Upload
yuma
View
35
Download
0
Tags:
Embed Size (px)
DESCRIPTION
EE5342 – Semiconductor Device Modeling and Characterization Lecture 23 - Spring 2004. Professor Ronald L. Carter [email protected] http://www.uta.edu/ronc/. Reverse Early VAR extraction. VAR eff = - i E /[ i E / v BE ] vBC VAR was set at 200V for this data When v BE = 0 - PowerPoint PPT Presentation
Citation preview
L23 April 13 1
EE5342 – Semiconductor Device Modeling and CharacterizationLecture 23 - Spring 2004
Professor Ronald L. [email protected]
http://www.uta.edu/ronc/
L23 April 13 2
198
200
202
204
0 1 2 3 4
VAReff(V) vs. vEC (V)
Reverse EarlyVAR extractionVAReff =
-iE/[iE/vBE]vBC
• VAR was set at 200V for this data
• When vBE = 0
vBC = 0.75VAR=200.5
vBC = 0.85VAR=200.2
vBC = 0.85 V
vBC = 0.75 V
L23 April 13 3
99
101
103
105
0 1 2 3 4VAFeff(V) vs. vCE (V)
Forward EarlyVAf extractionVAFeff =
-iC/[iC/vBC]vBE
• VAF was set at 100V for this data
• When vBC = 0
vBE = 0.75VAF=101.2
vBE = 0.85VAF=101.0
vBE = 0.85 V
vBE = 0.75 V
L23 April 13 4
Forward ActiveHybrid-pi Circuit model
Fig 9.33*
L23 April 13 5
Gummel PoonBase ResistanceIf IRB = 0, RBB = RBM+(RB-RBM)/QB
If IRB > 0
RB = RBM + 3(RB-RBM)(tan(z)-z)/(ztan2(z))
Regarding (i) RBB and (x) RTh on previous slide,
RBB = Rbmin + Rbmax/(1 + iB/IRB)RB
1
IRBi144
1i
IRB24
z 2B
B
2
L23 April 13 6
h11_vs_ib
L23 April 13 7
h11_vs_frequency
L23 April 13 8
h11_vs_1/ib
L23 April 13 9
Gummel-Poon Staticnpn Circuit Model
C
IntrinsicTransistor
E
B
B’
ILC
ILEIBF
IBR
RC
RE
RBB
C’
E’ )ee(QIS
II
t
'C'B
t
'E'B
VNR
v
VNF
v
B
ECCC
L23 April 13 10
Gummel Poon npnModel Equations
IBF = ISexpf(vBE/NFVt)/BF
ILE = ISEexpf(vBE/NEVt)
IBR = ISexpf(vBC/NRVt)/BR
ILC = ISCexpf(vBC/NCVt)
QB = (1 + vBC/VAF + vBE/VAR )
{½ + ¼ + (BFIBF/IKF + BRIBR/IKR)}
L23 April 13 11
BJT CharacterizationForward GummelvBCx= 0 = vBC + iBRB - iCRC
vBEx = vBE +iBRB +(iB+iC)RE
iB = IBF + ILE
= ISexpf(vBE/NFVt)/BF + ISEexpf(vBE/NEVt)iC = FIBF/QB = ISexpf(vBE/NFVt) (1-vBC/VAF-vBE/VAR ) {IKF terms}-1
vBE = vBEx –iBRBB -(iB+iC)RE
+
-
iC RC
iB
RE
RBB
vBEx
vBC
vBE
++
-
-
L23 April 13 12
1.E-12
1.E-10
1.E-08
1.E-06
1.E-04
1.E-02
0.1 0.3 0.5 0.7 0.9
Sample fg data forparameter extraction
• IS = 10f• NF = 1• BF = 100• Ise = 10E-14• Ne = 2• Ikf = .1m• Var = 200• Re = 1• Rb = 100
iC, iB vs. vBEext
iB data
iC data
L23 April 13 13
Definitions ofNeff and ISeff
• In a region where iC or iB is approxi-mately a single exponential term, then
iC or iB ~ ISeffexp (vBEext /(NFeffVt)
whereNeff = {dvBEext/d[ln(i)]}/Vt,
and ISeff = exp[ln(i) - vBEext/(NeffVt)]
L23 April 13 14
Simple extractionof IS, ISE from data
1.E-16
1.E-14
1.E-12
1.E-10
0.1 0.3 0.5 0.7 0.9
Data set used • IS = 10f• ISE = 10E-14Flat ISeff for iC data =
9.99E-15 for 0.230 < vD < 0.255
Max ISeff value for iB data is 8.94E-14 for vD = 0.180
ISeff vs. vBEext
iB data
iC data
L23 April 13 15
Forward Gummelextr. of IS and IS/BF
IS/BF extr
ISextr – should to Neff at same point
L23 April 13 16
Simple extraction of NF, NE from fg data
Data set used NF=1NE=2
Flat Neff region from iC data = 1.00 for 0.195 < vD < 0.390
Max Neff value from iB data is 1.881 for 0.180 < vD < 0.181
0.9
1.1
1.3
1.5
1.7
1.9
2.1
0.1 0.3 0.5 0.7 0.9
NEeff vs. vBEext
iB
data
iC data
L23 April 13 17
0
25
50
75
100
1.E-10 1.E-06 1.E-02
Simple extractionof BF from data
• Data set used BF = 100
• Extraction gives max iC/iB = 92 for 0.50 V < vD < 0.51 V 2.42A < iD < 3.53A
• Minimum value of Neff =1 for slightly lower vD and iD
iC/iB vs. iC
L23 April 13 18
BJT CharacterizationReverse Gummel
+
-
iE
RC
iB
RE
RB
vBCxvBC
vBE
++
-
-
vBEx= 0 = vBE + iBRB - iERE
vBCx = vBC +iBRB +(iB+iE)RC
iB = IBR + ILC =
ISexpf(vBC/NRVt)/BR
+ ISCexpf(vBC/NCVt)
iE = RIBR/QB =
ISexpf(vBC/NRVt)/QB
L23 April 13 19
BJT CharacterizationReverse Gummel
+
-
iE
RC
iB
RE
RB
vBCxvBC
vBE
++
-
-
vBEx= 0 = vBE + iBRB - iERE
vBCx = vBC +iBRB +(iB+iE)RC
iB = IBR + ILC =
(IS/BR)expf(vBC/NRVt)
+ ISCexpf(vBC/NCVt)
iE = RIBR/QB =
ISexpf(vBC/NRVt)
(1-vBC/VAF-vBE/VAR )
{IKR terms}-1
L23 April 13 20
1.E-10
1.E-08
1.E-06
1.E-04
1.E-02
0.1 0.3 0.5 0.7 0.9
Sample rg data forparameter extraction
• IS=10f• Nr=1• Br=2• Isc=10p • Nc=2• Ikr=.1m• Vaf=100• Rc=5• Rb=100
iE, iB vs. vBCext
iB data
iE data
L23 April 13 21
1.E-10
1.E-08
1.E-06
1.E-04
1.E-02
0.1 0.3 0.5 0.7 0.9
Region a - IKRIS, RB, RC, NR, VAF
Region b - IS, NR, VAF, RB, RC
Region c - IS/BR, NR, RB, RC
Region d - IS/BR, NRRegion e - ISC, NC
Reverse GummelData Sensitivities
iE(A),iB(A) vs. vBC(V)
iE
vBCx = 0
iB
a
b
c
d
e
L23 April 13 22
0.9
1.1
1.3
1.5
1.7
1.9
2.1
0.1 0.3 0.5 0.7 0.9
Simple extraction of NR, NC from rg data
Data set used Nr = 1Nc = 2
Flat Neff region from iE data = 1.00 for 0.195 < vBC < 0.375
Max Neff value from iB data is 1.914 for 0.195 < vBC < 0.205
NEeff vs. vBCext
iB
data
iE data
L23 April 13 23
1.E-16
1.E-14
1.E-12
1.E-10
0.2 0.4 0.6
Simple extractionof IS, ISC from data
Data set used • IS = 10fA• ISC = 10pAMin ISeff for iE data =
9.96E-15 for vBC = 0.200
Max ISeff value for iB data is 8.44E-12 for vBC = 0.200ISeff vs. vBCext
iB data
iE data
L23 April 13 24
0.0
0.5
1.0
1.5
2.0
1.E-10 1.E-06 1.E-02
Simple extractionof BR from data
• Data set used Br = 2
• Extraction gives max iE/iB = 1.7 for 0.48 V < vBC < 0.55V 1.13A < iE < 14.4A
• Minimum value of Neff =1 for same range
iE/iB vs. iE