1451Directives: 2009/142/EC (ex-90/396/EEC) Appliances burning


POLSKA Zasoby

gaseous fuels2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

POLSKIE CENTRUM BADAN I CERTYFIKACJI S.A.ul. Klobucka 23A, 02-699 Warszawa, Poland ; +48 22 464 52 01; Fax: +48 22 647 12 22; [email protected]; www.pcbc.gov.plNotified Body number : 1434Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

POLSKI REJESTR STATKOW S.A.Al. Gen. Jozefa Hallera 126, 80-416 GDANSK, Poland; +48 58 346 17 00; Fax: +48 58 346 03 92; [email protected]; www.prs.plNotified Body number : 1463Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

PRZEMYSLOWY INSTYTUT AUTOMATYKI I POMIAROWAl. Jerozolimskie 202, 02-486 WARSZAWA, Poland; +48 22 874 04 02; Fax: +48 22 874 02 20; [email protected]; www.piap.plNotified Body number : 1548Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

URZAD DOZORU TECHNICZNEGOul. Szczesliwicka 34, 02-353 Warszawa, Poland; +48 22 57 22 101, +48 22 57 22 110; Fax: +48 22 822 72 09, +48 22 57 22 129; [email protected]; www.udt.gov.pl;Notified Body number : 1433Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility

WROCLAW UNIVERSITY OF TECHNOLOGYInstitute of Telecommunications, Teleinformatics and AcousticsElectromagnetic Compatibility LaboratoryWybrzeze St. Wyspianskiego Str.27, PL50-370 Wro-claw, Poland ; Phone: +48 71 320 29 47, +48 71 320 42 96, +48 71 320 27 30; Fax: +48 71 320 31 89, +48 71 322 36 64; [email protected]; http://zrt.pwr.wroc.pl/en/ Notified Body number : 1975Directive: 2004/108/EC Electromagnetic compatibility

ZAKLADY BADAN I ATESTACJI “ZETOM” IM. PROF. F. STAUBA W KATOWICACH SP. Z O.O.ul. Ks. Bpa Herberta Bednorza 17, 40-384 KATOWICE, Poland ; +48 32 256 92 57; Fax: +48 32 256 93 05; [email protected]; www.zetomkatowice.com.plNotified Body number : 1436Directives: 88/378/EEC Safety of toys89/106/EEC Construction products2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility2006/42/EC Machinery

OTHER

MINISTRY OF INFRASTRUCTURE,DEPARTMENT OF TELECOMMUNICATIONSul. Chałubińskiego 4/6, 00-928 Warszawa, +48 22 522 5006; Fax: +48 22 522 5045; Marek Wysocki, [email protected]

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Zasoby | POLSKA

http://www.ifi.com


ASTATPoznan, Polska

LAborATorium EmC (AkrEdyTowAnE, komErCyjnA inSTyTuCjA)

Producenci ograniczają zakres realizowanych badań do min. (tak by zaoszczędzić koszty, czas), najczęściej kojarzą obowiązujące dyrektywy z koniecznością sprawdzenia bezpieczeństwa elektrycznego (dyrektywa LVD). Jeśli już inwestują w badania EMC to starają się ograniczyć program badań do ESD i przewodzonego RF (odporność i emisja) co świadczy o tym, że są świadomi problemów z tymi próbami lub tylko o takich testach wiedzą.

Mało który Klient potrafi przygotować samodzielnie program badań. Małych firm nie stać na prowadzenie badań i one z nich rezygnuja (deklaracja zgodności jest podpisana bez badań)

LAborATorium EmC (AkrEdyTowAnE, w STrukTurzE uCzELni wyżSzEj)w Polsce jest ustawa wdrażająca dyrektywę EMC o której nie wszyscy wiedzą , PKN prowadzi aktualny wykaz zhar-monizowanych norm gdzie można uzyskać do nich dostęp (za opłatą), przy Polskiej Akademii Nauk jest Komitet EMC ktorego członkowie wspierają ideę propagowania wiedzy na temat EMC. Kliencie tego laboratorium przestrzegają norm EMC i nowo opracowane wyroby spełniają normy.

LAborATorium EmC (AkrEdyTowAnE, w STrukTurzE inSTyTuTu nAukowEgo)Kwestie formalno-prawne związane z dyrektywą 2004/108/EC są w Polsce uregulowane na podstawie odnośnych ustaw państwowych i rozporządzeń ministerialnych. W szczególności należy wymienić „Ustawę z dn. 13.04.2007 o kompatybilności elektromagnetycznej” (Dz. U. z dnia 11 maja 2007 r.) oraz „Rozporządzenie Ministra Transportu i Budownictwa z dnia 27 grudnia 2005 w sprawie dokonywania oceny zgodności aparatury z zasadniczymi wymaganiami dotyczącymi kompatybilności elektromagnetycznej oraz sposobu jej oznakowania”. Stan prawny w Polsce jest zgodny z prawem europejskim. Nadzór rynku krajowego w zakresie przestrzegania zgodności z wymienioną dyrektywą prowadzi Urząd Komunikacji Elektronicznej (Warszawa, ul. Kasprzaka 18). W ramach tego nadzoru prowadzi się kontrole w sklepach, hurtowniach i bezpośrednio u producentów. Większość kon-troli polega tylko na sprawdzeniu dokumentacji wyrobów. W uzasadnionych przypadkach UKE wykonuje laboratoryjne badania wyrobów w zakresie EMC w celu stwierdzenia

zgodności w wymaganiami podstawowymi dyrektywy 2004/108/EC.

Źródłem informacji na temat stanu przestrzegania wymagań dyrektywy EMC w Polsce jest UKE, który jako jedyna instytucja ma podstawy do całościowej oceny w skali kraju. Proponuję zwrócić się do nich z prośbą o udostępnienie informacji na ten temat.

O ile pamiętam z jakiegoś seminarium, rocznie UKE wykonuje kilka tysięcy kontroli oraz bada w swoim labora-torium kilkuset wyrobów. Stan przestrzegania wymagań dyrektywy EMC w Polsce polepsza się z roku na rok. Nadzór rynku krajowego skupia się głównie na wyrobach pow-szechnego użytku (np AGD) i jest raczej słabszy w sektorze aparatury do zastosowań przemysłowych.

Na podstawie wieloletnich doświadczeń z pracy w labora-torium EMC można stwierdzić, że zdecydowana większość (> 70 %) nowych konstrukcji urządzeń elektronicznych nie spełnia początkowo wszystkich wymagań EMC i wymaga wprowadzenia jakiś (większych lub mniejszych) zmian konstrukcyjnych. Uzasadniona jest zatem teza, że firmy, które nie korzystają z usług laboratoriów badawczych EMC i nie posiadają również własnego zaplecza badawczego, z dość dużym prawdopodobieństwem mogą wprowadzać na rynek wyroby niezgodne z dyrektywą 2004/108/EC.

Klienci naszego Laboratorium poważnie traktują kwestie zgodności z wymaganiami EMC, tzn. wyroby są poprawiane w sposób skuteczny, a ponadto z zachowaniem dostatecznie dużych marginesów EMC.

W naszym laboratorium nigdy nie wystawia się po-zytywnych świadectw badań w przypadkach wątpliwych technicznie. Takie podejście prowadzone konsekwentnie od wielu lat skupia wokół naszego laboratorium tylko takie firmy, które rzeczywiście dbają o poziom technicznych swoich wyrobów, także w zakresie EMC. Jednocześnie „odstrasza” to od nas firmy, którym zależy raczej tylko na dokumencie potwierdzającym badania. O tym, że takie mniej rzetelne firmy w Polsce również istnieją czasem słyszymy od naszych Klientów, ale nie potrafimy tego zweryfikować i ocenić skali zjawiska.

Pewnym problemem na rynku krajowym są nadal wyroby dalekowschodnie, a ostatnio także raporty badań EMC pochodzące z tego obszaru. W przypadku produkcji wielkoseryjnej, problemem może być nadzór wyrobów w zakresie EMC w toku produkcji (czyli jak utrzymać parametry EMC prototypu wyrobu podczas wielkoseryjnej produkcji). Trudno oszacować skalę problemu, ale mieliśmy pojedyncze przykłady znacznych odstępstw wyrobu produkowanego od parametrów badanego wcześniej prototypu.

Status Dyrektwy EMC

124 interference technology euroPe emc guide 2011

Polska



The Status of EMC Directive

JAN SROKAEMC-Testcenter Zurich AGZurich, Switzerland

STRESZCZENIENapięcie zaburzeń przewodzonych z wrót EUT sieci sztucznej przekazywane jest torem pomiarowym do wejścia miernika. Współczynnik F wiążący te napięcia, zwany współczynnikiem toru pomiarowego, wyznaczany jest z pominięciem niedopasowań. Towar-zyszy mu współczynnik niedopasowania toru pomiarowego δM. Współczynnik niedopasowania zależy od wszystkich elementów toru pomiarowego, w tym od sieci sztucznej. Fakt ten jest igno-rowany w istniejących dokumentach [7], [8]. Ze względu na odbicia Γr na wejściu miernika, których tylko wartości graniczne dostępne są w dokumetacjach technicznych mierników, współczynnik niedopasowania nie może być wyznac-zony, tylko oszacowany. Jego estymata wchodzi w skład bilansu niepewności pomiaru. W artykule przedstawione są dwa sposoby szacowania współczynnika niedopasowania: z pzodzielonym i ze zintegrowanym torem pomiarowym. Zamieszczone są szacowania numery-czne z wykorzystaniem metory Monte

Carlo. Różne postaci współczynników niedopasowania w pomiarach emisji przewodzonej i promieniowanej oraz wykazanie wad szacowania z podziel-onym torem pomiarowym są głónymi przesłaniami artykułu.

I. WSTĘPPrzedmiotem badań zaburzeń przewod-zonych jest napięcie we wrotach EUT (Equipment Under Test) sieci sztucznej (Artifi cial Mains Network) (złącze 1 na Rys. 1). Czwórnik między złączem 1 i wejściem miernika zaburzeń (złącze 3 na Rys. 1) nazywa się torem pomiar-owym. Między złączami 1 i 2 występuje sieć sztuczna wraz z tłumikiem. Wiele konstrukcja sieci sztucznych ma wbu-dowane tłumiki. W przypadku br-aku wewnętrznego tłumika zaleca sie wstawienie w tor pomiarowy tłumika zewnętrznego, w celu zmniejszenia niedopasowania.

Dla uproszczenia, elementy między złączami 1 i 2 będą nazwane siecią sztuczną, a wielkości z nią związane będą opatrzone górnym indeksem (A).

Między złączami 2 i 3 znajdują się kable, przepust i ewentualnie ogranic-znik przepięć. Dla uproszczenia, el-ementy między tymi złączami będą

Korekcja Niedopasowań W Torze Pomiarowym Przewodzonych Zaburzeń

Radioelektrycznych


Polska



Measurement Instrumentation Uncertainty of Radiated Disturbances Due to Antenna Receiver Transmission

Rys 1. Stanowisko do pomaru emisji przewodzonej.

nazwane kablem, a wielkości z nim związane będą opatrzone górnym indeksem (B). Wielkości odpowiadające całemu to-rowi pomiarowemu, między złączami 1 i 3 będą opatrzone górnym indeksem (AB) lub (A+B).

Do wyznaczenia współczynnika F toru pomiarowego, pozwalającego przeliczyć napięcie złącza 3 na napięcie złącza 1, niezbędne jest pomierzenie parametrów rozpro-szeniowych S toru. Współczynnik F wyznaczany jest z pominięciem niedopasowania w torze. Implikuje to istnienie współczynnika niedopasowania toru δM. W efekcie, relacja między napięciami złącz 3 i 1 jest iloczynem współczynnika toru i współczynnika niedopasowania (F•δM).

Współczynnik niedopasowania w emisji przewodzonej różni się od swojego odpowiednika w emisji promieniowanej. Zależy on od parametró S sieci sztucznej. Fakt ten jest ig-norowany w istniejących dokumentach [7], [8], w których współczynnik niedopasowania w pomiarach emisji promien-iowanej jest prezentowany jako jedyny, ogólny współczynnik niedopasowania. Sytuacja ta zmotywowała autora do zajęcia się tym zagadnieniem.

Przy wyprowadzaniu wzoru na współczynnik niedopaso-wania toru w pomiarach emisji przewodzonej tor ten może być traktowany jako podzielony na kilka czwórników lub jako zintegrowany jeden czwórnik. W artykule omówione są wady podejścia z torem podzielonym.

II. TOR PODZIELONYW podejściu tym tor traktowany jest jako kaskadowe połączenie sieci sztucznej, opisanej parametrami S(A) oraz kabla opisanego parametrami S(B). Gdyby sieć sztuczna była podłączona bezpośrednio do miernika, wtedy zależność między napięciami bramy EUT sieci sztucznej (U1), a napięciem na wejściu miernika (U2=3) wynikałaby ze stratności napięciowej [3], [11]

Ponieważ jednak między siecią sztuczną i odbiornikiem jest kabel, to napięcie (U2=3) trzeba zastąpić wyrażeniem wiążącym napięcia (U2) i (U3) po wtrąceniu czwórnika między złącze 2 i 3. Zależność ta wynika ze stratności wtrąceniowej [3], [11]

Równ.(2) w skali decybelowej jest sumą następujących składników

Współczynnik F(A), to współczynnik podziału napięcia sieci sztucznej, którego metoda pomiaru przedstawiona jest w publikacjach [2], [3] i [6]. Współczynnik F(B), to po prostu tłumienność kabla. Współczynnik F(A)(B) całego toru pomiarowego, pomiędzy złączem 1 i 3 jest sumą obydwu współczynników (F(A)(B) = F(A) + F((B))1. Współczynnik δM(A)

(B) niedopasowania całego toru jest sumą współczynników niedopasowania sieci sztucznej δM(A) oraz kabla δM(B) (δM(A)

(B) =δM(A) + δM(B))2 Dużą niedogodnością tego podejścia jest występowanie

odbić Γe na złączu 2, patrząc w kierunku sieci sztucznej. Odbicia te zależą od impedancji EUT. Muszą one być zatem mierzone dla każdego EUT z osobna, co jest nierealne lub muszą być traktowane jako druga zmienna losowa, obok odbić Γr na wejściu miernika.

II. TOR ZINTEGROWANYAlternatywą do podzielenia toru pomiarowego jest wykorzystanie parametrów S dla całego toru. Parametry uzyskane bepośrednio z pomiarów całego toru będą opatrzone indeksem S(AB). Opcjonalnie można pomierzyć oddzielnie parametry S(A) dla sieci sztycznej i S(B) dla kabla, a następnie obliczyć S(A+B) korzystając ze wzorów na kaskadowe połączenie czwórników [10].

Dla czwórnika opisanego parametrami S(AB) relacja między napięciem U1 sieci sztucznej, a napięciem U3 na wejściu mi-ernika jest analogiczna do wzoru (1)3

Stąd współczynnik toru pomiarowego w skali decybelowej będzie miał postać

oraz współczynnik niedopasowania toru

Dużą zaletą tego podejścia jest brak odbić Γe we współczynniku niedopasowania.

IV. OBLICZENIA PROPAGACJI PARAMETRÓW ROZKŁADU W każdym z trzech współczynników niedopasowania (wzory (3c), (3d) i (6)) jest przynajmniej jedna zmienna losowa. Są to odbicia Γr na wejściu miernika. Dodatkowo we wspołczynniku niedopasowania opisanym wzorem (3d) może być druga zmienna losowa Γe. Oznacza to, że wartość żadnego ze współczynników niedopasowania nie może być wyznaczona. Co najwyżej może być oszacowana.

Szacowanie z założeniem rozkładu kształtu U [3], [9] nie może być zastosowane4 . Również szacowanie wartości granicznych metodą podaną w rozdziale A.5 dokumentu [7] i rozdziale A.7 dokumentu [8] nie może być zastosowane. Podejście to można stosować gdy argument logarytmu jest sumą wartości jeden i innych składników, z których każdy


SROK A Polska

jest iloczynem modułów. Ułamki występujące we wzorach (3c), (3d) i (6) uniemożliwiają ten rodzaj szacowania. Jedynym, prawidłowym sposobem oszacowania wzorów (3c), (3d) i (6) jest metoda Monte Carlo [1], [4], [5]. Autor przeprowadził szacowanie programem Mathcad13, wykorzystując dostępny w nim generator pseudolosowy z rozkładem jednostajnym.

Za wartość oczekiwaną (przeciętną) E(X) autor przyjął średnią arytmetyczna próbek. Odchylenie standardowe (niepewność standardowa) u została policzona zależnością

Parametry rozproszeniowe pomierzono wektorow-ym analizatorem sieci ZVRE firmy R&S w przedziale częstotliwości od 9kHz do 30MHz w 201 logarytmicznie rozłożonych punktach częstotliwości. Do kalibracji anali-zatora sieci użyto zestawu kalibracyjnego 85032B TYPE-N fi rmy H&P.

Przeanalizowano stanowisko pomiarowe z odbiornikiem ESIB40 fi rmy R&S. Producent tego odbiornika zapewnia współczynnik fali stojącej VSWR na wejściu miernika nie większy niż 2,0 przy wyborze tłumienia na wejściu 0dB (VSWR<2,0) oraz nie większy niż 1,2 jeśli tłumienie to wynosi

co najmniej 10dB (VSWR<1,2). Dotyczy to całego przedziału częstotliwości, od 20Hz do 40GHz. W przeliczeniu na moduł współczynnika odbicia |Γr| oznacza to |Γr|<0,34 dla 0dB tłmienia oraz |Γr|<0,092 dla co najmniej 10dB tłmienia na wejściu miernika.

Przeanalizowany tor pomiarowy składa się z: jednofazowej sieci sztucznej typu ANS-25/2 fi rmy ElectroMetrics wraz z 10dB zewnętrzym tłumikiem, dwu kabli koncentrycznych o długościach 3m i 2m oraz przepustu.

Współczynnik niedopasowania oszacowano dla obu granicznych wartości VSWR. W tym celu wygenerowano generatorem pseudolosowym dwa zbiory 180 elementowych próbek zmiennych losowych modułu |Γr| w przedziałach odpowiednio [0;0,34] oraz [0;0,092]. Każdorazowo prób-kom tym towarzyszyły 180 elementowe próbki zmiennych losowych fazy |Γr| w przedziale [-π; π].

Przeprowadzono trzy rodzaje szacowania: jeden z podziel-onym torem pomiarowym5 i dwa ze zintegrowanym torem pomiarowym wykorzystując raz parametry S(AB) pomierzone dla całego toru i drugi raz parametry S(A) i S(B) pomierzone oddzielnie. Przy szacowaniu z torem podzielonym użyto zdeterminowanego Γe, pomierzonego dla EUT z typowym fi ltrem podłączonego do wrót EUT sieci sztucznej. Wyniki szacowania, oznaczone indeksami (A), (B), (AB) oraz (A+B) przedstawione są na Rys. 2a i 2b. Maxima niepewności standardowej w paśmie częstotliwości A (9kHz – 150kHz) oraz B (150kHz – 30MHz) przedstawione są w Tabeli I dla (VSWR<2,0) oraz Tabeli II dla (VSWR<1,2).

V. WNIOSKIZarówno sieć sztuczna jak i kabel mają swój udział we współczynniku niedopasowania toru pomiarowego w badani-ach emisji przewodzonej. Pomierzona wartość współczynnika dbić Γr na wejściu miernika jest niedostępna. Wykorzystuje

1Czynnik 1+Γr występujący we wzorach (1) i (2) nie występuje we wzorze

(3a), bowiem jego wartość jest zapamiętana w EPROM miernika i wykorzstana do korekcji jego wskazania (patrz publikacje [2], [3]).2We wzorze (3d), w odróżnieniu do wzoru na współczynnik niedopasowania w emisji promieniowanej, jak to przedstawione jest w dokumentach [7] i [8] występuje mianownik 1+Γ

r Γ

e. W przypadku promieniowania mianownik ten

skraca się po zastosowaniu współczynnika antenowego [3].3W przypadku oddzielnego pomiaru S(A) i S(B) indeks górny S(AB) należy zastąpić indeksem S(A+B) 4Z rozkładem kształtu U mamy do czynienia gdy moduł wielkości zespolonych, w tym wypadku |Γ

r| jest znany, natomiast zmienną losową jest

argument. W przypadku Γr, z danych dostępnych w specyfi kacji technicznej

miernika można wyznaczyć jedynie wartości graniczne modułu.


KOREKCJA NIEDOPASOWAŃ W TORZEPolska

Figure 2. Niepewność standardowa u oraz wartość przeciętna E(X) współczynnika niedopasowania przy 0dB (VSWR<2,0) (Rys. a) i co najmniej 10dB (VSWR<1,2) (Rys. b) tłumieniu na wejściu miernika.

sie natomiast wartości graniczne tych odbić, dostepne w do-kumentacji technicznej miernika. Dlatego Γr jest zmienną losową.

Do oszacowania propagacji rozkładu zmiennej losowej Γr na współczynnik niedopasowania toru pomiarowego nie można zastosować ani rozkładu kształtu U [3], [9], ani sza-cowania wartosci ekstremalnych metodą prezentowaną w dokumentach [7] i [8]. Jedynym prawidłowym sposobem jest zastosowanie metody Monte Carlo [1], [4], [5].

Odradza się szacowanie z podziałem toru pomiarowego na dwa lub więcej czwórników. Konsekwencją tego jest współczynnik niedopasowania zależny od Γe , czyli od odbić na wyjściu sieci sztucznej, patrząc w jej kierunku. Odbicia te zależą od impedancji EUT. Wymaga to każdorazowo pomiaru Γe i utworzenia bilansu niepewności pomiaru dla każdego EUT z osobna lub traktowania Γe jako kolejnej zmiennej losowej. Pierwsze podejście jest nierentowne. Drugie, czyni współczynnik niedopasowania toru zależny od dwu zmiennych losowych, z których każda jest wielkością zespoloną. Zwiększa to stopień złożoności procesu estymacji.

Parametry rozproszeniowe toru zintegrowanego mogą być określone na dwa sposoby. W pierwszym mierzy się cały tor pomiarowy jako jeden czwórnik. Alternatywą jest pomiar parametrów S dla sieci sztucznej i kabla z osobna i zastosowanie wzorów na kaskadow połączenie czwórników.

Wartości oczekiwane (przeciętne) E(X) współczynnika niedopasowania są we wszystkich trzech podejściach pomijalnie małe.

BIBLIOGRAFIA• [1] R. Bąbka: Niepewność pomiarów emisji przewodzonej

w kompatybilności elektromagnetycznej Praca Doktorska. Politechnika Warszawska, 2009.

• [2] R.Bąbka, J.Sroka: Measurement instrumentation un-certainty of conducted disturbances due to AMN-receiver transmission 19th International Wrocław Symposium and Exhibition on EMC, 2008.

• [3] J. Sroka: Niepewność pomiarowa w badaniach EMC, pomiary emisyjności radioelektrycznej Ofi cyna Wydawnicza Politechniki Warszawskiej, Warszawa 2009. ISBN 978-7207-837-7

• [4] Joint Committee for Guides in Metrology (JCGM), Evalu-ation of measurement data - Supplement 1 to the “Guide to the expression of uncertainty in measurement” - Propagation

of distributions using a Monte Carlo method. JCMG 101:2008. Dostępne bezpłatnie na OIML web side, www.oiml.org.

• [5] C.,F.,M. Carobbi: e GUM Supplement 1 and the Uncertainty Evaluations of EMC Measurements. IEEE EMC Society Newsletter, Issue No. 225, 2010.

• [6] CISPR 16-1-2: 2004 + A1:2005 + A2:2006, Specifi cation for radio disturbance and immunity measuring apparatus and methods - Part 1-2: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Conducted disturbances. IEC, 2006.

• [7] CISPR 16-4-2: 2003, Specifi cation for radio disturbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Measurement instrumentation uncertainty. IEC, 2003.

• [8] CISPR A/901/CDV, CISPR 16-4-2 Ed.2: Specifi cation for radio dis-turbance and immunity measuring apparatus and methods - Part 4-2: Uncertainties, statistics and limit modelling - Measurement instrumenta-tion uncertainty. IEC, 2010.

• [9] I.A.Harris, F.L.Warner,: Re-examination of mismatch uncertainty when measuring microwave power and attenuation. IEE Proc., Vol.128 No.1, February 1981.

• [10] D.M.Kerns: Basic theory of waveguide junctions and introductory microwave network analysis. Pergamon Press Ltd., London, 1967.

• [11] F.L.Warner: Microwave attenuation measurements. IEE Monograph Series 19, Peter Pergamon Ltd, 1977.

33


SROK A Polska

Table 1. Maxima niepewności standardowej dla współczynnika fali stojącej na wejściu miernika VSWR<2,0.

Table 1.1. Maxima niepewności standardowej dla współczynnika fali stojącej na wejściu miernika VSWR<1,2.


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Bruno StraumannSenior Development Engineer Haefely Test AG Basel, Switzerland

IntroDuCtIonThe new IEC 61000-4-2 Edition 2 standard which replaces IEC 61000-4-2 Edition 1 1995 was initially announced in December 2008.

Based on the revised IEC standard, the identical European standard EN 61000-4-2:2009 was also released.

The new EN standard can already be applied for ESD immunity testing, and testing according to the new stan-dard will be mandatory starting 1st of March 2012.

The following article focuses on the effects the new standard has on ESD simulators and the corresponding cali-bration procedures of such generators.

mISleaDIng fIrSt ImpreSSIonSWhile comparing the previous and new standard ESD simulator specifi-cations, one may easily get the wrong impression.

The tolerance levels (table 1) along with the rise time (tr) and current peak values (Ip), are clearly higher in the new stan-dard.

One would assume that the ESD simulator require-ments would now be re-duced with the new stan-dard, something which is

not actually true.On one hand, the enhanced lower

tolerance limit of the rise time only takes into account the lower measure-ment values, which results from the increased measurement bandwidth.

On the other hand, the new standard requires that per measurement level, 5 impulses are recorded at a time and individually evaluated.

Every single measurement (i.e. tr, Ip, I30, I60) of each impulse must meet the required tolerance levels.

It is now not permitted to use average values from several impulses, although the previous standard permitted using averaged measured values, a procedure which is often used.

CorreCt meaSurement BeComeS more DIffICultPreviously, if random measurement errors (in terms of measurement un-certainty) occurred, it was very likely that they would not appear in the final measurement results. The reason for this is because random measurement errors were averaged.

With the new standard, random measurement errors are no longer aver-

the effects of the new eSD Standard on eSD Simulators

61000-4-2 Edition 1

61000-4-2 Edition 2

Rise time tr 0,7ns – 1,0ns 0,6ns – 1,0ns

Peak value Ip ±10% ±15%

Current at 30ns I30 ±30% ±30%

Current at 60ns I60 ±30% ±30%

Table 1. Permitted ESD impulse tolerance levels according to previous and new standard.

134 inTErfErEncE TEcHnoloGy EuropE Emc GuiDE 2011

Schweiz

aged, and thus random errors will now clearly be shown in the final measurement results.

An important source of random measuring errors could be an insufficiently shielded measuring system.

In other words, the reason why the measured ESD impulse does not meet the standard specification could be due to the measurement system itself, and not the actual ESD simulator.

Figure 1 shows the possible effects of a badly shielded measurement system.

HIgHer meaSurement BanDwIDtHanD DefIneD teSt SetupTo calibrate an ESD simulator according to the new standard, the following equipment is necessary:- Digital Oscilloscope, analogue Bandwidth

≥2GHz / Sampling rate ≥10GS/s- Measurement target, Bandwidth 4GHz / Imped-

ance ≤2,1 Ohm- Attenuator, 20dB typically- Reference ground plane, dimensions ≥ 1,2m x

1,2m- Suitable shielded housing for the measurement

systemFirst, it is important to note that the new mea-

surement target no longer has the 50 Ohm series resistor. Therefore, when taking measurements of the peak current with the oscilloscope the signal should no longer be cut in half. If data transfer is being performed between a PC and the Oscillo-scope it should be done via fibre optics.

A second important aspect of the new test setup is the shielded housing. This has to damp interference frequencies of up to GHz levels and all wiring leading into the shielded housing must be filtered accordingly. A properly shielded scope is even more important when taking measurements according to the new standard. This is because you can no longer average out random errors.

If data transfer is being performed between a PC and the oscilloscope it should be done via fibre optics. Also, the position of the grounding connections on the ground reference plane is now exactly defined; 0.5m vertically below the measuring target.

Finally, the position of the ESD simulator earth cable is now also defined. This is very important

and should not be ignored because it influences the measure-ment values of I30 and I60.

ConSequenCeS for eSD SImulatorSExperience shows that there are significant differences between various ESD models. Because the new standard demands more from ESD simulators, it is clear that some ESD simulators will no longer be compliant to the new standard.

Testing with such non-compliant ESD simulators can lead to over-testing or under-testing of EUTs. In practice this is not a desirable result.

A decision on whether an existing ESD simulator meets the new requirements can only be made following calibration to the latest edition of the IEC standard. When purchasing a new ESD simulator, one should ensure that the new simulator meets the exact requirements of IEC 61000 4-2 edition 2.

VerIfICatIon anD CalIBratIon In the previous standard, the term verification and calibra-tion was used incorrectly, while the revised standard now correctly differentiates verification from calibration.

Calibration is the exact measuring technique of the mea-surement values, and verification means verification of the ESD simulator.

The verification is carried out before the actual testing takes place, whereas calibration period of the ESD simulator

Figure 1. Non-conforming measurement (above) and correct measurement (below).Insufficient shielding can lead to measurement errors of ±20% magnitude or more.

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Straumann Schweiz



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needs to be determined by the user, and is typically every 1-2 years.

The new standard suggests that to determine whether the simulator is functioning correctly, the length of the spark should be checked during an air discharge.

Figure 2. Modern ESD-Simulator built to meet exact requirements of the latest standard.

However, this is an insufficient method as the length of the spark depends on the geometry of the discharging electrodes, the polarity, and the environmental conditions. Furthermore, a defective discharge relay will not be detected.

This is the reason modern ESD simulators include self test routines, which within seconds can diagnose potential defects.

It can generally be said that the new IEC/EN 61000-4-2 Edition 2 standard demands more from ESD simulators as well as from the measuring equipment used for calibrating the ESD simulator itself.

Whether the ESD simulator meets the standard can only be determined through proper calibration.

BRUNO STRAUMANN is currently working as senior development and application engineer in the EMC Division of HAEFELY. He has been with the company for more than 20 years in various roles, including project manager for design and development of EMC test equipment.

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Comtest Eng.Industrieweg 12, 2382NV Zoeterwoude, Nederland; +31 71 5417531; Fax +31 71 5420375; www.comtestnl.com; [email protected] en services: Testen, Afges-chermde ruimtes en afsluitingen

CPI International -EuropePO Box 2704, 1000CS Amsterdam, Neder-land; +31 20 638 05 97; Fax:+31 20 420 28 36; www.cpiinternational.com; [email protected] en services: Testinstru-menten

D

D.A.R.E.!! ConsultancyVijzelmolenlaan 7, 3447 GX Woerden, Ned-erland; + 31 348 430 979; Fax: + 31 348 430 645; www.dare.nl; [email protected] en services: Testinstru-menten

E

EEMCCOIMEXApolloweg 80, 8239 Da Lelystad, Ned-erland; 0320 295 395; Fax: 0320 413 133; www.eemc.nl; [email protected] Producten en services: Ferrieten, Filters, Afscherming

EM Test GmbHLünener S trasse 211, 5 9174 Kamen, Deutschland; +49 (0)2307 260 700; Fax: + 4 9 ( 0 ) 2 307 17050 ; info @ emtest .de; www.emtest.nlProducten en services: Spanning en overgangen, Testinstrumenten, Testen

EMC PartnerRIMARCK, Mr. Jan Heerooms, Oosterleek 3, NL - 1609 GA Oosterleek Nederland; +31 229 503 478; Fax: +31 229 503 479; [email protected]; www.rimarck.nl Producten en services : Spanning en overgangen, Testinstrumenten

EMCMCC Sedanlaan 13a, Eindhoven, 5 627MS, Nederland; 31-40-2927936; Fax: 31-40-2927481; www.emcmcc.nl; Mart Coenen, [email protected] Producten en services : Testen, Consultants

European Test Services Keplerlaan 1, PO Box 299, Noordwijk, 2200 AG, Nederland; +31(0)71 565 59 69; Fax: +31(0)71 565 56 59; www.european-test-services.netProducten en services: Testen

F

Fair-Rite Products Corp.HF Technology, Atalanta 5 1562 LC Krom-menie Holland; (0031) (0)75 - 628 37 17; (0031) (0)75 - 621 11 20; www.fair-rite.com; [email protected] Producten en services: Ferrieten, Filters, Afgeschermde ruimtes en afslui-tingen, Afscherming

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Haefely Test AGDepartment AG, Lehenmattstrasse 353 CH-4052 Basel, Schweiz; +41 61 373 45 84; Fax: +41 61 373 4912; www.haefely.com; [email protected] Producten en services: Spanning en overgangen, Testinstrumenten

Holland Shielding SystemsP.O Box 730, 3300 AS Dordrecht, Neder-land; +31 78 613 13 66; Fax: +31 78 614 95 85; www.hollandshielding.com; [email protected] en services: Geleidende materialen, Filters, Afgeschermde ruimtes en afsluitingen, Afscherming, Testen

I

IFI - Instruments for IndustryEEMC Coimex, Apolloweg 80 8239 DA Lecystad, Nederland; + 31 320295395; Fax: +31 320413133; Antoon Naus, [email protected]; www.eemccoimex.nlProducten en services: Versterkers, Antennes, Filters, Afgeschermde ruimtes en afsluitingen, Testinstrumenten, Testen

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Nexio EEMC Coimex, Apolloweg 80 8239 Da Lelystad, Nederland; +31 320 295 395; Fax : +31 320 413 133; www.eemc.nl/eng; [email protected] Producten en services: Testinstru-menten

P

Philips Applied Technologies EMCHigh Tech Campus 26, 5656 AE Eindhoven, Nederland; +31 40 2746214; Fax: +31 40 2742224; www.emc.philips.com; [email protected] en services: Testen

S

Schlegel Electronic MaterialsDracon-Eltron, Herastraat 51, 5047 TX Til-burg; +31 13 5780800 Nederland; Fax: +31 13 5711369; Paul Jansen, [email protected]; www.dracon.nlProducten en services: Geleidende materialen, Afscherming

Stork Fokker AESB B. V.A mers foor t ses traat weg 7, 1412 K A Naarden, Nederland; +31 (0)35 695 74 11; Fax: +31 (0)35 694 11 84; www.stork.com; [email protected] en services: Testen

T

Tech-Etch, Inc.HF Technology, Atalanta 5, 1562 LC Krom-menie, Nederland; 31 75-628 37 17; Fax: 31 75-621 11 20; [email protected] en services: Geleidende materialen, Afscherming

Teseq LtdAccelonix BV; +31 40 750 1650; [email protected]; www.accelonix.nlProducten en services: Versterkers, Antennes, Testinstrumenten, Testen

Thales Nederland B.V.Haaksbergerstraat 49, 7554 PA Hengelo, Nederland; +31 74 2488111; Fax: +31 74 2425936; www.thalesgroup.com; [email protected] en services: Testen

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interferencetechnology.com interference technology 139

ASSOCIATIONS

DuTCH EMC-ESD SOCIETyPostbus 366, 3830 AK Leusden, 033 465 75 07, Fax: 033 461 66 38, www.emvt.nl, Leusden, Paul Petersen, [email protected]

IEEE EMC SOCIETy CHAPTER BENELuX Frank Leferink, Thales Nederland B.V., P.O. Box 42, 7550 GDHengelo, Netherlands; +31 74-248-3132; Fax: +31 74-248-4037; [email protected]

NEDERLANDSE EMC-ESD VERENIGINGPostbus 366, 3830 AK Leusden; 033 - 465 75 07; Fax: 033 - 461 66 38; Bezoekadres, Dodeweg 6, gebouw B, 3832 RC Leusden; Paul Petersen, [email protected]

NOTIFIED BODIES

D.A.R.E.!! CONSuLTANCyVijzelmolenlaan 7, NL-3447 GX Woerden, Netherlands; +31(0)348 430 979; Fax: +31(0)348 430 645; [email protected]; www.dare.nlNotified Body number : 1912Directives: 2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility (31/07/2012)

KEMA QuALITy B.V.Utrechtseweg 310, Postbus 5185, 6802 ED ARNHEM, Nether-lands; +31:(0)26:356 20 00; Fax: +31:(0)26:352 58 00; [email protected]; www.kemaquality.com Notified Body number : 0344Directives: 89/106/EEC Construction products90/385/EEC Active implantable medical devices93/42/EEC Medical devices94/9/EC Equipment and protective systems intended for use in potentially explosive atmospheres98/79/EC In vitro diagnostic medical devices2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low voltage directive2004/22/EC Measuring Instruments Directive2004/108/EC Electromagnetic compatibility (31/07/2012)2006/42/EC Machinery (29/12/2013)

KIwA NEDERLAND B.V.Wilmersdorf, 50 (PO Box 137, 7300 AC), 7327 AC APELDOORN, Netherlands; (055) 539 33 55; Fax : (055) 539 36 85; [email protected]; www.1kiwa.comNotified Body number : 0063Directives: 89/106/EEC Construction products2009/142/EC (ex-90/396/EEC) Appliances burning gaseous fuels92/42/EEC Hot-water boilers2004/108/EC Electromagnetic compatibility (20/07/2012)

TELEFICATION B.V.Edisonstraat 12 A , 6902 PK ZE VENA AR, Netherlands ; +31:316:583 180; Fax: +31:316:583 189; [email protected]; www.telefication.comNotified Body number : 0560Directives: 89/106/EEC Construction products96/98/EC Marine Equipmen99/5/EC Radio and telecommunications terminal equipment (01/11/2011)2006/95/EC (ex-73/23/EEC) Low voltage directive 2004/108/EC Electromagnetic compatibility (31/07/2012)

THALES NEDERLAND B.V.Surface Radar, Environmental Competence Centre P.O. Box 42, 7550 GD Hengelo, Netherlands; +31 74 248 3219; Fax: +31 74 248 4037; [email protected]; www.thales-nederland.nlNotified Body number : 1914Directives: 2004/108 /EC Electromagnetic compatibility (31/07/2012)

TÜV RHEINLAND EPS B.V.Smidshornerweg 18, NL-9822 TL Niekerk, Netherlands; (+31) (0)594 505005; Fax: (+31) (0)594 504804; [email protected]; www.tuv-eps.comNotified Body number : 1856Directives: 89/106/EEC Construction products99/5/EC Radio and telecommunications terminal equipment (01/03/2012)2006/95/EC (ex-73/23/EEC) Low voltage directive2004/108/EC Electromagnetic compatibility (30/06/2012)

OTHER

AGENTSHAP TELECOMEmmasingel 1, 9700 Al Groningen; +31 50 587 73 25; Fax: +31 50 587 74 00; Jean Paul van Assche, [email protected]

Middelen NEDERLAND

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Wat vindt u er van

Uw opmerkingen en feedback zijn van groot belang

voor ons. Ga naar www.interferencetechnology.eu en

vul een kort onderzoek in dat ons zal helpen de EMC

Europa handleiding te verbeteren.

Mart CoenenEMCMCC bv Eindhoven, Nederland

During the last years, many new EMC standards have been ad-opted but more and more are

outside the scope of formal EMC legisla-tion. The recent change of scope of IEC ACEC, CISPR and the new European EMC Directive creates new challenges for industry as their focus will be aimed at the protection of the general broad-casting and communication services and of serving the main public interest.

During the last APEMC 2010 sym-posium in Beijing a contribution was given to a workshop about the EMC developments for the European Indus-try. As in Europe, large changes resulted from the recent update of the EMC Directive 89/336/CE to 2004/108/CE where the entire legislation on physi-cally large systems and large installa-tions, called “fixed installations” has been altered.

Although the European EMC Direc-tive explicitly state: “The equipment covered by this Directive should include both apparatus and fixed installations. However, separate provisions should be made for each. This is so because, whereas apparatus as such may move freely within the Community, fixed installations on the other hand are installed for permanent use at a pre-defined location, as assemblies of various types of apparatus and, where appropriate, other devices. The compo-sition and function of such installations correspond in most cases to the particu-

lar needs of their operators”, by which exclusions are already claimed. By the last sentence, the requirements will be based on particular needs.

It further reads that: “Fixed instal-lations, including large machines and networks, may generate electromag-netic disturbance, or be affected by it. There may be an interface between fixed installations and apparatus, and the electromagnetic disturbances pro-duced by fixed installations may affect apparatus, and vice versa. In terms of electromagnetic compatibility, it is ir-relevant whether the electromagnetic disturbance is produced by apparatus or by a fixed installation. Accord-ingly, fixed installations and apparatus should be subject to a coherent and comprehensive regime of essential requirements. It should be possible to use harmonized standards for fixed installations in order to demonstrate conformity with the essential require-ments covered by such standards.”

On the one hand, it is assumed that “fixed installations” will cause electro-magnetic disturbance and/ or may be affected by other nearby systems. On the other hand, no IEC nor CE harmo-nized standards exist which enable RF emission, RF immunity and impulse immunity testing at close proximity on site or in-situ. Even worse, RF immunity testing at most end-user premises is prohibited by law or restricted to the ISM frequency bands only. Conducted mains tests will not be performed at all as the power cabling to the “fixed installation” has to be adapted for the sake of a “few” measurements. Here,

a Change in International eMC Legislation: Do Industrial Premises

Become outlawed?

140 iNtErfErENCE tEChNology EuropE EMC guidE 2011

nederland

ar europe Andere ar-divisies: • modular rf • receiver systemsNational Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

Copyright © 2010 AR. De oranje streep op AR-producten is een in de VS gepatenteerd en geregistreerd handelsmerk.

ISO 9001:2008GecertificeerdOPMERKING: De FL7040- & FL7060-sondes vereisen een FI7000 voor vermogen en communicatie.

Model FL7040Bereik van 2 MHz – 40 GHz

Model FL7060 Bereik van 2 MHz –60 GHz

Nauwkeurigheid, lineariteit& bandbreedte.

Wat wilt u nog meer?

Eigenlijk wel. Deze nieuwe laseraangedreven E-Field-sondes van AR zijn ongelooflijk veelzijdig; Ze doen het werkvan meerdere sondes, met uitstekende nauwkeurigheid en lineariteit voor uw veeleisende noden inzake veldcontrole.

Ze bevatten een interne microprocessor met geavanceerde bedienings- en communicatiefuncties, en tegelijkautomatisch corrigerend is voor meetafwijking door schommelingen in de omgevingstemperatuur.

Onze nieuwste lasersondes zijn verkrijgbaar in twee modellen, met een uitzonderlijk omvangrijk frequentiebereik. Model FL7040 dekt een bereik van 2 MHz – 40 GHz, terwijl het model FL7060 het gehele bereik van 2 MHz –

60 GHz dekt. U hoeft dus geen genoegen te nemen met hetgeen wordt aangeboden, maar doet wat u wilt. De lasersonde heeft als

extra handig kenmerk dat de batterijen nooit moeten worden vervangen of opnieuw moeten worden opgeladen.Daarnaast biedt AR de grootste serie sondes binnen de industrie aan.

Net als alle AR-producten geven we op onze nieuwe sondes de beste en meest volledige garantie, samen en dekrachtigste ondersteuning binnen de industrie.

In Nederland kunt u contact opnemen met AR Benelux BV, [email protected] of neem telefonisch contact op onder telefoonnummer +31-(0)172-423-000



the long system start-up and turn-down times are not being considered which might take several hours. For this reason, comparison between RF emissions measured with an active “fixed installation” and one turned-off doesn’t make sense due to the lag time between these events.

“It is not pertinent to carry out the conformity assessment of apparatus placed on the market for incorporation into a given fixed installation, and otherwise not commercially available, in isolation from the fixed installation into which it is to be incorporated. Such apparatus should therefore be exempted from the conformity assessment procedures nor-mally applicable to apparatus. However, such apparatus should not be permitted to compromise the conformity of the fixed installation into which it is incorporated. Should apparatus be incorporated into more than one identical fixed installation, identifying the electromagnetic compatibility characteristics of these installations should be sufficient to ensure exemption from the conformity assessment procedure.”

The above gives a carte blanche to “fixed installation” contractors and subcontractors as they might leave all nec-essary EMC measures to the end-integrator, the one who or who’s company is bringing the full “fixed installation” under his brand name onto the market. Only for those apparatus which also will be brought as OEM on the market, the general apparatus requirements apply.

“FIxeD InstaLLatIons”1. Apparatus which has been placed on the market and which

may be incorporated into a fixed installation is subject to all relevant provisions for apparatus set out in this Directive. However, the provisions of Articles 5, 7, 8 and 9 shall not be compulsory in the case of apparatus which is intended for incorporation into a given fixed installa-tion and is otherwise not commercially available. In such cases, the accompanying documentation shall identify the fixed installation and its electromagnetic compatibility characteristics and shall indicate the precautions to be taken for the incorporation of the apparatus into the fixed installation in order not to compromise the conformity of that installation. It shall furthermore include the informa-tion referred to in Article 9(1) and (2).

2. Where there are indications of non-compliance of the fixed installation, in particular, where there are complaints about disturbances being generated by the installation, the competent authorities of the Member State concerned may request evidence of compliance of the fixed installation, and, when appropriate, initiate an assessment. Where non-compliance is established, the competent authorities may impose appropriate measures to bring the fixed installation into compliance with the protection requirements set out in Annex I, point 1.

3. Member States shall set out the necessary provisions for identifying the person or persons responsible for the establishment of compliance of a fixed instal-lation with the relevant essential requirements.”

In the first part it is again assumed that a single apparatus and a “fixed installation” shall be threated the same whereas in the following clauses exclusions are given.

Then sub-clause 2 indicates that only EMC mea-sures or corrective actions will or need to be taken in case of complaints. However, these complaints will only be governmental addressed when these stem from citizen living in the neighborhood of that industrial premise. No governmental actions will be taken on what is called intra-system or on-premises EMC issues. These need to be solved on a case-to-case base between the end-user and the apparatus and installation suppliers. However, there are no formal EMC measurement methods available to prove “guilt” when RF emission is exceeded, other than IEC CISPR 16-2-5. Above all, IEC CISPR/B claims that: “There is particular no meaning in requiring any emission measurements within the given large system or installation. Such testing is regarded as assessing the intra-system EMC which is however NOT in the scope of standardization work in CISPR. Globally spoken, user installation testing is a rather untypical case of application and use of CISPR standards and technical reports and its practice strongly depends on national (or regional) regulation. Some states recognize user installations as substitute for the traditional type test business for equipment which cannot be tested, for certain reasons, at standardized CISPR test sites. However, even in these circumstances the national authority will determine which limits shall be used, even if it

142 iNtErfErENCE tEChNology EuropE EMC guidE 2011

A chAnge in internAt ionAl eMc leg islAt ionnederland

http://www.ifi.com


http://www.eemccoimex.nl

http://www.eemc.nl

follows the advice of existing CISPR standards or technical reports”.

The latter would mean that the industry has to rely on what is called the EMC competence of the Notified Bodies and accredited test houses. Here too, any relation of correlation between the findings of these “accredited” test houses is lack-ing though they are tempting to unify their Way-of-Working under the “Group of Notified Bodies under the EMC Direc-tive (ECANB)”. They have issued their technical guidance Note; TGN 27, February 2010, regarding on-site tests of large products. Here, opposite to what has been recently stated by ACEC and CISPR (June 2010), conductive measurements are evoked. No reference is made to IEC CISPR-2-5 but EN 55016-2-3 (= Standard 3/10 m RF emission test method). Differences in in-situ test result with deviations over +/– 20 dB and aside are noted at exorbitant costs of 50.000,= Euro /test sequence. When in search for an intra-system solution at the end-user premises still no issue but when it comes to who’s taken the costs to solve these intra-system compatibility issues in-situ a serious point of conflict by lacking proper reference.

annex 1: essentIaL reQUIreMents reFerreD to1. Protection requirements

Equipment shall be so designed and manufactured, having regard to the state of the art, as to ensure that:

a. the electromagnetic disturbance generated does not exceed the level above which radio and telecommunications equipment or other equipment cannot operate as intended;

b. it has a level of immunity to the electromag-netic disturbance to be expected in its in-tended use which allows it to operate without unacceptable degradation of its intended use.

2. Specific requirements for fixed installations

InstaLLatIon anD IntenDeD Use oF CoMPonentsA fixed installation shall be installed applying good engineering practices and respecting the informa-tion on the intended use of its components, with a view to meeting the protection requirements set out in Point 1. Those good engineering practices shall be documented and the documentation shall be held by the person(s) responsible at the disposal of the relevant national authorities for inspection purposes for as long as the fixed installation is in operation.”

This last statement from the Annex of the EMC Directive comes back to the initial title; I’m sure that all my EMC colleagues have all the best in mind (when they are or have been involved with the apparatus or system design up to the level of installation). Many system concepts have been de-veloped with most intra-system constraints in mind but without considering the additional apparatus and systems which might appear adjacent at the end-user’s premises. Good engineering practice is hard to defend in case of dispute when it goes up into court. Although some standardization groups lead industry astray, an objective internationally agreed measurement method with accompanying

limit levels will support intra-system issues for in-situ fixed installations.

Fortunately, the new guidance on the EMC Directive, dated February 2010 indicates that alternative measures may be used as testing techniques to demonstrate compliance when correlation can be proven with the existing regulations. Alas, neither ACEC nor CISPR/B sees need in alternative test methods which could have a broad acceptance and which could be published as technical report (TR) rather than an international standard (for the time being).

There is a call for a better defined reference such that end-users, fixed installation suppliers and their contractors and sub-contractors know what is or will be required rather than the Eldorado which is presently created to solve every issue on an ad-hoc bases with an arbitrary result at the end. The global market has not only opened up for small apparatus and appliances but should also become uniform accessible for the “fixed installation” market.

MART COENEN (BSc ’79) has over 30 years experience in EMC in vari-ous fields and has published many papers and publications. He has been actively involved in international EMC standardization since 1988 and was given the IEC 1906 award in 2006. He is the former project leader of the standards: IEC 61000-4-6 and IEC 610004-2 but moved his focus towards EMC in integrated circuits. He has been the convener of IEC TC47A/WG9 and member of WG2.

33

interferencetechnology.eu iNtErfErENCE tEChNology 143

coenen nederland

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BELGIQUE

146 PRODUITSETSERVICES

148 RESSOURCES

A

AH SystemsEEMCCOIME X , Apol loweg 8 0 , 8 2 3 9 DA, Lelystad, Nederland; 31 320 295 395; Fax: 31 320 413 133; [email protected]; www.AHSystems.com Produits et services: Antennes, Instru-ment de contrôle, Contrôles

ANPIParc scientifi que Fleming, Rue Granbon-pré 1, 1348 Louvain-la-Neuve, Belgie; +32 (0) 10 47 52 11; Fax: +32 (0) 10 47 52 70; www.anpi.be; [email protected] et services: Contrôles

AR Benelux B.V.Frankrijklaan 7, ITC Boskoop, NL-2391 PX, Hazerswoude-Dorp, Nederland; +31-(0)172-423-000; Fax: +31-(0)172-423-009; Onno de Meyer, [email protected]; www.arbenelux.comProduits et services: Amplifi cateurs, Antennes, Câbles et connexions, Espaces sous protection et clôtures, Hausse et éléments temporaires, Instrument de contrôle

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Bekaert FibreTechnologiesPresident Kennedypark 18, B-8500 Kortrijk Belgique; +32 56 23 05 11; Fax: +32 56 22 85 57; www.bekaert.comProduits et services: Protection

E

EM Test AGEM TEST GmbH, Lünener Strasse 211, 59174 Kamen, Deutschland; +49 (0)2307 / 26070-0; Fax: +49 (0)2307 / 17050; [email protected]; www.emtest.beProduits et services: Hausse et élé-ments temporaires , Contrôles Instrumen-tation, Contrôles

EMC PartnerDECATEL S.A., Mr. Bernard Decamp, Rue de la Technologie 31, BE - 1082 Berchem-Ste-Agathe, Belgique; +32 2 469 00 90; +32 2 469 06 07; [email protected]; www.decatel.beProduits et services: Hausse et élé-ments temporaires , Instrument de con-

trôle

F

Fair-Rite Products Corp.

HF Technology, Atalanta 5, 1562 LC Krommenie, Holland; (0031) (0)75 - 628 37 17; (0031) (0)75 - 621 11 20; [email protected]; www.fair-rite.comProduits et services: Fer-rite, Filtres, Espaces sous pro-tection et clôtures, Protection

H

Haefely Test AGDepar tment AG, Lehenmat t-s t rasse 3 5 3 CH- 4 0 5 2 Basel , Schweiz; +41 61 373 45 84; Fax: +41 61 373 4912, [email protected]; www.haefely.comProduits et ser vices : Hausse et éléments tempo-raires , Instrument de contrôle

I

IFI - Instruments for Industry

Air-Parts B.V., Postbus 255,

24 0 0 AG Alphen aan den Rijn, Kalk-ovenweg 12, 2401 LK Alphen aan den Rijn, Nederland; +31 172422455 ; Fax: +31 172421022; Bert V.D. Luytgaarden, luy tgaarden.b @ air-par ts.com; www.air-parts.comProduits et services: Amplifi cateurs, Antennes, Filtres, Espaces sous protec-tion et clôtures, Instrument de contrôle, Contrôles

L

LaborelecRodestraat 125, B -1630 Linkebeek, Bel-gique, +31 43 36 75 203, Fax: +32 2 382 02 41, www.laborelec.com, [email protected] et services: Contrôles

N

Nexio EEMC Coimex, Apolloweg 80 8239 Da Lely-stad; +31 320 295 395; Fax : +31 320 413 133; www.eemc.nl/eng; [email protected] Produits et services: Instrument de contrôle

S

Schlegel Electronic MaterialsSEM Belgium bvba, Slijpesteenweg 28, 8432 Middelkerke (Leffi nge), Belgique; +32 59 560 270; Fax: +32 59 560 271; www.schlegelemi.com; [email protected] et services: Matériaux con-ducteurs, Protection

T

Tech-Etch, Inc.HF Technology, Atalanta 5, 1562 LC Krom-menie, Nederland; 31 75-628 37 17; Fax: 31 75-621 11 20; [email protected] et services: Matériaux con-ducteurs, Protection

Teseq LtdAccelonix BV; +31 40 750 1650; [email protected]; www.accelonix.Produits et services: Amplifi cateurs, Antennes, Instrument de contrôle, Con-trôles


BELGIQUE | Produits et Services

http://www.ifi.com


http://www.eemccoimex.nl

http://www.eemc.nl

ar europe

Autres divisions ar : • modular rf • receiver systemsNational Technology Park, Ashling Building, Limerick, Ireland • 353-61-504300 • www.ar-europe.ie

Tous droits réservés © 2010 AR. La bande orange sur les produits AR est enregistrée au US Patent & Trademark Office

Une collaboration qui profite à tous.

L’un existe pour l’autre. C’est fondamentalement simple. Et puissamment fructueux. Chez AR Europe, nous fournissons des amplificateurs de puissance, des antennes, et des modules pour les

essais de CEM, et les applications sans fil, médicales et industrielles. Depuis ces 40 dernières années nousavons appris d’importantes leçons en ce qui concerne la collaboration.

Nos partenaires nous ont appris que lorsqu’on vise haut, il n’y a pas de limite. Nous avons appris que lorsqu’on est disposé à faire des compromis avec les autres, ils sont généralement

disposés à vous rendre la pareille. Nous avons appris que la solidité d’une entreprise se mesure à celle de son maillon le plus faible.

C’est pourquoi nous ne forgeons des alliances qu’avec les meilleurs dans le domaine. La collaboration nous enseigne que le partage des produits ne constitue qu’un élément du succès.

Le succès, c’est aussi le partage des ressources. Se donner un coup de main. Et même parfois prêter l’oreille. C’est là la différence entre une collaboration qui dépérit, et celle qui se solidifie. Si cela correspond aussi

à votre idée d’un rapport mutuellement avantageux, nous vous invitons à en envisager la possibilité avec AR.

En Belgique, contactez AR Benelux BV, [email protected] ou appelez le +31-(0)172-423-000

AR Benelux Tél: 31-172-423-000 Belgique Luxembourg Pays-Bas

AR FranceTél: 33-1-47-91-75-30 France

AR United Kingdom Ltd.Tél: 441-908-282766 Irlande Royaume Uni

Caltest OyTél: 358-9-530-6070 Estonie Finlande Lettonie Lituanie

CE-BIT Elektronik AB Tél: 46-8-7357550 Suède

Emitec AG Tél: 41-41-748-6010 Suisse

EMV Gmbh Tél: 49-89-614-1710 Autriche Allemagne

Erik Blichfeld Tél: 45-7552-2020 Danemark

H TESTTél: 420-235365207 République tchèque Hongrie Slovaquie

Nortelco Electronics Tél: 47-22-57-6100 Norvège

ORKOTél: 90-312-438-2213 Turquie

Radiant-ElcomTél: 7495-725-0404 Biélorussie Russie Ukraine

Teseo S.p.A. Tél: 39-011-994-1911 Italie

Urzadzenia Elektroniczne ImportTél: 022-313-17-35 Pologne

Vector Technologies Ltd. Tél: 30-210-6858008 Albanie Bulgarie Croatie Chypre Grèce Macédoine Roumanie Serbie Slovénie

Wavecontrol, S.L.Tél: 34-933-208-055 Portugal Espagne



ASSOCIATIONS

IEEE EMC SOCIETY CHAPTER BENELUX Frank Leferink, Thales Nederland B.V., P.O. Box 42, 7550 GD, Hengelo, Nederland; +31 74-248-3132; Fax: +31 74-248-4037; [email protected]

NOTIFIED BODIES

AIB-VINÇOTTE INTERNATIONAL S.A.Business Class Kantorenpark Jan Olieslagerslan, 35, 1800 Vil-voorde, Belgique; +32/2.674.57.11; Fax: +32-2-674-59-59; [email protected]; www.vincotte.beNotifi ed Body number: 0026

ASBL ANPI VZWParc scientifi que Fleming, Rue Granbonpré 1, BE-1348 Louvain-La-Neuve, Belgique; +32:10:47 52 11; Fax: +32:10:47 52 70; [email protected]; www.anpi.beNotifi ed Body number: 1134

BLUE GUIDE EMC – MORE@MEREJoseph Cardijnstraat 21, BE-9420 Erpe-Mere, Belgique; +32 53 60 16 51; Fax: +32 53 60 16 50; www.bjemc.com Notifi ed Body number: 2023

LABORATORIA DE NAYERJ.P. De Nayerlaan 9, BE-2860 Sint-Katelijne-Waver, Belgique; +32 15 31 33 22; Fax: +32 15 32 12 12; www.labodenayer.be; [email protected] ed Body number: 0651

LABORATOIRE COMPATIBILITÉ ÉLECTROMAGNÉTIQUE - UNIVERSITÉ DE LIÈGEUniversité de Liège Institut Montefi ore B28 Sart-Tilman, BE-4000 LIEGE, Belgique, + 32 4 366 37 46, Fax: + 32 4 366 29 10, [email protected] ed Body number: 1945

LABORELEC CENTRAAL LABORATORIUM VOOR ELEKTRIC-ITEIT (CIE) / LABORATOIRE CENTRAL D’ELECTRICITÉ (LCE)

Rodestraat, 125 / Rue de Rhode, 125, BE-1630 Linkebeek, Belgique; + 32 2 382 02 11; Fax: + 32 2 382 06 49; [email protected]; www.laborelec.comNotifi ed Body number: 1943

LEMCKOGraaf Karel De Goedelaan 5, BE-8500 Kortrijk, Belgique; + 32 56 24 12 35; Fax: + 32 56 24 12 34; [email protected] ed Body number: 1944

SGS BELGIUM NV - DIVISION CEBECAvenue F. Van Kalkenlaan 9A/1, 1070 Bruxelles, Bel-gique; +32 2 556 00 20; Fax: +32 2 556 00 36; [email protected]; www.cebec.sgs.comNotifi ed Body number: 0649

OTHER

SERVICE PUBLIC FÉDÉRAL ECONOMIE, PME, CLASSES MOYENNES & ENERGIE / FEDERALE OVER-HEIDSDIENST ECONOMIE, KMO, MIDDENSTAND & ENERGIE DIRECTION GÉNÉRALE DE L’ÉNERGIE Blvd. du Roi Albert II, 16, B-1000 Bruxelles / Brussel; +32 2 277 65 79; Fax: +32 2 277 52 05; Guibert Crevecoeur, [email protected]

INSTITUT BELGE DES SERVICES POSTAUX ET DES TÉLÉCOMMUNICATIONS / BELGISCH INSTITUUT VOOR POSTDIENSTEN EN TELECOMMUNICATIE (BIPT)Sterrenkundelaan 14b 21, B-1210 Bruxelles / Brussel; +32 22 26 87 33; Fax: +32 22 23 11 28; Eric Colpaert, [email protected]

33


BELGIQUE Ressources

http://www.eemc.nl/



ČESKÁ REPUBLIKA / SLOVENSKO

150 ZDROJE

151 VÝROBKY A SLUŽBY

ČLÁNEK

153 Měření EMC v časové oblasti: Nová metoda CISPR vhodná pro analýzu přechodných rušivých vyzařování v oblasti průmyslu a automobilní elektroniky

WOLFGANGWINTER,MARKUSHERBRIG,ZUZANAWOOD,EMVGMBH

ASSOCIATIONS

CZECHOSLOVAKIA IEEE SESSIONMTT/AP/ED/EMC Joint Chapter (Česká Republika & Slovensko)

RADIOENGINEERING SOCIETY (Česká Republika & Slovensko), www.radioeng.cz/

NOTIFIED BODIES

EVPU A.S.Trencianska 19, 018 51 NOVA DUB-NICA, Slovensko; +421:42:4403600; Fax: +421:42:4403502; [email protected]; www.evpu.skNotifi ed Body number: 1293Directives: 99/5/EC Radio and telecom-munications terminal equipment2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

INSTITUT PRO TESTOVÁNI A CERTIFIKACI, A. S.T. Bati 299, 764 21 ZLIN – LOUKY, Česká Republika, +420-577 104 776; Fax: +420-577 104 855; [email protected]; www.itczlin.czNotifi ed Body number: 1023Directives: 88/378/EEC Safety of toys89/106/EEC Construction products89/686/EEC Personal protective equip-ment90/385/EEC Active implantable medi-cal devices93/42/EEC Medical devices98/79/EC In vitro diagnostic medical devices2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

LEKTROTECHNICKÝ ZKUŠEBNÍ ÚSTAV, S.P.Pod Lisem 129, 171 02 PRAHA 71 – Tro-ja, Česká Republika; +420:266104111; Fax: +420:284680037; [email protected]; www.ezu.czNotifi ed Body number: 1014Directives: 89/106/EEC Construction products90/385/EEC Active implantable medi-

cal devices93/42/EEC Medical devices95/16/EC Lifts2000/14/EC Noise emission in the envi-ronment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

STATNI ZKUSEBNA ZEMEDEL-SKYCH POTRAVINARSKYCH A LESNICKYCH STROJU, AKCIOVATranovskeho 622/11, 163 04 PRAHA 6, Česká Republika, +420 235018111; Fax: +420 235315226; [email protected]; www.szzpls.czNotifi ed Body number: 1016Directives: 2000/14/EC Noise emission in the environment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

STROJIRENSKY ZKUSEBNI USTAV S.P.Hudcova 56b, 621 00 BRNO, Česká Republika; +420::541120111; Fax: +420::541211225; [email protected]; www.szutest.czNotifi ed Body number: 1015Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels88/378/EEC Safety of toys89/106/EEC Construction products89/686/EEC Personal protective equip-ment2009/142/EC (ex-90/396/EEC) Appli-ances burning gaseous fuels92/42/EEC Hot-water boilers93/42/EEC Medical devices95/16/EC Lifts99/36/EC Transportable pressure equipment2000/14/EC Noise emission in the envi-ronment by equipment for use outdoors2000/9/EC Cableway installations de-signed to carry persons2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

TECHNICKY SKUSOBNY USTAV PIESTANY S.P.Krajinska cesta 2929/9, 921 24 Pies-tany, Slovensko; +421:33:7957233; Fax: +421:33:7623503; [email protected]; www.tsu.skNotifi ed Body number : 1299Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels88/378/EEC Safety of toys89/106/EEC Construction products2009/142/EC (ex-90/396/EEC) Appli-ances burning gaseous fuels92/42/EEC Hot-water boilers2000/14/EC Noise emission in the envi-ronment by equipment for use outdoors2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

TÜV SÜD CZECH S. R. O.Novodvorska 994, 142 21 PRAHA 4, Česká Republika; +420:239046800; Fax: +420:239046805; [email protected]; www.tuv-sud.czNotifi ed Body number: 1017Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels89/106/EEC Construction products99/36/EC Transportable pressure equipment2000/14/EC Noise emission in the envi-ronment by equipment for use outdoors2000/9/EC Cableway installations de-signed to carry persons2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

TÜV SÜD SLOVENSKO S.R.O.Jasikova, 6 PO BOX 89, 821 03 BRATISLA-VA, Slovensko; +421:2:48291286; Fax: +421:2:48291266; www.tuvslovakia.sk; [email protected] Notifi ed Body number: 1353Directives: 2009/105/EC (ex-87/404/EEC) Simple pressure vessels99/36/EC Transportable pressure equipment2000/9/EC Cableway installations de-signed to carry persons2006/95/EC Low voltage directive2004/108/EC Electromagnetic compat-ibility


ČESKÁ REPUBLIKA / SLOVENSKO Zdroje

VOP-026 STERNBERK, S.P.Olomoucka 175, 785 01 STERNBERK, Česká Republika; +420 5850 83 111; Fax: +420 5850 83 115; [email protected]; www.vop.czNotifi ed Body number: 1380Directives: 89/686/EEC Personal pro-tective equipment2006/95/EC (ex-73/23/EEC) Low volt-age directive2004/108/EC Electromagnetic compat-ibility

VYSKUMNY USTAV SPOJOV N.O.Zvo lenská Cesta , 20, 974 05, BANSKA BYSTRICA, Slovensko; +421:48:4324133; Fax: +421:48:4161163; [email protected]; www.vus.skNotifi ed Body number: 1355Directives: 99/5/EC Radio and telecom-munications terminal equipment

OTHER

CZECH ACCREDITATION INSTITUTE+420 221 004 501; Fax: +420 221 004 408; [email protected]; www.cai.cz

CZECH OFFICE FOR STANDARDS, METROLOGY AND TESTINGGorazdova 24, P.O Box 02, CZ-225 02 Praha 025; +420 224 907 144; Ladislav Budik, [email protected]

CZECH TELECOMMUNICATIONS OFFICESokolovská 219, P.O. Box 02, CZ -225 02 Praha 025; + 420 2 24 00 45 71; Fax: + 420 2 24 00 48 22; Jan Sedlacek, [email protected]

CZECH URSI NATIONAL COMMITTEEwww.ufa.cas.cz/html/ursi/

SLOVAK NATIONAL ACCREDITA-TION SERVICE (SNAS)P.O. Box 74, Karloveská 63, 840 00 Bratislava 4, Slovak republic; [email protected]; www.snas.sk/e/

SLOVAK OFFICE OF STANDARDS, METROLOGY AND TESTINGŠtefanovičova 3, P. O. Box 76, 810 05 Bratislava 15; +421 2 5249 6847; Rich-ard Cukovic, [email protected]; www.unms.sk

SLOVAK STANDARDS INSTITUTESlovenský ústav technickej normalizá-cie, Karloveská 63, P.O.Box 246, 840 00 Bratislava; 02/602 94 452, 02/602 94 315; [email protected] www.sutn.sk


Výrobky a služby

emv - Elektronische MeßgeräteVertriebs GmbH Wallbergstr. 7, Taufkirchen, 82024, Taufkirchen; +49 (0) 89 614171-0; Fax: +49 (0) 89 614171-71; www.emvgmbh.de; Ariane Wahrmann, [email protected]ýrobky a služby: Testovací nástroje, Zesilovace, Antény

Haefely Test AGPetr Kratochvil, Nad lesnim divadlem 1114, 14 200 Praha 4 - Branik, Česká Republika; +420 2 414 93981; Fax: +420 2 414 71407; Petr Kratochvil, [email protected]; www.haefely.comVýrobky a služby: Přepětí a přechodné jevy, Testovací nástroje

R

RFspin s.r.o.Jugoslávských partyzánů 1580/3, 160 00, Praha 6, Česká Republika, +420 224 353 124 – 125, Fax: +420 224 353 103, www.rfspin.cz, [email protected]ýrobky a služby: Antény

S

Schlegel Electronic MaterialsDracon-Eltron, Herastraat 51, 5047 TX Tilburg; +31 13 5780800 Nederland; Fax: +31 13 5711369; Paul Jansen, [email protected]; www.dracon.nlVýrobky a služby: Vodivé materiály, Stínění

Teseq LtdEmpos Spol s.r.o.; +420 2 4174 2084; [email protected]; www.empos.czVýrobky a služby: Zesilovače, Antény, Testovací nástroje, Testování

1-9

7 layersBorsigstrasse 11, Ratingen 40880, Germany; +49 2102 749 0 ; Fax: +49 2102 749 350 ; www.7layers.com; [email protected]; Brigit te Lewis, brigit [email protected]ýrobky a služby: Antény, Testovací nástroje, Testování

A

AR / RF Microwave InstrumentationH TEST a.s, Šafránkova 3, 15500 Praha 5 Česká Republika; +420 235365207; Fax: +420 23536893; David Koshuba, [email protected]; www.htest.cz; www.ar-worldwide.comVýrobky a služby: Zesilovače, Antény, Kabely a konektory, Odstíněné komory a pracoviště, Přepětí a přechodné jevy, Testovací nástroje

E

EM Test AGTestovaci Technika s.r.o., Hakenova 1423, 290 01 Podebrady, Česká Republika; +42 (0)325 610 123; Fax: +42 (0)325 610 134; [email protected]; www.teste.czVýrobky a služby: Přepětí a přechodné jevy, Testovací nástroje, Testování

EMC PartnerTECTRA A.S., Herr Ing. Zbynek Sommer, Domkovska 2343/43 CZ - 193 00 Praha Česká Republika; +420 281 921 650; Fax: +420 281 921 649; [email protected]; www.tectra.cz Výrobky a služby: Přepětí a přechodné jevy, Testovací nástroje

ŘEKNĚTE NÁM, CO SI MYSLÍTE

Aktualizované seznamy výrobků a služeb a překlady technických článků do angličtiny naleznete na www.interferencetechnology.eu.

VÍCE INFORMACÍ NALEZNETE ONLINE

Je pro nás velice důležité vědět, co si myslíte. Jděte prosím na www.interferencetechnology.eu a vyplňte krátký dotazník, který nám napomůže vylepšit Evropského průvodce EMC.

emv GmbHTaufkirchen, Deutschland

Czech Republic

In Czech Republic, EMC is treated in the following documents:

1) Act No. 22/1997 Coll., on tech-nical requirements for products and amending some laws, in accordance with Act No. 205/2002 Coll.

2) Government Regulation No. 616/2006 Coll of 20 December 2006 on technical requirements for prod-ucts in terms of their electromagnetic compatibility.

A detailed assessment procedure is outlined in Annexes 2 and 3 of Govern-ment Decree No. 616/2006 Coll.

SlovakiaIn Slovakia since 1999, there has

been a significant change in the assess-ment of performance of new products on the market. On 7 September 1999 an extremely important Act No. 264/99 Coll. z. (in acc. with Act No. 436/01 a 254/03) on technical require-ments for products and conformity assessment and amending certain laws was adopted. Upon enforcement of this Act, all technical standards became non-mandatory. Status of standards aimed to electromagnetic compat-ibility (EMC) is slightly different. It is given by the government regula-tion No. 394/99 of 16 December 1999 (in acc. with No. 159/02 and 245/04 respectively the latest 194/05 of 27 April 2005) laying down the details of technical requirements for products in terms of electromagnetic compat-ibility.

This regulation was issued as one of

the implementing regulations of Law No. 264/99 Z. Coll.

Government regulation No. 194/05 corresponds to the EU directive on EMC of 2004.

StandaRdSIn Czech Republic, the Czech Met-

rologic Institute CMI in Prague is re-sponsible for coordination of works on all standards. The technical standard committee TNK 47 “Electromagnetic Compatibility” revises the Czech EMC standards (ČSN) and harmonizes these with the international standards IEC, CISPR and EN.

Example of conversion between international and Czech standards:

• CENELEC EN 50 000 ČSN EN 50000

• CISPR EN 55000 ČSN EN 55000, or ČSN CISPR XX

• IEC EN 60000 ČSN EN 60000, or ČSN IEC YYY

• IEC 1000 EN 61000 ČSN EN 61000, or ČSN IEC 1000-X-Y

The EMC standards are split into three groups: EMC Standards, Im-munity Standards and Emission Stan-dards. More detailed information structure and classification can be ob-tained at Czech standard authorities.

EMC Directive Update

152 inTerference Technology europe emc guiDe 2011

česká republika / Slovensko

WOLFGANG WINTER, MARKUS HERBRIG, ZUZANA WOOD emvgmbhWallberstrasse7,82024taufkirchen,Deutschland

Metoda měření v časové oblasti se používá k zachycení náhod-ných a časově omezených

vf-rušení. V oblasti automobilní elek-troniky se stávají tato rušení stále kritičtějšími. Komfortní vybavení automobilu, jako např. bluetooth připojení k externímu zařízení s kom-plexní vysokofrekvenční funkciona-litou (Automotive-WLAN, UMTS, GSM, WCDMA, MIMO, Multiband Smart Phones, Netbooks) musí komu-nikovat se systémem integrovaným v automobilu, aniž by bylo rušeno. Na základě technických koncepcí těchto bezdrátových komunikačních sítí, jsou používány procesy s rychlou změnou frekvence za účelem potlačení rušení a časově omezených náhodných vf-signálů. Tyto však mohou být rušeny překrývajícími se signály i přes kom-plexní ko rekci chyb. Tato rušení mo-

hou být širokopásmová a úzkopásmová, mohou ale také mít časově omezené a transientní vlastnosti. Cílem nových digitá lních radiokomunikačních přenosných systémů je, vedle lepšho využití frekvenčního spektra, také snížení zatížení životního prostředí vf-zářením.

Z tohoto důvodu je vyzařovaný vf-výkon digitálních služeb zprav-idla nižší než dříve používaných analogo vých systémů (např. DVB-T a analogové televize). Zachycení těchto signálů, anebo rušičů, a re-produkovatelné měření se správným nastavením (např. Dwell Time) je náročné a v yžaduje nové měřicí technologie. Nejnovější metodou je měření se systémy v časové oblasti a v ýpočet kmitočtového spektra pomocí Fourierovy transformace. V dnešní době jsou dostupné velmi ry-chlé analogově-digitální měniče s více než 109 vzorky za sekundu, a s velmi výkonnými a vysoce integrovanými FPGAs (Field Programmable Gate Arrays), které umožňují nepřetržité sledování analogového vstupního signálu a současnou kalkulaci až 4000

Měření EMC v časové oblasti:Nová metoda CISPR vhodná pro analýzu

přechodných rušivých vyzařování v oblasti průmyslu a automobilní elektroniky

Obr. 1. Blokový diagram měřicího přijímače EMC


česká republika / Slovensko

German translation available


EMV-Messungen im Zeitbereich: Neue CISPR-konforme Messverfahren zur Analyse transienter Störaussendungen im Bereich Industrieund Kraftfahrzeugelektronik

frek-venčních bodů s požadovanými CISPR 16-1-1 detek-tory a šířkami pásem. Tradiční vysokofrekvenční měřicí přijí-mače zachycují transienty a časově omezené vf-rušiče jen náhodně, když se tyto právě nachází v pozorovaném kmitočtovém rozmezí, které směšovač přetransformuje na mezifrekvenční kmitočet. Aby mohl být tento rušič spoleh-livě zachycen, musí být známa šířka pásma a jeho kmitočet a pak tento změřen po velmi dlouhou dobu na jednotlivých kmitočtových bodech.

I. ÚVODMěření signálu v časové oblasti napomáhá porozumět příčině a působení komplexních elektromagnetických rušení moder-ních elektronických systémů.

Mezinárodní normalizace, podle které se zajišťuje bez-poruchový provoz všech elektronických systémů, má na zák-ladě rychlého vývoje komerčně používaných vysokofrek-venčních aplikaci složitou úlohu. Např. se očekává, že zave-dením nejnovějšího standardu mobilního vysílání LTE vzni-kne nezanedbatelný rušivý příspěvek. Tato rušení by mohla ovlivnit televizní kabelovou síť, DVB-T-příjem, rádiové při-jímače a mobilní USB-přijímací jednotky. Rádiové přijímače nejsou připraveny na LTE-signály v pásmu 790 – 862 MHz, které se nachází nad frekvencí radiových vysílačů. Zde nor-motvorné orgány ještě nemají dostatečné množství namě-řených výsledků, aby se mohla případně omezit připustná úroveň LTE vysílačů, anebo zvýšit odolnost přípustná proti rušení v tomto kmitočtovém pásmu.

Výpočet kmitočtového spectra prostřednictvím dat v časové oblasti za použití matematického postupu (Fouri-erovy tras-formace) uveřejnil J. Cooley a J.W.Tukey v roce 1965 na zák-ladě prací C.F. Gausse z roku 1805. Optima lizace algoritmů s potlačením možných chyb a nepřesnosti byla vypracována v 70. letech, jelikož byly v této době vyvinuty první výkonné analogově-digitální převodníky. K prvním oblastem použití těchto FFT-analyzátorů (Fast Fourier Transformation) došlo v nízkofrekvenční oblasti, např. u analýzy chvění mechanických systémů (např. u automobilů, letadel), audio-aplikací a iterpretaci městských meteorologických dat v oblasti ochrany životního prostředí. Zde se pracovalo s hraničními kmitočty v oblasti kHz a použití pro vysokokmitočtové aplikace se zdály ve vzdálené budoucnosti.

Dynamický proces vývoje analogově-digitálních převodníků umožňuje v současné době nasazení v GHz oblasti, např. u rychlých paměťových osciloskopů.

Oscioloskop se však nemohl prosadit jako EMC měřicí systém, jelikož měření dle norem vyžaduje použití dalších hardwarových a soft-warových komponentů. Při vyhod-nocení dat časové oblasti bez analýzy v ní obsažených kmitočtových podílů je těžké rozlišit užitečné signály od rušivých. Vyhodnocení vf rušivých emisí dále vyžaduje plynulé pozorování testovaného objektu alespoň na jed-nom kmitočtu. Toto nelze běžnými paměťovými oscilos kopy realizovat, jelikož jsou data nejprve uložena do paměti a teprve poté pomocí FFT transformována do kmitočtové oblasti. Zde se ztratí pozorování rušivého signálu v časové oblasti. EMC normy předepisují speciální hardware, jako např. automatické vf-útlumové články s dolní propustí, předselekce pásma A, B, C a vyhodnocovací filtry (např.

Peak, Average, RMS, Quasi Peak, CISPR AVG, CISPR RMS), které všechny musí odpovídat příslušným normám. K dalším požadavkům patří normované mezifrekvenční filtry a mezifrekvenční pásma (např. 200 Hz, 9 kHz, 120 kHz, 1 MHz). Poté musí být STFFT (Short Term Fast Fourier Transformation) algoritmus a hardware imple-mentovány tak, aby bylo zaručeno kontinuální pozorovaní vysokofrekvenčního signálu [7].

Požadavek na použítí Fourierovy transformace v oblasti EMC, byl odůvodněn přibývajícími přechodnými rušiči v prostředí automobilové elektroniky. První systémy byly založeny na bázi paměťových osciloskopů a byly navrženy jako single-shot systémy, aby mohly vyšetřovat časově omezené poruchy přesněji. Experimentální studie pak musely být doplněny o další hardwarové kompo-nenty, aby bylo dosaženo jednoznačného znázornění v kmitočtovém rozsahu. Jelikož při vf měření není ma ximální frekvence většinou známa, vyžaduje vstup A/D stupně nízkofrekvenční propust (anti-aliasing filtr). Ten omezí maximalní frekvenci, která může být digitalizována tak, aby v časové oblasti byly sejmuty nejméně dva vzorky na periodu sinusového signálu. To zajišťuje rekonstrukci signálu (Nyquistův teorém). Zobrazení v kmitočtovém rozsahu je pak až do mezní frekvence jednoznačné.

Běžný paměťový osciloskop je s jeho limitovanou hloubkou paměti pouze omezeně použitelný v oblasti měření EMC. Kromě toho je definice vzorkování prob-lematická, protože rušiče mohou být překryty úzkopás-movými, širokopásmovými nebo jinými rušivými či užitečnými signály. Mikroprocesorem řízené bus-systémy v automobilovém průmyslu, jako je CAN, LIN, FlexRay a externí řídicí zařízení (motor, ABS, ESP, atd.) způsobují in-terfererence vyzařováním i po vedeních. Reprodukovatelné snímání potenciálních rušičů je zde pomocí konvenčních metod měření jen velmi obtížné.

Širokopásmové měření vf emisí v kmitočtovém rozsahu vyžaduje speciální hardware a software. Aby bylo možné digitalizovaná data v GHz rozsahu s co největší šířkou pásma transformovat do kmitočtového rozsahu, jsou použity speciální programovatelná pole FPGAs (Field Pro-grammable Gate Arrays), která provádí rychlou Fourierovu transformaci STFFT (Short Term Fourier Transform) v reálném čase.

Kromě výpočtu kmitočtového spektra, jsou u EMC aplikací zapotřebí další funkce přístroje. Měřicí přístroje musí splnit normami předepsané charakteristiky filtrů, předdefinované IF šířky pásem, a detektory musi být k dispozici.

Technik potřebuje navíc znát korelaci mezi oběmi metodami měření. To znamená, že naměřená frekvenční spektra, která jsou zaznamenána systémy měření v časové oblasti, musí být srovnatelná se spektry, které byly zazna-menány s konvenčními měřicími vf přijímači. Odchylky naměřených hodnot by neměly být větší než odchylky dvou přístrojů stejné technologie. To je nutné z důvodu právních aspektů připouštěcích měření, jako je CE certifikace a z ní odvozená odpovědnost výrobce výrobku. Poslední gene race systémů měření EMC v časové oblasti je obsluho-vatelná jako konvenční měřicí vf přijímač, a také v prezen-taci naměřených výsledků v přijímacím módu (start/stop frekvence, Limit Lines, IF pásma, doba prodlevy, atd.) se


Winter česká republika / Slovensko

neodlišují od měřicích vf přijímačů.Typické vol itelné parametr y

těchto přístrojů jsou frekvence startu a zastavení skenování, dále normou CISPR [1, 2] stanovené

rozlišení šířky pásma nebo IF pásma, doba setrvání, normu splňující de-tektory (peak, average, RMS, quasi peak , CISPR AVR), anténní fak-tory, hraniční hodnotové křivky,

Obr. 4. VF emise zapnutého kuchyňského mixeru na bezdrátové frekvenci. (2,4 GHz) s odstupem 1 m od monopólové anteny

znázornění v dBmV, CISPR 16-1-1 kompatibilní vlastnosti vf přijímače, v f předzesi lovač, předselekce a automatické EMC-kompatibilní vf atenuátory na vstupním modulu přístroje.

Funkčnost všech těchto úloh a technických rámcových pod-mínek je realizována v nové ge neraci systemů měření EMC v časové oblas-ti (TDEMI).

II. SYSTÉMY PRO MĚŘENÍ V čASOVÉ OBLASTI

A. VF přijímače pro měření EMCKonvenční měřicí VF přijímač je v dnešní době konfigurován jako heterodynový detektor (superhe terodynní přijímač). Tento přijímač zachycuje užitečný signál v daném kmitoč-tovém pásmu. Princip za-pojení na trhu dostupných EMC měřicích přijímačů je zobrazen jako blokové schéma na obr. 1.

50-ohmov ý vstupní v f signál z přijímací antény, nebo LISN je automatick ým atenuátorem na staven tak, aby další vstupní bloky byly chráněny před poškozením a přístoj byl ideálně laděn s cí-lem optimálně využít dostupnou dynamiku. Následující předvolba potlačí signály, které se nachází mimo pozorované frekvenční pásmo. Toto zlepšuje dynamický rozsah, pokud se v sousedství měřeného velmi nízkého užitečného signálu nachází vf signál s vysokou hladinou. VF signál je po předvolbě dále veden k vlastnímu směšovacímu stupni.

Vstupní signál je poté smísen se signálem ladicího oscilátoru. Přitom se vytvoří celá řada nových frekvencí, z nichž některé jsou pro další zpra-cování nežádoucí. Poté následující mf fi ltr propustí dál jen úzký frekvenční rozsah střední frekvence filtru, a ostatní frekvence jsou maximálně u tlumeny. mf fi ltry jsou v jejich rozsa-hu a charakteru přesně defi novány normou CISPR 16-1-1. Následná demodulace fi ltrovaného IF signálu se děje pomocí normou určenými detektory.

Mě ř ic í p ř i j í m ač u mo ž ňuj e pro s t ře d n ic t v í m pře d volby a předzesílením mnohem vyšší dy-namiku a vstupní citlivost než u běžných spektrálních analyzátorů.

Obr. 2. Systém pro měření emisí v časové oblasti / Time Domain EMI Measurement. System (TDEMI) [5]

Obr. 3. Srovnávací měření TDEMI/VF-měřicí přijímač

MĚŘenÍ eMC V ČASOVÉ OBL AStičeská republika / Slovensko


Předselekce a automatický tlumič jsou zde důležitou součástí kon-cepce, aby se dal přijímač použít v oblasti EMC, a aby se vyloučila satu-race přístroje. Volitelné šířky EMC pásem, nastavitelná doba prodlevy a detektory, které musí být v souladu s normou CISPR 16-1-1, to jsou typické parametry, které musí splnit systém měření EMC.

Ty p i c k ý m i n e v ý h o d a m i v f přijímačů jsou následující vlastnosti:• Dlouhé doby měření u úzkopás-

mových mf fi ltrů (200 Hz, 9 KHz) a Quasi Peak detektoru

• Sekvenční zachycení frekvenčního spektra

• Nen í mož no s t měřen í v íc e frekvenčních bodů sou-časně

• Není informace o fázi pro inverzní transformaci do časové oblasti

• Problemat ické měřen í t ra n-sientních signálů a signálů s frekvenčním posuvem

B. Systémy pro měření EMC v časové oblasti (TDEMI)Základní provedení systémů měření EMC v časové oblasti je zobrazeno na obr. 2

VF signál je veden přes ate nuá-tor dá le k dolní propusti . Tato zajišťuje, že až do defi nované hraniční frekvence měřicího systému jsou digitalizovány všechny frekvenční složky bez zjevných frekvenčních komponentů (Nyquistův zákon). Toto zaručuje jednoznačnou zpětnou vazbu digitalizovaného vstupního signálu do původního analogového signálu. Omezení horní vstupní frekvence je vždy nutné, jelikož data v časové oblasti mohou obsahovat libovolné frekvenční složky. Použití dolní propusti pro vstupní vf signál je v podstatě základem každého digi-tálního měřicího systému.

Automatický attenuator vyhodnotí úroveň vstupních VF signálů, které mohou obsahovat periodické, CW a pulzní komponenty. Poté se oslabí stupní vf signál tak, aby byl analogově-digitální převodníkový stupeň ideálně vyladěn.

Normou CISPR 16-1-1 předepsaný rozsah (spurious free dy-namic range s minimálně 36 dB pro přechodné signály a 40 dB pro pevné signály) může být dodržen s dnes dostupnými A/D převodníky s rozlišením 10 bitů a s hraniční frekvencí ca. 2,3 GHz [3].

U digitálních systémů se zvláště musí dát pozor na případné artefakty ve frekvenčním spektru. Možné arte-fakty vstupního vf signálu vznikající během digitalizace a jsou závislé na počtu odběrů vzorků z ADC. Pokud dojde k intermodulaci mezi vnitřním taktem ADC a vstupním signálem, mohou se objevit nežádoucí prvky zdánlivé frekvence,. Těmto případným zdrojům chyb lze předejít zavedením techniky multiodběru

Obr. 5. Porovnání výsledků měření (41 MHz - 770 MHz) bez rušičů. Nahoře: Systém měření EMC v časové oblasti. Dole: vf-měřicí přijímač.

Obr. 6. Porovnání výsledků měření FM pásma (76 – 108 MHz), zapalování,současné uvedení do činnosti el. zadních dveří vozu (zavírání), Nahoře:Systém měření EMC v časové oblasti. Dole: vf-měřicí přijímač.

vzorků (multisampling technique). Zároveň se během každého měření mění vzorkovací rychlost ADC, přičemž nežádoucí složky mění pak jejich polohu v kmitočtovém rozsahu a mohou tak být přesně zjištěny.

Aby bylo možné posk y tnout srovnatelný dynamický rozsah bez intermodulací, tak jak jsou uživatelé VF měřicích při-jímačů zvyklí, jsou u nejmodernějších systémů pro měření v časové oblasti (např. TDEMI) použity



paralelní ADC stupně.Zejména impulzní signály vyžadují ca. 20 bitové A/D

převodníkové rozlišení, aby bylo dosaženo parametrů v souladu s CISPR16-1-1. Analogový vstupní VF signál je po průchodu low-pass fi ltrem prostřednictvím logaritmick-ých výkonových děličů rozdělen na vícero A/D převodníků. Vyladění jednotlivých stupňů A/D převodníku následuje pak v závislosti na úrovni vstupního signálu.

Poté, co vstupní signál prošel vstupní fází a A/D-převodníkem, je signál pomocí FPGA (Field Program-

mable Gate Arrays) a STFFT (Short Term Fast Fou-rier Transform) transformován do frekvenční oblasti. CISPR detektory jsou implementovány na paralel-ním FPGA, a umožňují v reálném čase výpočet 4000 frekvenčních bodů [4].

Implementace této techniky byla provedena Brau-nem a Russerem [5], spolu s příspěvky od Aidama [3]. První pokus, ve kterém byl použít paměťový osciloskop s následnou FFT pro měření EMC, provedl Keller a Feser [7]. CISPR normou předepsané kontinuální sledování VF signálu a potřebu poskytnout mf výstupní signál požadoval specifi ckou kon-strukci EMC systému měření v časové oblasti. Aby bylo možné získat ana logový mf signál z digitálních hodnot, je po-třeba použít výpočetní jednotka, která dokáže zpracovat vstupní vf signály v reálném čase. Výhodou je (kromě analogového mf výstupu) sběr vf dat s nastavenou dobou setrvání v reálném čase, a to bez jakéhokoli zatemňovacího intervalu. Bylo prokázáno, že VF spektra naměřena s kon-venčním meřicím přijímačem, korelují velmi dobře se spektry naměřenými systémy v časové oblasti (TDEMI). Odchylka amplitudy se u prove-dených vyhodnocovacích zkoušek pohybuje na cca 1 dB (špičkový detektor), 0,4 dB (kvazišpičkový detektor) a 0,2 dB (detektor střední hodnoty).

Odchylka je srovnatelná s odchylkou, kterou by-chom obdrželi také mezi přístroji stejné výrobní série. U TDEMI systémů se používá stejné kalibrační metody jako u konvenčního měřicího vf přijímače (Schwarzbeck pulsní generátor IGUU2916, atd.). Zpětná vazba kalibrace Schwarzbeckova pulsního generátoru je prováděna u Physikalische Technische Bundesanstalt (PTB) rychlým paměťovým osciloskopem, který používá FFT k určení frek-venčního spektra.

III. STRATEGIE EMC MĚŘENÍMotivací pro další vývoj TDEMI systémů je požadavek lépe pochopit rušivé emise komplexních elektronických systémů a schopnost tyto rychleji analyzovat. Velmi důležitou výhodou této technologie je drasticky zkrácená doba celkového měření, a tudíž je předměření (takzvaný pre-scan) rušivých maxim zcela zbytečný. Kromě toho je jedno jediné měření dostačující k získání přehledu o všech přechodových rušičích ve frekvenční oblasti s ohledem na opakovací frekvenci a z ní odvozenou normou předepsanou dobu setrvání. Vzhledem k tomu, že toto vždy podstatně zvyšuje dobu měření, často se nenastavují ty časy prodlevy, které by aplikace vyžadovala. Uživatel se orientuje nejmenší povolenou dobou prodlevy na jednotlivých kmitočtech, neboť při malých frekvenčních krokách by měření trvalo i několik hodin.

Velmi krátké doby měření TDEMI systémů umožňují ušetřením času uživateli téměř libovolný počet opakování měření. I tak je celková doba měření stále ještě nižší než u konvenčních měřicích přijímačů. Z ekonomického aspektu zvyšuje technologie měření v časové oblasti v souladu s CISPR 16-1-1 normou hospodárnost používání testovacího EMC zařízení, plně bezodrazové komory FAR (Fully Anech-oic Room) nebo automotive tlumící stíněné míst-nosti ALSE (Automotive Absorber Lined Shielded Rooms).

Časově omezené a přechodné vf emise, způsobené například servo a regulačními motory u automobilových



Tabulka 1. CAS MĚŘENÍ CISPR 25, VF MĚŘICÍ PŘIJÍMAČ

Tabulka 2. ČAS MĚŘENÍ CISPR 25 , SYSTÉM MĚŘENÍ EMC V ČASOVÉ OBLASTI (TDEMI)

Tabulka. SNÍŽEJNÍ DOBY MĚŘENÍ ZKOUŠEK DLE CISPR 25 SYSTÉM MĚŘENÍ V ČASOVÉ OBLASTI TDEMI VE SROVNÁNÍ S KONVENČNÍM VF MĚŘICÍM PŘIJÍMAČEM

aplikací (kli-matizace, seřízení sedadla, elektricky o vládané zadní dveře, el. zrcátka, ABS, ESP), lze tak nyní přesně měřit a analyzovat.

Obr. 4: VF emise zapnutého kuchyňského mix-eru na bezdrátové frekvenci (2,4 GHz) s odstupem 1 m od monopólové anteny.

TDEMI systémy jsou schopny také v spe-ktrogramovém režimu s pásmy v reálném čase zaznamenávat po několik minut frekvenční data a tak vytvořit přímý časový vztah k vf rušení. K tomu je použito trojrozměrného zobrazení času/frekvence/amplitudy (viz obr. 4).

IV. MĚŘENÍ EMC A ÚSPORA čASU: MĚŘICÍ PŘIJÍMAč VE SROVNÁNÍ SE SYSTÉMEM MĚŘENÍ EMC V čASOVÉ OBLASTI (TDEMI)

A. Typické doby měření: měřicí přijímač / EMC systém měření v časové oblastiTypický čas měření potřebný při stejném nastavení přístrojů pro standardní měření (CISPR 25) ukazuje na významné rozdíly mezi oběma koncepcemi.

Obě technologie byly měřeny pouze v módu kompatibilním s CISPR, přičemž nebylo použito funkce předměření (pre-scan) konvencionálního přijímače, protože tato vyžaduje předměření a přitom ke ztrátě informace. Různá měření ukazují, v závislosti na nastavení doby prodlení, šířky mf pásma, velikosti kroku a detektoru, časovou výhodu TDEMI systému danou fak-torem 500x i větším.

Srovnání bylo provedeno s jedním komerčně dostupným mě-řicím vf přijímačem a jedním systémem pro měření emisí v časové oblasti. Oba přístroje byly řízeny manuálně a propojeny se stejnou testovací sestavou.

Bylo zjištěno, že čas měření metodou měření v časové oblasti může být snížen o několik řádů. To otevírá nové možnosti pro testování složitých moderních elektronick-ých systémů. Provést konvenčními metodami rozsáhlou analýzu všech vf emisí je stěží ekonomicky uskutečnitelné, protože časy měření mohou být téměř libovolné. Další problém je nutnost opakování měření, s cílem přesně zjistit příčinu možných rušičů. Pakliže se jedná o přechodné nebo o frekvenčně nestabilní emise je metoda měření v časové oblasti výrazně lepší než metoda konvenčního su-perheterodynního přijímače. Některé rušiče lze skutečně zaznamenat jen s těmito systémy.

Podle standardizace mají bý t zkušební vzorky testovány pouze za běžných provozních podmínek. Zkoušení kávového automatu, elektricky řízených zad-ních dveří u vozu nebo elektrického otevírání oken není u několikahodinového měření možné. Výše popsaná testovaná zařízení by se důsledkem tepelného přetížení vypnula, a navíc by se nepředvídaným trvalým provozem změnilo emisní spektrum.

To by mohlo znamenat, že by se stanovily nesprávné kroky k potlačení emisí, které by technicky neměly smysl nebo by se zbytečně zvýšily náklady na výrobu.

B. Výsledky měřeníJako příklad byl změřen osobní vůz horní střední třídy (naf-

tový motor) na volném prostranství OATS (Open Area Test Site) [9]. U první série měření bylo použito log-periodické antény, která byla umístěna ve vzdálenosti 3 m od zádi resp. od motorové části vozidla. Tato byla pak střídavě připojena k systému TDEMI nebo ke konvenčnímu měřicímu přijímači.

Okolní rušení jsou v tomto měřicím postupu příznivá, protože jsou k dispozici stávající užitečné signály v ana logovém FM pásmu a digitální rozhlasové a televizní signály, které umožňují reálnou kulisu prostředí. Lze bezprostředně hodnotit, zda poruchy na palubě ovlivňují přijímač.

Při srovnání výsledků obou měřicích metod zjistíme dobrou shodu dat. Zejména stacionární signály, jako



Obr. 7. Spektrogram, CISPR 16-1-1 Peak-Detektor, IF šířka pásma a 50 ms setrvání, FM pásmo (76 – 108 MHz), zapalování, automatické zavírání zadních dveří., Nahoře: Frekvenční spektrum posledního scanu. Dole: Průběh: čas/frekvence/signál amplituda

Obr. 8 Proces startování vozidla, měřen systémem měření v časové oblasti TDEMI

je např. vysílač FM (76 až 108 MHz), poskytují stejné výsledky. Odchylky vzniknou pokud signály nejsou časově a frekvenčně stacionární. Rozdíly lze rozeznat u DVB-T signálů (174 - 230 MHz a 470 - 862 MHz). Zde hraje roli nastavení doby měření a to že TDEMI systém posky-tuje frekvenční data v reálném čase. Měřicí vf přijímač se přelaďuje samozřejmě jen velmi pomalu přes kmitočtové pásmo a nemůže zaznamenávat data v reálném čase. Další srovnávací měření mezi oběma technologiemi byly prove-deny Braunem, Donauerem a Russerem [8].

Bylo provedeno srovnávací měření v přijímačovém režimu, podle CISPR 25, ve FM pásmu (76 MHz až 108 MHz), se zapalováním a při zavření elektrických zadních dveří vozu. Zde jsou systémem měření v časové oblasti

velmi dobře zachycena širokopásmová rušení mezi 80 a 87 MHz (obr. 6), zatímco konvenční vf měřicí přijímač s 50 ms dobou měření nezobrazuje rušení tak rozsáhle. Tato rušení jsou způsobena nedokonalým rušením výkonové elektroniky servomotoru zadních dveří vozu.

Časový průběh celého procesu zavírání je znázorněn na obr. 7. Kromě stacionárnich FM vysílačů lze rozpoznat širokopás-mové rušení pohonu zadních dveří.

U FM pásem (76 – 108 MHz) se jedná o následující sta nice: 88.8 Radio FM, 89.5 B2, 90.1 B5, 92 OE1, 93.7 B1, 94 Kronehit, 94.8 Radio S, 96.7 Charivari, 97.7 DLF, 98.5 B3, 99.4 Bayernwelle, 100.1 DLF, 101.2 Radio, 101.8 Salzburg, 102.3 B4, 103.5 Antenne, 104.5 FM4, 105.1 Arabella, 105.7 B5, 106.2 Welle1, 107.2 Klassik, 107.7 Antenne.

Další příklady měření, která lze dobře ana-lyzovat systémem měření v časové oblasti, jsou například proces startování motoro-vého vozidla se všemi poruchami palubní elektroniky.

Měření bylo provedeno v souladu s CISPR 25 v jedné plně bezodrazové komoře FAC (fully anechoic room). Vlastní rušení bylo změřeno na anténě vozidla.

Odpovídající spektrogram časového průběhu amplitudy a frekvence procesu startování vozidla je znázorněn na obr. 9. Při t = 6,5 s byl motor vypnut. Lze rozeznat „plochu“ rušení u běžícího motoru. Rušení způsobené starterem je zhruba o 25 dB nižší než rušení způsobené elektrickými zadními dveřmi vozu.

Aplikace, u kterých se používá digitálních rozhlasových slu-žeb, mohou být ideálně změřeny právě se systémy v časové oblasti. Zde je zejména vhodné spektrogramové zobrazení s časovým průběhem vf signálu.

Ve volném prostoru byla změřena nová pozice mezi základnovou a mobilní stanicí GSM. Nastavení se provádí s CISPR 16-1-1 detektory a mf pásmy. Frekvence 890,1 MHz a 914,9 frekvence jsou frekvencemi GSM900 buňkové sítě.

Pro domácí spotřebiče lze tento postup měření velmi dobře použít také pro časově omezené poruchy.

Kuchyňský mixer, vyroben v roce 2009 pro USA trh, vytváří na vzdálenost 1 m širokopásmové spektrum vyzařování, které je dostatečně silné, aby úplně překrylo



Obr. 9. Startování vozidla ve spektrogramovém režimu, měřeno se systémem TDEMI

Obr. 10. Váhový spektrogram: GSM-pásmo (890.1 až 914.9 up link). Nahoře: Frekvenční spektrum posledního scanu. Dole: Časový průběh amplitudy a frekvence, x-osa = frekvence, y-osa = čas, z-osa = amplituda

Obr. 11. Váhový spektrogram: Vyzařované rušivé emise elektrického kuchyňského mixeru, které se překrývají s užitečnými signály bezdrátových spojů.

slabé signály bezdrátového spoje.Při současném provozu mixeru a PC by uživatel např.

nemohl z internetu stahnout recept. Nejedná se o v dnešní době neobvyklou aplikaci. Překrytí signálu Bluetooth a signálů WLAN jsou zřetelně porovnatelné před a po vypnutí mixéru na

V oblasti vývoje a Obr. 12 výroby energeticky úsporných zářivek je frekvenční odstup oscilátorového modulu od tradičního měřicího přijímače jen velmi obtížně měřitelný. EMC systémy měření v časové oblasti zde poskytují další cenné informace.

Za nepříznivých podmínek může dojít k intermodu-laci mezi dálkovým ovládáním audio a video zařízení a oscilátorů úsporných zářivek. Tyto efekty jsou snadno zjistitelné právě metodou měření v časové oblasti

V. ZÁVĚRByly porovnány dostupné technologie přijímačů (super-heterodynové přijímače, systémy měření EMC v časové oblasti) a tyto testovány z hlediska vhodnosti zachycení zvláště kritických rušení. Srovnávací měření prokázala, že oba postupy poskytují v souladu s CISPR 16-1-1 stejné naměřené výsledky. Rozdíly se pohybují v rozsahu 0,5 dB a jsou tím v rozmezí nejistoty měření mezi různými měřicími přijímači stejného provedení. Přechod od konvenčního vf přijímače k moderním systémům měření v časové oblasti je možný pro kontrolní i schvalovácí měření. Kalibrační

metoda DKD používá pro obě technologie shodné právní a testovací předpisy a kalibrační přístroje. To také zajišťuje návaznosti kalibrace a použitého zkušebního zařízení. Metoda měření v časové oblasti ukazuje výhody, zejména pokud se jedná o velmi krátké časy měření nebo o hodnocení časově omezených přechodných a frekvenčně odchylných elektronických systémů.

LITERATURA• CISPR 25 Vehicles, boats and internal combustion engines- Radio disturbance characteristics- Limits and methods of mea-surement for the protection of on board receivers. Switzerland Int. Electrotech. Commiss., 2008.• CISPR 16-1-1, Specification for Radio Disturbance and Im-munity Measuring Apparatus and Methods Part 1-1: Radio Disturbance and Immunity Measuring Apparatus-Measuring Apparatus. Switzerland: Int. Electrotech. Commiss., 2003.• S. Braun, M. Aidam, and P. Russer, “Development of a mul-tiresolution time-domain EMI measurement system that fulfils

CISPR 16-1,” in Proc. 2005 IEEE Int. Symp. Electromagn. Compat., Chicago, IL, pp. 388-393.

• A. V. Oppenheim and R.W. Schafer. Discrete-Time Signal Processing. Englewood Cliffs, NJ: Prentice-Hall, 1999.

• S. Braun and P. Russer, “A low-noise multiresolution high-dynamic ul-tra-broad-band time-domain EMI measurement system,” IEEE Trans. Microw. Theory Techn., vol. 53, no. 11, pp. 3354-3363, Nov. 2005.

• S. Braun, M. Al-Qedra, and P. Russer, “A novel realtime time-domain emi measurement system based on field programmable gate arrays,” in Proc. 17th Int. Zurich Symp. Electromagn. Compat., Digest, Signapore, Feb. 2006, pp. 501-505.

• C. Keller and K. Feser, “Fast emission measurement in time domain,” presentation at the 14th Int. Zurich Symp. Electromagn. Compat., Zurich, Switzerland, Feb. 20-22, 2001, Paper no. 70K7.

• Stephan Braun, Thomas Donauer and Peter Russer, “A Real-Time Time Domain EMI Measurement System for Full- Compliance Measure-ments According to CISPR 16-1-1, IEEE Trans. Electrom. Comp., vol. 50, no. 2, May 2008

• W. Winter, M. Herbrig, “Time Domain Measurements in Automotive Applications,” in Proc. 2009 IEEE Int. Symp. Electromagn. Compat., Austin, TX, pp. 109-115.

WOLFGANG WINTER, Sales Manager at emv GmbH, can be reached at [email protected]. Markus Herbrig, Projects & Support at emv GmbH, can be reached at [email protected]. Zuzana Wood, Sales Central & Eastern Europe at emv GmbH, can be reached at [email protected].

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Obr. 13. Váhový spektrogram: Posuv frekvence u energie-úsporných zářivek x-ose = frekvence, y-osa = čas, z-osa = amplituda

Obr. 12. Váhový spektrogram: WLAN (2.400,0 - 2.483,5 GHz) Bluetooth (2.402,0 – 2.480,0) a širokopásmový rušič - kuchyňský mixer, x- osa = frekvence, y-osa = čas, z-osa = amplituda



ÖSTERREICH

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