Device: WP2 Interface & materials

Amit K. Tiwari, Nick Wright and Anthony O’NeillSchool of Electrical and Electronic Engineering

Newcastle University

amit.tiwari@ncl.ac.uk, nick.wright@ncl.ac.uk and anthony.oneill@ncl.ac.uk

Hot spot

1. Designing, parameter optimisation and performance evaluations of power semiconductor devices 1 (static, transient, electro-thermal, breakdown analyses)

Transient analysis

Self-heating analysis

Our research work area

Breakdown

Contd...

Lateral JFET

Vertical JFET

Breakdown-analysis

1. High voltage 4H-SiC current limiting device for serial protection applications, submitted to ECSCRM2014.2. Design optimization and performance evaluation of a 10 kV super-junction power SiC-JFET, submitted to ECSCRM2014. 3. Self-heating effects in lateral JFETs, in preparation for IEEE TED.

Contd...

2. Device fabrication and characterisation

Vov=Vgs-VT

SEM image of cross-section of a lateral FET

1. Manuscript in preparation

3. Modelling of wide bandgap materials (SiC and diamond) and surface/interfaces analysis

(a) Surface topography and (b) contact potential difference (Kelvin probe measurement) map for a nano-crystalline diamond surface

4H-SiC (C-face) 4H-SiC (Si-face)

[001] Oriented metal terminated diamond surface

Electronic affinity calculation for H- and O-terminated diamond surfaces

1. Electronic and structural properties of diamond (100) surfaces terminated by selected transition metals, PRB 86 155301.

2. Calculated electron affinity and stability of halogen-terminated diamond, PRB 84245305

3. Tuning optoelectronic properties of 4H-SiC QDs using -H, -OH and -F surface functionalisation , submitted to ECSCRM2014.

Project Plans & Objectives

Ln<Lp Ln>Lp

Ln=Lp

Super-junction VJFET structure

•Designing and performance evaluation of novel high temperature and high voltage SiC devices for rugged electronic applications (our current main focus is on the super-junction structures)

•Development of fabrication process steps and high temperature device packaging analysis for thermal management

•Extreme environments testing

Charge-imbalence analysis1. Design optimization and performance evaluation of high voltage (>1 kV) super–junction SiC–JFETs, in preparation for IEEE TED.

Potential Outcomes & Exploitation PlansOutcomes:•Commercially unavailable novel high temperature and high voltage SiC-devices•Advancement of underpinning material growth and device fabrication technology

Exploitation: • Technology dissemination to the wider power-electronics community working in different areas (aerospace, automobile and power distribution sectors) through the knowledge transfer networks and potential collaborations.•Publications in refereed academic journals and conferences, and feature articles in trade journals

Input from the PE Community

• Any experience/feedback regarding the super-junction and electro-thermal simulations of thick device (several 100s

microns) structures will be much appreciated.

Thanks