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Diagnostic System for Low Level RF Control System for VUV-FEL. Tomasz Jeżyński. Outlook VUV-FEL LLRF Source of perturbations D iagnostic System for LLRF. Technical University of Łódź , Poland Deutsches Elektronen-Synchrotron, Germany. VUV-FEL - the pilot facility for the XFEL. - PowerPoint PPT Presentation
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Diagnostic System for Low Level RF Control System for VUV-FEL
Technical University of Łódź, PolandDeutsches Elektronen-Synchrotron, Germany
Tomasz Jeżyński
Outlook
• VUV-FEL • LLRF• Source of perturbations• Diagnostic System for LLRF
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
VUV-FEL - the pilot facility for the XFEL
• 260 m long (tunel 100 m)• 6 Cryo-modules• TESLA technology
– 48 superconductive cavities• Development platform for XFEL
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Tunnel
Place for electronic
• no access during operation
• no service tunnel• risk of radiation
damage
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Outlook
• VUV-FEL • LLRF• Source of perturbations• Diagnostic System for LLRF
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Control System in VUV-FEL
~MO
Cavities
. . .
DSP
HP AmplifierRF
Switch
. . .Downconverters
DAC
DAC
VM
ADC
ADC...7
8
Control System
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
LLRF - requirements
Electrical field : 30 MV/m Required field stability :
10-5 in amplitude, 0.01° in phase Continuous operation is required
one maintenance day per month
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
LLRF– Goals
Provide:
1. stable RF field in cavity during beam2. continuous operation
0 500 1000 1500 2000 25000
5
10
15
Fillin
g ti
me
De c a y
Fla tto pP
[M V/m ]
tim e [us]
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Outlook
• VUV-FEL • LLRF• Source of perturbations• Diagnostic System for LLRF
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Source of perturbationSoftwareHardwareHardware
• MO – phase• VM – Pin, nn• Klyston – Pout = f(Pin)• RF Power distribution• Probes – individual char• Mixers – nn, offset• ADCs – nn, offset• DACs – nn, offset• Timing – time & temp.• Power Supplies• Noise level• ...
Software
• Numerical errors • Calibration• Parameters• Control System• ...
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Outlook
• VUV-FEL • LLRF• Source of perturbations• Diagnostic System for LLRF
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic System - Goals
The diagnostic system cannot increase reliability!
but can decrease maintenance cost(minimize time and man power necessary to repair)
provide the high availability
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic System - Goals
Diagnostic have to be:
• Cheap• Flexible (easy modification, extend...)• Failures of diagnostic cannot stop
operation
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Monitoring
~51 32 4
...
MO
Cavities
. . .
DSP
HP AmplifierRF
Switch
. . .Downconverters
DAC
DAC
VM
ADC
ADC...7
8
Control System
0 1 0 0 2 0 0 3 0 0 4 0 0 5 0 0 6 0 0 7 0 0 8 0 0 9 0 0 1 0 0 0-1 6 0
-1 4 0
-1 2 0
t [pu lse no.]
ph
ase
[ d
eg]
standarddeviation
m ean va lue
0 5 0 0 1 0 0 0 1 5 0 0 2 0 0 0 2 5 0 00
5
1 0
1 5
Fillin
g tim
e
De c a yFla tto p
P[M V/m ]
tim e [us]
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Phase between two points in time
0 50 100 150 200 250 3006
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LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
400 500 600 700 800 900 1000 1100 1200 1300 14006860
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400 500 600 700 800 900 1000 1100 1200 1300 14006860
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400 500 600 700 800 900 1000 1100 1200 1300 14006860
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-155
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-130
-125
0 500 1000 1500 2000 25000
1000
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7000
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Unacceptable data from the system
0 500 1000 1500 2000
100
110
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150
160
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180
tim e [us]
pha
se [
de
g]
0 5 0 0 1 0 0 0 1 5 0 0 2 0 0 0 2 5 0 00
5
1 0
1 5
Fillin
g tim
e
De c a y
Fla tto pP
[M V/m ]
tim e [us]
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic
. . .
DSP
HP Amplifier
Cavities
RFSwitch
~
. . .Downconverters
DAC
DAC
VM
ADC
ADC
51 32
...6
4
MO
Control System
78
DAC
DAC
Tests:• Hardware
• Algorithm
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic & Calibration
. . .
DSP
HP Amplifier
Cavities
RFSwitch
~
. . .Downconverters
DAC
DAC
VM
ADC
ADC DAC
DAC
Sig. Gen.
51 32
9 ...
8
7
4
6
MO
Control System
0 500 1000 1500 2000 25000
5
10
15
Fillin
g ti
me
De c a y
Fla tto pP
[M V/m ]
tim e [us]
2000 3000 4000 5000 6000 7000 8000-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
10 x ADC,14 bits,
105 MMz
4 x DAC,14 bits,
200 MMz
Digital IO
2 x optolink 3.125 Gbps
Ethernet
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Main panel - first result (timing)
Timing requires dedicated hardware !
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic System for VUV-FEL
• Monitoring • Diagnostic• Calibration
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Monitoring
Error detection Timing signals (synchronization, phase) Pfor & Pref Probes Field stability (RMS, p-p, ...) Detuning Loaded Q Limits of set value ...
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Diagnostic
• Detect malfunction• Locate damage hardware
– Crate, board, input• Perform components tests
– ADCs, DACs– Interfaces– Memory, DSP blocks ...– Timing distribution
• ...
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
Calibration
• timing• probes• vector sum• ADCs and DACs offset• downconverter• attenuators• .....
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
What we want to do?
• Provide possibility to read data form different points of the system
• Design an universal diagnostic interface and implement it to all electronic boards
• Integrate diagnostic elements in control system– Sources of test signals– RF Switches– ...
• Provide self-diagnostics for all boards
LLRF WorkshopCERN 12.10.2005
Tomasz Jezynski
THE END