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    Homework #8 Solutions EE 528, Fall 2010

    9.7. (a) Plot the deposition rate (on a log scale) versus 1/T (K), for 600-1200C for a

    CVD system with the following parameter values:

    hG = 0.5 cm sec-1

    , kS = 4x106

    exp(-1.45 eV/kT) cm sec-1

    Partial pressure of incorporating species = 1 torr, Total pressure = 1 atm

    CT/n=1/10,000

    Identify the reaction and mass transfer limited regimes.

    (b) Redo the problem when the total pressure is decreased to 1 torr, so that hG

    increases by 100 times. Assume that the partial pressure of the incorporatingspecies remains the same, and CT decreases by the same factor as the total

    pressure.

    Answer:

    By Equation 9.10: v kShG

    kS hG

    CT

    N

    Y 1

    1hG

    1kS

    CT

    N

    Y ,

    hG = 0.5 cm sec-1

    kS = 4x106

    exp(-1.45 eV/kT) cm sec-1

    where T = T C + 273CT/N= 1/10,000

    Y = Pg/Ptotal = 1 torr / 760 torr

    For low pressure case, only hg changes (increased by 100 times). CT/N times

    Pg/Ptotal remains constant since n and Pg each remains constant, and the CT/Ptotal ratiostays constant as stated above.

    For the 1 atm total pressure case, the transition between surface reaction controlledand diffusion controlled is at about 800 C, while for the low pressure case (low

    P), the transition occurs above 1200 C.

    10-5

    10-4

    10-3

    10-2

    10-1

    0.60 0.75 0.90 1.05 1.2

    VV(low P)

    V (microns/sec)

    1000/T(K)

    600C1200C 800C

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    Homework #8 Solutions EE 528, Fall 2010

    10.7. (a) In a particular etch process, if selectivity is the biggest concern, which

    type(s) of etch equipment should be used?(b) If the biggest concern is ion bombardment damage, which type(s) of etch

    equipment should be used?

    (c) If the biggest concern is obtaining vertical sidewalls, which type(s) of etchequipment should be used?

    (d) If the biggest concerns are selectivityandvertical sidewalls, which type(s)of etch equipment should be used?

    (e) What about selectivity andvertical sidewalls anddamage, while maintain-

    ing reasonable etch rate?

    Answer:

    a. If biggest concern is selectivity? barrel or remote plasma or wet etching

    b. If biggest concern is damage? barrel or remote or wet

    c. If biggest concern is vertical sidewalls? sputtering or RIE/HDP

    d. What about selectivity AND vertical sidewalls? RIE/HDP

    e. What about selectivity AND vertical sidewalls AND damage, while maintaining

    reasonable etch rate? HDP