33
ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the World Input-Output Database (WIOD) Conference Vienna University of Technology Vienna, Austria – May 26-28, 2010

ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the World Input-Output Database (WIOD) Conference

  • Upload
    buzz

  • View
    55

  • Download
    2

Embed Size (px)

DESCRIPTION

ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the World Input-Output Database (WIOD) Conference Vienna University of Technology . Vienna, Austria – May 26-28, 2010. LIST OF SECTORS. TESTS FOR OVER-IDENTIFICATION. Note: - PowerPoint PPT Presentation

Citation preview

Page 1: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference

ECONOMETRIC MODELING OF TECHNICAL CHANGE

byDale W. JorgensonHarvard University

Presented to the World Input-Output Database (WIOD) Conference

Vienna University of Technology

Vienna, Austria – May 26-28, 2010

Page 2: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 3: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 4: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 5: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 6: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 7: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 8: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 9: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 10: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 11: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 12: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 13: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference

LIST OF SECTORS

Page 14: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference

TESTS FOR OVER-IDENTIFICATION

Note: (1) The number of degrees of freedom for the LR test for each sector is 8.(2) The null hypothesis is that the instrumental variables are exogenous. (3) High p-values indicate that we cannot reject the null hypothesis of exogeneity.(4) The last column presents p-values adjusted for simultaneous inference.

Page 15: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference

TESTS OF VALIDITY OF THE INSTRUMENTAL VARIABLES

Note: (1) Number of degrees of freedom for the LR test for each sector is 99.(2) The null hypothesis is that instrumental variables are uncorrelated with the endogenous independent variables.(3) Low p-values indicate that we can reject the null hypothesis of no correlation.

Page 16: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 17: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 18: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 19: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 20: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 21: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 22: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 23: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 24: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 25: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 26: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 27: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 28: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference

ECONOMETRIC MODELING OF PRODUCER BEHAVIOR: SUMMARY.

Production Theory, Price Effects, and Share Elasticities.

Latent Variables, Rate, and Biases of Technical Change and the Kalman Filter.

Substitution and Technical Change Equally Important in Explaining Changes in Budget Shares.

Autonomous and Induced Technical Change. Generally Opposite in Sign; Autonomous Change Generally Positive; Induced Change Generally Negative and Much Less Important.

Page 29: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 30: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 31: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 32: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference
Page 33: ECONOMETRIC MODELING OF TECHNICAL CHANGE by Dale W. Jorgenson Harvard University Presented to the  World Input-Output Database (WIOD) Conference