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ITRS Design

Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

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Page 1: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

ITRS

Design

Page 2: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Design

• Design for manufacturability• Design verification

Page 3: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Design for Manufacturability

• Architecture challenges• Logic and circuit challenges• Layout and physical design challenges• Yield prediction and optimization

Page 4: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Variability Modeling and Roadmap –Need for Such a Roadmap

• Expected to be the source of multipleDFM challenges

• Invest in variability reduction or designproductivity improvements?

Page 5: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Variability Modeling and Roadmap –Levels of Abstraction

• Circuit/Chip level• Device level• Physical level

Page 6: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Design Verification

• Verification vs testing• Moore’s law• Historical emphasis in design improvement

Page 7: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Design Verification – Challenges (>50nm)

• Capacity• Robustness• Verification metrics• Software• Reuse• Specialized verification methodology• Specialized design-for-verifiability• New kinds of concurrency

Page 8: Design · Design for Manufacturability •Architecture challenges •Logic and circuit challenges •Layout and physical design challenges •Yield prediction and optimization

Design Verification – Challenges (<50nm)

• Design for verifiability• Higher levels of abstraction• Specification for verifiability• Verification in presence of non-digital effects• Heterogeneous systems• Analog-Mixed signal• Soft failures• Verification for redundancy