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Editorial New Algorithmic Techniques for Complex EDA Problems Shantanu Dutt, 1 Dinesh Mehta, 2 and Gi-Joon Nam 3 1 Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL 60607, USA 2 Department of Electrical Engineering and Computer Science, Colorado School of Mines, Golden, CO 80401, USA 3 IBM Research Labs, Austin, TX 78758, USA Correspondence should be addressed to Shantanu Dutt; [email protected] Received 3 February 2014; Accepted 3 February 2014; Published 27 April 2014 Copyright © 2014 Shantanu Dutt et al. is is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. VLSI design is a very complex problem in today’s decananometer technology and billion-plus gate designs. ere are two broad sets of effects that result from the rapidly decreasing feature sizes in CMOS VLSI: (a) significant increase in the number and the diversity of systems that are implemented on a single chip and (b) further exacerbation of old problems and the introduction of new ones, such as high power dissipation and temperature hot spots at all levels of the design process, high process-voltage-temperature based variability in various CMOS and interconnect parameters, and reliability of the design stemming from reduced feature sizes, to name a few. ese issues present significant challenges to the entire range of EDA tools from system-level to gate-level synthesis to more accurate and computationally tractable analysis methods to better reliability via robust design and effective testing techniques. However, current algorithmic approaches used to tackle these issues lack the necessary optimization and analysis heſt needed, while also being computationally tractable. us we feel that significant algorithmic innovations are needed to tackle these new problems with efficiency and efficacy at various stages of the VLSI design flow. Included in this special issue are six papers that present novel algorithms for a number of the aforementioned issues. A high-level meta-algorithm for scheduling a chain of coarse grained tasks on a linear array of FPGAs, which can tackle a wide range of problem formulations and cost functions, is presented in the first paper “Meta-algorithms for scheduling a chain of coarse-grained tasks on an array of reconfigurable FPGAs” by D. P. Mehta, C. Shetters and D.W. Bouldin. e second paper “Power-driven global routing for multi- supply voltage domains” by T.-H. Wu, A. Davoodi, and J. T. Linderoth, presents a new formulation for the power- aware routing problem for multi-supply voltage designs. e problem is solved using integer programming and parallel processing, the latter being an aspect that is actively being explored for various time-intensive EDA problems. In the third paper “Fast and near-optimal timing-driven cell siz- ing under cell area and leakage power constraints using a simplified discrete network flow algorithm,” H. Ren and S. Dutt develop a simplified and fast discretized network flow (DNF) algorithm for cell sizing for timing optimization under power and area constraints. is technique is much faster than a “full-fledged” DNF algorithm, but provides close to optimal solutions. e fourth paper “A graph-based approach to optimal scan chain stitching using RTL design descriptionsby L. Zaourar, Y. Kieffer, and C. Aktouf, presents a first-time mathematical formulation of the problem of scan insertion at the register transfer level of a design, and solves it as a traveling salesman problem. e work presented in the fiſth paper “A novel framework for applying multiobjective GA and PSO based approaches for simultaneous area, delay, and power optimization in high level synthesis of datapaths” by D. S. Har- ish Ram, M. C. Bhuvaneswari and S. S. Prabhu, provides an application of the non-dominated sorting genetic algorithm (NSGA II) to the problem of multi-objective optimization in high-level synthesis with the goal of achieving solutions that are close to the true Pareto front of optimal solutions. Finally, the sixth paper “Line search-based inverse lithography technique for mask design” by X. Zhao and C. Chu, presents Hindawi Publishing Corporation VLSI Design Volume 2014, Article ID 134946, 2 pages http://dx.doi.org/10.1155/2014/134946

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Page 1: Editorial New Algorithmic Techniques for Complex …downloads.hindawi.com/archive/2014/134946.pdfVLSI Design a novel enhanced mask design method via a highly e cient gradient-basedsearch

EditorialNew Algorithmic Techniques for Complex EDA Problems

Shantanu Dutt,1 Dinesh Mehta,2 and Gi-Joon Nam3

1 Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, IL 60607, USA2Department of Electrical Engineering and Computer Science, Colorado School of Mines, Golden, CO 80401, USA3 IBM Research Labs, Austin, TX 78758, USA

Correspondence should be addressed to Shantanu Dutt; [email protected]

Received 3 February 2014; Accepted 3 February 2014; Published 27 April 2014

Copyright © 2014 Shantanu Dutt et al. This is an open access article distributed under the Creative Commons Attribution License,which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

VLSI design is a very complex problem in today’sdecananometer technology and billion-plus gate designs.There are two broad sets of effects that result from the rapidlydecreasing feature sizes in CMOS VLSI: (a) significantincrease in the number and the diversity of systems that areimplemented on a single chip and (b) further exacerbation ofold problems and the introduction of new ones, such as highpower dissipation and temperature hot spots at all levels ofthe design process, high process-voltage-temperature basedvariability in various CMOS and interconnect parameters,and reliability of the design stemming from reducedfeature sizes, to name a few. These issues present significantchallenges to the entire range of EDA tools from system-levelto gate-level synthesis to more accurate and computationallytractable analysis methods to better reliability via robustdesign and effective testing techniques. However, currentalgorithmic approaches used to tackle these issues lack thenecessary optimization and analysis heft needed, while alsobeing computationally tractable. Thus we feel that significantalgorithmic innovations are needed to tackle these newproblems with efficiency and efficacy at various stages of theVLSI design flow.

Included in this special issue are six papers that presentnovel algorithms for a number of the aforementioned issues.A high-level meta-algorithm for scheduling a chain of coarsegrained tasks on a linear array of FPGAs, which can tacklea wide range of problem formulations and cost functions, ispresented in the first paper “Meta-algorithms for schedulinga chain of coarse-grained tasks on an array of reconfigurableFPGAs” by D. P. Mehta, C. Shetters and D.W. Bouldin.

The second paper “Power-driven global routing for multi-supply voltage domains” by T.-H. Wu, A. Davoodi, and J.T. Linderoth, presents a new formulation for the power-aware routing problem for multi-supply voltage designs. Theproblem is solved using integer programming and parallelprocessing, the latter being an aspect that is actively beingexplored for various time-intensive EDA problems. In thethird paper “Fast and near-optimal timing-driven cell siz-ing under cell area and leakage power constraints using asimplified discrete network flow algorithm,” H. Ren and S.Dutt develop a simplified and fast discretized network flow(DNF) algorithm for cell sizing for timing optimization underpower and area constraints. This technique is much fasterthan a “full-fledged” DNF algorithm, but provides close tooptimal solutions.The fourth paper “A graph-based approachto optimal scan chain stitching using RTL design descriptions”by L. Zaourar, Y. Kieffer, and C. Aktouf, presents a first-timemathematical formulation of the problem of scan insertionat the register transfer level of a design, and solves it as atraveling salesman problem. The work presented in the fifthpaper “A novel framework for applying multiobjective GA andPSO based approaches for simultaneous area, delay, and poweroptimization in high level synthesis of datapaths” by D. S. Har-ish Ram, M. C. Bhuvaneswari and S. S. Prabhu, provides anapplication of the non-dominated sorting genetic algorithm(NSGA II) to the problem of multi-objective optimizationin high-level synthesis with the goal of achieving solutionsthat are close to the true Pareto front of optimal solutions.Finally, the sixth paper “Line search-based inverse lithographytechnique for mask design” by X. Zhao and C. Chu, presents

Hindawi Publishing CorporationVLSI DesignVolume 2014, Article ID 134946, 2 pageshttp://dx.doi.org/10.1155/2014/134946

Page 2: Editorial New Algorithmic Techniques for Complex …downloads.hindawi.com/archive/2014/134946.pdfVLSI Design a novel enhanced mask design method via a highly e cient gradient-basedsearch

2 VLSI Design

a novel enhanced mask design method via a highly efficientgradient-basedsearch technique that results in fewer patternerrors than previous work;it thus also reduces variability.

We hope the readers will find the papers interesting andinformative, and that this special issue will get researchersthinking about developing new algorithmic approaches toeffectively solving critical problems in current VLSI design.

Shantanu DuttDinesh MehtaGi-Joon Nam

Page 3: Editorial New Algorithmic Techniques for Complex …downloads.hindawi.com/archive/2014/134946.pdfVLSI Design a novel enhanced mask design method via a highly e cient gradient-basedsearch

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