DESIGN AND CONSTRUCTION OF

ELECTRONIC COMPONENTS

TESTER WITH CAPACITANCE

METER

BY

FAJUBE MAYOWA

MATRICULATION NUMBER:

2006/24403EE

A FINAL YEAR PROJECT SUBMITTED TO THE DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING, SCHOOL OF

ENGINEERING AND ENGINEERING TECHNOLOGY, FEDERAL UNIVERSITY OF TECHNOLOGY, MINNA, IN PARTIAL

FULFUILMENT OF THE REQUIREMENTS OF THE AWARD OF THE BACHELOR OF ENGINEERING (B.ENG.) DEGREE IN ELECTRICAL

AND COMPUTER ENGINEERING

NOVEMBER, 2011

DEDICATION

I dedicate this work first and foremost to Almighty God who has always been there for me all the days of my life, then to my dearest parent Mr. and Mrs. Fajube for their unrelenting efforts towards my success in life.

ii

. DECLARATION

I. FAJUBE MA YOW A, declare that this work was done by me and has never been presented elsewhere for the award of decree. I also hereby relinquish the copyright to the Federal University of Technology, Minna.

FAJUBEMAYOWA Dr. E. N. Onwuka · ... .. t···.,· ... , ................. , ....... , ....... , ................ ...... . . ...................................................... ................ . rName of Student) (Name o/Supervisor)

... ................................................ ................. .. (Signature and Date)

~~ ~. c;~1r\ .............................................. f ............ . ............. ,. ................................ -......................... .

[ (M m:\Of";~ l~ ~\~ CZ (NameofExterna:nerJ q>~( L .............................. _ .... / ~"""""'''''''''''''''''''''''''''''''''''''' .

(Signature and Date) (Signature and Date)

iii

. ACKNOWLEDGEMENT

I want to thank aJI the people who have helped me through the course of my journey

towards making this project a success. I sincerely thank my project supervisor, Dr. E. N.

Onwuka for her word of inspiration, enlightenment, guidance, and inspiration. Apart from the

subject otthis project, I learnt a lot from her, that I am sure, will be useful in different stages

of my life. My gratitude also goes to Ellgr. A.G. Raji the HOD Department, Electrical and

Computer Engineering, FUT, Minna, my technical supervisor Mallam Doko (the Chief

Technician) and the entire staff of the department whose effort, criticism and remarks did a ,

lot of good to me and my work.

This project would not have been possible without the confidence, endurance and

support of my family members especially my lovely parents Mr. and Mrs. Fajube who have

always b~en the source of my inspiration and encouragement towards actualizing my dream.

Likewise, I appreciate the moral and financial support given to me by Mr. Abiodun Onileowo

and his family, Mrs. Abolaji Adekunle, and Sis. Mopelola Onileowo.

I also appreciate the assistance, advice and encouragement rendered to the success of

. , my program in one way or the other by my brothers and sisters who are Fajube Olamide,

Fajube Muyiwa, Fajube Olalekan and Fajube Faith. My acknowledgment will not be

completed without remembering the FCS "His Dwelling Place", my friends ,and colleagues

\ in the department of Electrical and Computer Engineering (2010/2011), for their wonderful

support towards my achievement.

ABSTRACT

This project presents the design and construction of an electronic components tester with

capacitance meter. This tester uses the flexible programmable features of AT89C52

microcontroller for its application. The micro controller was used as a central processing unit

for the keypad, Liquid Crystal Display (LCD), and input and output components under test

via a ZIF socket.

Keypad was function as a medium for alerting the microcontroller about the component to be

tested. The LCD was function as a platform for displaying the functionality condition of the

component under and results. ZIF socket was function as a platform to place IC under test,

and as a channel for input and output IC under test to be connected to microcontroller as

central processing unit. The testing method used is exhaustive method. Through this method,

all input combinations are considered for tests. For this project, IC555 timer, IC741,

Transistors, Diode and Continuity can be test effectively. In addition the value of some

electrolytic capacitors can also be measured through the capacitance meter incorporated.

v

TABLE OF CONTENT

Title page ................................................................................................ ... i

Dedication ........... . ....... ....... ....... .. ........ .... ... .. . .. ...... .. .......... . ....... .. ............... ii

Declaration ................................................. ....... ... . .. . .............. .. ................... iii

Acknowledgement ......... ........ ..... ................ ... ..... ................ .. ....................... . .iv

Abstract .... . .... ................ .................. . .... .. ........ ... ....... . .... .. ..... .. ................. .. v

Table of Contents ............ ....... .. .... ................................. .. ............ .... ... . ...... .. vi

List of Figures .. .................. . ............ .. ............................. . . . ................... ... ... .ix

List of Tables .............................. . ................................................. . .... . .... . ..... x

<:~1rICIt(}~: ~()])1J<:1rI()~ .•..•••••••.••••••••••.•••••..•••..••••••.•.•• ••.••.••.•••••••.• 1

1. 1 General Introduction ................. . .................................. .......... . ........... .... ... 1

1.2 Project Objectives .... .. ..... . ........... .... ... ... . .. ..... . . . ... . .... . ........ .. .... .. ...... .......... 3

1.3 Methodology ........................................................... , .......... . ... . ................ 4

1.4 Scope of Project ...................... .. . . ....... . .......... . ..... . ... .............. ... ...... ... ... .... 4

1.5 Project Outline .. ............................... . .................................... . ............ .. ..... 5

CHAPTER lWO: LITERATURE REVIEW ....................................................... 6

2.1 Historical Background ........................ . ......... .. ... ... ..................................... 6

2.1.1 Components Tester Review .......................................... . ........... ... .. .. 7

2.1.2 A Display Meter. .......................................... '" .... .......................... .. ... 9

2.2 Theoretical Background ................................. . ........................................... 11

2.2.1 The Need ofIC Testing ...... ... ... ....... .. . . . ..... .... ........... ..... ..... ..... .... 12

2.2.2 Microcontrollers .................. .. ...................... . ....... . ...... ........ ... .. .... 13

2.2.3 The 555 Timer IC Chip ... .. .................................. . ............... . ......... . 17

vi

2.3 Circuit Block Diagram ...... . ....... . .... .. ..... . ... ........... .... .... .... .. .... .. ..... .. .. ... ... . 20

CHAPTER THREE: DESIGN AND IMPLEMENTATION ............... ..... .. ........... 21

3.1 Principle of Operation ... .................... . ....... .................. .. .............. ...... .... 21

3.2 The Power Supply Unit ..... . ....... .. ....... .......... ................................. ..... .. .. 21

3.3 The Control Unit ......... ....................... . ................................... ......... .... 23

3.3.1. The AT89C52 Microcontroller .. ... ... .. .............................................. 25

3.4 The Display Unit ... .......... ........ ...................... .. ................ ................. .. 25

3.5 The Keypad Unit .................. ... ....................... . .............. . ................. ... 26

3.5.1 Principle of Operation ......... ..... . ...... ................... .................... . .... 27

3.6 The Component under Test Unit ................. . ..... .. ............. .... . .... ............ .. . 28

3.6.1 555-Timer IC Test Circuit. .. ................................. .. ............. ......... 28

3.6.2 LM741 IC Test Circuit ... ...................... ............. .. .......... . ............ . 29

3.6.3 Capacitor Circuit .............. .. ........................ ......... ...................... 29

3.6.4 Diode and Continuity Testing ................... .............................. . ..... .30

3.6.4 Transistor Testing .... ........ ... ....... ........................................... ..... .31

3.7 Construction and Casing .................. ...... .................... . .... ................... .. . 32

3.8 Precautions ............................... ................................ ........................ 32

3.9 The Complete Circuit Diagram .......................... ................. . .................. .. 33

CHAPTER FOUR: TEST, RESULTS AND DISCUSSION .....••••••..•••..••••..•••...••••• 34

4.1 Testing ............ ... ... ........... . ..... . .................. ....... . ........ ............ ....... ... . 34

4.2 Results ........................ ........... . ........................... ... ..................... ..... 34

4.2.1 Results for IC555 timer. ..... ... ......................... .. ............................ 34

4.2.2 Results for LM741 ..................... .. .......................... .. ..... . ............ 35

4.2.3 Results for Transistor. .. ........ . ..... . ........ . ........................ ......... ...... 35

4.2.4 Results for Capacitance meter. ........................................ . ............ .. 35

vii

4.3 Discussion of Results .................. ....... ... ... .. ........ . .............. . ................ .. 36

4.4 Limitation .......... . ..... ..... ....... ......... .................................. , ....... , ........ 36

CHA.PTER FIVE: CONCLUTION ................................................................. 37

5.1 Conclusion ... .... ....................... ... .... ........ ............... .. ....... ............. .... . 37

5.2 Problem Encountered ................... .. ............ .. ..... ..... .. ...................... ... .. .37

5.3 Possible Improvement ................. . .............................. ... ... ........... . ........ 38

5.2 Recommendation ........... . ............. ... ................................. . ...... ........... . 38

REFERENCES .................................................................................................................. 39

APPENDIX A: USER'S MANUAL ................................................................. 41

AP~E~IX II: ~()~ CllJ\IlT ..................................................................... 42

APPE~IX C: CONSTR.UCTION STAGES .................................................... 44

AP~~~IX I>: S()1JIlC~ <:()])~ •••••••••••••••••••••••••••••••••••••••••••••••••• •••••••••••••••••• 45

viii

Fig. 2.1

Fig. 2.2

Fig. 2.3

Fig. 2.4

Fig. 2.5

Fig. 2.6

Fig. 2.2

Fig. 3.0

Fig. 3.1

Fig. 3.2

Fig. 3.3

Fig. 3.4

Fig. 3.5

Fig. 3.6

Fig. 3.7

Fig.3.7

Fig. 3.9

LIST OF FIGURES

A typical AT89C52 Microcontroller. ................................................ 15

555 timer IC chip with Pin Configuration .............................. . ........... 17

555 timer connected as Astable Multivibrator. ............ . . . ..................... 18

555 Voltage waveform of the Astable Multivibrator. .... ....... ........ ..... ... . 18

555 timer connected in the monostable mode ..... ........ ..... ......... ...... . .. 19

Voltage waveform of the monostable multivibrator .. . .......... .. .............. 19

Block Diagram of Electronic Components Tester. ........ .. .... . ...... .. . . ... ... 20

The Power Supply Unit . ............................................................... 23

The Control Unit .. . . ................................................... .............. .. 23

The Display Unit ..................... ..... ................. ....... ......... ... ... ..... . 26

The Keypad Unit ........... . ........................................................... 27

555-Timer Testing Circuit. ........................... ........... ............... ... .... 28

LM741 IC in Comparator mode .... ... ........ ............ . ......................... 29

Capacitance measuring circuit .... .... . ....... ....... . ...... . ... .... . ........... ..... .30

Continuity and Diode testing circuit ................................................ .31

NPN Transistor Testing Circuit .............. . ................................ .. ...... 32

Complete Circuit Diagram .... ... ... ........ ... ......... ... ..... .... ..... .. .. .. ....... 33

ix

Table 4.1

Table 4.2

Table 4.3

Table 4.4

LIST OF TABLES

Results obtain from testing IC555 timer functionality

Results obtain from testing LM741 functionality

Results obtain from testing NPN transistor functionality

Results obtain from the Digital Capacitance and Digital Multimeter

x