Electronics for first beam tests of diamond sensors

Presented by: Igor Emeliantchik

NC PHEP, Minsk: Konstantin Afanaciev,

Igor Emeliantchik

Alexander Ignatenko

Alexander Solin

DESY Zeuthen: Hans Henschel

Instrumentation of the Forward Region

for a Linear Collider Detector

Prague

April 15 – 17, 2004

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Current Status of Diamond Sensors Research

Laboratory tests with 90Sr:Charge collection efficiency of 20%

Next step:first prototype for beam tests

Beam tests planned:PITZ ate first,

thenCERN, HERA, TTF2

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Typical spectrum of x-ray tube.Something similar can be expectedat sensor location

What should we expect at PITZ?

5MeV

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Diamond Sensor and -quanta

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1

1 10 100 1000

E, keV

Pro

ba

bil

ity

of

inte

rac

tio

n

Probability of photon interaction within300 m of diamond sensor

Calculations are based on data compiled by W. H.McMaster et. al. Compilation of X-ray Cross-Sections, National Bureau of Standards, for calculation of x-ray cross sections,http://www.csrri.iit.edu/periodic-table.html

Photons with energies of several keV are expectedto give main contribution.

13 eV are needed for 1 e-hole production.

Thus 1 photon will give about 100e.

So, if PITZ halo contains a dozen or more photons with energy of several keV per bunch, we havea chance to register it with our diamond sensor

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Time Structure of the Beam at PITZ

So, we need fast electronics, able to operate at 100ns bunch rate with minimum noise

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Readout Electronics for Beam Tests of Diamond Sensors

Diamond

Metallized plastic box

CSP“Tetrod”

Rfb

Cfb

Ccal 50

OpAmpAD829

Test

Output

Charge-sensitive preamplifier “Tetrod” is a low-noiseone-channel monolythic IC, developed at NC PHEP (Minsk), and produced by microelectronics plant “Integral” (Minsk)

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Two Types of “Tetrod” Preamplifier IC

CTRL_I(BT)

3

2

1

C_SH2

C_SH1

OUT-

OUT+

C_FB

R_FB

IN_T BT

GND

IN

Tetrod-JFETpreamplifier

Tetrod-BJTpreamplifier

Tetrod preamplifierswere designed forcalorimetric applications,so they have big dynamic range,at least 13 bits

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Tetrod-BJT amplifier

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Oscillograms of Tetrod-BJT Amplifier

20ns/div

20ns/div

Preamp output

Shaper output

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Performance of Tetrod-BJT Amplifier

Noise

Linearity

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Performance of Tetrod-jFET amplifier

Noise

Linearity

Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004

Conclusions

Two amplifiers, Tetrod-BJT and Tetrod-jFET aredesigned, produced, and tested.

Tetrod-jFET has slightly better noise performance.

Tetrod-BJT is faster

Both amplifiers seem to be suitable for beam tests